Portable adaptive curved chip sampling device and chip sampling method

Abstract

This invention discloses a portable adaptive curved surface chip sampling device and method. The portable adaptive curved surface chip sampling device includes a drive mechanism, a chip-cutting mechanism, and a chip collection mechanism. The drive mechanism includes a housing, a drive motor, and a negative pressure generating component. The chip-cutting mechanism includes a mounting housing, a sun gear, planetary gears, a planetary carrier, a pressure plate, and a cutting head. The cutting head includes a detachably connected working head and a curved surface adaptive adjustment structure. The chip collection mechanism includes a chip collection bin. This device is easy to carry to the field and can effectively and uniformly sample complex curved surfaces such as pipe outer walls and turbine blades. Chip sampling is more convenient and efficient, avoiding excessive damage to the workpiece substrate. The drive mechanism generates negative air pressure to adsorb chips, effectively preventing chip splashing and waste, thus avoiding the need for multiple samplings due to chip waste and reducing damage to the workpiece.

Description

Technical Field

[0001] This invention relates to the field of cutting sampling technology, and in particular to a portable adaptive curved surface chip sampling device and chip sampling method. Background Technology

[0002] In the analysis of metallic materials, wet sample preparation and testing are widely used due to their outstanding high-precision quantitative analysis capabilities for major elements (≥1%) such as chromium (Cr), nickel (Ni), and iron (Fe), significant low-cost advantages, and wide applicability to steel, alloys, and castings (especially suitable for multi-point sampling of non-uniform samples). Wet sample preparation and testing requires preparing the sample into small pieces and dissolving them in specific detection solvents such as acids or alkalis to form a solution.

[0003] Currently, for workpieces that can be handled (typically with dimensions in the centimeter range and a weight within 30 kg), the conventional approach is to move them to a machine tool for machining and chip sampling. However, this process is cumbersome, time-consuming, and labor-intensive. For larger, heavier workpieces that are difficult to move, manual cutting using tools such as cutting machines and angle grinders is required for on-site sampling. The retrieved samples are then processed on a lathe. This process is also inefficient, and the cutting and sampling operation can easily damage the integrity of the workpiece, reducing its reliability. Furthermore, the sampling process is also very labor-intensive due to the shape and position of the workpiece. Because of the lack of specialized sampling equipment or methods in the market, technicians struggle to achieve effective and uniform sampling when dealing with complex curved surfaces such as pipe walls and turbine blades. Existing technologies not only solidify technical thinking but also hinder the exploration of convenient and non-destructive chip sampling methods, resulting in technicians spending most of their time on chip sampling during the entire wet sample preparation and testing process. In addition, existing sampling methods also have the problem of debris splashing, which can easily cause sample loss, environmental pollution and safety hazards. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a portable adaptive curved surface chip sampling device and chip sampling method.

[0005] The technical solution adopted by the present invention to solve its technical problem is: to construct a portable adaptive curved surface chip sampling device, including a driving mechanism, a chip mechanism and a chip collection mechanism; The drive mechanism includes a housing, a drive motor, and a negative pressure generating component. Both the drive motor and the negative pressure generating component are installed inside the housing. The first output shaft of the drive motor is connected to the negative pressure generating component. The chip-cutting mechanism includes a mounting shell, a sun gear, planetary gears, a planetary carrier, a pressure plate, and a cutting head. The mounting shell also has a collection hole. The mounting shell has a mounting groove on the side near the outer shell, an end plate on the side of the mounting groove near the outer shell, and a limiting plate on the side of the mounting groove away from the outer shell. The inner wall of the mounting groove has a gear ring arranged in a circumferential direction. There are multiple planetary gears, and multiple planetary gears are installed in the mounting groove with the sun gear. All planetary gears mesh with the sun gear and all planetary gears mesh with the gear ring. The planetary carrier has a plate-like structure, and the pressure plate has a ring-like structure. The pressure plate is used to connect with the limiting plate. The planetary carrier is limited between the limiting plate and the pressure plate. The planetary carrier and the end plate together restrict the sun gear and planetary gears in the mounting groove. The second output shaft of the drive motor is connected to the sun gear. The cutting head includes a detachably connected working head and a curved surface adaptive adjustment structure. The curved surface adaptive adjustment structure has a connecting shaft, which passes through the planetary carrier to connect with the planetary gear. The debris collection mechanism is detachably installed on the mounting shell. The debris collection mechanism includes a debris collection chamber, and the upper end of the debris collection chamber is provided with a collection port. The collection port is connected to the collection hole. The debris collection chamber is connected to the outer shell and is connected to the inner cavity of the outer shell.

[0006] In some embodiments, each planetary gear has a connecting groove at its center, the axis of the connecting groove coincides with the axis of the planetary gear, and the inner wall of the connecting groove has a protrusion; the portion of the planetary carrier exposed in the inner cavity of the pressure plate has a plurality of through holes, the through holes being correspondingly provided with the connecting groove; the outer surface of the connecting shaft has an axially extending recess. The connecting shaft passes through the through hole and is inserted into the connecting groove, and the protrusion and the concave part engage with each other.

[0007] In some embodiments, the curved adaptive adjustment structure includes a front cover, a rear cover, a large transmission ball, a small transmission ball, and a retaining ring; the rear cover is provided with the connecting shaft. The front cover has a through hole at its end, a first ball socket inside the front cover, and a plurality of first slide rails on the inner wall surface of the front cover. The plurality of first slide rails are spaced apart circumferentially along the front cover, and all the first slide rails extend axially along the front cover. The rear cover has a second ball socket inside the rear cover, and a plurality of second slide rails on the inner wall surface of the rear cover. The plurality of second slide rails are spaced apart circumferentially along the rear cover, and all the second slide rails extend axially along the rear cover. After the front cover and the rear cover are assembled together, the first ball socket and the second ball socket together form a receiving cavity for mounting the large transmission ball, and the first slide rail and the second slide rail are correspondingly connected. One end of the large transmission ball is provided with a connecting part, which passes through the through hole to connect with the working head. The outer surface of the large transmission ball is provided with a plurality of sliding grooves, which are spaced apart along the circumference of the large transmission ball, and all the sliding grooves extend along the axis of the large transmission ball. The retaining ring is installed inside the receiving cavity and is sleeved on the outer periphery of the large transmission ball. The retaining ring has several mating holes that penetrate its inner and outer walls. The several mating holes are spaced apart along the circumferential direction of the retaining ring. There are multiple small transmission balls, which are installed in the mating holes. The ends of the small transmission balls protrude from the inner and outer walls of the retaining ring. The small transmission balls can slide along the first slide rail, the second slide rail, and the slide groove.

[0008] In some embodiments, the mating hole is a square hole, and the inner wall surface of the mating hole is entirely tangent to the outer surface of the small transmission ball.

[0009] In some embodiments, the working head has multiple cutting edges.

[0010] In some embodiments, the chipping mechanism further includes a brush ring disposed at the end of the mounting housing away from the outer casing.

[0011] In some embodiments, the chipping mechanism further includes a depth limiting shim that is detachably mounted on the end of the mounting housing away from the outer casing.

[0012] In some embodiments, the surface of the housing is provided with a plurality of airflow holes; The negative pressure generating component includes a fan blade shaft and spiral fan blades disposed on the fan blade shaft. The first end of the fan blade shaft is connected to the first output shaft, and the second end of the fan blade shaft is connected to the end of the housing. The negative pressure generating component also includes a fixing ring and several arc-shaped fixing plates. The fixing ring is located near the second end of the fan blade shaft. One end of the length direction of the several arc-shaped fixing plates is connected to the fixing ring. The several arc-shaped fixing plates are spaced apart along the circumference of the fixing ring, and the inner side of the arc-shaped fixing plates is connected to the outer edge of the spiral fan blade. The negative pressure generating component also includes a sealing ring, which is installed inside the housing and sleeved on the outer periphery of the arc-shaped fixing plate.

[0013] In some embodiments, the outer casing is provided with a first interface, and the bottom of the debris collection chamber is provided with a second interface, the first interface and the second interface being connected together by a connecting pipe.

[0014] The present invention also provides a chip sampling method, applied to the portable adaptive surface chip sampling device described in any of the above embodiments, comprising the following steps: S10: Determine the sampling area and clean the surface of the sampling area to be sampled; S20: Align the cutting head of the portable adaptive curved surface chip sampling device with the surface to be sampled, start the drive mechanism, and drive the chip cutting mechanism to perform cutting. S30: Extract the debris from the debris collection mechanism of the portable adaptive surface chip sampling device and weigh the debris.

[0015] The present invention offers the following advantages: This portable adaptive curved surface chip sampling device is easy to carry to the field. It enables effective and uniform sampling of complex curved surfaces such as pipe outer walls and turbine blades, making chip sampling more convenient and efficient, while avoiding excessive damage to the workpiece substrate. The drive mechanism creates negative air pressure to adsorb chip fragments, effectively preventing chip splashing and waste, thus avoiding the need for multiple samplings due to chip waste and reducing damage to the workpiece. Attached Figure Description

[0016] To more clearly illustrate the technical solution of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and embodiments. It should be understood that the following drawings only show some embodiments of the present invention and should not be considered as a limitation of the scope. For those skilled in the art, other related drawings can be obtained from these drawings without creative effort. In the drawings: Figure 1 This is one of the structural schematic diagrams of a portable adaptive curved surface chip sampling device in some embodiments of the present invention; Figure 2 This is a second schematic diagram of the structure of the portable adaptive curved surface chip sampling device in some embodiments of the present invention; Figure 3 This is one of the partial structural schematic diagrams of the portable adaptive curved surface chip sampling device in some embodiments of the present invention; Figure 4 This is a second partial structural schematic diagram of the portable adaptive curved surface chip sampling device in some embodiments of the present invention; Figure 5 This is a partial structural cross-sectional view of a portable adaptive surface chip sampling device according to some embodiments of the present invention; Figure 6 This is an exploded view of the chip-cutting mechanism in some embodiments of the present invention; Figure 7 This is a perspective sectional view of the mounting shell in some embodiments of the present invention; Figure 8 This is a partial cross-sectional view of the chip-cutting mechanism in some embodiments of the present invention; Figure 9 This is a partial structural schematic diagram of the chip-cutting mechanism in some embodiments of the present invention; Figure 10 This is an exploded view of the working head and planetary gear in some embodiments of the present invention; Figure 11 This is an exploded view of the working head in some embodiments of the present invention; Figure 12 These are cross-sectional views of the working head in some embodiments of the present invention; Figure 13 This is an exploded view of the working head in some other embodiments of the present invention; Figure 14 This is a cross-sectional view of the working head in some other embodiments of the present invention; Figure 15 This is an exploded view of a portion of the working head in some other embodiments of the present invention; Figure 16 This is a schematic diagram illustrating the adaptive curvature of the working head in some embodiments of the present invention; Figure 17 This is a schematic diagram illustrating the application of the depth limiting pad in some embodiments of the present invention; Figure 18 This is an exploded view of a debris collection mechanism in some embodiments of the present invention. Detailed Implementation

[0017] To provide a clearer understanding of the technical features, objectives, and effects of this invention, specific embodiments are now described in detail with reference to the accompanying drawings. In the following description, it should be understood that the orientations or positional relationships indicated by terms such as "front," "rear," "upper," "lower," "left," "right," "longitudinal," "horizontal," "vertical," "horizontal," "top," "bottom," "inner," "outer," "head," and "tail" are based on the orientations or positional relationships shown in the accompanying drawings, and are constructed and operated in a specific orientation. They are only for the convenience of describing this technical solution and do not indicate that the device or element referred to must have a specific orientation; therefore, they should not be construed as limitations on this invention.

[0018] It should also be noted that, unless otherwise explicitly specified and limited, terms such as "installation," "connection," "linking," "fixing," and "setting" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. When an component is referred to as being "on" or "below" another component, the component can be located "directly" or "indirectly" on the other component, or there may be one or more intermediary components. The terms "first," "second," "third," etc., are only for the convenience of describing this technical solution and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first," "second," "third," etc., may explicitly or implicitly include one or more of that feature. For those skilled in the art, the specific meaning of the above terms in this invention can be understood according to the specific circumstances.

[0019] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of the invention. However, those skilled in the art will understand that the invention can be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods are omitted so as not to obscure the description of the invention with unnecessary detail.

[0020] To address the problems of sampling difficulties, easy damage to workpieces, low efficiency, and long time consumption in current wet testing on-site sampling, this application provides a portable adaptive curved surface chip sampling device that can simultaneously achieve "in-situ, minimal damage, adaptive curved surface, controllable depth, and immediate chip recovery", which can systematically solve the above problems and ensure the integrity of workpieces and equipment.

[0021] See Figures 1 to 18This invention discloses a portable adaptive curved surface chip sampling device, which can effectively and uniformly sample complex curved surfaces such as pipe outer walls and turbine blades. Pipe outer walls can include, but are not limited to, the outer walls of nuclear power plant pipes, and turbine blades can include, but are not limited to, nuclear power plant turbine blades. Furthermore, this portable adaptive curved surface chip sampling device can sample chips from the surfaces of workpieces and equipment of various sizes and materials, while controlling the depth of chip sampling to ensure the integrity of the workpieces and equipment.

[0022] See Figures 1 to 18 The portable adaptive curved surface chip sampling device includes a drive mechanism 10, a chip mechanism 20, and a chip collection mechanism 30.

[0023] The drive mechanism 10 includes a housing 11, a drive motor 12, and a negative pressure generating component 13. The drive motor 12 and the negative pressure generating component 13 are both installed inside the housing 11. The first output shaft of the drive motor 12 is connected to the negative pressure generating component 13. The drive motor 12 is used to drive the negative pressure generating component 13 to generate negative pressure inside the housing 11 to form an adsorption force.

[0024] The chip-cutting mechanism 20 includes a mounting housing 21, a sun gear 22, planetary gears 23, a planetary carrier 24, a pressure plate 25, and a cutting head 26. The mounting housing 21 also has a collection hole 211. The mounting housing 21 has a mounting groove 212 near the outer casing 11, an end plate 213 near the outer casing 11, and a limiting plate 214 away from the outer casing 11. The inner wall of the mounting groove 212 has a gear ring 215 arranged circumferentially. The planetary gears... The number of planetary gears 23 is multiple, and multiple planetary gears 23 and sun gears 22 are installed in the mounting slot 212. All planetary gears 23 mesh with the sun gear 22, and all planetary gears 23 mesh with the gear ring 215. The planet carrier 24 has a plate-like structure, such as a circular plate structure, and the pressure plate 25 has an annular structure, such as an annular plate structure. The pressure plate 25 is used to connect with the limiting plate 214, for example, by fastening bolts. The planet carrier 24 is limited between the limiting plate 214 and the pressure plate 25 (e.g., Figure 5 As shown), the planetary carrier 24 and the end plate 213 together restrict the sun gear 22 and the planetary gear 23 within the mounting groove 212. The second output shaft of the drive motor 12 is connected to the sun gear 22. The end plate 213 may be provided with a limiting hole, and the shaft of the sun gear 22 may extend out of the limiting hole to connect with the second output shaft of the drive motor 12.

[0025] The cutter head 26 includes a detachably connected working head 261 and a curved surface adaptive adjustment structure 262. The curved surface adaptive adjustment structure 262 has a connecting shaft 26223, which passes through the planetary carrier 24 to connect with the planetary gear 23. The working head 261 protrudes from the end of the mounting housing 21. The curved surface adaptive adjustment structure 262 can automatically adjust the direction of the cutter head 26 according to the unevenness of the sampling surface, ensuring that the cutter head 26 is always perpendicular to the contact surface, thus guaranteeing the effectiveness and uniformity of the cut.

[0026] The debris collection mechanism 30 is detachably mounted on the mounting housing 21. The debris collection mechanism 30 includes a debris collection chamber 31, the upper end of which has a collection port 311. The collection port 311 communicates with the collection hole 211. The debris collection chamber 31 is connected to the outer housing 11 and communicates with the inner cavity of the outer housing 11. Further, the portion of the debris collection chamber 31 located at the collection port 311 has several latches 312 to engage with the inner edge of the collection hole 211 (e.g., ...). Figure 5 (As shown). Furthermore, the outer shell 11 is provided with a first interface 112, and the bottom of the debris collection chamber 31 is provided with a second interface 313. The first interface 112 and the second interface 313 are connected together by an air pipe.

[0027] The drive motor 12 drives the negative pressure generating component 13 to generate negative pressure, thereby forming an adsorption force at the collection hole 211 of the mounting shell 21. At the same time, the drive motor 12 drives the sun gear 22 to move, the sun gear 22 drives the planet gear 23 to rotate, and the planet gear 23 drives the working head 26 to move to perform cutting operations. The cutting trajectory generated by the "rotation + revolution" composite motion of the planet gear 23 is cycloidal or subcycloidal, which can cut the chip in time. It can not only prevent entanglement, but also realize "high-frequency intermittent cutting", thereby reducing the single-point cutting force, reducing cutting heat, and suppressing the formation of continuous ribbon chips. The metal chips cut off are absorbed into the chip collection chamber 31.

[0028] This portable adaptive curved surface chip sampling device is easy to carry to the field and is suitable for workpieces of various sizes. It eliminates the need for on-site cutting and machine tool chip removal, making chip sampling more convenient and increasing work efficiency. It avoids excessive damage to the workpiece substrate. The drive mechanism 10 creates negative air pressure to adsorb chip fragments, effectively preventing chip splashing and waste, thus avoiding the need for multiple samplings due to chip waste and reducing damage to the workpiece.

[0029] See Figures 3 to 5In some embodiments, the outer casing 11 is generally columnar, for example, generally rectangular or cylindrical. The inner cavity of the outer casing 11 is used to install the drive motor 12 and the negative pressure generating component 13. The drive motor 12 may be installed in the inner cavity of the outer casing 11 and near the first end of the outer casing 11. One end of the negative pressure generating component 13 is connected to the drive motor 12, and the other end of the negative pressure generating component 13 may be connected to the second end of the outer casing 11. The surface of the outer casing 11 is provided with a plurality of airflow holes 111, which are located near the first end of the outer casing 11 and are located on the upper surface portion of the outer casing 11. The plurality of airflow holes 111 can form an exhaust grille.

[0030] The negative pressure generating component 13 includes a fan shaft 131 and a spiral fan blade 132 disposed on the fan shaft 131. The first end of the fan shaft 131 is connected to the first output shaft, and the second end of the fan shaft 131 is connected to the end of the housing 11.

[0031] The first end of the fan blade shaft 131 can be connected to the first output shaft via a coupling. The second end of the fan blade shaft 131 can be mounted on the end wall of the second end of the housing 11 via a bearing structure. Alternatively, the end wall of the second end of the housing 11 may be provided with a bearing seat containing a bearing, and the second end of the fan blade shaft 131 may be connected to the bearing. The spiral fan blades 132 may be continuously extended.

[0032] The drive motor 12 drives the fan blade shaft 131 to rotate through the first output shaft, and the fan blade shaft 131 drives the spiral fan blade 132 to rotate, forming a negative pressure at the second end (or rear end) of the outer casing 11, forming an adsorption force, and the blown air is discharged through the exhaust grille on the outer casing 11.

[0033] See Figures 3 to 5 Furthermore, the negative pressure generating component 13 also includes a fixing ring 133 and a plurality of arc-shaped fixing plates 134. The fixing ring 133 is disposed near the second end of the fan blade shaft 131. One end of the plurality of arc-shaped fixing plates 134 in the length direction is connected to the fixing ring 133. The plurality of arc-shaped fixing plates 134 are spaced apart along the circumference of the fixing ring 133, and the inner side of the arc-shaped fixing plates 134 is connected to the outer edge of the spiral fan blade 132.

[0034] One end of the arc-shaped fixing plate 134 along its length can be connected to the outer circumferential surface of the fixing ring 133, or one end of the arc-shaped fixing plate 134 along its length can be connected to the axial end face of the fixing ring 133. There can be three arc-shaped fixing plates 134, evenly spaced along the circumference of the fixing ring 133. The length direction of the arc-shaped fixing plate 134 is parallel to the axial direction of the fan blade shaft 131. The fixing ring 133 can be a circular ring structure.

[0035] In this embodiment, the fixing ring 133 and the arc-shaped fixing plate 134 are provided to effectively prevent the spiral fan blade 132 from deforming due to high-speed operation. The fixing ring 133 serves as a support structure, ensuring that the spiral fan blade 132 has two support points: the connection point with the drive motor 12 and the fixing ring 133. This ensures stable operation and effectively improves the operational and structural stability of the negative pressure generating component 13, thereby increasing the overall service life of the negative pressure generating component 13.

[0036] See Figures 3 to 5 In some embodiments, the negative pressure generating component 13 further includes a sealing ring 135, which is installed inside the housing 11 and sleeved around the outer periphery of the arc-shaped fixing plate 134. The sealing ring 135 can be a circular ring structure. The sealing ring 135 can be used to block air, effectively preventing air from entering along the gaps of the outer ring of the arc-shaped fixing plate 134 and affecting the adsorption force. Understandably, the arc-shaped fixing plate 134 and the sealing ring 135 ensure airflow sealing and prevent leakage from affecting adsorption efficiency. The fixing ring 133 provides dual support points to ensure the operational stability of the negative pressure generating component 13.

[0037] In some embodiments, the mounting housing 21 may be made of metal or composite material. In some embodiments, the mounting housing 21 may also be made of transparent material to facilitate observation of the working status of the cutter head 26.

[0038] In some embodiments, the number of planetary gears 23 is at least two, and the number of cutting heads 26 is the same as the number of planetary gears 23. Preferably, the number of planetary gears 23 is three, and the number of cutting heads 26 is also three. Of course, the number of planetary gears 23 and the number of cutting heads 26 can be adjusted according to actual needs, and no specific limitation is made here.

[0039] like Figure 6 and Figure 10 For details, please refer to the following: Figure 10 In some embodiments, each planetary gear 23 has a connecting groove 231 at its center, the axis of which coincides with the axis of the planetary gear 23. The inner wall of the connecting groove 231 has a protrusion 232 that extends along the axis of the connecting groove 231 and may protrude from the end wall of the planetary gear 23. The protrusion 232 may be generally rectangular columnar in shape. The portion of the planetary carrier 24 exposed in the cavity of the pressure plate 25 has several through holes 241 that correspond to the connecting grooves 231. The outer surface of the connecting shaft 26223 has an axially extending recess 262231.

[0040] The connecting shaft 26223 passes through the through hole 241 and is inserted into the connecting groove 231. The protrusion 232 and the recess 262231 engage with each other, so that the cutter head 26 and the planetary gear 23 are relatively fixed.

[0041] See Figures 11 to 13 In some embodiments, the curved adaptive adjustment structure 262 includes a front cover 2621, a rear cover 2622, a large transmission ball 2623, a small transmission ball 2624, and a retaining ring 2625; the rear cover 2622 is provided with the connecting shaft 26223. The front cover 2621 and the rear cover 2622 can be fixed by a threaded connection or other detachable connection methods, which are not specifically limited here.

[0042] Furthermore, the front cover 2621 has a through hole at its end, a first ball socket 26211 inside the front cover 2621, and a plurality of first slide rails 26212 on the inner wall surface of the front cover 2621. The plurality of first slide rails 26212 are spaced apart circumferentially along the front cover 2621, and all the first slide rails 26212 extend axially along the front cover 2621. The rear cover 2622 has a second ball socket 26221 inside, and a plurality of ball sockets 26221 on the inner wall surface of the rear cover 2622 are provided with... The second slide rail 26222 is provided, with several second slide rails 26222 spaced circumferentially along the rear cover 2622, and all second slide rails 26222 extending axially along the rear cover 2622. After the front cover 2621 and the rear cover 2622 are assembled together, the first ball socket 26211 and the second ball socket 26221 together form a receiving cavity for mounting the large transmission ball 2623, and the first slide rail 26212 and the second slide rail 26222 are correspondingly connected. The first ball socket 26211 and the second ball socket 26221 can be symmetrically arranged, and the first slide rail 26212 and the second slide rail 26222 can be symmetrically arranged.

[0043] One end of the large transmission ball 2623 is provided with a connecting part 26231, which passes through the through hole to connect with the working head 261. The connecting part 26231 and the working head 261 can be fixed by thread or by welding. When fixed by thread, the thread direction is opposite to the rotation direction of the cutter head 26 to ensure that it will not loosen during the cutting process. Preferably, the working head 261 and the connecting part 26231 are detachably connected, and different materials and sizes of working heads 261 can be replaced to adapt to different sampling objects.

[0044] The outer surface of the large transmission ball 2623 is provided with a plurality of sliding grooves 26232, the plurality of sliding grooves 26232 are arranged at intervals along the circumference of the large transmission ball 2623, and all the sliding grooves 26232 extend along the axis of the large transmission ball 2623.

[0045] The retaining ring 2625 is installed in the receiving cavity and is sleeved on the outer periphery of the large transmission ball 2623. The retaining ring 2625 has a plurality of mating holes 26251 penetrating its inner and outer walls. The plurality of mating holes 26251 are spaced apart along the circumferential direction of the retaining ring 2625. There are multiple small transmission balls 2624. The plurality of small transmission balls 2624 are installed in the mating holes 26251. The ends of the small transmission balls 2624 protrude from the inner and outer walls of the retaining ring 2625. The small transmission balls 2624 can slide along the first slide rail 26212, the second slide rail 26222 and the slide groove 26232.

[0046] See Figures 11 to 13 In some embodiments, the mating hole 26251 is a square hole, and the inner wall surface of the mating hole 26251 is tangent to the outer surface of the small transmission ball 2624. This not only restricts the small transmission ball 2624, but more importantly, maintains that the centers of all the small transmission balls 2624 are coplanar, ensuring the stability and predictability of the deflection motion and avoiding jamming.

[0047] The curved surface adaptive adjustment structure 262 uses a large transmission ball 2623 as the main degree of freedom pivot, combined with the distributed support of multiple small transmission balls 2624, to form an adaptive balance system under over-constraint conditions. This allows the cutter head 26 to smoothly deflect in any direction while ensuring sufficient rigidity for effective cutting after deflection. It adapts to the curvature of the sampling surface, maintaining its perpendicularity to the sampling surface, thus ensuring cutting efficiency and effectiveness. Figure 16 As shown.

[0048] In some embodiments, the number of small transmission balls 2624 is six, and they are evenly spaced. The number of mating holes 26251 is the same as the number of small transmission balls 2624.

[0049] See Figure 14 and Figure 15 In some embodiments, the retaining ring 2625 may be omitted. In this embodiment, there may be three or six small transmission balls 2624, and the number can be selected according to actual needs, without specific limitation here.

[0050] In some embodiments, the working head 261 has a plurality of cutting edges 2611, for example, the working head 261 may be provided with five or six cutting edges 2611, the cutting edges 2611 may be generally claw-shaped, and their structural shape may be as follows: Figure 14 As shown.

[0051] like Figure 6As shown, in some embodiments, the chip-cutting mechanism 20 further includes a brush ring 27, which is disposed at the end of the mounting housing 21 away from the outer casing 11. The brush ring 27 can be magnetically fixed to the mounting housing 21; for example, the annular body of the brush ring 27 can be made of magnetic material to magnetically fix it to the end of the mounting housing 21 away from the outer casing 11. Of course, the brush ring 27 can also be fixed in other ways, which are not specifically limited here. The brush ring 27 is fixed on the mounting housing 21 and distributed on the outer periphery of the cutter head 26, which can prevent chip fragments from flying.

[0052] like Figure 6 As shown, in some embodiments, the chip-cutting mechanism 20 further includes a depth-limiting gasket 28, which is detachably mounted on the end of the mounting housing 21 away from the outer casing 11. The depth-limiting gasket 28 may be an annular thin sheet structure. It may be magnetically fixed to the end of the mounting housing 21. The end of the mounting housing 21 away from the outer casing 11 has several grooves 216, and the depth-limiting gasket 28 may have several protrusions 281. The protrusions 281 can be positioned within the grooves 216. The end of the mounting housing 21 may be made of magnetic or metallic material, and the depth-limiting gasket 28 may be entirely made of magnetic or metallic material, or the protrusions 281 may be made of either magnetic or metallic material, as long as both can be magnetically fixed. Of course, the depth-limiting gasket 28 may also use other fixing methods, which are not specifically limited here.

[0053] like Figure 17 As shown, the depth limiting shim 28 is a thin sheet with a fixed thickness, available in three different specifications: 1mm, 2mm, and 3mm, denoted as D. D refers to the length by which the cutter head 26 extends beyond the depth limiting shim 28; the larger the value of D, the thinner the depth limiting shim 28. Based on the sampleable thickness of the workpiece, a suitable depth limiting shim 28 is selected. During the sampling process, after cutting the surface to be sampled to the appropriate thickness, the cutter head 26 stops contacting the surface.

[0054] like Figure 18 As shown, in some embodiments, the debris collection bin 31 is generally cylindrical in shape, and the debris collection bin 31 can also serve as an auxiliary handle structure during cutting operations.

[0055] The debris collection bin 31 features a detachable design, allowing for easy removal of collected debris and facilitating cleaning. Furthermore, the debris collection bin 31 can be installed on the mounting housing 21 via a snap-fit ​​connection, a threaded connection, or other quick-installation methods. The shape and size of the collection port 311 are the same as or similar to those of the collection hole 211.

[0056] like Figure 18As shown, the debris collection chamber 31 is further equipped with a filter 32, which is installed at the bottom of the chamber. The filter 32 contains a porous sponge to effectively intercept debris and prevent it from entering the trachea and causing blockage. The second interface 313 is connected to the first interface 112. The negative pressure airflow generated by the negative pressure generating component 13 draws the debris generated by the cutting mechanism 20 into the collection port 311, where it is blocked by the filter 32 and accumulates inside the debris collection chamber 31. After one sampling is completed, the debris collection mechanism 30 can be removed from the mounting shell 21, and the collected metal debris can be poured out from the collection port 311.

[0057] Preferably, the first interface 112 and the second interface 313 can be quick connectors for quick connection.

[0058] For example Figure 1 and Figure 2 As shown, in some embodiments, the portable adaptive surface chip sampling device may further include a handle connected to the housing 11, which may be detachably or fixedly connected to the housing 11. In some embodiments, the portable adaptive surface chip sampling device may further include a battery module connected to the handle, which may be detachably connected to facilitate battery module replacement.

[0059] The handle may be equipped with a switch button, which is connected to the drive motor 12 or the battery module to start the drive motor 12. The switch button can also be used to adjust the power of the drive motor 12 to control the output shaft speed of the drive motor 12. The drive motor 12 may be a servo motor, which has forward and reverse rotation capabilities and high adjustment precision.

[0060] In this application, the depth limiting shim 28 enables precise minimization and integrity assurance: by controlling the extension length of the cutter head 26 through the replaceable depth limiting shim 28, precise minimization and integrity assurance of the device are achieved. By precisely controlling the maximum sampling depth, the structural integrity and load-bearing capacity of the workpiece are maintained to the greatest extent, meeting the "minimum damage" or "non-destructive" testing requirements of in-service equipment.

[0061] The portable adaptive curved surface chip sampling device is used as follows: When using the portable adaptive curved surface chip sampling device for sampling, firstly select the corresponding replaceable cutter head 26 according to the material of the workpiece to be sampled, select the corresponding depth limiting shim 28 according to the sampleable thickness of the workpiece, and then fix the second interface 313 of the chip collection chamber 31 to the first interface 112 of the outer shell 11 through the air pipe connection to ensure that the air pipe connection is unobstructed. At the same time, install the brush ring 27 and the selected depth limiting shim 28 by magnetic attraction to complete the device assembly.

[0062] During operation, clean the surface to be sampled, align the blade 26 with the surface to be sampled, press the switch button of the drive mechanism 10 to start the device, and after reaching the maximum sampling depth, turn off the device and disassemble the debris collection chamber 31. Pour out the metal debris collected in the debris collection chamber 31 and weigh it. If the debris weight meets the analysis requirements, sampling can be stopped. If the debris weight is insufficient, reselect the sampling area and repeat the above steps until enough debris is obtained.

[0063] This portable adaptive curved surface chip sampling device has the following technical advantages: 1. Adaptive cutting head and comprehensive sampling capability: The cutting head 26 adopts a curved surface adaptive adjustment structure 262. Through the large transmission ball 2623 and the small transmission ball 2624, the cutting head 26 can automatically adjust its angle during sampling, always maintaining perpendicularity to the workpiece contact surface. The cutting head 26 is replaceable to adapt to different materials and curved surface requirements. The above design enables the device to have comprehensive sampling capability, automatically keeping the cutting edge 2611 aligned with the normal direction on complex geometric surfaces, thereby obtaining chip samples with consistent composition and strong representativeness.

[0064] 2. Precise Minimally Damaged and Integrity Assurance: The extension length of the cutter head 26 is controlled by a replaceable depth limiting shim 28, achieving precise minimizing damage and ensuring the integrity of the workpiece. By accurately controlling the maximum sampling depth, the structural integrity and load-bearing capacity of the workpiece are maintained to the greatest extent, meeting the "minimally damaged" or "non-destructive" testing requirements of in-service equipment.

[0065] 3. Highly Efficient and Clean Sample Management Throughout the Process: The spiral fan blades 132 of the drive mechanism 10 generate negative pressure airflow, which, connected to the mounting housing 21 via an air pipe, creates a localized negative pressure field, directly drawing debris into the debris collection chamber 31. The debris collection chamber 31 contains a porous sponge filter 32 to intercept debris and prevent system clogging. This achieves highly efficient and clean sample management throughout the entire process. By capturing debris in situ in real time, it effectively prevents debris splashing and sample waste, completely solving the problems of sample loss and contamination during on-site sampling, and ensuring the health of operators and the cleanliness of the on-site environment.

[0066] 4. Modular Design and Ease of Operation: Power, cutting, and collection functions are integrated into a handheld device. The modular design allows for quick replacement and simplifies maintenance. A single person can complete the entire process from positioning and sampling to recovery in one operation, simplifying traditionally complex procedures into a "one-click" operation, greatly improving the efficiency of on-site testing.

[0067] The present invention also provides a chip sampling method, applicable to the portable adaptive surface chip sampling device of any of the above embodiments, the chip sampling method comprising the following steps: S10: Determine the sampling area and clean the surface to be sampled in the sampling area; first, clean the surface to be sampled, remove dust, protrusions, etc., and make it as flat as possible.

[0068] S20: Align the cutter head 26 of the portable adaptive curved surface chip sampling device with the surface to be sampled, start the drive mechanism 10, and drive the chip cutting mechanism 20 to perform cutting.

[0069] S30: Extract the debris from the debris collection mechanism 30 of the portable adaptive curved surface chip sampling device and weigh the debris. If the weight does not meet the requirements, repeat steps S10 and S20 until the weight meets the requirements. If the weight meets the requirements, stop the sampling operation.

[0070] In this application, when using a portable adaptive curved surface chip sampling device for sampling, firstly, a replaceable cutting head 26 is selected according to the material of the workpiece to be sampled, and a depth limiting shim 28 of the appropriate specification is selected according to the sampleable thickness of the workpiece. Then, the second interface 313 of the chip collection chamber 31 is fixed to the first interface 112 of the outer shell 11 by connecting and fixing the air pipe to ensure that the air pipe connection is unobstructed. At the same time, the brush ring 27 and the selected depth limiting shim 28 are installed by magnetic attraction to complete the device assembly.

[0071] During operation, clean the surface to be sampled, align the blade 26 with the surface to be sampled, press the switch button of the drive mechanism 10 to start the device, and after reaching the maximum sampling depth, turn off the device and disassemble the debris collection chamber 31. Pour out the metal debris collected in the debris collection chamber 31 and weigh it. If the debris weight meets the analysis requirements, sampling can be stopped. If the debris weight is insufficient, reselect the sampling area and repeat the above steps until enough debris is obtained.

[0072] It is understood that the above embodiments only illustrate preferred embodiments of the present invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the present invention. It should be noted that those skilled in the art can freely combine the above technical features without departing from the concept of the present invention, and can also make several modifications and improvements, all of which fall within the protection scope of the present invention. Therefore, all equivalent transformations and modifications made with respect to the scope of the claims of the present invention should fall within the scope of the claims of the present invention.

Claims

1. A portable adaptive curved surface chip sampling device, characterized in that, It includes a drive mechanism (10), a chip cutting mechanism (20), and a chip collection mechanism (30); The drive mechanism (10) includes a housing (11), a drive motor (12), and a negative pressure generating component (13). The drive motor (12) and the negative pressure generating component (13) are both installed inside the housing (11). The first output shaft of the drive motor (12) is connected to the negative pressure generating component (13). The chip-cutting mechanism (20) includes a mounting housing (21), a sun gear (22), planetary gears (23), a planet carrier (24), a pressure plate (25), and a cutting head (26). The mounting housing (21) is also provided with a collection hole (211). The mounting housing (21) has a mounting groove (212) on the side near the outer shell (11). The mounting groove (212) has an end plate (213) on the side near the outer shell (11). The mounting groove (212) has a limiting plate (214) on the side away from the outer shell (11). The inner wall of the mounting groove (212) is provided with a gear ring (215) arranged in the circumferential direction. There are multiple planetary gears (23). The multiple planetary gears (23) are connected to the sun gear. Gear (22) is installed in the mounting slot (212), all planetary gears (23) mesh with the sun gear (22), and all planetary gears (23) mesh with the gear ring (215); the planet carrier (24) has a plate-like structure, the pressure plate (25) has a ring-like structure, the pressure plate (25) is used to connect with the limiting plate (214), the planet carrier (24) is limited between the limiting plate (214) and the pressure plate (25), the planet carrier (24) and the end plate (213) together restrict the sun gear (22) and the planetary gears (23) in the mounting slot (212), and the second output shaft of the drive motor (12) is connected to the sun gear (22); The cutting head (26) includes a detachably connected working head (261) and a curved surface adaptive adjustment structure (262). The curved surface adaptive adjustment structure (262) has a connecting shaft (26223), which passes through the planetary carrier (24) to connect with the planetary gear (23). The debris collection mechanism (30) is detachably installed on the mounting shell (21). The debris collection mechanism (30) includes a debris collection chamber (31). The upper end of the debris collection chamber (31) is provided with a collection port. The collection port is connected to the collection hole (211). The debris collection chamber (31) is connected to the outer shell (11) and the debris collection chamber (31) is connected to the inner cavity of the outer shell (11).

2. The portable adaptive curved surface chip sampling device according to claim 1, characterized in that, Each of the planetary gears (23) has a connecting groove (231) at its center, the axis of the connecting groove (231) coincides with the axis of the planetary gear (23), and the inner wall of the connecting groove (231) has a protrusion (232); the portion of the planet carrier (24) exposed in the inner cavity of the pressure plate (25) has several through holes (241), the through holes (241) being correspondingly arranged with the connecting grooves (231); the outer surface of the connecting shaft (26223) has an axially extending recess (262231). The connecting shaft (26223) passes through the through hole (241) and is inserted into the connecting groove (231), and the protrusion (232) and the recess (262231) engage with each other.

3. The portable adaptive curved surface chip sampling device according to claim 2, characterized in that, The curved surface adaptive adjustment structure (262) includes a front cover (2621), a rear cover (2622), a large transmission ball (2623), a small transmission ball (2624), and a retaining ring (2625); the rear cover (2622) is provided with the connecting shaft (26223). The front cover (2621) has a through hole at one end, a first ball socket (26211) inside the front cover (2621), and a plurality of first slide rails (26212) on the inner wall surface of the front cover (2621). The plurality of first slide rails (26212) are spaced apart circumferentially along the front cover (2621), and all the first slide rails (26212) extend axially along the front cover (2621). The rear cover (2622) has a second ball socket (26221) inside, and a plurality of second slide rails (26221) on the inner wall surface of the rear cover (2622). The second slide rail (26222) is arranged circumferentially around the rear cover (2622), and all the second slide rails (26222) extend axially around the rear cover (2622). After the front cover (2621) and the rear cover (2622) are assembled together, the first ball socket (26211) and the second ball socket (26221) together form a receiving cavity for the installation of the large transmission ball (2623), and the first slide rail (26212) and the second slide rail (26222) are correspondingly connected. One end of the large transmission ball (2623) is provided with a connecting part (26231), which passes through the through hole to connect with the working head (261). The outer surface of the large transmission ball (2623) is provided with a plurality of sliding grooves (26232). The plurality of sliding grooves (26232) are arranged at intervals along the circumference of the large transmission ball (2623), and all the sliding grooves (26232) extend along the axis of the large transmission ball (2623). The retaining ring (2625) is installed in the receiving cavity and is sleeved on the outer periphery of the large transmission ball (2623). The retaining ring (2625) has a plurality of mating holes (26251) that penetrate its inner and outer walls. The plurality of mating holes (26251) are spaced apart along the circumferential direction of the retaining ring (2625). There are multiple small transmission balls (2624). The plurality of small transmission balls (2624) are installed in the mating holes (26251). The ends of the small transmission balls (2624) protrude from the inner and outer walls of the retaining ring (2625). The small transmission balls (2624) can slide along the first slide rail (26212), the second slide rail (26222), and the slide groove (26232).

4. The portable adaptive curved surface chip sampling device according to claim 3, characterized in that, The mating hole (26251) is a square hole, and the inner wall surface of the mating hole (26251) is tangent to the outer surface of the small transmission ball (2624).

5. The portable adaptive curved surface chip sampling device according to claim 1, characterized in that, The working head (261) has multiple cutting edges (2611).

6. The portable adaptive curved surface chip sampling device according to any one of claims 1 to 5, characterized in that, The chipping mechanism (20) also includes a brush ring (27) located at the end of the mounting housing (21) away from the outer casing (11).

7. The portable adaptive curved surface chip sampling device according to any one of claims 1 to 5, characterized in that, The chipping mechanism (20) also includes a depth limiting shim (28), which is detachably mounted on the end of the mounting housing (21) away from the outer casing (11).

8. The portable adaptive curved surface chip sampling device according to any one of claims 1 to 5, characterized in that, The surface of the outer shell (11) is provided with a plurality of airflow holes (111). The negative pressure generating component (13) includes a fan blade shaft (131) and a spiral fan blade (132) disposed on the fan blade shaft (131). The first end of the fan blade shaft (131) is connected to the first output shaft, and the second end of the fan blade shaft (131) is connected to the end of the housing (11). The negative pressure generating component (13) further includes a fixing ring (133) and a plurality of arc-shaped fixing plates (134). The fixing ring (133) is disposed near the second end of the fan blade shaft (131). One end of the plurality of arc-shaped fixing plates (134) in the length direction is connected to the fixing ring (133). The plurality of arc-shaped fixing plates (134) are arranged at intervals along the circumference of the fixing ring (133), and the inner side of the arc-shaped fixing plates (134) is connected to the outer edge of the spiral fan blade (132). The negative pressure generating component (13) also includes a sealing ring (135), which is installed inside the housing (11) and sleeved on the outer periphery of the arc-shaped fixing plate (134).

9. The portable adaptive curved surface chip sampling device according to any one of claims 1 to 5, characterized in that, The outer shell (11) is provided with a first interface (112), and the bottom of the debris collection bin (31) is provided with a second interface (313). The first interface (112) and the second interface (313) are connected together by a connecting pipe.

10. A chip sampling method, applied to the portable adaptive surface chip sampling device according to any one of claims 1 to 9, characterized in that, Includes the following steps: S10: Determine the sampling area and clean the surface of the sampling area to be sampled; S20: Align the cutter head (26) of the portable adaptive curved surface chip sampling device with the surface to be sampled, start the drive mechanism (10), and drive the chip cutting mechanism (20) to perform cutting; S30: Extract the debris from the debris collection mechanism (30) of the portable adaptive surface chip sampling device and weigh the debris.

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