Circuit board test tool

Abstract

The utility model discloses a circuit board testing tool, and relates to the technical field of semiconductor testing, and the circuit board testing tool comprises a bearing seat and a frame body arranged on the bearing seat, the bearing seat is provided with a probe assembly, a space is formed in the bearing seat, and a testing plate connected with the probe assembly is arranged in the space of the bearing seat. A plurality of probes extend out of the side, away from the bearing seat, of the probe assembly, the other sides of the probes are used for arranging a circuit board to be tested, a clamping assembly is arranged on the frame body, and the clamping end of the clamping assembly moves towards the bearing seat to extrude the circuit board to be tested. Therefore, the test points of the to-be-tested circuit board are correspondingly contacted with the probes so as to detect the information of the to-be-tested circuit board through the test board. According to the circuit board test tool provided by the invention, the test efficiency and the test accuracy can be improved.

Description

Technical Field

[0001] The present application relates to the field of semiconductor testing technology, and in particular to a circuit board testing tool. Background Art

[0002] Printed Circuit Board (PCB) is a vital basic component in electronic devices. It connects electronic components through a preset conductive path so that current can flow between different components according to the design requirements to achieve circuit functions. In order to ensure the stable and smooth operation of the circuit board, the circuit board needs to be tested before it is installed in the semiconductor equipment to screen out defective products. During the circuit board testing process, the circuit board test tooling is indispensable. The circuit board test tooling can firmly fix the circuit board, making it easier for operators to firmly test the integrated circuit chip.

[0003] In the prior art, the circuit board test device is only used to fix the circuit board. During the test, the impedance or voltage of each test point is manually measured using a digital multimeter. However, there are many resistance test points and many voltage test points on the circuit board, which makes the test points more numerous and smaller. It takes a long time for the operator to use the digital multimeter to measure point by point step by step, and it is easy to miss the measurement. After the measurement, it is necessary to manually judge whether the data is within the qualified range, which is easy to make mistakes. Utility Model Content

[0004] The purpose of this application is to provide a circuit board testing tool that can improve testing efficiency and testing accuracy.

[0005] On the one hand, an embodiment of the present application provides a circuit board testing tool, including a supporting seat and a frame arranged on the supporting seat, a probe assembly is arranged on the supporting seat, a space is formed in the supporting seat and a test board connected to the probe assembly is arranged in the space of the supporting seat, a plurality of probes are extended from the probe assembly toward a side away from the supporting seat, and the other side of the probe is used to set the circuit board to be tested, a clamping assembly is arranged on the frame, and the clamping end of the clamping assembly moves toward the supporting seat to squeeze the circuit board to be tested, so that the test points of the circuit board to be tested are in contact with the corresponding probes to detect information of the circuit board to be tested through the test board.

[0006] As an implementable manner, a pressing rod is provided at the clamping end of the clamping assembly, and when the clamping assembly moves toward the bearing seat, the pressing rod contacts and presses the circuit board to be tested.

[0007] As an implementable method, the clamping assembly includes a clamping member arranged on a frame and a clamping plate arranged at the clamping end of the clamping member. The clamping member includes multiple pressing rods, and the multiple pressing rods are arranged on the side of the clamping plate facing the supporting seat. When the clamping plate moves toward the circuit board to be tested, the multiple pressing rods respectively contact the circuit board to be tested and squeeze the circuit board to be tested.

[0008] As an implementable manner, the pressure rod is an anti-static pressure rod.

[0009] As an implementable manner, a balancing plate is further provided between the clamping plate and the clamping member, and guide shafts are respectively provided at both ends of the balancing plate, and the guide shafts pass through the balancing plate and are fixedly connected to the frame and the bearing seat.

[0010] As an implementable manner, a limiting structure is provided on the bearing seat for limiting the relative position of the probe assembly with respect to the bearing seat, and the upper surface of the probe assembly is concave to form a groove, in which the circuit board to be tested is placed.

[0011] As an implementable manner, at least two positioning holes are provided on the circuit board to be tested, and at least two limiting posts are extended from the probe assembly toward a side away from the supporting seat, which are used to cooperate with the positioning holes on the circuit board to limit the circuit board to be tested.

[0012] As an implementable manner, the limiting structure is a placement groove arranged on the bearing seat, the probe assembly is arranged in the placement groove and the outer periphery of the probe assembly contacts the inner wall of the placement groove.

[0013] As an implementable manner, a take-in and put-out opening is provided at corresponding positions of the side wall of the placement slot and the side wall of the groove, so as to facilitate taking out or placing the circuit board to be tested through the take-in and put-out opening.

[0014] As an implementable method, multiple pressure rods are arranged on the clamping plate, the side walls of the groove form a limiting step, the circuit board to be tested is set on the limiting step, and the projection of the pressure rods on the bearing seat along the clamping direction of the clamping member falls on the limiting step.

[0015] The beneficial effects of the embodiments of the present application include:

[0016] The circuit board testing tool provided by the present application includes a bearing seat and a frame body arranged on the bearing seat, a probe assembly is arranged on the bearing seat, a space is formed in the bearing seat and a test board connected to the probe assembly is arranged in the space formed by the bearing seat, a plurality of probes are extended from the probe assembly toward a side away from the bearing seat, and the other side of the probe is used to set the circuit board to be tested. During the detection, the test points of the plurality of circuit boards to be tested are in contact with the probes one by one, a clamping assembly is arranged on the frame body, and the clamping end of the clamping assembly moves toward the bearing seat to squeeze the circuit board to be tested, so that the test points of the circuit board to be tested are in contact with the probes to detect the information of the circuit board to be tested through the test board. Since the plurality of probes correspond to the plurality of test points of the circuit board to be tested one by one, the test of the plurality of test points can be realized in one test process, thereby improving the test efficiency. In addition, the test is carried out using the test board, and the test points on the test board, the probes on the probe assembly and the circuit board to be tested correspond to each other, so that no missed test will be caused. In addition, when the circuit board test tool cooperates with the circuit board test machine, the circuit board test machine, as a controller, can store the information on the circuit board and compare it with the preset threshold, and remind the value that exceeds the preset threshold, which is not easy to make misjudgment. Therefore, the circuit board test tool of the embodiment of the present application can improve the test efficiency and test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 One of the structural schematic diagrams of a circuit board testing tool provided in an embodiment of the present application;

[0019] Figure 2 A second structural diagram of a circuit board testing tool provided in an embodiment of the present application;

[0020] Figure 3 for Figure 2 Cross-section along AA.

[0021] Icons: 100-circuit board test tooling; 110-carrying seat; 120-frame; 130-probe assembly; 131-probe; 132-groove; 133-limiting column; 134-limiting step; 140-test board; 150-clamping assembly; 151-clamping piece; 152-clamping plate; 153-pressing rod; 154-balance plate; 155-guide shaft; 160-limiting structure; 161-placement slot; 162-pick-up and drop-out port; 200-circuit board to be tested. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations.

[0023] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for which protection is sought, but merely represents selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0024] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0025] In the description of the present application, it should be noted that the terms "center", "vertical", "horizontal", "inside", "outside", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, or are the orientations or positional relationships in which the product of the application is usually placed when in use. They are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0026] The present application embodiment provides a circuit board testing tool 100, such as Figure 1 , Figure 2 and Figure 3 As shown, it includes a supporting base 110 and a frame 120 arranged on the supporting base 110, a probe assembly 130 is arranged on the supporting base 110, a space is formed in the supporting base 110, and a test board 140 connected to the probe assembly 130 is arranged in the space formed by the supporting base, the probe assembly 130 extends a plurality of probes 131 toward a side away from the supporting base 110, and the other side of the probes 131 is used to set the circuit board 200 to be tested, and a clamping assembly 150 is arranged on the frame 120, and the clamping end of the clamping assembly 150 moves toward the supporting base 110 to squeeze the circuit board 200 to be tested, so that the test points of the circuit board 200 to be tested are in contact with the probes 131 to detect the information of the circuit board 200 to be tested through the test board 140.

[0027] The circuit board testing tool 100 of the embodiment of the present application is used to cooperate with the circuit board testing machine to complete the information detection of the circuit board 200 to be tested. Specifically, Figure 1 As shown, when the circuit board test fixture 100 is working, the circuit board 200 to be tested is first placed on the probe assembly 130, and the multiple probes 131 on the probe assembly 130 contact the test points on the circuit board 200 to be tested one by one. At this time, the clamping assembly 150 is operated so that the clamping end of the clamping assembly 150 moves downward perpendicular to the support base 110 until the clamping end of the clamping assembly 150 contacts and squeezes the circuit board 200 to be tested, so that the contact points of the circuit board 200 to be tested abut against the probes 131, and the electrical connection between the circuit board 200 to be tested and the probe assembly 130 is realized. A test board 140 connected to the probe assembly 130 is arranged in the support base 110, so that the test board 140 is connected to the circuit board 200 to be tested through the probe assembly 130, and at this time, the circuit board tester tests the information on the circuit board 200 to be tested through the test board 140. After the test is completed, the clamping assembly 150 is operated to release the clamping of the circuit board 200 to be tested, the circuit board 200 to be tested is taken out and the next circuit board 200 to be tested is placed to start the test of the next circuit board 200 to be tested.

[0028] Since the multiple probes 131 correspond one-to-one with the multiple test points of the circuit board 200 to be tested, the test of multiple test points can be realized in one test process, thereby improving the test efficiency. In addition, the test board 140 is used for testing, and the test board 140, the probes 131 on the probe assembly 130 and the test points on the circuit board 200 to be tested correspond one-to-one, so that no missed test will be caused. In addition, when the circuit board test fixture 100 cooperates with the circuit board tester, the circuit board tester, as a controller, can store the information on the circuit board and compare it with the preset threshold, and remind the numerical value exceeding the preset threshold, and it is not easy to make misjudgment. Therefore, the circuit board test fixture 100 of the embodiment of the present application can improve the test efficiency and test accuracy.

[0029] Specifically, the test information of the circuit board 200 to be tested is not limited in the embodiment of the present application, and can be, for example, the impedance between two contact points, the voltage value between two points, etc. During the test, if the circuit board 200 to be tested needs to be powered, an external voltage stabilizer can be used to power the circuit board 200 to be tested.

[0030] In addition, if Figure 3As shown, in order to facilitate the electrical connection between the probe assembly 130 and the test board 140, a wire opening can be opened on the upper surface of the supporting base 110, and the connecting wires between the probe assembly 130 and the test board 140 pass through the wire opening to connect the probe assembly 130 and the test board 140. Since there are multiple test points on the circuit board 200 to be tested, the corresponding probe assembly 130 has multiple probes 131, so that the probe assembly 130 and the test board 140 have multiple line connections. In order to facilitate the connection between the probe assembly 130 and the test board 140, a wiring harness can be used to connect the probe assembly 130 and the test board 140, and the wiring harness passes through the wire opening to realize the electrical connection between the probe assembly 130 and the test board 140.

[0031] It should be noted that Figure 1 1 is a schematic diagram of the structure of the circuit board testing tool 100 during testing. At this time, the circuit board 200 to be tested is placed on the probe assembly 130 and clamped by the clamping assembly 150 . Figure 2 exist Figure 1 The circuit board 200 to be tested is removed on the basis of the probe assembly 130 , so that the specific structure of the probe assembly 130 can be more clearly displayed.

[0032] The specific structure of the support seat 110 is not limited in the present embodiment, and can be, for example, as follows: Figure 1 As shown, 6 boards are connected to each other to form a rectangular parallelepiped, and a containing space is formed in the support seat 110. The test board 140 is arranged in the support seat 110, which can protect the test board 140 and prevent the test board 140 from being damaged by external collision. In addition, in order to prevent the solder joints on the back of the test board 140 from contacting the inner surface of the support seat 110, a supporting structure can be provided at the bottom of the inner surface of the support seat 110. This can prevent the solder joints on the back of the test board 140 from contacting the inner surface of the support seat 110, and can limit the position of the test board 140 to prevent displacement. In addition, the specific structure of the probe assembly 130 is not limited in the embodiment of the present application. For example, it can be a probe card.

[0033] The circuit board testing tool 100 provided in the present application includes a supporting base 110 and a frame 120 arranged on the supporting base 110, a probe assembly 130 is arranged on the supporting base 110, and a test board 140 connected to the probe assembly 130 is arranged in the space formed by the supporting base 110, the probe assembly 130 extends a plurality of probes 131 toward a side away from the supporting base 110, and the other side of the probes 131 is used to set a circuit board 200 to be tested. During detection, the test points of the plurality of circuit boards 200 to be tested contact with the probes 131 one by one, and a clamping assembly 150 is arranged on the frame 120, and the clamping end of the clamping assembly 150 moves perpendicular to the supporting base 110 to squeeze the circuit board 200 to be tested, so that the test points of the circuit board 200 to be tested contact with the probes 131 accordingly to detect the information of the circuit board 200 to be tested through the test board 140. Since the multiple probes 131 correspond one-to-one with the multiple test points of the circuit board 200 to be tested, the test of multiple test points can be realized in one test process, thereby improving the test efficiency. In addition, the test board 140 is used for testing, and the test board 140, the probes 131 on the probe assembly 130 and the test points on the circuit board 200 to be tested correspond one-to-one, so that no missed test will be caused. In addition, when the circuit board test fixture 100 cooperates with the circuit board tester, the circuit board tester, as a controller, can store the information on the circuit board and compare it with the preset threshold, and remind the numerical value exceeding the preset threshold, and it is not easy to make misjudgment. Therefore, the circuit board test fixture 100 of the embodiment of the present application can improve the test efficiency and test accuracy.

[0034] Optional, such as Figure 1 , Figure 2 and Figure 3 As shown, a pressing rod 153 is provided at the clamping end of the clamping assembly 150 . When the clamping assembly 150 moves toward the supporting seat 110 , the pressing rod 153 contacts and presses the circuit board 200 to be tested.

[0035] In order to facilitate the clamping assembly 150 to press the circuit board 200 under test, a pressing rod 153 is provided at the clamping end of the clamping assembly 150 . Driven by the clamping assembly 150 , the pressing rod 153 contacts and presses the circuit board 200 under test.

[0036] In one achievable manner of the embodiment of the present application, the clamping assembly 150 includes a clamping member 151 disposed on the frame 120 and a clamping plate 152 disposed at the clamping end of the clamping member 151, and the pressure rod 153 includes a plurality of pressure rods 153, and the plurality of pressure rods 153 are disposed on a side of the clamping plate 152 facing the supporting seat, and when the clamping plate 152 moves toward the circuit board 200 to be tested, the plurality of pressure rods 153 all contact with the circuit board 200 to be tested and squeeze the circuit board 200 to be tested.

[0037] When the pressing rod 153 contacts the circuit board 200 to be tested, it has to avoid the electronic components on the circuit board 200 to be tested, so the cross-sectional area is small. In this way, the contact area between the pressing rod 153 and the circuit board 200 to be tested is small, while the circuit board 200 to be tested has a larger area. In order to achieve stable clamping of the circuit board 200 to be tested, the embodiment of the present application provides a clamping plate 152 at the clamping end of the clamping member 151, and multiple pressing rods 153 are provided on the clamping plate. The multiple pressing rods 153 respectively contact and squeeze the circuit board 200 to be tested, so that the clamping assembly 150 has multiple contact points with the circuit board 200 to be tested, thereby improving the clamping stability.

[0038] Specifically, the area of ​​the clamping member 151 may be the same as the area of ​​the circuit board 200 to be tested, or may be slightly smaller than the area of ​​the circuit board 200 to be tested.

[0039] like Figure 1 , Figure 2 and Figure 3 Optionally, the pressure bar 153 is an anti-static pressure bar.

[0040] Those skilled in the art should know that the circuit board 200 to be tested is a semiconductor component and is relatively sensitive to static electricity. In order to prevent the pressure rod 153 from carrying static electricity and thus causing the static electricity to be transmitted to the circuit board 200 to be tested and affect the circuit board 200 to be tested, the pressure rod 153 in the embodiment of the present application is configured as an anti-static pressure rod, which isolates static electricity and prevents static electricity from being transmitted to the circuit board 200 to be tested and affecting the circuit board 200 to be tested.

[0041] In one possible implementation of the present application, Figure 1 , Figure 2 and Figure 3 As shown, a balancing plate 154 is further disposed between the clamping plate 152 and the clamping member 151 , and guide shafts 155 are respectively disposed at both ends of the balancing plate 154 . The guide shafts 155 pass through the balancing plate 154 and are fixedly connected to the frame 120 and the bearing seat 110 .

[0042] When the clamping end of the clamping member 151 is a point-shaped contact surface, for example, Figure 1 and Figure 2When the toggle clamp is shown, the contact area between the toggle clamp and the clamping plate 152 is small. Since the area of ​​the clamping plate 152 is large, the movement of the clamping plate 152 is unbalanced during the movement of the clamping member 151 driving the clamping plate 152, thereby causing unbalanced pressure on the circuit board 200 to be tested. In the embodiment of the present application, a balance plate 154 is arranged between the clamping member 151 and the clamping plate 152, and guide shafts 155 are arranged at both ends of the balance plate 154, and both ends of the guide shaft 155 are respectively fixedly connected to the frame 120 and the bearing seat 110. Due to the existence of the guide shaft 155, the balance plate 154 remains balanced during the movement of the balance plate 154 driven by the clamping member 151. The balance plate 154 is connected to the clamping plate 152 and is in surface contact with a large area, thereby causing the clamping plate 152 to move downward in a balanced manner, that is, the pressure of the clamping plate 152 on the circuit board 200 to be tested is balanced at various locations, thereby preventing the circuit board 200 to be tested from being out of contact at a certain location and affecting the detection effect.

[0043] The number of guide shafts 155 is not limited in the embodiment of the present application. For example, multiple guide shafts 155 may be provided at both ends of the balance plate 154, or one guide shaft 155 may be provided at both ends of the balance plate 154. Those skilled in the art may configure the guide shafts 155 according to actual conditions. For example, Figure 1 As shown, a guide shaft 155 is respectively provided at both ends of the balance plate 154.

[0044] It can be understood that the two ends of the balance plate 154 are respectively connected to the guide shaft 155, and the two ends of the guide shaft 155 are respectively connected to the supporting seat 110 and the frame 120, so that the projection of the guide shaft 155 in the vertical direction is located at the periphery of the probe assembly 130, that is, the two ends of the balance plate 154 exceed the probe assembly 130 in the horizontal direction, and the clamping plate 152 is the same size as the circuit board 200 to be tested, that is, the size of the balance plate 154 is larger than the size of the clamping plate 152, and the two ends extend out of the clamping plate 152.

[0045] Optional, such as Figure 1 , Figure 2 and Figure 3 As shown, a limiting structure 160 is provided on the support base 110 for limiting the relative position of the probe assembly 130 relative to the support base 110 . The upper surface of the probe assembly 130 is concave to form a groove 132 , and the groove 132 is used to place the circuit board 200 to be tested.

[0046] In order to prevent the probe assembly 130 from shifting on the bearing seat 110, a limiting structure 160 is provided on the bearing seat 110, the limiting structure 160 is fixedly connected to the bearing seat 110, the probe assembly 130 is arranged in the limiting structure, and the limiting structure 160 limits the position of the probe assembly 130. Similarly, the upper surface of the probe assembly 130 is concave to form a groove 132, the circuit board 200 to be tested is placed in the groove 132, and the side wall of the groove 132 limits the position of the circuit board 200 to be tested, so as to limit the circuit board 200 to be tested and prevent the circuit board from shifting on the probe assembly 130.

[0047] In one possible implementation of the present application, Figure 2 As shown, at least two limiting posts 133 extend from the probe assembly 130 toward a side away from the supporting base 110 , and are used to cooperate with positioning holes on the circuit board 200 to limit the circuit board 200 to be tested.

[0048] Since the test points on the circuit board 200 to be tested are densely populated, the corresponding probes 131 are close to each other. In order to accurately position the probes 131 and the test points, it is necessary to more accurately position the circuit board 200 to be tested. In the embodiment of the present application, at least two limiting posts 133 extend from the probe assembly 130 toward the side away from the supporting seat 110. The circuit board 200 to be tested has at least two positioning holes, and the positioning holes correspond to the limiting posts 133 one by one. The positioning posts extend into the positioning holes to realize accurate positioning of the circuit board 200 to be tested and the probe assembly 130.

[0049] Optional, such as Figure 2 and Figure 3 As shown, the limiting structure 160 is a placement groove 161 disposed on the supporting seat 110 , the probe assembly 130 is disposed in the placement groove 161 and the outer periphery of the probe assembly 130 contacts the inner wall of the placement groove 161 .

[0050] The limiting structure 160 is in the form of a placement groove 161, so that the bearing seat 110 and the probe assembly 130 are detachably connected. It should be known in the art that the circuit board 200 to be tested includes multiple types, the distribution diagram of the test points on the circuit board 200 to be tested also includes multiple types, and the corresponding probe assembly 130 also includes multiple types. When the bearing seat 110 and the probe assembly 130 are detachably connected, it is convenient to replace the probe assembly 130 and switch between multiple circuit boards 200 to be tested.

[0051] In addition, if Figure 1 and Figure 2 As shown, the depth of the placement groove 161 can be set to be shallower, so that the probe assembly 130 can be limited while the probe assembly 130 is extended out of the limiting structure 160, so that the probe assembly 130 can be easily taken and placed.

[0052] In one possible implementation of the present application, Figure 1 and Figure 2 As shown, a take-in and put-out opening 162 is provided at a corresponding position of the side wall of the placement slot 161 and the side wall of the groove 132 , so as to facilitate taking out or placing the circuit board 200 to be tested through the take-in and put-out opening 162 .

[0053] It can be seen from the working process of the circuit board test fixture 100 that a circuit board 200 to be tested is placed in the probe assembly 130 and measured, and then taken out after completion. When placing or taking out the circuit board 200 to be tested, it is inconvenient because the circuit board 200 to be tested is placed in the groove 132. In order to facilitate the removal or placement of the circuit board 200 to be tested, the embodiment of the present application respectively opens a take-in and put-out opening 162 on the side wall of the placement groove 161 and the side wall of the groove 132, and the operator can take and put the circuit board 200 to be tested through the take-in and put-out opening 162.

[0054] Optionally, the pressing rods 153 are distributed on the periphery of the clamping plate 152 , the side walls of the groove 132 form a limiting step 134 , the circuit board 200 to be tested is set on the limiting step 134 , and the projection of the pressing rods 153 on the supporting seat 110 along the clamping direction of the clamping member 151 falls on the limiting step 134 .

[0055] The pressing rods 153 are distributed on the periphery of the clamping plate 152, and the projection of the pressing rods 153 on the supporting seat 110 along the clamping direction of the clamping member 151 falls on the limiting step 134. When the clamping member 151 drives the pressing rods 153 to squeeze the circuit board 200 to be tested through the clamping plate 152, the pressing rods 153 contacting the circuit board 200 to be tested are carried on the step surface of the limiting step 134. In this way, the situation in which the circuit board 200 to be tested is damaged due to squeezing when there is air under the circuit board 200 to be tested is avoided.

[0056] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A circuit board testing tool, characterized in that: The invention comprises a bearing seat and a frame body arranged on the bearing seat, a probe assembly is arranged on the bearing seat, a space is formed in the bearing seat and a test board connected to the probe assembly is arranged in the space of the bearing seat, a plurality of probes are extended from the probe assembly toward a side away from the bearing seat, the other side of the probes is used to set a circuit board to be tested, a clamping assembly is arranged on the frame body, a clamping end of the clamping assembly moves toward the bearing seat to squeeze the circuit board to be tested, so that the test points of the circuit board to be tested are in contact with the probes correspondingly so as to detect the information of the circuit board to be tested through the test board.

2. The circuit board testing tool according to claim 1, characterized in that: A pressing rod is arranged at the clamping end of the clamping assembly. When the clamping assembly moves toward the bearing seat, the pressing rod contacts the circuit board to be tested and presses the circuit board to be tested.

3. The circuit board testing tool according to claim 2, characterized in that: The clamping assembly includes a clamping member arranged on a frame and a clamping plate arranged at a clamping end of the clamping member. The pressure rod includes a plurality of pressure rods, and the plurality of pressure rods are arranged on a side of the clamping plate facing the supporting seat. When the clamping plate moves toward the circuit board to be tested, the plurality of pressure rods respectively contact with the circuit board to be tested and squeeze the circuit board to be tested.

4. The circuit board testing tool according to claim 3, characterized in that: The pressure rod is an anti-static pressure rod.

5. The circuit board testing tool according to claim 3, characterized in that: A balancing plate is further arranged between the clamping plate and the clamping member, and guide shafts are respectively arranged at both ends of the balancing plate. The guide shafts pass through the balancing plate and are fixedly connected to the frame and the bearing seat.

6. The circuit board testing tool according to claim 3, characterized in that: A limiting structure is arranged on the bearing seat for limiting the relative position of the probe assembly with respect to the bearing seat. The upper surface of the probe assembly is concave to form a groove, and the circuit board to be tested is placed in the groove.

7. The circuit board testing tool according to claim 6, characterized in that: At least two positioning holes are arranged on the circuit board to be tested, and at least two limiting posts are extended from the probe assembly toward a side away from the bearing seat, so as to cooperate with the positioning holes on the circuit board to be tested to limit the circuit board to be tested.

8. The circuit board testing tool according to claim 6, characterized in that: The limiting structure is a placement groove arranged on the supporting seat, the probe assembly is arranged in the placement groove and the outer periphery of the probe assembly contacts the inner wall of the placement groove.

9. The circuit board testing tool according to claim 8, characterized in that: The side walls of the placement slot and the side walls of the groove are provided with access openings at corresponding positions, so as to facilitate taking out or placing the circuit board to be tested through the access openings.

10. The circuit board testing tool according to claim 6, characterized in that: A plurality of the pressing rods are arranged on the clamping plate, the side walls of the groove form a limiting step, the circuit board to be tested is arranged on the limiting step, and the projection of the pressing rods on the bearing seat along the clamping direction of the clamping member falls on the limiting step.

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