Detection devices and systems

Abstract

The present application discloses a detection device and system, which relates to the field of motherboard testing. The detection device includes a first component and a second component; the first component includes a first USB interface, the second component includes a second USB interface, and the first USB interface is used to connect to the second USB interface; the second component includes a USB communication test contact, a power supply voltage test contact, and a battery voltage test contact; the USB communication test contact is used to connect the USB signal probe of the test equipment, the power supply voltage test contact is used to connect the power supply voltage probe of the test equipment, and the battery voltage test contact is used to connect the battery voltage probe of the test equipment; the data terminal of the second USB interface is connected to the USB communication test contact, the power supply voltage terminal of the second USB interface is connected to the power supply voltage test contact, and the spare terminal of the second USB interface is connected to the battery voltage test contact; the first component includes a controller, and the controller is used to execute the test items indicated by the host computer.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of motherboard testing, and more particularly to a detection device and system. Background Art

[0002] Each component of an electronic device (such as a mobile phone) needs to be tested to meet the factory conditions. For example, the component to be tested can be a motherboard (such as a mobile phone motherboard). The motherboard test needs to be carried out in a specific test environment (including test equipment cabinets, fixtures, instrument power supplies, and connectors between components, etc.).

[0003] The quality of the motherboard test environment is an important factor affecting the false detection rate of motherboard testing. However, there is currently a lack of detection technology for the motherboard test environment. In addition, when the motherboard production line is cleared and there are no motherboards, it is difficult to evaluate whether the motherboard test environment meets the test environment standards, which will affect the production quality and test efficiency of other motherboards. Utility Model Content

[0004] The embodiments of the present application provide a detection device and system for detecting a test environment of a mainboard.

[0005] To achieve the above objectives, the embodiments of the present application adopt the following technical solutions:

[0006] In a first aspect, a detection device is provided, comprising a first component and a second component; the first component comprises a first universal serial bus (USB) interface, the second component comprises a second USB interface, and the first USB interface is used to connect to the second USB interface; the second component comprises a USB communication test contact, a power supply voltage test contact, and a battery voltage test contact; the USB communication test contact is used to connect a USB signal probe of a test device, the power supply voltage test contact is used to connect a power supply voltage probe of the test device, and the battery voltage test contact is used to connect a battery voltage probe of the test device; the data terminal of the second USB interface is connected to the USB communication test contact, the power supply voltage terminal of the second USB interface is connected to the power supply voltage test contact, and the spare terminal of the second USB interface is connected to the battery voltage test contact; the first component comprises a controller, and the controller detects whether the data terminal transmits data normally, detects the voltage of the power supply voltage terminal, and detects the voltage of the spare terminal by executing the test items indicated by the upper computer.

[0007] The detection device provided in the embodiment of the present application can detect the power supply voltage and battery voltage of the test environment and detect whether the data communication of the test environment is normal by receiving a test command from a host computer and executing the test items indicated by the host computer in response to the test command.

[0008] In a possible implementation of the first aspect, the first component also includes a USB-to-serial port chip; the controller includes a serial communication input / output (IO) interface, the serial communication IO interface is connected to one end of the USB-to-serial port chip, and the other end of the USB-to-serial port chip is connected to a data terminal of the first USB interface.

[0009] In this implementation, the USB-to-serial port chip can realize the conversion between serial port communication and USB communication, thereby realizing the data communication function between the controller and the host computer.

[0010] In a possible implementation of the first aspect, the first component also includes a power supply voltage divider sampling circuit; the power supply voltage divider sampling circuit is used to convert the power supply voltage of the test equipment into a voltage adapted to the controller; the controller includes a first analog-to-digital conversion interface, the first analog-to-digital conversion interface is connected to the output end of the power supply voltage divider sampling circuit, the input end of the power supply voltage divider sampling circuit is connected to the power supply voltage terminal of the first USB interface, and the ground end of the power supply voltage divider sampling circuit is grounded.

[0011] In this implementation, the power supply voltage division sampling circuit can ensure the safety of power supply voltage sampling.

[0012] In a possible implementation of the first aspect, the first component also includes a first switch and a first load resistor; the controller also includes a first IO output interface, the first IO output interface is connected to the control end of the first switch, the first end of the first switch is grounded, the second end of the first switch is connected to one end of the first load resistor, and the other end of the first load resistor is connected to the input end of the power supply voltage divider sampling circuit.

[0013] In this implementation, the controller may control the conduction of the first switch through the first IO output interface to test the power path resistance of the test environment.

[0014] In a possible implementation manner of the first aspect, the first switch is specifically a first N-metal oxide semiconductor (NMOS) switch.

[0015] In a possible implementation of the first aspect, the first component also includes a battery voltage divider sampling circuit; the battery voltage divider sampling circuit is used to convert the battery voltage of the test equipment into a voltage adapted to the controller; the controller includes a second analog-to-digital conversion interface, the second analog-to-digital conversion interface is connected to the output end of the battery voltage divider sampling circuit, the input end of the battery voltage divider sampling circuit is connected to the spare terminal of the first USB interface, and the ground end of the battery voltage divider sampling circuit is grounded.

[0016] In this implementation, the battery voltage division sampling circuit can ensure the safety of battery voltage sampling.

[0017] In a possible implementation of the first aspect, the first component also includes a second switch and a second load resistor; the controller also includes a second IO output interface, the second IO output interface is connected to the control end of the second switch, the first end of the second switch is grounded, the second end of the second switch is connected to one end of the second load resistor, and the other end of the second load resistor is connected to the input end of the battery voltage divider sampling circuit.

[0018] In this implementation, the controller can control the conduction of the second switch through the second IO output interface to test the battery path resistance of the test environment.

[0019] In a possible implementation manner of the first aspect, the second switch is specifically a second NMOS switch.

[0020] In a possible implementation manner of the first aspect, the first component also includes a temperature sensor; the controller includes an inter integrated circuit (I2C) communication IO interface, and the I2C communication IO interface is connected to the temperature sensor.

[0021] In this implementation, the controller obtains temperature data from the temperature sensor through the I2C communication interface, and can detect whether the heat dissipation function of the test environment is normal.

[0022] In a possible implementation of the first aspect, the first component also includes a power conversion chip; the controller also includes a power supply voltage (volt current condenser, VCC) interface; one end of the power conversion chip is connected to the power supply voltage terminal of the first USB interface; the other end of the power conversion chip is connected to the VCC interface for powering the controller.

[0023] In this implementation, the power conversion chip can provide an adaptive power supply voltage to the controller through the VCC interface.

[0024] In a possible implementation of the first aspect, the power supply voltage divider sampling circuit includes a first voltage divider resistor and a second voltage divider resistor; the first end of the first voltage divider resistor serves as an input end of the power supply voltage divider sampling circuit, the second end of the first voltage divider resistor is connected to the first end of the second voltage divider resistor, and the connection point serves as an output end of the power supply voltage divider sampling circuit, and the second end of the second voltage divider resistor serves as a ground end of the power supply voltage divider sampling circuit.

[0025] In a possible implementation of the first aspect, the battery voltage dividing sampling circuit includes a third voltage dividing resistor and a fourth voltage dividing resistor; the first end of the third voltage dividing resistor serves as an input end of the battery voltage dividing sampling circuit, the second end of the third voltage dividing resistor is connected to the first end of the fourth voltage dividing resistor, and the connection point serves as an output end of the battery voltage dividing sampling circuit, and the second end of the fourth voltage dividing resistor serves as a ground end of the battery voltage dividing sampling circuit.

[0026] In a possible implementation manner of the first aspect, the second component includes a positioning hole, and the positioning hole is used to fix the second component.

[0027] In this implementation, when the test equipment is different, the first component remains unchanged, and the detection device can be adapted to the new test equipment only by setting the positioning holes and test contacts of the second component according to the positions of the positioning holes and test probes of the test equipment. The assembly of the first component and the second component can make the detection device more applicable and reduce the detection cost.

[0028] In a possible implementation manner of the first aspect, a size of the first component is smaller than a preset range.

[0029] In this implementation, the circuit layout area of ​​the detection device is reduced so that the first component of the detection device can be accommodated by the fixture of the test equipment.

[0030] In a second aspect, a detection system is provided, comprising: a host computer, an instrument power supply, a test device, and a detection device as in the first aspect and any implementation thereof; after the detection device is fixed on the test device, a USB communication test contact on a second component in the detection device is connected to a USB signal probe of the test device, a power supply voltage test contact on the second component is connected to a power supply voltage probe of the test device, and a battery voltage test contact on the second component is connected to a battery voltage probe of the test device; the USB signal probe is also connected to a USB data terminal in a USB interface of the host computer, and the detection device communicates with the host computer via the USB signal probe of the test device; the power supply voltage probe is also connected to a power supply voltage terminal of the test device; and the battery voltage probe is also connected to the instrument power supply.

[0031] The technical effects of the second aspect refer to the technical effects of the first aspect and any of its embodiments, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 A schematic diagram of the structure of a detection system provided in an embodiment of the present application;

[0033] Figure 2 A schematic diagram of the structure of a detection device provided in an embodiment of the present application;

[0034] Figure 3One of the structural schematic diagrams of a first component provided in an embodiment of the present application;

[0035] Figure 4 A second structural diagram of a first component provided in an embodiment of the present application;

[0036] Figure 5 A schematic diagram of a detection process provided in an embodiment of the present application. DETAILED DESCRIPTION

[0037] First, some concepts involved in this application are described.

[0038] The terms "first", "second", etc. involved in the embodiments of the present application are only used to distinguish features of the same type and cannot be understood as indicating relative importance, quantity, order, etc.

[0039] The terms "exemplary" or "for example" and the like in the embodiments of the present application are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of the terms "exemplary" or "for example" is intended to present the related concepts in a specific way.

[0040] The terms "coupling" and "connection" involved in the embodiments of the present application should be understood in a broad sense. For example, they may refer to a direct physical connection, or an indirect connection achieved through electronic devices, such as a connection achieved through resistors, inductors, capacitors or other electronic devices.

[0041] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0042] In order to produce electronic equipment that meets factory conditions, it is necessary to test and evaluate the performance of each component of the electronic equipment. The motherboard is one of the core components of electronic equipment, which enables electronic equipment to achieve various functions such as control, signal transmission and data exchange. The test of the motherboard needs to be carried out in a specific test environment (including test equipment cabinets, fixtures, instrument power supplies, and connectors between components, etc.).

[0043] The quality of the motherboard test environment is an important factor affecting the false detection rate of motherboard testing. However, there is currently a lack of detection technology for the motherboard test environment. In addition, when the motherboard production line is cleared and there are no motherboards, it is difficult to evaluate whether the motherboard test environment meets the test environment standards, which will affect the production quality and test efficiency of other motherboards.

[0044] To solve the above problems, Figure 1 As shown, an embodiment of the present application provides a detection system for detecting a test environment of a mainboard, including a detection device 1, a test device 2, a host computer 3 and an instrument power supply 4.

[0045] The test equipment 2 refers to a device for testing and verifying various performance indicators of the motherboard, including test probes, test fixtures and other components. The test fixture is used to fix the test probe. During the test process, the test probe contacts the test contacts of the motherboard under test, so that the test equipment and the motherboard under test are connected. The test probe transmits the test signal to the motherboard under test and feeds back the test result to the host computer 3. Exemplarily, in the embodiment of the present application, the test equipment 2 includes a USB signal probe T1, a battery voltage probe T2, and a power supply voltage probe T3.

[0046] When the detection device 1 replaces the mainboard and is fixed on the test equipment 2, the detection device 1 communicates with the host computer 3 through the USB signal probe T1 of the test equipment 2 and receives the test command from the host computer 3. The host computer 3 can be a personal computer (PC) or a laptop computer with a USB interface.

[0047] The instrument power supply 4 is used to simulate a battery and provide a battery voltage for the test equipment. The detection device 1 is connected to the instrument power supply 4 via a battery voltage probe T2 of the test equipment 2 to detect the battery voltage of the test environment (ie, the battery voltage simulated by the instrument power supply).

[0048] The detection device 1 is also connected to the power supply voltage terminal of the test device 2 via the power supply voltage probe T3 of the test device 2 to detect the power supply voltage of the test environment.

[0049] like Figure 2 As shown, the detection device 1 provided in the embodiment of the present application includes a first component 11 and a second component 12. The first component 11 is a main component, and the second component 12 is a secondary component.

[0050] The first component 11 includes a controller 112, which detects the test environment by receiving a test command from a host computer and executing the test items indicated by the host computer in response to the test command. The controller 112 can be a single-chip microcomputer, a programmable logic controller, a digital signal processor, and an intelligent regulator. Exemplarily, the detection device provided in the embodiment of the present application can use a single-chip microcomputer chip as the controller 112, and detect the test environment by combining the host computer software of the test equipment.

[0051] The second component 12 includes a positioning hole and a test contact, and the test contact includes a USB communication test contact, a power supply voltage test contact, and a battery voltage test contact. Among them, the USB communication test contact is used to connect the USB signal probe of the test equipment, the power supply voltage test contact is used to connect the power supply voltage probe of the test equipment, and the battery voltage test contact is used to connect the battery voltage probe of the test equipment.

[0052] The positions of the positioning holes and test contacts of the mainboards of different projects may be different, and the positions of the test probes of the test equipment should be set according to the positions of the positioning holes and test contacts of the mainboard. Therefore, the detection device provided in the embodiment of the present application adopts the form of assembling the first component 11 and the second component 12. When the test equipment is different, the first component 11 remains unchanged, and only the second component 12 needs to be replaced (the positioning holes and test contacts of the second component are set according to the positions of the positioning holes and test probes of the test equipment) to make the detection device adapt to the new test equipment. The form of assembling the first component 11 and the second component 12 can make the detection device have better applicability and reduce the detection cost.

[0053] The first component 11 includes a first USB interface 111, and the second component 12 includes a second USB interface 121. The first component 11 and the second component 12 are connected through the first USB interface 111 and the second USB interface 121. Exemplarily, the first USB interface 111 and the second USB interface 121 can be MicroUSB interfaces, which can prevent reverse insertion. In addition, the first component 11 can also be connected to a host computer through the first USB interface 111, and the program of the controller 112 can be debugged and burned through the host computer.

[0054] Figure 3 FIG. 1 shows a schematic diagram of the structure of the first component 11. Figure 3 As shown, the controller 112 specifically includes a VCC interface 1121 , a serial communication IO interface 1122 , a first analog-to-digital conversion interface 1123 , a second analog-to-digital conversion interface 1124 , a first IO output interface 1125 , a second IO output interface 1126 , and an I2C communication IO interface 1127 .

[0055] like Figure 3As shown, the first component 11 includes a power conversion chip 113, one end of the power conversion chip 113 is connected to the power voltage terminal of the first USB interface, and the other end of the power conversion chip 113 is connected to the VCC interface 1121. The VCC interface 1121 is a dedicated power supply interface of the controller 112, which is used to provide a power supply voltage to the controller 112 so that the circuits in the controller 112 can work normally. It should be noted that the voltage of the VCC interface 1121 must be within the preset voltage range of the controller 112, otherwise it may cause the controller 112 to work abnormally or be damaged. Therefore, it is necessary to use the power conversion chip 113 to provide the VCC interface 1121 with a power supply voltage that is compatible with the controller 112.

[0056] For example, Figure 4 As shown in the power conversion chip 113 and its peripheral circuit in FIG, when the operating voltage of the controller 112 is 3.3V and the voltage of the power voltage terminal VBUS of the first USB interface is 5V, the power conversion chip 113 that converts 5V to 3.3V can be used to power the controller 112. The capacitors C11 and C12 in the peripheral circuit of the power conversion chip 113 are used to filter the noise on the power line; and the power conversion chip 113 also provides a stable power supply voltage for the controller 112 through the filter circuit 403. The filter circuit 403 includes a plurality of parallel capacitors (capacitors C1-C6), which can avoid the influence of power supply voltage fluctuations and noise interference on the controller 112. In addition, the power conversion chip 113 also has functions such as overvoltage protection, overcurrent protection and overheating protection, which can ensure the safe operation of the controller 112. When selecting the model of the power conversion chip 113, the power conversion chip 113 with a maximum withstand voltage value higher than the voltage value of the power voltage terminal VBUS of the first USB interface should be selected to ensure the safety of the test. For example, the voltage test range of the current mobile phone motherboard is 0-5V. Therefore, the test environment is that the voltage provided by the power voltage terminal VBUS of the first USB interface is 5V. The power conversion chip 113 with a maximum withstand voltage of 6V can be selected to provide an adaptive working voltage for the controller 112.

[0057] When the controller 112 is a serial communication device (such as a single-chip microcomputer), since the host computer generally does not provide a standard serial port interface, a USB-to-serial port chip is needed to realize the conversion between USB communication and serial communication, thereby realizing the communication function between the host computer and the controller 112 (such as a single-chip microcomputer). Figure 3As shown, the first component 11 also includes a USB to serial port chip 114, one end of the USB to serial port chip 114 is connected to the data terminal of the first USB interface, and the other end of the USB to serial port chip 114 is connected to the serial communication IO interface 1122, and the controller 112 realizes the data communication function with the host computer through the USB to serial port chip 114. In the embodiment of the present application, the controller 112 can simulate a mobile phone through the USB to serial port chip and communicate with the host computer, such as receiving instructions from the host computer and feeding back detection results to the host computer.

[0058] Specifically, Figure 4 As shown in the USB to serial port chip 114 and its peripheral circuit, the pin 1 of the USB to serial port chip 114 is connected to the first data terminal D+ of the first USB interface, the pin 2 is connected to the second data terminal D- of the first USB interface, and the pin 6 and the pin 7 are respectively connected to the serial communication IO interface 1122 of the controller 112, so as to realize the conversion between the serial communication and the USB communication between the controller 112 and the host computer. In addition, the capacitors C12 and C13 in the peripheral circuit of the USB to serial port chip 114 are used for filtering.

[0059] The controller 112 collects the power supply voltage of the test environment through the first analog-to-digital conversion interface 1123, and collects the battery voltage of the test environment through the second analog-to-digital conversion interface 1124. The analog-to-digital conversion interface is an interface for converting an analog signal into a digital signal, which can realize sampling, quantization, encoding, etc. of the analog signal. Through the analog-to-digital conversion interface, the controller 112 can read the analog signal of the voltage of the test environment and convert it into a digital signal for processing.

[0060] To ensure the safety of power supply voltage sampling, Figure 3 As shown, the first component 11 also includes a power supply voltage dividing sampling circuit 115, the output end of the power supply voltage dividing sampling circuit 115 is connected to the first analog-to-digital conversion interface 1123, and the input end of the power supply voltage dividing sampling circuit 115 is connected to the power supply voltage terminal of the first USB interface. Figure 4 As shown, when the voltage of the power supply voltage terminal VBUS of the first USB interface is 5V, and the operating voltage of the controller 112 is 3.3V, the power supply voltage voltage-dividing sampling circuit 115 can be formed by the resistor R3 and the resistor R4. The connection point of the resistor R3 and the resistor R4 is coupled to the first analog-to-digital conversion interface 1123, so that the power supply voltage test value collected by the first analog-to-digital conversion interface 1123 is the voltage after the actual value of the power supply voltage is divided, that is, the power supply voltage test value = R4 / (R3+R4)*actual value of the power supply voltage. After the controller 112 collects the power supply voltage test value through the first analog-to-digital conversion interface 1123, it is also necessary to convert the power supply voltage test value into the actual value of the power supply voltage through the relevant program algorithm (actual value of the power supply voltage = (R3+R4) / R4*test value of the power supply voltage).

[0061] To ensure the safety of battery voltage sampling, Figure 3 As shown, the first component 11 also includes a battery voltage dividing sampling circuit 116, the output end of the battery voltage dividing sampling circuit 116 is connected to the second analog-to-digital conversion interface 1124, and the input end of the battery voltage dividing sampling circuit 116 is connected to the battery voltage terminal of the first USB interface. Figure 4 As shown, when the voltage of the battery voltage terminal VBUS of the first USB interface is 3.8V, and the operating voltage of the controller 112 is 3.3V, the battery voltage voltage-dividing sampling circuit 116 can be formed by resistors R7 and R8. The connection point of resistors R7 and R8 is coupled to the second analog-to-digital conversion interface 1124, so that the battery voltage test value collected by the second analog-to-digital conversion interface 1124 is the voltage after the actual value of the battery voltage is divided, that is, the battery voltage test value = R8 / (R7+R8)*battery voltage actual value. After the controller 112 collects the battery voltage test value through the second analog-to-digital conversion interface 1124, it is also necessary to convert the battery voltage test value into the battery voltage actual value through the relevant program algorithm (battery voltage actual value = (R7+R8) / R8*battery voltage test value).

[0062] like Figure 3 As shown, the first component 11 further includes a first switch K1 and a first load resistor R6, the first IO output interface 1125 is connected to the control end of the first switch K1, the first end of the first switch K1 is grounded, the second end of the first switch K1 is connected to one end of the first load resistor R6, and the other end of the first load resistor R6 is connected to the input end of the power supply voltage division sampling circuit 115. The controller 112 can control the conduction or disconnection of the first switch K1 through the first IO output interface 1125.

[0063] The first switch K1 may be an NMOS transistor, a PMOS transistor, a triode, etc. For example, Figure 4 As shown, when the first switch K1 is a first NMOS tube, the gate of the first NMOS tube is the control end of the first switch K1, the source of the first NMOS tube is the first end of the first switch K1, and the drain of the first NMOS tube is the second end of the first switch K1. When the voltage applied by the controller 112 to the first NMOS tube through the first IO output interface 1125 is greater than or equal to the turn-on voltage of the first NMOS tube, the first NMOS tube is turned on; when the voltage applied by the controller 112 to the first NMOS tube through the first IO output interface 1125 is less than the turn-on voltage of the first NMOS tube, the first NMOS tube is turned off.

[0064] like Figure 3As shown, the first component 11 also includes a second switch K2 and a second load resistor R10, the second IO output interface 1126 is connected to the control end of the second switch K2, the first end of the second switch K2 is grounded, the second end of the second switch K2 is connected to one end of the second load resistor R10, and the other end of the second load resistor R10 is connected to the input end of the battery voltage division sampling circuit 116. The controller 112 can control the conduction or disconnection of the second switch K2 through the second IO output interface 1126. The second switch K2 can also be an NMOS tube, a PMOS tube, a triode, etc.

[0065] like Figure 3 As shown, the first component 11 also includes a temperature sensor 117, and the controller 112 can obtain temperature data from the temperature sensor 117 through an I2C communication interface 1127 to detect whether the heat dissipation function of the test environment is normal. I2C communication is a serial communication protocol that can be used for communication between sensors (such as temperature sensors, humidity sensors, light sensors, pressure sensors, etc.) and the controller 112.

[0066] For example, in I2C communication, the temperature sensor is connected to the I2C bus as a slave device, and the controller 112 is used as a master device to read data. When the controller 112 needs to read temperature data from the temperature sensor, the controller 112 first sends a start signal to the temperature sensor, and then sends a slave device address and a read command. After receiving these signals, the temperature sensor sends the temperature data to the controller 112. After receiving the temperature data, the controller 112 can detect whether the heat dissipation function of the test environment is normal according to the temperature data.

[0067] like Figure 4 As shown in the temperature sensor 117 in FIG. 1 , the temperature sensor 117 is connected to the I2C communication IO interface 1127 of the controller 112 via pin 1, and a single data bus is used to transmit temperature data, which can avoid interference and simplify the circuit.

[0068] like Figure 4 As shown, the conventional embedded system includes a low-speed crystal oscillator circuit with a real-time clock (RTC) function and a reset circuit for realizing BOOT startup by pressing a button. In order to enable the first component of the detection device of the embodiment of the present application to be assembled in the narrow fixture space of the test equipment, the circuit layout area of ​​the detection device should be reduced as much as possible. Therefore, the detection device provided by the embodiment of the present application adopts an external crystal oscillator circuit 401 to provide the RTC function on the one hand, and cancels the button of the reset circuit on the other hand, and suspends the two contacts originally used to connect the button, one of the two contacts is connected to the reset pin of the controller 112, and the other contact is grounded. When the controller 112 is required to perform BOOT startup, the two contacts can be short-circuited by flying wires.

[0069] The detection device and the host computer detect the test environment through command interaction. The detection process is as follows: Figure 5 As shown, it specifically includes steps S1 to S4:

[0070] Step S1, the detection device detects the power supply voltage and battery voltage of the test environment.

[0071] Specifically, S101, the host computer sends a first instruction to the detection device, and the controller of the detection device responds to the first instruction of the host computer, controls the first switch to be turned off through the first IO output interface, controls the second switch to be turned off through the second IO output interface, obtains the first power supply voltage test value of the test environment through the first analog-to-digital conversion interface, and obtains the first battery voltage test value of the test environment through the second analog-to-digital conversion interface.

[0072] S102: The detection device converts the first power supply voltage test value into the first power supply voltage actual value and converts the first battery voltage test value into the first battery voltage actual value through a processor.

[0073] S103. The processor of the detection device sends the actual value of the first power supply voltage and the actual value of the first battery voltage to the host computer, and the host computer determines whether the actual value of the first power supply voltage and the actual value of the first battery voltage are within a preset range.

[0074] If the actual value of the first power supply voltage is within the preset range, it indicates that the power supply of the test environment is in good condition; if the actual value of the first power supply voltage is not within the preset range, it indicates that the power supply of the test environment is abnormal, and the abnormality may be caused by poor contact of the power supply voltage path (for example, poor contact between the power supply voltage probe and the power supply voltage contact). In particular, when the power supply voltage path is short-circuited, the first power supply voltage measured by the detection device is zero.

[0075] If the actual value of the first battery voltage is within the preset range, it indicates that the battery power supply state of the test environment is good; if the actual value of the first battery voltage is not within the preset range, it indicates that the battery power supply of the test environment is abnormal, and the abnormality may be caused by poor contact of the battery voltage path (for example, poor contact between the battery voltage probe and the battery voltage contact). In particular, when the battery voltage path is short-circuited, the first battery voltage measured by the detection device is zero.

[0076] In the process of detecting the power supply voltage and battery voltage of the test environment, if the detection device can receive the first instruction and respond, it means that the USB path configuration of the host computer, the test equipment, and the detection device is correct. If the detection device does not respond, it means that there is a problem with the USB path configuration of the host computer, the test equipment, and the detection device, and re-debugging is required.

[0077] Step S2: The detection device detects the power path resistance and the battery path resistance of the test environment.

[0078] Specifically, S201, the host computer sends a second instruction to the detection device, and the processor of the detection device responds to the second instruction of the host computer to control the first switch to be turned on through the first IO output interface and to control the second switch to be turned on through the second IO output interface.

[0079] When the first switch is turned on, the equivalent resistance Rvbus of the power supply path of the test environment is connected in series with the first load resistance R6. At this time, the processor of the detection device can obtain the second power supply voltage test value of the test environment through the first analog-to-digital conversion interface. Since the connection point between the equivalent resistance Rvbus of the power supply path of the test environment and the first load resistance R6 is coupled to the input end of the power supply voltage divider sampling circuit, the second power supply voltage test value = R6 / (R6+Rvbus)*first power supply voltage test value. When the equivalent resistance Rvbus of the power supply path of the test environment is large, the voltage value obtained by the voltage division of the first load resistance R6 is small, and the second power supply voltage test value measured by the first analog-to-digital conversion interface is small; when the equivalent resistance Rvbus of the power supply path of the test environment is small, the voltage value obtained by the voltage division of the first load resistance R6 is large, and the second power supply voltage test value measured by the first analog-to-digital conversion interface is large.

[0080] When the second switch is turned on, the equivalent resistance Rvbat of the test environment battery path is connected in series with the second load resistance R10. At this time, the processor of the detection device can obtain the second battery voltage test value of the test environment through the second analog-to-digital conversion interface. Since the connection point of the equivalent resistance Rvbat of the test environment battery path and the second load resistance R10 is coupled to the input end of the battery voltage divider sampling circuit, the second battery voltage test value = R10 / (R10+Rvbat)*first battery voltage test value.

[0081] S202: The detection device converts the second power supply voltage test value into the second power supply voltage actual value and converts the second battery voltage test value into the second battery voltage actual value through a processor.

[0082] S203: The processor of the detection device sends the actual value of the second power supply voltage and the actual value of the second battery voltage to the host computer, and the host computer determines whether the actual value of the second power supply voltage and the actual value of the second battery voltage are within a preset range.

[0083] If the actual value of the second power supply voltage is within the preset range, it means that the power supply path resistance of the test environment is small, and the power supply voltage loss is small when the test equipment tests the mainboard; if the actual value of the second power supply voltage is lower than the lower limit of the preset range, it means that the power supply path resistance of the test environment is large, and the power supply voltage loss is large when the test equipment tests the mainboard.

[0084] If the actual value of the second battery voltage is within the preset range, it means that the battery path resistance of the test environment is small, and the battery voltage loss is small when the test equipment tests the mainboard; if the actual value of the second battery voltage is lower than the lower limit of the preset range, it means that the battery path resistance of the test environment is large, and the battery voltage loss is large when the test equipment tests the mainboard.

[0085] It should be noted that, since the first load resistor R6 and the second load resistor R10 have relatively small resistance values, long-term operation may cause the load resistors to overheat and be damaged. Therefore, after measuring the power path resistance and the battery path resistance, the processor should promptly control the first switch to turn off through the first IO output interface and control the second switch to turn off through the second IO output interface to avoid damage to the detection device due to overheating of the load resistors.

[0086] Step S3: The detection device detects whether the data communication in the test environment is normal.

[0087] Specifically, S301, the host computer sends data to the detection device cyclically through the USB signal probe, and the detection device checks the received data. If the data checked by the detection device is consistent with the preset data, the data return value is sent to the host computer; if the data checked by the detection device is inconsistent with the preset data, it means that the data communication of the test environment is abnormal, and at this time, the detection device sends a data communication abnormality signal to the host computer.

[0088] S302, the host computer checks the received data return value. If the data return value received by the host computer is consistent with the preset data return value, it means that the data communication of the test environment is normal; if the data return value received by the host computer is inconsistent with the preset return value, it means that the data communication of the test environment is abnormal, and the data communication module of the test environment needs to be debugged or repaired.

[0089] Step S4: The detection device detects whether the heat dissipation function of the test environment is normal.

[0090] Specifically, S401, the host computer sends a third instruction to the detection device, and the processor of the detection device responds to the third instruction of the host computer and cyclically obtains temperature data of the temperature sensor through the I2C communication interface.

[0091] S402, the processor of the detection device sends the acquired temperature data to the host computer, which reads the temperature value of the test environment in a loop to determine whether the temperature decreases faster than the preset speed, so as to detect whether the heat dissipation function of the test environment is normal. If the temperature decreases faster than the preset speed, it means that the heat dissipation function of the test environment is good; if the temperature decreases slower than the preset speed, it means that the heat dissipation of the test environment is abnormal, and the heat dissipation module of the test environment needs to be debugged or repaired.

Claims

1. A detection device, characterized in that: It comprises a first component and a second component; the first component comprises a first USB interface, the second component comprises a second USB interface, and the first USB interface is used to connect to the second USB interface; The second component includes a USB communication test contact, a power supply voltage test contact and a battery voltage test contact; The USB communication test contact is used to connect a USB signal probe of a test device, the power supply voltage test contact is used to connect a power supply voltage probe of the test device, and the battery voltage test contact is used to connect a battery voltage probe of the test device; The data terminal of the second USB interface is connected to the USB communication test contact, the power voltage terminal of the second USB interface is connected to the power voltage test contact, and the spare terminal of the second USB interface is connected to the battery voltage test contact; The first component includes a controller, and the controller detects whether the data terminal transmits data normally, detects the voltage of the power voltage terminal, and detects the voltage of the standby terminal by executing the test items indicated by the host computer.

2. The device according to claim 1, characterized in that The first component also includes a USB to serial port chip; the controller includes a serial communication input and output IO interface, the serial communication IO interface is connected to one end of the USB to serial port chip, and the other end of the USB to serial port chip is connected to the data terminal of the first USB interface.

3. The device according to claim 2, characterized in that The first component also includes a power supply voltage dividing sampling circuit; the power supply voltage dividing sampling circuit is used to convert the power supply voltage of the test device into a voltage adapted by the controller; The controller includes a first analog-to-digital conversion interface, the first analog-to-digital conversion interface is connected to the output end of the power supply voltage divider sampling circuit, the input end of the power supply voltage divider sampling circuit is connected to the power supply voltage terminal of the first USB interface, and the ground end of the power supply voltage divider sampling circuit is grounded.

4. The device according to claim 3, characterized in that The first component also includes a first switch and a first load resistor; The controller also includes a first IO output interface, the first IO output interface is connected to the control end of the first switch, the first end of the first switch is grounded, the second end of the first switch is connected to one end of the first load resistor, and the other end of the first load resistor is connected to the input end of the power supply voltage divider sampling circuit.

5. The device according to claim 4, characterized in that The first switch is specifically a first N-type metal oxide semiconductor (NMOS) switch.

6. The device according to claim 2, characterized in that The first component also includes a battery voltage division sampling circuit; the battery voltage division sampling circuit is used to convert the battery voltage of the test device into a voltage adapted by the controller; The controller includes a second analog-to-digital conversion interface, which is connected to the output end of the battery voltage divider sampling circuit, the input end of the battery voltage divider sampling circuit is connected to the spare terminal of the first USB interface, and the ground end of the battery voltage divider sampling circuit is grounded.

7. The device according to claim 6, characterized in that The first component also includes a second switch and a second load resistor; The controller also includes a second IO output interface, the second IO output interface is connected to the control end of the second switch, the first end of the second switch is grounded, the second end of the second switch is connected to one end of the second load resistor, and the other end of the second load resistor is connected to the input end of the battery voltage divider sampling circuit.

8. The device according to claim 7, characterized in that The second switch is specifically a second NMOS switch.

9. The device according to any one of claims 2 to 8, characterized in that: The first component also includes a temperature sensor; the controller includes an internal integrated circuit I2C communication IO interface, and the I2C communication IO interface is connected to the temperature sensor.

10. The device according to any one of claims 2 to 8, characterized in that The first component also includes a power conversion chip; the controller also includes a power supply voltage VCC interface; One end of the power conversion chip is connected to the power voltage terminal of the first USB interface; the other end of the power conversion chip is connected to the VCC interface for supplying power to the controller.

11. The device according to claim 3, characterized in that The power supply voltage dividing sampling circuit comprises a first voltage dividing resistor and a second voltage dividing resistor; The first end of the first voltage-dividing resistor serves as the input end of the power supply voltage dividing sampling circuit, the second end of the first voltage-dividing resistor is connected to the first end of the second voltage-dividing resistor, and the connection point serves as the output end of the power supply voltage dividing sampling circuit, and the second end of the second voltage-dividing resistor serves as the ground end of the power supply voltage dividing sampling circuit.

12. The device according to claim 6, characterized in that The battery voltage dividing sampling circuit comprises a third voltage dividing resistor and a fourth voltage dividing resistor; The first end of the third voltage-dividing resistor serves as the input end of the battery voltage-dividing sampling circuit, the second end of the third voltage-dividing resistor is connected to the first end of the fourth voltage-dividing resistor, and the connection point serves as the output end of the battery voltage-dividing sampling circuit, and the second end of the fourth voltage-dividing resistor serves as the ground end of the battery voltage-dividing sampling circuit.

13. The device according to claim 1, characterized in that The second component includes a positioning hole, and the positioning hole is used to fix the second component.

14. The device according to claim 1, characterized in that The size of the first component is smaller than a preset range.

15. A detection system, characterized in that: It comprises: a host computer, an instrument power supply, a test device, and a detection device as described in any one of claims 1 to 14; After the detection device is fixed on the test equipment, the USB communication test contact on the second component in the detection device is connected to the USB signal probe of the test equipment, the power supply voltage test contact on the second component is connected to the power supply voltage probe of the test equipment, and the battery voltage test contact on the second component is connected to the battery voltage probe of the test equipment; The USB signal probe is also connected to the USB data terminal in the USB interface of the host computer, and the detection device communicates with the host computer through the USB signal probe of the test equipment; the power supply voltage probe is also connected to the power supply voltage terminal of the test equipment; the battery voltage probe is also connected to the instrument power supply.

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