Dark level correction method and system based on brightness and temperature joint constraint
By combining a dark level correction method with brightness and temperature constraints in a CMOS sensor, the dark level drift problem was solved, and the stability of dark area brightness and the imaging quality were improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 深圳森云智能科技有限公司
- Filing Date
- 2026-04-21
- Publication Date
- 2026-07-10
AI Technical Summary
Existing dark level correction methods have failed to effectively address the dark level drift problem of CMOS sensors under long-term operation or temperature changes, resulting in unstable brightness and color shift in dark areas.
By acquiring operating temperature information in the field environment, and combining the dark level reference value in the brightness dimension and the dark level correction component in the temperature dimension, dark level correction parameters adapted to the current temperature conditions are generated, and dark level correction processing is performed.
It improves the stability of pixel levels in dark areas under different temperature conditions, reduces the probability of color shift in dark areas, and ensures image quality.
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