A chip characteristic detection device and method

Abstract

This invention discloses a chip characteristic testing device and method, relating to the field of chip testing technology. The device includes a testing circuit board, an external power supply module, a toggle switch module, a signal conditioning circuit, a high-low temperature chamber, and a paperless recorder. The testing circuit board is used to perform characteristic testing on a target chip according to a set test mode. The testing circuit board has at least two chip adapter interfaces for individual and collaborative chip characteristic testing. The external power supply module is electrically connected to the testing circuit board. The toggle switch module is located on the testing circuit board and is used to switch test modes. The signal conditioning circuit is integrated on the testing circuit board, with its input terminal electrically connected to the target chip adapter interface, for receiving and conditioning the output signal. The high-low temperature chamber houses the testing circuit board and the target chip under test, simulating the actual operating temperature environment. The paperless recorder is electrically connected to the output interface of the testing circuit board for real-time acquisition and recording of the conditioned electrical signal.

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