Method and system for inspecting transparent objects
By arranging an imaging unit, a light source, and a dark background around a transparent object, and using scattered light to detect defects in the transparent object, the problem of difficulty in identifying internal defects of transparent objects in existing technologies is solved, and rapid and automated defect detection is achieved.
CN121068638APending Publication Date: 2025-12-05HEXAGON INNOVATION CENTER LTD
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Patent Information
- Application Number
- CN202510736043.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2024-07-01
- Filing Date
- 2025-06-04
- Publication Date
- 2025-12-05
AI Technical Summary
Technical Problem
Existing technologies are ineffective at inspecting defects in transparent objects, especially internal defects, and manual inspection is prone to human error. Existing devices are also inaccurate in identifying defects in transparent objects.
Method used
By employing a combination of imaging unit, light source, and dark background, defects in transparent objects are detected through scattered light, and image data is analyzed by computing unit to automatically identify defects.
Benefits of technology
It enables rapid and automated transparent object defect detection, improving detection accuracy and efficiency while reducing human error.
✦ Generated by Eureka AI based on patent content.
Abstract
Methods and systems for inspecting transparent objects. The invention relates to an inspection system for detecting defects in a transparent object, the system comprising at least one imaging unit, one or more light sources and at least one dark background arranged around an inspection location for inspecting the transparent object. The light source is configured to emit light to illuminate the transparent object from at least a first side of the object when the object is positioned at the inspection position. The imaging unit is configured and arranged relative to the inspection position to capture one or more images of the object from a second side of the object when the object is positioned at the inspection position, and is configured to generate image data. The dark background is arranged such that the inspection position is located between the imaging unit and the dark background. The system includes a computing unit configured to receive image data and detect in the image data one or more indications of scattered light deflected from a defect in the object. The invention also relates to a method for detecting defects in a transparent object using such a system.
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