Line-by-line calculation and subtraction method for water vapor spectral line overlapping interference in laser methane detection
By combining dual-channel detection and machine learning with a line-by-line calculation subtraction method, the interference of water vapor and volatile organic compounds in complex industrial environments is dynamically removed, solving the measurement accuracy problem of laser methane detection equipment in complex environments and achieving high-precision and high-reliability detection.
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HEFEI QINGXIN SENSING TECH CO LTD
- Filing Date
- 2026-04-28
- Publication Date
- 2026-07-07
AI Technical Summary
Existing laser methane detection equipment faces spectral line overlap interference caused by high concentrations of water vapor and volatile organic compounds in complex industrial environments, resulting in decreased measurement accuracy and making it difficult to meet the requirements for high-precision real-time detection.
Employing a dual-channel detection unit and environmental parameter sensors, combined with a pre-defined machine learning model and physical feature library, the system dynamically removes spectral overlap interference from water vapor and other interfering gases through line-by-line calculation and subtraction. It also introduces a multi-level priority fitting and closed-loop verification iteration strategy to adaptively handle complex dynamic environments.
It improves the measurement accuracy and environmental adaptability of laser methane detection equipment in harsh environments, enhances the reliability and accuracy of measurements, and can effectively cope with extreme optical path attenuation and electromagnetic shock, reducing data distortion and missed detections.
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