X-ray diffractometer sample table compatible with different manufacturers

Abstract

The invention belongs to the related technical field of diffractometer corollary equipment, and discloses an X-ray diffractometer sample stage compatible with different manufacturers, which comprises three structural layers in vertical layering and splicing design, the X-ray diffractometer and goniometer butt joint layer is used for being in butt joint with X-ray diffractometers and goniometer of different manufacturers, and meanwhile splicing with the core function execution layer is achieved through a conical surface positioning pin, an annular magnetic attraction groove and the like. An independent driving and control module is arranged in the core function execution layer and is used for independently completing the functions of translation, rotation, inclination angle adjustment and the like; the sample bearing and fixing layer is provided with a plurality of sample clamps matched with samples in different forms. The technical problems that mechanical interfaces of sample tables of different manufacturers are not uniform, control protocols are not compatible, and recalibration is needed after replacement are effectively solved, and the sample table has the advantages of being compact in structure, convenient to control, high in switching efficiency, accurate and reliable in positioning, capable of achieving plug and play and the like.

Description

Technical Field

[0001] This invention belongs to the technical field of diffractometer supporting equipment, and more specifically, relates to a sample stage for X-ray diffractometers compatible with different manufacturers. Background Technology

[0002] The sample stage of a multifunctional X-ray diffractometer (XRD) is one of the core components for supporting, fixing, and adjusting samples. Its functionality directly affects the accuracy of diffraction data, experimental efficiency, and the scalability of testing scenarios. To meet different testing needs, a multifunctional sample stage needs to integrate various adjustment and control functions. More specifically, the multifunctional sample stage needs to provide translation (X / Y / Z axes), rotation (θ / ω axes), and tilt adjustment functions to achieve high-precision testing. Simultaneously, the multifunctional sample stage also needs to integrate auxiliary units such as temperature control, atmosphere control, and stress control to achieve in-situ XRD testing, which is crucial in materials science research (such as battery materials and high-temperature alloys).

[0003] However, further research reveals that existing technologies still suffer from the following defects or deficiencies: XRD sample stages from different manufacturers exhibit poor overall compatibility, with incompatible mechanics and interfaces; furthermore, multi-functional sample stages require precise docking with the diffractometer's goniometer, and the mounting hole positions, positioning references, and load-bearing designs of goniometers from different manufacturers vary significantly. For example, the magnetic positioning interface of the Bruker D8 series automatic sample stage is completely different from the snap-fit ​​interface of the Panaco Empyrean series, making cross-installation impossible. The lack of a unified mechanical interface standard further complicates the interchangeability of multi-functional sample stages from different brands; simultaneously, imported original sample stages are expensive, and repair costs are high, resulting in high operating costs and hindering widespread adoption.

[0004] Accordingly, there is an urgent need for continued research and improvement in this field to address the aforementioned technical pain points in the existing technology. Summary of the Invention

[0005] To address one or more of the above-mentioned defects or improvement needs in the existing technology, this invention provides an X-ray diffractometer sample stage compatible with different manufacturers. Through improvements to its overall structural composition and spatial arrangement, particularly the modular design and inter-component arrangement of key components such as the interface unit layer and core function execution layer, this X-ray diffractometer sample stage achieves a "modular design with interconnected interfaces," effectively solving the technical pain points of inconsistent mechanical interfaces, incompatible control protocols, and the need for recalibration after replacement in current sample stages from different manufacturers. It also boasts advantages such as compact structure, ease of operation, high switching efficiency, accurate and reliable positioning, and plug-and-play functionality.

[0006] To achieve the above objectives, according to the present invention, an X-ray diffractometer sample stage compatible with different manufacturers is provided. The sample stage comprises three vertically layered and spliced ​​structural layers: an interface unit layer, a core function execution layer, and a sample support and fixation layer, wherein: The interface unit layer is located at the bottom of the entire sample stage and includes a load-bearing base and a locking mechanism. The load-bearing base integrates snap-on interfaces, bolt fastening interfaces, and magnetic interfaces for docking with the goniometers of X-ray diffractometers from different manufacturers. In addition, each interface is equipped with a conical positioning pin and an annular magnetic groove for aligning with the lower interface of the core function execution layer during splicing and performing magnetic pre-fixation after light pressure. The locking mechanism is used to lock the interface unit layer and the core function execution layer together after installation and pre-fixation, thereby achieving a rigid connection between the two. The core function execution layer is located in the middle of the entire sample stage. It has interfaces on both the upper and lower sides. The lower interface is used to connect with the interface unit layer, and the upper interface is used to connect with the sample support and fixing layer. The core function execution layer also has an independent drive and control module built in, which is used to independently complete functions such as translation, rotation, and tilt adjustment. At the same time, multiple standardized expansion interfaces are reserved on the side. The sample support and fixing layer is located at the top of the entire sample stage and has multiple sample clamps that are adapted to samples of different shapes. Each sample clamp is spliced ​​with the upper interface of the core function execution layer using a snap-fit ​​interface and can be freely replaced as needed.

[0007] As a further preferred embodiment of the present invention, the interface unit layer preferably also has a built-in horizontal adjustment element for quickly correcting the slight tilt angle of the instrument mounting surface and ensuring the levelness of the core function execution layer.

[0008] As a further preferred embodiment of the present invention, the interface unit layer preferably corresponds to a dedicated adapter module for X-ray diffractometers from different manufacturers, and each adapter module is marked with a brand logo.

[0009] As a further preferred embodiment of the present invention, the core function execution layer preferably includes the following multiple functional modules: an X / Y / Z axis translation component driven by a stepper motor, an θ / ω dual-axis rotation component, an angle adjustment component for grazing incidence diffraction testing, a temperature variable module, an in-situ electrochemical module, a rotational transmission module, and an automatic sample introduction module, etc.

[0010] As a further preferred embodiment of the present invention, for the core function execution layer, the multiple standardized expansion interfaces reserved on its side are preferably used to install at least one of the following auxiliary function modules: temperature-controlled sample stage, atmosphere control chamber supporting the introduction of inert gas or reactive gas, stress loading accessory, laser positioning module, sample automatic identification sensor, etc., thereby realizing the expansion and splicing in the side direction.

[0011] As a further preferred embodiment of the present invention, a height extension transition module is preferably provided between the core function execution layer and the interface unit layer. This height extension transition module is used to adjust the overall height of the sample stage as required and to ensure that the sample is always at the center of the focusing circle of the X-ray diffractometer, thereby realizing the stacking and splicing in the longitudinal direction.

[0012] As a further preferred embodiment of the present invention, all functional parameters of the core function execution layer are preferably pre-calibrated and stored, so that the functional parameters do not need to be readjusted when splicing different units.

[0013] As a further preferred embodiment of the present invention, the sample support and fixation layer preferably includes the following functional modules: a glass sample tank, a quartz plate, and a pressing device for powder samples to ensure that the sample surface is flat and coplanar with the focusing circle of the X-ray diffractometer; magnetic clamps, vacuum adsorption clamps, and universal clamps for bulk / single crystal samples to meet the fixation requirements of samples of different sizes and materials; an ultra-thin sample stage and a horizontal calibration component for thin film / coating samples to ensure that the thin film surface remains perpendicular to the incident X-rays; and an in-situ temperature control / atmosphere integrated module, etc.

[0014] As a further preferred embodiment of the present invention, the sample support and fixing layer preferably also integrates a sample anti-displacement limiting structure to prevent data distortion caused by sample slippage during the test.

[0015] As a further preferred embodiment of the present invention, the above-mentioned sample stage is compatible with Bruker D8 series, Panaca Empyrean series, Rigaku Smart Lab, Shimadzu XRD-6100 series, etc.

[0016] In summary, the technical solutions conceived by this invention have the following main technical advantages compared with the prior art: (1) This invention redesigns the overall structure and spatial arrangement of the X-ray diffractometer sample stage, fully drawing on the modular building block combination logic. With the core design concept of "standardization of core function execution layer + customization of interface unit layer + plug-in of sample carrying and fixing layer", it constructs a more flexible and reliable configuration system, and addresses the industry pain points of inconsistent mechanical interfaces, incompatible control protocols, and repeated calibration after replacement of X-ray diffractometer sample stages from different manufacturers, thereby significantly reducing the equipment adaptation cost and operational complexity for researchers. (2) The present invention further improves the modular structure design and mutual setting of some key components such as interface unit layer and core function execution layer, so that the three structural layers can be precisely positioned and interlocked, and the layers are relatively independent and coordinated, ensuring the positioning accuracy and stability after module switching; on this basis, the sample stage achieves the advantages of unified compatibility, and the modular design can freely assemble other types of functions such as temperature control, atmosphere control, rotation orientation, etc. (3) The improved core function execution layer of this invention can complete full parameter calibration before leaving the factory. When changing brands, mechanical splicing can be quickly completed by operating positioning pins and other components without recalibrating the core function parameters, effectively avoiding time loss and data error caused by repeated calibration. The improved interface unit layer can accurately match the core function execution layer and achieve rigid connection between the bottom and middle layers through structures such as conical positioning pins and annular magnetic grooves, significantly improving positioning accuracy. The improved sample bearing and fixing layer can achieve plug-and-play functionality according to actual test requirements, without replacing the core function execution layer and interface unit layer located at the bottom and middle. (4) The X-ray diffractometer sample stage according to the present invention has a multi-dimensional splicing capability of "lateral expansion + vertical stacking". It not only supports vertical layer splicing, but also has the flexible combination capability of lateral expansion and vertical stacking. The sample stage has a compact structure, is easy to operate, has high switching efficiency, and is accurate and reliable in positioning. It truly realizes the function of "sponging is compatible and no complicated settings are required", and is therefore particularly suitable for various complex test scenarios. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below. It should be understood that the specific embodiments described herein are only for explaining the present invention and are not intended to limit the present invention. Furthermore, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0018] In response to the shortcomings and improvement needs in the field analyzed in the "Background Art" section, this invention redesigns an X-ray diffractometer sample stage compatible with different manufacturers. The core design principles will be introduced below.

[0019] Principle 1: Modular decomposition and interface standardization Strictly adhering to the principle of "separation of function and interface," the sample stage is divided into a core functional unit layer and a brand-specific interface unit layer. The core functional execution layer integrates general testing functions such as translation, rotation, and tilt adjustment, and can further include in-situ testing modules such as temperature control and atmosphere control. The brand-specific interface unit layer is customized according to the mounting hole positions, positioning references, and load-bearing parameters of different manufacturers' XRD goniometers. The two are connected by a standardized precision positioning structure and locking mechanism to ensure positioning accuracy and stability after module switching.

[0020] Principle 2: Avoid frequent calibrations and ensure data consistency. The core functional execution layer undergoes high-precision calibration of all parameters before leaving the factory, including key indicators such as X / Y / Z axis translation accuracy, θ / ω axis rotation angle calibration, and verification of the coplanarity of the sample stage plane and the goniometer center. It also incorporates a built-in calibration parameter storage chip. When changing brand interface units, only mechanical alignment via quick-positioning pins is required; recalibrating the core functional parameters is unnecessary. Only a single interface positioning accuracy verification is needed before use, effectively avoiding the time loss and data errors caused by repeated calibration.

[0021] Principle 3: Prioritize ease of use and lower the operational threshold. The system features a quick-release and quick-installation positioning pin + magnetic double locking structure, allowing experimenters to disassemble and replace the interface module manually without the need for specialized tools. The entire switching process can be completed within 5 minutes. Furthermore, the core function execution layer can be equipped with a unified operation panel and software control interface, compatible with the host control systems of different XRD manufacturers, requiring no additional driver installation and truly achieving "plug and play".

[0022] Guided by the above core design principles, the X-ray diffractometer sample stage obtained by this invention will be described in detail below. From an overall structural perspective, the sample stage comprises three vertically layered and spliced ​​structural layers: an interface unit layer that is both independent and collaboratively linked, a core function execution layer, and a sample support and fixation layer. Each layer or module will be explained in detail below.

[0023] The interface unit layer is designed to be located at the bottom of the entire sample stage and includes a load-bearing base and a locking mechanism. The load-bearing base integrates snap-fit ​​interfaces, bolt fastening interfaces, and magnetic interfaces for docking with the goniometers of X-ray diffractometers from different manufacturers. In addition, each interface is equipped with a conical positioning pin and an annular magnetic groove for aligning with the lower interface of the core function execution layer during splicing and performing magnetic pre-fixation after light pressure. The locking mechanism is used to lock the interface unit layer and the core function execution layer together after installation and pre-fixation, thereby achieving a rigid connection between the two.

[0024] Serving as the connection hub between the sample stage and XRD goniometers from different manufacturers, this interface unit layer is custom-designed according to the mechanical interface parameters of the target brand's instruments, including mounting holes, positioning pins, and a load-bearing base. For different types, such as the magnetic positioning interface of the Bruker D8 series, the snap-on interface of the Panaco Empyrean series, Rigaku's Smart Lab, and the bolt-fastening interface of the Shimadzu XRD-6100, corresponding dedicated adapter modules have been developed. Each module is clearly labeled with its brand to avoid confusion. Furthermore, this layer preferably incorporates a built-in leveling knob, which can quickly correct minor tilt angles of the instrument mounting surface, ensuring the levelness of the upper modules.

[0025] More specifically, this layer, serving as the "supporting foundation" of the entire sample stage, is a customized module, individually designed according to the mechanical interface parameters (such as mounting hole positions, positioning references, and load-bearing thresholds) of different manufacturers' XRD goniometers. Each interface base is equipped with a uniform conical positioning pin and annular magnetic groove, precisely matching the bottom interface of the middle core function execution layer. During assembly, simply align the positioning pin and apply light pressure to complete the magnetic pre-fixation. Then, tighten the quick-locking knob on the edge to achieve a rigid connection between the bottom and middle layers. The preferred positioning accuracy error is set to ≤±2μm.

[0026] The core function execution layer is designed to be located in the middle of the entire sample stage, with interfaces on both its upper and lower sides. The lower interface is used to connect with the interface unit layer, and the upper interface is used to connect with the sample support and fixing layer. The core function execution layer also has an independent drive and control module built in, which is used to independently complete functions such as translation, rotation, and tilt adjustment. At the same time, multiple standardized expansion interfaces are reserved on the side.

[0027] More specifically, this core functional execution layer, as the functional core of the sample stage, can integrate a multi-dimensional motion adjustment system and expansion function interfaces. The motion adjustment system may include, for example, a high-precision stepper motor-driven X / Y / Z-axis translation component (positioning accuracy ≤ ±5μm), an θ / ω dual-axis rotation component (angular resolution ≤ 0.001°), and an tilt adjustment component (adjustment range 0°~10°) for grazing incidence diffraction testing, meeting the routine testing needs of various samples such as powders, thin films, and single crystals. Furthermore, this layer preferably reserves standardized expansion interfaces, allowing for the addition of in-situ testing modules such as a temperature-controlled sample stage (temperature range -196℃~1500℃), an atmosphere control chamber (supporting the introduction of inert and reactive gases), and a stress loading device, enabling flexible functional expansion.

[0028] Based on this, the core function execution layer has standardized splicing interfaces on both its upper and lower sides: the lower interface is used to connect to the base of the bottom layer, while the upper interface is used to mount the sample support and fixation layer of the upper layer. In addition, this layer preferably also has an independent drive and control module built in, which can independently complete basic operations such as translation, rotation, and tilt adjustment, and all functional parameters are pre-calibrated and stored, so there is no need to readjust the core parameters when splicing different modules.

[0029] The sample support and fixing layer is designed to be located at the top of the entire sample stage and has multiple sample clamps that are adapted to samples of different shapes. Each sample clamp is spliced ​​with the upper interface of the core function execution layer using a snap-fit ​​interface and can be freely replaced as needed.

[0030] More specifically, the sample support and fixation layer employs a replaceable sample clamp design to accommodate samples of different shapes. For example, for powder samples, it is equipped with a standard-sized glass sample holder, quartz plate, and pressing device to ensure that the sample surface is flat and coplanar with the focusing circle of the goniometer; for bulk / single-crystal samples, it provides magnetic clamps, vacuum adsorption clamps, and universal clamps to meet the fixation requirements of samples of different sizes and materials; for thin film / coating samples, it is equipped with a dedicated ultra-thin sample stage and a horizontal calibration component to ensure that the thin film surface is perpendicular to the incident X-ray. Preferably, this layer also integrates a sample anti-displacement limiting structure to prevent data distortion caused by sample slippage during testing.

[0031] Accordingly, this sample support and fixing layer serves as a replaceable functional plug-in, and can be designed in various specifications according to different sample types and testing requirements, such as powder sample holder modules, block sample clamp modules, ultra-thin support modules for thin film samples, and in-situ temperature control / atmosphere integrated modules. For example, each plug-in can be connected to the middle core unit using a unified snap-fit ​​interface, allowing researchers to "plug and play" according to their testing needs: for example, when testing powder samples, the powder sample holder module can be directly connected; when testing high-temperature in-situ phase transitions, it can be replaced with a support module with integrated temperature control function, without needing to replace the core unit and the bottom interface.

[0032] This invention, through the above design, fully draws on the modular building block assembly logic, using "standardization of the core function execution layer + customization of the interface unit layer + plug-inization of the sample carrying and fixing layer" as its core design concept. It constructs a flexible configuration system of "basic platform + on-demand assembly," achieving the design goal of "one core, multi-scenario adaptation, and cross-brand universality." Based on this, the resulting sample stage is compatible with various sample sizes and specifications. By changing different sample clamps or bases, it meets the testing needs of various samples such as powders, blocks, films, fibers, and nanoparticles, demonstrating its core advantage of "multi-functionality."

[0033] Furthermore, the sample stage designed in this invention not only supports vertical layering and splicing, but also has the flexible combination capability of horizontal expansion and vertical stacking, meeting the needs of complex testing scenarios: Lateral expansion and splicing: Standardized expansion interfaces are reserved on the side of the core functional execution unit, allowing multiple auxiliary functional modules to be spliced ​​in parallel, such as stress loading accessories, laser positioning modules, and automatic sample identification sensors. For example, when studying the stress-structure evolution of materials, stress loading modules and in-situ temperature measurement modules can be spliced ​​simultaneously to achieve synchronous testing of "stress application + temperature monitoring + XRD diffraction".

[0034] Vertical stacking: For ultra-thick samples or special in-situ testing needs, a height extension adapter module can be stacked between the bottom interface and the middle core execution unit to flexibly adjust the overall height of the sample stage, ensuring that the sample is always at the center of the XRD goniometer's focusing circle without any modification to the instrument host.

[0035] Furthermore, according to another preferred embodiment of the present invention, the sample stage can also support automatic switching of multiple well positions, and multiple samples can be pre-placed. The samples to be tested can be automatically changed through program control, eliminating the need for frequent manual operation and greatly improving the testing efficiency of batch samples.

[0036] In summary, the X-ray diffractometer sample stage of the present invention improves its overall structure and spatial arrangement, especially the modular structure design and mutual arrangement of some key components such as the interface unit layer and the core function execution layer. This enables an overall design mechanism of "building block splicing and interface modularization," effectively solving the technical pain points of inconsistent mechanical interfaces, incompatible control protocols, and the need for recalibration after replacement of sample stages from different manufacturers. It also has the advantages of compact structure, easy operation, high switching efficiency, accurate and reliable positioning, and plug-and-play capability, thus possessing good practical value and application prospects.

[0037] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A sample stage for X-ray diffractometers compatible with different manufacturers, characterized in that, The sample stage comprises a three-layered, vertically layered and spliced ​​structural design: an interface unit layer that is both independent and collaborative, a core function execution layer, and a sample support and fixation layer. The interface unit layer is located at the bottom of the entire sample stage and includes a load-bearing base and a locking mechanism. The load-bearing base integrates snap-on interfaces, bolt fastening interfaces, and magnetic interfaces for docking with the goniometers of X-ray diffractometers from different manufacturers. In addition, each interface is equipped with a conical positioning pin and an annular magnetic groove for aligning with the lower interface of the core function execution layer during splicing and performing magnetic pre-fixation after light pressure. The locking mechanism is used to lock the interface unit layer and the core function execution layer together after installation and pre-fixation, thereby achieving a rigid connection between the two. The core function execution layer is located in the middle of the entire sample stage. It has interfaces on both the upper and lower sides. The lower interface is used to connect with the interface unit layer, and the upper interface is used to connect with the sample support and fixing layer. The core function execution layer also has an independent drive and control module built in, which is used to independently complete functions such as translation, rotation, and tilt adjustment. At the same time, multiple standardized expansion interfaces are reserved on the side. The sample support and fixing layer is located at the top of the entire sample stage and has multiple sample clamps that are adapted to samples of different shapes. Each sample clamp is spliced ​​with the upper interface of the core function execution layer using a snap-fit ​​interface and can be freely replaced as needed.

2. The X-ray diffractometer sample stage as described in claim 1, characterized in that, The interface unit layer preferably also has a built-in horizontal adjustment element for quickly correcting minor tilt angles of the instrument mounting surface, ensuring the levelness of the core function execution layer.

3. The X-ray diffractometer sample stage as described in claim 1 or 2, characterized in that, The interface unit layer preferably corresponds to a dedicated adapter module for X-ray diffractometers from different manufacturers, and each adapter module is marked with a brand logo.

4. The X-ray diffractometer sample stage as described in any one of claims 1-3, characterized in that, For the core function execution layer, its drive and control module preferably includes the following multiple functional modules: an X / Y / Z axis translation component driven by a stepper motor, an θ / ω dual-axis rotation component, an angle adjustment component for grazing incidence diffraction testing, a temperature change module, an in-situ electrochemical module, a rotational transmission module, and an automatic sample introduction module, etc.

5. The X-ray diffractometer sample stage as described in claim 4, characterized in that, For the core function execution layer, the multiple standardized expansion interfaces reserved on its side are preferably used to install at least one of the following auxiliary function modules: temperature-controlled sample stage, atmosphere control chamber supporting the introduction of inert gas or reactive gas, stress loading accessory, laser positioning module, sample automatic identification sensor, etc., thereby realizing the expansion and splicing in the side direction.

6. The X-ray diffractometer sample stage as described in claim 5, characterized in that, For the core function execution layer, a height extension transition module is preferably provided between it and the interface unit layer. This height extension transition module is used to adjust the overall height of the sample stage as required and ensure that the sample is always at the center of the focusing circle of the X-ray diffractometer, thereby realizing the stacking and splicing in the longitudinal direction.

7. The X-ray diffractometer sample stage as described in any one of claims 1-6, characterized in that, All functional parameters of the core function execution layer are preferably pre-calibrated and stored, so that there is no need to readjust the functional parameters when splicing different units.

8. The X-ray diffractometer sample stage as described in any one of claims 1-7, characterized in that, For the sample support and fixation layer, it preferably includes the following functional modules: a glass sample tank, quartz plate, and pressing device for powder samples to ensure that the sample surface is flat and coplanar with the focusing circle of the X-ray diffractometer; magnetic clamps, vacuum adsorption clamps, and universal clamps for bulk / single crystal samples to meet the fixation requirements of samples of different sizes and materials; an ultra-thin sample stage and horizontal calibration components for thin film / coating samples to ensure that the thin film surface is perpendicular to the incident X-rays; and an in-situ temperature control / atmosphere integrated module, etc.

9. The X-ray diffractometer sample stage as described in any one of claims 1-8, characterized in that, The sample support and fixing layer preferably also integrates a sample anti-displacement limiting structure to prevent data distortion caused by sample slippage during testing.