Micro-deformation detection system, method, storage medium and electronic device

Abstract

Embodiments of the present application provide a micro-deformation detection system, method, storage medium and electronic device. The system comprises: a reflection device configured to receive an excitation signal emitted by a signal source device, modulate the excitation signal, and backscatter the modulated excitation signal, wherein the reflection device is arranged on a target object; and a receiving device configured to receive the backscattered signal from the reflection device, determine a radial deformation variable of the target object based on the backscattered signal, and determine a horizontal deformation variable or a vertical deformation variable of the target object based on a positional relationship between the reflection device and the receiving device and the radial deformation variable. By using the backscattered signal of the reflection device to detect the horizontal deformation variable or the vertical deformation variable of the object, the hardware cost and power consumption are low, and the problem of high power consumption and cost caused by using a sensing base station to perceive the micro-deformation of the object in the related art is solved, thereby achieving the effect of low-power micro-deformation perception.

Description

Technical Field

[0001] This application relates to the field of communications, and more specifically, to a micro-deformation detection system, method, storage medium, and electronic device. Background Technology

[0002] Minor deformations of objects are a common phenomenon in daily life, such as the tilting of buildings, the subsidence of roads, the deformation of bridges, and the sliding of slopes. These changes in the target state usually do not occur suddenly, but are the result of the continuous accumulation of small deformations, which eventually trigger a change in the target state at a certain moment. Therefore, minor deformations of objects can lead to significant safety problems.

[0003] The coexistence or integration of communication and sensing functions is one of the key enabling technologies for next-generation mobile communication systems and a current research focus in academia and industry. Utilizing sensing base stations to detect minute deformations of objects has also become a major use case of interest in the industry. Next-generation mobile communication systems with sensing capabilities can continuously detect targets of interest in the environment using widely deployed sensing nodes in the network, uninterruptedly acquiring information on the target's state changes over time. However, traditional methods for detecting minute deformations using base stations may result in high power consumption and cost due to the direct transmission and reception of signals.

[0004] There is no good solution to the above problems yet. Summary of the Invention

[0005] This application provides a micro-deformation detection system, method, storage medium, and electronic device to at least solve the problem of high power consumption and cost caused by using a sensor base station to sense micro-deformation of an object in related technologies.

[0006] According to one embodiment of this application, a micro-deformation detection system is provided, comprising: a reflective device for receiving an excitation signal emitted by a signal source device and modulating the excitation signal before backscattering it, wherein the reflective device is disposed on a target object; and a receiving device for receiving the backscattered signal from the reflective device, determining the radial deformation of the target object based on the backscattered signal, and determining the horizontal or vertical deformation of the target object based on the positional relationship between the reflective device and the receiving device and the radial deformation.

[0007] According to another embodiment of this application, a method for detecting minute deformation is provided, applied to a receiving device, comprising: receiving a backscattered signal from a reflective device disposed on a target object, wherein the backscattered signal is an excitation signal received by the reflective device from a signal source device, the excitation signal being modulated and backscattered to the receiving device; determining the radial deformation of the target object based on the backscattered signal; and determining the horizontal or vertical deformation of the target object based on the positional relationship between the reflective device and the receiving device and the radial deformation.

[0008] According to yet another embodiment of this application, a computer-readable storage medium is also provided, which stores a computer program, wherein the computer program, when executed by a processor, implements the steps in any of the above method embodiments.

[0009] According to yet another embodiment of this application, an electronic device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in any of the above method embodiments.

[0010] According to yet another embodiment of this application, a computer program product is also provided, including a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0011] Through the above embodiments of this application, the horizontal or vertical deformation of an object can be detected by using the backscattered signal of the reflective device. The hardware cost and power consumption are low, which solves the problem of high power consumption and cost caused by using a sensing base station to sense the small deformation of an object in related technologies, and thus achieves the effect of low power consumption for sensing small deformation. Attached Figure Description

[0012] Figure 1 This is a structural block diagram of a micro-deformation detection system according to an embodiment of this application;

[0013] Figure 2 This is a schematic flowchart of a minute deformation detection method according to an embodiment of this application;

[0014] Figure 3 This is a schematic diagram of detecting vertical deformation in one embodiment of this application;

[0015] Figure 4 This is a schematic diagram of detecting horizontal deformation in one embodiment of this application;

[0016] Figure 5 This is a structural block diagram of a computer device according to an embodiment of this application. Detailed Implementation

[0017] The embodiments of this application will be described in detail below with reference to the accompanying drawings and examples.

[0018] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0019] In one embodiment of this application, a micro-deformation detection system is provided. Figure 1 This is a structural block diagram of a micro-deformation detection system according to an embodiment of this application, such as... Figure 1 As shown, the system includes the following structure:

[0020] The reflector 10 is used to receive the excitation signal emitted by the signal source device, and to modulate and backscatter the excitation signal. The reflector is disposed on the target object.

[0021] The receiving device 20 is used to receive the backscattered signal from the reflecting device, determine the radial deformation of the target object based on the backscattered signal, and determine the horizontal or vertical deformation of the target object based on the positional relationship between the reflecting device and the receiving device and the radial deformation.

[0022] In this embodiment, by utilizing the backscattering of the excitation signal by a reflective device mounted on the target object, the micro-deformation detection system can accurately capture the minute deformations of the target object, ensuring structural safety. The target object can include, but is not limited to, large building structures such as bridges, high-rise buildings, and dams. In this embodiment, the hardware cost of the reflective and receiving devices is low, the excitation signal required for detection can come from outside the system (such as signals from the environment), and the overall system power consumption is low.

[0023] In this embodiment, the horizontal or vertical deformation of an object can be detected by using the backscattered signal of the reflector. The hardware cost of the reflector and receiver is low, and the excitation signal required for detection can come from outside the system (such as signals in the environment). Therefore, the overall power consumption of the detection system is low, which can solve the problem of high power consumption and cost caused by using a sensor base station to sense the small deformation of an object in related technologies, and thus achieve the effect of low power consumption and small deformation sensing.

[0024] In some embodiments, the backscattering of the excitation signal by the reflecting device 10 can be achieved based on Orthogonal Frequency Division Multiplexing (OFDM) backscattering technology. OFDM backscattering technology is a type of Ambient Backscatter Communication (AmBC). OFDM backscattering technology utilizes the characteristics of OFDM signals to transmit data by reflecting the received OFDM signal through a backscattering tag. Specifically, the backscattering tag selectively changes the characteristics (such as amplitude, phase, or frequency) of its reflected signal according to the data information to be transmitted, thereby achieving data modulation and transmission.

[0025] In some embodiments, the reflective device 10 may include, but is not limited to, active and passive tags. Both active and passive tags are Radio Frequency Identification (RFID) tags, which do not require active signal transmission and therefore have extremely low power consumption. Passive tags do not require a built-in battery; they generate an induced current after their antenna receives an excitation signal and modulate the reflected signal by changing the antenna's load impedance. The use of passive tags can further reduce the cost and power consumption of the detection system.

[0026] In some embodiments, the receiving device 20 may include, but is not limited to, user equipment (UE), and the receiving device 20 may utilize a specific detection algorithm to identify backscattered signals. For example, the detection algorithm includes, but is not limited to, energy detection or maximum likelihood detection.

[0027] In some embodiments, the system further includes a signal source device, wherein the signal source device includes: a signal source device already present in the environment, or a dedicated signal source device.

[0028] In one exemplary embodiment, the signal source device already present in the environment may include: a mobile communication base station, a Wi-Fi router, or other OFDM infrastructure. The excitation signal may be an OFDM signal or a wireless communication signal, such as a New Radio (NR) signal, a Long Term Evolution (LTE) signal, or a Wi-Fi signal. This embodiment can utilize existing signal source devices in the environment as excitation signal sources, reducing the need to deploy new base stations, thereby reducing costs and power consumption; it can also achieve coexistence with existing OFDM communication systems, such as LTE and Wi-Fi, achieving seamless integration; and it can also utilize existing OFDM signal sources to expand the coverage of communication and deformation sensing functions.

[0029] In one exemplary embodiment, the type of dedicated signal source device includes, but is not limited to, wireless communication signal sources, Wi-Fi signal sources, etc. Correspondingly, the excitation signal can be a dedicated excitation signal emitted by the dedicated signal source device, such as a dedicated OFDM signal or a dedicated Wi-Fi signal. This embodiment improves the accuracy and reliability of detection by setting a dedicated signal source device and performing deformation detection based on a dedicated excitation signal.

[0030] In one exemplary embodiment, the dedicated excitation signal may be an orthogonal frequency division multiplexing with linear frequency modulation (OFDM-LFM) signal.

[0031] In one exemplary embodiment, the dedicated excitation signal can be transmitted using a dedicated excitation subband. By setting a separate excitation subband, it is possible to distinguish it from the demodulation subband used for data transmission, thereby improving the accuracy of signal detection and increasing spectrum utilization efficiency.

[0032] In some embodiments, the reflecting device 10 can modulate the excitation signal using on-off keying (OOK), binary phase shift keying (BPSK), or quadrature amplitude modulation (QAM). Different modulation schemes can be used to adapt to different communication requirements. Furthermore, these modulation methods enable the reflecting device to process the excitation signal more effectively, improving the recognition accuracy of the backscattered signal and the detection accuracy of the receiving device.

[0033] In some embodiments, the reflection device 10 modulates the excitation signal using single-sideband modulation (SSB), which can reduce the occupation of spectrum resources and reduce signal transmission power.

[0034] In some embodiments, the reflecting device 10 may use different encoding methods such as Manhattan encoding or Manchester encoding to communicate with the receiving device 20.

[0035] In some embodiments, the receiving device is further configured to determine the radial deformation of the target object based on the backscattered signal in the following manner:

[0036] 1) Channel estimation is performed based on the first backscattered signal received at the reference time and the second backscattered signal received at the target time to obtain the channel information at the reference time and the channel information at the target time;

[0037] 2) Determine the phase change of the target time relative to the reference time based on the channel information at the reference time and the channel information at the target time;

[0038] 3) Determine the radial deformation of the target object based on the phase change, where the radial deformation is the radial deformation of the target object at a time relative to the reference time.

[0039] In this embodiment, the radial deformation of the target object during this period can be determined based on the phase change of the backscattered signal at different times. This enables accurate measurement and continuous detection of the target object and has a wide range of applications, such as health monitoring of large buildings and earthquake early warning.

[0040] In some embodiments, the positional relationship between the reflecting device and the receiving device includes the vertical angle between the radial and vertical directions of the reflecting device and the receiving device.

[0041] In this embodiment, the positional relationship between the reflecting device and the receiving device can be predetermined when setting up the reflecting device and the receiving device. In one exemplary embodiment, the vertically upward direction can be set as the positive direction of the vertical direction, and the range of the vertical angle can be 0 to 180°. In another exemplary embodiment, the positive direction of the vertical direction can be disregarded, and the vertical direction can be set as the direction of the surface normal, and the range of the vertical angle can be 0 to 90°.

[0042] In this embodiment, the number of reflecting devices can be one or more, with multiple reflecting devices positioned at different locations on the target object. Besides the vertical angle, the positional relationship between the reflecting device and the receiving device can also include the distance between them; that is, the angles and / or distances corresponding to the multiple reflecting devices are different. In this embodiment, based on the relative positional relationship between each reflecting device and the receiving device, the detection system can convert radial deformation into more intuitive horizontal or vertical deformation, improving the user experience.

[0043] In some embodiments, the receiving device is further configured to determine the horizontal or vertical deformation of the target object based on the positional relationship between the reflecting device and the receiving device and the radial deformation in the following manner:

[0044] 1) Determine the horizontal deformation of the target object based on the sine of the radial deformation and the vertical angle; and / or,

[0045] 2) Determine the vertical deformation of the target object based on the cosine value of the radial deformation and the vertical angle.

[0046] In this embodiment, by converting radial deformation variables into more intuitive horizontal or vertical deformation variables, users can gain a more comprehensive understanding of the deformation of the target object.

[0047] In an exemplary embodiment, the reflective device may be configured such that the vertical angle between the reflective device and the receiving device is 0°, in which case the vertical deformation of the reflective device is equal to the radial deformation.

[0048] In some embodiments, the positional relationship between the reflecting device and the receiving device may further include: the azimuth angle between the radial projection of the reflecting device to the receiving device onto the horizontal plane and the first reference direction.

[0049] In some embodiments, the receiving device is further configured to determine a first directional deformation of the target object in the first reference direction based on the horizontal deformation and the cosine value of the azimuth angle; and / or to determine a second directional deformation of the target object in the second reference direction based on the horizontal deformation and the sine value of the azimuth angle; wherein the first reference direction and the second reference direction are both located on the horizontal plane, and the first reference direction is perpendicular to the second reference direction.

[0050] In an exemplary embodiment, the first reference direction can be the geographical east / west direction, and correspondingly, the first direction deformation is the east-west deformation. The second reference direction is the geographical south / north direction, and the second direction deformation is the north-south deformation.

[0051] In another exemplary embodiment, the first reference direction may also be the geographic north / south direction. Correspondingly, the first direction deformation is the north-south deformation, the second reference direction is the geographic east / west direction, and the second direction deformation is the east-west deformation.

[0052] In this embodiment, by calculating the deformation in the east-west / north-south direction, the minute deformation of the target object on the horizontal plane can be assessed more accurately and intuitively.

[0053] In some embodiments, the formulas for calculating the horizontal or vertical deformation of the target object can be derived from the dot product formula of the radial deformation ΔR:

[0054] ΔR=Δx·sinα·cosβ+Δy·sinα·sinβ+Δz·cosα;

[0055] Where α is the vertical angle, which is the angle between the radial direction of the reflector to the receiver and the vertical direction (such as the surface normal), β is the azimuth angle, which is the angle between the radial projection of the reflector to the receiver and the east-west direction, Δx is the deformation in the east-west direction (positive direction is east), Δy is the deformation in the north-south direction (positive direction is north), and Δz is the vertical deformation (positive direction is upward).

[0056] In an exemplary embodiment, it can be assumed that the reflecting device and the receiving device are positioned in the vertical direction or nearly vertical direction, i.e., the vertical angle α is equal to or close to 0°. Then, Δx·sinα·cosβ + Δy·sinα·sinβ is approximately zero, and ΔR = Δz·cosα can be obtained. Furthermore, the vertical deformation Δz can be expressed as Δz = ΔR / cosα. In this embodiment, the closer the vertical angle α is to 0°, the smaller the calculation deviation of the vertical deformation and the more accurate the calculation result. For example, when α = 0°, Δz = ΔR, and the radial deformation of the target object is the vertical deformation.

[0057] In an exemplary embodiment, it can be assumed that the reflecting device and the receiving device are positioned on the same horizontal plane or nearly horizontal, i.e., the vertical angle α is equal to or close to 90°. Then, Δz·cosα is approximately zero, and we can obtain ΔR = Δx·sinα·cosβ + Δy·sinα·sinβ = sinα·(Δx·cosβ + Δy·sinβ). Replacing Δx·cosβ + Δy·sinβ with the horizontal deformation ΔL, we can express the horizontal deformation ΔL as ΔL = ΔR / sinα. In this embodiment, the closer the vertical angle α is to 90°, the smaller the calculation deviation of the horizontal deformation and the more accurate the calculation result. For example, when α = 90°, ΔL = ΔR, and the radial deformation of the target object is the horizontal deformation.

[0058] In an exemplary embodiment, based on ΔL = Δx·cosβ + Δy·sinβ, it can be assumed that the relative positions of the reflecting device and the receiving device in the horizontal plane are close to the east-west direction, that is, the azimuth angle β is equal to or close to 0°. Then Δy·sinβ is approximately zero, and ΔL = Δx·cosβ can be obtained. Furthermore, the deformation Δx in the east-west direction can be expressed as Δx = ΔL / cosβ. In this embodiment, the closer the azimuth angle β is to 0°, the smaller the calculation deviation of the deformation in the east-west direction, and the more accurate the calculation result. For example, when β = 0°, Δx = ΔL, and the horizontal deformation of the target object is the deformation in the east-west direction.

[0059] In an exemplary embodiment, based on ΔL = Δx·cosβ + Δy - sinβ, it can be assumed that the relative positions of the reflecting device and the receiving device in the horizontal plane are close to the north-south direction, i.e., the azimuth angle β is equal to or close to 90°. Then Δx·cosβ is approximately zero, and ΔL = Δy·sinβ can be obtained. Furthermore, the deformation Δy in the north-south direction can be expressed as Δy = ΔL / sinβ. In this embodiment, the closer the azimuth angle β is to 90°, the smaller the calculation deviation of the deformation in the north-south direction, and the more accurate the calculation result. For example, when β = 90°, Δy = ΔL, and the horizontal deformation of the target object is the deformation in the north-south direction.

[0060] In some embodiments, the system may further include: a reconfigurable intelligent surface (RIS) panel for converting the transmission path of an excitation signal into a first NLOS path under non-line-of-sight (NLOS) conditions, and / or converting the transmission path of a backscattered signal into a second NLOS path, wherein the first NLOS path includes a path between the signal source device and the RIS panel and a path between the RIS panel and the reflector, and the second NLOS path includes a path between the reflector and the RIS panel and a path between the RIS panel and the receiver.

[0061] In this embodiment, the NLOS condition refers to a situation where the line of sight between the signal source device and the reflector, and / or between the reflector and the receiver device, is blocked by an obstacle. The RIS panel, also known as a smart metasurface or intelligent reflective surface (IRS), is used in this embodiment to enable the system to maintain effective detection capabilities even in environments with obstructed visibility. This makes it suitable for infrastructure monitoring in complex urban environments, such as safety inspections of subway tunnels.

[0062] In one exemplary embodiment, if the direct line of sight of the signal source device-reflector is blocked, a RIS panel can be positioned appropriately to convert the direct line of sight of the signal source device-reflector into an NLOS path of the signal source device-RIS panel-reflector. Since the path of the backscattered signal remains unchanged, the horizontal or vertical deformation can be determined based on the positional relationship between the reflector and the receiver according to the method described in the above embodiments.

[0063] In one exemplary embodiment, if the direct line of sight of the reflector-receiver is blocked, the RIS panel can be positioned appropriately to convert the direct line of sight of the reflector-receiver into an NLOS path of reflector-RIS panel-receiver. Since the path of the backscattered signal changes, the horizontal or vertical deformation can be determined based on the positional relationship between the reflector, RIS panel, and receiver.

[0064] In one exemplary embodiment, if both the direct line-of-sight path of the signal source device to the reflector and the direct line-of-sight path of the reflector to the receiver are blocked, RIS panels can be deployed on both paths. This transforms the direct line-of-sight path of the signal source device to the reflector into a first NLOS path of the signal source device to the RIS panel to the reflector, and the direct line-of-sight path of the reflector to the receiver into a second NLOS path of the reflector to the RIS panel to the receiver. Since the path of the backscattered signal changes, the horizontal or vertical deformation can be determined based on the positional relationship between the reflector, the RIS panel, and the receiver.

[0065] In some embodiments, the number of reflective devices is one or more, and in the case of multiple reflective devices, the multiple reflective devices are disposed at different locations on the target object. For example, one receiving device may correspond to one or more target objects, and each target object can be detected at multiple points. The detection system can construct a deformation distribution map of the target object, suitable for comprehensive health monitoring of large buildings, ensuring the overall safety of the structure.

[0066] In this embodiment, the receiving device is further configured to determine the deformation information of the target object based on the backscattered signals received from multiple reflecting devices at multiple times. The deformation information includes deformation amount information, which may include at least one of the following: radial deformation amount of the multiple reflecting devices, horizontal deformation amount of the multiple reflecting devices, or vertical deformation amount of the multiple reflecting devices. In this embodiment, the specific method by which the receiving device determines the deformation amount information of the target object based on the backscattered signals can be referred to the relevant descriptions in the above embodiments, and will not be repeated here. By continuously receiving backscattered signals at multiple times, the receiving device can achieve continuous detection of the target object, determine the deformation amount information at multiple times, and thus promptly detect safety risks in the building structure, achieving safety risk early warning.

[0067] In this embodiment, the multiple times include a reference time and multiple target times. Therefore, the deformation information may include the deformation information of each reflective device at each of the multiple target times relative to the reference time. For example, if the multiple times include a reference time t0 and multiple target times t1, t2, t3, etc., then the deformation information may include deformation information from t0 to t1, deformation information from t0 to t2, and deformation information from t0 to t3, etc.

[0068] In some embodiments, the distribution of multiple reflective devices includes a discrete distribution or an array distribution. A discrete distribution is suitable for detecting specific areas of a target object, while an array distribution can provide more comprehensive deformation information and is suitable for all-round health monitoring of large structures.

[0069] In some embodiments, the deformation information may further include at least one of the following:

[0070] Time-series information of multiple reflecting devices, including channel information of multiple reflecting devices at multiple times;

[0071] Interference information includes the conjugate multiplication result of multiple reflectors at multiple target times. The conjugate multiplication result is obtained by multiplying the channel information of each reflector at the target time with the channel information at the reference time. The multiple times include the reference time and multiple target times.

[0072] Interference phase information includes the phase change of multiple reflecting devices at multiple target times relative to a reference time, wherein the phase change is the phase of the conjugate multiplication result;

[0073] Coherence information includes coherence values ​​of multiple reflecting devices at multiple target times relative to a reference time, wherein the coherence values ​​are the magnitudes of the conjugate multiplication results;

[0074] Deformation curve information of one or more specific reflective devices among multiple reflective devices at multiple target times;

[0075] Deformation information of multiple reflecting devices relative to a reference time at a specific target time;

[0076] Deformation curves and deformation trends of multiple specific reflective devices with the same distance but different angles, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves;

[0077] Deformation curves and deformation trends of multiple specific reflective devices at different distances but the same angle, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves;

[0078] Vibration amplitude and frequency information of one or more specific reflective devices, wherein the vibration amplitude and frequency information are determined based on deformation curve information.

[0079] In this embodiment, the aforementioned angle may include only the vertical angle, or it may include both the vertical angle and the azimuth angle. Different angles may include the same vertical angle but different azimuth angles, different vertical angles but the same azimuth angle, or both the vertical angle and the azimuth angle may be different.

[0080] In this embodiment, various forms of deformation information are provided as deformation detection results. This not only provides the real-time state of the target object but also predicts its future deformation trend. It is suitable for long-term monitoring of key infrastructure such as bridges and dams, and provides early warning of potential structural risks.

[0081] In some embodiments, each reflecting device corresponds to a time-series information, which includes channel information at multiple time points. The channel information is obtained by the receiving device through channel estimation based on the backscattered signal at the corresponding time point. For example, the reflecting devices are positioned at different locations and can be identified by their distance r and angle θ relative to the receiving device. The time-series information of one reflecting device can be represented as follows: The time-series information of multiple reflecting devices can be represented as a two-dimensional image. Each row contains the time-series information of one reflecting device, such as scattering information (e.g., channel information) at N time points. Each column contains the scattering information of multiple reflecting devices at various distances and angles at a single time point. Assuming there are M reflecting devices, the two-dimensional image can be represented as G, with a size of M*N.

[0082] In some embodiments, the interference information can be determined as follows: the second to Nth columns of the above two-dimensional image are sequentially multiplied by the conjugate of the first column to obtain a new two-dimensional image (i.e., the interference information image) I, with a size of M*(N-1). Here, the first column is selected as the reference time, and the other columns are the target times.

[0083] In some embodiments, the interference phase information is the phase of the interference information. The interference phase image can be obtained by taking the phase of the interference information image I. Where I represents the interferometric information image, The term "phase diagram" is used to represent the phase of a backscattered signal from a reflector at a target time relative to a reference time.

[0084] In some embodiments, the coherence information is the modulus of the interference information. The coherence map can be obtained by taking the modulus of the interference information image I. For example, the modulus can be obtained by normalization according to the coherence calculation formula, as follows: in, The graph represents the coherence map, and abs indicates normalization. In this embodiment, coherence information can be used as a reference for the confidence level of detection results (such as phase change). A large coherence value indicates high confidence, while a small coherence value indicates low confidence. Therefore, coherence information can be used as a condition for reporting detection results. For example, the receiving device can only report detection results with a confidence level greater than or equal to a confidence threshold to the sensing device.

[0085] In some embodiments, the deformation information can be obtained from the above-mentioned interferometric information / interferometric phase diagram and the deformation inversion formula to calculate the deformation of each target time relative to the reference time. The calculation formula is as follows:

[0086] Where ΔR is the radial deformation. This represents the phase change.

[0087] Furthermore, based on the radial deformation and the positional relationship between the reflecting device and the receiving device, the vertical or horizontal deformation can be determined. The specific calculation process can be referred to the relevant description in the above embodiments, and will not be repeated here.

[0088] In some embodiments, the deformation curve information can be represented as a coordinate graph, with the horizontal axis representing each target time and the vertical axis representing the deformation information (e.g., radial deformation, vertical deformation, horizontal deformation, north-south / east-west deformation, etc.) of each target time relative to a reference time, thereby drawing / generating / determining the deformation curve information for each specific reflector.

[0089] In some embodiments, the deformation curve includes deformation information of multiple specific reflective devices at a specific target time (e.g., time n) relative to a reference time (e.g., time 1). For example, the deformation curves of these multiple specific reflective devices can be drawn / generated / determined based on the deformation information of multiple specific reflective devices that are at the same distance but different angles, or the deformation curves of these multiple specific reflective devices can be drawn / generated / determined based on the deformation information of multiple specific reflective devices that are at different distances but the same angles.

[0090] In some embodiments, the deformation trend can be fitted based on the deformation curve described above, thereby enabling the prediction of structural safety risks.

[0091] In an exemplary embodiment, the deformation trend can be fitted to the deformation curves of multiple reflective devices distributed from small to large (or from large to small) distances according to a specific angle. At the same time, the reliability of the deformation of each reflective device at different distances can be determined by combining the coherence diagram. If the coherence of a certain distance is low, the deformation information is unreliable, and the fitted curve is also unreliable.

[0092] In another exemplary embodiment, the deformation trend can be fitted to the deformation curves of multiple reflective devices distributed along the angle from small to large (or from large to small) at a certain distance. At the same time, the reliability of the deformation of each reflective device at different angles can be determined by combining the coherence. If the coherence of a certain angle is low, the deformation information is unreliable, and the fitted curve is also unreliable.

[0093] In some embodiments, the vibration amplitude and frequency information of a particular reflective device can be determined based on the deformation curve information of the reflective device.

[0094] In the embodiments of this application, the processing / operation of the above-mentioned deformation information of each type can all be implemented by the receiving device, and the receiving device can also implement the processing / operation of one or more types of deformation information as needed.

[0095] In some embodiments, the receiving device is further configured to send one or more pieces of deformation information to the sensing device according to a preset method, wherein the preset method includes at least one of the following:

[0096] Periodically send one or more types of deformation information;

[0097] In response to a deformation information request received from a sensing device, the deformation information requested by the sensing device is sent.

[0098] In response to the deformation information conditions received from the sensing device, deformation information that satisfies the deformation information conditions is sent.

[0099] Based on the preset deformation information conditions, send deformation information that meets the deformation information conditions.

[0100] In an exemplary embodiment, the deformation information condition may include, but is not limited to, a confidence level greater than or equal to a preset confidence threshold, a deformation amount greater than a preset deformation threshold, etc.

[0101] In this embodiment, the receiving device can report one or more of the aforementioned deformation information to the sensing device, which then processes / operates on other types of deformation information as needed. Specific operation strategies and information reporting strategies can be set as required and are not limited to the aforementioned preset methods.

[0102] In this embodiment, the reporting method of deformation information is highly flexible. The receiving device and the sensing device can each have the ability to calculate / determine one or more of the aforementioned deformation information based on their computing power. For example, if the receiving device has weak computing power, it can directly report time series information to the sensing device, which then calculates other deformation information as needed. If the receiving device has strong computing power, the calculation / determination of the aforementioned deformation information can be completed within the receiving device, enabling distributed computing of the sensing information and reducing the computing power requirements and computational load of the sensing device.

[0103] In some embodiments, the detection system may further include a sensing device, which may include, but is not limited to, a sensing server.

[0104] In an exemplary embodiment, a sensing device can receive deformation information from one or more receiving devices. By acquiring the deformation information reported by multiple receiving devices, the structural safety of the entire area can be detected, managed, and warned.

[0105] Through the embodiments described above in this application, not only can precise detection of minute deformations of target objects be achieved, but the detection strategy and information transmission method can also be flexibly adjusted according to specific needs and environmental conditions, greatly expanding the application scope of deformation detection. Whether it is health monitoring of large infrastructure, vibration detection of precision instruments, or even non-line-of-sight detection in complex environments, this system can provide accurate and real-time deformation information, providing strong technical support for structural safety, stable equipment operation, and environmental change perception. In addition, through multi-point detection and comprehensive analysis of information, the system can construct a deformation distribution map of the target object and predict its future deformation trend, providing a data foundation for preventive maintenance and intelligent decision-making, effectively improving the efficiency of monitoring and early warning, and ensuring the safe operation of critical facilities and equipment.

[0106] In another embodiment of this application, a method for detecting minute deformations is also provided, applied to the receiving device in the above-described detection system. Figure 2 This is a schematic flowchart of a minute deformation detection method according to an embodiment of this application, as shown below. Figure 2 As shown, the process includes the following steps:

[0107] Step S202: Receive the backscattered signal from the reflective device installed on the target object. The backscattered signal is the excitation signal emitted by the signal source device received by the reflective device, which is modulated and then backscattered to the receiving device.

[0108] Step S204: Determine the radial deformation of the target object based on the backscattered signal;

[0109] Step S206: Determine the horizontal or vertical deformation of the target object based on the positional relationship between the reflecting device and the receiving device and the radial deformation.

[0110] The entities that perform the above steps include, but are not limited to, user equipment (UE).

[0111] In this embodiment, through steps S202, S204, and S206, the horizontal or vertical deformation of an object can be detected using the backscattered signal from the reflecting device. The hardware cost of the reflecting and receiving devices is low, and the excitation signal required for detection can come from outside the system (such as signals from the environment). Therefore, the overall power consumption of this detection method is low, solving the problem of high power consumption and cost associated with using a sensing base station for sensing minute deformations of objects in related technologies. This achieves the effect of low-power sensing of minute deformations. This detection method not only enables accurate detection of minute deformations but can also be converted into horizontal or vertical deformations according to specific needs, greatly improving the flexibility and practicality of the detection.

[0112] In some embodiments, the excitation signal may come from a signal source device that is already present in the environment, or a dedicated signal source device.

[0113] In some embodiments, step S204 may include the following steps:

[0114] 1) Channel estimation is performed based on the first backscattered signal received at the reference time and the second backscattered signal received at the target time to obtain the channel information at the reference time and the channel information at the target time;

[0115] 2) Determine the phase change of the target time relative to the reference time based on the channel information at the reference time and the channel information at the target time;

[0116] 3) Determine the radial deformation of the target object based on the phase change, where the radial deformation is the radial deformation of the target object at a time relative to the reference time.

[0117] In some embodiments, the positional relationship between the reflecting device and the receiving device includes at least one of the following: the vertical angle between the radial and vertical directions of the reflecting device and the receiving device.

[0118] In some embodiments, step S206 may include the following steps:

[0119] 1) Determine the horizontal deformation of the target object based on the sine of the radial deformation and the vertical angle; and / or,

[0120] 2) Determine the vertical deformation of the target object based on the cosine value of the radial deformation and the vertical angle.

[0121] In some embodiments, the positional relationship between the reflecting device and the receiving device may further include: the azimuth angle between the radial projection of the reflecting device to the receiving device onto the horizontal plane and the first reference direction.

[0122] In some embodiments, the receiving device is further configured to determine a first directional deformation of the target object in the first reference direction based on the horizontal deformation and the cosine value of the azimuth angle; and / or to determine a second directional deformation of the target object in the second reference direction based on the horizontal deformation and the sine value of the azimuth angle; wherein the first reference direction and the second reference direction are both located on the horizontal plane, and the first reference direction is perpendicular to the second reference direction.

[0123] In an exemplary embodiment, the first reference direction may be the geographic north / south direction, and the first directional deformation may be a north-south directional deformation. The second reference direction may be the geographic east / west direction, and the second directional deformation may be an east-west directional deformation.

[0124] In some embodiments, under non-line-of-sight (NLOS) conditions, step S202 may include: receiving a backscattered signal from a reflective device disposed on a target object via a reconfigurable smart surface (RIS) panel, wherein the RIS panel is disposed between the reflective device and the receiving device, for converting the transmission path of the backscattered signal under NLOS conditions into a path from the reflective device to the RIS panel and then to the receiving device.

[0125] In some embodiments, the number of reflective devices is one or more, and in the case of multiple reflective devices, the multiple reflective devices are disposed at different locations on the target object. For example, one receiving device may correspond to one or more target objects, and each target object can be detected at multiple points. The detection system can construct a deformation distribution map of the target object, suitable for comprehensive health monitoring of large buildings, ensuring the overall safety of the structure.

[0126] In this embodiment, the distribution of the multiple reflective devices includes discrete distribution or array distribution.

[0127] In this embodiment, the method may further include determining the deformation information of the target object based on the backscattering signals of multiple reflecting devices received at multiple times, wherein the deformation information includes deformation information, and the deformation information includes at least one of the following: radial deformation of multiple reflecting devices, horizontal deformation of multiple reflecting devices, or vertical deformation of multiple reflecting devices.

[0128] In this embodiment, the multiple times may include a reference time and multiple target times. Therefore, the deformation information may include the deformation information of each reflective device at each of the multiple target times relative to the reference time. For example, if the multiple times include a reference time t0 and multiple target times t1, t2, t3, etc., then the deformation information may include deformation information from t0 to t1, deformation information from t0 to t2, and deformation information from t0 to t3, etc.

[0129] In some embodiments, the deformation information may further include at least one of the following:

[0130] Time-series information of multiple reflecting devices, including channel information of multiple reflecting devices at multiple times;

[0131] Interference information includes the conjugate multiplication result of multiple reflectors at multiple target times. The conjugate multiplication result is obtained by multiplying the channel information of each reflector at the target time with the channel information at the reference time. The multiple times include the reference time and multiple target times.

[0132] Interference phase information includes the phase change of multiple reflecting devices at multiple target times relative to a reference time, wherein the phase change is the phase of the conjugate multiplication result;

[0133] Coherence information includes coherence values ​​of multiple reflecting devices at multiple target times relative to a reference time, wherein the coherence values ​​are the magnitudes of the conjugate multiplication results;

[0134] Deformation curve information of one or more specific reflective devices among multiple reflective devices at multiple target times;

[0135] Deformation information of multiple reflecting devices relative to a reference time at a specific target time;

[0136] Deformation curves and deformation trends of multiple specific reflective devices with the same distance but different angles, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves;

[0137] Deformation curves and deformation trends of multiple specific reflective devices at different distances but the same angle, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves;

[0138] Vibration amplitude and frequency information of one or more specific reflective devices, wherein the vibration amplitude and frequency information are determined based on deformation curve information.

[0139] In this embodiment, various forms of deformation information are provided as deformation detection results. This not only provides the real-time state of the target object but also predicts its future deformation trend. It is suitable for long-term monitoring of key infrastructure such as bridges and dams, and provides early warning of potential structural risks.

[0140] In some embodiments, the method may further include at least one of the following:

[0141] Periodically send one or more types of deformation information to the sensing device;

[0142] Based on the deformation information request received from the sensing device, send the deformation information requested by the sensing device to the sensing device;

[0143] Based on the deformation information conditions received from the sensing device, deformation information that meets the deformation information conditions is sent to the sensing device;

[0144] Based on preset deformation information conditions, deformation information that meets the deformation information conditions is sent to the sensing device.

[0145] In this embodiment, the reporting method of deformation information is highly flexible. The receiving device and the sensing device can each have the ability to calculate / determine one or more of the aforementioned deformation information based on their computing power. For example, if the receiving device has weak computing power, it can directly report time series information to the sensing device, which then calculates other deformation information as needed. If the receiving device has strong computing power, the calculation / determination of the aforementioned deformation information can be completed within the receiving device, enabling distributed computing of the sensing information and reducing the computing power requirements and computational load of the sensing device.

[0146] In one exemplary embodiment, the method may further include at least one of the following:

[0147] Interference information is determined based on time series information. For example, the channel information at each target time in the time series information of each reflector is multiplied by the conjugate of the channel information at the reference time.

[0148] The interference phase information is determined based on the interference information; for example, the interference phase information is determined to be the phase of the interference information.

[0149] Coherence information can be determined based on interference information, for example, by determining the magnitude of the interference information.

[0150] Based on time series information / interference information / interference phase information, the deformation information of multiple reflecting devices relative to the reference time at multiple target times is determined, such as radial deformation, vertical deformation, horizontal deformation, east-west / north-south deformation, etc. For specific calculation process, please refer to the description of a single reflecting device in the above embodiments.

[0151] Based on the deformation information of multiple reflective devices at multiple target times relative to a reference time, the deformation curve information of one or more specific reflective devices at multiple target times is determined. Each reflective device corresponds to one deformation curve information, which is drawn / generated based on the radial deformation / vertical deformation / horizontal deformation at multiple target times.

[0152] The deformation curves of multiple specific reflective devices (at one or more specific target times) with the same distance but different angles are determined, and the deformation trend is fitted according to the deformation curves. Each deformation curve corresponds to a specific target time.

[0153] The deformation curves of multiple specific reflective devices (at one or more specific target times) with different distances but the same angle are determined based on the deformation information, and the deformation trend is fitted based on the deformation curves, wherein one deformation curve corresponds to one specific target time.

[0154] The vibration amplitude and frequency information of one or more specific reflective devices are determined based on the deformation curve information of one or more specific reflective devices.

[0155] In another exemplary embodiment, the determination / calculation / processing flow of the aforementioned arbitrary deformation information can also be implemented in the sensing device, and the receiving device only needs to report the information required for the deformation information calculation to the sensing device. In this embodiment, the processing method and reporting method of deformation information are very flexible and can be flexibly set and adjusted according to the computational requirements or the device's computing power.

[0156] The embodiments described above in this application not only enable precise detection of minute deformations of target objects, but also allow for flexible adjustment of detection strategies and information transmission methods based on specific needs and environmental conditions, greatly expanding the application scope of deformation detection. Whether for health monitoring of large infrastructure, vibration detection of precision instruments, or even non-line-of-sight detection in complex environments, this method provides accurate and real-time deformation information, offering strong technical support for structural safety, stable equipment operation, and environmental change perception. Furthermore, this method enables multi-point detection and comprehensive analysis of information from target objects, constructing deformation distribution maps and predicting future deformation trends. This provides a data foundation for preventative maintenance and intelligent decision-making, effectively improving monitoring and early warning efficiency and ensuring the safe operation of critical facilities and equipment.

[0157] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0158] Figure 3 This is a schematic diagram of detecting vertical deformation in one embodiment of this application, as shown below. Figure 3 As shown, the system may include a signal source device, a reflector device, and a receiver device. The reflector device and the receiver device are positioned approximately perpendicularly. For example, the reflector device may be a passive tag, hereinafter referred to as a tag.

[0159] In this embodiment, the detection process for vertical deformation is as follows:

[0160] 1) The signal source device transmits an excitation signal S(t, f) at time t and frequency f. The excitation signal reaches the tag, and after backscattering by the tag, the backscattered signal received by the receiving device is:

[0161] y(t, f) = h aft (t, f)v(t, f)T(t)h fore (t, f)S(t, f);

[0162] Among them, h fore (t, f) is the tag forward (from the signal source device to the tag) channel function, h aft (t, f) is the tag backward (from tag to receiver) channel function, T(t) is the tag modulation function, v(t, f) is the channel variation function, and S(t, f) is the excitation signal.

[0163] For example, when the tag uses OOK modulation, the modulation function T(t) can be expressed as:

[0164]

[0165] In this embodiment, the channel change function caused by micro-deformation can be expressed as: Where d′(t) is the radial distance measured by the channel.

[0166] 2) Assume h aft (t, f), h foreIf (t, f) remains constant at times t0 and t1, then the receiving device can obtain channel information through channel estimation. The channel function of this channel information can be expressed as:

[0167] G(t,f)=h aft (t, f)v(t, f)T(t)h fore (t, f);

[0168] 3) The phase change Δ caused by the micro-deformation is obtained by the following method. φ (f):

[0169] Where G(t1, f) represents the channel information at time t1, and G(t0, f) represents the channel information at time t0 (i.e., the reference time). The Phase(.) function is a function to obtain the phase of a complex number.

[0170] 4) Obtain the radial penalty variable ΔR caused by the micro-penalty variation in the following manner:

[0171] Radial micro-deformation was obtained.

[0172] 5) Based on the angle α (vertical angle) between the radial and vertical directions from the tag to the receiving device, the vertical deformation Δz is calculated as: Δz=ΔR / cosα.

[0173] Through the embodiments of this application, the vertical deformation of a target object at different times can be accurately detected using tags. The tags are small in size, low in cost and power consumption, and have a wide range of applications, making them suitable for deformation detection in complex environments or large building structures.

[0174] Figure 4 This is a schematic diagram of detecting horizontal deformation in one embodiment of this application, as shown below. Figure 4 As shown, the system may include a signal source device, a reflector device, and a receiver device. The reflector device and the receiver device are positioned approximately horizontally. For example, the reflector device may be a passive tag, hereinafter referred to as a tag.

[0175] In this embodiment, the detection process for horizontal deformation is as follows:

[0176] 1) The signal source device transmits an excitation signal S(t, f) at time t and frequency f. The excitation signal reaches the tag, and after backscattering by the tag, the backscattered signal received by the receiving device is:

[0177] y(t, f) = h aft (t, f)v(t, f)T(t)h fore (t, f)S(t, f);

[0178] Among them, hfore (t, f) is the tag forward (from the signal source device to the tag) channel function, h aft (t, f) is the tag backward (from tag to receiver) channel function, T(t) is the tag modulation function, v(t, f) is the channel variation function, and S(t, f) is the excitation signal.

[0179] For example, when the tag uses OOK modulation, the modulation function T(t) can be expressed as:

[0180]

[0181] In this embodiment, the channel change function v(t, f) caused by the micro-deformation can be expressed as:

[0182] Where d′(t) is the radial distance measured by the channel.

[0183] 2) Assume h aft (t, f), h fore If (t, f) remains constant at times t0 and t1, then the receiving device can obtain channel information through channel estimation. The channel function of this channel information can be expressed as:

[0184] G(t,f)=h aft (t, f)v(t, f)T(t)h fore (t, f);

[0185] 3) The phase change Δ caused by the micro-deformation is obtained by the following method. φ (f):

[0186] Where G(t1, f) represents the channel information at time t1, and G(t0, f) represents the channel information at time t0 (i.e., the reference time). The Phase(.) function is a function to obtain the phase of a complex number.

[0187] 4) Obtain the radial deformation ΔR caused by the micro-deformation in the following way:

[0188] The deformation amount of radial micro-deformation is obtained.

[0189] 5) Calculate the horizontal deformation ΔL based on the angle between the radial and vertical directions (vertical angle) from the tag to the receiving device:

[0190] ΔL=ΔR / sinα.

[0191] 6) Optional procedure: Based on the horizontal deformation, the small deformations in the north-south / east-west directions can be calculated. The north-south deformation Δy and / or the east-west deformation Δx can be calculated based on the angle between the radial projection of the tag to the receiving device on the horizontal plane and the first reference direction (e.g., true north), i.e., the azimuth angle θ, and the horizontal deformation ΔL.

[0192] Δy=ΔL / cosθ, Δx=ΔL / sinθ.

[0193] Through the embodiments of this application, the horizontal deformation and north-south / east-west deformation of the target object at different times can be accurately detected using the tag. The tag is small in size, low in cost and power consumption, and has a wide range of applications, making it suitable for deformation detection in complex environments or large building structures.

[0194] The method embodiments provided in this application can be executed in a computer device or similar computing device.

[0195] Figure 5 This is a structural block diagram of a computer device according to an embodiment of this application, such as... Figure 5 As shown, computer device 500 may include one or more ( Figure 5 Only one is shown. A processor 502 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 504 for storing data are also shown. The computer device may further include transmission devices for communication functions and input / output devices. Those skilled in the art will understand that... Figure 5 The structure shown is for illustrative purposes only and does not limit the structure of the computer device described above. For example, the computer device may also include components that are more... Figure 5 The more or fewer components shown, or having the same Figure 5 The different configurations shown.

[0196] The memory 504 can be used to store computer programs, such as application software programs and modules, like the computer programs corresponding to the signal transmission and signal reception methods in this embodiment. The processor 502 executes various functional applications and data processing by running the computer programs stored in the memory 504, thus implementing the methods described above. The memory 504 may include high-speed random access memory and non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 504 may further include memory remotely located relative to the processor 502, and these remote memories can be connected to the computer device via a network. Examples of the aforementioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof. The transmission device is used to receive or transmit data via a network. Specific examples of the aforementioned networks may include wireless networks provided by the communication provider of the computer device. In one instance, the transmission device includes a Network Interface Controller (NIC), which can be connected to other network devices via a base station to communicate with the Internet. In one instance, the transmission device may be a radio frequency (RF) module used to communicate with the Internet wirelessly.

[0197] It should be noted that the above modules can be implemented by software or hardware. For the latter, they can be implemented in the following ways, but are not limited to: all the above modules are located in the same processor; or, the above modules are located in different processors in any combination.

[0198] Embodiments of this application also provide a computer-readable storage medium storing a computer program, wherein the computer program, when executed by a processor, implements the steps in any of the above method embodiments.

[0199] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0200] Embodiments of this application also provide an electronic device including a memory and a processor, the memory storing a computer program and the processor being configured to run the computer program to perform the steps in any of the above method embodiments.

[0201] In one exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor and the input / output device is connected to the processor.

[0202] Embodiments of this application also provide a computer program product, including a computer program that, when executed by a processor, implements the steps in any of the above method embodiments.

[0203] Specific examples in this embodiment can be found in the examples described in the above embodiments and exemplary implementations, and will not be repeated here.

[0204] Obviously, those skilled in the art should understand that the modules or steps of this application described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those presented here, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, this application is not limited to any particular combination of hardware and software.

[0205] The above description is merely an exemplary embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the principles of this application should be included within the protection scope of this application.

Claims

1. A micro-deformation detection system, characterized in that, include: A reflecting device is used to receive an excitation signal emitted by a signal source device, and to modulate the excitation signal and then backscatter it, wherein the reflecting device is disposed on the target object; A receiving device is configured to receive a backscattered signal from the reflecting device, determine the radial deformation of the target object based on the backscattered signal, and determine the horizontal or vertical deformation of the target object based on the positional relationship between the reflecting device and the receiving device and the radial deformation.

2. The system according to claim 1, characterized in that, The system also includes the signal source device, wherein the signal source device includes: a signal source device already existing in the environment, or a dedicated signal source device.

3. The system according to claim 1, characterized in that, The reflection device modulates the excitation signal in the following ways: on-off keying (OOK), binary phase shift keying (BPSK), or quadrature amplitude modulation (QAM).

4. The system according to claim 1, characterized in that, The receiving device is further configured to determine the radial deformation of the target object based on the backscattered signal in the following manner: Channel estimation is performed based on the first backscattered signal received at the reference time and the second backscattered signal received at the target time to obtain the channel information at the reference time and the channel information at the target time. The phase change of the target time relative to the reference time is determined based on the channel information of the reference time and the channel information of the target time; The radial deformation of the target object is determined based on the phase change, wherein the radial deformation is the radial deformation of the target time relative to the reference time.

5. The system according to claim 1, characterized in that, The positional relationship between the reflecting device and the receiving device includes the vertical angle between the radial and vertical directions of the reflecting device and the receiving device.

6. The system according to claim 5, characterized in that, The receiving device is further configured to determine the horizontal or vertical deformation of the target object based on the positional relationship between the reflecting device and the receiving device and the radial deformation in the following manner: The horizontal deformation of the target object is determined based on the sine value of the radial deformation and the vertical angle; and / or, The vertical deformation of the target object is determined based on the cosine value of the radial deformation and the vertical angle.

7. The system according to claim 6, characterized in that, The positional relationship between the reflecting device and the receiving device also includes: the azimuth angle between the radial projection of the reflecting device to the receiving device onto the horizontal plane and the first reference direction; The receiving device is further configured to determine the first directional deformation of the target object in the first reference direction based on the horizontal deformation and the cosine value of the azimuth angle; and / or, determine the second directional deformation of the target object in the second reference direction based on the horizontal deformation and the sine value of the azimuth angle. Wherein, both the first reference direction and the second reference direction are located in the horizontal plane, and the first reference direction is perpendicular to the second reference direction.

8. The system according to claim 1, characterized in that, The system also includes: A reconfigurable smart surface RIS panel is used to convert the transmission path of the excitation signal into a first NLOS path under non-line-of-sight (NLOS) conditions, and / or to convert the transmission path of the backscattered signal into a second NLOS path, wherein the first NLOS path includes the path between the signal source device and the RIS panel and the path between the RIS panel and the reflector, and the second NLOS path includes the path between the reflector and the RIS panel and the path between the RIS panel and the receiver.

9. The system according to claim 1, characterized in that, The number of the reflective devices can be one or more, or, in response to the number of multiple reflective devices, the multiple reflective devices are disposed at different positions on the target object, wherein... The receiving device is configured to determine the deformation information of the target object based on the backscattered signals of the plurality of reflecting devices received at multiple times, wherein the deformation information includes deformation information, and the deformation information includes at least one of the following: radial deformation of the plurality of reflecting devices, horizontal deformation of the plurality of reflecting devices, or vertical deformation of the plurality of reflecting devices.

10. The system according to claim 9, characterized in that, The deformation information also includes at least one of the following: Time-series information of multiple reflecting devices, including channel information of the multiple reflecting devices at the multiple times; Interference information includes the conjugate multiplication results of the plurality of reflecting devices at a plurality of target times, wherein the conjugate multiplication result is obtained by multiplying the channel information of each reflecting device at the target time with the channel information at a reference time, and the plurality of times includes the reference time and the plurality of target times; Interference phase information includes the phase change of the plurality of reflecting devices at the plurality of target times relative to the reference time, wherein the phase change is the phase of the conjugate multiplication result; Coherence information includes coherence values ​​of the plurality of reflecting devices at the plurality of target times relative to the reference time, wherein the coherence values ​​are the magnitude of the conjugate multiplication result; Deformation curve information of one or more specific reflective devices among the plurality of reflective devices at the plurality of target times; Deformation information of the plurality of reflecting devices relative to the reference time at a specific target time; Deformation curves and deformation trends of multiple specific reflective devices with the same distance but different angles, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves; Deformation curves and deformation trends of multiple specific reflective devices at different distances but at the same angle, wherein the distances and / or angles of the multiple reflective devices relative to the receiving device are different, and the deformation trends are obtained by fitting the deformation curves; Vibration amplitude and frequency information of one or more of the specific reflective devices, wherein the vibration amplitude and frequency information are determined based on the deformation curve information.

11. The system according to claim 9 or 10, characterized in that, The receiving device is further configured to send one or more pieces of the deformation information to the sensing device according to a preset method, wherein the preset method includes at least one of the following: Periodically send one or more of the deformation information; In response to a deformation information request received from the sensing device, the deformation information requested by the sensing device is sent. In response to the deformation information condition received from the sensing device, deformation information that satisfies the deformation information condition is sent. Based on preset deformation information conditions, deformation information that satisfies the deformation information conditions is sent.

12. The system according to claim 9, characterized in that, The distribution of the multiple reflective devices can be either discrete or arrayed.

13. A method for detecting minute deformations, characterized in that, Applied to a receiving device, including: The receiver receives a backscattered signal from a reflective device mounted on a target object, wherein the backscattered signal is an excitation signal emitted by a signal source device received by the reflective device, and the excitation signal is modulated and backscattered to the receiving device. The radial deformation of the target object is determined based on the backscattered signal; The horizontal or vertical deformation of the target object is determined based on the positional relationship between the reflecting device and the receiving device, as well as the radial deformation.

14. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the steps of the method of claim 13.

15. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method of claim 13.

16. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method of claim 13.

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