A signal parameter scanning method, device and electronic equipment

Abstract

This application provides a signal parameter scanning method, apparatus, and electronic device. The method includes: configuring multiple test tasks based on set PHY physical layer parameters, each test task corresponding to a target storage channel in a storage device; concurrently executing the multiple test tasks to send write and read instructions to the target storage channel; the write instruction at least includes a test data template; acquiring read data returned by the target storage channel in response to the read instruction; comparing the read data with the test data template to obtain a comparison result; adjusting the PHY parameters based on the comparison result to obtain a signal parameter scanning result corresponding to the target storage channel; the signal parameter scanning result characterizes the PHY parameter range corresponding to the target storage channel when the signal is in a stable state. This application improves the accuracy and efficiency of the signal parameter scanning method.

Description

Technical Field

[0001] This application relates to the field of computer technology, and in particular to a signal parameter scanning method, apparatus, and electronic device. Background Technology

[0002] High-speed signal transmission between NAND flash memory and the physical layer interface is crucial for reliable data read and write operations in storage devices. With the rapid development of storage technology and the continuous improvement of signal transmission rates, signal quality issues (including signal attenuation, jitter, and timing deviations) become particularly prominent under high-temperature and heavy-load conditions. However, current signal parameter scanning methods typically focus only on basic functional verification under single environmental conditions, lacking the ability to comprehensively scan signal parameters under high-temperature and heavy-load scenarios. Furthermore, current signal parameter scanning methods often employ sequential command execution tests, failing to realistically reproduce the transmission pressure generated by multiple concurrent commands in actual applications, and are often limited to room-temperature conditions, neglecting the impact of high-temperature environments on signal impedance and transmission delay. Therefore, current signal parameter scanning methods have low accuracy and efficiency. Summary of the Invention

[0003] This application provides a signal parameter scanning method, apparatus, and electronic device.

[0004] This application provides a signal parameter scanning method, the method comprising: configuring multiple test tasks based on set PHY physical layer parameters, each test task corresponding to a target storage channel in a storage device; concurrently executing the multiple test tasks to send write instructions and read instructions to the target storage channel; the write instruction at least includes a test data template; acquiring read data returned by the target storage channel in response to the read instruction; comparing the read data with the test data template to obtain a comparison result; adjusting the PHY parameters based on the comparison result to obtain a signal parameter scanning result corresponding to the target storage channel; the signal parameter scanning result characterizes the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

[0005] According to one embodiment of this application, the PHY parameters include one or more of data line delay, data strobe signal offset, and drive strength.

[0006] According to one embodiment of this application, configuring multiple test tasks includes: configuring multiple slots in the command descriptor queue of the controller corresponding to the storage device, with each slot corresponding to one test task; configuring a channel identifier, the PHY parameters, and the test data template for each slot; and establishing an association between the slot and the target storage channel of the storage device, so that the target storage channel is associated with multiple slots.

[0007] According to one embodiment of this application, the concurrent execution of the multiple test tasks includes: sending write instructions and read instructions corresponding to the multiple slots to the target storage channel within a preset time window; the write instructions corresponding to the same slot are sent before the read instructions, and the sending times of the instructions corresponding to different slots overlap at least partially.

[0008] According to one embodiment of this application, adjusting the PHY parameters based on the comparison results to obtain the signal parameter scanning results corresponding to the target storage channel includes: determining an initial value and a first preset step size for the PHY parameters; in response to the comparison result corresponding to the test task with the initial value being a first comparison result, adjusting the PHY parameters of each test task based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the first comparison result to the second comparison result for the first time, determining the PHY parameters corresponding to the test task at this time as a first critical value and continuing to adjust the PHY parameters based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the second comparison result to the first comparison result for the first time, determining the PHY parameters corresponding to the previous test task as a second critical value; determining a first signal parameter range based on the first critical value and the second critical value, and using the first signal parameter range as the signal parameter scanning result; the first comparison result indicates that the read data does not match the test data template, and the second comparison result indicates that the read data matches the test data template.

[0009] According to one embodiment of this application, the method further includes: determining a second preset step size; the second preset step size being smaller than a first preset step size; within the first signal parameter range, adjusting the PHY parameters of each test task based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from a first alignment result to a second alignment result, determining the PHY parameter corresponding to the test task at this time as a third critical value and continuing to adjust the PHY parameter based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from a second alignment result to a first alignment result, determining the PHY parameter corresponding to the previous test task as a fourth critical value; based on the third critical value and the fourth critical value, adjusting the first signal parameter range to obtain a second signal parameter range, and using the second signal parameter range as the signal parameter scanning result.

[0010] According to one embodiment of this application, the method further includes: acquiring a plurality of set ambient temperatures and determining the signal parameter scanning result corresponding to each ambient temperature; establishing a mapping model between ambient temperature and PHY parameters based on the plurality of ambient temperatures and the corresponding signal parameter scanning results; predicting the signal parameter scanning result corresponding to a second temperature based on the mapping model and the signal parameter scanning result corresponding to a first temperature; wherein the second temperature is higher than the first temperature.

[0011] This application also provides a signal parameter scanning device, the device comprising: a configuration module for configuring multiple test tasks based on set PHY physical layer parameters, each test task corresponding to a target storage channel in a storage device; an execution module for concurrently executing the multiple test tasks to send write instructions and read instructions to the target storage channel; the write instruction at least includes a test data template; an acquisition module for acquiring read data returned by the target storage channel in response to the read instruction; a comparison module for comparing the read data with the test data template to obtain a comparison result; and a determination module for adjusting the PHY parameters based on the comparison result to obtain a signal parameter scanning result corresponding to the target storage channel; the signal parameter scanning result characterizes the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

[0012] According to one embodiment of this application, the PHY parameters include one or more of data line delay, data strobe signal offset, and drive strength.

[0013] According to one embodiment of this application, the configuration module is configured to: configure multiple slots in the command descriptor queue of the controller corresponding to the storage device, each slot corresponding to a test task; configure a channel identifier, the PHY parameters, and the test data template for each slot; and establish an association between the slot and the target storage channel of the storage device, so that the target storage channel is associated with multiple slots.

[0014] According to one embodiment of this application, the execution module is configured to: send write instructions and read instructions corresponding to the plurality of slots to the target storage channel within a preset time window; the write instructions corresponding to the same slot are sent before the read instructions, and the sending times of the instructions corresponding to different slots overlap at least partially.

[0015] According to one embodiment of this application, the determining module is configured to: determine an initial value and a first preset step size for the PHY parameters; in response to the comparison result corresponding to the test task with the initial value being a first comparison result, adjust the PHY parameters of each test task based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the first comparison result to the second comparison result for the first time, determine the PHY parameters corresponding to the test task at this time as a first critical value and continue to adjust the PHY parameters based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the second comparison result to the first comparison result for the first time, determine the PHY parameters corresponding to the previous test task as a second critical value; determine a first signal parameter range based on the first critical value and the second critical value, and use the first signal parameter range as the signal parameter scanning result; the first comparison result indicates that the read data does not match the test data template, and the second comparison result indicates that the read data matches the test data template.

[0016] According to one embodiment of this application, the determining module is configured to: determine a second preset step size; the second preset step size is smaller than the first preset step size; within the first signal parameter range, adjust the PHY parameters of each test task based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from the first alignment result to the second alignment result, determine the PHY parameter corresponding to the test task at this time as a third critical value and continue to adjust the PHY parameter based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from the second alignment result to the first alignment result, determine the PHY parameter corresponding to the previous test task as a fourth critical value; based on the third critical value and the fourth critical value, adjust the first signal parameter range to obtain a second signal parameter range, and use the second signal parameter range as the signal parameter scanning result.

[0017] According to one embodiment of this application, the device further includes a prediction module, which is configured to: acquire a plurality of set ambient temperatures and determine the signal parameter scanning result corresponding to each ambient temperature; establish a mapping model between ambient temperature and PHY parameters based on the plurality of ambient temperatures and the corresponding signal parameter scanning results; predict the signal parameter scanning result corresponding to a second temperature based on the mapping model and the signal parameter scanning result corresponding to a first temperature; wherein the second temperature is higher than the first temperature.

[0018] This application also provides an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the method of the above-described embodiments.

[0019] The method of this application, based on set PHY physical layer parameters, configures multiple test tasks, each test task corresponding to a target storage channel in a storage device; concurrently executes the multiple test tasks to send write and read instructions to the target storage channel; the write instruction includes at least a test data template; acquires read data returned by the target storage channel in response to the read instruction; compares the read data with the test data template to obtain a comparison result; based on the comparison result, adjusts the PHY parameters to obtain a signal parameter scan result corresponding to the target storage channel; the signal parameter scan result characterizes the PHY parameter range corresponding to the target storage channel when the signal is in a stable state. This application improves the accuracy and efficiency of the signal parameter scanning method.

[0020] It should be understood that the teachings of this application are not required to achieve all the beneficial effects described above, but rather that a specific technical solution can achieve a specific technical effect, and other embodiments of this application can also achieve beneficial effects not mentioned above. Attached Figure Description

[0021] The above and other objects, features, and advantages of exemplary embodiments of this application will become readily apparent from the following detailed description taken in conjunction with the accompanying drawings. Several embodiments of this application are illustrated in the drawings by way of example and not limitation, in which:

[0022] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.

[0023] Figure 1 A schematic diagram of the processing flow of the signal parameter scanning method provided in an embodiment of this application is shown; Figure 2 The diagram illustrates an application scenario of the signal parameter scanning method provided in this application embodiment. Figure 3 This illustration shows an optional schematic diagram of the signal parameter scanning device provided in an embodiment of this application; Figure 4 An optional schematic diagram of an electronic device provided in an embodiment of this application is shown. Detailed Implementation

[0024] To make the objectives, features, and advantages of this application more apparent and understandable, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0025] In the following description, references are made to “some embodiments,” which describe a subset of all possible embodiments. However, it is understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0026] In the following description, the terms "first" and "second" are used merely to distinguish similar objects and do not represent a specific ordering of objects. It is understood that "first" and "second" may be interchanged in a specific order or sequence where permitted, so that the embodiments of this application described herein can be implemented in an order other than that illustrated or described herein.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0028] The processing flow of the signal parameter scanning method provided in the embodiments of this application will be described. See [link to relevant documentation]. Figure 1 , Figure 1 This is a schematic diagram of the processing flow of the signal parameter scanning method provided in the embodiments of this application, which will be combined with Figure 1 Steps S101-S105 are explained below.

[0029] Step S101: Based on the set PHY physical layer parameters, configure multiple test tasks, each test task corresponding to a target storage channel in the storage device.

[0030] In some embodiments, PHY (Physical Layer) parameters may include: data line latency, data strobe signal offset, and drive strength. PHY parameters characterize the transmission characteristics of NAND flash memory interface signals. PHY refers to the underlying hardware responsible for data transmission in a hardware device. NAND is a non-volatile storage technology commonly used in solid-state drives (SSDs) and other types of flash memory devices. The test task may be a slot configured in the storage controller command descriptor queue, along with the corresponding channel identifier, PHY parameter group, and test data template. The test task can be used to perform read / write tests on a storage channel defined in the storage device. The storage device may include solid-state drives and NAND flash memory. The storage device may also be other devices including non-volatile storage media; this application embodiment does not limit the specific storage device. The target storage channel may include a NAND flash memory storage channel defined in the storage device.

[0031] Step S102: Execute multiple test tasks concurrently to send write and read instructions to the target storage channel; the write instruction includes at least a test data template.

[0032] In some embodiments, concurrent execution of multiple test tasks may involve simultaneously sending write commands to multiple target storage channels within the same time window, followed by simultaneous sending read commands to multiple target storage channels. Write commands can be used to write a test data template to a specified storage cell of the target storage channel. Read commands can be used to retrieve the written test data template from a specified storage cell of the target storage channel. The test data template may include a pseudo-random sequence PRBS7. The test data template is test data written to the NAND flash memory.

[0033] Step S103: Obtain the read data returned by the target storage channel in response to the read command.

[0034] In some embodiments, the controller of the NAND flash memory receives read data returned from the target storage channel in response to a read command and stores the read data in the data buffer of DDR (Double Data Rate Synchronous Dynamic Random Memory).

[0035] Step S104: Compare the read data with the test data template to obtain the comparison result.

[0036] In some embodiments, the comparison result can indicate whether the read data and the test data template are completely matched. A data comparator can determine whether the read data and the test data template are completely matched. If they are not completely matched, the comparison result is the first comparison result; if they are completely matched, the comparison result is the second comparison result.

[0037] Step S105: Based on the comparison results, adjust the PHY parameters to obtain the signal parameter scan results corresponding to the target storage channel; the signal parameter scan results characterize the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

[0038] In some embodiments, the signal parameter scan result may be a range of PHY parameters between the minimum and maximum stable delay values ​​representing the signal stability window. The signal parameter scan result can be used to determine the signal integrity of the corresponding storage channel. Adjusting the PHY parameters may include incrementally increasing the PHY parameters based on a set step size.

[0039] As an example, 128 independent slots are configured in the command descriptor queue of the controller corresponding to the storage device. Each slot corresponds to a test task. For each of the 16 target storage channels, multiple independent slots are configured in the command descriptor queue of the controller corresponding to the storage device, each slot corresponding to a test task. PHY parameters and test data templates are set for each slot, and the association between each target storage channel and the 128 slots is established. Using a hardware accelerator, write commands are simultaneously sent to each target storage channel within the same time window to write the test data templates to the corresponding storage locations on the storage devices. Immediately afterwards, read commands are sent to retrieve the read data from the corresponding storage locations. A data comparator is used to compare the read data returned by each slot bit-by-bit with its corresponding test data template, generating a comparison result indicating whether the two data sets match. When the comparison results show a data mismatch, the PHY parameter value is incremented by a first preset step size, and the corresponding slot is reconfigured according to the modified PHY parameter. Write and read commands are sent to the target storage channel again until the comparison result changes from mismatch to match for the first time. When this happens, the corresponding PHY parameter value is determined to be the first critical value. Then, the PHY parameter is incremented until the comparison result changes from mismatch to mismatch again. When this happens, the previous PHY parameter value is determined to be the second critical value. Finally, based on the first and second critical values, the PHY parameter range of the target storage channel under stable signal conditions is determined. This range is output as the signal parameter scan result to evaluate the signal integrity and timing margin of the channel.

[0040] The method described in this application embodiment can achieve the following technical effects: Comprehensive coverage of high-load scenarios: This application supports a high-concurrency test architecture with multiple slots, sending read and write commands to multiple target storage channels in parallel within the same time window. This realistically simulates the extreme signal transmission pressure of storage devices under full load and multi-task concurrency conditions. Compared with the current sequential command test method, it can more accurately reproduce complex signal transmission scenarios in actual applications, improving the accuracy and efficiency of signal parameter scanning.

[0041] Automatic scanning of dynamic parameters: This application adopts a closed-loop feedback mechanism to automatically increase or decrease PHY parameters (such as data line delay, drive strength, etc.). By comparing the consistency between the read data and the test data template in real time, the minimum stable delay value (PHY_Min) and the maximum stable delay value (PHY_Max) of the signal stability window are determined, realizing the full automation of the scanning process, effectively avoiding the errors caused by manual adjustment of parameters one by one, and improving the accuracy of signal parameter scanning.

[0042] Dual-mode scanning: This application supports a dual-mode strategy that combines coarse scanning and fine scanning. First, a first preset step size is used to quickly locate the approximate range of the stable signal region. Then, within the determined range, the second preset step size is switched to perform fine calibration. By scanning the signal parameters in two stages, the overall test time is significantly shortened while ensuring positioning accuracy, and the efficiency of signal parameter scanning is improved.

[0043] High-temperature environment adaptability test: This application performs multi-temperature zone scanning within the range of 50°C to 90°C, records the critical values ​​of PHY parameters at each temperature, and establishes a temperature-PHY parameter mapping table or mathematical model. This effectively solves the attenuation problems such as signal impedance mismatch and timing drift caused by high-temperature environment, and realizes signal parameter scanning of storage devices in the full temperature range.

[0044] Signal quality quantitative assessment: This application calculates the signal margin based on the first and second critical values ​​of the signal stability window, and characterizes the signal stability of each channel through quantitative indicators. When the signal margin is detected to be lower than the preset threshold, an alarm is automatically triggered, providing guidance for hardware optimization decisions (such as adjusting PCB trace length, termination resistors, or drive strength configuration).

[0045] Significantly improved testing efficiency: Compared to the current signal parameter scanning method, which requires manual testing of each channel and parameter and takes more than 8 hours, this application shortens the entire signal parameter scanning process to less than 30 minutes through a multi-slot concurrent architecture and fully automated parameter adjustment, improving testing efficiency by up to 16 times and significantly reducing the time cost and manpower investment for NAND IO signal quality verification.

[0046] In some embodiments, configuring multiple test tasks in step S101 includes: configuring multiple slots in the command descriptor queue of the controller corresponding to the storage device, with each slot corresponding to a test task; configuring a channel identifier, PHY parameters, and test data template for each slot; and establishing an association between the slot and the target storage channel of the storage device so that the target storage channel is associated with multiple slots.

[0047] In this embodiment, the controller may include an NFC (NAND Flash Controller). The controller can directly manage the read / write timing, command scheduling, and PHY parameter configuration of the NAND flash memory. The command descriptor queue can be a linked list structure within the controller used to cache commands to be executed. A slot may include an independent entry in the command descriptor queue assigned to a single test task. The slot can store task information corresponding to each test task. A test task may include read / write tests performed on a target storage channel. The test task can be used to verify the signal integrity of the target storage channel under set PHY parameters. A channel identifier can be used to identify the target storage channel corresponding to the test task. The association may include a mapping relationship between a slot and a target storage channel established through the channel identifier. The association relationship can be used to send multiple test tasks to one or more target storage channels through multiple slots within the same time window to simulate a heavy-load scenario for the storage device.

[0048] As an example, first configure multiple slots in the NFC command descriptor queue, with each slot independently configured with the following information: The Channel ID is used to identify the NAND flash memory storage channel corresponding to the test task.

[0049] PHY parameters include data line delay (DQ_Delay), data strobe offset (DQS_Skew), and drive strength (Drive_Strength).

[0050] Temperature tags are used to record the current test environment temperature.

[0051] The test data template (Data_Pattern) includes test data written to NAND flash memory (such as pseudo-random sequence PRBS7).

[0052] The configured slots are associated with the target storage channels of the NAND flash memory to form multiple concurrent test tasks. Taking a 16-channel NAND flash memory as an example, 128 slots are allocated to each target storage channel and corresponding associations are established, so that each channel corresponds to 128 independent concurrent test tasks. The configured slots can enable multi-slot concurrency through hardware accelerators, and NFC concurrently executes the test tasks corresponding to the 128 slots for the 16 target storage channels within the same time window.

[0053] In some embodiments, the concurrent execution of multiple test tasks in step S102 may include: sending multiple write and read instructions corresponding to slots to the target storage channel within a preset time window.

[0054] In this embodiment, write commands for the same slot are sent before read commands, and the transmission times of commands for different slots at least partially overlap. The preset time window may include a fixed clock period set by the hardware accelerator or NFC.

[0055] As an example, a fixed clock cycle is set by NFC. Taking a single clock cycle (i.e., a single test round) as an example, at the beginning of the clock cycle, NFC simultaneously sends write commands to each of the 128 slots corresponding to the 16 target storage channels, writing the test data template configured for each slot to the corresponding storage location of the NAND flash memory. Within the same time window, read commands are immediately sent to the same batch of 128 slots, ensuring that the write command for the same slot completes before the read command. Simultaneously, the command transmission times between different slots overlap at least partially, allowing the read and write operations of a total of 2048 slots across the 16 channels to occur concurrently within the same time window, simulating the extreme input / output pressure scenario of the SSD operating at full load. After all slots complete data comparison within the current clock cycle, the next clock cycle begins, executing the next round of the test task. Each round dynamically adjusts the PHY parameters of each slot based on the comparison results of the previous round and re-executes the read and write operations of the 2048 slots.

[0056] In some embodiments, step S105, adjusting the PHY parameters based on the comparison results to obtain the signal parameter scanning results corresponding to the target storage channel, includes: determining the initial value of the PHY parameters and a first preset step size; in response to the comparison result corresponding to the test task with the initial value being the first comparison result, adjusting the PHY parameters of each test task based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the first comparison result to the second comparison result for the first time, determining the PHY parameters corresponding to the test task at this time as the first critical value and continuing to adjust the PHY parameters based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the second comparison result to the first comparison result for the first time, determining the PHY parameters corresponding to the previous test task as the second critical value; and determining a first signal parameter range based on the first critical value and the second critical value, and using the first signal parameter range as the signal parameter scanning result.

[0057] In this embodiment, the first comparison result indicates a mismatch between the read data and the test data template, and the second comparison result indicates a match between the read data and the test data template. The initial values ​​of the PHY parameters may include: initial values ​​set for data line delay, data strobe signal offset, and drive strength. The first preset step size may include: a set fixed increment unit. The first threshold value may include: the minimum stable delay value (PHY_Min) corresponding to the first time the comparison result changes from mismatch to match. The second threshold value may include: the previous valid PHY parameter, i.e., the maximum stable delay value (PHY_Max), corresponding to the first time the comparison result changes from match to mismatch. The first signal parameter range may include: the parameter interval defined by the first and second threshold values ​​(e.g., 130ps to 180ps).

[0058] As an example, initial values ​​for PHY parameters are set for the target storage channel, such as setting DQ_Delay to 0ps and determining the first preset step size to 10ps. Simultaneously, a multi-slot concurrent test task is started to write the PRBS7 test data template to the NAND flash memory and immediately read it to the DDR for comparison. In response to the first comparison result where the read data corresponding to the test task with the initial value differs from the test data template, DQ_Delay is incremented to 10ps based on the first preset step size, and the test task is re-executed concurrently until, after a certain adjustment (e.g., DQ_Delay is adjusted to 130ps), the comparison result changes from the first comparison result to the second comparison result for the first time. 130ps is determined as the first critical value, and DQ_Delay is continuously incremented based on the first preset step size, and the test task is re-executed concurrently until, after a certain adjustment (e.g., DQ_Delay is adjusted to 190ps), the comparison result changes from the second comparison result to the first comparison result for the first time. At this point, the previous DQ_Delay, i.e., 180ps, is determined as the second critical value. The range of the first signal parameter is determined to be 130ps to 180ps based on the first critical value of 130ps and the second critical value of 180ps, and the range of the first signal parameter is output as the signal parameter scanning result.

[0059] In some embodiments, the signal parameter scanning method may further include: determining a second preset step size; adjusting the PHY parameters of each test task within a first signal parameter range based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from a first alignment result to a second alignment result, determining the PHY parameters corresponding to the test task at this time as a third critical value and continuing to adjust the PHY parameters based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from a second alignment result to a first alignment result, determining the PHY parameters corresponding to the previous test task as a fourth critical value; adjusting the first signal parameter range based on the third critical value and the fourth critical value to obtain a second signal parameter range, and using the second signal parameter range as the signal parameter scanning result.

[0060] In this embodiment, the second preset step size is smaller than the first preset step size. The third threshold value may include: the minimum stable delay value corresponding to the first change from mismatch to match within the first signal parameter range. The fourth threshold value may include: the previous valid PHY parameter, i.e., the maximum stable delay value, corresponding to the first change from match to mismatch within the first signal parameter range. The second signal parameter range may include: the parameter interval defined by the third and fourth threshold values.

[0061] As an example, firstly, a second preset step size is determined to be 1ps (less than the first preset step size of 10ps). Within the determined first signal parameter range of 130ps to 180ps, the PHY parameters of each test task are adjusted from the first critical value of 130ps based on the second preset step size. In response to the test task's alignment result changing from the first alignment result to the second alignment result for the first time when DQ_Delay is gradually increased from 130ps to 131ps in 1ps increments, this 131ps is determined as the third critical value, and the adjustment continues based on the second preset step size. The PHY parameters are adjusted by a preset step size, and the test task is executed in increments of 1ps. When the adjustment reaches 180ps, the comparison result changes from the second comparison result to the first comparison result for the first time. At this time, the effective value of 179ps from the previous test is determined as the fourth critical value. Finally, based on the third critical value of 131ps and the fourth critical value of 179ps, the original first signal parameter range of 130ps to 180ps is adjusted to the second signal parameter range of 131ps to 179ps, and the second signal parameter range is output as the signal parameter scan result.

[0062] In some embodiments, the signal parameter scanning method may further include: determining the PHY_Min and PHY_Max for each target memory channel of a 16-channel NAND flash memory; determining the margin for each target memory channel based on the PHY_Min and PHY_Max; the margin may be the width of the signal stabilization window, i.e., the difference between PHY_Max and PHY_Min; generating a channel delay distribution map based on the margin of each target memory channel; determining the target memory channel with the lowest margin; and generating an optimization suggestion corresponding to the target memory channel with the lowest margin, i.e., shortening the PCB (substrate) trace length corresponding to the target memory channel with the lowest margin to reduce signal transmission delay.

[0063] In some embodiments, the signal parameter scanning method may further include: acquiring a plurality of set ambient temperatures and determining the signal parameter scanning result corresponding to each ambient temperature; establishing a mapping model between ambient temperature and PHY parameters based on the plurality of ambient temperatures and the corresponding signal parameter scanning results; and predicting the signal parameter scanning result corresponding to a second temperature based on the mapping model and the signal parameter scanning result corresponding to a first temperature.

[0064] In this embodiment, the second temperature is higher than the first temperature. The ambient temperature can simulate the operating state of the storage device under different temperature conditions. The mapping model can include a mathematical model of temperature and PHY parameters fitted based on experimental data. Taking DQ_Delay as an example, the mathematical model of temperature and DQ_Delay can be expressed by the following formula.

[0065] DQ_Delay(T2) = DQ_Delay(T1) + α (T2-T1) Where T2 represents the second temperature, T1 represents the first temperature, DQ_Delay(T2) represents the DQ_Delay corresponding to the second temperature, DQ_Delay(T1) represents the DQ_Delay corresponding to the second temperature, and α represents the temperature coefficient.

[0066] As an example, multiple ambient temperatures of 50°C, 60°C, 70°C, 80°C, and 90°C were first set as temperature points in the constant temperature chamber. Signal parameter scanning results for each target storage channel were obtained at each ambient temperature. Taking the PHY_Min data from the signal parameter scanning results at all temperature points as an example, a mapping model between ambient temperature and PHY_Min was established using linear regression fitting: DQ_Delay(T2) = DQ_Delay(T1) + α (T2-T1) The temperature coefficient α is determined to be 0.5 ps / °C. Finally, based on the mapping model and the signal parameter scan results corresponding to the first temperature 25°C (PHY_Min=130 ps), the PHY_Min corresponding to the second temperature 90°C is predicted to be approximately 150 ps. Similarly, the PHY_Max corresponding to the second temperature 90°C is predicted to be approximately 180 ps. Thus, the signal parameter scan results corresponding to the second temperature are predicted.

[0067] Figure 2 The diagram illustrates an application scenario of the signal parameter scanning method provided in this application embodiment.

[0068] like Figure 2 As shown, in the NAND signal parameter scanning system based on multi-slot concurrency, the multi-slot concurrency control module first configures 2048 slots in the NFC command descriptor queue, assigns a channel identifier, PHY parameters and test data template to each slot, and establishes an association with 16 target storage channels. Within the same time window, it concurrently sends read and write commands to each target storage channel, writes the test data template to the NAND flash memory and then reads it into the DDR.

[0069] The data comparison and recording module receives the read data from the DDR and compares it bit by bit with the original test data template to generate a comparison result indicating a match or a mismatch. At the same time, it records the current PHY parameter values ​​and channel status.

[0070] Based on the comparison results, the dynamic parameter adjustment module executes a two-level scanning strategy. First, it uses a first preset step size (e.g., 10ps) to coarsely locate the boundary of the signal stabilization region, and then uses a second preset step size (e.g., 1ps) to finely scan near the boundary, gradually approaching and determining the critical values ​​of the PHY parameters of each channel, namely PHY_Min and PHY_Max.

[0071] During the scanning process, the anomaly detection module monitors the comparison results of each slot in real time. When it detects that a target storage channel has failed to match data multiple times in a row or that the signal margin calculated by the critical value of the PHY parameter is lower than the preset threshold, it automatically switches to the backup test mode, reduces the number of concurrent slots of the target storage channel from 128 to 64 and increases the adjustment step size.

[0072] Meanwhile, the temperature coupling test module sequentially acquires multiple ambient temperature setpoints such as 50°C, 70°C, and 90°C under the control of the constant temperature chamber. At each temperature point, the multi-slot concurrent control module is triggered to start a complete signal parameter scanning process, collect the PHY critical values ​​at each ambient temperature, and fit and establish a mapping model between temperature and PHY parameters.

[0073] The data comparison and recording module summarizes the scan results of all temperature points, the abnormal event logs and optimization suggestions of the anomaly detection module (such as the need to shorten the PCB traces if the signal margin of target storage channel 3 is insufficient at 90°C), generates a complete signal parameter scan report and outputs it.

[0074] Understandable. Figure 2 The application scenarios of the signal parameter scanning method described in this application are only some exemplary implementations in the embodiments of this application. The application scenarios of the signal parameter scanning method in the embodiments of this application include, but are not limited to, those of... Figure 2 The application scenarios of the signal parameter scanning method shown are illustrated.

[0075] The exemplary structure of the software modules included in the signal parameter scanning device 90 provided in this application embodiment will be further described below. In some embodiments, such as... Figure 3 As shown, the signal parameter scanning device 90 may include: The configuration module 901 is used to configure multiple test tasks based on the set PHY physical layer parameters, each test task corresponding to a target storage channel in the storage device; the execution module 902 is used to concurrently execute multiple test tasks to send write and read instructions to the target storage channel; the write instruction includes at least a test data template; the acquisition module 903 is used to acquire the read data returned by the target storage channel in response to the read instruction; the comparison module 904 is used to compare the read data with the test data template to obtain the comparison result; the determination module 905 is used to adjust the PHY parameters based on the comparison result to obtain the signal parameter scan result corresponding to the target storage channel; the signal parameter scan result characterizes the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

[0076] In some embodiments, PHY parameters include one or more of data line delay, data strobe offset, and drive strength.

[0077] In some embodiments, the configuration module 901 is configured to: configure multiple slots in the command descriptor queue of the controller corresponding to the storage device, each slot corresponding to a test task; configure a channel identifier, PHY parameters and test data template for each slot; and establish an association between the slot and the target storage channel of the storage device so that the target storage channel is associated with multiple slots.

[0078] In some embodiments, the execution module 902 is configured to: send multiple write instructions and read instructions corresponding to slots to the target storage channel within a preset time window; the write instructions corresponding to the same slot are sent before the read instructions, and the sending times of the instructions corresponding to different slots overlap at least partially.

[0079] In some embodiments, the determining module 903 is configured to: determine an initial value for the PHY parameters and a first preset step size; in response to the comparison result corresponding to the test task with the initial value being a first comparison result, adjust the PHY parameters of each test task based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the first comparison result to the second comparison result for the first time, determine the PHY parameters corresponding to the test task at this time as a first critical value and continue to adjust the PHY parameters based on the first preset step size; in response to the comparison result corresponding to the test task after adjusting the PHY parameters changing from the second comparison result to the first comparison result for the first time, determine the PHY parameters corresponding to the previous test task as a second critical value; based on the first critical value and the second critical value, determine a first signal parameter range, and use the first signal parameter range as the signal parameter scanning result; the first comparison result indicates that the read data does not match the test data template, and the second comparison result indicates that the read data matches the test data template.

[0080] In some embodiments, the determining module 903 is configured to: determine a second preset step size; the second preset step size is less than a first preset step size; within a first signal parameter range, adjust the PHY parameters of each test task based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from the first alignment result to the second alignment result, determine the PHY parameter corresponding to the test task at this time as a third critical value and continue to adjust the PHY parameter based on the second preset step size; in response to the first change of the alignment result corresponding to the test task after adjusting the PHY parameters from the second alignment result to the first alignment result, determine the PHY parameter corresponding to the previous test task as a fourth critical value; based on the third critical value and the fourth critical value, adjust the first signal parameter range to obtain a second signal parameter range, and use the second signal parameter range as the signal parameter scanning result.

[0081] In some embodiments, the signal parameter scanning device 90 further includes a prediction module, which is configured to: acquire a plurality of set ambient temperatures and determine the signal parameter scanning result corresponding to each ambient temperature; establish a mapping model between ambient temperature and PHY parameters based on the plurality of ambient temperatures and the corresponding signal parameter scanning results; predict the signal parameter scanning result corresponding to a second temperature based on the mapping model and the signal parameter scanning result corresponding to the first temperature; wherein the second temperature is higher than the first temperature.

[0082] It should be noted that the description of the apparatus in this application embodiment is similar to the description of the method embodiment above, and has similar beneficial effects as the method embodiment, therefore it will not be repeated. For any technical details not covered in the signal parameter scanning apparatus provided in this application embodiment, please refer to... Figures 1 to 3 The meaning is understood in accordance with the description of any of the accompanying drawings.

[0083] According to embodiments of this application, this application also provides an electronic device and a non-transitory computer-readable storage medium.

[0084] Figure 4 A schematic block diagram of an example electronic device 800 that can be used to implement embodiments of this application is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the application described and / or claimed herein.

[0085] like Figure 4 As shown, the electronic device 800 includes a computing unit 801, which can perform various appropriate actions and processes according to a computer program stored in ROM 802 or a computer program loaded into RAM 803 from storage unit 808. RAM 803 can also store various programs and data required for the operation of the electronic device 800. The computing unit 801, ROM 802, and RAM 803 are interconnected via bus 804. I / O interface 805 is also connected to bus 804.

[0086] Multiple components in electronic device 800 are connected to I / O interface 805, including: input unit 806, such as keyboard, mouse, etc.; output unit 807, such as various types of displays, speakers, etc.; storage unit 808, such as hard disk, optical disk, etc.; and communication unit 809, such as network card, modem, wireless transceiver, etc. Communication unit 809 allows electronic device 800 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0087] The computing unit 801 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 801 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 801 performs the various methods and processes described above, such as the signal parameter scanning method. For example, in some embodiments, the signal parameter scanning method may be implemented as a computer software program tangibly contained in a machine-readable medium, such as storage unit 808. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 800 via ROM 802 and / or communication unit 809. When the computer program is loaded into RAM 803 and executed by the computing unit 801, one or more steps of the signal parameter scanning method described above may be performed. Alternatively, in other embodiments, the computing unit 801 may be configured to perform the signal parameter scanning method by any other suitable means (e.g., by means of firmware).

[0088] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0089] The program code used to implement the methods of this application may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing device, such that when executed by the processor or controller, the functions / operations specified in the flowcharts and / or block diagrams are implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0090] In the context of this application, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. Machine-readable media can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0091] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0092] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0093] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact via communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other. Servers can be cloud servers, servers in distributed systems, or servers incorporating blockchain technology.

[0094] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this application can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this application can be achieved, and this is not limited herein.

[0095] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0096] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A signal parameter scanning method, characterized in that, The method includes: Based on the set PHY physical layer parameters, multiple test tasks are configured, and each test task corresponds to a target storage channel in the storage device; The multiple test tasks are executed concurrently to send write and read instructions to the target storage channel; the write instruction includes at least a test data template. Obtain the read data returned by the target storage channel in response to the read command; The read data is compared with the test data template to obtain the comparison result; Based on the comparison results, the PHY parameters are adjusted to obtain the signal parameter scanning results corresponding to the target storage channel; the signal parameter scanning results characterize the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

2. The signal parameter scanning method according to claim 1, characterized in that, The PHY parameters include one or more of the following: data line delay, data strobe signal offset, and drive strength.

3. The method according to claim 1, characterized in that, The configuration of multiple test tasks includes: Multiple slots are configured in the command descriptor queue of the controller corresponding to the storage device, and each slot corresponds to a test task; Configure a channel identifier, the PHY parameters, and the test data template for each slot; Establish an association between the slot and the target storage channel of the storage device, so that the target storage channel is associated with multiple slots.

4. The method according to claim 1, characterized in that, The concurrent execution of the multiple test tasks includes: Within a preset time window, write and read commands corresponding to the multiple slots are sent to the target storage channel; Write commands for the same slot are sent before read commands, and the sending times of commands for different slots overlap at least partially.

5. The method according to claim 1, characterized in that, The step of adjusting the PHY parameters based on the comparison results to obtain the signal parameter scan results corresponding to the target storage channel includes: Determine the initial values ​​and the first preset step size of the PHY parameters; The comparison result corresponding to the test task in response to the initial value is the first comparison result, and the PHY parameters of each test task are adjusted based on the first preset step size; In response to the first change from the first comparison result to the second comparison result of the test task after the PHY parameter adjustment, the PHY parameter corresponding to the test task at this time is determined as the first critical value and the PHY parameter continues to be adjusted based on the first preset step size; In response to the first change of the comparison result from the second comparison result to the first comparison result after the PHY parameter is adjusted, the PHY parameter corresponding to the previous test task is determined as the second critical value. Based on the first critical value and the second critical value, a first signal parameter range is determined, and the first signal parameter range is used as the signal parameter scanning result; The first comparison result indicates that the read data does not match the test data template, while the second comparison result indicates that the read data matches the test data template.

6. The method according to claim 5, characterized in that, The method further includes: Determine a second preset step size; the second preset step size is smaller than the first preset step size. Within the range of the first signal parameters, the PHY parameters of each test task are adjusted based on the second preset step size; In response to the first change from the first comparison result to the second comparison result of the test task after the PHY parameter adjustment, the PHY parameter corresponding to the test task at this time is determined as the third critical value and the PHY parameter continues to be adjusted based on the second preset step size; In response to the fact that the comparison result of the test task after adjusting the PHY parameters changes from the second comparison result to the first comparison result for the first time, the PHY parameters corresponding to the previous test task are determined as the fourth critical value. Based on the third and fourth critical values, the first signal parameter range is adjusted to obtain the second signal parameter range, and the second signal parameter range is used as the signal parameter scanning result.

7. The method according to claim 1, characterized in that, The method further includes: Acquire multiple set ambient temperatures and determine the signal parameter scan results corresponding to each ambient temperature; Based on the scanning results of the multiple ambient temperatures and corresponding signal parameters, a mapping model between ambient temperature and PHY parameters is established. Based on the mapping model and the signal parameter scanning results corresponding to the first temperature, predict the signal parameter scanning results corresponding to the second temperature; The second temperature is higher than the first temperature.

8. A signal parameter scanning device, characterized in that, The device includes: The configuration module is used to configure multiple test tasks based on the set PHY physical layer parameters, each of which corresponds to a target storage channel in the storage device; An execution module is used to concurrently execute the multiple test tasks to send write instructions and read instructions to the target storage channel; the write instructions include at least a test data template. The acquisition module is used to acquire the read data returned by the target storage channel in response to the read command; The comparison module is used to compare the read data with the test data template to obtain the comparison result; The determining module is used to adjust the PHY parameters based on the comparison results to obtain the signal parameter scanning results corresponding to the target storage channel; the signal parameter scanning results characterize the PHY parameter range corresponding to the target storage channel when the signal is in a stable state.

9. The signal parameter scanning device according to claim 8, characterized in that, The PHY parameters include one or more of the following: data line delay, data strobe signal offset, and drive strength.

10. The apparatus according to claim 8, characterized in that, The configuration module is used for: Multiple slots are configured in the command descriptor queue of the controller corresponding to the storage device, and each slot corresponds to a test task; Configure a channel identifier, the PHY parameters, and the test data template for each slot; Establish an association between the slot and the target storage channel of the storage device, so that the target storage channel is associated with multiple slots.

11. The apparatus according to claim 8, characterized in that, The execution module is used for: Within a preset time window, write and read commands corresponding to the multiple slots are sent to the target storage channel; Write commands for the same slot are sent before read commands, and the sending times of commands for different slots overlap at least partially.

12. The apparatus according to claim 8, characterized in that, The determining module is used for: Determine the initial values ​​and the first preset step size of the PHY parameters; The comparison result corresponding to the test task in response to the initial value is the first comparison result, and the PHY parameters of each test task are adjusted based on the first preset step size; In response to the first change from the first comparison result to the second comparison result of the test task after the PHY parameter adjustment, the PHY parameter corresponding to the test task at this time is determined as the first critical value and the PHY parameter continues to be adjusted based on the first preset step size; In response to the first change of the comparison result from the second comparison result to the first comparison result after the PHY parameter is adjusted, the PHY parameter corresponding to the previous test task is determined as the second critical value. Based on the first critical value and the second critical value, a first signal parameter range is determined, and the first signal parameter range is used as the signal parameter scanning result; The first comparison result indicates that the read data does not match the test data template, while the second comparison result indicates that the read data matches the test data template.

13. The apparatus according to claim 12, characterized in that, The determining module is used for: Determine a second preset step size; the second preset step size is smaller than the first preset step size. Within the range of the first signal parameters, the PHY parameters of each test task are adjusted based on the second preset step size; In response to the first change from the first comparison result to the second comparison result of the test task after the PHY parameter adjustment, the PHY parameter corresponding to the test task at this time is determined as the third critical value and the PHY parameter continues to be adjusted based on the second preset step size; In response to the fact that the comparison result of the test task after adjusting the PHY parameters changes from the second comparison result to the first comparison result for the first time, the PHY parameters corresponding to the previous test task are determined as the fourth critical value. Based on the third and fourth critical values, the first signal parameter range is adjusted to obtain the second signal parameter range, and the second signal parameter range is used as the signal parameter scanning result.

14. The apparatus according to claim 8, characterized in that, The device further includes a prediction module, the prediction module being used for: Acquire multiple set ambient temperatures and determine the signal parameter scan results corresponding to each ambient temperature; Based on the scanning results of the multiple ambient temperatures and corresponding signal parameters, a mapping model between ambient temperature and PHY parameters is established. Based on the mapping model and the signal parameter scanning results corresponding to the first temperature, predict the signal parameter scanning results corresponding to the second temperature; The second temperature is higher than the first temperature.

15. An electronic device, characterized in that, include: At least one processor; And a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-7.

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