Metallographic microscope device

By designing an automated motion metallographic microscope device, the problem of low observation efficiency of large batch samples in the prior art is solved, and fast and accurate sample observation and analysis are achieved, which improves observation efficiency and productivity.

CN222636376UActive Publication Date: 2025-03-18ANXIN TUORI INFORMATION TECH CO LTD +1
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Patent Information

Application Number
CN202420607128.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-03-27
Publication Date
2025-03-18
Estimated Expiration
2034-03-27

AI Technical Summary

Technical Problem

The existing metallographic microscope devices are complex in operation and low efficiency when observing large batch samples, and cannot quickly observe and analyze large batch samples.

Method used

A metallographic microscope device is designed, including a rack, a stage, a sample stage, a first motion module, a second motion module and a third motion module. Through the coordinated work of these modules, the automated movement of the sample stage is realized, so that multiple samples can be moved quickly and accurately under the observation lens.

Benefits of technology

It realizes rapid observation and analysis of large batches of samples, improves observation efficiency and continuity, reduces the labor intensity of operators, reduces the time for processing large batches of samples, reduces costs, and improves the efficiency and productivity of metallographic intelligent analysis.

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Abstract

The utility model discloses a metallographic microscope device, and relates to the technical field of microscopes, and the metallographic microscope device comprises a rack, an objective table, a sample table, a first motion module, a second motion module and a third motion module. The objective table is movably arranged on the rack, and the objective table comprises a bottom plate and a movable plate movably arranged on the bottom plate; the sample table is arranged on the movable plate, and a plurality of station grooves for placing samples are formed in the sample table; the first movement module is used for driving the objective table to move relative to the rack in the first direction. The second movement module is used for driving the movable plate to move relative to the bottom plate in a second direction; the third movement module is used for driving the movable plate to move relative to the bottom plate in the third direction. According to the metallographic microscope device, the continuity, reliability and efficiency of observation of large-batch samples can be improved, so that the labor intensity of operators is reduced, the time for processing the large-batch samples is shortened, the cost is reduced, and the metallographic intelligent analysis efficiency and productivity are improved.
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