Fault diagnosis method and device, sample analysis equipment and storage medium

Abstract

This invention discloses a fault diagnosis method for a sample analysis device, comprising the following steps: when the fault type of the sample analysis device is a global fault, determining the scheduling path information of a target sample rack; controlling the target sample rack to move according to the scheduling path information; monitoring the motion monitoring information of the target sample rack; and obtaining a first diagnostic result of the sample analysis device based on the motion monitoring information. This invention also discloses a fault diagnosis device, a sample analysis device, and a storage medium. Using the method of this invention, diagnosis can be performed without manual intervention, greatly reducing diagnosis time and improving diagnostic efficiency.

Description

[0001] This application is a divisional application of the invention patent application filed on December 28, 2021, with application number 202111626666.4 and invention title "Fault Diagnosis Method, Apparatus, Sample Analysis Equipment and Storage Medium". Technical Field

[0002] This invention relates to the field of sample analysis equipment control, and in particular to a fault diagnosis method, device, sample analysis equipment, and storage medium. Background Technology

[0003] In clinical biochemical and immunological applications, a large number of blood or urine samples are transported daily to the sample analyzer's aspiration station via sample racks and a sample scheduling system for chemical composition analysis. Taking a biochemical and immunological analysis pipeline as an example, it generally consists of an analytical unit, a sample scheduling system, and an operating unit. The analytical module analyzes analytes in serum, plasma, and other human fluids; the sample scheduling system handles sample rack loading, scanning, scheduling, transmission, positioning, and retrieval; and the operating software provides software control for the analytical unit and the sample scheduling system, handling test input, result output, result analysis, and quality control.

[0004] During normal testing, the sample rack testing process is as follows: sample injection - obtaining barcode information - scheduling and distribution - transmission to the sampling position in the analysis department - test completion and return - scheduling and distribution - return to the recycling area. When the scheduling system malfunctions, it is often necessary to quickly identify the faulty component or sensor. Currently, mainstream track systems on the market require manual intervention to diagnose the corresponding faulty components and sensors. When there are too many sensors or moving parts on the production line, fault diagnosis becomes a time-consuming and labor-intensive pre-startup task, resulting in low diagnostic efficiency for the production line. Summary of the Invention

[0005] The main objective of this invention is to provide a fault diagnosis method, apparatus, sample analysis equipment, and storage medium, aiming to solve the technical problem of low diagnostic efficiency in existing pipelines.

[0006] To achieve the above objectives, this invention proposes a fault diagnosis method for a sample analysis device, comprising the following steps: When the fault type of the sample analysis equipment is a global fault, determine the scheduling path information of the target sample rack; Control the target sample rack to move according to the scheduling path information; Monitor the motion information of the target sample rack; Based on the motion monitoring information, the first diagnostic result of the sample analysis device is obtained.

[0007] Optionally, before the step of determining the target sample rack and its scheduling path when the failure type of the sample analysis device is a global failure, the method further includes: Upon receiving a device recovery command sent to the sample analysis device, the device recovery command is executed; When the device recovery command is successfully executed, determine whether the sample analysis device is malfunctioning. When the sample analysis equipment malfunctions, the fault type of the sample analysis equipment is determined to be a global fault.

[0008] Optionally, the step of determining the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure includes: When the failure type of the sample analysis equipment is a global failure, determine the number of sample racks in the target sample rack and the analysis unit information of the analysis unit in the sample analysis equipment; Based on the number of sample racks and the information from the analysis unit, the scheduling path information for the target sample rack is determined.

[0009] Optionally, the sample analysis device includes a plurality of first sensors distributed in a preset order, wherein any two adjacent first sensors correspond to a preset duration, and the motion monitoring information includes multiple first sensor information corresponding to the plurality of first sensors; the step of obtaining a first diagnostic result of the sample analysis device based on the motion monitoring information includes: Based on information from multiple first sensors, determine the first duration of any two adjacent first sensors; Based on the first duration of any two adjacent first sensors and the corresponding preset duration, the initial fault diagnosis results of any two adjacent first sensors are obtained. The first diagnostic result of the sample analysis device is obtained based on the initial fault diagnosis results of any two adjacent first sensors.

[0010] Optionally, the step of obtaining the first diagnostic result of the sample analysis device based on the initial fault diagnosis results of any two adjacent first sensors includes: When the initial fault diagnosis result of any two adjacent first sensors is that a fault has occurred, the current dwell position information of the target sample rack is obtained; Obtain the preset dwell position information corresponding to any two adjacent first sensors; Determine the comparison result between the current location information and the preset location information; Based on the comparison results, the first diagnostic result of the sample analysis device is obtained.

[0011] Optionally, after the step of executing the device recovery command upon receiving a device recovery command sent for the sample analysis device, the method further includes: When the recovery command fails to execute, based on the failure information of the recovery command, an abnormal operating unit is identified in the sample analysis device. The abnormal operating unit includes a target transmission mechanism and a second sensor, and the target transmission mechanism is equipped with a third sensor. Place the new target sample holder at the target position corresponding to the second sensor; Obtain the second sensor information from the second sensor; Control the movement of the target transmission mechanism and acquire the third sensor information of the third sensor; Based on the information from the second sensor and the information from the third sensor, a second diagnostic result is obtained from the sample analysis device.

[0012] Optionally, after the step of obtaining the first diagnostic result from the sample analysis device, the method further includes: Based on the first diagnostic result, obtain the scheduling status information of the sample analysis device; If the scheduling status information includes prohibition of further scheduling of the sample analysis device, then the target sample rack is controlled to stop moving until a confirmation operation is received regarding the scheduling status information, at which point the target sample rack is controlled to continue moving according to the scheduling path, or... If the scheduling status information indicates that the sample analysis device can continue to be scheduled, then the target sample rack is controlled to continue moving according to the scheduling path.

[0013] Furthermore, to achieve the above objectives, the present invention also proposes a fault diagnosis device for a sample analysis equipment, comprising: The determination module is used to determine the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure; The control module is used to control the target sample rack to move according to the scheduling path information; The monitoring module is used to monitor the motion information of the target sample rack; The acquisition module is used to obtain the first diagnostic result of the sample analysis device based on the motion monitoring information.

[0014] Furthermore, to achieve the above objectives, the present invention also proposes a sample analysis device, the sample analysis device comprising: a memory, a processor, and a fault diagnosis program stored in the memory and running on the processor, wherein the fault diagnosis program, when executed by the processor, implements the steps of the fault diagnosis method as described in any of the preceding claims.

[0015] In addition, to achieve the above objectives, the present invention also proposes a storage medium storing a fault diagnosis program, which, when executed by a processor, implements the steps of the fault diagnosis method as described in any of the preceding claims.

[0016] The present invention proposes a fault diagnosis method, which involves determining the scheduling path information of a target sample rack when the fault type of the sample analysis device is a global fault; controlling the target sample rack to move according to the scheduling path information; monitoring the motion monitoring information of the target sample rack; and obtaining a first diagnostic result of the sample analysis device based on the motion monitoring information.

[0017] Existing methods require manual intervention to diagnose faulty components and sensors, resulting in lengthy diagnosis times and low efficiency. The method of this invention, however, uses a sample analysis device that controls the movement of the target sample rack according to scheduling path information and collects motion monitoring information to obtain a first diagnostic result based on this information. This eliminates the need for manual intervention, significantly reducing diagnosis time and improving efficiency. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the sample analysis device structure of the hardware operating environment involved in the embodiments of the present invention; Figure 2 This is a flowchart illustrating the first embodiment of the fault diagnosis method of the present invention; Figure 3 This is a schematic diagram of the sample detection system of the present invention; Figure 4 This is a schematic diagram of the second embodiment of the sample analysis device of the present invention; Figure 5 This is a schematic diagram showing the position of the first sensor of the present invention; Figure 6 This is a structural block diagram of the first embodiment of the fault diagnosis device of the present invention.

[0020] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0021] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0022] Reference Figure 1 , Figure 1 This is a schematic diagram of the hardware operating environment sample analysis device involved in the embodiments of the present invention.

[0023] Typically, a sample analysis device includes at least one processor 301, a memory 302, and a fault diagnosis program stored in the memory and executable on the processor, the fault diagnosis program being configured to implement the steps of the fault diagnosis method as described above.

[0024] Processor 301 may include one or more processing cores, such as a quad-core processor or an octa-core processor. Processor 301 may be implemented using at least one hardware form of DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), or PLA (Programmable Logic Array). Processor 301 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 301 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the screen. Processor 301 may also include an AI (Artificial Intelligence) processor, which handles operations related to fault diagnosis methods, enabling the fault diagnosis method model to train and learn autonomously, improving efficiency and accuracy.

[0025] The memory 302 may include one or more storage media, which may be non-transitory. The memory 302 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory storage media in the memory 302 are used to store at least one instruction, which is executed by the processor 301 to implement the fault diagnosis method provided in the method embodiments of this application.

[0026] In some embodiments, the terminal may also optionally include a communication interface 303 and at least one peripheral device. The processor 301, memory 302, and communication interface 303 can be connected via a bus or signal line. Each peripheral device can be connected to the communication interface 303 via a bus, signal line, or circuit board. Specifically, the peripheral device includes at least one of a radio frequency circuit 304, a display screen 305, and a power supply 306.

[0027] The communication interface 303 can be used to connect at least one I / O (Input / Output) related peripheral device to the processor 301 and the memory 302. In some embodiments, the processor 301, the memory 302, and the communication interface 303 are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor 301, the memory 302, and the communication interface 303 can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0028] The radio frequency (RF) circuit 304 is used to receive and transmit RF (Radio Frequency) signals, also known as electromagnetic signals. The RF circuit 304 communicates with communication networks and other communication devices via electromagnetic signals. The RF circuit 304 converts electrical signals into electromagnetic signals for transmission, or converts received electromagnetic signals back into electrical signals. Optionally, the RF circuit 304 includes: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a user identity module card, etc. The RF circuit 304 can communicate with other terminals through at least one wireless communication protocol. This wireless communication protocol includes, but is not limited to: metropolitan area networks (MANs), various generations of mobile communication networks (2G, 3G, 4G, and 5G), wireless local area networks (WLANs), and / or WiFi (Wireless Fidelity) networks. In some embodiments, the RF circuit 304 may also include circuitry related to NFC (Near Field Communication), which is not limited in this application.

[0029] Display screen 305 is used to display a UI (User Interface). This UI may include graphics, text, icons, videos, and any combination thereof. When display screen 305 is a touch display screen, it also has the ability to collect touch signals on or above its surface. These touch signals can be input as control signals to processor 301 for processing. In this case, display screen 305 can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments, display screen 305 can be a single screen, the front panel of an electronic device; in other embodiments, display screen 305 can be at least two screens, respectively disposed on different surfaces of the electronic device or in a folded design; in still other embodiments, display screen 305 can be a flexible display screen, disposed on a curved or folded surface of the electronic device. Furthermore, display screen 305 can also be configured as a non-rectangular, irregular shape, i.e., a non-rectangular screen. Display screen 305 can be made of materials such as LCD (Liquid Crystal Display) or OLED (Organic Light-Emitting Diode).

[0030] Power supply 306 is used to supply power to various components in an electronic device. Power supply 306 can be AC ​​power, DC power, a disposable battery, or a rechargeable battery. When power supply 306 includes a rechargeable battery, the rechargeable battery can support wired or wireless charging. The rechargeable battery can also be used to support fast charging technology.

[0031] Those skilled in the art will understand that Figure 1 The structure shown does not constitute a limitation on the sample analysis device and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0032] Furthermore, embodiments of the present invention also propose a storage medium storing a fault diagnosis program, which, when executed by a processor, implements the steps of the fault diagnosis method described above. Therefore, further details will not be repeated here. Additionally, the beneficial effects of using the same method will not be repeated. For technical details not disclosed in the storage medium embodiments of this application, please refer to the description of the method embodiments of this application. As an example, program instructions can be deployed to execute on a single sample analysis device, or on multiple sample analysis devices located at one location, or on multiple sample analysis devices distributed across multiple locations and interconnected via a communication network.

[0033] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0034] Based on the above hardware structure, an embodiment of the fault diagnosis method of the present invention is proposed.

[0035] Reference Figure 2 , Figure 2 This is a flowchart illustrating the first embodiment of the fault diagnosis method of the present invention. The method includes the following steps: Step S11: When the fault type of the sample analysis device is a global fault, determine the scheduling path information of the target sample rack.

[0036] It should be noted that the executing entity of this invention is a sample analysis device, which is equipped with a fault diagnosis program. When the sample analysis device executes the fault diagnosis program, it implements the steps of the fault diagnosis method of this invention. In some embodiments, the executing entity is an external device connected to the sample analysis device, which controls the sample analysis device to implement the steps of the sample rack emptying method of this invention.

[0037] The sample rack can be a test tube holder for a single test tube or a sample rack for multiple test tubes. The target sample rack contains at least one sample with a barcode. The target sample rack is only used for scheduling and not for conspicuous detection.

[0038] Reference Figure 3 , Figure 3 This is a schematic diagram of the sample detection system of the present invention. The sample detection system includes a control system, a sample scheduling system, and a sample analysis system (the sum of the sample scheduling system and the sample analysis system is the sample analysis device of the present invention). The control system includes an operation unit and a remote module. The operation unit in the control system can refer to an external device that controls the sample analysis device, and the remote module refers to a module that can communicate with a remote device for remote control of the sample analysis device.

[0039] exist Figure 3The sample scheduling system includes a scheduling area and a track area. The scheduling area includes: a sample rack retrieval track, an emergency sample rack injection track, a routine sample rack injection track, a sample rack buffer zone, a sample rack scheduling mechanism, a sample rack retrieval area, and a sample rack placement area. The sample analysis system includes a biochemical analysis department and an immunoassay department. The sample analysis system also includes an emergency sample rack input track, a routine sample rack input track, a sample rack output track, a sample rack aspiration area, a sample rack waiting aspiration area, a sample rack waiting area before track change, and a sample rack track change area.

[0040] Reference Figure 4 , Figure 4 This is a schematic diagram of the structure of the second embodiment of the sample analysis device of the present invention. Figure 4 In this diagram, the analytical equipment refers to the sample analysis equipment. 101 is the sample rack placement area, 102 is the conventional sample rack inlet track, 103 is the emergency sample rack inlet track, 104 is the sample rack buffer zone, 105 is the sample rack scheduling area, 106 is the sample rack retrieval track, 107 is the sample rack retrieval area, 108 is the transport track (which may include three parallel tracks: an emergency sample rack input track, a conventional sample rack input track, and a sample rack output track), and 109 is the sample rack track changing area. The sample rack waiting area for aspiration, the sample rack aspiration area, and the sample rack waiting area before track changing are not shown. Typically, the sample rack aspiration area and the sample rack aspiration waiting area are located within area 108, and the sample rack waiting area before track changing is located at the junction of 108 and 109.

[0041] The sample is placed in the sample rack scheduling area through the sample rack, which is a carrier mechanism. The scheduling area is responsible for uploading, downloading, scheduling and buffering the sample. As an independent module, it is generally placed on the side of the analyzer. Regardless of how many analysis departments are interconnected, there is only one sample rack scheduling area.

[0042] The analytical unit comprises at least one cascaded unit, including but not limited to: a combination of all biochemical analytical units, a combination of all immunoassay analytical units, and a combination of biochemical and immunoassay analytical units, with the analytical units connected by left-right splicing.

[0043] The analytical unit's tracks (emergency sample rack input track, regular sample rack input track, and sample rack output track) are attached to the front of the analyzer in the analytical unit, with the number matching the number of analytical units. The regular sample rack input track has a sampling area and a pre-sampling waiting area, while the emergency sample rack input track has a sampling area. The operation unit can be connected to the sample and analytical equipment via wired or wireless means for operation control, running the operating software, completing sample data entry and test result output, and simultaneously monitoring and scheduling the samples.

[0044] refer to Figure 4The sample rack buffer 104 includes at least one storage location for storing sample racks, serving as a temporary buffer area for sample racks. The sample rack scheduling area 105 has bidirectional movement capabilities, freely switching between track and buffer positions. The scheduling area's support mechanism is not directly observable on the surface of the sample detection system and is not shown in the accompanying diagram. Figure 4 As shown in the image.

[0045] The analysis unit can also be equipped with up to four tracks. In addition to the three tracks mentioned above, the fourth track serves as a sample rack loading and transport channel. The emergency sample rack input track and the regular sample rack input track each include one aspiration position. The regular sample rack input track can simultaneously include at least one pre-absorption waiting position. When a sample is initiated and returns from the aspiration position, the sample rack in the waiting position can be immediately loaded into the aspiration position. The movement of the sample rack within the track can be controlled by a conveyor belt, by a robotic arm, or by a propulsion mechanism.

[0046] The location of the sample rack can be determined by setting corresponding sensors (hereinafter referred to as the first or second sensor) at designated locations. All stationary or designated moving positions of the sample rack are equipped with sensors for detection and positioning. The sample rack detection device of this invention can acquire sensor status changes in real time, thereby determining changes in the sample rack's position. Simultaneously, all stationary positions of the sample rack are equipped with sample blocking mechanisms for blocking and positioning, preventing overshoot or positioning delays in the sample rack's movement.

[0047] Based on the above description, the location information of the sample rack includes two main areas: the track area and the scheduling area; the distribution of sample rack locations includes the following situations: the sample rack is in a static position, that is, the sample rack is in a stationary position. In this case, it can be determined based on the sensor-triggered occlusion situation, specifically including: Sample suction position: The sample rack is in the sample suction area of ​​the analytical section and is being tested; Pre-sampling waiting position: The sample rack is in the pre-sampling waiting position of the analytical section and is waiting to be tested; Track (or channel) inlet: The sample rack is in a certain track (or channel) inlet and is waiting for the track to start transport; Track (or channel) outlet: The sample rack is in a certain track (or channel) outlet and is waiting to enter the next analytical section, be transported to the dispatch trolley, or enter the sample rack track changing area; Sample rack buffer zone: The sample rack is in the sample rack buffer zone and is waiting to be tested, retrieved, or retested; Sample rack retrieval area: The sample rack has been tested and returned to the sample rack retrieval area; Sample rack track changing area: The sample rack is in the sample rack track changing area and is waiting to change tracks.

[0048] The sample holder is in a dynamic position: the sample holder is in motion, that is, it moves from one position sensor to another. The predetermined transmission time is determined based on the distance between different sensors, and the expected position of the sample holder during the transmission process is determined based on the movement time of the sample holder. Specifically, this includes: From the sample inlet of the track (or channel) to the sample outlet of the track (or channel); from the sample rack buffer zone to the sample rack scheduling area support mechanism or from the sample rack scheduling area support mechanism to the sample rack buffer zone; from the sample rack scheduling area support mechanism to the track area or from the track area to the sample rack scheduling area support mechanism; from one track to another.

[0049] Furthermore, before the step of determining the target sample rack and its scheduling path when the fault type of the sample analysis device is a global fault, the method further includes: executing the device recovery instruction when a device recovery instruction is received for the sample analysis device; determining whether the sample analysis device is malfunctioning when the device recovery instruction is successfully executed; and determining that the fault type of the sample analysis device is a global fault when the sample analysis device is malfunctioning.

[0050] It should be noted that, in this invention, when the sample rack analysis equipment malfunctions, the fault typically occurs in the track system (all tracks involved in the sample analysis equipment, including those in the scheduling area and track area). When the track system stops for any reason, users and maintenance personnel can restore the instrument to normal operating status using system recovery methods. That is, the diagnostic method of this invention is primarily used for diagnosing faults in the aforementioned track system.

[0051] When a user fails to initiate a device recovery command, it is necessary to determine the location and faulty components of the track system. However, the track system has numerous sensors and moving parts. When a user executes a device recovery command, it often only displays that the instrument reset failed and indicates a motion fault in a certain unit, without accurately locating which sensor or motion mechanism is faulty. In this case, it is necessary to initiate a local diagnostic process to check whether the sensors and motion mechanisms in the sample analysis equipment can perform corresponding motion control according to the normal scheduling process.

[0052] When the user initiates the device recovery command normally, the track system resets successfully, but the sample analysis device still operates abnormally. This may be due to a sensor malfunction, preventing the signal from changing. However, the system will still indicate that the reset was successful (at this time, the device recovery command was executed successfully, but the sample analysis device is operating abnormally). In this case, a global diagnostic process needs to be initiated to determine that the fault type is a global fault.

[0053] Specifically, the global diagnostic command is initiated for the purpose of maintenance or troubleshooting (or determining that the fault type is a global fault), including but not limited to the following scenarios: when the device recovery command is executed normally, but the instrument is still malfunctioning; or, when the service provider performs scheduled on-site maintenance to determine the working status of the system.

[0054] Furthermore, the step of determining the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure includes: determining the number of sample racks in the target sample rack and the analysis unit information of the analysis unit in the sample analysis equipment when the failure type of the sample analysis equipment is a global failure; and determining the scheduling path information of the target sample rack based on the number of sample racks and the analysis unit information. It should be noted that in this invention, the scheduling path information includes a specific scheduling path and the path arrangement order of the scheduling paths. That is, when there is only one scheduling path, the scheduling path information includes that scheduling path; when there are multiple scheduling paths, the scheduling path information includes multiple scheduling paths and the path arrangement order corresponding to the multiple scheduling paths.

[0055] Typically, the target sample rack has a preset quantity—the number of sample racks. The scheduling path needs to be determined based on the number of target sample racks and the information of the analysis unit (including the specific type and quantity of the analysis unit).

[0056] The sample analysis equipment includes emergency sample rack loading tracks and regular sample rack loading tracks. Each track must correspond to at least one target sample rack, and each target sample rack has a barcode. The rack contains at least one sample with a barcode. Both the barcode on the rack and the barcode on the sample are used to diagnose whether the barcode scanner can scan them correctly; scanning is performed, but no testing is requested.

[0057] In some embodiments, the number of sample racks and the scheduling path for a specific target sample rack are obtained as follows: The cascaded test track includes an emergency sample rack input track and a regular sample rack input track, which correspond to emergency target sample racks and regular target sample racks, respectively. When the number of analysis units is 1, only one analysis unit needs to be tested for the target sample rack, and the required number of sample racks is 2, namely one regular target sample rack and one emergency target sample rack, corresponding to the regular sample rack input track and the emergency sample rack input track, respectively. The required scheduling path information is the regular test scheduling path and the emergency test scheduling path, respectively. When the number of analysis units is 2, the test scenarios for the target sample racks include: single analysis unit 1, single analysis unit 2, and analysis unit 1 + analysis unit 2. The target sample racks are further divided into regular and emergency racks, therefore the required number of target sample racks is 6, and the corresponding scheduling path is also 6. Similarly, assuming the number of cascaded analysis units is X, the required number of sample racks is N = X * (X + 1), and the required number of scheduling paths is also N = X * (X + 1). The required number of regular target sample racks is N_regular = {X * (X + 1)} / 2; the required number of emergency target sample racks is N_emergency = {X * (X + 1)} / 2. All sample racks are placed on the sample rack loading track (regular sample racks are placed on the regular sample rack loading track, and emergency sample racks are placed on the emergency sample rack loading track). Each target sample rack corresponds to one scheduling path, and at the end of each scheduling path, the target sample rack finally returns to the recycling area. In another implementation, to reduce the number of target sample racks, two target sample racks can be used: one regular target sample rack and one emergency target sample rack. These are placed on the regular sample rack loading track and the emergency sample rack loading track, respectively. The number of scheduling paths executed is N = {X*(X+1)} / 2. The multiple scheduling paths on the emergency sample rack loading track and the regular sample rack loading track have a path arrangement order. The target sample rack on the emergency sample rack loading track returns to the emergency sample rack loading track, arranged according to the scheduling path order. Each time, a corresponding scheduling path is determined, and the target sample rack is scheduled according to the corresponding scheduling path. When the last scheduling path is traversed, it finally returns to the recycling area. Similarly, the target sample rack on the regular sample rack loading track undergoes the same operation.

[0058] Step S12: Control the target sample rack to move according to the scheduling path information.

[0059] Based on the specific circumstances of the scheduling path information described above, a specific control process is performed to ensure that the target sample frame moves according to the scheduling path information.

[0060] It is understood that the target sample rack in the process of this invention only moves, schedules and positions the sample rack, and does not perform sample suction operation. The scheduling path of the target sample rack is consistent with the path of the target sample rack when it is being tested normally.

[0061] Understandably, the scheduling path for the target sample rack is already written as a fixed scheduling path. It is only necessary to obtain the corresponding scheduling path based on the actual situation; there is no need to replan the scheduling path. In the process instructions of this invention, the target sample rack automatically follows the path arrangement order of the scheduling path, traversing all scheduling paths, and ultimately returning to the recycling area.

[0062] When a conventional target sample holder is included, the steps of the present invention are performed using the conventional target sample holder as follows: The scheduling path for routine target sample racks via dual-analytical unit diagnostic testing specifically includes: placing the diagnostic sample in the placement area, then proceeding via the routine sample rack loading track - through the loading channel to the sample rack scheduling area - completing scanning and information entry (only uploading data, no actual testing) - arriving at the routine sample rack input track in the Analytical Unit 1 track area - sequentially positioning each stop position of the sample rack - arriving at the Analytical Unit 2 routine sample rack input track via the track change area - sequentially positioning each stop position of the sample rack - arriving at the Analytical Unit 2 sample rack output track via the track change area - arriving at the Analytical Unit 1 sample rack output track via the Analytical Unit 2 sample rack output track - arriving at the sample rack scheduling area via the Analytical Unit 1 sample rack output track - arriving at the sample rack retrieval channel via the sample rack retrieval channel - arriving at the routine sample rack loading track of the sample rack. This completes a routine sample rack scheduling path diagnostic for Analytical Unit 1 + Analytical Unit 2 testing type.

[0063] When an emergency sample holder is included, the steps of the present invention are performed using the emergency sample holder as follows: The path for the emergency sample rack to be scheduled via the dual-analytical unit diagnostic test includes: placing the diagnostic sample on the emergency sample rack inlet track - passing through the inlet channel to the sample rack scheduling area - completing scanning and information entry (only uploading data, no actual testing) - arriving at the emergency sample rack input track in the Analytical Unit 1 track area - sequentially positioning each stop position of the sample rack - arriving at the Analytical Unit 2 emergency sample rack input track via the track change area - sequentially positioning each stop position of the sample rack - arriving at the Analytical Unit 2 sample rack output track via the track change area - arriving at the Analytical Unit 1 sample rack output track via the Analytical Unit 2 sample rack output track - arriving at the sample rack scheduling area via the Analytical Unit 1 sample rack output track - returning to the emergency sample rack inlet track via the sample rack scheduling area, thus completing a diagnostic emergency sample rack scheduling path for Analytical Unit 1 + Analytical Unit 2 test type.

[0064] For reference, the diagnostic test scheduling path for a single analysis unit sample rack is similar to the above process, that is, only the scheduling process for a single analysis unit is performed; the regular target sample rack returns to the sample rack return area via the sample rack placement area. The regular sample rack is scheduled according to all possible combinations of test scheduling paths, such as the single analysis unit 1 test scheduling path, the single analysis unit 2 test scheduling path, ..., the single analysis unit N test scheduling path, and the dual analysis unit test scheduling path. The specific order of the scheduling paths can follow, but is not limited to, the principle of prioritizing the sample rack that needs to be tested for multiple analysis units. That is, the scheduling path can test the multi-analyte scheduling path first, and then test the single analysis unit scheduling path, or it can test the single analysis unit scheduling path first, and then test the multi-analyte scheduling path.

[0065] Understandably, when a regular target sample rack returns to the sample rack recycling area via the sample rack placement area, it will be about to complete all scheduling path traversals when performing the last scheduling path. At this time, the regular target sample rack returns to the sample rack recycling area and no longer performs sample rack rotation scheduling. The return to the sample rack recycling area is used as a node to determine whether this type of regular sample rack has completed all regular sample scheduling path traversals.

[0066] Similarly, it is understandable that the emergency sample rack returns to the emergency area via the emergency area. The emergency sample rack is scheduled according to all possible combinations of test scheduling paths, such as the single analysis unit 1 test scheduling path, the single analysis unit 2 test scheduling path, ... the single analysis unit N test scheduling path, the dual analysis unit test scheduling path, etc. The specific order of the scheduling paths can follow, but is not limited to, the principle of prioritizing the testing of multiple analysis units for the sample rack. That is, the scheduling path can test the multi-analysis unit scheduling path first, and then test the single analysis unit scheduling path, or it can test the single analysis unit scheduling path first, and then test the multi-analysis unit scheduling path.

[0067] Understandably, when the emergency target sample rack returns to the emergency area via the emergency area, it will have completed all scheduling path traversals when performing the last scheduling path. At this point, the emergency target sample rack returns to the sample rack recycling area and no longer performs sample rack rotation scheduling. The return to the sample rack recycling area is used as a node to determine whether this type of regular sample rack has completed all regular sample scheduling path traversals.

[0068] Step S13: Monitor the motion monitoring information of the target sample holder.

[0069] Step S14: Obtain the first diagnostic result of the sample analysis device based on the motion monitoring information.

[0070] Among them, motion monitoring information refers to the information monitored by various sensors in the sample analysis equipment (usually referring to the sensors in the aforementioned track system), including the first sensor information, the second sensor information, and the third sensor information mentioned below.

[0071] Furthermore, the sample analysis device includes a plurality of first sensors distributed in a preset order, with any two adjacent first sensors corresponding to a preset duration, and the motion monitoring information includes multiple first sensor information corresponding to the multiple first sensors; the step of obtaining a first diagnostic result of the sample analysis device based on the motion monitoring information includes: determining a first duration for any two adjacent first sensors based on the multiple first sensor information; obtaining an initial fault diagnosis result for any two adjacent first sensors based on the first duration and the corresponding preset duration; and obtaining a first diagnostic result of the sample analysis device based on the initial fault diagnosis result of any two adjacent first sensors.

[0072] The step of obtaining the first diagnostic result of the sample analysis device based on the initial fault diagnosis results of any two adjacent first sensors includes: when the initial fault diagnosis results of any two adjacent first sensors indicate a fault, obtaining the current dwelling position information of the target sample rack; obtaining the preset dwelling position information corresponding to any two adjacent first sensors; determining the comparison result between the current dwelling position information and the preset dwelling position information; and obtaining the first diagnostic result of the sample analysis device based on the comparison result.

[0073] The first sensor typically refers to each sensor in the track system (involving the scheduling area and the track area) of the sample rack analysis equipment, used to detect obstruction signals of the sample rack. The signal monitored by each first sensor is the first sensor information. The first sensor information can include indicator lights being on and off: when the target sample rack reaches the position corresponding to the first sensor, the first sensor is obstructed, at which time the first sensor information outputs a low-level signal, and the sensor indicator light is off; when the target sample rack leaves the position corresponding to the first sensor, the first sensor is not obstructed, at which time the first sensor information outputs a high-level signal, and the first sensor indicator light is on.

[0074] Reference Figure 5 , Figure 5 This is a schematic diagram showing the position of the first sensor of the present invention. Figure 5 The diagram shows a sample rack transport track in any track of the track system (tracks involving scheduling area and track area). Three first sensors are set in the sample rack transport track: sensor 1, sensor 2 and sensor 3. Each dashed box represents the stopping position of a sample rack, which also corresponds to the detection position of the first sensor.

[0075] Understandably, for a sample rack transport track, if its first sensor detects an obstruction signal, it indicates that a target sample rack exists at the corresponding stopping position. The preset order of the first sensors refers to the order in which a sample rack encounters the first sensors on its corresponding scheduling path.

[0076] by Figure 5 For example, the target sample holder moves from sensor 1 to sensor 2 (sensor 1 and sensor 2 can be two adjacent first sensors of other types). Based on the designed movement distance and the designed transmission speed, there is an initial preset time for the movement path between sensor 1 and sensor 2, which is the movement distance divided by the transmission speed. Adding an allowable time error range to this time, generally between 10% and 20% of the preset time, can be used as a preset time for that segment of the transmission path. Theoretically, this preset time range applies. In other words, based on the first sensor information of any two first sensors, it is necessary to determine the time—the first time—for the target sample holder to move from the first first sensor to the second first sensor.

[0077] by Figure 5 For example, the comparison results between the first duration and the preset duration are further determined: if the first duration does not exceed the preset duration, the target sample rack moves from sensor 1 to sensor 2. At this time, the corresponding change in the state of the first sensor should be --- sensor 1 changes from obstructed to unobstructed, and sensor 2 changes from unobstructed to obstructed, indicating that the first sensor of this segment of the transportation path is working normally; conversely, if the first duration of the rack exceeds the preset duration, and sensor 1 has not yet changed from obstructed to unobstructed, and sensor 2 has not yet changed from unobstructed to obstructed, it indicates that the first sensor of this segment of the transmission path is working abnormally.

[0078] Understandably, if the first sensor is functioning normally, the target sample rack continues to move along the scheduled path; if the first sensor is malfunctioning, the target sample rack is stopped.

[0079] Understandably, under normal circumstances, when the target sample rack finally returns to the sample rack recovery area, the system will indicate that the diagnostic process has ended and no abnormalities have been detected. Under abnormal circumstances, the sample rack will stop at the abnormal position, indicating that an abnormality exists. The abnormal position is that the first sensor on the movement path from a certain position to another position is in an abnormal state, and the corresponding first sensor should be checked.

[0080] If the first duration of the target sample rack does not exceed the preset duration, the target sample rack moves normally. If the target sample rack operates abnormally, the first duration of the target sample rack exceeds the preset duration. In this case, the possible reasons are that the signal of the first sensor cannot change (the first sensor is abnormal) or the motion mechanism is stuck, which causes the target sample rack to be unable to advance.

[0081] Then, further judgment is needed. For any two first sensors, there will be a corresponding preset stopping position—the stopping position corresponding to the blocking mechanism mentioned above (usually the position of the second first sensor distributed in a preset order between two adjacent first sensors). It is necessary to obtain the real-time current stopping position information of the target sample rack. Based on the comparison result between the current stopping position information and the preset stopping position information, the first diagnostic result of the sample analysis device is obtained. Specifically: if the stopping position information of the target sample rack exceeds the preset stopping position, it indicates that the first sensor is abnormal and cannot detect normally; if the stopping position of the sample rack does not exceed the preset stopping position, it indicates that the sample rack is stuck and cannot advance normally.

[0082] Furthermore, after the step of obtaining the first diagnostic result of the sample analysis device, the method further includes: obtaining the scheduling status information of the sample analysis device based on the first diagnostic result; if the scheduling status information includes that the sample analysis device is prohibited from continuing to be scheduled, then controlling the target sample rack to stop moving until a confirmation operation is received for the scheduling status information, then controlling the target sample rack to continue moving according to the scheduling path; or, if the scheduling status information includes that the sample analysis device can continue to be scheduled, then controlling the target sample rack to continue moving according to the scheduling path.

[0083] The scheduling status information is obtained based on the first diagnostic result. The first diagnostic result may include specific fault information and fault location. It is necessary to determine whether the fault is a stop-type fault based on the first diagnostic result. When it is a stop-type fault, the sample analysis equipment is prohibited from continuing scheduling; when it is not a stop-type fault, the sample analysis equipment can continue scheduling. Among them, a stop-type fault refers to a fault in which the target sample rack does not cause the overall scheduling to stop at the fault position, but the stop position will have a substantial impact on the continuity of subsequent actions.

[0084] When a scheduling path fails and stops, the corresponding first diagnostic result is returned to locate the fault location. After the fault is handled, the target sample rack is placed at the fault repair point, and the previous diagnostic process can continue to complete the traversal of the remaining scheduling paths.

[0085] For example: When the target sample rack reaches the sampling stop position, if the sampling position sample rack detection sensor does not detect the sample rack stopping, an alarm will be triggered (Sampling position detection sensor abnormal, please repair). Click OK, and the maintenance personnel will repair the sensor. After the sensor is repaired, the software interface will prompt (Is the faulty sensor repair completed?). Click OK, and then the software interface will prompt (Is the incomplete diagnostic process continued?). Click Continue (Clicking Continue is a way to send a confirmation). The system can then directly continue from the repaired fault point according to the corresponding scheduling path to complete the remaining scheduling path. Conversely, if you click Do Not Continue (No confirmation is sent), the target sample rack must be placed back on the sample regular sample rack loading track and the emergency sample rack loading track to start a new process.

[0086] The software interface prompts are displayed in ways including, but not limited to, via pop-up windows. The software interface includes virtual buttons for user selection. This method further reduces the time required for the process and avoids repetitive execution of scheduling procedures.

[0087] In another implementation, based on the first diagnostic result, the fault location of the target sample rack in a certain scheduling path is determined. At this time, if the target sample rack does not cause a stop to the overall scheduling at the fault location, that is, if the stop location will not have a substantial impact on the continuity of subsequent actions, it can continue without stopping—controlling the target sample rack to continue moving according to the scheduling path.

[0088] For example: For a certain track inlet and outlet detection sensor in the track area, under normal circumstances, the target sample holder will stop at the inlet detection point. If the inlet fails to perform normal signal transition for some reason, the target sample holder can stop and directly transmit the sample holder until it reaches the outlet stop position. At this time, the software system records the fault information and issues an alarm after the fault occurs or after the diagnostic process. This can further save the time required for the diagnostic process and facilitate the handling of all fault points at once.

[0089] Furthermore, after the step of executing the device recovery command when receiving a device recovery command sent to the sample analysis device, the method further includes: when the recovery command fails to execute, determining an abnormal operating unit in the sample analysis device based on the execution failure information of the recovery command, the abnormal operating unit including a target transmission mechanism and a second sensor, the target transmission mechanism being provided with a third sensor; placing a new target sample holder at the target position corresponding to the second sensor; acquiring the second sensor information of the second sensor; controlling the movement of the target transmission mechanism and acquiring the third sensor information of the third sensor; and obtaining a second diagnostic result of the sample analysis device based on the second sensor information and the third sensor information.

[0090] When a user fails to initiate a device recovery command, it is necessary to determine the location and faulty components of the track system. However, the track system has numerous sensors and moving parts. When a user executes a device recovery command, it often only displays that the instrument reset failed and indicates a motion fault in a certain unit, without accurately locating which sensor or motion mechanism is faulty. In this case, it is necessary to initiate a local diagnostic process to check whether the sensors and motion mechanisms in the sample analysis equipment can perform corresponding motion control according to the normal scheduling process.

[0091] Based on the failure information of the recovery command, it is possible to determine which of the sample analysis devices is involved. A malfunctioning unit is designated as an abnormal operating unit. The transmission mechanism within this abnormal operating unit is the target transmission mechanism. This abnormal operating unit has a second sensor for detecting the target sample holder, and a third sensor for detecting the transmission mechanism's position. The target position is the location of the second sensor. The third sensor includes sensors for the initial and final positions of the target transmission mechanism. The information from the second and third sensors refers to the occlusion information detected by the second and third sensors, which includes two states: occlusion and no occlusion.

[0092] Under normal circumstances, the second sensor is unobstructed, while the third sensor at the initial position in the target transmission mechanism is obstructed; under abnormal circumstances, the second sensor is obstructed, while the third sensor at the initial position in the target transmission mechanism is unobstructed.

[0093] Place the target sample holder at the designated location of the abnormal operation unit, click the query second sensor status command, and determine whether it is displayed as occluded. If it is, it means that the second sensor is normal; if not, it means that the second sensor is abnormal.

[0094] The status of the third sensor is determined by resetting the motion mechanism of the direct target transmission mechanism. Clicking the module reset option indicates that if the target transmission mechanism moves from the initial position to the final position, the status of the third sensor at the initial position changes from obstructed to unobstructed, and the status of the third sensor at the final position changes from unobstructed to obstructed. Based on the actual third sensor information (including the information at the initial and final positions), if it is determined that the target transmission mechanism has not moved from the initial position to the final position, then the motor of the abnormal operating unit is considered abnormal.

[0095] By combining the information from the second sensor and the information from the third sensor, a second diagnostic result of the sample analysis device is obtained, which may include motor malfunction, second sensor malfunction, or third sensor malfunction.

[0096] Understandably, the sample rack detection sensor can determine its default working state by querying commands, and can also determine its working state when it is blocked by manually placing a sample rack in it. Understandably, local diagnostics are applicable when the system is reset, i.e., when abnormal sensor occlusion is detected. Understandably, the diagnosis of the motion mechanism positioning sensor includes the diagnosis of the motion control motor. When the motion control motor is abnormal, the motion mechanism cannot perform normal motion control actions. When the motion control motor is normal, the positioning sensor should follow the position change of the motion mechanism and make corresponding jump transitions.

[0097] The present invention proposes a fault diagnosis method, which involves determining the scheduling path information of a target sample rack when the fault type of the sample analysis device is a global fault; controlling the target sample rack to move according to the scheduling path information; monitoring the motion monitoring information of the target sample rack; and obtaining a first diagnostic result of the sample analysis device based on the motion monitoring information.

[0098] Existing methods require manual intervention to diagnose faulty components and sensors, resulting in lengthy diagnosis times and low efficiency. The method of this invention, however, uses a sample analysis device that controls the movement of the target sample rack according to scheduling path information and collects motion monitoring information to obtain a first diagnostic result based on this information. This eliminates the need for manual intervention, significantly reducing diagnosis time and improving efficiency.

[0099] Reference Figure 6 , Figure 6 This is a structural block diagram of a first embodiment of the fault diagnosis device of the present invention. The device is used in a sample analysis equipment and, based on the same inventive concept as the foregoing embodiments, includes: The determination module 10 is used to determine the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure. Control module 20 is used to control the target sample rack to move according to the scheduling path information; Monitoring module 30 is used to monitor the motion monitoring information of the target sample rack; The module 40 is used to obtain the first diagnostic result of the sample analysis device based on the motion monitoring information.

[0100] It should be noted that since the steps performed by the device in this embodiment are the same as those in the aforementioned method embodiments, the specific implementation methods and the technical effects that can be achieved can be referred to the aforementioned embodiments, and will not be repeated here.

[0101] The above description is merely an optional embodiment of the present invention and does not limit the patent scope of the present invention. All equivalent structural transformations made using the contents of the present invention's specification and drawings under the inventive concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A fault diagnosis method, characterized in that, For sample analysis equipment, the following steps are included: Upon receiving a device recovery command sent to the sample analysis device, the device recovery command is executed; When the device recovery command is successfully executed, determine whether the sample analysis device is malfunctioning. When the sample analysis equipment malfunctions, the fault type of the sample analysis equipment is determined to be a global fault. When the fault type of the sample analysis equipment is a global fault, determine the scheduling path information of the target sample rack; Control the target sample rack to move according to the scheduling path information; Monitor the motion information of the target sample rack; Based on the motion monitoring information, the first diagnostic result of the sample analysis device is obtained.

2. The fault diagnosis method as described in claim 1, characterized in that, The step of determining the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure includes: When the failure type of the sample analysis equipment is a global failure, determine the number of sample racks in the target sample rack and the analysis unit information of the analysis unit in the sample analysis equipment; Based on the number of sample racks and the information from the analysis unit, the scheduling path information for the target sample rack is determined.

3. The fault diagnosis method as described in claim 2, characterized in that, The sample analysis device includes multiple first sensors distributed in a preset order, with any two adjacent first sensors corresponding to a preset duration, and the motion monitoring information includes multiple first sensor information corresponding to the multiple first sensors; The step of obtaining the first diagnostic result of the sample analysis device based on the motion monitoring information includes: Based on information from multiple first sensors, determine the first duration of any two adjacent first sensors; Based on the first duration of any two adjacent first sensors and the corresponding preset duration, the initial fault diagnosis results of any two adjacent first sensors are obtained. The first diagnostic result of the sample analysis device is obtained based on the initial fault diagnosis results of any two adjacent first sensors.

4. The fault diagnosis method as described in claim 3, characterized in that, The step of obtaining the first diagnostic result of the sample analysis device based on the initial fault diagnosis results of any two adjacent first sensors includes: When the initial fault diagnosis result of any two adjacent first sensors is that a fault has occurred, the current dwell position information of the target sample rack is obtained; Obtain the preset dwell position information corresponding to any two adjacent first sensors; Determine the comparison result between the current location information and the preset location information; Based on the comparison results, the first diagnostic result of the sample analysis device is obtained.

5. The fault diagnosis method as described in claim 1, characterized in that, After the step of executing the device recovery command upon receiving a device recovery command sent for the sample analysis device, the method further includes: When the recovery command fails to execute, based on the failure information of the recovery command, an abnormal operating unit is identified in the sample analysis device. The abnormal operating unit includes a target transmission mechanism and a second sensor, and the target transmission mechanism is equipped with a third sensor. Place the new target sample holder at the target position corresponding to the second sensor; Obtain the second sensor information from the second sensor; Control the movement of the target transmission mechanism and acquire the third sensor information of the third sensor; Based on the information from the second sensor and the information from the third sensor, a second diagnostic result is obtained from the sample analysis device.

6. The fault diagnosis method according to any one of claims 1-5, characterized in that, After the step of obtaining the first diagnostic result of the sample analysis device, the method further includes: Based on the first diagnostic result, obtain the scheduling status information of the sample analysis device; If the scheduling status information includes prohibition of further scheduling of the sample analysis device, then the target sample rack is controlled to stop moving until a confirmation operation is received regarding the scheduling status information, at which point the target sample rack is controlled to continue moving according to the scheduling path, or... If the scheduling status information indicates that the sample analysis device can continue to be scheduled, then the target sample rack is controlled to continue moving according to the scheduling path.

7. A fault diagnosis device, characterized in that, Equipment for sample analysis includes: The determination module is used to determine the scheduling path information of the target sample rack when the failure type of the sample analysis equipment is a global failure; The control module is used to control the target sample rack to move according to the scheduling path information; The monitoring module is used to monitor the motion information of the target sample rack; The acquisition module is used to obtain the first diagnostic result of the sample analysis device based on the motion monitoring information.

8. A sample analysis device, characterized in that, The sample analysis device includes: a memory, a processor, and a fault diagnosis program stored in the memory and running on the processor, wherein the fault diagnosis program, when executed by the processor, implements the steps of the fault diagnosis method as described in any one of claims 1 to 6.

9. A storage medium, characterized in that, The storage medium stores a fault diagnosis program, which, when executed by a processor, implements the steps of the fault diagnosis method as described in any one of claims 1 to 6.

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