Touch controller and method for touch controller

Abstract

A touch controller is disclosed for controlling a touch panel. The touch panel includes an array of a plurality of sensing units, the plurality of sensing units are divided into N columns, each column includes M ranges, and the M ranges in each column are grouped into P regions. The touch controller includes a switching circuit and a sensing circuit. During a coarse scan, the switching circuit couples the plurality of sensing units in each region of each column to each other, and the sensing circuit scans the P x N regions of the N columns to generate P x N region signals. During M fine scans, the switching circuit uncouples the plurality of sensing units in a triggered region of the P x N regions from each other, and the sensing circuit scans the ranges in the triggered region without scanning the plurality of untriggered regions of the P x N regions to generate a plurality of cell signals of the plurality of sensing units in the triggered region.

Description

Technical Field

[0001] This invention relates to touch sensing technology, and more particularly to a touch controller and a method for controlling a touch panel using the touch controller. Background Technology

[0002] With technological advancements, touch panels have been integrated into various electronic devices to enhance the user's interactive experience. However, as the size of touch panels increases, the workload of the electronic components controlling these panels also increases, leading to increased power consumption.

[0003] For example, touch panels typically consist of an array of sensing units used to detect user touches. The touch panel scans all sensing units to determine which unit detected the touch event. Therefore, even if the touch event only affects a small subset of sensing units, the touch panel needs to scan all units before completing the detection, resulting in unnecessary power consumption.

[0004] Therefore, there is a need for a touch controller and a method for using the touch controller to reduce power waste of the touch panel during touch event sensing. Summary of the Invention

[0005] This invention provides a touch controller for controlling a touch panel. The touch panel includes an array of multiple sensing units arranged in N columns, each column comprising M ranges, and the M ranges in each column forming P regions, where N and M are integers greater than 1, and P is a positive integer less than M+1. The touch controller includes a switching circuit coupled to the touch panel and a sensing circuit coupled to the switching circuit. During a coarse scan, the switching circuit couples the multiple sensing units in each region of each column to each other, and the sensing circuit scans the PxN regions of the N columns to generate PxN region signals. During M fine scans, the switching circuit disconnects the multiple sensing units in the trigger regions of the PxN regions from each other, and the sensing circuit scans the ranges in the trigger regions without scanning the multiple untriggered regions of the PxN regions to generate multiple unit signals for the multiple sensing units in the trigger regions.

[0006] The present invention also provides a method for controlling a touch panel in a touch controller. The touch panel includes an array of multiple sensing units arranged in N columns, each column including M ranges, and the M ranges in each column forming P regions, where N and M are integers greater than 1, and P is a positive integer less than M+1. The touch controller includes a switching circuit and a sensing circuit. Attached Figure Description

[0007] Figure 1 This is a block diagram of an electronic device according to an embodiment of the present invention.

[0008] Figure 2Aand Figure 2B This is a schematic diagram of the touch panel structure.

[0009] Figure 3 This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0010] Figure 4 This is a schematic diagram of the touch panel structure.

[0011] Figure 5 This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0012] Figure 6 This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0013] Figure 7A and Figure 7B This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0014] Figure 8A , Figure 8B and Figure 8C This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0015] Figure 9A and Figure 9B This is a schematic diagram of a control method used for touch panels to respond to touch events.

[0016] Figure 10 This is a flowchart of a method for a touch controller according to an embodiment of the present invention.

[0017] The reference numerals in the attached figures are explained as follows:

[0018] 1: Electronic devices

[0019] 300: Touch panel

[0020] 100: Touch controller

[0021] 110: Switching circuit

[0022] 120: Sensing Circuit

[0023] 200: Processor

[0024] 400: Touch event

[0025] 320: Range

[0026] 322, L, R: Columns

[0027] 324: Sensing Unit

[0028] 122: Touchscreen integrated circuit

[0029] A1, A2: Direction

[0030] 402, T1-T6, TM, TM+1: Period

[0031] 404: Triggering Region

[0032] S1-S4: Steps Detailed Implementation

[0033] The embodiments will be described in detail below with reference to the accompanying drawings to enable those skilled in the art to implement them. The inventive concept can be embodied in various forms, and is not limited to the embodiments set forth herein. For clarity, descriptions of well-known components are omitted, and the same reference numerals refer to the same elements throughout the text.

[0034] Figure 1 The display shows an electronic device having a touch controller 100, a touch panel 300, and a processor 200. The electronic device 1 may be, but is not limited to, a display device. The touch panel 300 may be an embedded touch panel and may include an array of sensing units for detecting touch events 400. Touch events 400 may correspond to a finger touching the touch panel 300 or a stylus sliding across the touch panel 300. The touch controller 100 may include a switching circuit 110 and a sensing circuit 120 coupled to the switching circuit 110. The switching circuit 110 may be coupled to the touch panel 300. The switching circuit 110 may include switches, logic gates, and / or multiplexers to manage the connection of the sensing units in the touch panel 300. During touch detection, the switching circuit 110 may sequentially select groups of sensing units in the touch panel 300 and couple the selected groups of sensing units to the sensing circuit 120. The sensing circuit 120 may include an analog front end (AFE) that scans a selected group of sensing units on the touch panel 300 to detect touch event 400. The processor 200 may be coupled to the touch controller 100 to process the signal detected by the sensing circuit 120 in response to touch event 400. In some embodiments, the processor 200 may be located within the touch controller 100.

[0035] Figure 2A and Figure 2B The structure of the touch panel 300 is shown. The array of sensing units 324 on the touch panel 300 can be divided into N columns 322, and the sensing circuit 120 can include N integrated circuits (ICs) 122, where N is an integer greater than 1. Each column 322 can be controlled by a corresponding touch IC 122. Each column 322 can include M regions 320 of sensing units 324, where M is an integer greater than 1. Each region 320 can be formed by ixj sensing units 324, where i and j are integers greater than 1.

[0036] Each touch IC 122 may include multiple analog front - ends. In some embodiments, if ixj sensing units 324 are coupled (merged) together, one of the multiple analog front - ends can simultaneously scan the ixj sensing units 324 to identify a touch event 400 associated with the range 320. In other words, the sensing circuit 120 can detect a touch event 400 on the touch panel 300 based on the range 320. In other embodiments, if the ixj sensing units 324 are disconnected from each other, each analog front - end can scan an individual sensing unit 324 to identify a touch event 400 associated with each sensing unit 324. For example, if i = 16, j = 16, and the number of analog front - ends in the touch IC 122 is 64, the 64 analog front - ends can scan the 16x16 sensing units 324 in 4 times, with each scan generating 64 results, thus generating 256 results. These 256 results are used to identify one or more touch events 400 associated with one or more sensing units 324.

[0037] The sensing circuit 120 can perform two different scanning operations: coarse scanning and fine scanning. M ranges 320 in each column can be grouped into P zones, where P is a positive integer less than M + 1. In some embodiments, P = 1, and the M ranges 320 in each column are grouped into 1 zone, thereby enabling rapid detection of the touch event 400. In other embodiments, P = M, and each range 320 in each column forms a separate zone, enabling more precise detection of the touch event 400. In other embodiments, 1 < P < M, and the M ranges 320 in each column are divided into multiple zones, achieving a balance between the speed and accuracy of touch detection. During coarse scanning, the processor 200 can determine whether a touch event 400 occurs in a specific zone. If a touch event 400 is detected, the analog front - end can perform a fine scan accordingly. During fine scanning, the analog front - end can scan each sensing unit 324 in the specific zone to determine the exact location of the touch event 400.

[0038] To determine the exact location of the touch event 400 on the touch panel 300, the analog front - end can scan the sensing units 324 in the range 320 column - by - column (such as in direction A1) or row - by - row (such as in direction A2). However, the analog front - end can also scan the sensing units 324 in the range 320 in other desired orders to achieve optimal efficiency.

[0039] The process of detecting touch event 400 can be described as follows. During the coarse scan, the switching circuit 110 can couple the sensing units 324 in each region of each column 322 to each other, and the sensing circuit 120 can scan PxN regions of N columns to generate PxN region signals. During the M fine scan periods following the coarse scan, the switching circuit 110 can disconnect the sensing units 324 in the trigger regions of the PxN regions from each other, and the sensing circuit 120 can scan the range 320 in the trigger regions without scanning the untriggered regions of the PxN regions to generate unit signals in the trigger regions.

[0040] Figure 3 The touch panel 300 is divided into 4 columns 322 (i.e., N=4), and each column 322 contains M ranges 320 forming a region (i.e., P=1). In this case, a touch frame period 402 may include M fine scan periods and one coarse scan period. The M fine scan periods can be defined by the M ranges 320 (i.e., T1 to TM) on the column 322, such that the m-th range 320 on the column 322 can be fine-scanned in the corresponding m-th period. The coarse scan period can be arranged in the last period (TM+1) of the touch frame period 402. Blocks labeled with "column-range" numbers are displayed below the corresponding period in the touch frame period 402 to indicate the m-th range 320 in the n-th column 322 scanned in the m-th period. m is an integer between 1 and M, and n is an integer between 1 and N. The range "ALL" indicates all ranges in the n-th column.

[0041] During a coarse scan during the first touch frame 402 (e.g., TM+1 of touch frame 1), a coarse scan is performed on all ranges 320 of the four columns 322 to detect touch event 400. Switching circuitry 110 can couple sensing units 324 in each column 322 to each other, and sensing circuitry 120 can scan the four columns 322 to generate four region signals. In the coarse scan, each touch IC 122 may have one analog front end scanning column 322, thus a total of four analog front ends are possible, each scanning one of the four columns 322. Each analog front end can generate a region signal indicating whether the corresponding column 322 has been touched. Based on the region signals, processor 200 can identify the trigger region 404 associated with touch event 400. In this embodiment, touch event 400 occurs in ranges 1-ALL, and trigger region 404 is identified as column 1 of the touch panel 300. Processor 200 can also identify one or more untriggered regions based on the four region signals. In this embodiment, the processor can accordingly determine that the range 2-ALL to 4-ALL is an untriggered area.

[0042] During the M fine scan periods of the second touch frame period 402 (e.g., T1 to TM of touch frame 2), the trigger area 1 is finely scanned, scanning a range in each period to determine the precise location of the touch event 400 on the touch panel 300. The switching circuit 110 can disconnect the sensing units 324 in the trigger area 404 from each other, and the sensing circuit 120 can scan the corresponding ranges 1-1 to 1-M of the trigger area 404 respectively during periods T1 to TM to generate unit signals for the sensing units 324 in each range 320 of column 1. In the m-th period of the M fine scan periods, the sensing circuit 120 can scan the range 1-m of the trigger area 404 to generate unit signals for the sensing units 324 in the range 1-m of the trigger area 404, where m is an integer between 1 and M. During the fine scan, each touch IC 122 can use 64 analog front ends to scan a range in column 322. For example, if m = 1, then during the first period of M fine scans, the 64 analog front-ends in the first touch IC 122 can scan the 256 sensing units 324 in the range 1-1 of the trigger area 404 four times to generate 256 unit signals for the 256 sensing units 324 in the range 1-1 of the trigger area 404. Each unit signal indicates whether the corresponding sensing unit 324 has been touched. Based on the unit signals, the processor 200 can then identify the exact location on the touch panel 300 touched by the touch event 400. During the M fine scans, the untriggered areas on the touch panel 300 can be the second to fourth columns, and the sensing circuit 120 will not scan the untriggered areas, thereby saving power.

[0043] In other embodiments, the coarse scan period may also be arranged within the first period of the touch frame period 402, so that the coarse scan period and the M fine scan periods are located in the same touch frame period 402. The order of the coarse scan period and the M fine scan periods in the embodiments of the present invention is not intended to limit the present invention.

[0044] In some embodiments, a touch IC 122 of the sensing circuit 120 can manage a range 320 of more than one column 322. Figure 4 This shows an example of each touch IC 122 managing two columns 322 in M ​​ranges 320. Figure 5 show Figure 3 An alternative example is provided, in which the touch panel 300 is divided into 8 columns, each column 322 of the range 320 is composed of a region (i.e., P=1), and each touch IC 122 is responsible for a left column (L) and a right column (R).

[0045] exist Figure 5Each touch IC 122 may have two analog front ends that scan the left column (L) and right column (R) in a coarse scan, resulting in a total of eight analog front ends, each scanning one of the eight columns 322. For example, the eight analog front ends in the sensing circuit 120 may scan the eight columns 322 (including four left columns and four right columns) respectively, each generating a region signal to indicate whether the corresponding column 322 has been touched. Similarly, when the region signal from the coarse scan period of the first touch frame period 402 (e.g., TM+1 of touch frame 1) has determined that the touch event 400 is associated only with the left column of column 1, the trigger region 404 will be set to the range 1-L-1 to the range 1-LM of column 1, and the non-triggered region will be set to the right column of column 1 and all ranges 320 of the left and right columns of columns 2 to 4. In other words, during the M fine scan periods of the second touch frame (e.g., touch frame 2), only the trigger area 404 will be scanned, and the untriggered area will not be scanned to save power. During the fine scan, each touch IC 122 may have 32 analog front-ends scanning a range in the left column (L) and 32 analog front-ends scanning a range in the right column (R). For example, the 32 analog front-ends in the first touch IC 122 may scan each range 320 of the left column (L) four times during each of the M fine scan periods to generate 256 unit signals, each unit signal indicating whether the corresponding sensing unit 324 has been touched. Similarly, the 32 analog front-ends in the first touch IC 122 may scan each range 320 of the right column (R) four times during each of the M fine scan periods to generate 256 unit signals, each unit signal indicating whether the corresponding sensing unit 324 has been touched. Based on the obtained Mx256 unit signals, the processor 200 can then identify the exact location on the touch panel 300 where the touch event 400 was touched.

[0046] In some embodiments, touch event 400 may occur on more than one column 322 on touch panel 300. Figure 6 This displays the situation when each column 322 of range 320 is grouped into a region (i.e., P=1), and columns 1 through 4 are all associated with touch event 400. Figure 3 Alternative examples.

[0047] exist Figure 6For example, the four analog front ends in the sensing circuit 120 can scan the four columns 322 respectively, with each analog front end generating a region signal to indicate whether the corresponding column 322 has been touched. Similarly, the processor 200 can identify the region signal from the coarse scan period (e.g., TM+1 of touch frame 1) of the first touch frame period 402 and determine that columns 1 to 4 should all be set as trigger regions 404. Therefore, during the M fine scan periods (e.g., T1 to TM of touch frame 2) of the second touch frame period 402, the sensing circuit 120 will scan columns 1 to 4 simultaneously. In the m-th period of the M fine scan periods, the sensing circuit 120 can scan the range 1-m of the trigger region 404 to generate unit signals of the sensing units 324 in the range 1-m of the trigger region 404, where m is an integer between 1 and M. For example, if m = 1, then in the first period of the M fine scan periods, the 64 analog front ends of each touch IC 122 in the sensing circuit 120 can scan each of the 256 sensing units 324 in each range 320 four times in each of the M fine scan periods to generate 256 unit signals, each unit signal indicating whether the corresponding sensing unit 324 has been touched. Based on the resulting 4xMx256 unit signals, the processor 200 can then identify the exact location on the touch panel 300 touched by the touch event 400. Similarly, if the touch panel 300 includes other columns 322 that are determined to be non-trigger areas in addition to columns 1 to 4, then the non-trigger areas will not be scanned during the M fine scan periods to save power.

[0048] Figure 7AThe display touch panel 300 is divided into 4 columns (i.e., N=4), each range 320 in each column 322 is grouped into an area (i.e., P=M), and each column 322 has 5 ranges 320 (i.e., M=5). During a coarse scan, the switching circuit 110 can couple the sensing units 324 in each range 320 of each column 322 to each other, and the sensing circuit 120 can scan MxN ranges 320 of N columns to generate MxN area signals. During M fine scans, the switching circuit 110 can disconnect the sensing units 324 in the trigger areas of the MxN ranges 320 from each other, without scanning the non-trigger areas of the MxN ranges 320 to generate unit signals for the sensing units in the trigger areas. In some embodiments, during a coarse scan, the MxN analog front ends of the sensing circuit 120 can simultaneously scan MxN ranges 320 of N columns to generate MxN area signals. For example, if N=4 and M=5, during the coarse scan period, the switching circuit 110 can couple the sensing units 324 in each range 320 of each column 322 to each other, and the 20 (=5x4) analog front ends of the sensing circuit 120 can scan the 20 ranges 320 of N columns to generate 20 region signals. During the 5 fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in the triggered regions of the 20 ranges 320 from each other, without scanning the 20 ranges 320 in the untriggered regions, to generate unit signals of the sensing units in the triggered regions.

[0049] Figure 7B Describe how based on Figure 7A The configuration is used to perform scanning during touch frame period 402. In this example, touch frame period 402 may include five fine scan periods and one coarse scan period, and touch event 400 indicates that a finger touches the second range of the second column (hereinafter, range 2-2). The five fine scan periods can be defined by five ranges 320 on column 322 (i.e., T1 to T5). The coarse scan period can be set in the last period of touch frame period 402 (i.e., T6).

[0050] During the coarse scan period of the first touch frame 402 (e.g., T6 of touch frame 1), a coarse scan is performed on all ranges 320 of the four columns 322 to detect touch event 400. For example, the switching circuit 110 can couple the sensing units 324 in each range 320 to each other, and the four analog front ends in the sensing circuit 120 can scan 5x4 = 20 ranges 320 of the four columns 322 respectively to generate 20 area signals. Based on the 20 area signals, the processor 200 can identify range 2-2 as the trigger area 404 associated with touch event 400. The processor 200 can also identify one or more non-trigger areas based on the four area signals. In this embodiment, the processor can determine ranges 1-1 to 1-5, 2-1, 2-3 to 2-5, 3-1 to 3-5, and 4-1 to 4-5 as non-trigger areas.

[0051] The trigger region 404 can be located in the m-th range of the n-th column in N columns, where n is an integer between 1 and N, and m is an integer between 1 and M. Subsequently, in the m-th period of M fine scan periods, the sensing circuit 120 can scan the range nm of the trigger region 404 to generate a unit signal of the sensing unit 324 in the range nm of the trigger region 404. In the five fine scan periods of the second touch frame period 402 (e.g., T1 to T5 of touch frame 2), the trigger region 2-2 is finely scanned in the corresponding period T2 to determine the accurate position of the touch event 400 in the range 2-2. For example, if n=2 and m=2, then in the second period T2 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in the trigger area 404 from each other. The 64 analog front ends in the sensing circuit 120 can scan the 256 sensing units 324 in the trigger area 202 four times to generate 256 unit signals for the 256 sensing units 324 in range 2-2. Each unit signal indicates whether a sensing unit 324 has been touched, and the processor 200 can identify the trigger unit corresponding to the touched sensing unit 324 based on the unit signals. During the five fine scan periods, the untriggered area on the touch panel 300 can refer to all ranges 320 except for range 2-2, and the sensing circuit 120 will not scan the untriggered area to save power.

[0052] Figure 8A The display touch event 400 involves another example of a finger moving across ranges 2-2, 2-3, 3-2, and 3-3 on the touch panel 300. Figure 8B and Figure 8C For based on Figure 8A The circuit configuration is shown in the schematic diagram of the touch panel 300 in touch frames 1 to 3. Following the time sequence shown from B to B', Figure 8C Touch frame 3 continues in Figure 8B After touch frame 2 in the middle.

[0053] When a finger moves on or touches one or more areas on the touch panel 300, the processor 200 can identify one or more trigger areas 404 from 20 areas 320 on the touch panel 300 during a coarse scan. During the coarse scan period of the first touch frame 402 (e.g., T6 of touch frame 1), the processor 200 can acquire 20 area signals from the 20 areas 320 to identify areas 2-2, 2-3, 3-2, and 3-3 as trigger areas 404 and areas 1-1 to 1-5, 2-1, 2-4 to 2-5, 3-1, 3-4 to 3-5, and 4-1 to 4-5 as non-trigger areas.

[0054] If multiple trigger regions 404 are identified from 20 ranges 320, then during the fine scan following the coarse scan, the switching circuit 110 can disconnect the sensing units 324 in the multiple trigger regions 404 from each other, and the sensing circuit 120 can scan the multiple trigger regions 404 to generate unit signals for the sensing units 324 in the multiple trigger regions 404. During the five fine scan periods of the second touch frame period 402 (e.g., T1 to T5 of touch frame 2), fine scans are performed on trigger regions 2-2 and ranges 3-2 in the corresponding period T2, and on trigger regions 2-3 and ranges 3-3 in the corresponding period T3. Therefore, the accurate movement path of the touch event 400 detected during the first touch frame period 402 and the second touch frame period 402 on the trigger regions 404 can be determined. The sensing circuit 120 does not scan untriggered areas to save power.

[0055] In some embodiments, multiple trigger regions 404 may be located in different ranges 320 of a single column 322. That is, the first trigger region 404 and the second trigger region 404 may be the m1-th range 320 and the m2-th range 320 of a column 322 in N columns 322, respectively, where m1 and m2 are distinct integers between 1 and M. During the m1-th fine scan period of M fine scan periods, the switching circuit 110 disconnects the sensing units 324 in the m1-th range 320 of a column 322 in N columns 322 from each other. The sensing circuit 120 scans the m1-th range 320 of a column 322 in N columns 322 without scanning the untriggered areas of M x N ranges 320, in order to generate unit signals for the sensing units 324 in the m1-th range 320 of a column 322 in N columns 322. During the m2th fine scan period of M fine scan periods, the switching circuit 110 disconnects the sensing units 324 in the m2th range 320 of one column 322 out of N columns 322 from each other. The sensing circuit 120 scans the m2th range 320 of one column 322 out of N columns 322, without scanning the untriggered areas of the M x N ranges 320, to generate unit signals for the sensing units 324 in the m2th range 320 of one column 322 out of N columns 322. Please refer to... Figure 8B If N=4, M=5, m1=2, m2=3, then the first trigger region 404 and the second trigger region 404 can be ranges 2-2 and 2-3 of the second column 322 in the four columns 322, respectively. During the fine scan period T2 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in range 2-2 of the second row in the four columns 322 from each other, and the sensing circuit 120 can scan range 2-2 without scanning the untriggered areas to generate unit signals for the sensing units 324 in range 2-2. During the fine scan period T3 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in range 2-3 of the second column in the four columns 322 from each other, and the sensing circuit 120 can scan range 2-3 without scanning the untriggered areas to generate unit signals for the sensing units 324 in range 2-3.

[0056] In some embodiments, the multiple trigger regions 404 may be located in different ranges 320 of different columns 322. That is, the first trigger region 404 is the m1st range 320 of the n1st column in N columns 322, the second trigger region 404 is the m2nd range 320 of the n2nd column in N columns 322, m1 and m2 are different integers between 1 and M, and n1 and n2 are different integers between 1 and N. During the m1st fine scan period of M fine scan periods, the switching circuit 110 disconnects the sensing units 324 in the m1st range 320 of the n1st column in N columns 322 from each other, and the sensing circuit 120 scans the m1st range 320 of the n1st column in N columns 322 without scanning the untriggered areas of M x N ranges 320, so as to generate the unit signal of the sensing unit 324 in the m1st range 320 of the n1st column in N columns 322. During the m2th fine scan period of the M fine scan periods, the switching circuit 110 disconnects the sensing units 324 in the m2th range 320 of the n2th column of the N columns 322 from each other, and the sensing circuit 120 scans the m2th range 320 of the n2th column of the N columns 322, without scanning the untriggered areas of the M x N ranges 320, to generate unit signals for the sensing units 324 in the m2th range 320 of the n2th column of the N columns 322. Please refer to... Figure 8B If N=4, M=5, n1=2, n2=3, m1=2, m2=3, then the first trigger region 404 can be the range 2-2 of the second column 322 out of the four columns 322, and the second trigger region 404 can be the range 3-3 of the third column 322 out of the four columns 322. During the fine scan period T2 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in the range 2-2 of the second column out of the four columns 322 from each other, while the sensing circuit 120 can scan the range 2-2 of the second column out of the four columns 322 without scanning the untriggered region, so as to generate the unit signal of the sensing unit 324 in the range 2-2 of the second column out of the four columns 322. During fine scan period T3 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in the range 3-3 of the third column of the four columns 322 from each other, while the sensing circuit 120 can scan the range 3-3 of the third row of the four columns 322 without scanning the untriggered area, so as to generate the unit signal of the sensing unit 324 in the range 3-3 of the third column of the four columns 322.

[0057] In some embodiments, multiple trigger regions 404 may be located in corresponding ranges 320 of different columns 322. That is, the first trigger region 404 is the m1-th range 320 of the n1-th column in N columns 322, and the second trigger region 404 is the m1-th range 320 of the n2-th column in N columns 322, where m1 is a different integer between 1 and M, and n1 and n2 are distinct integers between 1 and N. During the m1-th fine scan period of M fine scan periods, the switching circuit 110 disconnects the sensing units 324 in the m1-th range 320 of the n1-th column of N columns 322 from each other, and the sensing circuit 120 scans the m1-th range 320 of the n1-th column of N columns 322 and the m1-th range of the n2-th column of N columns 322, without scanning the untriggered areas of M x N ranges 320, to generate unit signals for the sensing units 324 in the m1-th range 320 of the n1-th column of N columns 322 and the m1-th range 320 of the n2-th column of N columns 322. Please refer to Figure 8B If N=4, M=5, n1=2, n2=3, m1=2, then the first trigger region 404 can be the range 2-2 of the second column 322 out of the four columns 322, and the second trigger region 404 can be the range 3-2 of the third column 322 out of the four columns 322. During the fine scan period T2 of the five fine scan periods, the switching circuit 110 can disconnect the sensing units 324 in range 2-2 and range 3-2 from each other, while the sensing circuit 120 can scan range 2-2 and range 3-2 without scanning the untriggered region, so as to generate unit signals of the sensing units 324 in range 2-2 and range 3-2.

[0058] During the coarse scan period of the second touch frame 402 (e.g., T6 of touch frame 2), the processor 200 can also acquire signals from 20 ranges 320 for an additional 20 regions and detect touch events 400 including finger movements ending in range 3-3. Therefore, the processor 200 can identify range 3-3 as a further triggering region 404.

[0059] During the five fine scan periods of the third touch frame 402 (e.g., T1 to T5 of touch frame 3), a fine scan is performed on the triggered range 3-3 during the corresponding period T3. Therefore, the exact position where the finger movement on range 3-3 ends can be determined. Similarly, in touch frame 3, another untriggered area on the touch panel 300 can point to all ranges 320 except for range 3-3, and the sensing circuit 120 will not scan the untriggered area to save power.

[0060] Figure 9AThis shows another example of a touch event 400 involving two fingers pressing simultaneously on the touch panel 300. One finger presses on area 2-2, and the other finger presses on areas 1-3 and 1-4. Figure 9B Describe how based on Figure 9A The configuration is used to perform the scan during touch frame 402.

[0061] exist Figure 9B ,and Figure 7B Similarly, when the 20 region signals from the coarse scan period of the first touch frame period 402 (e.g., T6 of touch frame 1) determine that the touch event 400 is associated with ranges 1-3 and 1-4 in the first column and range 2-2 in the second column, the trigger region 404 will be set to ranges 1-3, 1-4, and 2-2. Therefore, the five fine scan periods of the second touch frame period 402 (e.g., T1 to T5 of touch frame 2) will scan ranges 2-2, 1-3, and 1-4 respectively in the corresponding periods T2, T3, and T4 to generate unit signals for the trigger region 404. Furthermore, the untriggered regions during the five fine scan periods will be set to all ranges 320 in the touch panel 300 except for ranges 2-2, 1-3, and 1-4, and the untriggered regions will not be scanned to save power.

[0062] Figure 10 This is a flowchart of a method by which a touch controller 100 controls a touch panel 300. The method includes steps S1 to S4. Any reasonable changes or adjustments to the steps are within the scope of this disclosure. Steps S1 to S4 are as follows:

[0063] S1: During the coarse scan, the switching circuit couples the sensing units in each region of each column to each other, and the sensing circuit scans PxN regions of N columns to generate PxN region signals.

[0064] S2: During the coarse scan, the processor identifies the trigger region based on PxN region signals;

[0065] S3: During M fine scan periods, the switching circuit disconnects the sensing units in the trigger regions of the PxN regions from each other, and the sensing circuit scans the range of the trigger regions without scanning the untriggered regions of the PxN regions to generate unit signals for the sensing units in the PxN regions; and

[0066] S4: During the M fine scans, the processor identifies the location of the touch event based on the unit signal.

[0067] The touch controller and the method for using the touch controller employ a coarse scan period to identify trigger areas on the touch panel, while a fine scan period is used to finely scan the sensing units of the trigger areas to identify the precise location of touch events on the touch panel, without scanning sensing units of untriggered areas on the touch panel. Therefore, the power consumed by the electronic device with the touch panel is only spent on the sensing units associated with touch events, thereby improving the power efficiency of controlling the touch panel.

[0068] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A touch controller for controlling a touch panel, the touch panel comprising an array of multiple sensing units, the multiple sensing units being divided into N columns, each column comprising M regions, the M regions in each column being grouped into P zones, N and M being integers greater than 1, and P being a positive integer less than M+1, characterized in that, The touch controller includes: A switching circuit is coupled to the touch panel; and A sensing circuit is coupled to the switching circuit; Its features are: During a coarse scan, the switching circuit couples the plurality of sensing units in each region of each column to each other, and the sensing circuit scans PxN regions of the N columns to generate PxN region signals; and During M fine scans, the switching circuit disconnects the plurality of sensing units in a trigger region of the PxN regions from each other, and the sensing circuit scans a range in the trigger region without scanning the plurality of untriggered regions in the PxN regions to generate a plurality of unit signals of the plurality of sensing units in the trigger region.

2. The touch controller according to claim 1, characterized in that, The coarse scan period and the M fine scan periods form a touch frame period.

3. The touch controller according to claim 1, characterized in that: P=1, the M ranges in each column are combined into one region; During the coarse scan, the switching circuit couples multiple sensing units in each column to each other, and the sensing circuit scans the N columns to generate N region signals; and During the M fine scans, the switching circuit disconnects multiple sensing units in M ​​ranges within a trigger region of the N columns from each other, and the sensing circuit scans the M ranges within the trigger region without scanning the multiple untriggered regions in the N columns to generate the multiple unit signals of the multiple sensing units in the M ranges of the trigger region.

4. The touch controller according to claim 3, characterized in that: During the m-th period of the M fine scanning periods, the sensing circuit scans the m-th range of the M ranges of the trigger region to generate the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the trigger region, where m is an integer between 1 and M.

5. The touch controller according to claim 3, characterized in that: The sensing circuit is further coupled to a processor; and During the coarse scan, the processor identifies the triggered regions and the plurality of untriggered regions in the N columns based on the N region signals.

6. The touch controller according to claim 5, characterized in that: During the coarse scan, the processor further identifies another trigger region in the N columns based on the N region signals; and During the M fine scans, the switching circuit further disconnects the plurality of sensing units in the M ranges of the other trigger region of the N columns from each other, and the sensing circuit further scans the M ranges of the other trigger region of the N columns to generate the plurality of unit signals of the plurality of sensing units in the M ranges of the other trigger region.

7. The touch controller according to claim 6, characterized in that: During the m-th period of the M fine scanning periods, the sensing circuit scans the m-th range of the M ranges of the trigger region and the m-th range of the M ranges of the other trigger region to generate the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the trigger region and the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the other trigger region, where m is an integer between 1 and M.

8. The touch controller according to claim 1, characterized in that: P=M, each range in each column is grouped into one region; During the coarse scan, the switching circuit couples multiple sensing units in each range of each column to each other, and the sensing circuit scans MxN ranges of the N columns to generate MxN region signals; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in a trigger region of the MxN range from each other, without scanning the plurality of untriggered regions of the MxN range to generate the plurality of unit signals of the plurality of sensing units in the trigger region.

9. The touch controller according to claim 8, characterized in that: The triggering region is located in the m-th range of one of the N columns, where m is an integer between 1 and M; and During the m-th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m-th range of the column in the N columns from each other, and the sensing circuit scans the m-th range of the column in the N columns without scanning the plurality of untriggered areas in the MxN ranges.

10. The touch controller according to claim 8, characterized in that: The sensing circuit is further coupled to a processor; and During the coarse scan, the processor identifies the triggered regions and the plurality of untriggered regions within the MxN ranges based on the MxN region signals.

11. The touch controller according to claim 10, characterized in that, During the M fine scans, the processor identifies the trigger units in the trigger region based on the plurality of unit signals.

12. The touch controller according to claim 10, characterized in that: During the coarse scan, the processor further identifies another trigger region within the MxN ranges based on the MxN region signals; and During the M fine scans, the switching circuit further disconnects the plurality of sensing units in another trigger region within the MxN range from each other, and the sensing circuit further scans the other trigger region within the MxN range to generate the plurality of unit signals of the plurality of sensing units in the other trigger region.

13. The touch controller according to claim 12, characterized in that: The triggering region and the other triggering region are respectively the m1th range and the m2th range of a column in the N columns, where m1 and m2 are distinct integers between 1 and M; During the m1th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1th range of the column in the N columns from each other, and the sensing circuit scans the m1th range of the column in the N columns without scanning the plurality of untriggered areas in the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m1th range of the column in the N columns; and During the m2th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m2th range of the column in the N columns from each other, and the sensing circuit scans the m2th range of the column in the N columns without scanning the plurality of untriggered areas in the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m2th range of the column in the N columns.

14. The touch controller according to claim 12, characterized in that: The triggering region is the range of the m1th column in the N columns, and the other triggering region is the range of the m2th column in the n2th column in the N columns, where m1 and m2 are distinct integers between 1 and M, and n1 and n2 are distinct integers between 1 and N; During the m1th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1th range of the n1th column of the N columns from each other, and the sensing circuit scans the m1th range of the n1th column of the N columns without scanning the plurality of untriggered areas of the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m1th range of the n1th column of the N columns; and During the m2th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m2th range of the n2th column of the N columns from each other, and the sensing circuit scans the m2th range of the n2th column of the N columns without scanning the plurality of untriggered areas of the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m2th range of the n2th column of the N columns.

15. The touch controller according to claim 12, characterized in that: The triggering region is the m1-th range of the n1-th column in the N columns, and the other triggering region is the m1-th range of the n2-th column in the N columns, where m1 is an integer between 1 and M, and n1 and n2 are distinct integers between 1 and N; During the m1st fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1st range of the n1st column of the N columns and the plurality of sensing units in the m1st range of the n2st column of the N columns from each other, and the sensing circuit scans the m1st range of the n1st column of the N columns and the m1st range of the n2st column of the N columns, but does not scan the plurality of untriggered areas of the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m1st range of the n1st column of the N columns and the plurality of unit signals of the plurality of sensing units in the m1st range of the n2st column of the N columns.

16. A method for controlling a touch panel in a touch controller, the touch panel comprising an array of multiple sensing units divided into N columns, each column comprising M ranges, the M ranges in each column forming P regions, N and M being integers greater than 1, and P being a positive integer less than M+1, the touch controller comprising a switching circuit and a sensing circuit, characterized in that... The method includes: During a coarse scan, the switching circuit couples the plurality of sensing units in each region of each column to each other, and the sensing circuit scans PxN regions of the N columns to generate PxN region signals; and During M fine scans, the switching circuit disconnects the plurality of sensing units in a trigger region of the PxN regions from each other, and the sensing circuit scans a range in the trigger region without scanning the plurality of untriggered regions in the PxN regions to generate a plurality of unit signals of the plurality of sensing units in the trigger region.

17. The method according to claim 16, characterized in that, The coarse scan period and the M fine scan periods form a touch frame period.

18. The method according to claim 16, characterized in that: P=1, the M ranges in each column are combined into one region; During the coarse scan, the switching circuit couples the plurality of sensing units in each region of each column to each other, and the sensing circuit scans the PxN regions of the N columns to generate PxN region signals, including: During the coarse scan, the switching circuit couples multiple sensing units in each column to each other, and the sensing circuit scans the N columns to generate N region signals; and During M fine scan periods, the switching circuit disconnects the plurality of sensing units in the trigger regions of the PxN regions from each other, and the sensing circuit scans the range in the trigger regions without scanning the plurality of untriggered regions in the PxN regions to generate plurality of unit signals for the plurality of sensing units in the trigger regions, including: During the M fine scans, the switching circuit disconnects multiple sensing units in M ​​ranges within a trigger region of the N columns from each other, and the sensing circuit scans the M ranges within the trigger region without scanning the multiple untriggered regions in the N columns to generate the multiple unit signals of the multiple sensing units in the M ranges of the trigger region.

19. The method according to claim 16, characterized in that, During the M fine scans, the switching circuit disconnects multiple sensing units in M ​​ranges of the trigger regions in the N columns from each other, and the sensing circuit scans the M ranges of the trigger regions without scanning the multiple untriggered regions in the N columns to generate the multiple unit signals of the multiple sensing units in the M ranges of the trigger regions, including: During the m-th period of the M fine scanning periods, the sensing circuit scans the m-th range of the M ranges of the trigger region to generate the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the trigger region, where m is an integer between 1 and M.

20. The method according to claim 18, characterized in that, The sensing circuit is coupled to a processor, and the method further includes: During the coarse scan, the processor identifies the triggered regions and the plurality of untriggered regions in the N columns based on the N region signals.

21. The method according to claim 20, characterized in that, The method further includes: During the coarse scan, the processor further identifies another trigger region in the N columns based on the N region signals; and During the M fine scans, the switching circuit further disconnects the plurality of sensing units in the M ranges of the other trigger region of the N columns from each other, and the sensing circuit further scans the other trigger region of the N columns to generate the plurality of unit signals of the plurality of sensing units in the M ranges of the other trigger region.

22. The method according to claim 21, characterized in that: During the M fine scans, the switching circuit disconnects multiple sensing units in M ​​ranges of the trigger regions in the N columns from each other, and the sensing circuit scans the M ranges of the trigger regions without scanning the multiple untriggered regions in the N columns to generate the multiple unit signals of the multiple sensing units in the M ranges of the trigger regions, including: During the m-th period of the M fine scanning periods, the sensing circuit scans the m-th range of the M ranges of the trigger region to generate the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the trigger region, where m is an integer between 1 and M; and During the M fine scans, the switching circuit further disconnects the plurality of sensing units in M ​​ranges of the other trigger region of the N columns from each other, and the sensing circuit further scans the M ranges of the other trigger region of the N columns to generate the plurality of unit signals of the plurality of sensing units in the M ranges of the other trigger region, including: During one of the M fine scanning periods, the sensing circuit scans one of the M ranges of the other trigger region to generate the plurality of unit signals of the plurality of sensing units in the m-th range of the M ranges of the other trigger region.

23. The method according to claim 16, characterized in that: P=M, each range in each column is grouped into one region; During the coarse scan, the switching circuit couples the plurality of sensing units in each region of each column to each other, and the sensing circuit scans the PxN regions of the N columns to generate PxN region signals, including: During the coarse scan, the switching circuit couples multiple sensing units in each range of each column to each other, and the sensing circuit scans MxN ranges of the N columns to generate MxN region signals; and During M fine scan periods, the switching circuit disconnects the plurality of sensing units in the trigger regions of the PxN regions from each other, and the sensing circuit scans the range in the trigger regions without scanning the plurality of untriggered regions in the PxN regions to generate plurality of unit signals for the plurality of sensing units in the trigger regions, including: During the M fine scans, the switching circuit disconnects the plurality of sensing units in a trigger region of the MxN range from each other, without scanning the untriggered regions of the MxN range to generate the plurality of unit signals of the plurality of sensing units in the trigger region.

24. The method according to claim 23, characterized in that: The triggering region is located in the m-th range of one of the N columns, where m is an integer between 1 and M; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in the trigger regions of the M x N ranges from each other, and does not scan the plurality of untriggered regions of the M x N ranges to generate the plurality of unit signals of the plurality of sensing units in the trigger regions, including: During the m-th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m-th range of the column in the N columns from each other, and the sensing circuit scans the m-th range of the column in the N columns without scanning the plurality of untriggered areas in the MxN ranges.

25. The method according to claim 23, characterized in that, The sensing circuit is further coupled to a processor, and the method further includes: During the coarse scan, the processor identifies the triggered regions and the plurality of untriggered regions within the MxN ranges based on the MxN region signals.

26. The method according to claim 25, characterized in that, The method further includes: During the M fine scans, the processor identifies the trigger units in the trigger region based on the plurality of unit signals.

27. The method of claim 25, further comprising: During the coarse scan, the processor identifies another trigger region within the MxN ranges based on the MxN region signals; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in the other trigger region within the MxN range from each other, and the sensing circuit further scans the other trigger region within the MxN range to generate the plurality of unit signals of the plurality of sensing units in the other trigger region.

28. The method according to claim 27, characterized in that: The triggering region and the other triggering region are respectively the m1th range and the m2th range of a column in the N columns, where m1 and m2 are distinct integers between 1 and M; During the M fine scans, the switching circuit disconnects the plurality of sensing units in the trigger regions within the MxN ranges from each other, while the sensing circuit scans the trigger regions within the MxN ranges without scanning the plurality of untriggered regions within the MxN ranges to generate the plurality of unit signals of the plurality of sensing units in the trigger regions, including: During the m1th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1th range of the columns in the N columns from each other, and the sensing circuit scans the m1th range of the columns in the N columns without scanning the plurality of untriggered areas in the MxN ranges, to generate the plurality of unit signals of the plurality of sensing units in the m1th range of the columns in the N columns; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in the other trigger region within the MxN range from each other, and the sensing circuit scans the other trigger region within the MxN range to generate the plurality of unit signals of the plurality of sensing units in the other trigger region, including: During the m2th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m2th range of the column in the N columns from each other, and the sensing circuit scans the m2th range of the column in the N columns without scanning the plurality of untriggered areas in the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m2th range of the column in the N columns.

29. The method according to claim 27, characterized in that: The triggering region is the range of the m1th column in the N columns, and the other triggering region is the range of the m2th column in the n2th column in the N columns, where m1 and m2 are distinct integers between 1 and M, and n1 and n2 are distinct integers between 1 and N; During the M fine scans, the switching circuit disconnects the plurality of sensing units in the trigger regions within the MxN ranges from each other, while the sensing circuit scans the trigger regions within the MxN ranges without scanning the plurality of untriggered regions within the MxN ranges to generate the plurality of unit signals of the plurality of sensing units in the trigger regions, including: During the m1th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1th range of the n1th column of the N columns from each other, and the sensing circuit scans the m1th range of the n1th column of the N columns, without scanning the plurality of untriggered areas of the M x N ranges, to generate the plurality of unit signals of the plurality of sensing units in the m1th range of the n1th column of the N columns; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in the other trigger region within the MxN range from each other, and the sensing circuit scans the other trigger region within the MxN range to generate the plurality of unit signals of the plurality of sensing units in the other trigger region, including: During the m2th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m2th range of the n2th column of the N columns from each other, and the sensing circuit scans the m2th range of the n2th column of the N columns without scanning the plurality of untriggered areas of the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m2th range of the n2th column of the N columns.

30. The method according to claim 27, characterized in that: The triggering region is the m1-th range of the n1-th column in the N columns, and the other triggering region is the m1-th range of the n2-th column in the N columns, where m1 is an integer between 1 and M, and n1 and n2 are distinct integers between 1 and N; During the M fine scans, the switching circuit disconnects the plurality of sensing units in the trigger regions within the MxN ranges from each other, while the sensing circuit scans the trigger regions within the MxN ranges without scanning the plurality of untriggered regions within the MxN ranges to generate the plurality of unit signals of the plurality of sensing units in the trigger regions, including: During the m1th fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1th range of the n1th column of the N columns from each other, and the sensing circuit scans the m1th range of the n1th column of the N columns, without scanning the plurality of untriggered areas of the M x N ranges, to generate the plurality of unit signals of the plurality of sensing units in the m1th range of the n1th column of the N columns; and During the M fine scans, the switching circuit disconnects the plurality of sensing units in the other trigger region within the MxN range from each other, and the sensing circuit scans the other trigger region within the MxN range to generate the plurality of unit signals of the plurality of sensing units in the other trigger region, including: During the m1st fine scan period of the M fine scan periods, the switching circuit disconnects the plurality of sensing units in the m1st range of the n2th column of the N columns from each other, and the sensing circuit scans the m1st range of the n2th column of the N columns without scanning the plurality of untriggered areas of the MxN ranges, so as to generate the plurality of unit signals of the plurality of sensing units in the m1st range of the n2th column of the N columns.

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