Microwave electric field measurement system and method based on rydberg atom fluorescence imaging
By using fluorescence imaging technology based on Rydberg atoms, the problems of insufficient spatial resolution and low signal-to-noise ratio in existing microwave electric field measurements have been solved, achieving high-precision microwave electric field measurement and improving the spatial resolution and signal-to-noise ratio of the measurement system.
Patent Information
- Application Number
- CN202610818740.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-06-08
- Publication Date
- 2026-07-17
AI Technical Summary
Existing microwave electric field measurement techniques based on Rydberg atoms suffer from insufficient spatial resolution and low signal-to-noise ratio, making it difficult to achieve high-precision microwave electric field measurements.
A microwave electric field measurement system based on Rydberg atomic fluorescence imaging was adopted. The probe light and the coupling light were respectively incident on the atomic gas cell through the probe light path and the coupling light path. The frequency of the coupling light was modulated by the optical modulation component, the fluorescence acquisition component collected the fluorescence signal of the stimulated emission of atoms, and the data acquisition component was used for synchronous control to reconstruct the fluorescence EIT spectrum and calculate the microwave electric field intensity.
It improves the spatial resolution and signal-to-noise ratio of microwave electric field measurement, optimizes measurement accuracy, reduces background noise interference, and realizes high signal-to-noise ratio precision measurement of microwave electric fields.
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Abstract
Citation Information
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