A semiconductor device machine hand life prediction method
By dynamically collecting motion parameters of the robotic arm joints and utilizing multidimensional feature vectors and long short-term memory network models, the problem of accurate life prediction for semiconductor equipment robotic arms was solved, achieving precise life prediction, reducing equipment failure risks, and improving the reliability and efficiency of equipment operation.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NINGBO RUNHUA QUANXIN MICROELECTRONICS EQUIP CO LTD
- Filing Date
- 2026-05-18
- Publication Date
- 2026-06-12
AI Technical Summary
Existing methods for predicting the lifespan of semiconductor equipment robotic arms cannot accurately predict their actual lifespan, leading to unplanned equipment downtime and economic losses. Furthermore, traditional methods cannot meet the requirements of the semiconductor manufacturing industry for equipment operating efficiency and reliability.
By dynamically collecting motion parameters of the robotic arm joints and extracting multidimensional feature vectors, using Mahalanobis distance to map health indicators, and combining state-space models and long short-term memory network models, the remaining service life of the robotic arm is predicted. By integrating physical baseline lifespan and environmental data, accurate lifespan prediction is achieved.
It enables accurate prediction of the lifespan of robotic arms, reduces economic losses caused by equipment failure, improves the reliability and efficiency of equipment operation, adapts to dynamic correlation under complex working conditions, and enhances the reliability and accuracy of prediction results.
Smart Images

Figure CN122197657A_ABST