Systems, methods, media, and electronic devices for testing a seismic data acquisition

Abstract

A system, method, medium, and electronic device for testing seismic data acquisition devices are disclosed. The system includes: a signal generator, a digital multimeter, at least one seismic data acquisition device, a connector, and a host computer. The signal generator generates electrical signals; the digital multimeter measures electrical parameters in the test circuit; the seismic data acquisition device performs corresponding processing operations on its input signals in its current test circuit and transmits the results of the processing operations to the host computer; the connector controls the state of each relay in the relay group to form a test circuit for the current test index; the host computer sends test control commands and determines the test results of the seismic data acquisition device for the current test index based on the received information. This disclosure facilitates convenient and accurate testing of various indicators of seismic data acquisition devices, thereby improving the testing efficiency and reliability of test results.

Description

Technical Field

[0001] This disclosure relates to the field of earthquake technology, and in particular to a system for testing earthquake data acquisition devices, a method for testing earthquake data acquisition devices, a storage medium, and an electronic device. Background Technology

[0002] Seismic data acquisition systems primarily convert analog signals captured by sensors such as seismometers and accelerometers into digital signals. These digital signals undergo preprocessing such as noise reduction and calibration before being output, and may be transmitted to seismic network centers via wired / wireless methods. During factory manufacturing or maintenance / repair, the performance status of seismic data acquisition systems is typically tested / evaluated to ensure the acquisition of high-quality seismic observation data during actual use.

[0003] In developing this disclosure, the inventors discovered that current performance testing / evaluation of seismic data acquisition devices often requires connecting the seismic data acquisition device to corresponding equipment based on different test indicators to form a test environment for those indicators, and then manually measuring the corresponding terminals in the seismic data acquisition device's port using tools. Because there are many indicators to be tested, and some indicators have different test ranges, the current process for performance testing / evaluation of seismic data acquisition devices is cumbersome and time-consuming. For example, a single person can complete the performance testing / evaluation of 3-4 seismic data acquisition devices per day.

[0004] How to conveniently, efficiently, and accurately test / evaluate the performance of seismic data acquisition devices is a technical issue worthy of attention. Summary of the Invention

[0005] To address the aforementioned technical problems, this disclosure is proposed. Embodiments of this disclosure provide a system for testing a seismic data acquisition device, a method for testing a seismic data acquisition device, a storage medium, and an electronic device.

[0006] According to a first aspect of the present disclosure, a system for testing a seismic data acquisition device is provided, comprising: a signal generator, a digital multimeter, at least one seismic data acquisition device, a connector, and a host computer; the signal generator is connected to the connector and the host computer respectively, and is used to generate electrical signals of corresponding specifications according to the control of the host computer; the digital multimeter is connected to the connector and the host computer respectively, and is used to measure electrical parameters in the test circuit according to the control of the host computer, and transmit the electrical parameter measurement results to the host computer; the seismic data acquisition device is connected to the connector and the host computer respectively, and the seismic data acquisition device, which is used as the current device under test, is used to perform corresponding processing operations on its input signals in its current test circuit, and transmit the result information of the processing operations to the host computer; the connector is connected to the signal generator, the digital multimeter, at least one seismic data acquisition device, a connector, and a host computer; the signal generator is connected to the connector and the host computer respectively, and is used to generate electrical signals of corresponding specifications according to the control of the host computer; the seismic data acquisition device is used to perform corresponding processing operations on its input signals in its current test circuit, and transmit the result information of the processing operations to the host computer; the connector is connected to the signal generator, the digital multimeter, the host computer, and the host computer respectively, and is used to generate electrical signals of corresponding specifications according to the control of the host computer; the seismic data acquisition device is used to generate electrical signals of corresponding specifications according to the control of the host computer, and is used to generate electrical signals of corresponding specifications according to the control of the host computer; the seismic data acquisition device is connected to the connector and the host computer respectively, and is used to generate electrical signals of corresponding specifications according to the control of the host computer; the seismic data acquisition device is used to generate electrical signals of corresponding specifications according to the control of the host computer ... A digital multimeter, each seismic data acquisition unit, and a host computer are connected respectively. The connector includes a relay group, and the connector is used to control the state of each relay in the relay group according to the received index test command, so as to form a test circuit for the current index to be tested together with some or all of the signal generator, digital multimeter, and each seismic data acquisition unit. The host computer is connected to the signal generator, digital multimeter, each seismic data acquisition unit, and the connector respectively. The host computer is used to generate a test control command according to the current index to be tested and send the test control command to at least one of all devices connected to it. The host computer determines the test result of the seismic data acquisition unit, which is the current test device, for the current index to be tested based on the information transmitted from at least one device connected to it. The test control command includes an index test instruction.

[0007] According to a second aspect of the present disclosure, a method for testing a seismic data acquisition device is provided. The method is executed in a host computer, which is connected to a signal generator, a digital multimeter, at least one seismic data acquisition device, and a connector. The method includes the steps of: acquiring a user-set current test index of the seismic data acquisition device through a seismic data acquisition device test interface; wherein the seismic data acquisition device is connected to the connector, and the connector is also connected to the signal generator, the digital multimeter, and the host computer; generating a test control command based on the current test index; wherein the test control command includes an index test instruction, which controls the state of each relay in a relay group in the connector, thereby enabling some or all of the signal generator, the digital multimeter, and each seismic data acquisition device to form a test circuit for the current test index together with the connector; sending the test control command to at least one device connected to the host computer; receiving and storing information transmitted from at least one device connected to the host computer; and determining the test result of the seismic data acquisition device (the device currently under test) for the current test index based on the stored information.

[0008] According to a third aspect of the present disclosure, a computer-readable storage medium is provided, the storage medium storing a computer program for implementing any of the methods described above.

[0009] According to a fourth aspect of the present disclosure, an electronic device is provided, comprising: a processor; a memory for storing processor-executable instructions; the processor being configured to read the executable instructions from the memory and execute the instructions to implement any of the methods described above.

[0010] Based on the system, method, storage medium, and electronic device for testing a seismic data acquisition device provided in the above embodiments of this disclosure, by setting up a connector containing a relay group and connecting the connector to a host computer, the host computer can control the state of each relay in the relay group within the connector; by connecting the connector to a signal generator, a digital multimeter, and the seismic data acquisition device respectively, the state changes of each relay can create multiple different connection methods between the terminals of the signal generator, the digital multimeter, and the seismic data acquisition device, thereby automatically forming a corresponding test circuit for any test index, so as to apply the corresponding signal to the corresponding terminal of the seismic data acquisition device; by making the signal generator... The generator is connected to a host computer, which can control the generator to produce signals of the appropriate specifications to meet the signal requirements of the current test parameters. Connecting a digital multimeter to the host computer allows for convenient and accurate acquisition of various electrical parameters in the test circuit. Connecting the seismic data acquisition unit to the host computer allows for configuration of parameters such as the acquisition unit's range and timely acquisition of its output information. This enables the host computer to quickly determine the test results of the current test parameters based on the information transmitted from various devices. This not only helps avoid human error in the tedious manual testing process but also significantly improves the automation level of seismic data acquisition unit testing. Therefore, the technical solution provided in this disclosure facilitates convenient and accurate testing of various parameters of seismic data acquisition units, thereby improving testing efficiency (for example, according to actual experimental comparisons, the testing efficiency of this disclosure can reach 20 times that of existing methods) and enhancing the reliability of test results.

[0011] The technical solutions of this disclosure will be further described in detail below with reference to the accompanying drawings and embodiments. Attached Figure Description

[0012] The above and other objects, features, and advantages of this disclosure will become more apparent from the more detailed description of the embodiments thereof in conjunction with the accompanying drawings. The drawings are provided to further illustrate the embodiments of this disclosure and form part of the specification. They are used together with the embodiments of this disclosure to explain the disclosure and do not constitute a limitation thereof. In the drawings, the same reference numerals generally represent the same components or steps.

[0013] Figure 1 This is a schematic diagram of an embodiment of the system for testing a seismic data acquisition device disclosed herein;

[0014] Figure 2 This is a schematic diagram of the structure of one embodiment of the connector disclosed herein;

[0015] Figure 3This is a schematic diagram of the electrical connections of the connector used for testing seismic data acquisition devices during conversion factor testing, as disclosed in this disclosure.

[0016] Figure 4 This is a schematic diagram of the electrical connection of the connector used for testing a seismic data acquisition device in this disclosure during an absolute clock difference test;

[0017] Figure 5 This is a schematic diagram of the electrical connection of the connector used for testing a seismic data acquisition device during an input short-circuit noise test, as disclosed in this disclosure.

[0018] Figure 6 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during the first step of testing the input impedance and crosstalk at the positive terminal of the first differential signal channel.

[0019] Figure 7 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during the second step of testing the positive terminal input impedance and crosstalk of the first differential signal channel;

[0020] Figure 8 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during the first step of testing the input impedance and crosstalk at the negative terminal of the first differential signal channel.

[0021] Figure 9 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during the second step of testing the input impedance at the negative terminal of the first differential signal channel and the crosstalk between paths.

[0022] Figure 10 This is a schematic diagram of the electrical connections of the system for testing seismic data acquisition devices disclosed herein during common-mode rejection ratio testing;

[0023] Figure 11 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during calibration current testing;

[0024] Figure 12 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during calibration voltage testing;

[0025] Figure 13 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during VLP acquisition testing;

[0026] Figure 14 This is a schematic diagram of the electrical connections of the system for testing a seismic data acquisition device disclosed herein during sensor communication testing;

[0027] Figure 15This is a schematic diagram of an electrical connection for testing the sensor control signal of the system for testing a seismic data acquisition device disclosed herein.

[0028] Figure 16 This is another electrical connection diagram of the system for testing a seismic data acquisition device disclosed herein during sensor control signal testing;

[0029] Figure 17 This is a schematic flowchart of an embodiment of the method for testing a seismic data acquisition device disclosed herein;

[0030] Figure 18 This is a schematic diagram of the main control interface of the seismic data acquisition test system in the host computer of this disclosure;

[0031] Figure 19 This is a structural diagram of an electronic device provided in an exemplary embodiment of this disclosure. Detailed Implementation

[0032] Example embodiments according to this disclosure will now be described in detail with reference to the accompanying drawings. It is obvious that the described embodiments are merely some embodiments of this disclosure, and not all embodiments of this disclosure, and it should be understood that this disclosure is not limited to the example embodiments described herein.

[0033] Exemplary System

[0034] Figure 1 This is a schematic diagram of an embodiment of the system for testing a seismic data acquisition device disclosed herein. Figure 1 The system shown mainly includes: a signal generator 100, a digital multimeter 110, and at least one seismic data acquisition unit 120. Figure 1 The example shows two seismic data acquisition units 120, a connector 130, and a host computer 140. Optionally, the system may also include a clock device 150 and / or at least one GNSS (Global Navigation Satellite System) timing module 160. The number of GNSS timing modules 160 is typically less than the number of seismic data acquisition units 120. Figure 1 Only one GNSS timing module 160 is shown as an example. It should be noted that the system may also include multiple connectors 130, and each connector 130 can connect to multiple seismic data acquisition units 120. For example, if the system includes two connectors 130, since each connector 130 can connect to two seismic data acquisition units 120, the system includes four seismic data acquisition units 120, so the system can sequentially perform performance testing / evaluation on the four seismic data acquisition units 120.

[0035] The signal generator 100 is connected to the connector 130 and the host computer 140, respectively. The signal generator 100 is primarily used to generate electrical signals of corresponding specifications according to the control of the host computer 140. These electrical signals are provided to the corresponding terminals of the seismic data acquisition unit 120. In this disclosure, the signal generator 100 refers to a device used for calibrating and testing the seismic data acquisition unit. The signal generator 100 can generate controllable simulated seismic wave signals of different intensities and frequencies, such as pulsed simulated seismic wave signals and synthetic seismic record signals. Additionally, the signal generator 100 can also generate standard electrical signals such as sine wave signals, square wave signals, triangular wave signals, and DC bias signals. The electrical signals generated by the signal generator 100 can be analog or digital signals. In one example, the signal generator 100 and the host computer 140 can exchange information using the VISA (Virtual Instrument Software Architecture) protocol, for example, using the NI VISA (National Instruments VISA) protocol.

[0036] Digital multimeter 110 is connected to connector 130 and host computer 140 respectively. Digital multimeter 110 is mainly used to measure electrical parameters in the test circuit according to the control of host computer 140 and transmit the measurement results to the host computer. Specifically, host computer 140 controls the state of the corresponding relay in connector 130, causing digital multimeter 110 connected to connector 130 to be connected to the test circuit. In this way, digital multimeter 110 can measure the electrical parameters in the test circuit and provide the measurement results to host computer 140. In one example, digital multimeter 110 and host computer 140 can exchange information using the VISA protocol (such as NI VISA).

[0037] The seismic data acquisition unit 120 is connected to the connector 130 and the host computer 140 respectively. If the system includes a GNSS timing module 160, the seismic data acquisition unit 120 is also connected to the GNSS timing module 160. If the system includes only one seismic data acquisition unit 120, that seismic data acquisition unit 120 is the device under test. If the system includes multiple seismic data acquisition units 120, the multiple seismic data acquisition units 120 will be used as the devices under test sequentially. Specifically, the host computer 140 controls the state of the corresponding relays in the connector 130 to allow the multiple seismic data acquisition units 120 to be connected to the test circuit sequentially. The seismic data acquisition unit 120 currently connected is the device under test. In one example, the seismic data acquisition unit 120 can connect to the host computer 140 via a network connection port. For example, the seismic data acquisition unit 120 and the host computer 140 can be connected via a LAN (Local Area Network), and the seismic data acquisition unit 120 and the host computer 140 can exchange information based on the common seismic data acquisition control protocol TCP / IP (Transmission Control Protocol / Internet Protocol).

[0038] The seismic data acquisition unit 120 is mainly used to perform corresponding processing operations on its input signals in its current test circuit and transmit the result information of the processing operations to the host computer; that is, by controlling the connection status of the corresponding terminals of the seismic data acquisition unit 120, the seismic data acquisition unit 120 is put into the corresponding test state. The result information here can refer to the information generated by the seismic data acquisition unit 120 in response to the input analog or digital signals in the corresponding test circuit. For example, the response information generated by the seismic data acquisition unit 120 based on the analog electrical signal generated by the signal generator 100 provided to its corresponding terminal by the test circuit; or the clock sampling signal generated by the clock device 150 provided to its corresponding terminal by the test circuit, etc. This disclosure does not limit the specific process by which the seismic data acquisition unit 120 generates result information on the input signals in the corresponding test circuit, nor does it limit the specific content of the result information transmitted by the seismic data acquisition unit 120 to the host computer 140.

[0039] Connector 130 is connected to signal generator 100, digital multimeter 110, each seismic data acquisition unit 120, and host computer 140 respectively. If the system includes clock device 150, connector 130 is also connected to clock device 150. Connector 130 mainly includes multiple ports, a data processor, a relay group, and a power module, etc., which are combined in the following embodiments. Figure 2The structure of connector 130 is described in detail.

[0040] Connector 130 is primarily used to control the state of each relay in relay group 205 according to the index test instructions transmitted from host computer 140, thereby enabling at least some of the signal generator 100, digital multimeter 110, each seismic data acquisition unit 120, and clock device 150 to connect with connector 130 to form a test circuit for the index to be tested. In one example, connector 130 and host computer 140 can use a custom control protocol for information exchange.

[0041] The host computer 140 is connected to the signal generator 100, the digital multimeter 110, each seismic data acquisition unit 120, the connector 130, and the clock device 150, respectively. In one example, the host computer 140 can be connected to the signal generator 100, the digital multimeter 110, each seismic data acquisition unit 120, the connector 130, and the clock device 150 via an RS-232 (Recommended Standard 232) serial port or a USB (Universal Serial Bus) interface, respectively.

[0042] The host computer 140 is mainly used to generate test control commands based on the current test index and send these commands to at least one of all connected devices. Since the test control command initiates the test process for the current test index, the host computer 140 receives information transmitted from the connected devices. By analyzing and calculating the received information, the host computer 140 can obtain the test results of the seismic data acquisition device (the device currently under test) for the current test index. The host computer 140 disclosed herein can be an electronic device such as a computer, server, or tablet computer.

[0043] In one example, the aforementioned test control commands may include one or more instructions, such as index test instructions and electrical signal control instructions. The index test instructions are used to control the state of each relay in connector 130, and the electrical signal control instructions are used to control signal generator 100 to generate electrical signals of corresponding specifications (such as square wave signals).

[0044] In one example, the host computer 140 can summarize the test results of all test indicators of all seismic data acquisition devices 120, form an indicator test report for each seismic data acquisition device 120, and display it to the user.

[0045] The clock device 150 is connected to the connector 130, and the clock device 150 is mainly used to generate a standard clock signal (such as a minute pulse signal). The standard clock signal is transmitted to the seismic data acquisition unit 120 via the connector 130.

[0046] The GNSS timing module 160 is connected to at least one seismic data acquisition unit 120. For example, if the GNSS timing module 160 can output four IRIG (Inter-Range Instrumentation Group) timecode signals, it can simultaneously connect to four seismic data acquisition units 120. The GNSS timing module 160 is mainly used to test the time synchronization performance of the seismic data acquisition units 120. The GNSS timing module 160 and the host computer 140 can exchange information using the VISA protocol (such as NI VISA).

[0047] In one example, the structure of connector 130 of this disclosure is as follows: Figure 2 As shown. Figure 2 The connector 130 mainly includes: a signal source port 200, a multimeter port 201, a first serial interface 202, and at least one data acquisition device port 203. Figure 2 Only two data acquisition ports 203, data processor 204, relay group 205, second serial interface 206, power module 207 and clock device port 208 are shown as examples.

[0048] It should be noted that, in order to adapt to the corresponding test circuit, connector 130 also includes multiple resistors and other components, such as multiple high-resistance resistors with a resistance of not less than 100kΩ (as shown in the figure, the resistor with a resistance of 200kΩ), multiple low-resistance resistors with a resistance of not more than 200Ω (as shown in the figure, the resistor with a resistance of 100Ω), and series resistor R2, etc.

[0049] Figure 2 The signal source port 200 is connected to the output terminal of the signal generator 100, that is, the structure of the signal source port 200 is adapted to the structure of the output terminal of the signal generator 100 (such as the signal source port 200 including positive terminal and negative terminal), and the connector 130 obtains the signal generated by the signal generator 100 through the signal source port 200.

[0050] Figure 2The multimeter port 201 is connected to the input terminal of the digital multimeter 110, meaning the structure of the multimeter port 201 is adapted to the structure of the input terminal of the digital multimeter 110 (e.g., the multimeter port 201 includes positive and negative terminals). The connector 130 allows the digital multimeter 110 to measure the object being measured (such as current or voltage in a circuit) through the multimeter port 201. The digital multimeter 110 disclosed herein refers to a multifunctional measuring tool capable of measuring electrical parameters such as voltage, current, and resistance. This digital multimeter 110 is typically a high-precision digital multimeter, and it can interact with the host computer 140.

[0051] In one example, the positive terminal of digital multimeter 110 is connected to the positive terminal of signal generator 100 via multimeter port 201, relays in relay group 205, and signal source port 200, and the negative terminal of multimeter 210 is connected to the negative terminal of signal generator 100 via multimeter port 201, relays in relay group 205, and signal source port 200.

[0052] In another example, the positive terminal of multimeter 210 is connected to one terminal of seismic data acquisition device 120 via multimeter port 201, relays in relay group 205, and data acquisition port 203, and the negative terminal of multimeter 210 is connected to another terminal of seismic data acquisition device 120 via multimeter port 201, relays in relay group 205, and data acquisition port 203.

[0053] Figure 2 The first serial interface 202 is connected to the serial interface of the host computer 140, that is, the connector 130 interacts with the host computer 140 through the first serial interface 202. The first serial interface 202 can be an asynchronous serial interface or a synchronous serial interface, such as an RS-232 serial port or a USB interface.

[0054] Figure 2The data acquisition port 203 is connected to the input terminal of the seismic data acquisition device 120, and the data acquisition port 203 includes multiple differential signal channels. For example, the data acquisition port 203 includes a first differential signal channel, a second differential signal channel, and a third differential signal channel, etc., and each differential signal channel includes a positive terminal and a negative terminal. The seismic data acquisition device 120 of this disclosure refers to an electronic device that can perform analog front-end processing (such as filtering, amplification, and bias adjustment), analog-to-digital conversion processing, and digital signal processing (such as digital filtering, baseline correction, denoising, and calibration) on seismic wave signals obtained by seismic sensors such as detectors and seismometers, and store the processed seismic wave signals. The seismic data acquisition device 120 acquires signals through the data acquisition port 203. The structure of the data acquisition port 203 is usually adapted to the structure of the input terminal of the seismic data acquisition device 120. In one example, the terminals (also referred to as pins) included in the data acquisition port 203 are shown in Table 1 below:

[0055] Table 1

[0056] Terminal / pin numbers of the data acquisition unit port Terminal / Pin Name Signal descriptions for terminals / pins U VLP_W+ W-to-zero voltage V VLP_V+ V-direction zero-point voltage T VLP_U+ U-direction zero-point voltage F CH3- EW - Output E CH3+ EW+ Output D CH2- NS - Output C CH2+ NS+ output B CH1- UD - Output A CH1+ UD+ Output H CALI_IN Calibration signal input X / W AGND (calibration) signal ground Y CALI_EN (Calibration Enable) L ZERO_ADJ Seismograph control (zeroing) M UNLOCK Seismograph control (open swing) N LOCK Seismograph control (locking pendulum) J VDD Power positive K PGND power ground P TXD Serial communication negative OR transmission a RXD Serial communication positive or negative reception R EARTH Shielding layer

[0057] In one example, when connector 130 includes a data acquisition port 203, multiple terminals in data acquisition port 203 are connected to the test circuit via multiple relays in relay group 205. For example, the positive and / or negative terminals of the three differential signal channels of seismic data acquisition device 120 are connected to the positive / negative terminals of signal generator 100 / ground terminal of connector 130 via data acquisition port 203, at least one relay, and signal source port 200.

[0058] In another example, connector 130 includes two or more data acquisition ports 203 (such as...). Figure 3 In the case of data acquisition port A and data acquisition port B in the relay group 205, multiple terminals in the data acquisition port 203 selected / connected by the corresponding relay in the relay group 205 are connected to the test circuit through multiple relays. That is, the present disclosure can determine the seismic data acquisition device 120 that is currently being tested by the relay in the relay group 205 that is responsible for switching the access state of the data acquisition port 203.

[0059] By setting a relay in the relay group 205 responsible for switching the access status of the data acquisition port 203 (i.e., a relay for switching the seismic data acquisition 120), the connector 130 of this disclosure can be connected to multiple seismic data acquisitions 120 simultaneously through its multiple data acquisition ports 203. This allows for sequential testing of the performance indicators of multiple seismic data acquisitions 120, which is beneficial to further improve the automation level of seismic data acquisition testing and thus further improve the efficiency of seismic data acquisition performance testing / evaluation.

[0060] Figure 2 The data processor 204 is connected to the first serial interface 202, the relay group 205, the second serial interface 206, and the power module 207, respectively. The data processor 204 can interact with the host computer 140 via the first serial interface 202. Based on information sent by the host computer 140 (such as indicator test commands), the data processor 204 can control the state of each relay in the relay group 205 via the second serial interface 206. This allows at least some of the signal generator 100, multimeter 210, seismic data acquisition device 120, and clock device 150, together with the connector 130, to form a corresponding indicator test circuit for the seismic data acquisition device 120. The second serial interface 206 can also be an RS-232 serial port, etc. By setting a second serial interface 206 between the data processor 204 and the relay group 205, it is beneficial to simplify the connection circuit between the data processor 204 and the relay group 205 and to simplify the control logic of the data processor 204 on the relay group 205. This not only helps to reduce the hardware implementation cost of the connector 130, but also helps to improve the performance stability of the connector 130.

[0061] Figure 2The relay group 205 can include various types of relays such as single-pole four-throw relays, single-pole double-throw relays, single-pole single-throw relays, and double-pole single-throw relays. The state of each relay (e.g., the closed state, open state, and which contact the common terminal of the relay is connected to) is controlled by the data processor 204. For example, the host computer 140 generates an index test command based on the index test requirements (e.g., the index test command contains the identifier of the seismic data acquisition device currently under test) and transmits it to the data processor 204 via the first serial interface 202. The data processor 204 controls the state of each relay in the relay group 205 according to the received index test command via the second serial interface 206 (e.g., controls the state of the relay used to switch the seismic data acquisition device). This allows at least some of the signal generator 100, multimeter 210, seismic data acquisition device 120 currently under test, and clock device 150 to form a corresponding index test circuit together with the relay in the connector 130, thereby realizing the test of one or more indicators of the corresponding seismic data acquisition device 120. Each relay in relay group 205 can be in the open state (also known as the disconnected state). A relay in the disconnected state disconnects the circuits on both sides of it.

[0062] In one example, relay group 205 includes relays S1, S2, S3, S4, S5, S6, S13, and S14. These relays are mainly used to establish different connection states between the multiple differential signal channels in the seismic data acquisition unit 120 and the signal generator 100, so as to facilitate the formation of index testing circuits for the differential signal channels. Specifically:

[0063] When relay S1 is connected to its common terminal and the first contact, the positive terminal of the first differential signal channel of the seismic data acquisition device 120 is connected to the positive terminal of the signal generator 100 through the first resistor and relay S13. When relay S1 is connected to its common terminal and the second contact, the positive terminal of the first differential signal channel of the seismic data acquisition device 120 is short-circuited to the positive terminal of the signal generator 100 through relay S13. When relay S1 is connected to its common terminal and the third contact, the positive terminal of the first differential signal channel of the seismic data acquisition device 120 is short-circuited to the ground of connector 130. When relay S1 is connected to its common terminal and the fourth contact, the positive terminal of the first differential signal channel of the seismic data acquisition device 120 is connected to the ground of connector 130 through the second resistor. Alternatively, relay S1 can also be in the open state, in which case the positive terminal of the first differential signal channel of the seismic data acquisition device 120 is not connected to the positive terminal of the signal generator 100 or the ground of connector 130.

[0064] When relay S2 is connected to its common terminal and the first contact, the positive terminal of the second differential signal channel of the seismic data acquisition device 120 is connected to the positive terminal of the signal generator 100 through the third resistor and relay S13. When relay S2 is connected to its common terminal and the second contact, the positive terminal of the second differential signal channel of the seismic data acquisition device 120 is short-circuited to the positive terminal of the signal generator 100 through relay S13. When relay S2 is connected to its common terminal and the third contact, the positive terminal of the second differential signal channel of the seismic data acquisition device 120 is short-circuited to the ground of connector 130. When relay S2 is connected to its common terminal and the fourth contact, the positive terminal of the second differential signal channel of the seismic data acquisition device 120 is connected to the ground of connector 130 through the fourth resistor. Alternatively, relay S2 can also be in the open state, in which case the positive terminal of the second differential signal channel of the seismic data acquisition device 120 is not connected to the positive terminal of the signal generator 100 or the ground of connector 130.

[0065] When relay S3 is connected to its common terminal and the first contact, the positive terminal of the third differential signal channel of the seismic data acquisition unit 120 is connected to the positive terminal of the signal generator 100 through the fifth resistor and relay S13. When relay S3 is connected to its common terminal and the second contact, the positive terminal of the third differential signal channel of the seismic data acquisition unit 120 is short-circuited to the positive terminal of the signal generator 100 through relay S13. When relay S3 is connected to its common terminal and the third contact, the positive terminal of the third differential signal channel of the seismic data acquisition unit 120 is short-circuited to the ground of connector 130. When relay S3 is connected to its common terminal and the fourth contact, the positive terminal of the third differential signal channel of the seismic data acquisition unit 120 is connected to the ground of connector 130 through the sixth resistor. Alternatively, relay S3 can also be in the open state, in which case the positive terminal of the third differential signal channel of the seismic data acquisition unit 120 is not connected to the positive terminal of the signal generator 100 or the ground of connector 130.

[0066] When relay S4 is connected to the first contact at its common terminal, the negative terminal of the first differential signal channel of the seismic data acquisition unit 120 is connected to either the positive or negative terminal of the signal generator 100 through the seventh resistor and relay S14. When relay S4 is connected to the second contact at its common terminal, the negative terminal of the first differential signal channel of the seismic data acquisition unit 120 is short-circuited to either the positive or negative terminal of the signal generator 100 through relay S14. When relay S4 is connected to the third contact at its common terminal, the negative terminal of the first differential signal channel of the seismic data acquisition unit 120 is short-circuited to the ground of connector 130. When relay S4 is connected to the fourth contact at its common terminal, the negative terminal of the first differential signal channel of the seismic data acquisition unit 120 is connected to the ground of connector 130 through the eighth resistor. Alternatively, relay S4 can also be in the open state, in which case the negative terminal of the first differential signal channel of the seismic data acquisition unit 120 is not connected to the positive or negative terminals of the signal generator 100 or the ground of connector 130.

[0067] When relay S5 is connected to its common terminal and the first contact, the negative terminal of the second differential signal channel of the seismic data acquisition unit 120 is connected to either the positive or negative terminal of the signal generator 100 through the ninth resistor and relay S14. When relay S5 is connected to its common terminal and the second contact, the negative terminal of the second differential signal channel of the seismic data acquisition unit 120 is short-circuited to either the positive or negative terminal of the signal generator 100 through relay S14. When relay S5 is connected to its common terminal and the third contact, the negative terminal of the second differential signal channel of the seismic data acquisition unit 120 is short-circuited to the ground of connector 130. When relay S5 is connected to its common terminal and the fourth contact, the negative terminal of the second differential signal channel of the seismic data acquisition unit 120 is connected to the ground of connector 130 through the tenth resistor. Alternatively, relay S5 can also be in the open state, in which case the negative terminal of the second differential signal channel of the seismic data acquisition unit 120 is not connected to the positive or negative terminals of the signal generator 100 or the ground of connector 130.

[0068] When relay S6 is connected to its common terminal and the first contact, the negative terminal of the third differential signal channel of the seismic data acquisition unit 120 is connected to the positive or negative terminal of the signal generator 100 through the eleventh resistor and relay S14. When relay S6 is connected to its common terminal and the second contact, the negative terminal of the third differential signal channel of the seismic data acquisition unit 120 is short-circuited to the positive or negative terminal of the signal generator 100 through relay S14. When relay S6 is connected to its common terminal and the third contact, the negative terminal of the third differential signal channel of the seismic data acquisition unit 120 is short-circuited to the ground of connector 130. When relay S6 is connected to its common terminal and the fourth contact, the negative terminal of the third differential signal channel of the seismic data acquisition unit 120 is connected to the ground of connector 130 through the twelfth resistor. Alternatively, relay S6 can also be in the open state, in which case the negative terminal of the third differential signal channel of the seismic data acquisition unit 120 is not connected to the positive or negative terminal of the signal generator 100 or the ground of connector 130.

[0069] The resistance values ​​of the first, third, fifth, seventh, ninth, and eleventh resistors mentioned above all exceed 100 kilohms, while the resistance values ​​of the second, fourth, sixth, eighth, tenth, and twelfth resistors mentioned above all do not exceed 200 ohms.

[0070] Figure 2 The power module 207 is connected to the data processor 204 and the relay group 205 respectively, thereby providing power resources to each relay in the data processor 204 and the relay group 205. In addition, the power module 207 can also provide power resources to other electrical components (such as indicator lights) in the connector 130.

[0071] In one example, power module 207 can connect to connector 130 via seismic data acquisition unit 120. If connector 130 includes a data acquisition port 203, the positive terminal of power module 207 is connected to the positive power terminal of data acquisition port 203, and the negative terminal of power module 207 is connected to the negative power terminal of data acquisition port 203, thereby allowing seismic data acquisition unit 120 to provide power to connector 130. If connector 130 includes multiple data acquisition ports 203, the positive terminal of power module 207 is connected to the positive power terminal of only one of the data acquisition ports, and the negative terminal of power module 207 is connected to the negative power terminal of only that data acquisition port. The positive and negative power terminals of other data acquisition ports should be isolated from the positive and negative terminals of power module 207. For example, in Figures 3-16 In this configuration, the positive terminal of power module 207 is connected to the positive power terminal of data acquisition port A, and the negative terminal of power module 207 is connected to the negative power terminal of data acquisition port A. Neither the positive nor negative power terminals of data acquisition port B are connected to the positive or negative terminals of power module 207. By utilizing the power resources of seismic data acquisition device 120 to connect to connector 130, a separate power supply for connector 130 is unnecessary, making connector 130 easier to use and simplifying system setup.

[0072] The clock device port 208 is used to connect the standard clock signal generated by the external clock device 150 to the connector 130. By controlling the state of multiple relays in the relay group 205, an absolute clock error index test circuit can be formed, thereby enabling the testing / evaluation of the absolute clock error index of each differential signal channel in the corresponding seismic data acquisition device 120.

[0073] The following is combined with Figure 3-16 The figure illustrates, using a specific indicator test scenario as an example, a detailed description of the electrical connections formed by the system disclosed in this disclosure for testing seismic data acquisition devices.

[0074] Figure 3 This is a schematic diagram of the electrical connections used when testing the conversion factor based on different ranges for the three differential signal channels of seismic data acquisition device A.

[0075] Figure 3In this disclosure, connector 130 includes two data acquisition ports, namely data acquisition port A and data acquisition port B; GND represents the ground of connector 130; GND_A represents the ground terminal (i.e., power ground terminal) of data acquisition port A, and GND_B represents the ground terminal (i.e., power ground terminal) of data acquisition port B; CH1+_A, CH2+_A, and CH3+_A represent the positive terminals of the first differential signal channel, the second differential signal channel, and the third differential signal channel of data acquisition port A, respectively; CH1-_A, CH2-_A, and CH3-_A represent the first differential signal channel of data acquisition port A, respectively. The negative terminals of the first, second, and third differential signal channels are: CH1+_B, CH2+_B, and CH3+_B; CH1-_B, CH2-_B, and CH3-_B represent the positive terminals of the first, second, and third differential signal channels, respectively, at port B of the data acquisition unit; CH1-_B, CH2-_B, and CH3-_B represent the negative terminals of the first, second, and third differential signal channels, respectively, at port B of the data acquisition unit; 200kΩ represents a 200kΩ resistor, and 100Ω represents a 100Ω resistor; S represents a relay; GND_COM and CH1+_COM... CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM represent the common terminal of relay S8 (used for switching between GND_A and GND_B), the common terminal of relay S17 (used for switching between CH1+_A and CH1+_B), ..., the common terminal of relay S22 (used for switching between CH3-_A and CH3-_B), respectively. The meanings of these symbols when they appear in other diagrams are the same as... Figure 3 The same applies, and will not be repeated hereafter.

[0076] Figure 3In this design, relays S1, S2, S3, S4, S5, and S6 can all be single-pole four-throw relays. S7 can be a double-pole single-throw relay; however, in this disclosure, two single-pole single-throw relays can be used to replace S7. S8, S17, S18, S19, S20, S21, and S22 are all relays used for switching seismic data acquisition devices, and can all be single-pole double-throw relays. CH1+_A, CH2+_A, and CH3+_A can be connected to the positive terminal of signal source port 200 via S13; CH1+_A, CH2+_A, and CH3+_A can be connected to the negative terminal of signal source port 200 via S13 and S16; CH1-_A, CH2-_A, and CH3-_A can be connected to either the positive or negative terminal of signal source port 200 via S14; CH1-_A, CH2-_A, and CH3-_A can also be connected to the positive terminal of signal source port 200 via S16 and S13; similarly... CH1+_B, CH2+_B, and CH3+_B can be connected to the positive terminal of signal source port 200 via S13; CH1+_B, CH2+_B, and CH3+_B can be connected to the negative terminal of signal source port 200 via S13 and S16; CH1-_B, CH2-_B, and CH3-_B can be connected to either the positive or negative terminal of signal source port 200 via S14; CH1-_B, CH2-_B, and CH3-_B can also be connected to the positive terminal of signal source port 200 via S16 and S13. S15 is used to connect the negative terminal of signal source port 200 to GND. S41 can be a double-pole single-throw relay. Of course, two single-pole single-throw relays can also be used to replace S41. S41 is used to connect CH1+_A, CH2+_A, CH3+_A, CH1-_A, CH2-_A and CH3-_A to the clock signal, or to connect CH1+_B, CH2+_B, CH3+_B, CH1-_B, CH2-_B and CH3-_B to the clock signal.

[0077] Figure 3 In the circuit, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 respectively connect to their first contacts; the common terminals of S1, S2, S3, S4, S5, and S6 respectively connect to their second contacts; and the common terminals of S13 and S14 respectively connect to their first contacts. S7 is in a closed state (i.e., a conducting state), causing the multimeter 210 (i.e.,...) to... Figure 3 The positive terminal of the high-precision multimeter in the middle is connected to the signal generator 100 (i.e., Figure 3The positive terminal of the signal source (the signal source in each of the following figures also represents the signal generator 100, which will not be described one by one) is connected, and the negative terminal of the multimeter 210 is connected to the negative terminal of the signal generator 100; and S15, S16 and S41 are all in the open state (i.e., the open state).

[0078] S1, S2, S3, S13, S17, S18 and S19 work together to short-circuit CH1+_A, CH2+_A and CH3+_A to the positive terminal of signal generator 100 respectively;

[0079] S4, S5, S6, S14, S20, S21 and S22 work together to short-circuit CH1-_A, CH2-_A and CH3-_A to the negative terminal of signal generator 100 respectively;

[0080] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0081] use Figure 3 The electrical connections shown allow for the measurement of the conversion factors based on different ranges for the three differential signal channels in data acquisition port A. If the second contact of the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of relays S8, S17, S18, S19, S20, S21, and S22 is connected respectively, while the states of the other relays remain unchanged, then the conversion factors based on different ranges for each channel in data acquisition port B can be measured.

[0082] In one example, using Figure 3 The process of converting the three differential signal channels in port A of the electrical connection measurement data acquisition unit, based on different ranges, may include the following steps:

[0083] Step 1: Host computer 140, reset signal generator 100, digital multimeter 110, and connector 130;

[0084] Step 2: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 3 As shown;

[0085] Step 3: Arrange all ranges (e.g., four ranges) of the seismic data acquisition device (hereinafter referred to as seismic data acquisition device A) connected to port A in ascending order;

[0086] Step 4: Select a range according to the range arrangement order, set the range of the seismic data acquisition device A to the selected range, and control the host computer 140 to control the signal generator 100 to output a square wave signal with a width of 20s, a duty cycle of 50%, and an amplitude of FS (Full Scale) / 2.

[0087] Step 5: The host computer 140 controls the digital multimeter 110 to continuously read the same potential (such as high potential / low potential) three times in a row. Then, the average value of the same potential obtained from the three readings is calculated and recorded as v1.

[0088] Step 6: The host computer 140 reads the count values ​​of the three differential signal channels within 4 to 1 seconds before the current time from the data buffer queue of the acquisition unit, and calculates the average value of each, which is recorded as k1. The count values ​​of the three differential signal channels in this step are the processing results of the square wave signals input by the seismic data acquisition unit A for the three differential signal channels.

[0089] Step 7: The host computer 140 controls the digital multimeter 110 to read continuously until the same potential opposite to that in step 5 is read 3 times in a row. Then, the average value of the same potential obtained 3 times is calculated and recorded as v2.

[0090] Step 8: The host computer 140 reads the count values ​​of the three differential signal channels within 4 to 1 seconds before the current time from the data buffer queue of the acquisition unit, and calculates the average value of each, which is denoted as k2. The count values ​​of the three differential signal channels in this step are also the processing results of the square wave signals input by the seismic data acquisition unit A for the three differential signal channels.

[0091] Step 9: Calculate the conversion factor c of each of the three differential signal channels of the seismic data acquisition device A according to the following formula (1), and record the conversion factor c of each of the three differential signal channels;

[0092] Formula (1)

[0093] Repeat steps 4-9 above until the conversion factor for all ranges has been tested.

[0094] Figure 4 This is a schematic diagram of the electrical connections used to test the absolute clock difference of each of the three differential signal channels.

[0095] Figure 4In the circuit, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact; the common terminals of S1, S2, S3, S4, S5, and S6 are each connected to their second contact; S7, S13, S14, S15, and S16 are all in the open state (i.e., the open state); and S41 is in the closed state (i.e., the closed state).

[0096] S1, S2, S3, S4, S5, S6, S17, S18, S19, S20, S21, S22, and S41 work together to ensure that the clock signal generated by the clock device 150 enters CH1+_A, CH2+_A, CH3+_A, CH1-_A, CH2-_A, and CH3-_A through the clock device port 208;

[0097] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0098] use Figure 4 The electrical connections shown can be used to test the absolute clock bias of the three differential signal channels in data acquisition port A. If the second contact of the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of relays S8, S17, S18, S19, S20, S21, and S22 is each connected, while the states of the other relays remain unchanged, the absolute clock bias of the three differential signal channels in data acquisition port B can be measured. The absolute clock bias obtained by this disclosure can reach the microsecond level.

[0099] In one example, using Figure 4 The process of determining the absolute clock difference of the three differential signal channels in port A of the electrical connection measurement data acquisition unit shown may include the following steps:

[0100] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 4 As shown, this allows the pulse signal (i.e., the standard clock signal) generated by the clock device to be connected to each differential signal channel of the seismic data acquisition unit A. The following explanation uses a sub-pulse signal (i.e., one pulse signal per minute, with a high level for the first 30 seconds and a low level for the last 30 seconds) as an example. The host computer 140 receives the sub-pulse sampling signals acquired and output by the seismic data acquisition unit A through the acquisition thread and stores them in the data buffer queue.

[0101] Step 2: When the host computer 140 detects that it has received the pulse period start signal (in the case of using a divided pulse signal, the pulse period start signal can be called the clock division signal, and the pulse period start signal can be specifically a narrow pulse signal or a level flip signal, etc.), it delays for 10 seconds and proceeds to step 3.

[0102] Step 3: The host computer 140 reads three continuous 10-second pulse sampling signals from the data buffer queue, and ensures that the read 10-second pulse sampling signals are the pulse sampling signal data of the first 5 seconds and the last 5 seconds of the clock division signal.

[0103] Step 4: The host computer 140 resamples the read pulse sampling signals at a sampling frequency of 10000sps (Samples Per Second), and extracts the middle 4s of the pulse resampled signal x(i) for each resampled pulse signal, where i=1,2,...,40000 (i.e., the pulse resampled signals 2s before and 2s after the clock division signal).

[0104] Step 5: For each sub-pulse resampling signal, calculate the mean value of x(i) (i=1, 2, ... 10000) for the first 1 second and the mean value of x(i) (i=30001, 30002, ..., 40000) for the last 1 second, and take the difference between the latter and the former as the high potential value h, thereby obtaining the high potential value h of each sub-pulse resampling signal;

[0105] Step 6: In the three intermediate 4s resampled pulse signals x(i) (i=1, 2, ..., 40000) obtained in Step 4 above, query from front to back to obtain the first resampled pulse signal greater than 1 / 2h, and record the index (i.e., time point i) of the resampled pulse signal. Use the following formula (2) to calculate the time offset of the three pulse signals rising to 1 / 2h, i.e., the absolute clock difference. :

[0106] Formula (2)

[0107] In the above formula (2), k is the time point of the resampled signal with a potential value of 1 / 2h, and i is the time point of the first resampled signal with a potential value greater than 1 / 2h. This represents the potential value of the first resampled pulse signal greater than 1 / 2h that was found. This represents the potential value of the previous sub-pulse resampled signal of the first sub-pulse resampled signal found that is greater than 1 / 2h.

[0108] Figure 5This is a schematic diagram of the electrical connections used when testing for the input short-circuit noise parameter.

[0109] Figure 5 In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact; the common terminals of S1, S2, S3, S4, S5, and S6 are each connected to their third contact; and S7, S13, S14, S15, S16, and S41 are all in the open state (i.e., the open state).

[0110] S1, S2, S3, S17, S18 and S19 work together to short CH1+_A, CH2+_A and CH3+_A to GND of connector 130 respectively;

[0111] S4, S5, S6, S20, S21 and S22 work together to short CH1-_A, CH2-_A and CH3-_A to GND of connector 130 respectively;

[0112] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0113] use Figure 5 The electrical connections shown can be used to test the input short-circuit noise (i.e., self-noise) of each of the three differential signal channels in port A of the data acquisition unit based on different ranges. If the second contact of each of the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 is connected, while the states of the other relays remain unchanged, the input short-circuit noise of each differential signal channel in port B of the data acquisition unit based on different ranges can be tested.

[0114] In one example, using Figure 5 The process of input short-circuit noise based on different ranges in the three differential signal channels of port A of the electrical connection measurement data acquisition unit shown may include the following steps:

[0115] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 5 As shown, the positive and negative terminals of the three differential signal channels are all shorted to ground;

[0116] Step 2: The host computer 140 arranges the ranges of seismic data acquisition device A in ascending order;

[0117] Step 3: The host computer 140 selects a range according to the range arrangement order and sets the range of the seismic data acquisition device A to the selected range S. The host computer 140 can also set the sampling frequency of the seismic data acquisition device A to 100sps and wait for more than 63s. The host computer 140 receives the sampling data of the three differential signal channels output by the seismic data acquisition device A through the acquisition thread and stores the three sampling data in the data buffer queue.

[0118] Step 4: The host computer 140 reads the sampling data of the three differential signal channels from the data buffer queue 61-1s before the current time, and calculates the input short-circuit self-noise N of the three differential signal channels of the seismic data acquisition device A based on the current range according to the following formula (3). rms ;

[0119] Formula (3)

[0120] In the above formula (3), This represents the i-th sampled data, and FS represents the full-scale range of the measurement range S. express The corresponding voltage value.

[0121] By repeating steps 3-4 above, the input short-circuit self-noise of each of the three differential signal channels of seismic data acquisition device A based on all ranges can be obtained.

[0122] Figure 6-9 This is a schematic diagram of the electrical connections used to test the input impedance and crosstalk at the positive and negative terminals of the first differential signal channel.

[0123] Figure 6 In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact; the common terminal of S1 is connected to its second contact; the common terminals of S2, S3, S5, and S6 are each connected to their fourth contact; the common terminal of S4 is connected to its third contact; S7, S14, S16, and S41 are all in the open state (i.e., the open state); the common terminal of S13 is connected to its first contact; and the common terminal of S15 is connected to its second contact.

[0124] S1, S17, and S13 work together to short-circuit CH1+_A with the positive terminal of signal generator 100;

[0125] S2, S3, S5, S6, S18, S19, S21, and S22 work together to connect CH2+_A, CH3+_A, CH2-_A, and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0126] S4 and S20 work together to short CH1-_A with GND of connector 130;

[0127] S8 shorts the ground terminal GND_A in port A of the data acquisition unit with the GND of connector 130.

[0128] Figure 7 In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact. The common terminal of S1 is connected to its first contact. The common terminals of S2, S3, S5, and S6 are each connected to their fourth contact. The common terminal of S4 is connected to its third contact. S7, S14, S16, and S41 are all in the open state (i.e., the open state). The common terminal of S13 is connected to its first contact. The common terminal of S15 is connected to its second contact.

[0129] S1, S17, and S13 work together to connect CH1+_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor).

[0130] S2, S3, S5, S6, S18, S19, S21, and S22 work together to connect CH2+_A, CH3+_A, CH2-_A, and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0131] S4 and S20 work together to short CH1-_A with GND of connector 130;

[0132] S8 shorts the ground terminal GND_A in port A of the data acquisition unit with the GND of connector 130.

[0133] use Figure 6 and Figure 7 The electrical connections shown can be used to measure the input impedance and crosstalk of the CH1+_A channel at different ranges, i.e., using... Figure 6 The aforementioned electrical connection completes the first step of measuring the input impedance and crosstalk of the CH1+_A channel based on different ranges. Afterwards, using... Figure 7The electrical connections shown complete the second step of measuring the input impedance and crosstalk of the CH1+_A channel based on different ranges, thus completing the entire process of measuring the input impedance and crosstalk of the CH1+_A channel based on different ranges.

[0134] If Figure 6 In step S20, S21, and S22, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of each relay are connected to their second contacts, while the states of the other relays remain unchanged. Figure 7 By connecting the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 to their respective second contacts, while keeping the states of the other relays unchanged, the input impedance and crosstalk of the CH1+_B ​​channel based on different ranges can be measured.

[0135] If Figure 6 The states of S1 and S2 are swapped, and the states of S1 and S2 are swapped. Figure 6 The states of S4 and S5 are swapped, while the states of other relays remain unchanged.

[0136] The common terminal of S2 connects to its second contact, the common terminals of S1, S3, S4 and S6 each connect to their fourth contact, the common terminal of S5 connects to its third contact, S7, S14, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S13 connects to its first contact, and the common terminal of S15 connects to its second contact.

[0137] S2, S18 and S13 work together to short-circuit CH2+_A with the positive terminal of signal generator 100;

[0138] S1, S3, S4, S6, S17, S19, S20 and S22 work together to connect CH1+_A, CH3+_A, CH1-_A and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0139] S5 and S21 work together to short CH2-_A with GND of connector 130;

[0140] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0141] This disclosure can complete the first step of measuring the input impedance and crosstalk of the CH2+_A channel based on different ranges.

[0142] If Figure 7 The states of S1 and S2 are swapped, and Figure 7 The states of S4 and S5 are swapped, while the states of other relays remain unchanged.

[0143] The common terminal of S2 connects to its first contact, the common terminals of S1, S3, S4 and S6 each connect to their fourth contact, the common terminal of S5 connects to its third contact, S7, S14, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S13 connects to its first contact, and the common terminal of S15 connects to its second contact.

[0144] S2, S18, and S13 work together to connect CH2+_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor);

[0145] S1, S3, S4, S6, S17, S19, S20 and S22 work together to connect CH1+_A, CH3+_A, CH1-_A and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0146] S5 and S21 work together to short CH2-_A with GND of connector 130;

[0147] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0148] This disclosure can complete the second step of measuring the input impedance and crosstalk of the CH2+_A channel based on different ranges, thereby completing the entire process of measuring the input impedance and crosstalk of the CH2+_A channel based on different ranges.

[0149] In addition, by controlling S8, S17, S18, S19, S20, S21 and S22, the entire process of measuring the input impedance and crosstalk of the CH2+_B channel based on different ranges can be completed.

[0150] If Figure 6 The states of S1 and S3 are swapped, and the states of S1 and S3 are swapped. Figure 6 The states of S4 and S6 are swapped, while the states of the other relays remain unchanged.

[0151] The common terminal of S3 connects to its second contact, the common terminals of S1, S2, S4 and S5 each connect to their fourth contact, the common terminal of S6 connects to its third contact, S7, S14, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S13 connects to its first contact, and the common terminal of S15 connects to its second contact.

[0152] S3, S19 and S13 work together to short-circuit CH1+_A with the positive terminal of signal generator 100;

[0153] S1, S2, S4, S5, S17, S18, S20 and S21 work together to connect CH1+_A, CH2+_A, CH1-_A and CH2-_A to the GND of connector 130 through low-resistance resistors (such as resistors with a resistance of 100Ω);

[0154] S6 and S22 work together to short CH3-_A with GND of connector 130;

[0155] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0156] This disclosure can complete the first step of measuring the input impedance and crosstalk of the CH3+_A channel based on different ranges.

[0157] If Figure 7 The states of S1 and S3 are swapped, and Figure 7 The states of S4 and S6 are swapped, while the states of the other relays remain unchanged.

[0158] The common terminal of S3 connects to its first contact, the common terminals of S1, S2, S4 and S5 each connect to their fourth contact, the common terminal of S6 connects to its third contact, S7, S14, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S13 connects to its first contact, and the common terminal of S15 connects to its second contact.

[0159] S3, S19, and S13 work together to connect CH3+_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor).

[0160] S1, S2, S4, S5, S17, S18, S20 and S21 work together to connect CH1+_A, CH2+_A, CH1-_A and CH2-_A to the GND of connector 130 through low-resistance resistors (such as resistors with a resistance of 100Ω);

[0161] S6 and S22 work together to short CH3-_A with GND of connector 130;

[0162] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0163] This disclosure can complete the second step of measuring the input impedance and crosstalk of the CH3+_A channel based on different ranges, thereby completing the entire process of measuring the input impedance and crosstalk of the CH3+_A channel based on different ranges.

[0164] In addition, by controlling S8, S17, S18, S19, S20, S21 and S22, the entire process of measuring the input impedance and crosstalk of the CH3+_B channel based on different ranges can be completed.

[0165] Figure 8 In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact. The common terminal of S1 is connected to its third contact. The common terminals of S2, S3, S5, and S6 are each connected to their fourth contact. The common terminal of S4 is connected to its second contact. S7, S13, S16, and S41 are all in the open state (i.e., the open state). The common terminal of S14 is connected to its second contact. The common terminal of S15 is connected to its second contact.

[0166] S1 and S17 work together to short CH1+_A with GND of connector 130;

[0167] S2, S3, S5, S6, S18, S19, S21, and S22 work together to connect CH2+_A, CH3+_A, CH2-_A, and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0168] S4, S14 and S20 work together to short-circuit CH1-_A with the positive terminal of signal generator 100;

[0169] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0170] Figure 9In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contact. The common terminal of S1 is connected to its third contact. The common terminals of S2, S3, S5, and S6 are each connected to their fourth contact. The common terminal of S4 is connected to its first contact. S7, S13, S16, and S41 are all in the open state (i.e., the open state). The common terminal of S14 is connected to its second contact. The common terminal of S15 is connected to its second contact.

[0171] S1 and S17 work together to short CH1+_A with GND of connector 130;

[0172] S2, S3, S5, S6, S18, S19, S21, and S22 work together to connect CH2+_A, CH3+_A, CH2-_A, and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0173] S4, S14 and S20 work together to connect CH1-_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor);

[0174] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0175] use Figure 8 and Figure 9 The electrical connections shown allow for the measurement of the input impedance and crosstalk of the CH1-_A channel at different ranges, i.e., using... Figure 8 The aforementioned electrical connection completes the first step of measuring the input impedance and crosstalk of the CH1-_A channel based on different ranges. Afterwards, using... Figure 9 The electrical connections shown complete the second step of measuring the input impedance and crosstalk of the CH1-_A channel based on different ranges, thus completing the entire process of measuring the input impedance and crosstalk of the CH1-_A channel based on different ranges.

[0176] If Figure 8 In step S8, S17, S18, S19, S20, S21, and S22, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of each relay are connected to their second contacts, while the states of the other relays remain unchanged. Figure 9By connecting the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 to their second contacts, while keeping the states of the other relays unchanged, the input impedance and crosstalk of the CH1-_B channel based on different ranges can be measured.

[0177] If Figure 8 The states of S1 and S2 are swapped, and the states of S1 and S2 are swapped. Figure 8 The states of S4 and S5 are swapped, while the states of other relays remain unchanged.

[0178] The common terminal of S2 connects to its third contact, the common terminals of S1, S3, S4 and S6 each connect to their fourth contact, the common terminal of S5 connects to its second contact, S7, S13, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S14 connects to its second contact, and the common terminal of S15 connects to its second contact.

[0179] S2 and S18 work together to short CH2+_A with GND of connector 130;

[0180] S1, S3, S4, S6, S17, S19, S20 and S22 work together to connect CH1+_A, CH3+_A, CH1-_A and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0181] S5, S14 and S21 work together to short-circuit CH2-_A with the positive terminal of signal generator 100;

[0182] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0183] This disclosure can complete the first step of measuring the input impedance and crosstalk of the CH2-_A channel based on different ranges.

[0184] If Figure 9 The states of S1 and S2 are swapped, and Figure 9 The states of S4 and S5 are swapped, while the states of other relays remain unchanged.

[0185] The common terminal of S2 connects to its third contact, the common terminals of S1, S3, S4 and S6 each connect to their fourth contact, the common terminal of S5 connects to its first contact, S7, S13, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S14 connects to its second contact, and the common terminal of S15 connects to its second contact.

[0186] S2 and S18 work together to short CH2+_A with GND of connector 130;

[0187] S1, S3, S4, S6, S17, S19, S20 and S22 work together to connect CH1+_A, CH3+_A, CH1-_A and CH3-_A to the GND of connector 130 through low-resistance resistors (such as 100Ω resistors);

[0188] S5, S14 and S21 work together to connect CH2-_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor);

[0189] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0190] This disclosure can complete the second step of measuring the input impedance and crosstalk of the CH2-_A channel based on different ranges, thereby completing the entire process of measuring the input impedance and crosstalk of the CH2-_A channel based on different ranges.

[0191] In addition, by controlling S8, S17, S18, S19, S20, S21 and S22, the entire process of measuring the input impedance and crosstalk of the CH2-_B channel based on different ranges can be completed.

[0192] If Figure 8 The states of S1 and S3 are swapped, and the states of S1 and S3 are swapped. Figure 8 The states of S4 and S6 are swapped, while the states of the other relays remain unchanged.

[0193] The common terminal of S3 connects to its third contact, the common terminals of S1, S2, S4 and S5 each connect to their fourth contact, the common terminal of S6 connects to its second contact, S7, S13, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S14 connects to its second contact, and the common terminal of S15 connects to its second contact.

[0194] S3 and S19 work together to short CH3+_A with GND of connector 130;

[0195] S1, S2, S4, S5, S17, S18, S20 and S21 work together to connect CH1+_A, CH2+_A, CH1-_A and CH2-_A to the GND of connector 130 through low-resistance resistors (such as resistors with a resistance of 100Ω);

[0196] S6, S14 and S22 work together to short-circuit CH3-_A with the positive terminal of signal generator 100;

[0197] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0198] This disclosure can complete the first step of measuring the input impedance and crosstalk of the CH3-_A channel based on different ranges.

[0199] If Figure 9 The states of S1 and S3 are swapped, and Figure 9 The states of S4 and S6 are swapped, while the states of the other relays remain unchanged.

[0200] The common terminal of S3 connects to its third contact, the common terminals of S1, S2, S4 and S5 each connect to their fourth contact, the common terminal of S6 connects to its first contact, S7, S13, S16 and S41 are all in the open state (i.e., the open state), the common terminal of S14 connects to its second contact, and the common terminal of S15 connects to its second contact.

[0201] S3 and S19 work together to short CH3+_A with GND of connector 130;

[0202] S1, S2, S4, S5, S17, S18, S20 and S21 work together to connect CH1+_A, CH2+_A, CH1-_A and CH2-_A to the GND of connector 130 through low-resistance resistors (such as resistors with a resistance of 100Ω);

[0203] S6, S14, and S20 work together to connect CH3-_A to the positive terminal of signal generator 100 through a high-resistance resistor (such as a 200kΩ resistor);

[0204] S8 shorts the grounding terminal GND_A in data acquisition port A with the GND of connector 130.

[0205] This disclosure can complete the second step of measuring the input impedance and crosstalk of the CH3-_A channel based on different ranges, thereby completing the entire process of measuring the input impedance and crosstalk of the CH3-_A channel based on different ranges.

[0206] In addition, by controlling S8, S17, S18, S19, S20, S21 and S22, the entire process of measuring the input impedance and crosstalk of the CH3-_B channel based on different ranges can be completed.

[0207] In one example, using Figure 6-7The process of determining the input impedance and inter-path crosstalk at the positive terminal of the first differential signal channel in port A of the electrical connection measurement data acquisition unit, based on different ranges, may include the following steps:

[0208] Step 1: Initiate the input impedance test process at the positive terminal of the first differential signal channel of seismic data acquisition device A. The status of the relay in the control connector 130 of the host computer 140 is as follows: Figure 6 As shown;

[0209] Step 2: The host computer 140 arranges the ranges of seismic data acquisition device A in ascending order;

[0210] Step 3: The host computer 140 selects a range according to the range arrangement order and sets the range of the seismic data acquisition device A to the selected range S.

[0211] Step 4: The host computer 140 controls the signal generator 100 to output a sine wave signal with a frequency of 5Hz and an amplitude of FS (full scale) / 2; the host computer 140 receives the acquisition signals from the positive terminals of the three differential signal channels output by the seismic data acquisition device A in real time through the acquisition thread and stores them in the data buffer queue.

[0212] Step 5: After waiting 5 seconds, the host computer 140 reads the acquired signals from the data buffer queue from 4 to 1 seconds prior to the current time, and calculates the signal amplitude V at the positive terminal of each of the three differential signal channels according to a 5Hz sine wave. ok (k=1~3);

[0213] Step 6: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 7 As shown;

[0214] Step 7: After waiting 5 seconds, the host computer 140 reads the acquired signal from the data buffer queue from 4 to 1 seconds prior to the current time, and calculates the signal amplitude V at the positive terminal of each of the three differential signal channels according to a 5Hz sine wave. 1i (i=1~3);

[0215] Step 8: Calculate the input impedance of the positive terminal of the first differential signal channel in this range using the following formula (4). ;in, This indicates the resistance value of the resistor connected in series between the positive terminal of the first differential signal channel and the positive terminal of the signal generator 100, such as in... Figure 7 middle, It is 200KΩ;

[0216] Formula (4)

[0217] The following formula (5) is used to calculate the inter-path crosstalk between the positive terminals of the first differential signal channel and the positive terminals of the other two differential signal channels. ;

[0218] (k≠i) Formula (5)

[0219] Repeating steps 3-8 above, the input impedance and crosstalk of the positive terminal of the first differential signal channel at each range can be obtained. The process for obtaining the input impedance and crosstalk of the positive terminals of the second and third differential signal channels at different ranges in port A of the measurement data acquisition unit is similar to the above process and will not be described in detail here.

[0220] In one example, using Figure 8-9 The process of determining the input impedance and inter-path crosstalk at the negative terminal of the first differential signal channel in port A of the electrical connection measurement data acquisition unit, based on different ranges, may include the following steps:

[0221] Step 1: Initiate the test process for the input impedance of the negative terminal of the first differential signal channel of seismic data acquisition device A. The status of the relay in the control connector 130 of the host computer 140 is as follows: Figure 8 As shown;

[0222] Step 2: The host computer 140 arranges the ranges of seismic data acquisition device A in ascending order;

[0223] Step 3: The host computer 140 selects a range according to the range arrangement order and sets the range of the seismic data acquisition device A to the selected range S.

[0224] Step 4: The host computer 140 controls the signal generator 100 to output a 5Hz sine wave signal with an amplitude of FS (full scale) / 2. The host computer 140 receives the acquisition signals from the three differential signal channels of the seismic data acquisition device A in real time through the acquisition thread and stores them in the data buffer queue.

[0225] Step 5: After waiting 5 seconds, the host computer 140 reads the acquired signals from the data buffer queue 4 to 1 seconds prior to the current time, and calculates the signal amplitude V at the negative end of the three differential signal channels according to a 5Hz sine wave. ok (k=1~3);

[0226] Step 6: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 9 As shown;

[0227] Step 7: After waiting 5 seconds, the host computer 140 reads the acquired signals from the data buffer queue from 4 to 1 seconds prior to the current time, and calculates the signal amplitude V at the negative end of the three differential signal channels according to a 5Hz sine wave. 1i ;

[0228] Step 8: Calculate the input impedance of the negative terminal of the first differential signal channel in this range according to the above formula (4). The crosstalk between the negative terminals of the first differential signal channel and the negative terminals of the other two differential signal channels is calculated using the formula (5) above. .

[0229] Repeating steps 3-8 above, the input impedance and crosstalk at the negative terminal of the first differential signal channel for each range can be obtained. The process for obtaining the input impedance and crosstalk at the negative terminal of the second and third differential signal channels in port A of the measurement data acquisition unit based on different ranges is similar to the above process and will not be described in detail here.

[0230] Figure 10 This is a schematic diagram of the electrical connections used when testing the common-mode rejection ratio (CMRR) of three differential signal channels.

[0231] Figure 10 In the above, the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of S8, S17, S18, S19, S20, S21, and S22 are each connected to their first contacts. The common terminals of S1, S2, S3, S4, S5, and S6 are each connected to their second contacts. S7, S14, and S41 are all in the open state (i.e., the open state). The common terminal of S13 is connected to its first contact. The common terminals of S15 and S16 are each connected to their second contacts.

[0232] S1, S2, S3, S4, S5, S6, S13, S16, S17, S18, S19, S20, S21, and S22 work together to short-circuit CH1+_A, CH2+_A, CH3+_A, CH1-_A, CH2-_A, and CH3-_A to the positive terminal of signal generator 100, so that the same common-mode signal can be applied to CH1+_A, CH2+_A, CH3+_A, CH1-_A, CH2-_A, and CH3-_A respectively;

[0233] S15 shorts the negative terminal of signal generator 100 to GND of connector 130.

[0234] use Figure 10The electrical connection shown allows for the measurement of the common-mode rejection ratio (CMRR) of each differential signal channel in data acquisition port A based on different ranges. If the second contact of the common terminals GND_COM, CH1+_COM, CH2+_COM, CH3+_COM, CH1-_COM, CH2-_COM, and CH3-_COM of relays S8, S17, S18, S19, S20, S21, and S22 is connected, while the states of the other relays remain unchanged, then the CMRR of each differential signal channel in data acquisition port B based on different ranges can be measured.

[0235] In one example, using Figure 10 The process of connecting each differential signal channel of port A of the electrical connection measurement data acquisition unit, based on the common-mode rejection ratio of different ranges, may include the following steps:

[0236] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 10 As shown;

[0237] Step 2: The host computer 140 arranges the ranges of seismic data acquisition device A in ascending order;

[0238] Step 3: The host computer 140 selects a range S according to the range arrangement order and sets the range of the seismic data acquisition device A to the selected range S.

[0239] Step 4: The host computer 140 controls the signal generator 100 to output a sine wave signal with a frequency of 40Hz and a voltage of 10V. The host computer 140 receives the acquisition signals from the three differential signal channels output by the seismic data acquisition device A in real time through the acquisition thread and stores them in the data buffer queue.

[0240] Step 5: After waiting for 5 seconds, the host computer 140 reads the acquired signals of the three differential signal channels from the data buffer queue 2 seconds prior to the current time, and calculates the signal amplitude of each of the three differential signal channels according to a 40Hz sine wave. (k=1~3);

[0241] Step 6: Calculate the common-mode rejection ratio of each of the three differential signal channels using the following formula (6). ;

[0242] Formula (6)

[0243] Step 7: Repeat steps 3-6 to obtain the common-mode rejection ratio of each of the three differential signal channels in each range.

[0244] Figure 11This is a schematic diagram of the electrical connections used when testing the calibration current (including calibration current accuracy) of seismic data acquisition device A.

[0245] Figure 11 In the circuit, S33 is in the closed state (i.e., the ON state), which shorts CH1+_A with the calibration enable terminal Y_A. The common terminal of S23 and S24 is connected to their first contact (S23 and S24 can be omitted if the connector 130 only includes one data acquisition port). S25 is in the closed state (i.e., the ON state), which connects resistor R2 between the positive and negative terminals of multimeter 210. S45 is in the closed state (i.e., the ON state).

[0246] S23, S24, and S45 work together to connect the calibration signal input terminal H_A to the positive terminal of the multimeter 210, and the calibration signal ground terminal X_A to the negative terminal of the multimeter 210.

[0247] use Figure 11 The electrical connection shown can be used to test and obtain the rated current (including the accuracy of the rated current) of port A of the data acquisition unit. If the second contact of each of the common terminals of S23 and S24 is connected, while the states of the other relays remain unchanged, the rated current of port B of the data acquisition unit can be tested and obtained.

[0248] In one example, using Figure 11 The process of calibrating the current (including calibration current accuracy) at port A of the electrical connection measurement data acquisition unit shown may include the following steps:

[0249] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 11 As shown;

[0250] Step 2: The host computer 140 controls the acquisition thread to start the calibration current test of seismic data acquisition device A;

[0251] Step 3: Under the control of the host computer 140, the seismic data acquisition device A outputs a step calibration current of 10mA. The host computer 140 receives the output of the seismic data acquisition device A through the acquisition thread and stores it in the data buffer queue.

[0252] Step 4: The host computer 140 reads the first count value from the data buffer queue and converts it into a voltage value (e.g., voltage value = S * count / 2). 27 (S is the range). If the actual voltage is high (e.g., greater than 4.5V), the calibration enable signal of seismic data acquisition device A is considered normal; otherwise, the calibration enable signal of seismic data acquisition device A is considered abnormal.

[0253] Step 5: The host computer 140 controls the high-precision digital multimeter 110 to measure the voltage V0 across the series resistor R2 at this time.

[0254] Step 6: The host computer 140 controls the seismic data acquisition unit A to send a 10mA signal with a width of 600s;

[0255] Step 7: The host computer 140 controls the high-precision digital multimeter 110 to continuously measure the voltage across the series resistor R2 to obtain the voltage V1 before the step and the voltage V2 during the step.

[0256] Step 8: The host computer 140 divides V0, V1 and V2 by the resistance value of the series resistor R2 respectively to obtain the currents I0, I1 and I2, where I0 is the calibration current value.

[0257] Step 9: The host computer 140 records I0, I1 and I2, and uses the following formula (7) to calculate the calibration current accuracy P of the seismic data acquisition device A, and stores the calibration current value I0 and the calibration current accuracy P.

[0258] Formula (7)

[0259] Figure 12 This is a schematic diagram of the electrical connections used when testing the calibration voltage (including calibration voltage accuracy) of seismic data acquisition device A.

[0260] Figure 12 In the multimeter 210, S33 is in the closed state (i.e., on state), which shorts CH1+_A with the calibration enable terminal Y_A. The common terminal of S23 and S24 is connected to their first contact. S25 is in the open state (i.e., off state), which prevents resistor R2 from being connected between the positive and negative terminals of the multimeter 210. S45 is in the closed state (i.e., on state).

[0261] S23, S24, and S45 work together to connect the calibration signal input terminal H_A to the positive terminal of the multimeter 210, and the calibration signal ground terminal X_A to the negative terminal of the multimeter 210.

[0262] use Figure 12 The electrical connection shown can be used to test the calibration voltage of data acquisition port A. If the second contact of each of the common terminals of S23 and S24 is connected, while the states of the other relays remain unchanged, the calibration voltage of data acquisition port B can be tested.

[0263] In one example, using Figure 12 The process of calibrating the voltage (including calibration voltage accuracy) of port A of the electrical connection measurement data acquisition unit shown may include the following steps:

[0264] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 11 As shown;

[0265] Step 2: The host computer 140 receives the calibration output voltage V0 (i.e., calibration voltage value) of the seismic data acquisition device A obtained by the digital multimeter 110 through the acquisition thread, and stores it in the data buffer queue.

[0266] Step 3: The host computer 140 controls the seismic data acquisition unit A to send a 5V signal with a width of 600s;

[0267] Step 4: The host computer 140 receives the calibrated output voltage V to ground measured by the digital multimeter 110 through the acquisition thread, obtains the voltage V1 before the step and the voltage V2 during the step, and stores them in the data buffer queue.

[0268] Step 5: The host computer 140 reads V0, V1 and V2 from the data buffer queue, calculates the calibration voltage accuracy P of the seismic data acquisition device A using the following formula (8), and stores V0 and P.

[0269] Formula (8)

[0270] Figure 13 This is a schematic diagram of the electrical connections used when testing the VLP (Very-Long-Period) signal acquisition accuracy of seismic data acquisition device A.

[0271] Figure 13 In this circuit, the common terminals of S26, S27, S28, and S29 are each connected to their first contact. S9 and S10 are both double-pole single-throw relays and are both in the closed state (i.e., the on state), which short-circuit the positive terminal of multimeter 210 with the positive terminal of signal generator 100, and short-circuit the negative terminal of multimeter 210 with the negative terminal of signal generator 100.

[0272] S26, S27, S28, and S29 work together to connect the U-direction zero-point voltage terminal T_A, the W-direction zero-point voltage terminal U_A, and the V-direction zero-point voltage terminal V_A in the data acquisition port A to the positive terminal of the signal generator 100, and to connect the calibration signal ground terminal W_A to the negative terminal of the signal generator 100 and the GND of the connector 130.

[0273] use Figure 13 The electrical connections shown can be used to test the VLP signal acquisition accuracy of a seismic data acquisition device connected to data acquisition port A. If the second contact of each of the common terminals of S26, S27, S28, and S29 is connected, while the states of the other relays remain unchanged, the VLP signal acquisition accuracy of a seismic data acquisition device connected to data acquisition port B can be tested.

[0274] In one example, using Figure 13 The process of measuring the VLP signal acquisition accuracy at port A of the electrical connection measurement data acquisition unit may include the following steps:

[0275] Step 1: Host computer 140, reset signal generator 100, digital multimeter 110, and connector 130;

[0276] Step 2: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 13 As shown;

[0277] Step 3: The host computer 140 controls the signal generator 100 to output a square wave signal with a width of 20s, a duty cycle of 50%, and an amplitude of 5V (i.e., a 5V DC signal, such as a high level for the first 10s and a low level for the last 10s).

[0278] Step 4: The host computer 140 controls the digital multimeter 110 to read continuously until the same potential value is read three times in a row within 5 seconds (either both are high potential values ​​or both are low potential values). Then the host computer 140 calculates the average of the three obtained same potential values ​​and records it as v1.

[0279] Step 5: The host computer 140 receives the output k from each of the three auxiliary acquisition channels of the seismic data acquisition device A through the acquisition thread. 1i (i=1, 2, 3);

[0280] Step 6: The host computer 140 controls the digital multimeter 110 to read continuously until the same potential value opposite to the potential in step 4 is read three times in a row within 5 seconds (such as both being low potential values ​​or both being high potential values). Then the host computer 140 calculates the average of the three obtained same potential values ​​and records it as v2.

[0281] Step 7: The host computer 140 receives the output k from each of the three auxiliary acquisition channels of the seismic data acquisition device A through the acquisition thread. 2i (i=1, 2, 3);

[0282] Step 8: Calculate the VLP signal acquisition accuracy P of each of the three auxiliary data acquisition channels using the following formula (9). i And record it;

[0283] Formula (9)

[0284] Figure 14 This is a schematic diagram of the electrical connections used when testing the sensor communication accuracy of seismic data acquisition device A.

[0285] Figure 14In the middle, the common terminal of S30 is connected to its first contact, so that the output terminal P_A in the data acquisition unit port A is connected to the second serial interface 206 (i.e. Figure 14 The transmitter TX1 in serial port 1) is connected, and the common terminal of S31 is connected to its first contact, connecting the output terminal a_A in data acquisition port A with the receiver RX1 in the second serial interface 206. The common terminal of S32 is connected to its first contact, connecting the output terminal K_A in data acquisition port A with the ground terminal in the second serial interface 206. Because the data processor 204 (i.e. Figure 14 The CPU in the middle) uses the first serial interface 202 (i.e. Figure 14 Serial port 0 in the middle) and host computer 140 (i.e. Figure 14 The first serial interface 202 is connected to the PC (PC). Therefore, the transmitting end TX0 in the first serial interface 202 is connected to the transmitting end TX in the PC, the receiving end RX0 in the first serial interface 202 is connected to the receiving end RX in the PC, and the ground end GND in the first serial interface 202 is connected to the ground end GND in the PC.

[0286] use Figure 14 The electrical connections shown can be used to test the read / write accuracy of seismic data acquisition device A connected to data acquisition device port A. If the second contact of each of the common terminals of S30, S31, and S32 is connected, the read / write accuracy of seismic data acquisition device B connected to data acquisition device port B can be tested.

[0287] In one example, using Figure 14 The process of ensuring accurate sensor communication at port A of the electrical connection measurement data acquisition unit may include the following steps:

[0288] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 14 As shown;

[0289] Step 2: The host computer 140 controls the connector 130 to write sensor information with serial number 99999 to the serial communication channel TX1 of the sensor port of the seismic data acquisition device A through TX1.

[0290] Step 3: The acquisition thread in the host computer 140 queries whether the sensor information written by the seismic data acquisition device A is 99999, and stores the query result.

[0291] Step 4: The host computer 140 writes sensor information with serial number 00000 to the serial communication channel of the sensor port of the seismic data acquisition device A through connector 130.

[0292] Step 5: The acquisition thread in the host computer 140 queries whether the sensor information transmitted from the seismic data acquisition device A is 00000, and stores the query result.

[0293] Step 6: The host computer 140 determines the accuracy of sensor communication at port A of the data acquisition unit based on the stored query results.

[0294] Figure 15 This is a schematic diagram of the electrical connections used when testing the accuracy of the sensor control signals of seismic data acquisition device A. Figure 16 This is a schematic diagram of the electrical connections used when testing the accuracy of the sensor control signals of seismic data acquisition device B.

[0295] Figure 15 In the sequence, S38, S39, and S40 are all in the open state (i.e., disconnected state). When S38 is in the closed state, the seismograph zeroing control terminal L_A in seismic data acquisition unit A is connected to CH1+_A. When S39 is in the closed state, the seismograph swing opening control terminal M_A in seismic data acquisition unit A is connected to CH2+_A. When S40 is in the closed state, the seismograph swing locking control terminal N_A in seismic data acquisition unit A is connected to CH3+_A. Using... Figure 15 The electrical connections shown can be used to test the accuracy of the sensor control signals of seismic data acquisition unit A, which is connected to data acquisition unit port A.

[0296] Figure 16 In the sequence, S42, S43, and S44 are all in the open (i.e., disconnected) state. When S42 is in the closed state, the seismograph zeroing control terminal L_B in seismic data acquisition unit B is connected to CH1+_B. When S43 is in the closed state, the seismograph swing opening control terminal M_B in seismic data acquisition unit B is connected to CH2+_B. When S43 is in the closed state, the seismograph swing locking control terminal N_B in seismic data acquisition unit B is connected to CH3+_B. Using... Figure 16 The electrical connections shown can be used to test the accuracy of the sensor control signals of the seismic data acquisition unit B, which is connected to port B of the data acquisition unit.

[0297] In one example, using Figure 15 The process of ensuring the accuracy of the sensor control signal at port A of the electrical connection measurement data acquisition unit, as shown, and the utilization of... Figure 16 The process of ensuring the accuracy of the sensor control signal at port B of the electrical connection measurement data acquisition unit shown may include the following steps:

[0298] Step 1: The host computer 140 controls the status of the relays in the connector 130 as follows: Figure 15 or Figure 16As shown, connector 130 connects the pendulum centering signal line to the positive end of the first differential signal channel, connects the pendulum opening signal line to the positive end of the second differential signal channel, and connects the pendulum locking signal line to the positive end of the third differential signal channel.

[0299] Step 2: The acquisition thread in the host computer 140 sets the sensor type connected to the seismic data acquisition device A / B to the seismometer connected to the China Earthquake Networks Center.

[0300] Step 3: The acquisition thread in the host computer 140 sends a seismic zeroing signal to the seismic data acquisition unit A / B and waits for 30 seconds. The host computer 140 reads the continuous data of the first differential signal channel reported by the seismic data acquisition unit A / B from the data buffer queue, calculates the high-level signal width, and checks whether it is between 19 and 25 seconds. If it is, the zeroing signal is considered to be normal.

[0301] Step 4: The acquisition thread in the host computer 140 sends the seismic swing signal to the seismic data acquisition unit A / B and waits for 30 seconds. The host computer 140 reads the continuous data of the second differential signal channel reported by the seismic data acquisition unit A / B from the data buffer queue, calculates the high-level signal width, and checks whether it is between 19 and 25 seconds. If it is, the swing signal is considered to be normal.

[0302] Step 5: The acquisition thread in the host computer 140 sends the seismic lock pendulum signal to the seismic data acquisition unit A / B and waits for 30 seconds. The host computer 140 reads the continuous data of the third differential signal channel reported by the seismic data acquisition unit A / B from the data buffer queue, calculates the high-level signal width, and checks whether it is between 19 and 25 seconds. If it is, the lock pendulum signal is considered to be normal.

[0303] In one example, the specific process for testing the GNSS timing function of a seismic data acquisition device, as disclosed in this disclosure, can be as follows: The GNSS timing module 160 is configured to use an independent power supply mode and can simultaneously output four IRIG timecode signals. Seismic data acquisition devices A and B are connected to the GNSS timing module 160 respectively. The host computer 140 can then perform GNSS timing function tests on seismic data acquisition devices A and B sequentially. Specifically, seismic data acquisition devices A and B connected to the GNSS timing module 160 respectively perform synchronization operations with the IRIG timecode signals and return the operation results (i.e., GNSS clock synchronization status information) to the host computer 140. The acquisition thread in the host computer 140 reads the GNSS clock synchronization status information from the data buffer queue. If the read GNSS clock synchronization status information is in the "synchronization complete" or "clock fine-tuning" state, the GNSS timing function of the seismic data acquisition device is considered normal.

[0304] Exemplary methods

[0305] Figure 17 This is a flowchart of an embodiment of the method for testing a seismic data acquisition device disclosed herein. Figure 17 The method shown is executed in a host computer 140. The connection relationship between the host computer 140, the signal generator 100, the digital multimeter 110, at least one seismic data acquisition unit 120, the connector 130, the clock device 150, and the GNSS timing module 160 can be referred to the description in the above system embodiment. Figure 17 The methods shown mainly include: S1700, S1710, S1720, and S1730. The following sections will discuss... Figure 17 Each step in the process will be explained separately.

[0306] S1700: Obtain the current test indicators of the seismic data acquisition device set by the user through the seismic data acquisition device test interface.

[0307] The seismic data acquisition test interface in this disclosure is an interface for users to set the test parameters of the seismic data acquisition. The test parameters may include: configuration parameters of the seismic data acquisition, test index options, and configuration parameters of other devices connected to the host computer 140, such as the configuration parameters of devices like the signal generator 100, digital multimeter 110, connector 130, clock device 150, and GNSS timing module 160.

[0308] An example of the test interface for the seismic data acquisition device disclosed herein is as follows: Figure 18 As shown. Figure 18 The section on parameters of the seismic data acquisition device under test (DUT) is used to set information about the seismic data acquisition device, such as its serial number, IP address, network port, connection password, number of sensor ports, sampling rate, sampling phase, nominal capacity of the main memory card, and nominal capacity of the extended memory card. The section on test items is used to determine the indicators included in this test, such as the user's... Figure 18 The 10 listed indicators are all those that need to be tested in this test. The measurement equipment connection section is used to set up the signal generator 100, the digital multimeter 110, and the connector 130 (i.e., Figure 18 The parameters related to the line junction box (e.g., the NI-VISA device code of the signal generator, the serial port code of the multimeter, and the serial port code of the connector) are required. The calibration signal reference resistance value is used to calculate the calibration signal accuracy. The input impedance measurement reference resistance value is used to calculate the input impedance of the line. Additionally, Figure 18 The earthquake data acquisition test interface also allows users to set the save path for the final generated test result report.

[0309] In one example, if the user selected Figure 18 Of the 10 indicators, this disclosure allows you to sequentially select one of them as the current indicator to be tested.

[0310] S1710. Based on the current test index, generate a test control command and send the test control command to at least one device connected to the host computer.

[0311] The test control commands disclosed herein refer to commands used to control devices connected to the host computer 140, causing the devices to perform corresponding operations to complete the test. These test control commands may include at least one of the following: commands for the signal generator 100, commands for the digital multimeter 110, commands for the seismic data acquisition device 120, commands for the connector 130, commands for the clock device 150, and commands for the GNSS timing module 160, and the corresponding commands should be sent to the corresponding devices.

[0312] In one example, the test control command typically includes an index test instruction, which is directed to connector 130. Therefore, this index test instruction should be sent to connector 130. The index test instruction is used to control the state of each relay in the relay group in connector 130 (e.g., the data processor in connector 130 parses the index test instruction and sets each relay to the corresponding state according to the parsing result), thereby enabling some or all of the signal generator 100, digital multimeter 110, seismic data acquisition units 120, clock device 150, and GNSS timing module 160, together with connector 130, to form a test circuit for the index currently under test.

[0313] In one example, the test control command may include a signal specification instruction, which is an instruction directed to the signal generator 100; therefore, the signal specification instruction should be sent to the signal generator 100. The signal specification instruction is used to control the signal generator 100 to output a signal of the corresponding specification.

[0314] S1720: Receive information transmitted from at least one device connected to the host computer and store it.

[0315] After the test control command is sent to the corresponding device, the device receiving the command will perform the corresponding operation. For example, the relays in connector 130 will exhibit the following behavior: Figure 3-16 The state shown in any of the figures. For example, the seismic data acquisition unit 120 performs corresponding operations on the signals generated by the signal generator 100, etc.

[0316] In one example, the host computer 140 can use threads and sockets to receive information transmitted from connected devices and store the received information using queues (such as circular queues). For instance, the acquisition thread in the host computer 140 receives frames transmitted from the seismic data acquisition device 120 via sockets. The acquisition thread judges the received frames; if the result is that the received frame is a data frame, the acquisition thread stores the data frame in the data buffer queue; if the result is that the received frame is an information frame, the acquisition thread stores the information frame in the information buffer queue. Data frames refer to frames used to transmit sampled seismic wave data or standard signals during calibration, such as sampled values ​​of standard square wave signals, voltage sampled data corresponding to calibration current, and clock signal sample sequences. Information frames refer to frames used to transmit device status, configuration commands, and interactive responses, such as command responses and range setting receipts returned by the seismic data acquisition device 120. By using threads and sockets to receive frames transmitted from various devices, the real-time performance and reliability of frame reception can be improved. By using data buffer queues and information buffer queues to store the received frames, it is possible to ensure that data frames with high-frequency characteristics are processed in a timely manner, thereby reducing the latency of data frames.

[0317] S1730. Based on the currently stored information, determine the test results of the seismic data acquisition device, which is currently being tested, for the current test index.

[0318] In one example, this disclosure determines the test results of the seismic data acquisition device currently under test for the current test index by reading data frames in the data buffer queue. For example, by performing statistical, calculation, and / or judgment processing on the data frames in the data buffer queue, the test results of the current test index of seismic data acquisition device A / B can be obtained. This disclosure can obtain the test results of the current test index according to the relevant provisions for testing each index in the "Qualitative Testing Procedures for Seismic Observation Instruments Entering the Network of China Earthquake Networks Center".

[0319] In one example, this disclosure uses the time offset of the half-high potential of each differential signal channel to determine the absolute clock difference of each differential signal channel of the seismic data acquisition machine. Specifically, this disclosure uses the time offset of the half-rise edge of each differential signal channel as the absolute clock difference of each differential signal channel of the seismic data acquisition machine. The process of determining the absolute clock difference in this disclosure can be as follows:

[0320] When a connector is used to provide pulse signals (such as sub-pulse signals) generated by a clock device to each differential signal channel of a seismic data acquisition machine, the seismic data acquisition machine samples the pulse signals received from each channel to obtain multiple pulse sampling signals. The host computer 140 receives each pulse sampling signal output by the seismic data acquisition machine through an acquisition thread and stores it in a data buffer queue. The following describes the process of determining the absolute clock difference of one of the pulse sampling signals as an example.

[0321] First, the pulse sampling signal is read from the data buffer queue, and then resampled according to the preset resampling frequency (e.g., 10000sps) to obtain a pulse resampled signal. Typically, the number of pulse resampled signals before the pulse period start signal (e.g., the clock division signal, which will be used as an example below) and the number of pulse resampled signals after the clock division signal are the same. For example, a 10s pulse resampled signal is obtained, which includes: 5s of pulse resampled signals before the clock division signal and 5s of pulse resampled signals after the clock division signal.

[0322] Secondly, a resampled signal segment is extracted from the pulse resampled signal, and the extracted pulse resampled signal segment contains the same number of pulse resampled signals before the clock division signal and the same number of pulse resampled signals after the clock division signal; for example, taking the clock division signal as the midpoint, a first resampled signal segment of a predetermined duration (such as the first 2 seconds) before the clock division signal and a second resampled signal segment of a predetermined duration (such as the last 2 seconds) after the clock division signal are extracted.

[0323] Next, calculate the mean of the partial resampled signals in the first resampled signal segment and the mean of the partial resampled signals in the second resampled signal segment. The number of these two resampled signals should preferably be the same, and they should preferably be located at the beginning of the first resampled signal segment and the end of the second resampled signal segment. For example, calculate the mean of the resampled signals in the first 1 second of the first resampled signal segment and the mean of the resampled signals in the last 1 second of the second resampled signal segment.

[0324] Next, calculate the difference between the two means to obtain the high potential value, and based on the high potential value and the time point of the first pulse resampling signal in the resampling signal segment that is greater than half the difference, calculate the time point of the pulse resampling signal at half the rising edge (such as using the above formula (2) to calculate k).

[0325] Finally, using the above time points and resampling frequency, the time offset of the half-rise edge is calculated. For example, the time offset is calculated using the above formula (3), and the time offset is the absolute clock difference of the differential signal channel.

[0326] This disclosure determines the absolute clock error of the differential signal channel of a seismic data acquisition device by using the time offset of 1 / 2 rising edge, which helps to ensure the accuracy of the absolute clock error of the differential signal channel of the seismic data acquisition device. For example, it can realize the testing of the absolute clock error at the microsecond level.

[0327] Exemplary electronic devices

[0328] The following is for reference. Figure 19 To describe an electronic device according to embodiments of the present disclosure. Figure 19 A block diagram of an electronic device according to an embodiment of the present disclosure is shown. (As follows) Figure 19 As shown, the electronic device 191 includes one or more processors 1911 and memory 1912.

[0329] The processor 1911 may be a central processing unit (CPU) or other form of processing unit with data processing capabilities and / or instruction execution capabilities, and may control other components in the electronic device 191 to perform desired functions.

[0330] The memory 1912 may include one or more computer program products, which may include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may, for example, include random access memory (RAM) and / or cache memory. The non-volatile memory may, for example, include read-only memory (ROM), hard disk, and flash memory. One or more computer program instructions may be stored on the computer-readable storage medium, and the processor 1911 may execute the program instructions to implement the methods for testing seismic data acquisition devices and / or other desired functions described in the various embodiments of this disclosure above.

[0331] In one example, electronic device 191 may further include input device 1913 and output device 1914, etc., these components being interconnected via a bus system and / or other forms of connection mechanism (not shown). Furthermore, input device 1913 may include, for example, a keyboard, mouse, etc. Output device 1914 can output various information to the outside. Output device 1914 may include, for example, a display, speaker, printer, and communication networks and their connected remote output devices, etc.

[0332] Of course, for the sake of simplicity, Figure 19Only some of the components of the electronic device 191 relevant to this disclosure are shown, omitting components such as buses, input / output interfaces, etc. In addition, the electronic device 191 may include any other suitable components depending on the specific application.

[0333] Exemplary computer program products and computer-readable storage media

[0334] In addition to the methods and apparatus described above, embodiments of this disclosure may also be computer program products comprising computer program instructions that, when executed by a processor, cause the processor to perform the steps of the methods for testing a seismic data acquisition device according to various embodiments of this disclosure as described in the "Exemplary Methods" section of this specification.

[0335] The computer program product can be written in any combination of one or more programming languages ​​to perform the operations of the embodiments of this disclosure. The programming languages ​​include object-oriented programming languages ​​such as Java and C++, as well as conventional procedural programming languages ​​such as C or similar languages. The program code can be executed entirely on a user's computing device, partially on a user's computing device, as a standalone software package, partially on a user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0336] Furthermore, embodiments of this disclosure may also be computer-readable storage media having computer program instructions stored thereon, which, when executed by a processor, cause the processor to perform the steps in the methods for testing a seismic data acquisition device according to various embodiments of this disclosure as described in the "Exemplary Methods" section above.

[0337] The computer-readable storage medium may be any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may, for example, include, but is not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any combination thereof. More specific examples of readable storage media (not an exhaustive list) may include: an electrical connection having one or more wires, a portable disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

Claims

1. A system for testing seismic data acquisition devices, characterized in that, The system includes: a signal generator, a digital multimeter, at least one seismic data acquisition unit, a connector, and a host computer; The signal generator is connected to the connector and the host computer respectively, and the signal generator is used to generate electrical signals of corresponding specifications according to the control of the host computer; The digital multimeter is connected to the connector and the host computer respectively. The digital multimeter is used to measure the electrical parameters in the test circuit according to the control of the host computer and transmit the electrical parameter measurement results to the host computer. The seismic data acquisition device is connected to the connector and the host computer respectively. The seismic data acquisition device, which is used as the current test device, performs corresponding processing operations on its input signals in its current test circuit and transmits the result information of the processing operation to the host computer. The connector is connected to the signal generator, digital multimeter, each seismic data acquisition device, and the host computer, respectively. The connector includes a relay group, and is used to control the state of each relay in the relay group according to a received index test command, so as to form a test circuit for the current index to be tested together with some or all of the signal generator, digital multimeter, and each seismic data acquisition device. The host computer is connected to the signal generator, digital multimeter, each seismic data acquisition device, and the connector, respectively. The host computer is used to generate a test control command according to the current index to be tested and send the test control command to at least one of all devices connected to it. The host computer determines the test result of the seismic data acquisition device designated as the current test device for the current index to be tested based on information transmitted from at least one connected device. The test control command includes an index test instruction. The index test commands include: input impedance and inter-channel crosstalk index test commands for each differential signal channel of the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, shorting the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test) to the positive terminal of the signal generator, connecting the positive terminals of other differential signal channels to the ground of the connector through a resistor with a resistance of no more than 200 ohms, shorting the negative terminal of the differential signal channel under test to the ground of the connector, connecting the negative terminals of other differential signal channels to the ground of the connector through a resistor with a resistance of no more than 200 ohms, shorting the ground terminal of the seismic data acquisition device (the device under test) to the ground of the connector, and shorting the negative terminal of the signal generator to the ground of the connector. Thus, the connector, together with the signal generator and the seismic data acquisition device (the device under test), forms the first step test circuit for the input impedance and crosstalk index of the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test). The connector controls the state of each relay in the relay group, enabling the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test) to be connected to the positive terminal of the signal generator through a resistor with a resistance exceeding 100 kΩ, enabling the positive terminals of other differential signal channels to be connected to the ground of the connector through a resistor with a resistance not exceeding 200 Ω, shorting the negative terminal of the differential signal channel under test to the ground of the connector, shorting the negative terminals of other differential signal channels to the ground of the connector through a resistor with a resistance not exceeding 200 Ω, shorting the ground terminal of the seismic data acquisition device (the device under test) to the ground of the connector, and shorting the negative terminal of the signal generator to the ground of the connector. Thus, the connector, together with the signal generator and the seismic data acquisition device (the device under test), forms the second-step test circuit for the input impedance and crosstalk index of the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test). The connector controls the state of each relay in the relay group, shorting the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test) to the ground of the connector, connecting the positive terminals of other differential signal channels to the ground of the connector through a resistor with a resistance of no more than 200 ohms, shorting the negative terminal of the differential signal channel under test to the positive terminal of the signal generator, connecting the negative terminals of other differential signal channels to the ground of the connector through a resistor with a resistance of no more than 200 ohms, shorting the ground terminal of the seismic data acquisition device (the device under test) to the ground of the connector, and shorting the negative terminal of the signal generator to the ground of the connector. Thus, the connector, together with the signal generator and the seismic data acquisition device (the device under test), forms the first step test circuit for the input impedance and crosstalk index of the negative terminal of the differential signal channel under test of the seismic data acquisition device (the device under test). The connector controls the state of each relay in the relay group, shorting the positive terminal of the differential signal channel under test of the seismic data acquisition device (the device under test) to the ground of the connector, connecting the positive terminals of other differential signal channels to the ground of the connector through a resistor with a resistance not exceeding 200 ohms, connecting the negative terminal of the differential signal channel under test to the positive terminal of the signal generator through a resistor with a resistance exceeding 100 kΩ, connecting the negative terminals of other differential signal channels to the ground of the connector through a resistor with a resistance not exceeding 200 ohms, shorting the ground terminal of the seismic data acquisition device (the device under test) to the ground of the connector, and shorting the negative terminal of the signal generator to the ground of the connector. Thus, the connector, together with the signal generator and the seismic data acquisition device (the device under test), forms the second-step test circuit for the input impedance and crosstalk index of the negative terminal of the differential signal channel under test of the seismic data acquisition device (the device under test).

2. The system according to claim 1, characterized in that, In the case where the system includes multiple seismic data acquisition units, the index test command received by the connector includes: the seismic data acquisition unit identifier used as the current device to be tested; the connector controls the state of the relays in the relay group for switching seismic data acquisition units according to the seismic data acquisition unit identifier, so that the seismic data acquisition unit corresponding to the seismic data acquisition unit identifier is connected to the test circuit of the current index to be tested.

3. The system according to claim 1, characterized in that, The index test instructions include: conversion factor index test instructions for each differential signal channel of the seismic data acquisition device; Furthermore, the connector controls the state of each relay in the relay group according to the received index test command, including: The connector controls the state of each relay in the relay group, shorting the positive terminals of the first, second, and third differential signal channels of the seismic data acquisition device under test to the positive terminal of the signal generator, respectively; shorting the negative terminals of the first, second, and third differential signal channels of the seismic data acquisition device to the negative terminal of the signal generator, respectively; shorting the ground terminal of the seismic data acquisition device to the ground of the connector; and connecting the positive and negative terminals of the digital multimeter to the positive and negative terminals of the signal generator. Thus, the connector, together with the signal generator, the digital multimeter, and the seismic data acquisition device under test, forms a test circuit for the conversion factor index of the three differential signal channels of the seismic data acquisition device under test.

4. The system according to claim 1, characterized in that, The system further includes: a clock device for generating clock signals, and the clock device is connected to the connector; The index test commands include: absolute clock difference index test commands for each differential signal channel of the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, causing the first, second, and third differential signal channels of the seismic data acquisition device (the device under test) to be shorted to the clock signal output terminal of the clock device, and the ground terminal of the seismic data acquisition device to be shorted to the ground of the connector. Thus, the connector, together with the clock device and the seismic data acquisition device, forms a test circuit for the absolute clock error index of each differential signal channel of the seismic data acquisition device.

5. The system according to claim 1, characterized in that, The index test commands include: input short-circuit noise index test commands for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, causing the positive and negative terminals of the first differential signal channel, the positive and negative terminals of the second differential signal channel, and the positive and negative terminals of the third differential signal channel of the seismic data acquisition device under test to be shorted to the ground of the connector, respectively. This causes the grounding terminal of the seismic data acquisition device under test to be shorted to the ground of the connector. Thus, the connector and the seismic data acquisition device under test together form a test circuit for the input short-circuit noise index of the seismic data acquisition device under test.

6. The system according to claim 1, characterized in that, The index test commands include: common-mode rejection ratio (CMRR) index test commands for each differential signal channel of the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, causing the positive and negative terminals of the first differential signal channel, the second differential signal channel, and the third differential signal channel of the seismic data acquisition device under test to be shorted to the positive terminal of the signal generator, respectively. This also causes the grounding terminal of the seismic data acquisition device under test to be shorted to the ground of the connector. Thus, the connector, together with the signal generator and the seismic data acquisition device under test, forms a test circuit for the common-mode rejection ratio (CMRR) of each differential signal channel of the seismic data acquisition device under test.

7. The system according to claim 1, characterized in that, The index test commands include: a calibration current index test command for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, shorting the positive terminal of the first differential signal channel of the seismic data acquisition device (the device under test) and the calibration enable terminal of the seismic data acquisition device. This connects the positive and negative terminals of the digital multimeter to the calibration signal input terminal and calibration signal ground terminal in the port of the data acquisition device. A series resistor is connected between the calibration signal input terminal and the calibration signal ground terminal. Thus, the connector, the digital multimeter, and the seismic data acquisition device (the device under test) together form the calibration current index test circuit for the seismic data acquisition device (the device under test).

8. The system according to claim 1, characterized in that, The index test commands include: a calibration voltage index test command for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, shorting the positive terminal of the first differential signal channel of the seismic data acquisition device (the device under test) and the calibration enable terminal of the seismic data acquisition device. This connects the positive and negative terminals of the digital multimeter to the calibration signal input terminal and calibration signal ground terminal in the port of the data acquisition device. Thus, the connector, the digital multimeter, and the seismic data acquisition device (the device under test) together form the calibration voltage index test circuit for the seismic data acquisition device (the device under test).

9. The system according to claim 1, characterized in that, The index test commands include: very long period (VLP) signal acquisition index test commands for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, shorting the U, V, and W zero-point voltage terminals of the seismic data acquisition device (the device under test) to the positive terminal of the signal generator, shorting the calibration signal ground terminal of the seismic data acquisition device to the ground of the connector, shorting the negative terminal of the signal generator to the ground of the connector, and shorting the positive and negative terminals of the digital multimeter to the positive and negative terminals of the signal generator, respectively. Thus, the connector, together with the signal generator, the digital multimeter, and the seismic data acquisition device (the device under test), forms a very long period signal acquisition index test circuit for the seismic data acquisition device (the device under test).

10. The system according to claim 1, characterized in that, The indicator test commands include: sensor communication indicator test commands for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received indicator test commands, including: The connector controls the state of each relay in the relay group, shorting the serial communication transmitting terminal of the seismic data acquisition device (the device under test) to the transmitting terminal of the second serial interface, shorting the serial communication receiving terminal of the seismic data acquisition device to the receiving terminal of the second serial interface, and shorting the serial communication ground terminal of the seismic data acquisition device to the ground terminal of the second serial interface. Thus, the connector and the seismic data acquisition device (the device under test) together form the sensor communication index test circuit of the seismic data acquisition device (the device under test).

11. The system according to claim 1, characterized in that, The index test commands include: sensor control signal index test commands for the seismic data acquisition device, and the connector controls the state of each relay in the relay group according to the received index test commands, including: The connector controls the state of each relay in the relay group, causing the seismograph zeroing control terminal, seismograph swing control terminal, and swing lock signal terminal of the seismic data acquisition device currently under test to be shorted to the positive terminals of the three differential signal channels of the seismic data acquisition device. Thus, the connector and the seismic data acquisition device currently under test together form the sensor control signal index test circuit of the seismic data acquisition device currently under test.

12. The system according to claim 1, characterized in that, The system also includes a Global Navigation Satellite System (GNSS) timing module, which is connected to at least one seismic data acquisition unit. The host computer receives GNSS clock synchronization status information transmitted from each seismic data acquisition unit and determines the test results of the GNSS clock synchronization index of each seismic acquisition unit based on the GNSS clock synchronization status information.

13. A method for testing a seismic data acquisition device, characterized in that, The method is executed in a host computer of the system as described in any one of claims 1 to 12, the host computer being connected to a signal generator, a digital multimeter, at least one seismic data acquisition unit, and a connector, respectively, and the method includes the steps of: The current test indicators of the seismic data acquisition device set by the user are obtained through the seismic data acquisition device test interface; wherein, the seismic data acquisition device is connected to the connector, and the connector is also connected to the signal generator, the digital multimeter and the host computer respectively; Based on the current test index, a test control command is generated; wherein, the test control command includes: an index test instruction, which is used to control the state of each relay in the relay group in the connector, so that some or all of the signal generator, digital multimeter and each seismic data acquisition unit together with the connector form a test circuit for the current test index; Send the test control command to at least one device connected to the host computer; Receive and store information transmitted from at least one device connected to a host computer; Based on the stored information, the test results of the seismic data acquisition device, which is currently being tested, for the current test index are determined.

14. The method according to claim 13, characterized in that, The receiving and storing of information transmitted from at least one device connected to the host computer includes: The acquisition thread in the host computer receives frames transmitted from the seismic data acquisition unit via sockets. If the frame is a data frame, the acquisition thread stores the frame in a data buffer queue; If the frame is an information frame, the acquisition thread stores the frame in an information buffer queue.

15. The method according to claim 13 or 14, characterized in that, When the connector is also connected to a clock device for generating clock signals, and the index test command is the absolute clock difference index test command for each differential signal channel of the seismic data acquisition device, the receiving and storage of information transmitted from at least one device connected to the host computer includes: Receives and stores pulse sampling signals from each differential signal channel transmitted by the seismic data acquisition unit; The step of determining the test results of the seismic data acquisition device, which is currently the device under test, for the current test index based on the stored information includes: According to the preset resampling frequency, each of the pulse sampling signals is resampled to obtain each pulse resampled signal, and a resampled signal segment is extracted from each pulse resampled signal; wherein, the resampled signal segment includes: a first resampled signal segment with a predetermined duration before the pulse period start signal, and a second resampled signal segment with a predetermined duration after the pulse period start signal; For each differential signal channel, calculate the mean of the partial resampled signal in the first resampled signal segment and the mean of the partial resampled signal in the second resampled signal segment respectively. For each differential signal channel, the time point of the pulse resampling signal at half the rising edge is calculated based on the difference between the two means and the time point of the first pulse resampling signal in the resampling signal segment that is greater than half of the difference. For each differential signal channel, the time offset of the half-rise edge is calculated based on the time point of the half-rise edge and the resampling frequency; wherein, the time offset is used as the absolute clock difference.

16. A computer-readable storage medium storing a computer program for performing the method described in any one of claims 13 to 15.

17. An electronic device, the electronic device comprising: processor; Memory used to store the processor's executable instructions; The processor is configured to read the executable instructions from the memory and execute the instructions to implement the method described in any one of claims 13 to 15.

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