A method and apparatus for training SCD configuration capability

Abstract

This invention discloses an SCD configuration capability training method and device, belonging to the field of substation operation and maintenance training technology. The SCD configuration capability training method compares the configuration results of an SCD template generated based on preset difficulty levels, voltage level parameters, and corresponding generation rules with known conditions against a standard SCD file item by item to obtain data comparison results. This generates SCD templates of different voltage levels and difficulties for trainees to practice independently. Given known conditions, trainees can perform online configuration and verify the configuration results, comprehensively improving their SCD configuration capabilities. This solves the problem that current teaching SCD configuration samples are not comprehensive enough and cannot cope with various configuration problems in actual operation and maintenance.

Description

Technical Field

[0001] This invention relates to a method and apparatus for training SCD configuration capabilities, belonging to the field of substation operation and maintenance training technology. Background Technology

[0002] The SCD (Substation Configuration Description) file is the core configuration file of a smart substation. It covers key information such as the model, parameters, communication configuration, and virtual circuit relationships of the primary and secondary equipment in the substation. SCD configuration capability is a core skill that smart substation operation and maintenance personnel must master.

[0003] Currently, trainees mostly learn SCD configuration through lectures, typically by selecting a typical bay for explanation and demonstration, followed by trainees' imitation and practice. This traditional teaching method has significant drawbacks: First, it is inefficient, as lectures are limited by time and location, preventing trainees from self-organizing their training pace, and the explanation of a single typical bay cannot cover the complex and diverse real-world scenarios of substations. Second, learning samples are scarce; instructors spend considerable time and effort manually compiling SCD exam questions, making it difficult to provide a large number of self-training samples of different voltage levels and difficulties, resulting in incomplete self-training for trainees and an inability to cope with various configuration problems in actual operation and maintenance. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art and provide an SCD configuration capability training method and device. It provides students with SCD templates of different voltage levels and difficulties for self-training and verifies the configuration results, thereby comprehensively improving students' SCD configuration capabilities and solving the problem that the current teaching SCD configuration samples are not comprehensive enough and are difficult to deal with various configuration problems in actual operation and maintenance.

[0005] To solve the above-mentioned technical problems, the present invention is implemented using the following technical solution: This invention provides an SCD configuration capability training method, comprising: Obtain the configuration result of the pre-generated SCD template and the known conditions; The method for generating the SCD template includes: generating the SCD template based on a pre-established exam difficulty model, voltage level parameters, and generation rules; The configuration results are compared item by item with the standard SCD file to obtain the data comparison results; Based on the data comparison results, a visual data chart is generated that can represent the configuration capabilities of the configuration personnel.

[0006] Furthermore, the voltage level parameters include 750kV, 500kV, 330kV, 220kV, 110kV, and 35kV.

[0007] Furthermore, the SCD template generated based on the pre-established exam difficulty model, voltage level parameters, and corresponding generation rules includes: Based on the selected voltage level, the substation architecture is randomly selected from the primary equipment model library to generate the corresponding primary main wiring diagram; The selected substation architecture is coded, and a secondary equipment manufacturer is randomly selected from the preset list of secondary equipment manufacturers. The secondary equipment ICD model corresponding to the voltage level parameters of the secondary equipment manufacturer is matched according to the code. Match the corresponding virtual terminal table to the ICD model of the secondary equipment; Based on the primary wiring diagram, secondary equipment ICD model, and virtual terminal table, generate a standard SCD file according to the generation rules. The pre-established test difficulty model is applied to the standard SCD file to generate SCD templates with different difficulty levels.

[0008] Furthermore, the primary equipment model library includes: The types of busbar models include single busbar, single busbar segment, double busbar, double busbar single segment, and double busbar double segment; Transformer models include two-winding and three-winding transformers; The types of line models include bus connection, three-way connection, and bridge connection.

[0009] Furthermore, the establishment of the test question difficulty model includes: The exam questions are instantiated using different difficulty levels. The difficulty levels include: Level 1 difficulty is represented as: The transformer is a two-winding transformer, with a single busbar connection on both the high-voltage and low-voltage sides. The secondary equipment is configured as a single set, with no errors in its configuration. Level 2 difficulty is represented as: The transformer has two windings, with a single busbar connection on the high-voltage side and a single busbar with sectionalized low-voltage side connections. The secondary equipment is configured as a single set. Compared to Level 1 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 5%. Level 3 difficulty is represented as: The transformer has three windings, with a double busbar connection on the high-voltage side and a single busbar connection on the medium- and low-voltage sides. It has two sets of secondary equipment. Compared with the level 2 difficulty, the topology complexity increases, the types and number of secondary equipment increase, and the probability of error implantation is 10%. Level 4 difficulty is represented as: The transformer has three windings, with a double busbar connection on the high-voltage side, a single busbar connection on the medium-voltage side, and a single busbar segmented connection on the low-voltage side. It also has two sets of secondary equipment. Compared to the level 3 difficulty, the topology complexity increases, the types and number of secondary equipment increase, and the probability of error implantation is 15%. Level 5 difficulty is represented as: The transformer is a three-winding transformer. The high-voltage side wiring method is double bus or double bus section, the medium-voltage side wiring method is double bus or double bus section, and the low-voltage side wiring method is single bus section. The secondary equipment is configured in two sets. Compared with the level 4 difficulty, the complexity of the topology structure increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 20%.

[0010] Furthermore, the step of applying the pre-established exam difficulty model to a standard SCD file to generate SCD templates with different difficulty levels includes: Based on a pre-established exam difficulty model, the topological complexity and wiring method of the standard SCD file are changed and errors are injected to generate SCD templates with different difficulty levels. The SCD templates with different difficulty levels are divided using a comprehensive difficulty coefficient, as shown below: ; in, This indicates the overall difficulty level of the SCD template. This indicates a difficulty correction factor. Indicates the complexity of the primary equipment model. express Factor weight coefficients, This indicates the complexity of the secondary equipment ICD model. express Factor weight coefficients, This represents the complexity coefficient of the secondary equipment ICD model. This represents the probability value of implantation error; ; in, Indicates the complexity of the transformer model. express Weighting coefficients; Indicates the complexity of the busbar model. express Weighting coefficients; Indicates the complexity of the circuit model. express Weighting coefficients; ; in, This indicates multiple configuration coefficients. =0.25 indicates a single configuration. =0.5 indicates a dual-set configuration; Indicates the number of secondary equipment. This indicates the maximum number of secondary devices required for the selected voltage level. Indicates the quantity of secondary equipment types. This indicates the maximum number of secondary equipment types. ; in, Indicates the number of basic faulty links. Indicates the number of cascade errors. Indicates the difficulty level. Indicates the total number of links.

[0011] Furthermore, the errors include virtual terminal loss, virtual terminal duplication, virtual terminal error, and communication parameter error, which are randomly allocated according to a preset ratio to form implantation errors.

[0012] Furthermore, the data comparison results include configuration difficulty, configuration time, configuration accuracy, configuration error correction rate, and configuration completeness rate.

[0013] Furthermore, after generating a visual data chart representing the configuration capabilities of the personnel based on the data comparison results, it is also necessary to store the data comparison results and the corresponding visual data chart to form a historical record that can be queried by time.

[0014] In another aspect, the present invention provides an SCD configuration capability training apparatus for implementing the above-described SCD configuration capability training method, the apparatus comprising: The acquisition module is used to acquire the configuration result of the pre-generated SCD template and the known conditions; wherein, the SCD template generation method includes: generating the SCD template based on the pre-established exam difficulty model, voltage level parameters and generation rules; The verification module is used to compare the configuration results with the standard SCD file item by item to obtain the data comparison results; The generation module is used to generate visual data charts that represent the configuration capabilities of configuration personnel based on the data comparison results.

[0015] Compared with the prior art, the beneficial effects achieved by the present invention are as follows: 1. This invention can generate SCD templates of different voltage levels and difficulties for students to train independently. Given known conditions, students can perform online configuration and verify the configuration results, which comprehensively improves students' SCD configuration capabilities and solves the problem that the current teaching SCD configuration samples are not comprehensive enough and cannot cope with various configuration problems in actual operation and maintenance.

[0016] 2. Based on different difficulty levels and according to a preset allocation ratio, this invention embeds various types of error circuits into a standard SCD file. Combined with actual problems, it comprehensively tests the trainees' error correction ability, achieves full-scenario and multi-difficulty self-training coverage, and solves the problem of scarce traditional teaching samples.

[0017] 3. The present invention also has a historical review mechanism. After generating a visual data chart that can represent the configuration capabilities of the configuration personnel based on the data comparison results, it is also necessary to store the data comparison results and the corresponding visual data chart to form a historical record that can be queried by time, so as to realize the closed loop of "self-training-evaluation-review-targeted reinforcement" and quickly improve the SCD configuration capabilities of trainees. Attached Figure Description

[0018] Figure 1 This is a flowchart of an SCD configuration capability training method provided in an embodiment of the present invention; Figure 2 This is a flowchart of the generated SCD template provided in the embodiments of the present invention; Figure 3 This is a flowchart of the student configuration process for an SCD configuration capability training method provided in an embodiment of the present invention; Figure 4 This is a primary main wiring diagram with a voltage level of 35kV provided in an embodiment of the present invention; Figure 5 This is a primary main wiring diagram with a voltage level of 220kV provided in an embodiment of the present invention; Figure 6 This is a five-dimensional capability assessment radar chart provided in the embodiments of the present invention; Figure 7 This is a schematic diagram of the structure of an SCD configuration capability training device provided in an embodiment of the present invention. Detailed Implementation

[0019] The present invention will be further described below with reference to the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and should not be used to limit the scope of protection of the present invention. Example 1

[0020] like Figure 1 As shown, this embodiment provides an SCD configuration capability training method, including: Obtain the configuration result of the pre-generated SCD template and the known conditions; The method for generating the SCD template includes: generating the SCD template based on a pre-established exam difficulty model, voltage level parameters, and generation rules; Voltage level parameters include 750kV, 500kV, 330kV, 220kV, 110kV, and 35kV; The establishment of the exam difficulty model includes: instantiating corresponding exam content using different difficulty levels; wherein, the difficulty levels include: Level 1 difficulty is indicated as follows: the transformer has two windings, both the high-voltage and low-voltage sides are connected by a single busbar, the secondary equipment is configured as a single set, and there are no errors. Level 2 difficulty is represented as follows: the transformer has two windings, the high-voltage side wiring is a single bus, the low-voltage side wiring is a single bus with sections, and the secondary equipment is a single set of configurations. Compared with Level 1 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 5%. Level 3 difficulty is represented as follows: the transformer has three windings, the high-voltage side wiring method is double busbar, the medium-voltage side and low-voltage side wiring method is single busbar, and the secondary equipment is configured in two sets. Compared with Level 2 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 10%. Level 4 difficulty is represented as follows: the transformer has three windings, the high-voltage side wiring method is double busbar, the medium-voltage side wiring method is single busbar, the low-voltage side is single busbar segmented, and the secondary equipment is configured in two sets. Compared with Level 3 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 15%. Level 5 difficulty is indicated as follows: the transformer is a three-winding transformer, the high-voltage side wiring method is double bus or double bus section, the medium-voltage side wiring method is double bus or double bus section, the low-voltage side wiring method is single bus section, and the secondary equipment is configured in two sets. Compared with Level 4 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 20%. Errors include lost virtual terminals, duplicate virtual terminals, incorrect virtual terminals, and incorrect communication parameters, which are randomly allocated in a ratio of 3:2:3:2 to form implanted errors; like Figure 2 , Figure 3 and Figure 4 As shown, the selected difficulty level in this embodiment is level 2, the voltage level is 35kV, and the generation rule is as follows: The transformer is a two-winding transformer. The high-voltage side is connected by a single bus, and the low-voltage side is connected by a single bus with sections. The secondary equipment is configured as a single set. Compared with difficulty 1, the topological complexity increases, the types and quantities of secondary equipment increase, the error implantation probability is 5%, and the difficulty coefficient is 0.45. It should be noted that, in this embodiment, the primary equipment model library includes: The types of busbar models include single busbar, single busbar segment, double busbar, double busbar single segment, and double busbar double segment; Transformer models include two-winding and three-winding transformers; The types of line models include bus connection, three-way connection, and bridge connection; It matches the primary equipment model of a 35kV two-winding transformer from the primary equipment model library, the primary equipment model of the busbar on the 35kV high-voltage side, the primary equipment model of the single busbar section on the 10kV low-voltage side, and primary equipment models such as circuit breakers, isolating switches, and grounding switches; it automatically generates the primary main wiring diagram in low-code format, and supports adding, deleting, and modifying the primary main wiring diagram by dragging and dropping. The primary equipment model is coded, and a secondary equipment manufacturer is randomly selected from a preset list of secondary equipment manufacturers. The corresponding voltage level secondary equipment ICD model from that manufacturer is then matched based on the code. Specifically: The IEDName of the secondary equipment is automatically generated and written into the ICD model according to the preset intelligent substation IED naming standard. The network address and subnet information of the secondary equipment are automatically generated and written into the ICD model according to the preset network configuration. The secondary equipment model supports adding, deleting and modifying operations. Simplify network configuration by using the first two digits of the IP address as the default network segment, the third digit as the voltage level (99 for public IED devices), and incrementing the fourth digit of the IP address from the default starting IP address to quickly generate IP addresses for all IED devices. For example, if there are 16 IED devices, including 9 35kV IED devices and 7 10kV IED devices, with the default network segment being 192.168.0.0 and the starting IP address being 11, then the IP addresses for the 35kV IED devices will be from 192.168.35.11 to 192.168.35.19, and the IP addresses for the 10kV IED devices will be from 192.168.10.20 to 192.168.10.26. Automatically assigned to station control layer network and process layer network. The station control layer network accesses the S1 node by default. The GOOSE control block MAC address starts from 01-0C-CD-01-01-01 by default, with the last digit incrementing. The application identifier APPID starts from 0101 and increments, as shown in Table 1. Table 1. IED Device IP List A

[0021] Match the corresponding virtual terminal table to the ICD model of the secondary equipment; specifically: Based on the IEDName of the secondary equipment ICD model, the corresponding protection device, measurement and control device, intelligent terminal and merging unit are matched according to the preset secondary equipment configuration principle. Combined with the virtual terminal configuration information of typical intervals, the virtual terminals at both ends of the virtual loop are automatically matched and a virtual terminal table is formed based on the semantic fuzzy recognition of the improved Ratcliff-Obershelp algorithm. The virtual terminal table includes the device port of the starting device and the ending device, the virtual terminal definition, the virtual terminal name, the virtual terminal number and the data attributes. It should be noted that the semantic fuzzy recognition in this embodiment is based on the improved Ratcliff-Obershelp algorithm, which calculates the similarity between the virtual terminal name of this device and the virtual terminal name to be matched, and selects the virtual terminal corresponding to the maximum similarity value greater than the threshold (default 0.5) for matching; for example, after calculation, the similarity between "starting high voltage side circuit failure" and "three-phase start failure input" is 0.68, the similarity between "protection start" and "protection current" is 0.31, the similarity between "protection current" and "TJR closed triple trip" is 0.00; therefore, the virtual terminal of "starting high voltage side circuit failure" of the main transformer protection matches the virtual terminal of "three-phase start failure input" of the bus protection. For example, in a 35kV substation, the transformer is a two-winding transformer with two low-voltage branches; the IEDName of the transformer equipment is PT3501, identified as 35kV transformer protection; first, the devices are matched: automatically matching the PM3501 busbar protection, IM3501 bus tie intelligent terminal, IT3501 main transformer high-voltage side intelligent terminal, MT3501 main transformer high-voltage side merging unit, IBT3501 main transformer body intelligent terminal, and MBT3501 main transformer body merging unit for the 35kV voltage level; automatically matching the PK101 sectional backup protection, IT101 main transformer low-voltage side branch one intelligent terminal, MT101 main transformer low-voltage side branch one merging unit, IT102 main transformer low-voltage side branch two intelligent terminal, and MT102 main transformer low-voltage side branch two merging unit for the 10kV voltage level; then, the virtual terminals are matched, and the virtual terminals between the main transformer protection PT3501 and each device are automatically matched, as shown in Table 2, thus obtaining the standard SCD file; Table 2. List of Dummy Ends Matching A

[0022]

[0023] SCD templates with different difficulty levels are divided using a comprehensive difficulty coefficient, as shown below: ; in, This indicates the overall difficulty coefficient of the SCD template. This indicates a difficulty correction factor. Indicates the complexity of the primary equipment model. express Factor weight coefficients, This indicates the complexity of the secondary equipment ICD model. express Factor weight coefficients, This represents the complexity coefficient of the secondary equipment ICD model. This represents the probability value of implantation error; ; in, Indicates the complexity of the transformer model. express Weighting coefficients; Indicates the complexity of the busbar model. express Weighting coefficients; Indicates the complexity of the circuit model. express Weighting coefficients; ; in, This indicates multiple configuration coefficients. =0.25 indicates a single configuration. =0.5 indicates a dual-set configuration; Indicates the number of secondary equipment. This indicates the maximum number of secondary devices required for the selected voltage level. Indicates the number of secondary equipment types. This indicates the maximum number of secondary equipment types. ; in, Indicates the number of basic faulty links. Indicates the number of ladder errors. Indicates the difficulty level. Indicates the total number of links.

[0024] In summary, this embodiment selects a difficulty level of 2, with an implantation error probability of 0.05. The above device has 59 virtual terminals. The number of error entries is rounded down, resulting in a total of 2 implanted errors. Error categories include missing virtual terminals, duplicate virtual terminals, incorrect virtual terminals, and incorrect port parameters. These are randomly allocated in a 3:2:3:2 ratio. The number of error entries is rounded down, and any shortfall in the total number of implanted errors for each type is supplemented with virtual terminal error types. The allocation result is: 2 virtual terminal errors, i.e., the endpoint virtual terminal with the error, as detailed below: Table 3. List of Virtual Terminal Errors A

[0025] The configuration results are compared item by item with the standard SCD file to obtain the data comparison results, including configuration difficulty, configuration time, configuration accuracy, configuration error correction rate, and configuration completeness rate. like Figure 6 As shown, a five-dimensional capability assessment radar chart is generated, which comprehensively displays the trainee's SCD configuration capabilities; The system stores data comparison results and a five-dimensional capability assessment radar chart, forming a historical record that can be queried by time. Specifically, it automatically pushes 35kV data comparison results containing the corresponding error type and the corresponding SCD template for trainees to strengthen their self-training in a targeted manner.

[0026] Example 2 like Figure 1 As shown, this embodiment provides an SCD configuration capability training method, including: The configuration result of the pre-generated SCD template and the known conditions is obtained; wherein, the method for generating the SCD template includes: generating the SCD template based on the pre-established exam difficulty model, voltage level parameters and generation rules; Voltage level parameters include 750kV, 500kV, 330kV, 220kV, 110kV, and 35kV; The establishment of the exam difficulty model includes: instantiating corresponding exam content using different difficulty levels; wherein, the difficulty levels include: Level 1 difficulty is represented as follows: the transformer has two windings, the high-voltage side and the low-voltage side wiring are both single busbars, the secondary equipment is a single set of configurations, and there are no errors. Level 2 difficulty is represented as follows: the transformer has two windings, the high-voltage side wiring is a single bus, the low-voltage side wiring is a single bus with sections, and the secondary equipment is a single set of configurations. Compared with Level 1 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 5%. Level 3 difficulty is represented as follows: the transformer has three windings, the high-voltage side wiring method is double busbar, the medium-voltage side and low-voltage side wiring method is single busbar, and the secondary equipment is configured in two sets. Compared with Level 2 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 10%. Level 4 difficulty is represented as follows: the transformer has three windings, the high-voltage side wiring method is double busbar, the medium-voltage side wiring method is single busbar, the low-voltage side is single busbar segmented, and the secondary equipment is configured in two sets. Compared with Level 3 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 15%. Level 5 difficulty is indicated as follows: the transformer is a three-winding transformer, the high-voltage side wiring method is double bus or double bus section, the medium-voltage side wiring method is double bus or double bus section, the low-voltage side wiring method is single bus section, and the secondary equipment is configured in two sets. Compared with Level 4 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 20%. Errors include lost virtual terminals, duplicate virtual terminals, incorrect virtual terminals, and incorrect communication parameters, which are randomly allocated in a ratio of 3:2:3:2 to form implanted errors; like Figure 2 , Figure 3 and Figure 5 As shown, the selected difficulty level in this embodiment is level 4, the voltage level is 220kV, and the generation rule is as follows: The transformer is a three-winding transformer with a double busbar segmented connection on the high-voltage side, and a single busbar on the medium-voltage and low-voltage sides. It has two sets of secondary equipment, with an error implantation probability of 15% and a difficulty coefficient of 0.75. It should be noted that, in this embodiment, the primary equipment model library includes: The types of busbar models include single busbar, single busbar segment, double busbar, double busbar single segment, and double busbar double segment; Transformer models include two-winding and three-winding transformers; The types of line models include bus connection, three-way connection, and bridge connection; It matches primary equipment models from the primary equipment model library, including 220kV three-winding transformer primary equipment models, 220kV high-voltage side double busbar segmented primary equipment models, 110kV medium-voltage side single busbar primary equipment models, 10kV low-voltage side single busbar primary equipment models, and primary equipment models such as circuit breakers, isolating switches, and grounding switches; it automatically generates primary main wiring diagrams in low-code format, and supports adding, deleting, and modifying primary main wiring diagrams by dragging and dropping. The primary equipment model is coded, and a secondary equipment manufacturer is randomly selected from a preset list of secondary equipment manufacturers. The corresponding voltage level secondary equipment ICD model from that manufacturer is then matched based on the code. Specifically: The IEDName of secondary devices is automatically generated and written into the ICD model according to the preset intelligent substation IED naming standard. The network address and subnet information of secondary devices are automatically generated and written into the ICD model according to the preset network configuration. The secondary device model supports adding, deleting and modifying operations. Simplify network configuration by using the first two digits of the IP address as the default network segment, the third digit as the voltage level (99 for public IED devices), and incrementing the fourth digit of the IP address from the default starting IP address to quickly generate IP addresses for all IED devices. For example, with 32 IED devices (12 220kV, 10 110kV, and 10 10kV), and a default network segment of 192.168.0.0 with a starting IP address of 11, the IP addresses for the 220kV IED devices would be 192.168.22.11 to 192.168.22.22; for the 110kV IED devices, 192.168.11.23 to 192.168.11.32; and for the 10kV IED devices, 192.168.10.33 to 192.168.10.42. Automatically assigned to station control layer network and process layer network. The station control layer network accesses the S1 node by default. The GOOSE control block MAC address starts from 01-0C-CD-01-01-01 by default, with the last digit incrementing. The application identifier APPID starts from 0101 and increments, as shown in Table 3. Table 4. IED Device IP List B

[0027]

[0028]

[0029] Match the corresponding virtual terminal table to the ICD model of the secondary equipment; specifically: Based on the IEDName of the secondary equipment ICD model, the corresponding protection device, measurement and control device, intelligent terminal and merging unit are matched according to the preset secondary equipment configuration principle. Combined with the virtual terminal configuration information of typical intervals, the virtual terminals at both ends of the virtual loop are automatically matched and a virtual terminal table is formed based on the semantic fuzzy recognition of the improved Ratcliff-Obershelp algorithm. The virtual terminal table includes the device port of the starting device and the ending device, the virtual terminal definition, the virtual terminal name, the virtual terminal number and the data attributes. It should be noted that the semantic fuzzy recognition in this embodiment is based on the improved Ratcliff-Obershelp algorithm, which calculates the similarity between the virtual terminal name of this device and the virtual terminal name to be matched, and selects the virtual terminal corresponding to the maximum similarity value greater than the threshold (default 0.5) for matching; for example, after calculation, the similarity between "starting high voltage side circuit failure" and "three-phase start failure input" is 0.68, the similarity between "protection start" and "protection current" is 0.31, the similarity between "protection current" and "TJR closed triple trip" is 0.00; therefore, the virtual terminal of "starting high voltage side circuit failure" of the main transformer protection matches the virtual terminal of "three-phase start failure input" of the bus protection. For example: In a 220kV substation, the transformer is a three-winding transformer with two low-voltage branches; the transformer equipment's IEDName is PT2201A, identified as the main transformer protection set A; first, the matching devices are: automatically matching the 220kV voltage level PM2201A busbar protection A, IM2201A bus tie intelligent terminal A, IT2201A main transformer high-voltage side intelligent terminal A, MT2201A main transformer high-voltage side merging unit A, IBT2201A main transformer body intelligent terminal, and MBT2201A main transformer body merging unit; automatically matching the 110kV voltage level XM110 The system integrates the following components: IT1101A main transformer medium-voltage side intelligent terminal A, MT1101A main transformer medium-voltage side merging unit A; automatically matches the PK101 segmented backup protection at the 10kV voltage level, IT101A main transformer low-voltage side branch intelligent terminal A, MT101A main transformer low-voltage side branch merging unit A, IT102A main transformer low-voltage side branch two intelligent terminal A, MT102A main transformer low-voltage side branch two merging unit A, and then matches the virtual terminals. The virtual terminals between the main transformer protection PT2201A and each device are automatically matched, as shown in Table 4, thus obtaining the standard SCD file. Table 5. List of Dummy Ends Matching B

[0030]

[0031]

[0032]

[0033]

[0034]

[0035]

[0036]

[0037]

[0038]

[0039]

[0040]

[0041] SCD templates with different difficulty levels are divided using a comprehensive difficulty coefficient, as shown below: ; in, This indicates the overall difficulty coefficient of the SCD template. This indicates a difficulty correction factor. Indicates the complexity of the primary equipment model. express Factor weight coefficients, This indicates the complexity of the secondary equipment ICD model. express Factor weight coefficients, This represents the complexity coefficient of the secondary equipment ICD model. This represents the probability value of implantation error; ; in, Indicates the complexity of the transformer model. express Weighting coefficients; Indicates the complexity of the busbar model. express Weighting coefficients; Indicates the complexity of the circuit model. express Weighting coefficients; ; in, This indicates multiple configuration coefficients. =0.25 indicates a single configuration. =0.5 indicates a dual-set configuration; Indicates the number of secondary equipment. This indicates the maximum number of secondary devices required for the selected voltage level. Indicates the number of secondary equipment types. This indicates the maximum number of secondary equipment types. ; in, Indicates the number of basic faulty links. Indicates the number of ladder errors. Indicates the difficulty level. Indicates the total number of links.

[0042] In summary, the selected difficulty level was 4, with an error implantation probability of 0.15. The device had 77 virtual terminals. After rounding down the number of error entries, a total of 11 errors were implanted. Error categories included missing virtual terminals, duplicate virtual terminals, incorrect virtual terminals, and port parameter errors. These were randomly allocated in a 3:2:3:2 ratio. The number of error entries was rounded down, and any shortfall in the total number of errors of each type was supplemented with virtual terminal error types. The allocation results were: 3 missing virtual terminals, 2 duplicate virtual terminals, 4 incorrect virtual terminals, and 2 port parameter errors, as detailed below: Table 6. List of Virtual Terminal Errors B

[0043] The configuration results are compared item by item with the standard SCD file to obtain the data comparison results, including configuration difficulty, configuration time, configuration accuracy, configuration error correction rate, and configuration completeness rate. like Figure 6 As shown, a five-dimensional capability assessment radar chart is generated, which comprehensively displays the trainee's SCD configuration capabilities; The system stores data comparison results and a five-dimensional capability assessment radar chart, forming a historical record that can be queried by time. Specifically, it automatically pushes 35kV data comparison results containing the corresponding error type and the corresponding SCD template for trainees to strengthen their self-training in a targeted manner.

[0044] Example 3 like Figure 7 As shown, an SCD configuration capability training device is used to implement the above-mentioned SCD configuration capability training method. The device includes: The acquisition module is used to acquire the configuration result of the pre-generated SCD template and the known conditions; wherein, the SCD template generation method includes: generating the SCD template based on the pre-established exam difficulty model, voltage level parameters and generation rules; The verification module is used to compare the configuration results with the standard SCD file item by item to obtain the data comparison results; The generation module is used to generate visual data charts that represent the configuration capabilities of configuration personnel based on the data comparison results.

[0045] Those skilled in the art will understand that embodiments of this application can be provided as methods, apparatus, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage CD-ROMs, optical storage, etc.) containing computer-usable program code.

[0046] This application is described with reference to flowchart illustrations of methods, apparatus (systems), and computer program products according to embodiments of this application. It should be understood that each step in the flowchart can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing device, generate instructions for implementing the process. Figure 1 One or more processes or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0047] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 The function specified in one or more processes.

[0048] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 Steps of a specified function in one or more processes.

[0049] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.

Claims

1. A method for training SCD configuration capabilities, characterized in that, include: Obtain the configuration result of the pre-generated SCD template and the known conditions; The method for generating the SCD template includes: generating the SCD template based on a pre-established exam difficulty model, voltage level parameters, and generation rules; The configuration results are compared item by item with the standard SCD file to obtain the data comparison results; Based on the data comparison results, a visual data chart is generated that can represent the configuration capabilities of the configuration personnel.

2. The SCD configuration capability training method according to claim 1, characterized in that, The voltage level parameters include 750kV, 500kV, 330kV, 220kV, 110kV, and 35kV.

3. The SCD configuration capability training method according to claim 1, characterized in that, The SCD template generated based on the pre-established exam difficulty model, voltage level parameters, and corresponding generation rules includes: Based on the selected voltage level, the substation architecture is randomly selected from the primary equipment model library to generate the corresponding primary main wiring diagram; The selected substation architecture is coded, and a secondary equipment manufacturer is randomly selected from the preset list of secondary equipment manufacturers. The secondary equipment ICD model corresponding to the voltage level parameters of the secondary equipment manufacturer is matched according to the code. Match the corresponding virtual terminal table to the ICD model of the secondary equipment; Based on the primary wiring diagram, secondary equipment ICD model, and virtual terminal table, generate a standard SCD file according to the generation rules. The pre-established test difficulty model is applied to the standard SCD file to generate SCD templates with different difficulty levels.

4. The SCD configuration capability training method according to claim 3, characterized in that, The primary equipment model library includes: The types of busbar models include single busbar, single busbar segment, double busbar, double busbar single segment, and double busbar double segment; Transformer models include two-winding and three-winding transformers; The types of line models include bus connection, three-way connection, and bridge connection.

5. The SCD configuration capability training method according to claim 4, characterized in that, The establishment of the exam difficulty model includes: The exam questions are instantiated using different difficulty levels. The difficulty levels include: Level 1 difficulty is represented as: The transformer is a two-winding transformer, with a single busbar connection on both the high-voltage and low-voltage sides. The secondary equipment is configured as a single set, with no errors in its configuration. Level 2 difficulty is represented as: The transformer has two windings, with a single busbar connection on the high-voltage side and a single busbar with sectionalized low-voltage side connections. The secondary equipment is configured as a single set. Compared to Level 1 difficulty, the topology complexity increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 5%. Level 3 difficulty is represented as: The transformer has three windings, with a double busbar connection on the high-voltage side and a single busbar connection on the medium- and low-voltage sides. It has two sets of secondary equipment. Compared with the level 2 difficulty, the topology complexity increases, the types and number of secondary equipment increase, and the probability of error implantation is 10%. Level 4 difficulty is represented as: The transformer has three windings, with a double busbar connection on the high-voltage side, a single busbar connection on the medium-voltage side, and a single busbar segmented connection on the low-voltage side. It also has two sets of secondary equipment. Compared to the level 3 difficulty, the topology complexity increases, the types and number of secondary equipment increase, and the probability of error implantation is 15%. Level 5 difficulty is represented as: The transformer is a three-winding transformer. The high-voltage side wiring method is double bus or double bus section, the medium-voltage side wiring method is double bus or double bus section, and the low-voltage side wiring method is single bus section. The secondary equipment is configured in two sets. Compared with the level 4 difficulty, the complexity of the topology structure increases, the types and quantities of secondary equipment increase, and the probability of error implantation is 20%.

6. The SCD configuration capability training method according to claim 3, characterized in that, The process of applying a pre-established exam difficulty model to a standard SCD file to generate SCD templates with different difficulty levels includes: Based on a pre-established exam difficulty model, the topological complexity and wiring method of the standard SCD file are changed and errors are injected to generate SCD templates with different difficulty levels. The SCD templates with different difficulty levels are divided using a comprehensive difficulty coefficient, as shown below: ; in, This indicates the overall difficulty level of the SCD template. This indicates a difficulty correction factor. This represents the complexity of the primary equipment model. express Factor weight coefficients, This indicates the complexity of the secondary equipment ICD model. express Factor weight coefficients, This represents the complexity coefficient of the secondary equipment ICD model. This represents the probability value of implantation error; ； in, Indicates the complexity of the transformer model. express Weighting coefficients; Indicates the complexity of the busbar model. express Weighting coefficients; Indicates the complexity of the circuit model. express Weighting coefficients; ； in, This indicates multiple configuration coefficients. =0.25 indicates a single configuration. =0.5 indicates a dual-set configuration; Indicates the number of secondary equipment. This indicates the maximum number of secondary devices required for the selected voltage level. Indicates the number of secondary equipment types. This indicates the maximum number of secondary equipment types. ； in, Indicates the number of basic faulty links. Indicates the number of ladder errors. Indicates the difficulty level. Indicates the total number of links.

7. The SCD configuration capability training method according to claim 6, characterized in that, The errors include virtual terminal loss, virtual terminal duplication, virtual terminal error, and communication parameter error, which are randomly allocated according to a preset ratio to form implantation errors.

8. The SCD configuration capability training method according to claim 1, characterized in that, The data comparison results include configuration difficulty, configuration time, configuration accuracy, configuration error correction rate, and configuration completeness rate.

9. The SCD configuration capability training method according to claim 1, characterized in that, After generating a visual data chart representing the configuration capabilities of the personnel based on the data comparison results, it is also necessary to store the data comparison results and the corresponding visual data chart to form a historical record that can be queried by time.

10. An SCD configuration capability training device, characterized in that, The apparatus for implementing the SCD configuration capability training method according to claim 1 includes: The acquisition module is used to obtain the configuration results of the pre-generated SCD template and the known conditions. The method for generating the SCD template includes: generating the SCD template based on a pre-established exam difficulty model, voltage level parameters, and generation rules; The verification module is used to compare the configuration results with the standard SCD file item by item to obtain the data comparison results; The generation module is used to generate visual data charts that represent the configuration capabilities of configuration personnel based on the data comparison results.

Images