Tool clamp and chip antistatic performance test board
By designing a slidable conductor and chip antistatic performance test board, the problem of frequent replacement of circuits and templates in the prior art chip antistatic test is solved, and efficient antistatic performance testing of a variety of chips is achieved.
Patent Information
- Application Number
- CN202421131559.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-22
- Publication Date
- 2025-05-06
- Estimated Expiration
- 2034-05-22
AI Technical Summary
In the prior art, the antistatic test of each chip requires independent circuits and templates, which leads to frequent replacement of circuits and templates when testing multiple chips, which is troublesome to operate.
A tooling fixture and chip anti-static performance test board are designed, which is connected to the chip pin through a conductor, which is connected to the external pin through a conductor, and then is connected to the test circuit through an external pin. The conductor can slide in the sliding frame to achieve anti-static performance testing of various chips.
The antistatic performance test of multiple chips using one test board is realized, reducing the frequency of circuit and template replacement and improving the testing efficiency.
Smart Images
Figure CN222838094U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field related to chip production, in particular to a tooling fixture and a chip antistatic performance test board. Background Art
[0002] In the production process of chips, many complex processes are required, including epitaxy, oxidation, photolithography, packaging and testing of silicon wafers, among which performance testing is indispensable. Under the same conditions, the more stable the performance of the chip, the higher its production difficulty and sales price, and the antistatic performance test is particularly important.
[0003] In the prior art, each chip's anti-static test usually has an independent circuit, which releases static electricity to each pin of the chip and observes the changes in the chip and its parameters to determine the impact of static electricity on the chip.
[0004] However, there are many chips on the market with different packages and sizes, and the test of each chip requires corresponding circuits and templates. When testing the electrostatic performance of multiple chips, it is necessary to constantly replace the circuits and chip reading templates, which is too troublesome. Utility Model Content
[0005] The utility model aims to provide a tooling fixture and a chip antistatic performance test board to solve the problems raised in the above background technology.
[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a tooling fixture, comprising: a test plate and a plurality of positioning feet, wherein the plurality of positioning feet are fixedly installed on the lower surface of the test plate, and the upper surface of the test plate is provided with symmetrical first slideways, each of the first slideways is slidably connected with a sliding frame, and each of the sliding frames is slidably connected with a pin connecting device, and a second slideway is provided between the two first slideways, and a first threaded rod is arranged at one end of the second slideway, and a clamping block is rotatably connected to one end of the first threaded rod, and a fixing plate is fixedly connected to the clamping block.
[0007] Preferably, a third slide track is provided on the upper surface of the sliding frame, and fourth slide tracks are provided on both side walls of the third slide track. A plurality of first sliding blocks are slidably connected in the third slide track.
[0008] Preferably, the pin connecting device includes a second threaded rod, the second threaded rod passes through the first slider and is threadedly connected thereto, one end of the second threaded rod is fixedly connected to a rotating ring, the other end of the second threaded rod is fixedly connected to a spring, one end of the spring is fixedly connected to the second threaded rod, the other end of the spring is fixedly connected to a guide head, a telescopic rod is arranged between the guide head and the second threaded rod, the telescopic rod is fixedly connected to the upper surface of the guide head, the telescopic rod passes through the spring and extends into the second threaded rod, and an external pin is fixedly installed on the upper surface of the rotating ring.
[0009] Preferably, there are two types of guide heads, one of which has a groove on its lower surface, and the other of which has a hemispherical protrusion fixedly mounted on its lower surface.
[0010] Preferably, second sliders are fixedly mounted on both sides of the first slider, and the second sliders are slidably connected to the fourth slideway.
[0011] Preferably, a rubber pad is provided on the upper surface of each of the second sliding blocks.
[0012] A chip antistatic performance testing board comprises the above-mentioned fixture.
[0013] Compared with the prior art, the beneficial effects of the utility model are:
[0014] The utility model proposes that a guide head is connected to a chip pin by using the guide head, which is connected to an external pin through a wire and then connected to a test circuit through the external pin. The guide head can slide in a sliding frame and can be connected to the pin of a chip to be measured by sliding the guide head. Therefore, the design can use a test board to test the antistatic performance of multiple chips. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 It is a three-dimensional structural schematic diagram of the utility model;
[0016] Figure 2 A schematic diagram of a three-dimensional structure of the utility model from another viewing angle;
[0017] Figure 3 It is a schematic diagram of the three-dimensional structure of the slideway frame of the utility model;
[0018] Figure 4 It is a schematic diagram of the three-dimensional structure of the pin connection device of the utility model;
[0019] Figure 5 This is a schematic diagram of the three-dimensional structure of another pin connection device of the utility model.
[0020] In the figure: 1. test board; 2. positioning foot; 3. sliding frame; 4. first slide; 6. second slide; 7. pin connecting device; 8. first threaded rod; 9. clamping block; 10. fixing plate; 13. third slide; 14. fourth slide; 15. outer pin; 16. rotating ring; 17. second threaded rod; 18. second slide; 19. spring; 20. guide head; 21. groove; 22. telescopic rod; 23. first slide; 24. rubber pad; 25. hemispherical protrusion. DETAILED DESCRIPTION
[0021] In order to make the purpose and technical solution of the utility model clearly and completely described, and the advantages more clearly understood, the embodiments of the utility model are further described in detail in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are part of the embodiments of the utility model, not all of the embodiments, and are only used to explain the embodiments of the utility model, and are not used to limit the embodiments of the utility model. All other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0022] Embodiment 1
[0023] See also Figure 1-Figure 5The utility model provides a technical solution: a tooling fixture, including: a test board 1 and a plurality of positioning feet 2, the positioning feet 2 are used to prevent components from contacting the desktop when placing the circuit board, so as to avoid unknown static electricity affecting the test, the plurality of positioning feet 2 are fixedly installed on the lower surface of the test board 1, and the upper surface of the test board 1 is provided with symmetrical first slideways 4, each of which is slidably connected with a sliding frame 3, and each of which is slidably connected with a pin connection device 7, and the sliding frame 3 can slide on the test board 1, so that the pin connection device 7 can be on the test board 1 The chip can be placed in the second slide 6 in reverse, so that the pins of the chip face upward for easy access. A first threaded rod 8 is arranged at one end of the second slide 6, and a clamping block 9 is rotatably connected to one end of the first threaded rod 8. A fixing plate 10 is fixedly connected to the clamping block 9. When the threaded rod is rotated, the fixing plate 10 slides in the second slide 6, and the fixing plate 10 can firmly clamp the chip placed in the second slide 6 in reverse. A third slide 13 is arranged on the upper surface of the sliding frame 3, and both side walls of the third slide 13 are provided with The fourth slide 14, the third slide 13 is opened in the fourth slide 14, and a plurality of first sliders 23 are slidably connected in the third slide 13. The pin connection device 7 includes a second threaded rod 17, the second threaded rod 17 passes through the first slider 23 and is threadedly connected thereto, one end of the second threaded rod 17 is fixedly connected to a rotating ring 16, the other end of the second threaded rod 17 is fixedly connected to a spring 19, one end of the spring 19 is fixedly connected to the second threaded rod 17, the other end of the spring 19 is fixedly connected to a guide head 20, and a telescopic rod 2 is arranged between the guide head 20 and the second threaded rod 17 2. The telescopic rod 22 is fixedly connected to the upper surface of the guide head 20. The telescopic rod 22 penetrates the spring 19 and extends into the second threaded rod 17 and is slidably connected to the second threaded rod 17. The upper surface of the rotating ring 16 is fixedly installed with an external pin 15. When it is necessary to connect a pin on the chip, first slide the sliding frame 3 and the first slider 23 so that the guide head 20 is directly above the chip pin, and then rotate the second threaded rod 17 so that the guide head 20 contacts and presses the pin on the chip, and then connect the wire to the external pin 15, and static electricity can be released to the chip pin through the external pin 15.
[0024] First, place the chip upside down in the second slide 6, and rotate the first threaded rod 8 to clamp the chip in the second slide 6, then move the sliding frame 3 and the first slider 23, so that the guide head 20 is above the pin to be tested, and finally rotate the rotating ring 16. The rotating ring 16 will drive the entire device to rotate until the guide head 20 contacts the chip pin. The rotating ring 16 can continue to be rotated to generate a certain pressure on the chip pin. Under the action of pressure, the spring 19 is in a contracted state. At this time, the wire can be connected to the external pin 15 for testing.
[0025] A chip antistatic performance testing board comprises the above-mentioned fixture.
[0026] Embodiment 2
[0027] See also Figure 3-Figure 5 On the basis of the first embodiment, there are two types of guide heads 20, one of which has a groove 21 on the lower surface of the guide head 20, which can be used with a chip with an external pin 15, and the pin can be firmly stuck in the groove 21. The lower surface of the other guide head 20 is fixedly installed with a hemispherical protrusion 25, and the second slider 18 is fixedly installed on both sides of the first slider 23. The chip without the external pin 15 can use the hemispherical protrusion 25, the second slider 18 is slidably connected to the fourth slide 14, and the upper surface of each second slider 18 is provided with a rubber Pad 24, since the second slider 18 is in the fourth slide 14, when the spring 19 is subjected to force, the second threaded rod 17 and the first slider 23 and the second slider 18 on the second threaded rod 17 will move upward together. At this time, the rubber pad 24 on the upper surface of the second slider 18 will contact the upper arm of the fourth slide 14. At this time, the first slider 23 is not easy to move anymore. In this way, the first slider 23 can be positioned by the rubber block. If a guide head 20 with a groove 21 is selected, the rotating ring 16 can be stopped after the groove 21 is engaged with the outer pin 15 of the chip.
[0028] First, place the chip upside down in the second slide 6, and rotate the first threaded rod 8 to clamp the chip in the second slide 6, then move the sliding frame 3 and the first slider 23, so that the guide head 20 is above the pin to be tested, and finally rotate the rotating ring 16, which will drive the entire device to rotate until the guide head 20 contacts the chip pin. The rotating ring 16 can be continued to be rotated to exert a certain pressure on the chip pin. Under the action of the pressure, the spring 19 is in a contracted state. When the spring 19 is subjected to force, the second threaded rod 17 and the first slider 23 and the second slider 18 on the second threaded rod 17 will move upward together. At this time, there will be a second The rubber pad 24 on the upper surface of the slider 18 contacts the upper arm of the fourth slide 14. At this time, the first slider 23 is not easy to move anymore. In this way, the first slider 23 can be positioned by the rubber block. At this time, the wire can be connected to the external pin 15 for testing. The utility model proposes to connect the chip pin with the guide head 20 by using the guide head 20, and the guide head 20 is connected to the external pin 15 through the wire, and then connected to the test circuit through the external pin 15. The guide head 20 can slide in the sliding frame 3, and the pin of the chip to be measured can be connected by sliding the guide head 20. Therefore, the design can use a test board 1 to test the anti-static performance of multiple chips.
[0029] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A fixture, comprising: A test board (1) and a plurality of positioning feet (2), wherein the plurality of positioning feet (2) are fixedly mounted on the lower surface of the test board (1), characterized in that: a symmetrical first slideway (4) is provided on the upper surface of the test board (1), each of the first slideways (4) is slidably connected to a sliding frame (3), each of the sliding frames (3) is slidably connected to a pin connecting device (7), a second slideway (6) is provided between two of the first slideways (4), a first threaded rod (8) is provided at one end of the second slideway (6), a clamping block (9) is rotatably connected to one end of the first threaded rod (8), and a fixing plate (10) is fixedly connected to the clamping block (9).
2. A fixture according to claim 1, characterized in that: A third slideway (13) is provided on the upper surface of the sliding frame (3), and fourth slideways (14) are provided on both side walls of the third slideway (13). A plurality of first sliding blocks (23) are slidably connected in the third slideway (13).
3. A fixture according to claim 2, characterized in that: The pin connection device (7) comprises a second threaded rod (17), the second threaded rod (17) passes through the first slider (23) and is threadedly connected thereto, one end of the second threaded rod (17) is fixedly connected to a rotating ring (16), the other end of the second threaded rod (17) is fixedly connected to a spring (19), one end of the spring (19) is fixedly connected to the second threaded rod (17), the other end of the spring (19) is fixedly connected to a guide head (20), a telescopic rod (22) is arranged between the guide head (20) and the second threaded rod (17), the telescopic rod (22) is fixedly connected to the upper surface of the guide head (20), the telescopic rod (22) passes through the spring (19) and extends into the second threaded rod (17), and an outer pin (15) is fixedly mounted on the upper surface of the rotating ring (16).
4. A fixture according to claim 3, characterized in that: There are two types of guide heads (20), one of which has a groove (21) on its lower surface, and the other of which has a hemispherical protrusion (25) fixedly mounted on its lower surface.
5. A fixture according to claim 4, characterized in that: Second slide blocks (18) are fixedly mounted on both sides of the first slide block (23), and the second slide block (18) is slidably connected to the fourth slideway (14).
6. A fixture according to claim 5, characterized in that: A rubber pad (24) is provided on the upper surface of each of the second sliding blocks (18).
7. A chip antistatic performance test board, characterized in that: The tooling fixture comprises any one of claims 1 to 6.