A quality traceability method in a manufacturing process based on multi-source data parallel processing
By using the Transformer framework that integrates variable tokens and patch tokens in parallel with dual tokens, combined with MPC closed-loop regulation and Neo4j-PROV traceability, the challenges of cross-variable dependency and local detail capture in the manufacturing process are solved, achieving high-precision prediction and rapid traceability, and meeting compliance requirements.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NORTHEASTERN UNIV CHINA
- Filing Date
- 2026-03-02
- Publication Date
- 2026-06-30
AI Technical Summary
Existing Transformer models struggle to capture both global dependencies across variables and details of local segments during the manufacturing process. The fragmentation of the process leads to untraceable prediction biases, and the lack of a PROV-DM traceability framework fails to meet compliance requirements.
A Transformer framework that uses dual-token parallel fusion of variable tokens and patch tokens, combined with MPC closed-loop regulation and Neo4j-PROV tracing, is adopted to achieve parallel processing of multi-source data and end-to-end tracing.
It improves prediction accuracy, reduces traceability query latency to within 100ms, and achieves integrated manufacturing quality management with high precision, high transparency, and high governance.
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