Data acquisition method, device and storage medium

Abstract

This disclosure provides a data acquisition method, device, and storage medium. The method involves an industrial control computer responding to a target contour acquisition range setting command to set the target contour acquisition range of the object being measured. The target contour acquisition range is then transmitted to a contour scanner in a contour scanning system, enabling the contour scanner to acquire the contour of the object and store the original two-dimensional contour image of each row within the target contour acquisition range in the scanner's storage unit. The method also includes receiving the original two-dimensional contour image of each row within the target contour acquisition range transmitted from the contour scanner. This disclosure allows the industrial control computer to configure the target contour acquisition range, and the contour scanner to accurately acquire, store, and transmit the original two-dimensional contour image of each row within the target contour acquisition range to the industrial control computer. This allows the industrial control computer to perform offline parameter optimization based on the original two-dimensional contour image of each row within the target contour acquisition range, eliminating the need for online parameter optimization, reducing the difficulty of parameter optimization operations, and improving parameter optimization efficiency.

Description

Technical Field

[0001] This disclosure relates to the field of computer technology, and in particular to data acquisition methods, devices and storage media. Background Technology

[0002] A contour scanner is a non-contact optical 3D measurement device that typically projects a line laser onto the surface of an object. The laser pattern is deformed due to the shape of the object. A camera is used to capture an image of the object's surface. Based on the deformed laser pattern in the object's surface image, the contour line or point cloud data of the object is generated through 3D reconstruction.

[0003] When debugging the contour scanner on-site, if noise or missing data appears in the acquired point cloud, the abnormal point cloud location of the actual object needs to be placed under the laser line. Then, by observing the original two-dimensional contour image (RAW), the grayscale threshold, width threshold, sharpness, mask, gain and other functional parameters are adjusted to optimize the point cloud quality to the best.

[0004] However, the above parameter optimization process is complex and difficult, and it is impossible to quickly adjust the parameters to the optimal level. Summary of the Invention

[0005] This disclosure provides various methods, devices, and storage media for data acquisition, thereby reducing the difficulty of parameter optimization operations and improving the efficiency of parameter optimization.

[0006] The first aspect of this disclosure provides a data acquisition method applied to an industrial control computer in a contour scanning system, the method comprising:

[0007] In response to the target contour acquisition range setting command, the target contour acquisition range of the measured object is set.

[0008] The target contour acquisition range is transmitted to the contour scanner in the contour scanning system so that the contour scanner can acquire the contour of the object under test and store the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner.

[0009] Receive the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner.

[0010] A second aspect of this disclosure provides a data acquisition method applied to a contour scanner in a contour scanning system, the method comprising:

[0011] The industrial control computer receives the target contour acquisition range of the object being measured from the contour scanner.

[0012] The contour of the object under test is acquired starting from the initial scanning position of the contour scanner, and when the target contour acquisition range is reached, the original two-dimensional contour image of each row in the target contour acquisition range is stored in the storage unit of the contour scanner.

[0013] The original two-dimensional contour image of each row in the target contour acquisition range is transmitted to the industrial control computer.

[0014] A third aspect of this disclosure provides a contour scanner, including a storage unit;

[0015] The contour scanner is used for contour acquisition and stores the original two-dimensional contour image of each row in the acquired target contour acquisition range into the storage unit.

[0016] A fourth aspect of this disclosure provides an electronic device, including: a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method of the first aspect or the method of the second aspect.

[0017] The fifth aspect of this disclosure provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the method of the first aspect or the method of the second aspect described above.

[0018] The sixth aspect of this disclosure provides a computer program product comprising: a computer program stored in a readable storage medium, wherein at least one processor of an electronic device can read the computer program from the readable storage medium, and the at least one processor executes the computer program to cause the electronic device to perform the method of the first aspect or the method of the second aspect described above.

[0019] The data acquisition method, device, and storage medium provided in this embodiment of the present disclosure, in response to a target contour acquisition range setting command, enable an industrial control computer in a contour scanning system to set the target contour acquisition range of the object under test; transmit the target contour acquisition range to a contour scanner in the contour scanning system, so that the contour scanner can acquire the contour of the object under test and store the original two-dimensional contour image of each row in the target contour acquisition range in the storage unit of the contour scanner; and receive the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner. In this embodiment, the target contour acquisition range can be configured by the industrial control computer, and the contour scanner can accurately acquire, store, and transmit the original two-dimensional contour image of each row in the target contour acquisition range to the industrial control computer, so that the industrial control computer can perform offline parameter optimization based on the original two-dimensional contour image of each row in the target contour acquisition range, without the need for online parameter optimization, reducing the difficulty of parameter optimization operations and improving the efficiency of parameter optimization. Attached Figure Description

[0020] The accompanying drawings, which are included to provide a further understanding of this disclosure and form part of this disclosure, illustrate exemplary embodiments of the present disclosure and are used to explain the disclosure, but do not constitute an undue limitation of the disclosure. In the drawings:

[0021] Figure 1 An application scenario diagram of a data acquisition method provided for an exemplary embodiment of this disclosure;

[0022] Figure 2 A flowchart illustrating the steps of a data acquisition method provided in an exemplary embodiment of this disclosure;

[0023] Figure 3 A schematic diagram of an industrial control computer screen provided as an exemplary embodiment of this disclosure;

[0024] Figure 4 A schematic diagram of another industrial computer screen interface provided for an exemplary embodiment of this disclosure;

[0025] Figure 5 A flowchart illustrating the steps of another data acquisition method provided as an exemplary embodiment of this disclosure;

[0026] Figure 6 A schematic diagram of the structure of an electronic device provided for an exemplary embodiment of this disclosure. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of this disclosure clearer, the technical solutions of this disclosure will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without creative effort are within the scope of protection of this disclosure.

[0028] When debugging the contour scanner on site, if noise or missing data appears in the collected point cloud, the abnormal point cloud location of the actual object needs to be placed under the laser line. Then, by observing the original two-dimensional contour image, the grayscale threshold, width threshold, sharpness, mask, gain and other functional parameters are adjusted to optimize the point cloud quality to the best.

[0029] However, the above parameter optimization process is complex and difficult, making it impossible to quickly adjust the parameters to their optimal state. Specifically:

[0030] 1) It is quite difficult to accurately place the location of the anomalous point cloud under the laser line, for the following reasons:

[0031] Challenge 1: When the object being measured is small, it is difficult to observe the precise position of the laser line with the naked eye. The position of the object being measured needs to be repeatedly adjusted, and the adjustment process is complicated. If the contour scanner is installed inside the equipment, people cannot enter.

[0032] Challenge 2: Identifying whether the current location is within the detection area using laser imagery involves a degree of guesswork and requires repeated confirmation. For example, in the detection of pins in electronic components, the laser imagery contains many tiny laser lines, making it difficult to distinguish where the pins are and where the noise originates.

[0033] Challenge 3: If there are some scattered abnormal spots or missing parts on a flat object, and there are no features to refer to, it is difficult to find the location of these abnormalities.

[0034] Challenge 4: It is difficult for the machine to stop at abnormal positions on site. It often happens that the machine has not reached the previous position and has overshot the next position.

[0035] 2) It is impossible to take a holistic view. After adjusting the parameters according to the image of a certain laser line, the effect will be tested again for the whole. This new set of parameters may not be applicable to other positions, which will lead to repeated adjustments and tests.

[0036] 3) When providing remote support, it is impossible to see the physical status of the product, and the process is often laggy and communication is difficult.

[0037] To address the aforementioned technical problems, this disclosure provides a data acquisition method. An industrial control computer can configure a target contour acquisition range, and a contour scanner can accurately acquire, store, and transmit the original two-dimensional contour image of each row within the target contour acquisition range to the industrial control computer. This allows the industrial control computer to perform offline parameter optimization based on the original two-dimensional contour image of each row within the target contour acquisition range, eliminating the need for online parameter optimization, reducing the difficulty of parameter optimization operations, and improving the efficiency of parameter optimization.

[0038] like Figure 1 As shown, the industrial control computer in the contour scanning system responds to the target contour acquisition range setting command, sets the target contour acquisition range of the object being measured, and transmits the target contour acquisition range to the contour scanner in the contour scanning system, so that the contour scanner can acquire the contour of the object being measured and store the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner; it also receives the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner. Furthermore, the industrial control computer can subsequently perform parameter optimization based on the original two-dimensional contour image of each row in the target contour acquisition range.

[0039] Figure 2This is a flowchart illustrating the steps of a data acquisition method provided as an exemplary embodiment of the present disclosure. The contour scanning system includes a contour scanner and an industrial control computer, such as... Figure 2 As shown, this method is applied to an industrial control computer in a contour scanning system, and specifically includes the following steps:

[0040] S201. In response to the target contour acquisition range setting command, set the target contour acquisition range of the measured object.

[0041] In this embodiment, the user can set the target contour acquisition range of the object being measured on the industrial control computer. The purpose of setting the target contour acquisition range is to obtain the original two-dimensional contour image (RAW) of each row in the target contour acquisition range by the contour scanner for subsequent parameter optimization.

[0042] Specifically, the industrial control computer can first acquire the initial point cloud image or depth image obtained by the contour scanner from the object being measured, and display it in a display window on the industrial control computer screen (to distinguish it from the display window in the following embodiments, it is referred to here as the third display window), such as... Figure 3 As shown, users can set the target contour acquisition range based on point cloud images or depth images. This triggers a target contour acquisition range setting command based on the initial point cloud image or depth image. The industrial control computer can respond to the target contour acquisition range setting command and determine the target contour acquisition range set by the user. Optionally, the target contour acquisition range can also be displayed in a third display window to visually indicate its location.

[0043] Optionally, users can select the target contour acquisition range in the point cloud image or depth image by using a selection box. This allows them to perform operations such as dragging the selection box and / or adjusting its size, and the row covered by the selection box is defined as the target contour acquisition range.

[0044] Optionally, users can also input the target contour acquisition range through input boxes. For example, they can input the start and end rows of the target contour acquisition range, and use the rows between the start and end rows as the target contour acquisition range; or they can input the start row and row number of the target contour acquisition range, which can also determine the target contour acquisition range. In order to facilitate accurate determination of the row number, row identifiers (such as row numbers) can be displayed on the point cloud image or depth image.

[0045] Of course, other methods can also be used to determine the target contour acquisition range in this embodiment, and no limitation is made here.

[0046] S202. The target contour acquisition range is transmitted to the contour scanner in the contour scanning system so that the contour scanner can acquire the contour of the object being measured and store the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner.

[0047] In this embodiment, the industrial control computer can transmit the target contour acquisition range to the contour scanner. The goal is for the contour scanner to acquire the original two-dimensional contour image of each row within the target contour acquisition range and transmit it to the industrial control computer. To achieve this goal, the scanning position of the contour scanner first needs to be moved to the target contour acquisition range. In this embodiment, the contour scanner can be used to re-acquire the contour of the object being measured, that is, to scan sequentially from the scanning starting point until the target contour acquisition range is reached. This achieves precise movement of the contour scanner's scanning position to the target contour acquisition range (that is, accurately placing the target contour acquisition range under the laser line) without the need for manual position adjustment.

[0048] During the process of scanning sequentially from the starting point until the target contour acquisition range is reached, the contour scanner may or may not acquire data. However, data needs to be acquired when scanning each row of the target contour acquisition range, that is, the original two-dimensional contour image of each row needs to be acquired.

[0049] Considering the relatively large data volume of the original two-dimensional contour image, in order to avoid the process of the contour scanner transmitting the original two-dimensional contour image to the industrial control computer affecting the acquisition process, in this embodiment, the original two-dimensional contour image of each row in the target contour acquisition range is first stored in the storage unit of the contour scanner. The original two-dimensional contour image of each row in the target contour acquisition range can be transmitted to the industrial control computer asynchronously without affecting the acquisition process of the contour scanner. That is, the original two-dimensional contour image can be transmitted during the acquisition process, or it can be not transmitted (for example, it can be transmitted after the acquisition is completed), without affecting the acquisition process of the contour scanner.

[0050] It should be noted that, since the transmission process is asynchronous and may occur after the acquisition is completed, the industrial control computer may not be aware of the contour acquisition progress, nor will it know whether the contour scanner has performed the contour acquisition process normally or which position the contour has been acquired. Therefore, in this embodiment, the acquisition position can be displayed in real time in the third display window when the contour scanner is acquiring the contour of the object being measured. For example, the pointer can be used to point to the number of rows currently acquired, and the pointer position can be moved in real time according to the acquisition progress; or the acquisition position of the contour scanner can be marked in the initial point cloud image or depth image; or other methods can be used to display the acquisition position in real time. This embodiment does not impose any limitations on these methods.

[0051] In practice, the contour scanner can transmit the current acquisition position (such as row number) to the industrial control computer in real time, so that the industrial control computer can display the acquisition position in the third display window in real time according to the current acquisition position.

[0052] It should be noted that the industrial control computer is configured with a target contour acquisition range, and the contour scanner is able to acquire the target contour within this range, provided that the object being measured does not move relative to the platform of the contour scanner.

[0053] If it is determined that the object under test has moved relative to the platform, the target contour acquisition range configured by the industrial control computer and the position on the object under test will not correspond. In this case, the starting row of the target contour acquisition range can be set as the starting scanning position of the contour scanner (i.e., row 0). The industrial control computer can transmit the target row number of the target contour acquisition range and the starting row of the target contour acquisition range to the contour scanner. At the same time, the user also needs to align the starting row of the target contour acquisition range of the object under test to the starting scanning position of the contour scanner. In this way, the contour scanner starts to acquire the target row number of the target contour acquisition range from the starting scanning position of the contour scanner (i.e., row 0), which actually acquires the original two-dimensional contour image of the target contour acquisition range of the object under test. The contour scanner can store the original two-dimensional contour image of the target row number starting from the starting row of the target contour acquisition range into the storage unit, thereby ensuring that the method of this embodiment can still be used even if the object under test moves relative to the platform.

[0054] S203. Receive the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner.

[0055] In this embodiment, the contour scanner can transmit the original two-dimensional contour image of each row in the target contour acquisition range in the storage unit to the industrial control computer, so that the industrial control computer can perform offline parameter optimization based on the original two-dimensional contour image of each row in the target contour acquisition range.

[0056] The contour scanner can start transmitting the image to the industrial control computer after acquiring the original two-dimensional contour image of the starting row within the target contour acquisition range; or it can start transmitting the image to the industrial control computer after acquisition and reception; or it can start transmitting the image to the industrial control computer at any other time or triggered by other triggering conditions.

[0057] The data acquisition method provided in this embodiment involves an industrial control computer in a contour scanning system responding to a target contour acquisition range setting command to set the target contour acquisition range of the object being measured. The target contour acquisition range is then transmitted to the contour scanner in the contour scanning system, enabling the contour scanner to acquire the contour of the object being measured and store the original two-dimensional contour image of each row within the target contour acquisition range in the contour scanner's storage unit. The method also receives the original two-dimensional contour image of each row within the target contour acquisition range transmitted from the contour scanner. In this embodiment, the target contour acquisition range can be configured by the industrial control computer, and the contour scanner can accurately acquire, store, and transmit the original two-dimensional contour image of each row within the target contour acquisition range to the industrial control computer. This allows the industrial control computer to perform offline parameter optimization based on the original two-dimensional contour image of each row within the target contour acquisition range, eliminating the need for online parameter optimization, reducing the difficulty of parameter optimization operations, and improving the efficiency of parameter optimization.

[0058] Based on the above embodiments, after receiving the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner in S203, the method may further include:

[0059] In response to the parameter setting command for the target row in the target contour acquisition range, the processing parameter information corresponding to the target row is set;

[0060] The original two-dimensional contour image of the target row is processed using the processing parameter information corresponding to the target row, and the processing result is displayed on the industrial control computer screen.

[0061] In this embodiment, processing parameters can be set for a specific target row within the target contour acquisition range. These processing parameters are those used to process the original 2D contour image, including but not limited to parameters for contour extraction algorithms and point cloud generation algorithms. The contour extraction algorithm parameters include, but are not limited to, grayscale threshold, width threshold, sharpness, mask, gain, filtering, and line extraction mode. The target row is typically the starting row of the target contour acquisition range by default, but it can also be any other row within the target contour acquisition range, selectable by the user or preset.

[0062] After setting the processing parameters for the target row, these parameters can be applied to the original 2D contour image of the target row to verify their suitability. Specifically, a parameter configuration window can be provided. After entering the processing parameters in the window and confirming the settings, the processing parameters will be applied to the original 2D contour image of the target row, and the processing result will be displayed on the industrial control computer screen.

[0063] Optionally, the processing parameters corresponding to the target row can also be automatically configured by the industrial control computer. For example, the processing parameters corresponding to the target row can be configured based on the original two-dimensional contour image of the target row through machine learning or other methods.

[0064] Based on the above embodiments, after receiving the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner, S203 may further include:

[0065] Based on the original two-dimensional contour image of each row of the target contour acquisition range, the image is processed using preset processing parameters to generate the first point cloud image of the target contour acquisition range, which is then displayed in the first display window of the industrial control computer screen.

[0066] In this embodiment, after receiving the original two-dimensional contour image of each row within the target contour acquisition range, the original two-dimensional contour image of each row within the target contour acquisition range can be processed using preset processing parameters, such as contour line extraction and 3D reconstruction, to generate a first point cloud image of the target contour acquisition range, which is then displayed in the first display window as a reference for subsequent parameter optimization and comparison of optimization effects. Figure 4 As shown.

[0067] Correspondingly, in response to the parameter setting command for the target row within the target contour acquisition range, the processing parameter information corresponding to the target row is set, which may specifically include:

[0068] In response to a target row selection instruction based on the first point cloud image, the target row is determined;

[0069] In response to the parameter setting instructions in the parameter configuration window of the target row, set the processing parameter information corresponding to the target row.

[0070] In this embodiment, a target row can be selected in the first point cloud image. A virtual cutting plane (parallel to the XZ plane) can be displayed in the first point cloud image. By dragging the virtual cutting plane, the row containing the virtual cutting plane is determined as the target row, and a parameter configuration window for the target row is displayed. The user can set the processing parameter information for the target row in the parameter configuration window. Optionally, the target row can also be selected in other ways, such as by entering the row number of the target row.

[0071] Alternatively, the target row can be selected in other ways, such as by displaying a position control for the section plane and moving the section plane by manipulating the control.

[0072] Based on the above embodiments, after the target row is determined, the original two-dimensional contour image of the target row is displayed in the second display window of the industrial control computer screen, so as to facilitate the user to set the processing parameter information of the target row by referring to the original two-dimensional contour image of the target row.

[0073] Furthermore, the original two-dimensional contour image of the target row is processed using the processing parameter information corresponding to the target row, and the processing result is displayed on the industrial control computer screen. That is, the original two-dimensional contour image of the target row displayed in the second display window is updated to the processed two-dimensional contour image of the target row, so as to show the effect of parameter optimization. This allows users to preview and verify whether the parameter optimization is appropriate. If it is not appropriate, it can be flexibly adjusted and the content displayed in the second display window can be updated again for preview and verification.

[0074] Based on the above embodiments, since the processing parameter information corresponding to the target row is only applied to the original two-dimensional contour image of the target row, it can only verify the effect of parameter optimization in the target row. In order to further verify whether the processing parameter information corresponding to the target row is applicable to the entire target contour acquisition range, this embodiment can apply the processing parameter information corresponding to the target row to process the original two-dimensional contour image of each row of the target contour acquisition range, and finally generate the second point cloud image of the target contour acquisition range. The user can determine whether the processing parameter information corresponding to the target row is applicable to the entire target contour acquisition range based on the second point cloud image.

[0075] In practice, after setting the processing parameters for the target row, the user can trigger a refresh command for the first display window. In response to the refresh command, the user processes the original two-dimensional contour image of each row of the target contour acquisition range using the processing parameters for the target row, generates a second point cloud image for the target contour acquisition range, and updates the first point cloud image displayed in the first display window to the second point cloud image. This allows the user to visually observe the changes between the first and second point cloud images and verify whether the processing parameters for the target row are applicable to the entire target contour acquisition range.

[0076] It should be noted that, in the above embodiments, when setting the processing parameter information corresponding to the target row, the processing parameter information can be applied to the entire area of ​​the target contour acquisition range. However, considering that different areas of the target contour acquisition range may require different processing parameter information, especially since the surface features of the measured object in the X direction may differ, the target contour acquisition range can be divided into regions. Specifically, in response to the region division instruction for the target contour acquisition range, the target contour acquisition range is divided into multiple regions. The region division instruction can be user-defined or automatically divided by the industrial control computer based on the surface features of the measured object. Furthermore, when configuring the processing parameter information for the target row, it is necessary to configure the corresponding processing parameter information for each region. Specifically, in response to the parameter setting instruction for the target row in each region, the processing parameter information corresponding to the target row in each region is set, so that the processing parameter information corresponding to the target row in each region can be applied to the processing in each region, achieving more refined processing.

[0077] Based on any of the above embodiments, after optimizing the parameters of the target contour acquisition range, the optimized processing parameter information can be applied to the contour scanner, specifically including:

[0078] In response to the application command for processing parameter information, the processing parameter information is transmitted to the contour scanner so that the contour scanner can process the original two-dimensional contour image of the target contour acquisition range after acquiring the contour acquisition of the object being measured, and obtain the third contour data of the object being measured.

[0079] In this embodiment, the optimized processing parameters of the target contour acquisition range are transmitted to the contour scanner. When the contour scanner performs contour acquisition on the object under test again, it can apply the optimized processing parameters to process the original two-dimensional contour image of the target contour acquisition range when it scans the target contour acquisition range, and finally generate the third contour data of the object under test, thereby improving the quality of the contour acquisition results.

[0080] Based on any of the above embodiments, the processing parameter information can also be imported and exported. In response to the export instruction for the processing parameter information, a file including the processing parameter information can be generated. Correspondingly, when it is necessary to import the processing parameter information, the file including the processing parameter information can be loaded.

[0081] Based on any of the above embodiments, remote parameter optimization can also be supported. Specifically, the industrial control computer can transmit the original two-dimensional contour image of each row in the target contour acquisition range to the remote processing device, which will then execute the parameter optimization process in the above embodiments to obtain the optimized processing parameter information and return it to the industrial control computer. The industrial control computer can then apply the optimized processing parameter information to the contour scanner.

[0082] Figure 5 This is a flowchart illustrating the steps of a data acquisition method provided as an exemplary embodiment of the present disclosure. The contour scanning system includes a contour scanner and an industrial control computer, such as... Figure 5 As shown, this method is applied to the contour scanner of a contour scanning system, and specifically includes the following steps:

[0083] S501, Receives the target contour acquisition range of the object being measured from the industrial control computer of the contour scanner.

[0084] S502. Start collecting the contour of the object to be measured from the starting scanning position of the contour scanner, and when the target contour collection range is scanned, store the original two-dimensional contour image of each row in the target contour collection range into the storage unit of the contour scanner.

[0085] S503. Transmit the original two-dimensional contour image of each row in the target contour acquisition range to the industrial control computer.

[0086] The data acquisition method provided in this embodiment is the same as the method on the contour scanner side in the above embodiment. Its specific implementation process and principle can be found in the method on the industrial control computer side, and will not be repeated here.

[0087] This exemplary embodiment also provides a contour scanning system. The contour scanning system includes a contour scanner and an industrial control computer (ICC), wherein the ICC is used to execute the data acquisition method on the ICC side of the above embodiments, and the contour scanner is used to execute the data acquisition method on the contour scanner side of the above embodiments.

[0088] An exemplary embodiment of this disclosure also provides a contour scanner, including a storage unit; the contour scanner is used for contour acquisition and stores the original two-dimensional contour image of each row in the acquired target contour acquisition range into the storage unit.

[0089] In addition, the contour scanner is also used to transmit the original two-dimensional contour image of each row in the target contour acquisition range to the industrial control computer.

[0090] Corresponding to the data acquisition method on the industrial control computer side of the above embodiments, an exemplary embodiment of this disclosure also provides a data acquisition device, including: a receiving unit, a configuration unit, and a sending unit.

[0091] The configuration unit is used to set the target contour acquisition range of the measured object in response to the target contour acquisition range setting command.

[0092] The sending unit is used to transmit the target contour acquisition range to the contour scanner in the contour scanning system, so that the contour scanner can acquire the contour of the object being measured and store the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner.

[0093] The receiving unit is used to receive the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner.

[0094] Optionally, after receiving the original two-dimensional contour image of each row within the target contour acquisition range transmitted by the contour scanner, the configuration unit is further configured to:

[0095] In response to the parameter setting command for the target row in the target contour acquisition range, the processing parameter information corresponding to the target row is set;

[0096] The original two-dimensional contour image of the target row is processed using the processing parameter information corresponding to the target row, and the processing result is displayed on the industrial control computer screen.

[0097] Optionally, after receiving the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner, the configuration unit is further configured to:

[0098] Based on the original two-dimensional contour image of each row of the target contour acquisition range, the image is processed using preset processing parameters to generate the first point cloud image of the target contour acquisition range, and displayed in the first display window of the industrial control computer screen.

[0099] Accordingly, when the configuration unit sets the processing parameter information corresponding to the target row in response to the parameter setting instruction for the target row in the target contour acquisition range, it is used to:

[0100] In response to a target row selection instruction based on the first point cloud image, the target row is determined;

[0101] In response to the parameter setting instructions in the parameter configuration window of the target row, set the processing parameter information corresponding to the target row.

[0102] Optionally, after determining the target line, the configuration unit is also used for:

[0103] The original two-dimensional contour image of the target row is displayed in the second display window of the industrial control computer screen;

[0104] Accordingly, when displaying the processing results on the industrial computer screen, the configuration unit is used for:

[0105] Update the original 2D contour image of the target row displayed in the second display window to the processed 2D contour image of the target.

[0106] Optionally, the configuration unit is also used for:

[0107] In response to the refresh command of the first display window, the original two-dimensional contour image of each row of the target contour acquisition range is processed using the processing parameter information corresponding to the target row to generate the second point cloud image of the target contour acquisition range.

[0108] Update the first point cloud image displayed in the first display window to the second point cloud image.

[0109] Optionally, when the configuration unit sets the processing parameter information corresponding to the target row in response to a parameter setting instruction for the target row within the target contour acquisition range, it is used to:

[0110] In response to the instruction to divide the target contour acquisition range into regions, the target contour acquisition range is divided into multiple regions;

[0111] In response to the parameter setting command for the target row in each region, the processing parameter information corresponding to the target row in each region is set.

[0112] Optionally, when the configuration unit sets the target contour acquisition range for the measured object in response to a target contour acquisition range setting command, it is used to:

[0113] Acquire the initial point cloud image or depth image obtained by the contour scanner from the contour acquisition of the object under test, and display the initial point cloud image or depth image on the third display window of the industrial control computer screen;

[0114] In response to a target contour acquisition range setting command based on an initial point cloud image or depth image, the target contour acquisition range of the measured object is set, and the target contour acquisition range is displayed in the initial point cloud image or depth image.

[0115] Optionally, the configuration unit is also used for:

[0116] When the contour scanner acquires the contour of the object being measured, the acquisition position is displayed in real time in the third display window.

[0117] Optionally, after setting the target contour acquisition range for the object under test, the configuration unit is also used for:

[0118] If it is determined that the object being measured has moved relative to the platform, the starting row of the target contour acquisition range is set as the starting scanning position of the contour scanner.

[0119] Accordingly, transmitting the target contour acquisition range to the contour scanner in the contour scanning system includes:

[0120] The target number of rows and the starting row of the target contour acquisition range are transmitted to the contour scanner. After the user aligns the starting row of the target contour acquisition range of the object to be measured with the starting scanning position of the contour scanner, the contour scanner stores the original two-dimensional contour image of the target number of rows into the storage unit starting from the starting row of the target contour acquisition range.

[0121] Optionally, the configuration unit is also used for:

[0122] In response to the application command for processing parameter information, the processing parameter information is transmitted to the contour scanner so that the contour scanner can process the original two-dimensional contour image of the target contour acquisition range after acquiring the contour acquisition of the object being measured, and obtain the third contour data of the object being measured.

[0123] Optionally, the configuration unit is also used for:

[0124] In response to the instruction to export processing parameter information, a file containing the processing parameter information is generated.

[0125] The device provided in this embodiment can be used to execute the technical solution of the above-described industrial control computer-side method embodiment. Its implementation principle and technical effect are similar, and will not be described again here.

[0126] Corresponding to the data acquisition method on the contour scanner side of the above embodiments, an exemplary embodiment of this disclosure also provides a data acquisition device, including: an acquisition unit, a transmission unit, and a receiving unit.

[0127] The receiving unit is used to receive the target contour acquisition range of the object being measured transmitted by the industrial control computer of the contour scanner.

[0128] The acquisition unit is used to acquire the contour of the object to be measured from the starting scanning position of the contour scanner, and when the target contour acquisition range is reached, it stores the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner.

[0129] The transmitting unit is used to transmit the original two-dimensional contour image of each row in the target contour acquisition range to the industrial control computer.

[0130] The apparatus provided in this embodiment can be used to execute the technical solution of the above-described contour scanner side method embodiment. Its implementation principle and technical effect are similar, and will not be described again here.

[0131] Furthermore, in some of the processes described in the above embodiments and accompanying drawings, multiple operations appear in a specific order. However, it should be clearly understood that these operations may not be executed in the order they appear herein, or may be executed in parallel. The sequence numbers are merely used to distinguish different operations, and the sequence numbers themselves do not represent any execution order. Additionally, these processes may include more or fewer operations, and these operations may be executed sequentially or in parallel. It should be noted that the descriptions such as "first," "second," etc., in this document are used to distinguish different messages, devices, modules, etc., and do not represent a sequential order, nor do they limit "first" and "second" to different types.

[0132] Figure 6 This is a schematic diagram of the structure of an electronic device provided in an example embodiment of this disclosure. For example... Figure 6 As shown, the electronic device 60 includes a processor 61 and a memory 62 communicatively connected to the processor 61, the memory 62 storing computer-executed instructions.

[0133] The processor executes computer execution instructions stored in the memory to implement the data acquisition method on the industrial control computer side or the data acquisition method on the contour scanner side provided in any of the above method embodiments. The specific functions and technical effects that can be achieved will not be elaborated here.

[0134] This disclosure also provides a computer-readable storage medium storing computer-executable instructions. When executed by a processor, the computer-executable instructions are used to implement the data acquisition method on the industrial control computer side or the data acquisition method on the contour scanner side provided in any of the above method embodiments.

[0135] This disclosure also provides a computer program product, comprising: a computer program stored in a readable storage medium; at least one processor of an electronic device can read the computer program from the readable storage medium; the at least one processor executes the computer program to cause the electronic device to perform the data acquisition method on the industrial control computer side or the data acquisition method on the contour scanner side provided in any of the above method embodiments. In the several embodiments provided in this disclosure, it should be understood that the disclosed systems and methods can be implemented in other ways. For example, the system embodiments described above are merely illustrative; for example, the division of units is merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling or direct coupling or communication connection may be through some interfaces; the indirect coupling or communication connection of the system or unit may be electrical, mechanical, or other forms.

[0136] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0137] Furthermore, the functional units in the various embodiments of this disclosure can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in a combination of hardware and software functional units.

[0138] The integrated units implemented as software functional units described above can be stored in a computer-readable storage medium. These software functional units, stored in a storage medium, include several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute some steps of the methods of the various embodiments of this disclosure. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0139] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional modules is merely an example. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the system can be divided into different functional modules to complete all or part of the functions described above. The specific working process of the system described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0140] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0141] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A data acquisition method, characterized by, An industrial control computer applied to a contour scanning system, the method comprising: In response to the target contour acquisition range setting command, the target contour acquisition range of the measured object is set. The target contour acquisition range is transmitted to the contour scanner in the contour scanning system so that the contour scanner can acquire the contour of the object under test and store the original two-dimensional contour image of each row in the target contour acquisition range into the storage unit of the contour scanner. Receive the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner.

2. The method of claim 1, wherein, After receiving the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner, the method further includes: In response to the parameter setting instruction for the target row in the target contour acquisition range, the processing parameter information corresponding to the target row is set; The original two-dimensional contour image of the target row is processed using the processing parameter information corresponding to the target row, and the processing result is displayed on the industrial control computer screen.

3. The method of claim 2, wherein, After receiving the original two-dimensional contour image of each row in the target contour acquisition range transmitted by the contour scanner, the method further includes: Based on the original two-dimensional contour image of each row of the target contour acquisition range, the image is processed using preset processing parameters to generate a first point cloud image of the target contour acquisition range, which is then displayed in the first display window of the industrial control computer screen. Accordingly, the step of setting the processing parameter information corresponding to the target row in response to the parameter setting instruction for the target row in the target contour acquisition range includes: In response to a target row selection instruction based on the first point cloud image, the target row is determined; In response to the parameter setting instructions in the parameter configuration window of the target row, the processing parameter information corresponding to the target row is set.

4. The method of claim 3, wherein, After determining the target row, the process further includes: The original two-dimensional contour image of the target row is displayed in the second display window of the industrial control computer screen; Accordingly, displaying the processing results on the industrial control computer screen includes: The original two-dimensional contour image of the target row displayed in the second display window is updated to the processed two-dimensional contour image of the target.

5. The method according to claim 3, characterized in that, The method further includes: In response to a refresh command for the first display window, the original two-dimensional contour image of each row of the target contour acquisition range is processed using the processing parameter information corresponding to the target row to generate a second point cloud image of the target contour acquisition range. Update the first point cloud image displayed in the first display window to the second point cloud image.

6. The method according to claim 2, characterized in that, The step of setting processing parameter information corresponding to the target row in response to the parameter setting instruction for the target row within the target contour acquisition range includes: In response to the instruction to divide the target contour acquisition range into regions, the target contour acquisition range is divided into multiple regions; In response to the parameter setting command for the target row in each region, the processing parameter information corresponding to the target row in each region is set.

7. The method according to claim 1, characterized in that, The step of setting the target contour acquisition range in response to the target contour acquisition range setting command includes: Acquire the initial point cloud image or depth image obtained by the contour scanner from the contour acquisition of the object under test, and display the initial point cloud image or depth image in the third display window of the industrial control computer screen; In response to a target contour acquisition range setting instruction based on the initial point cloud image or depth image, the target contour acquisition range of the measured object is set, and the target contour acquisition range is displayed in the initial point cloud image or depth image.

8. The method according to claim 6, characterized in that, The method further includes: When the contour scanner acquires the contour of the object being measured, the acquisition position is displayed in real time in the third display window.

9. The method according to claim 1, characterized in that, After setting the target contour acquisition range of the object being measured, the method also includes: If it is determined that the object under test has moved relative to the platform, then the starting row of the target contour acquisition range is set as the starting scanning position of the contour scanner. Accordingly, transmitting the target contour acquisition range to the contour scanner in the contour scanning system includes: The target number of rows and the starting row of the target contour acquisition range are transmitted to the contour scanner so that after the user aligns the starting row of the target contour acquisition range of the object under test to the starting scanning position of the contour scanner, the contour scanner stores the original two-dimensional contour image of the target number of rows into the storage unit starting from the starting row of the target contour acquisition range.

10. The method according to claim 1, characterized in that, The method further includes: In response to an application instruction for processing parameter information, the processing parameter information is transmitted to the contour scanner, so that the contour scanner, during the contour acquisition process of the measured object, processes the original two-dimensional contour image of the target contour acquisition range using the processing parameter information to obtain the third contour data of the measured object.

11. The method according to claim 1, characterized in that, The method further includes: In response to the export instruction for processing parameter information, a file including the processing parameter information is generated.

12. A data acquisition method, characterized in that, A contour scanner applied in a contour scanning system, the method comprising: The industrial control computer receives the target contour acquisition range of the object being measured from the contour scanner. The contour of the object under test is acquired starting from the initial scanning position of the contour scanner, and when the target contour acquisition range is reached, the original two-dimensional contour image of each row in the target contour acquisition range is stored in the storage unit of the contour scanner. The original two-dimensional contour image of each row in the target contour acquisition range is transmitted to the industrial control computer.

13. A contour scanner, characterized in that, Includes storage units; The contour scanner is used for contour acquisition and stores the original two-dimensional contour image of each row in the acquired target contour acquisition range into the storage unit.

14. The contour scanner according to claim 13, characterized in that, The contour scanner is also used to transmit the original two-dimensional contour image of each row in the target contour acquisition range to the industrial control computer.

15. An electronic device, characterized in that, include: A processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the method as described in any one of claims 1-12.

16. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the method described in any one of claims 1-12.

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