Modeling method and electronic device based on electron backscatter diffraction data

By generating explicit grain boundary layers through data preprocessing and morphological reconstruction, the problems of high computational cost and unrealistic grain boundary morphology in existing technologies are solved, and efficient and accurate finite element mesh modeling of polycrystalline materials is achieved.

CN122154282APending Publication Date: 2026-06-05XIAN THERMAL POWER RES INST CO LTD +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
XIAN THERMAL POWER RES INST CO LTD
Filing Date
2026-01-30
Publication Date
2026-06-05

AI Technical Summary

Technical Problem

Existing technologies for converting electron backscatter diffraction data into finite element analysis mesh models suffer from high computational costs, element distortion, and unrealistic grain boundary morphology. In particular, when simulating grain boundary slip and corrosion, existing methods cannot reflect the physical width of grain boundaries and may lead to topological distortion.

Method used

By preprocessing and coarsening the data, a clean grain map is generated. Topology optimization is performed and the grain boundary space range is identified. A constrained morphological reconstruction is used to generate an explicit grain boundary layer. Its width is controlled and burrs are trimmed to generate a high-quality finite element mesh.

Benefits of technology

It effectively reduces model size, generates explicit grain boundary layers with user-controllable width, ensures computational efficiency and physical realism, and is suitable for simulating grain boundary slip and corrosion in polycrystalline materials.

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Abstract

Embodiments of the present disclosure provide a modeling method based on electron backscatter diffraction data and an electronic device, the modeling method comprising data preprocessing and coarsening, structure optimization and boundary definition, controlled generation of grain boundary layer, and mesh integration and output. A constrained morphological reconstruction algorithm is used to start from a seed unit, perform controllable inflation growth within the boundary constraint mask, and form an explicit grain boundary layer with a width that can be precisely defined by the user. Finally, based on the optimized coarsened grain map and the explicit grain boundary layer, a regularized mesh file that can be used for finite element analysis is generated. Through the strategy of "constraint first, reconstruction later", an explicit grain boundary model with a clear geometric width can be efficiently constructed, providing a high-quality mesh basis for studying the influence behavior of grain boundaries at the microscale.
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