Lens diopter and microstructure detection device and method based on diaphragm film layer modification

Abstract

The invention discloses a lens diopter and microstructure detection device and method based on diaphragm film modification, the lens diopter and microstructure detection device comprises a support table, a focusing assembly and an imaging assembly, the focusing assembly and the imaging assembly are both installed on the support table, a Hartmann diaphragm is installed on the imaging assembly, and the Hartmann diaphragm is installed on the support table. The Hartmann diaphragm is arranged on the surface of the imaging assembly, the lens to be detected is arranged between the Hartmann diaphragm and the focusing assembly, optical axes of the Hartmann diaphragm, the lens to be detected, the focusing assembly and the imaging assembly are located in the same plane, a micropore array is arranged on the Hartmann diaphragm, a notch-like filter film is arranged on the surface of the Hartmann diaphragm, and the notch-like filter film is used for blocking green light in the wave band of 500-580 nm. Aiming at the problem that the precision is uncontrollable due to the fact that the optical center and the geometric center of the microstructure area of the current microstructure lens cannot be positioned at the same time, the quality of the microstructure lens and the precision of an inspection mechanism can be improved.

Description

Technical Field

[0001] This invention relates to the field of optical precision measurement technology, specifically to a device and method for detecting lens refractive power and microstructure based on aperture membrane layer modification. Background Technology

[0002] Currently, microstructured lenses are commonly used by teenagers to intervene in myopia control, becoming an important part of the prevention and control system. The optical performance of these lenses depends on two core parameters: first, the refractive power required for basic refractive correction and the position of the optical center; second, the geometric center position of the microstructured region that directly affects the defocus control effect. If either of these positions is misaligned, the myopia control function of the lens will be severely weakened.

[0003] However, the mainstream testing instrument in the optometry industry is the focimeter, whose optical principle is mainly designed for traditional single-vision lenses. It calculates refractive power by utilizing the displacement change of collimated light after passing through the Hartmann stop, but it is difficult to effectively capture the spatial distribution characteristics of microstructural regions. Actual measurements require a step-by-step process: first, the optical center is determined using the focimeter, then the center of the microstructure is manually located using a microscopic imaging device. This multi-step, multi-device operation mode leads to low testing efficiency, significant human error interference, and fragmented data storage. Therefore, with the increasingly clear requirements for technological integration in myopia prevention and control policies, breaking through the technological bottlenecks of single-function devices and achieving efficient, accurate, and integrated detection of key parameters has become an urgent problem to be solved. Summary of the Invention

[0004] This invention provides a lens refractive power and microstructure detection device and method based on diaphragm layer modification. It addresses the problem of uncontrollable accuracy caused by the inability to simultaneously locate the optical center and the geometric center of the microstructure region in current microstructure lenses, and can improve the quality of microstructure lenses and the accuracy of inspection institutions.

[0005] To achieve the above objectives, in a first aspect, the present invention provides the following technical solution: a lens refractive power and microstructure detection device based on aperture film layer modification, comprising a support stage, a focusing component, and an imaging component. The focusing component and the imaging component are both mounted on the support stage. A Hartmann aperture is mounted on the imaging component. The lens under test is positioned between the Hartmann aperture and the focusing component. The optical axes of the Hartmann aperture, the lens under test, the focusing component, and the imaging component are located in the same plane. The Hartmann aperture has a micropore array and a notch-like filter film on its surface. The notch-like filter film is used to block green light in the 500-580nm wavelength range. Through the innovative combination design of the notch-like filter film and the Hartmann aperture, a single Hartmann aperture simultaneously possesses refractive power measurement and microstructure analysis functions, solving the pain points of step-by-step detection and data fragmentation in traditional equipment. Dual core parameter detection can be completed in a single setup, improving detection efficiency. The notch-like filter film accurately blocks 500-580nm wavelengths. Green light is used to avoid interference from stray light in the refractive index measurement spot signal. The micro-aperture array ensures the regularity of green light transmission, significantly improving the accuracy of refractive index measurement.

[0006] Preferably, the center stopband wavelength of the notch filter is 543 nm, the transmittance of light in the 500-580 nm band is ≤10%, and the transmittance of light in other bands is ≥90%. The precise positioning of the center stopband wavelength at 543 nm is a perfect match with the green light band commonly used in refractive power measurement. The transmittance of ≤10% in the 500-580 nm band effectively blocks interference light and ensures the purity of the light spot signal.

[0007] Preferably, the notch filter film uses an interference destructive structure formed by alternating stacks of materials with different refractive indices, including one or more elements such as O, Si, and Ti. The interference destructive structure formed by alternating stacks of high and low refractive index materials can accurately block green light in a specific wavelength band, with strong filtering selectivity, avoiding the influence on other wavelength bands of light. In addition, the use of common optical materials such as O, Si, and Ti is widely available, low in cost, and has good chemical stability, making the film layer less prone to oxidation and peeling, thus extending the service life of the device.

[0008] Preferably, the coating method between the notch filter and the Hartmann stop is magnetron sputtering, ion beam sputtering, or atomic layer deposition. Magnetron sputtering, ion beam sputtering, and atomic layer deposition are all mature optical coating processes with good coating uniformity and strong film adhesion.

[0009] Preferably, the focusing assembly includes at least a collimating lens and an illumination source. The illumination source is located on the focal plane of the collimating lens, and the distance between the two is matched with the focal length of the collimating lens. The illumination source and the optical axis of the collimating lens are coplanar. The illumination source 1 is located on the focal plane of the collimating lens and the distance is matched, ensuring that the parallelism of the emitted light is sufficiently high after collimation, providing stable incident light conditions for diopter measurement, and reducing measurement errors caused by light divergence.

[0010] Preferably, the collimating lens is a single-lens structure or a cemented lens group structure; it is composed of at least one of plano-convex lens, biconvex lens, aspherical lens, Fresnel lens and gradient refractive index lens. The single-lens structure is easy to process and has a low cost, making it suitable for conventional precision measurement scenarios; the cemented lens group structure can correct aberrations, making it suitable for high-precision measurement requirements and improving the adaptability of the device.

[0011] Preferably, the imaging component includes a sample holder and an image sensor. The Hartmann aperture and the lens under test are both positioned and mounted on the sample holder. The image sensor is located on the light signal transmission path emitted through the Hartmann aperture. The sample holder positions the Hartmann aperture and the lens under test to ensure that their relative positions are fixed, avoiding optical path offset caused by component displacement during measurement and ensuring measurement stability.

[0012] Preferably, the sample holder is provided with sliding guide rails connected to the support platform in the X, Y, and Z axes. The sample holder has a circular light-transmitting hole at its center, which corresponds to the Hartmann aperture and the lens under test. The three-axis sliding guide rails enable precise adjustment of the sample holder in the X, Y, and Z directions, and allow the position of the Hartmann aperture and the lens under test to be adjusted during testing to match the illumination source. And / or, the sample holder has an integrated auxiliary positioning device at the top for positioning the lens to be tested. The auxiliary positioning device is a spring clamping unit or a vacuum adsorption unit. The two options of spring clamping unit and vacuum adsorption unit can be adapted to hard lenses and fragile, thin lenses respectively, to avoid lens damage and to fix them firmly.

[0013] Preferably, the arrangement of the micro-aperture array includes at least one of equal-spaced orthogonal grid arrangement and gradually varying spacing arrangement. The micro-aperture array with equal-spaced orthogonal grid arrangement has a uniform light spot distribution, which facilitates the rapid calculation of the light spot offset by the algorithm. The micro-aperture array with gradually varying spacing arrangement has dense micro-apertures in the central region and sparse micro-apertures in the outer region, which can adapt to the measurement requirements of large field of view and high precision, and takes into account both accuracy and practicality.

[0014] In a second aspect, the present invention also provides a method for detecting the refractive power and microstructure of a lens based on the aperture membrane layer modification described in the first aspect, comprising the following steps: When measuring the refractive power of a lens, the lens to be tested is placed on a sample holder. The collimated and parallel light emitted by the focusing component passes through the lens to be tested vertically. The light is blocked by a notch filter-like film, and some of the green light passes through the micro-aperture array on the Hartmann aperture to reach the image sensor. By comparing the geometric offset of the array spot passing through the circular aperture before and after the lens is placed, the refractive power parameters of the lens are accurately calculated. When performing microstructure analysis of a lens, the light source of the focusing component is switched to infrared light. After the infrared light passes through the lens under test, it is all projected onto the Hartmann aperture and passes through the Hartmann aperture, and finally the corresponding signal is received by the image sensor. When simultaneously measuring the distance between the optical center of the lens and the geometric center of the microstructure region, the distance measurement tool built into the detection device is selected. Based on the calibrated optical center and the geometric center of the microstructure region, the spatial distance between the two feature points is accurately determined.

[0015] The overall method is simple to operate, requiring no equipment switching; only switching the light source band is needed to complete dual-function measurements. Each test is short, significantly reducing labor costs and testing time.

[0016] Compared with the prior art, the beneficial effects of the present invention are: This invention innovatively combines a notch-like filter with a Hartmann aperture, enabling a single Hartmann aperture to simultaneously perform refractive power measurement and microstructure analysis. This addresses the pain points of traditional equipment, such as step-by-step testing and fragmented data, allowing for the detection of dual core parameters in a single setup, thus improving testing efficiency. The notch-like filter precisely blocks 500-580nm green light, preventing stray light from interfering with the light spot signal in refractive power measurement. The micro-aperture array ensures the regularity of green light transmission, significantly improving the accuracy of refractive power measurement. Therefore, the technical solution of this invention integrates a lens refractive power measurement module and a high-precision microstructure analysis module, combining the refractive power measurement function and optical center positioning function of a traditional focimeter with the microscopic morphology analysis function of a microscopic observation system into a single instrument. During the inspection process, the optical center coordinates of the microstructure lens and the geometric center coordinates of the microstructure region can be acquired simultaneously, and the two can be compared and the offset calculated in real time. This completely eliminates the systematic and random errors introduced by lens movement, repeated positioning fixtures, and inconsistent human operation in the traditional step-by-step inspection process, which first uses a focimeter to measure the optical center and then uses a microscope to observe the microstructure. This achieves real-time synchronous acquisition of optical center positioning data and microstructure region geometric center data. The optical center coordinates and microstructure geometric center coordinates are acquired at the same time, at the same position, and in the same reference coordinate system. The two sets of coordinates are directly comparable, which fundamentally guarantees the absolute accuracy and reliability of the position offset calculation. Users can obtain all core inspection results at the same time after completing one clamping and startup, greatly improving inspection efficiency. Attached Figure Description

[0017] Figure 1 This is a schematic diagram illustrating the principle of the present invention; Figure 2 The transmittance curves of the notch filter film of the present invention in different wavelength bands are shown. Figure 3 This is an EDS analysis diagram of the notch filter film of the present invention; Figure 4 This is a structural diagram of the Hartmann aperture and notch-like filter film of the present invention; Figure 5 This is a cross-sectional view of the detection device of the present invention; Figure 6 This is a three-dimensional structural diagram of the detection device of the present invention.

[0018] Figure label: 1. Illumination source, 2. Collimating lens, 3. Notch filter, 4. Hartmann aperture, 41. Micropore array, 5. Sample holder, 6. Image sensor, 7. Lens to be tested, 8. Stage. Detailed Implementation

[0019] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

[0020] like Figure 1-6 As shown, this invention provides a solution to the problems of low efficiency and large human error in current lens diopter and microstructure analysis, which rely on multiple devices. The invention offers the following technical solution: a lens diopter and microstructure detection device based on aperture diaphragm modification, comprising a support stage 8, a focusing assembly, and an imaging assembly. Both the focusing assembly and the imaging assembly are mounted on the support stage 8. The imaging assembly is characterized by having a Hartmann aperture 4 mounted on it. The lens under test 7 is positioned between the Hartmann aperture 4 and the focusing assembly. The optical axes of the Hartmann aperture 4, the lens under test 7, the focusing assembly, and the imaging assembly are located in the same plane. The device is equipped with a micropore array 41 and a notch-like filter 3 on its surface. The notch-like filter 3 is used to block green light in the 500-580nm wavelength range. Through the innovative combination design of the notch-like filter 3 and the Hartmann aperture 4, a single Hartmann aperture can simultaneously perform refractive power measurement and microstructure analysis functions, solving the pain points of traditional equipment such as step-by-step detection and data fragmentation. Dual core parameter detection can be completed in a single clamping, improving detection efficiency. The notch-like filter 3 accurately blocks 500-580nm green light, avoiding stray light interference with the spot signal of refractive power measurement. The micropore array ensures the regularity of green light transmission, significantly improving the accuracy of refractive power measurement.

[0021] Specifically, the base layer of the Hartmann aperture 4 is made of optical glass with a light transmittance of 96%, with an overall diameter of 45mm and a thickness of 4mm; the aperture surface is uniformly coated with a notch filter film 3, which has a transmittance of ≤9% for green light in the 500-580nm band; the aperture surface is etched with a circular micro-hole array 41, and the lens to be tested 7 can be a microstructure resin lens for myopia prevention and control in adolescents.

[0022] In this embodiment, the center stopband wavelength of the notch filter 3 is 543nm, the transmittance of light in the 500-580nm band is ≤10%, and the transmittance of light in other bands is ≥90%. The precise positioning of the center stopband wavelength at 543nm is a perfect match with the green light band commonly used in refractive power measurement. The transmittance of ≤10% in the 500-580nm band effectively blocks interference light and ensures the purity of the light spot signal.

[0023] Furthermore, the notch-like filter 3 can be formed by alternating stacks of materials with different refractive indices to create an interference-destructive structure, including one or more elements such as O, Si, and Ti. This alternating stacking of high and low refractive index materials achieves precise blocking of green light in a specific wavelength band, exhibiting strong filter selectivity and avoiding interference with other wavelength bands. Additionally, the use of common optical materials such as O, Si, and Ti ensures wide availability, low cost, and good chemical stability, preventing oxidation and peeling of the film and extending the device's lifespan. Specifically, the notch-like filter 3 can be made of SiO2 (low refractive index, n=1.46) and Ti. The destructive interference structure of alternating stacked O2 (high refractive index, n=2.35) can employ a total of 15 film layers with a total thickness of 850nm. Among them, there are 7 SiO2 film layers with single-layer thicknesses of 50nm, 60nm, 70nm, 80nm, 70nm, 60nm, and 50nm, respectively; and 8 TiO2 film layers with single-layer thicknesses of 45nm, 55nm, 65nm, 75nm, 75nm, 65nm, 55nm, and 45nm, respectively. The film layers contain three elements: O, Si, and Ti. EDS analysis shows that the content of each element is 58% O, 27% Si, and 15% Ti.

[0024] In this embodiment, the coating method between the notch filter 3 and the Hartmann stop 4 is magnetron sputtering, ion beam sputtering, or atomic layer deposition. Magnetron sputtering, ion beam sputtering, and atomic layer deposition are all mature optical coating processes with good coating uniformity and strong film adhesion.

[0025] In this embodiment, the focusing assembly includes at least a collimating lens 2 and an illumination source 1. The illumination source 1 is located on the focal plane of the collimating lens 2, and the distance between them matches the focal length of the collimating lens 2. The optical axes of the illumination source 1 and the collimating lens 2 are coplanar. The location of the illumination source 1 on the focal plane of the collimating lens and the matching distance ensure that the parallelism of the emitted light is sufficiently high after collimation, providing stable incident light conditions for refractive power measurement and reducing measurement errors caused by light divergence. Specifically, the focusing assembly includes a green LED light source with a wavelength of 543nm and a biconvex lens-type collimating lens 2. The focal length of the collimating lens 2 is f=80mm. The illumination source 1 is fixed on the focal plane of the collimating lens 2, and the distance between them is fixed at 80mm by a precision bracket, which perfectly matches the focal length. The illumination source 1 has a power of 4W, a light-emitting surface size of 2mm×2mm, and its optical axis is coplanar with the optical axis of the collimating lens 2, with a coplanarity error ≤±0.06mm.

[0026] In this embodiment, the collimating lens is either a single-lens structure or a cemented lens group structure. It comprises at least one of a plano-convex lens, a biconvex lens, an aspherical lens, a Fresnel lens, and a gradient refractive index lens. The single-lens structure is simple to manufacture and has a low cost, making it suitable for conventional precision measurement scenarios. The cemented lens group structure can correct aberrations, making it suitable for high-precision measurement needs and improving the adaptability of the device. Specifically, as a first option, the collimating lens 2 adopts a single-lens Fresnel lens made of PMMA resin, with an effective aperture of 22mm, a focal length of 80mm, an aberration ≤0.01mm, and a weight of only 15g, making it suitable for portable measuring devices. As a second option, the collimating lens 2 adopts a cemented lens group structure, consisting of a plano-convex lens and a biconvex lens cemented together, with an effective aperture of 25mm, a focal length of 80mm, and an aberration ≤0.006mm, suitable for high-precision laboratory measurement scenarios.

[0027] In this embodiment, the imaging assembly includes a sample holder 5 and an image sensor 6. The Hartmann aperture 4 and the lens under test 7 are both positioned on the sample holder 5. The image sensor 6 is located on the light signal transmission path emitted through the Hartmann aperture 4. The sample holder 5 positions the Hartmann aperture 4 and the lens under test 7 to ensure their relative positions are fixed, avoiding optical path offset caused by component displacement during measurement and ensuring measurement stability. Specifically, the imaging assembly includes a sample holder 5 made of 304 stainless steel and an image sensor 6. The sample holder 5 is provided with an annular positioning groove adapted to the Hartmann aperture 4, and the radial positioning error after the aperture is embedded is ≤±0.04mm. The lens under test 7 is fixed by a limiting step inside the positioning groove, and the axial distance between it and the aperture is 10mm. The image sensor 6 is an OV50A model with 50 million pixels and a sampling frequency of 25fps, and is located 45mm directly behind the Hartmann aperture 4.

[0028] In this embodiment, the sample holder 5 is equipped with sliding guide rails connected to the support platform 8 in the X, Y, and Z axes. The sample holder 5 has a circular light-transmitting hole at its center, which corresponds to the Hartmann aperture 4 and the lens under test 7. The three-axis sliding guide rails enable precise adjustment of the sample holder in the X, Y, and Z directions, allowing for adjustment of the positions of the Hartmann aperture 4 and the lens under test 7 during testing to match the illumination source. Specifically, the X, Y, and Z axial sliding guide rails of the sample holder 4 adopt a ball screw structure, providing high axial positioning accuracy, a guide rail stroke of 50 mm, and an adjustment step of 0.1 μm. The diameter of the circular light-transmitting hole at the center of the sample holder 4 is 5 mm. In addition, the sample holder 5 integrates an auxiliary positioning device at its top for positioning the lens 7 to be tested. The auxiliary positioning device is either a spring clamping unit or a vacuum adsorption unit. The two options can be adapted to hard lenses and fragile, thin lenses respectively, avoiding lens damage and ensuring a firm fixation. Specifically, in the first option, the auxiliary positioning device is a spring clamping unit, which uses three sets of stainless steel arc-shaped spring sheets evenly distributed on the top of the sample holder 5. The clamping force of the spring sheets is 5-10N, and the clamping range is suitable for lenses with a diameter of 40-80mm. After clamping, the radial displacement of the lens is ≤±0.02mm. In the second option, the auxiliary positioning device is a vacuum adsorption unit with a ring-shaped adsorption surface with a diameter of 10mm. A vacuum generator is used to provide a vacuum degree of -0.08MPa. After adsorption, the axial displacement of the lens is ≤±0.01mm, which is suitable for thin lenses with a thickness of ≤5mm.

[0029] In this embodiment, the arrangement of the microaperture array 41 includes at least one of equal-spaced orthogonal grid arrangement and gradually varying spacing arrangement. The microaperture array with equal-spaced orthogonal grid arrangement has a uniform spot distribution, facilitating rapid calculation of spot offset using algorithms. The microaperture array with gradually varying spacing arrangement has densely packed microapertures in the central region and sparsely spaced microapertures in the outer region, adapting to the requirements of large field of view and high-precision measurement, balancing accuracy and practicality. Specifically, as the first option, the microaperture array 41 adopts an equal-spaced orthogonal grid arrangement, with both row and column spacing of 0.5 mm, resulting in a uniform distribution of 16 microapertures. As the second option, the microaperture array 41 adopts a gradually varying spacing arrangement, where the spacing between adjacent microapertures changes according to an arithmetic sequence from the center of the aperture outwards, with the first term being 0.3 mm and a tolerance of 0.05 mm, and the spacing between microapertures in the outermost region being 1.0 mm.

[0030] In this embodiment, the detection device is also equipped with a computing system, such as an ARM Cortex-A9 processor with a main frequency of 1.5 GHz, and a display screen. The computing system is equipped with the Zernike polynomial wavefront reconstruction algorithm and pixel coordinate conversion algorithm, which can realize functions such as diopter calculation, microstructure imaging, and dual-center distance measurement. The display screen is used to display measurement parameters, images and results.

[0031] The complete implementation process of the measurement method in this embodiment includes the following steps: (1) Equipment preparation: Press the power switch to start the device and enter the self-test mode. The self-test includes light source brightness, lens position, sensor status, optical axis parallelism, etc. After the self-test is passed, the display screen lights up and displays the mode selection interface by default (Mode 1: diopter measurement, Mode 2: microstructure measurement, Mode 3: dual center distance measurement).

[0032] (2) Calibration operation: Empty sample holder 5, select mode 1, and observe whether the display shows 0.00D, such as spherical lens 0.00D, cylindrical lens 0.00D, and axis position not displayed; if the displayed deviation exceeds ±0.01D, insert a standard lens, click the "calibrate" button as prompted on the display, and the system will automatically complete the calibration. After calibration, the deviation will be ≤ ±0.005D.

[0033] (3) Sample clamping Place the back surface of the microstructure lens for myopia control of the adolescent to be tested face down above the light-transmitting hole in the center of the sample holder 5. Fix the edge of the lens with 4 sets of spring clamping units to ensure that the lens is stable and centered without loosening or tilting, with a positioning error of ≤±0.6mm.

[0034] (4) Refractive power measurement (mode 1) When mode 1 is selected, the device automatically switches to a 543nm green light source. The scattered light emitted by the light source is converted into collimated light with a parallelism of ≥99.8% by the collimating lens 2 and passes perpendicularly through the lens under test 7. Green light passing through the lens is incident on the notch filter 3 of the Hartmann aperture 4. The stray light in the 500-580nm band is blocked, and only pure 543nm green light passes through the micro-hole array 41 to form a regular array of light spots. The light spot signal is transmitted to the image sensor 6. The calculation system compares the geometric offset of the array light spot before and after lens placement. Specifically, the light spot shifts by an average of 20 pixels after placement, with 1 pixel corresponding to 0.01mm and an actual offset of 0.2mm. Combined with the Zernike polynomial wavefront reconstruction algorithm, the refractive power parameters are accurately calculated. Meanwhile, the system uses an image sharpness recognition algorithm (sharpness threshold ≥85%) to locate the optical center of the lens, marks the center coordinates as X: 8.5mm, Y: 9.2mm on the display screen, and displays the measurement results: spherical lens -2.52D, cylindrical lens -0.48D, axis 179°, measurement time 9s.

[0035] (5) Microstructure measurement (mode 2) Exit mode 1, select mode 2, the device automatically switches to 850nm infrared light source, the infrared light is transmitted through the lens under test 7 and then projected onto the Hartmann aperture 4; Infrared light passes through the notch filter 3 and the aperture substrate and arrives at the image sensor 6 without obstruction, forming a clear microstructure image; Observe the microstructure image on the display screen, manually adjust the X and Y axis positions of the sample holder 5 to ensure that the center of the crosshair is aligned with the geometric center of the microstructure area. The system automatically marks the coordinates of this center as X: 8.8mm, Y: 9.7mm. The measurement takes 7 seconds.

[0036] (6) Dual-center distance measurement (mode 3) Exit Mode 2 and select Mode 3. The system will automatically retrieve the calibrated optical center coordinates as X: 8.5mm, Y: 9.2mm and the geometric center coordinates of the microstructure region as X: 8.8mm, Y: 9.7mm. Based on the pixel coordinate conversion algorithm, the distance was calculated to be 0.58mm. The display screen shows the distance measurement results and error range. Users can choose to save the measurement data, including diopter parameters, center coordinates, and distance values, or print a report. The total detection time is 25 seconds.

[0037] (7) Equipment shutdown After the measurement is completed, remove the lens to be tested, turn off the light source, press the power switch to turn off the device, and clean the dust and impurities on the sample holder and aperture surface to ensure the equipment is clean.

[0038] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0039] Furthermore, in this invention, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly and specifically defined.

[0040] In this invention, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0041] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

Claims

1. A lens refractive power and microstructure detection device based on aperture membrane layer modification, comprising a support stage (8), a focusing assembly, and an imaging assembly, wherein the focusing assembly and the imaging assembly are both mounted on the support stage (8), characterized in that, The imaging component is equipped with a Hartmann aperture (4), and the lens under test (7) is placed between the Hartmann aperture (4) and the focusing component. The optical axes of the Hartmann aperture (4), the lens under test (7), the focusing component and the imaging component are located in the same plane. The Hartmann aperture (4) is provided with a micro-hole array (41) and a notch filter (3) is provided on its surface. The notch filter (3) is used to block green light in the 500-580nm wavelength band.

2. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 1, characterized in that: The notch filter (3) has a center stopband wavelength of 543 nm, a transmittance of ≤10% for light in the 500-580 nm band, and a transmittance of ≥90% for light in other bands.

3. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 2, characterized in that: The notch filter (3) is formed by alternating stacking of materials with different refractive indices to form an interference destructive structure, including one or more elements of O, Si and Ti.

4. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 3, characterized in that: The coating method between the notch filter (3) and the Hartmann stop (4) is magnetron sputtering, ion beam sputtering or atomic layer deposition.

5. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 2, characterized in that: The focusing assembly includes at least a collimating lens (2) and an illumination source (1). The illumination source (1) is located on the focal plane of the collimating lens (2), and the distance between the two is matched with the focal length of the collimating lens (2). The optical axis of the illumination source (1) is coplanar with that of the collimating lens (2).

6. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 5, characterized in that: The collimating lens type is a single lens structure or a cemented lens group structure; it is composed of at least one of plano-convex lens, biconvex lens, aspherical lens, Fresnel lens and gradient refractive index lens.

7. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 2, characterized in that: The imaging assembly includes a sample holder (5) and an image sensor (6). The Hartmann aperture (4) and the lens under test (7) are both positioned on the sample holder (5). The image sensor (6) is located on the light signal transmission path emitted through the Hartmann aperture (4).

8. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 7, characterized in that: The sample holder (5) is provided with sliding guide rails connected to the support platform (8) in the X, Y and Z axes. The center of the sample holder (5) is provided with a circular light-transmitting hole, which corresponds to the Hartmann aperture (4) and the lens to be tested (7). And / or, the sample holder (5) is integrated with an auxiliary positioning device for positioning the lens to be tested (7) on the top, the auxiliary positioning device being a spring clamping unit or a vacuum adsorption unit.

9. The lens refractive power and microstructure detection device based on aperture membrane layer modification according to claim 1, characterized in that: The arrangement of the micropore array (41) includes at least one of equal-spaced orthogonal grid arrangement and gradually varying spacing arrangement.

10. A method for detecting the refractive power and microstructure of a lens based on aperture membrane layer modification according to any one of claims 7-9, characterized in that, Includes the following steps: When measuring the refractive power of a lens, the lens to be tested (7) is placed on the sample holder (5). The collimated parallel light emitted by the focusing component passes through the lens to be tested (7) vertically. After being blocked by the notch filter (3), some green light passes through the micro-aperture array (41) on the Hartmann aperture (4) and arrives at the image sensor (6). By comparing the geometric offset of the array spot passing through the circular aperture before and after the lens is placed, the refractive power parameters of the lens are accurately calculated. When performing microstructure analysis of the lens, the light source of the focusing component is switched to infrared light. After the infrared light passes through the lens under test (7), it is projected onto the Hartmann aperture (4) and passes through the Hartmann aperture (4) before being received by the image sensor (6). When simultaneously measuring the distance between the optical center of the lens and the geometric center of the microstructure region, the distance measurement tool built into the detection device is selected. Based on the calibrated markers of the optical center and the geometric center of the microstructure region, the spatial distance between the two feature points is accurately determined.

Images