Global grid crop yield prediction method and system based on phenological modeling
By employing phenological modeling methods, the problems of insufficient spatial resolution, poor phenological adaptability, and poor prediction timeliness in existing technologies have been solved, enabling efficient and accurate prediction of global gridded crop yields and supporting agricultural decision-making and food security early warning.
CN121936675APending Publication Date: 2026-04-28STATE QIHOU CENT
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- STATE QIHOU CENT
- Filing Date
- 2026-01-21
- Publication Date
- 2026-04-28
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Figure CN121936675A_ABST
Abstract
The invention discloses a global lattice point crop yield prediction method and system based on phenological modeling. The prediction method comprises the steps of S1, data preparation and preprocessing; step S2, phenological self-adaptive data extraction; s3, constructing and optimizing a historical model; s4, predicting the yield in real time; s5, evaluating and classifying results; and S6, result output and visualization processing are carried out. According to the method, the growth season is dynamically determined by adopting a global crop calendar, six candidate models are provided and optimized based on an AIC criterion, prediction products containing apology classification and multi-dimensional evaluation indexes are output, and a scientific basis is provided for grain safety early warning and agricultural decision making.
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