A method for detecting the life of a radio frequency switch, an electronic device, and a program product
By connecting directional couplers in series at both ends of the RF switch for online testing, the problem of complex and inaccurate RF switch life testing is solved, and efficient and accurate life testing and fault identification are achieved.
CN122410285APending Publication Date: 2026-07-17SHENZHEN TSIMEC CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN TSIMEC CO LTD
- Filing Date
- 2026-04-22
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing technologies for testing the lifespan of radio frequency switches are complex and inaccurate, typically requiring offline removal before testing, which leads to complicated operations and inaccurate test results.
Method used
By connecting a first directional coupler and a second directional coupler in series across the two ends of an RF switch, and using a detector to monitor the signal at the coupled output, lifetime detection is performed based on insertion loss, thus achieving online detection.
Benefits of technology
It can accurately detect the lifespan of RF switches and identify fault types without affecting the normal transmission of RF signals, thus improving the accuracy and convenience of detection.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN122410285A_ABST
Abstract
本申请公开了一种射频开关的寿命检测方法、电子设备及程序产品，应用于射频技术领域，包括：通过驱动电路控制射频开关进行导通状态和关断状态的循环切换；通过检测器，监测第一定向耦合器的耦合输出端的输出信号，作为第一检测信号；监测第二定向耦合器的耦合输出端的输出信号，作为第二检测信号；基于第一检测信号和第二检测信号，对射频开关导通状态下的插入损耗以及关断状态下的插入损耗进行更新；当检测到导通状态下的插入损耗和 / 或关断状态下的插入损耗异常时，记录当前的循环切换累积次数，作为所确定出的射频开关的寿命检测结果。应用本申请的方案，可以方便、准确地实现射频开关的寿命检测。
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