An IO board card automatic testing method, device, storage medium and electronic terminal
By using an automated testing system and a relay array switching device, the problem of uniformity in the IO board testing platform was solved, enabling full-function automated testing of different types of IO boards, improving testing efficiency and repeatability, and ensuring product quality consistency.
Patent Information
- Application Number
- CN202610504914.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-16
- Publication Date
- 2026-06-26
Smart Images
Figure CN122283397A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of power system testing technology, and particularly relates to an automated testing method, device, storage medium and electronic terminal for I / O boards. Background Technology
[0002] Power system control and protection devices are core secondary equipment ensuring the safe and stable operation of the power grid, and their reliability directly affects the power supply quality. These devices typically adopt a modular, plug-in structure design, in which input / output (IO) boards play a crucial role as a bridge between the device and primary equipment and secondary circuits. IO boards mainly include two categories: digital input / output (DI / DO) and analog input / output (AI / AO). DI boards are used to collect digital status information such as circuit breaker position and alarm signals; DO boards are used to issue trip / close commands or drive indicator lights; AI boards are responsible for converting high-voltage analog signals from instrument transformers into low-voltage digital signals for protection control logic calculations; and AO boards are used to output 4-20mA analog signals to control external devices.
[0003] During the R&D phase, comprehensive functional testing of I / O boards is a crucial step in verifying the correctness of hardware design and ensuring product quality. However, existing testing methods face a significant problem: the terminal layouts, signal types, and definitions of I / O boards vary greatly across different engineering projects and protection functions. For example, the input voltage levels of DI boards may differ from 24V, 48V, 110V, to 220V, and the common terminal definitions also vary; the contact types of DO boards may be single-point or multi-point; and the input range of AI boards may be 0~5V or 4~20mA. This diversity in terminal definitions directly leads to testers needing to maintain a dedicated set of test cables and adapters for each type of board. This results in cumbersome test platform setup, frequent plugging and unplugging that can damage connectors, poor test repeatability, and difficulty in automating testing, severely hindering R&D efficiency and product iteration speed.
[0004] Several solutions for automated testing of circuit boards exist in the existing technology. For example, a "Relay-based Multi-Signal Testing System" (CN2024112347180) uses an array switch module to achieve 4×128 signal switching functionality, controlling the circuit switching via relays to match test signals with test points. Another "Multi-Signal Point Switching Circuit" (CN2023215422803) uses a pyramid-shaped relay array layout, controlling the relays via FPGA to achieve automatic switching between multiple test points, improving testing efficiency. Regarding configuration management, a patent relates to a "Port Function Definition Method" (CN2023106793852), which uses a host computer to generate port setting commands based on a preset port configuration table, enabling customized settings of hardware board port functions. Another patent, "Instrument Test Board Configuration Method for Multiple Communication Protocols" (CN2012101022004), uses XML file format to store board and channel configuration information, resolving board configuration conflict issues. In addition, the "Board Testing Method, Apparatus, Computer Equipment and Storage Medium" (CN2024100785354) proposes to determine test cases based on board information to achieve flexible test combinations.
[0005] However, the aforementioned existing technologies either only address single-type signal testing or fail to achieve fully automated testing of I / O boards based on board information. Therefore, developing a fully automated testing method for I / O boards that can unify test schemes and improve test repeatability and efficiency has significant practical engineering value. Summary of the Invention
[0006] The purpose of this invention is to overcome the shortcomings of the prior art and provide an automated testing method, device, storage medium and electronic terminal for I / O boards, which is compatible with multiple I / O types and terminal definitions, unifies the testing process for four types of I / O boards (DI / DO / AI / AO), and improves testing efficiency.
[0007] To achieve the above objectives, the present invention is implemented using the following technical solution:
[0008] In a first aspect, the present invention provides an automated testing method for I / O boards, which employs a pre-built automated testing system, the automated testing system including a host computer, a relay array switching device, a standardized interface, and testing instruments; The standardized interface is connected between the relay array switching device and the I / O board under test. It has multiple pins with fixed and different pin definitions. Each pin is electrically connected to a physical terminal block with different definitions on the I / O board under test based on the same test cable. The testing method is applied to the host computer and includes the following steps: Obtain the physical terminal definition information and channel type of each channel of the I / O board under test; Based on the physical terminal definition information, the relay array switching device performs relay array switching to establish a connection between the I / O board under test and the designated test instrument. Configure the output signal or range of the specified test instrument according to the channel type, and control the configured test instrument to test the IO board under test and output the test results.
[0009] Optionally, obtaining the physical terminal definition information and channel type of each channel of the I / O board under test includes: loading and parsing the test configuration file of the I / O board under test; wherein the physical terminal definition information and channel type of each channel are carried by the test configuration file, and the test configuration file also includes the physical terminal number, the channel number of each channel, and the test items and their pass / fail criteria for the corresponding channel.
[0010] Optionally, establishing the connection between the I / O board under test and the designated test instrument includes: selecting pins with consistent physical terminal definitions on the standardized interface according to the terminal definition information, controlling the on / off state of the corresponding relays inside the relay array switching device, and connecting the designated test instrument to the corresponding pins.
[0011] Optionally, the testing instrument includes at least an adjustable DC voltage source, a standard analog source, and a digital multimeter.
[0012] Optionally, the channel types include digital input (DI), digital output (DO), analog input (AI), and analog output (AO); The step of configuring the output signal or range of the specified test instrument according to the channel type includes: The adjustable DC voltage source is controlled to output a test excitation signal to the DI channel of the I / O board under test; The standard analog signal source is controlled to output a test excitation signal to the AI channel of the I / O board under test; Control the digital multimeter to output test values to the DO or AO channel of the I / O board under test, and set the digital multimeter to measurement mode.
[0013] Optionally, the controlled and configured test instrument performs tests on the I / O board under test, including: For the DI channel, the adjustable DC voltage source is controlled to gradually increase the output voltage from 0V to the rated voltage, and the voltage value is collected when the internal logic state of the IO board under test is flipped. For the DO channel, control the output switch signal of the IO board under test, and collect the contact resistance value measured by the digital multimeter; For the AI channel, control the standard analog source to output standard voltage or current, and collect the digitized sampled value of the IO board under test; For the AO channel, control the output of the analog signal of the IO board under test, and collect the output value measured by the digital multimeter.
[0014] Optionally, the output test results include: Collect the response data of the I / O board under test to the test excitation signal, or read the measurement data collected by the test instrument; The response data or measurement data is compared with the preset corresponding pass / fail criteria to determine whether each channel test is qualified. Generate a formatted test report based on the test results of all channels.
[0015] Secondly, the present invention provides an automated testing device for I / O boards, which adopts a pre-built automated testing system, the automated testing system including a host computer, a relay array switching device, a standardized interface and testing instruments; The standardized interface is connected between the relay array switching device and the I / O board under test. It has multiple pins with fixed and different pin definitions. Each pin is electrically connected to a physical terminal block with different definitions on the I / O board under test based on the same test cable. The testing device is applied to a host computer and includes the following modules: Test configuration information acquisition module: used to acquire the physical terminal definition information of the I / O board under test and the channel type of each channel; Test environment setup module: used to switch the relay array of the relay array switching device according to the physical terminal definition information, and establish the connection between the I / O board under test and the specified test instrument; Test condition configuration module: Used to configure the output signal or range of the specified test instrument according to the channel type, and control the configured test instrument to test the IO board under test and output the test results.
[0016] Thirdly, the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, it implements an automated testing method for an I / O board as described in any of the first aspects.
[0017] Fourthly, the present invention provides an electronic terminal, including a processor and a memory connected to the processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the steps of the automated testing method for an I / O board as described in any of the first aspects are performed.
[0018] Compared with existing technologies, the beneficial effects achieved by this invention are as follows: By introducing key test configuration information to describe the channel type and terminal definition information of the I / O board under test, combined with the structure of a standardized interface with multiple physical terminal definitions and different pins, and utilizing a relay array switching device to achieve flexible connection between the test instrument and the board terminals, "one cable adapts to one type of terminal," realizing automatic reconfiguration of hardware connections, and automatically configuring the output signal or range of the test instrument according to the channel type, thereby unifying the test process for four types of I / O boards (DI / DO / AI / AO), realizing full-function automated testing of I / O boards, eliminating the need to customize dedicated cables for each board, reducing manual intervention, improving test efficiency and repeatability, ensuring product quality consistency, and significantly improving the level of test automation in the R&D stage; for AI / AO boards, automatic accuracy testing can be achieved; for DI boards, automatic input action threshold testing can be achieved; and for DO boards, automatic recalibration checking of relay action status can be achieved. Attached Figure Description
[0019] Figure 1 The diagram shown is a structural block diagram of an automated testing system according to one embodiment of the present invention.
[0020] Figure 2 The diagram shown is a flowchart of an automated testing method for an I / O board in one embodiment of the present invention.
[0021] Figure 3 The diagram shown illustrates the connection relationship between the relay array switching device and the standardized interface in one embodiment of the present invention.
[0022] Figure 4 The diagram shown is a schematic diagram of the DI board test circuit in one embodiment of the present invention;
[0023] Figure 5 The diagram shown is a schematic diagram of the AO board test circuit in one embodiment of the present invention. Detailed Implementation
[0024] The present invention will be further described below with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and should not be used to limit the scope of protection of the present invention.
[0025] Example 1
[0026] like Figure 1 As shown, this embodiment provides an automated testing system for I / O boards. The testing system includes a host computer control unit, a relay array switching device, a standardized interface, testing instruments, and the I / O board under test.
[0027] The host computer control unit is the core of the entire system, integrating multiple functional modules, including a configuration file parsing module, a relay array control module, a test control module, a data acquisition module, and a report generation module. The host computer control unit is connected to the relay array switching device and the test instruments via a communication bus (such as LAN or UART).
[0028] The testing instruments include:
[0029] Adjustable DC voltage source: Controlled by the host computer control unit, it is used to output a variable DC voltage to the DI channel to test the input action threshold;
[0030] Standard analog signal source: controlled by the host computer control unit, used to output standard voltage or current to the AI channel to test conversion accuracy;
[0031] Digital multimeter: Controlled by the host computer control unit, used to measure the on / off status of the contacts of the DO channel and the analog output values (voltage or current) of the AO channel.
[0032] The relay array switching device is an M×N array composed of multiple relays (M is the number of input instrument signals, and N is the number of pins in the standardized interface). Its control terminal connects to the host computer control unit, its signal input terminal connects to the signal lines of each test instrument (including positive and negative / common terminals), and its signal output terminal connects to the I / O board under test via a standardized interface, such as... Figure 3 As shown.
[0033] The standardized interface has multiple pins with fixed pin definitions, which are electrically connected to the various physical terminal blocks defined on the I / O board under test via a single test cable. Regardless of whether the board under test is a DI board or an AO board, and regardless of the definition of its panel terminals, it is connected to the system through the same standard test cable, achieving the design goal of "one cable adapting to all types of boards".
[0034] This embodiment uses a 21-channel digital input (DI) board as an example, combined with... Figure 2 and Figure 4 This paper details the implementation process of the automated testing method for the I / O board using this automated testing system. The rated input voltage of this I / O board is 110V, and each input requires two physical connection points: a signal input terminal (e.g., terminal 5) and a common terminal (e.g., terminal 22).
[0035] Step S1: Obtain and parse the test configuration file
[0036] Based on the hardware design drawings of the DI board, the testers created a test configuration file in XML format. This file contains information such as the channel type, physical terminal definitions (signal terminals and common terminals), test items, and pass / fail criteria for each channel. According to the technical specifications, the input threshold requirement is ≥70% of the rated voltage (i.e., ≥77V), and the reset threshold requirement is ≤55% of the rated voltage (i.e., ≤60.5V). An example configuration is as follows:
[0037] <iocardtestconfig cardtype="DI_110V"> <channellist> <channel num="5" type="DI" terminal="5,22"> <!-- Terminal attribute format: signal terminal, common terminal <testitem name="ActionThreshold"> <actionvalue> 77.0< / actionvalue> <!-- Action value threshold (V), corresponding to 70% rated voltage --> <returnvalue> 60.5< / returnvalue> <!-- Return value threshold (V), corresponding to 55% rated voltage --> < / testitem> < / channel> <channel num="6" type="DI" terminal="6,22"> <testitem name="ActionThreshold"> <actionvalue> 77.0< / actionvalue> <returnvalue> 60.5< / returnvalue> < / testitem> < / channel> <!-- The configurations of the remaining channels are omitted. --> < / channellist> < / iocardtestconfig>
[0038] After the configuration file parsing module of the host computer control unit reads the file, it parses out that the type of channel 5 is DI, the signal terminal corresponds to the standardized interface pin 5, the common terminal corresponds to pin 22, the test item is the action threshold test, and the pass criterion is that the action value is ≥77V and the return value is ≤60.5V.
[0039] Step S2: Control the relay array to establish electrical connections
[0040] The relay array control module of the host computer control unit sends commands to the relay array switching device based on the parsed physical terminal definition information (channel 5 signal terminal 5, common terminal 22), controlling the corresponding relays to close: connecting the positive output line of the adjustable DC voltage source to pin 5 of the standardized interface, and connecting the negative terminal (or common ground) of the adjustable DC voltage source to pin 22 of the standardized interface. Since pins 5 and 22 of the standardized interface are connected to terminals 5 and 22 of the DI board under test via test cables, a complete test circuit is established.
[0041] Step S3: Control the output excitation of the test instrument
[0042] The test control module of the host computer control unit controls the adjustable DC voltage source to enter the voltage output mode according to the channel type information "DI". It is ready to output a variable voltage that gradually increases from 0V to 120V (slightly higher than the rated voltage) and then gradually decreases to 0V according to the preset test sequence.
[0043] Step S4: Collect response data
[0044] The data acquisition module monitors the internal logic state of the DI channel of the I / O board under test in real time through the communication interface. When the output voltage rises to the point where the internal logic state flips from "0" to "1", the voltage value at this moment is recorded as the action value (e.g., 78.5V); when the output voltage drops to the point where the internal logic state flips from "1" to "0", the voltage value at this moment is recorded as the return value (e.g., 59.2V).
[0045] Step S5: Compare criteria and output test results
[0046] The judgment module compares the collected action value (78.5V) and return value (59.2V) with the preset pass / fail criteria in the configuration file (action value ≥ 77.0V, return value ≤ 60.5V). The results show that the action value 78.5V ≥ 77.0V and the return value 59.2V ≤ 60.5V are both within the acceptable range, therefore the test result for this channel is judged as "pass". The report generation module stores the test data, criteria, and results for this channel into the database. The system automatically disconnects the current relay and switches to the next channel for the same test according to the configuration file, until all channels have been tested. After the test is completed, the report generation module automatically generates a formatted test report containing the test results for all channels.
[0047] This embodiment uses a 4-channel analog output (AO) board as an example, combined with... Figure 2 and Figure 5 This example demonstrates how the same system can test different types of boards through simple configuration switching, thus verifying the versatility of the invention. Each output of an AO board typically requires two physical connection points (e.g., positive and negative / common terminals), therefore two terminal numbers must be specified in the configuration file. This example uses a 1mA step size to perform full-range accuracy testing on the 4~20mA output range.
[0048] Step S1: Obtain and parse the test configuration file
[0049] For the AO board, the test configuration file content is as follows:
[0050] <iocardtestconfig cardtype="AO_4_20mA"> <channellist> <channel num="1" type="AO" terminal="1,2"> <!-- Terminal attribute format: positive output terminal, negative output terminal (or common terminal) --> <testitem name="Accuracy"> <minoutput> 4.0< / minoutput> <!-- Minimum output current (mA) --> <maxoutput> 20.0< / maxoutput> <!-- Maximum output current (mA) --> <step> 1.0< / step> <!-- Test step size (mA) --> <accuracy> 0.5< / accuracy> <!-- Precision requirement: ±0.5% --> < / testitem> < / channel> <!-- Other channel configurations are omitted. --> < / channellist> < / iocardtestconfig>
[0051] The configuration file parsing module parses out that the type of channel 1 is AO, the physical terminal numbers are 1 and 2, the test item is accuracy test, the test range is 4~20mA, the step size is 1mA, and the accuracy requirement is ±0.5%.
[0052] Step S2: Control the relay array to establish electrical connections
[0053] The relay array control module controls the corresponding relays to close according to the physical terminal definition information "1,2", connecting the input lines of the digital multimeter (positive to pin 1, negative to pin 2) to pins 1 and 2 of the standardized interface, thereby connecting to the channel 1 output terminal of the AO board under test.
[0054] Step S3: Set the testing instrument to measurement mode.
[0055] The test control module sets the digital multimeter to DC current measurement mode based on the channel type information "AO" and waits for the measurement data.
[0056] Step S4: Collect response data
[0057] The test control module commands channel 1 of the AO board via the board control bus to gradually increase the current from 4mA to 20mA in 1mA increments (i.e., outputting 4mA, 5mA, 6mA...20mA sequentially, for a total of 17 test points). After each current value is output and the output stabilizes, the data acquisition module reads the stable reading of the digital multimeter and records the measured values of all 17 test points.
[0058] Step S5: Compare criteria and output test results
[0059] The judgment module calculates the absolute and relative errors for each test point and compares them with the preset ±0.5% accuracy requirement. For example, when the command output is 4mA, the measured value is 4.01mA (error +0.25%); when the output is 12mA, the measured value is 12.02mA (error +0.17%); and when the output is 20mA, the measured value is 20.03mA (error +0.15%). Since the errors at all test points are within ±0.5%, the test result for this channel is judged as "pass". If any test point exceeds the allowable error, it is judged as "fail". After all channel tests are completed, the report generation module automatically generates a test report containing detailed test data and error statistics.
[0060] As can be seen from the above embodiments, this invention, through the core mechanism of combining test configuration files with relay array switching, allows for automated testing of DI (input) and AO (output) boards on the same hardware platform simply by changing the configuration file and adjusting the test instrument settings. This solution is also applicable to DO and AI boards, as the principle is the same and will not be elaborated further here. For DO boards, the configuration file also needs to specify two contact terminals (such as the two ends of a normally open contact). During testing, a digital multimeter is used to measure the contact continuity resistance for recalibration checks. For AI boards, the configuration file needs to specify the input signal terminal and a common terminal. During testing, a standard analog source outputs a standard value, and the board's sampled values are read for accuracy comparison.
[0061] Example 2
[0062] This embodiment provides an automated testing device for I / O boards, which adopts a pre-built automated testing system. The automated testing system includes a host computer, a relay array switching device, a standardized interface, and testing instruments. The standardized interface is connected between the relay array switching device and the I / O board under test. It has multiple pins with fixed and different pin definitions. Each pin is electrically connected to a physical terminal block with different definitions on the I / O board under test based on the same test cable. The testing device is applied to a host computer and includes the following modules: Test configuration information acquisition module: used to acquire the physical terminal definition information of the I / O board under test and the channel type of each channel; Test environment setup module: used to switch the relay array of the relay array switching device according to the physical terminal definition information, and establish the connection between the I / O board under test and the specified test instrument; Test condition configuration module: Used to configure the output signal or range of the specified test instrument according to the channel type, and control the configured test instrument to test the IO board under test and output the test results.
[0063] The device provided in this embodiment can execute the automated testing method for the IO board provided in any step of Embodiment 1, and has the corresponding functional modules and beneficial effects of the execution method.
[0064] Example 3
[0065] This embodiment provides a computer-readable storage medium storing a computer program thereon. When the computer program is executed by a processor, it implements the automated testing method for the I / O board as provided in any step of Embodiment 1.
[0066] Example 4
[0067] This embodiment provides an electronic terminal, including a processor and a memory connected to the processor. The memory stores a computer program. When the computer program is executed by the processor, it performs the steps of the automated testing method for I / O boards provided in any step of Embodiment 1.
[0068] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0069] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.
[0070] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.
[0071] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.
[0072] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.
Claims
1. An automated testing method for I / O boards, characterized in that, A pre-built automated testing system is adopted, which includes a host computer, a relay array switching device, standardized interfaces, and testing instruments; The standardized interface is connected between the relay array switching device and the I / O board under test. It has multiple pins with fixed and different pin definitions. Each pin is electrically connected to a physical terminal block with different definitions on the I / O board under test based on the same test cable. The testing method is applied to the host computer and includes the following steps: Obtain the physical terminal definition information and channel type of each channel of the I / O board under test; Based on the physical terminal definition information, the relay array switching device performs relay array switching to establish a connection between the I / O board under test and the designated test instrument. Configure the output signal or range of the specified test instrument according to the channel type, and control the configured test instrument to test the IO board under test and output the test results.
2. The automated testing method for I / O boards according to claim 1, characterized in that, The process of obtaining the physical terminal definition information and channel type of each channel of the I / O board under test includes: loading and parsing the test configuration file of the I / O board under test; wherein the physical terminal definition information and channel type of each channel are carried by the test configuration file, and the test configuration file also includes the physical terminal number, the channel number of each channel, and the test items and their pass / fail criteria for the corresponding channel.
3. The automated testing method for I / O boards according to claim 1, characterized in that, The process of establishing a connection between the I / O board under test and the designated test instrument includes: selecting pins with consistent physical terminal definitions on the standardized interface according to the terminal definition information, controlling the on / off state of the corresponding relays inside the relay array switching device, and connecting the designated test instrument to the corresponding pins.
4. The automated testing method for I / O boards according to claim 1, characterized in that, The testing instruments include at least an adjustable DC voltage source, a standard analog source, and a digital multimeter.
5. The automated testing method for I / O boards according to claim 4, characterized in that, The channel types include digital input (DI), digital output (DO), analog input (AI), and analog output (AO); The step of configuring the output signal or range of the specified test instrument according to the channel type includes: The adjustable DC voltage source is controlled to output a test excitation signal to the DI channel of the I / O board under test; The standard analog signal source is controlled to output a test excitation signal to the AI channel of the I / O board under test; Control the digital multimeter to output test values to the DO or AO channel of the I / O board under test, and set the digital multimeter to measurement mode.
6. The automated testing method for I / O boards according to claim 5, characterized in that, The controlled and configured test instrument performs tests on the I / O board under test, including: For the DI channel, the adjustable DC voltage source is controlled to gradually increase the output voltage from 0V to the rated voltage, and the voltage value is collected when the internal logic state of the IO board under test is flipped. For the DO channel, control the output switch signal of the IO board under test, and collect the contact resistance value measured by the digital multimeter; For the AI channel, control the standard analog source to output standard voltage or current, and collect the digitized sampled value of the IO board under test; For the AO channel, control the output of the analog signal of the IO board under test, and collect the output value measured by the digital multimeter.
7. The automated testing method for I / O boards according to claim 5, characterized in that, The output test results include: Collect the response data of the I / O board under test to the test excitation signal, or read the measurement data collected by the test instrument; The response data or measurement data is compared with the preset corresponding pass / fail criteria to determine whether each channel test is qualified. Generate a formatted test report based on the test results of all channels.
8. An automated testing device for I / O boards, characterized in that, A pre-built automated testing system is adopted, which includes a host computer, a relay array switching device, standardized interfaces, and testing instruments; The standardized interface is connected between the relay array switching device and the I / O board under test. It has multiple pins with fixed and different pin definitions. Each pin is electrically connected to a physical terminal block with different definitions on the I / O board under test based on the same test cable. The testing device is applied to a host computer and includes the following modules: Test configuration information acquisition module: used to acquire the physical terminal definition information of the I / O board under test and the channel type of each channel; Test environment setup module: used to switch the relay array of the relay array switching device according to the physical terminal definition information, and establish the connection between the I / O board under test and the specified test instrument; Test condition configuration module: Used to configure the output signal or range of the specified test instrument according to the channel type, and control the configured test instrument to test the IO board under test and output the test results.
9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the automated testing method for the I / O board as described in any one of claims 1 to 7.
10. An electronic terminal, characterized in that, It includes a processor and a memory connected to the processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, it performs the steps of the automated testing method for the I / O board as described in any one of claims 1 to 7.