A contact resistance detection method and device, electronic equipment and storage medium
By automatically calculating contact resistance and utilizing signal excitation and impedance analysis modules, the problems of wasted resources and interference in manual testing are solved, achieving efficient and reliable contact resistance testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN YANMADE TECH CO LTD
- Filing Date
- 2026-04-03
- Publication Date
- 2026-06-12
AI Technical Summary
In existing technologies, contact resistance testing relies on manual inspection, which leads to resource waste and the test results are easily affected by human intervention, making it difficult to generate accurate contact resistance test results efficiently.
The excitation signal at the target frequency is generated by the control signal excitation module, the total impedance and capacitive reactance are determined by the impedance analysis module, the contact resistance is automatically calculated by combining the predefined resistance model, and a detection message is generated when the value exceeds the preset value.
It enables automated contact resistance detection without manual intervention, improving detection efficiency and reliability, reducing detection time, and ensuring the stability and accuracy of detection results.
Smart Images
Figure CN122193703A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of resistance detection technology, and in particular to a contact resistance detection method, apparatus, electronic device and storage medium. Background Technology
[0002] In the process of automated testing of components, when the contact resistance between the probe and the device under test increases, it will cause problems such as large deviation of test data and decreased test stability. Therefore, it is necessary to detect the contact resistance.
[0003] However, in the existing technology, the detection of contact resistance mostly relies on manual inspection. Manual inspection consumes a lot of human and time resources, increases the time for generating contact resistance test results, and is easily affected by human intervention. Therefore, how to generate contact resistance test results is a technical problem that urgently needs to be solved. Summary of the Invention
[0004] This application provides a contact resistance detection method, apparatus, electronic device, and storage medium to solve the aforementioned technical problem of how to generate contact resistance detection results.
[0005] In a first aspect, embodiments of this application provide a contact resistance detection method applied to electronic devices, the contact resistance detection method comprising: The control signal excitation module generates an excitation signal at the target frequency; An excitation signal of the target frequency is applied to the device under test through a probe in the test circuit. Based on the impedance analysis module, the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency are determined. Based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. Determine if the contact resistance is greater than the preset resistance. If the contact resistance is greater than the preset resistance, generate a contact resistance detection message.
[0006] In one possible implementation of the first aspect, the control signal excitation module generates an excitation signal at a target frequency, comprising: A frequency control command is sent to the signal excitation module, which then outputs an excitation signal at the target frequency according to the command.
[0007] In one possible implementation of the first aspect, determining the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency, based on the impedance analysis module, includes: Acquire the response signal of the test circuit and input the response signal of the test circuit into the impedance analysis module; The impedance analysis module generates the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency.
[0008] In one possible implementation of the first aspect, determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, includes: Determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, read the abnormal contact resistance message from the first text and read the abnormal contact resistance message from the second text. The message indicating abnormal contact resistance and the message indicating that the probes in the test circuit need to be cleaned are packaged together to generate a contact resistance detection message.
[0009] In one possible implementation of the first aspect, the resistance model is defined as follows: ; This indicates the contact resistance between the probe and the device under test in the test circuit; This represents the capacitive reactance of the device under test under a target frequency excitation signal. This represents the total impedance of the test circuit under an excitation signal at the target frequency.
[0010] In one possible implementation of the first aspect, after determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, the contact resistance detection method includes: The contact resistance detection message is pushed to the operator's host computer, which displays the contact resistance detection message to prompt the operator to clean the probes of the test circuit.
[0011] In one possible implementation of the first aspect, after the contact resistance detection message is pushed to the operator's host computer, which displays the contact resistance detection message to prompt the operator to clean the probes of the test circuit, the contact resistance detection method includes: The contact resistance detection messages are stored in the database.
[0012] Secondly, embodiments of this application provide a contact resistance detection device, applied to electronic devices, comprising: The control module is used to control the signal excitation module to generate an excitation signal at the target frequency; The application module is used to apply an excitation signal of the target frequency to the device under test through a probe in the test circuit; The determination module is used to determine the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency, based on the impedance analysis module. The generation module is used to generate the contact resistance between the probe and the device under test in the test circuit based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and a predefined resistance model. The detection module is used to determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated.
[0013] Thirdly, embodiments of this application provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the contact resistance detection method described in the first aspect above.
[0014] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the contact resistance detection method described in the first aspect above.
[0015] Fifthly, embodiments of this application provide a computer program product that, when run on an electronic device, causes the electronic device to execute the contact resistance detection method described in the first aspect.
[0016] The beneficial effects of the embodiments of this application are as follows: Firstly, based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. It is then determined whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated. Since no manual detection is required, the generation time of the contact resistance detection message is reduced, which is beneficial to improving the generation efficiency of the contact resistance detection message. Secondly, since the contact resistance detection message is automatically generated, it is not affected by human intervention, which helps to improve the reliability and stability of the contact resistance detection message. Attached Figure Description
[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0018] Figure 1 This is an application scenario diagram of the contact resistance detection method provided in the embodiments of this application; Figure 2 This is a schematic flowchart of the contact resistance detection method provided in the embodiments of this application; Figure 3 A flowchart illustrating the implementation of S203 provided in this application embodiment; Figure 4 A schematic block diagram of a contact resistance detection device provided in an embodiment of this application; Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation
[0019] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.
[0020] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.
[0021] It should be understood that in the description of this application and the appended claims, the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance. The terms "comprising," "including," "having," and their variations all mean "including but not limited to," unless otherwise specifically emphasized.
[0022] Furthermore, the technical solutions of the various embodiments can be combined with each other, but only if they are based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed in this application.
[0023] The flowchart shown in the attached diagram is for illustrative purposes only and does not necessarily include all content and operations / steps, nor does it necessarily have to be performed in the order described. For example, some operations / steps can be broken down, combined, or partially merged, so the actual execution order may change depending on the actual situation.
[0024] The contact resistance detection method provided in this application can be applied to electronic devices, including but not limited to servers, mobile phones, tablets, wearable devices, vehicle-mounted devices, and laptops. This application does not impose any restrictions on the specific type of electronic device.
[0025] Please see Figure 1 , Figure 1 The application scenario diagram of the contact resistance detection method provided in the embodiments of this application is described in detail below: Electronic devices are connected to a test circuit, and probes in the test circuit are connected to the device under test.
[0026] The test circuit includes independent circuits for multiple capacitance ranges of 0.05μF, 0.1μF, 0.2μF, 0.3μF, 0.4μF, and 1.2μF, enabling precise parameter matching for devices under test with different capacitance values. This ensures stable excitation signal transmission and optimal test circuit operation within each capacitance range, effectively improving overall test accuracy and measurement consistency, and meeting the automated testing requirements for a wide range of capacitive devices.
[0027] In this embodiment, the electronic device is connected to the test circuit, which in turn is connected to the device under test. This enables stable transmission of the excitation signal and reliable acquisition of the test signal, effectively separating the control, excitation, testing and detection functions. This simplifies the system structure and improves the anti-interference capability of the signal transmission.
[0028] Please see Figure 2 , Figure 2 This is a schematic flowchart of the contact resistance detection method provided in the embodiments of this application, which can be applied to electronic devices.
[0029] like Figure 2 As shown, the contact resistance detection method provided in this application includes the following steps, which are detailed below: S201, The control signal excitation module generates an excitation signal at the target frequency; The control signal excitation module generates an excitation signal at the target frequency, including: A frequency control command is sent to the signal excitation module, which then outputs an excitation signal at the target frequency according to the command.
[0030] The signal excitation module is located within the electronic device.
[0031] S202, through the probe in the test circuit, applies an excitation signal of the target frequency to the device under test; Among them, the devices under test are mainly capacitor-type electronic components, including but not limited to ceramic capacitors, film capacitors, electrolytic capacitors, and chip capacitors, which are electronic components with different capacitance values.
[0032] Applying a target frequency excitation signal to the device under test (DUT) enables the test circuit to operate at the point of highest measurement accuracy and most stable signal, making the electrical characteristics of the DUT more apparent, reducing errors caused by external interference and parasitic parameters, thereby improving the measurement accuracy and stability of the test circuit.
[0033] The target frequency refers to the signal frequency that is pre-set to be most suitable for measuring impedance and capacitance parameters based on the type, capacitance value, and test requirements of the device under test, ensuring a good match between the test circuit and the device under test.
[0034] S203, based on the impedance analysis module, determines the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency; The impedance analysis module is the core electrical parameter calculation unit of the entire test system, used to perform real-time calculations and processing on the received excitation and feedback signals. Based on the characteristics of voltage, current, and other signals in the test circuit, this module can accurately calculate and output key parameters such as the total impedance of the circuit and the capacitive reactance of the device under test, providing fundamental data for contact resistance calculation and device characteristic analysis.
[0035] S204, based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, generate the contact resistance between the probe in the test circuit and the device under test. The resistance model is defined as follows: ; This indicates the contact resistance between the probe and the device under test in the test circuit; This represents the capacitive reactance of the device under test under a target frequency excitation signal. This represents the total impedance of the test circuit under an excitation signal at the target frequency.
[0036] S205, determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, generate a contact resistance detection message.
[0037] The step of determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, includes: Determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, read the abnormal contact resistance message from the first text and read the abnormal contact resistance message from the second text. The message indicating abnormal contact resistance and the message indicating that the probes in the test circuit need to be cleaned are packaged together to generate a contact resistance detection message.
[0038] By packaging abnormal contact resistance warnings and probe cleaning information from the test circuit into a single contact resistance detection message, operators can quickly pinpoint the root cause of poor contact and receive clear instructions for handling the issue. This allows maintenance operations to be performed without additional analysis or judgment, effectively shortening fault response time and improving the maintenance efficiency of the test system.
[0039] The content of contact resistance detection messages can be quite complex. For ease of explanation, an example is provided below: For example, the contact resistance detection message is: the contact resistance is outside the normal range, the contact condition is abnormal, please clean the probes of the test circuit in time.
[0040] For example, the contact resistance detection message is: "Contact resistance is abnormally high, which may be due to probe contamination. Please clean the probes in the test circuit."
[0041] For example, the contact resistance detection message is: the contact resistance exceeds the threshold, the contact state is unstable, please check and clean the probes of the test circuit in time.
[0042] For example, the contact resistance detection message is: "Contact resistance is abnormal. To ensure test accuracy, the probes in the circuit need to be tested before continuing the test."
[0043] Wherein, after determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, the contact resistance detection method includes: The contact resistance detection message is pushed to the operator's host computer, which displays the contact resistance detection message to prompt the operator to clean the probes of the test circuit.
[0044] The system pushes the contact resistance detection message to the operator's host computer, which displays the contact resistance detection message. This allows the system and the operator to monitor the contact status between the probe and the device under test in real time, promptly identify abnormalities such as probe contamination, wear, and poor contact, and facilitate quick cleaning, adjustment, or replacement operations. This avoids problems such as distorted test data and decreased measurement accuracy caused by abnormal contact resistance, thereby ensuring a stable and reliable testing process for the device under test.
[0045] The contact resistance detection method includes the following steps: After the contact resistance detection message is pushed to the operator's host computer, which displays the message to prompt the operator to clean the probes in the test circuit, the contact resistance detection method includes: The contact resistance detection messages are stored in the database.
[0046] The detection messages of contact resistance are stored in a database. The database can be used to statistically analyze the detection messages of contact resistance to determine how often the probes of the test circuit need to be cleaned or replaced, thus preventing failures in advance.
[0047] The beneficial effects of the embodiments of this application are as follows: Firstly, based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. It is then determined whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated. Since no manual detection is required, the generation time of the contact resistance detection message is reduced, which is beneficial to improving the generation efficiency of the contact resistance detection message. Secondly, since the contact resistance detection message is automatically generated, it is not affected by human intervention, which helps to improve the reliability and stability of the contact resistance detection message.
[0048] Please see Figure 3 , Figure 3 The implementation flowchart of S203 provided in the embodiments of this application is described in detail below: S301, acquires the response signal of the test circuit and inputs the response signal of the test circuit into the impedance analysis module; S302 generates the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency through the impedance analysis module.
[0049] In this embodiment, the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency are generated by the impedance analysis module. This allows for the acquisition of complete circuit electrical parameters within a unified measurement framework, which can accurately reflect the overall transmission characteristics of the test circuit and also separate the capacitive parameters of the device under test itself.
[0050] For the contact resistance detection method described in the above embodiments, please refer to [link / reference]. Figure 4 , Figure 4 This is a schematic block diagram of the contact resistance detection device provided in the embodiments of this application. Figure 4 The contact resistance detection device 400 shown can be applied to, for example... Figure 1 The application scenario diagram shows electronic devices. The following section uses electronic devices as an example to illustrate this. Figure 4 The contact resistance detection device 400 shown will be described in detail. The contact resistance detection device 400 may include a control module 401, an application module 402, a determination module 403, a generation module 404, and a detection module 405.
[0051] The control module 401 is used to control the signal excitation module to generate an excitation signal of the target frequency; The application module 402 is used to apply an excitation signal of the target frequency to the device under test through a probe in the test circuit; The determination module 403 is used to determine the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency, based on the impedance analysis module. The generation module 404 is used to generate the contact resistance between the probe and the device under test in the test circuit based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and a predefined resistance model. The detection module 405 is used to determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated.
[0052] It should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.
[0053] The beneficial effects of the embodiments of this application are as follows: Firstly, based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. It is then determined whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated. Since no manual detection is required, the generation time of the contact resistance detection message is reduced, which is beneficial to improving the generation efficiency of the contact resistance detection message. Secondly, since the contact resistance detection message is automatically generated, it is not affected by human intervention, which helps to improve the reliability and stability of the contact resistance detection message.
[0054] Please see Figure 5 , Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.
[0055] like Figure 5 As shown, Figure 5 The electronic device includes: at least one processor 20, a memory 21, and a computer program 22 stored in the memory 21 and executable on the at least one processor 20, wherein the processor 20 executes the computer program 22 to implement the steps in any of the above method embodiments.
[0056] The electronic device may include, but is not limited to, processor 20 and memory 21. Those skilled in the art will understand that... Figure 5 This is merely an example of an electronic device and does not constitute a limitation on electronic devices. It may include more or fewer components than shown in the illustration, or combinations of certain components, or different components. For example, it may also include input / output devices, network access devices, etc.
[0057] The processor 20 is used to run a computer program 22 stored in the memory 21, and performs the following steps when executing the computer program 22: The control signal excitation module generates an excitation signal at the target frequency; An excitation signal of the target frequency is applied to the device under test through a probe in the test circuit. Based on the impedance analysis module, the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency are determined. Based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. Determine if the contact resistance is greater than the preset resistance. If the contact resistance is greater than the preset resistance, generate a contact resistance detection message.
[0058] The processor 20 may be a central processing unit (CPU), or it may be other general-purpose processors, digital signal processors, field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor.
[0059] In some embodiments, the memory 21 may be an internal storage unit of the electronic device, such as a hard disk or memory. In other embodiments, the memory 21 may be an external storage device of the electronic device, such as a plug-in hard disk, SmartMediaCard (SMC), SecureDigital (SD) card, or FlashCard.
[0060] Furthermore, the memory 21 may include both internal storage units and external storage devices of the electronic device. The memory 21 is used to store the operating system, applications, boot loader, data, and other programs, such as the program code of the computer program. The memory 21 can also be used to temporarily store data that has been output or will be output.
[0061] It should be noted that the information interaction and execution process between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.
[0062] This application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps described in the various method embodiments above.
[0063] The computer-readable storage medium may also be an external storage device of the contact resistance detection device or electronic device, such as a plug-in hard drive, smart media card (SMC), secure digital (SD) card, flash card, or non-transitory computer-readable storage medium equipped on the contact resistance detection device or electronic device.
[0064] Since the computer program stored in the computer-readable storage medium can execute any of the contact resistance detection methods provided in the embodiments of this application, the computer-readable storage medium can achieve the beneficial effects that any of the contact resistance detection methods provided in the embodiments of this application can achieve, as detailed in the preceding embodiments, and will not be repeated here.
[0065] This application provides a computer program product that, when run on an electronic device, causes the electronic device to perform the aforementioned contact resistance detection method.
[0066] When a computer program is loaded into an electronic device, it can perform the following steps: The control signal excitation module generates an excitation signal at the target frequency; An excitation signal of the target frequency is applied to the device under test through a probe in the test circuit. Based on the impedance analysis module, the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency are determined. Based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. Determine if the contact resistance is greater than the preset resistance. If the contact resistance is greater than the preset resistance, generate a contact resistance detection message.
[0067] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium.
[0068] Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium includes: an entity or device for carrying computer program code to an electronic device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium.
[0069] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.
[0070] The above are merely preferred embodiments of this application and do not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.
Claims
1. A method for detecting contact resistance, characterized in that, The contact resistance detection method, applied to electronic devices, includes: The control signal excitation module generates an excitation signal at the target frequency; An excitation signal of the target frequency is applied to the device under test through a probe in the test circuit. Based on the impedance analysis module, the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency are determined. Based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and the predefined resistance model, the contact resistance between the probe in the test circuit and the device under test is generated. Determine if the contact resistance is greater than the preset resistance. If the contact resistance is greater than the preset resistance, generate a contact resistance detection message.
2. The contact resistance detection method according to claim 1, characterized in that, The control signal excitation module generates an excitation signal at the target frequency, including: A frequency control command is sent to the signal excitation module, which then outputs an excitation signal at the target frequency according to the command.
3. The contact resistance detection method according to claim 1, characterized in that, The impedance analysis module determines the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency, including: Acquire the response signal of the test circuit and input the response signal of the test circuit into the impedance analysis module; The impedance analysis module generates the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency.
4. The contact resistance detection method according to claim 1, characterized in that, The step of determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, includes: Determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, read the abnormal contact resistance message from the first text and read the abnormal contact resistance message from the second text. The message indicating abnormal contact resistance and the message indicating that the test circuit probes need to be cleaned are packaged together to generate a contact resistance detection message.
5. The contact resistance detection method according to claim 1, characterized in that, The resistance model is defined as follows: ； This indicates the contact resistance between the probe and the device under test in the test circuit; This represents the capacitive reactance of the device under test under a target frequency excitation signal. This represents the total impedance of the test circuit under an excitation signal at the target frequency.
6. The contact resistance detection method according to claim 1, characterized in that, After determining whether the contact resistance is greater than a preset resistance, and generating a contact resistance detection message when the contact resistance is greater than the preset resistance, the contact resistance detection method includes: The contact resistance detection message is pushed to the operator's host computer, which displays the contact resistance detection message to prompt the operator to clean the probes of the test circuit.
7. The contact resistance detection method according to claim 6, characterized in that, After the contact resistance detection message is pushed to the operator's host computer, which displays the message to prompt the operator to clean the probes of the test circuit, the contact resistance detection method includes: The contact resistance detection messages are stored in the database.
8. A contact resistance detection device, characterized in that, Applied to electronic devices, including: The control module is used to control the signal excitation module to generate an excitation signal at the target frequency; The application module is used to apply an excitation signal of the target frequency to the device under test through a probe in the test circuit; The determination module is used to determine the total impedance of the test circuit under the excitation signal at the target frequency and the capacitive reactance of the device under test under the excitation signal at the target frequency, based on the impedance analysis module. The generation module is used to generate the contact resistance between the probe and the device under test in the test circuit based on the total impedance of the test circuit under the excitation signal at the target frequency, the capacitive reactance of the device under test under the excitation signal at the target frequency, and a predefined resistance model. The detection module is used to determine whether the contact resistance is greater than the preset resistance. When the contact resistance is greater than the preset resistance, a contact resistance detection message is generated.
9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the contact resistance detection method as described in any one of claims 1 to 7.
10. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements the contact resistance detection method as described in any one of claims 1 to 7.