32EANA nuclear test system card testing device

By designing the card test device of the 32EANA verified testing system, the card impedance and power supply voltage detection are used for the card impedance and power supply voltage detection, which solves the problem of card aging and damage in harsh environments, improves the accuracy and efficiency of the test, and ensures the safe operation of the nuclear power plant.

CN222913755UActive Publication Date: 2025-05-27CHENGDU SIHONGWEI SCI & TECH
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Patent Information

Application Number
CN202421121381.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-05-21
Publication Date
2025-05-27
Estimated Expiration
2034-05-21

AI Technical Summary

Technical Problem

The 32EANA's card parts are susceptible to harsh environments such as high temperature, high pressure and radiation during long-term operation, resulting in aging and damage, which may cause system failure and threaten the safe operation of nuclear power plants. Traditional card test methods are inefficient and prone to misjudgment.

Method used

A 32EANA verification system card test device is designed, including a DC adjustable power module, a digital multimeter module, a display module, a data processing module and a data storage module. Through the combination of these modules, impedance detection and power supply voltage detection of the card parts are realized, improving the accuracy and efficiency of the test.

Benefits of technology

This device can improve the accuracy and efficiency of card parts testing, ensure the safe and stable operation of the nuclear power plant, and avoid system hazards caused by card parts failure.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the field of testing, and discloses a 32EANA nuclear test system card testing device, which comprises a 32EANA nuclear test system card, a direct current adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module, the DC adjustable power supply module is connected with the 32EANA nuclear measurement system card, and the DC adjustable power supply module, the digital multimeter module, the display module and the data storage module are respectively connected with the data processing module. The digital multimeter module is connected with the 32EANA nuclear measurement system clamping piece; and the digital multimeter module is used for carrying out card impedance detection and card power supply voltage detection on the 32EANA nuclear measurement system card. According to the utility model, the accuracy and efficiency of card testing can be improved, and safe and stable operation of the nuclear power station is ensured.
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Description

Technical Field

[0001] The utility model relates to the field of control, and specifically to a 32EANA nuclear measurement system card testing device. Background Technique

[0002] With the rapid development and wide application of nuclear energy technology, the safety and stability of nuclear power plants have attracted more and more attention. During the operation of a nuclear power plant, the 32EANA nuclear measurement system plays a crucial role. It is responsible for monitoring and controlling the operating status of the nuclear reactor to ensure the safe operation of the nuclear power plant. However, the cards of the 32EANA nuclear measurement system, as key components in the system, their performance and stability have a decisive impact on the normal operation of the entire system.

[0003] At present, during the long-term operation of the 32EANA nuclear measurement system cards, due to the influence of harsh environments such as high temperature, high pressure, and radiation, problems such as aging and damage are likely to occur. These problems may not only lead to a decline in card performance but may even cause system failures, posing a serious threat to the safe operation of the nuclear power plant.

[0004] Traditional card testing methods mainly rely on manual detection and diagnosis, with low efficiency and prone to misjudgment. At the same time, due to the variety of card types, the testing methods and tools are also different, which brings great inconvenience to the testing work. Content of the Utility Model

[0005] The purpose of the utility model is to overcome the deficiencies of the prior art and provide a 32EANA nuclear measurement system card testing device, including a 32EANA nuclear measurement system card, which includes a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module, and a data storage module;

[0006] The DC adjustable power supply module is connected to the 32EANA nuclear measurement system card, and the DC adjustable power supply module, the digital multimeter module, the display module, and the data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the 32EANA nuclear measurement system card;

[0007] The digital multimeter module is used to perform card impedance detection and card power supply voltage detection on the 32EANA nuclear measurement system card.

[0008] Preferably, the digital multimeter module is used to perform card impedance detection on the 32EANA nuclear measurement system card, including:

[0009] Turn off the DC adjustable power supply module. Use the resistance range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the XC1-C32 port of the 32EANA nuclear measurement system card, and connect the black test lead of the digital multimeter module to the XC1-C31 port.

[0010] Use the resistance range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the XC2-C9 port of the 32EANA nuclear measurement system card, and connect the black test lead of the digital multimeter module to the XC2-C8 port of the 32EANA nuclear measurement system card.

[0011] Preferably, the digital multimeter module is used to detect the power supply voltage of the 32EANA nuclear measurement system card, including:

[0012] Turn on the DC adjustable power supply module. Connect the XC1-A32 and XC1-C32 ports of the 32EANA nuclear measurement system card to the power supply DC +5V ±0.1V, and connect the XC1-A31 and XC1-C31 ports to the power supply ground 0V; connect the XC2-C9 port to the power supply DC +24V ±0.1V, and connect the XC2-C8 port to the power supply ground 0V.

[0013] Use the DC voltage range of the digital multimeter module to measure the voltage between the XC1 / C32 port (red test lead) and the XC1 / C31 (black test lead) port.

[0014] Use the DC voltage range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the XC2-C9 port, and connect the black test lead of the digital multimeter module to the XC2-C8 port.

[0015] Use the DC voltage range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the XC2-C10 port, and connect the black test lead of the digital multimeter module to the XC1-C31 port.

[0016] Use the DC voltage range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the U1#1 port, and connect the black test lead of the digital multimeter module to the XC1-C31 port.

[0017] Use the DC voltage range of the digital multimeter module. Connect the red test lead of the digital multimeter module to the U1#27 port, and connect between the black test lead of the digital multimeter module and the XC1-C31 port.

[0018] Preferably, the data storage module is used to store the data measured by the digital multimeter module.

[0019] The beneficial effects of the present utility model are: The present utility model can improve the accuracy and efficiency of card testing, and ensure the safe and stable operation of nuclear power plants. Description of the Drawings

[0020] Figure 1 It is a schematic diagram of the principle of a test device for a 32EANA nuclear measurement system card

[0021] Figure 2 It is a schematic diagram of the circuit of a 2EANA nuclear measurement system card Detailed Implementation Modes

[0022] The technical solution of the present utility model will be further described in detail below with reference to the drawings, but the protection scope of the present utility model is not limited to the following description

[0023] The features and performance of the present utility model will be further described in detail below with reference to embodiments

[0024] As Figure 1 shown, a test device for a 32EANA nuclear measurement system card includes a 32EANA nuclear measurement system card, and includes a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module, and a data storage module

[0025] The DC adjustable power supply module is connected to the 32EANA nuclear measurement system card, and the DC adjustable power supply module, the digital multimeter module, the display module, and the data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the 32EANA nuclear measurement system card

[0026] The digital multimeter module is used to detect the impedance of the 32EANA nuclear measurement system card and the power supply voltage of the card

[0027] Preferably, the digital multimeter module is used to detect the impedance of the 32EANA nuclear measurement system card, including

[0028] Turn off the DC adjustable power supply module, use the resistance range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the XC1-C32 port of the 32EANA nuclear measurement system card, and connect the black test lead end of the digital multimeter module to the XC1-C31 port

[0029] Use the resistance range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the XC2-C9 port of the 32EANA nuclear measurement system card, and connect the black test lead end of the digital multimeter module to the XC2-C8 port of the 32EANA nuclear measurement system card

[0030] Preferably, the digital multimeter module is used to detect the power supply voltage of the 32EANA nuclear measurement system card, including

[0031] Turn on the DC adjustable power supply module, connect the XC1-A32 and XC1-C32 ports of the 32EANA nuclear measurement system card to the power supply DC +5V ±0.1V, and connect the XC1-A31 and XC1-C31 ports to the power supply ground 0V; connect the XC2-C9 port to the power supply DC +24V ±0.1V, and connect the XC2-C8 port to the power supply ground 0V;

[0032] Use the DC voltage range of the digital multimeter module to measure the voltage between the XC1 / C32 port (red test lead) and the XC1 / C31 (black test lead) port;

[0033] Use the DC voltage range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the XC2-C9 port, and connect the black test lead end of the digital multimeter module to the XC2-C8 port;

[0034] Use the DC voltage range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the XC2-C10 port, and connect the black test lead end of the digital multimeter module to the XC1-C31 port;

[0035] Use the DC voltage range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the U1#1 port, and connect the black test lead end of the digital multimeter module to the XC1-C31 port;

[0036] Use the DC voltage range of the digital multimeter module, connect the red test lead end of the digital multimeter module to the U1#27 port, and connect between the black test lead end of the digital multimeter module and the XC1-C31 port.

[0037] Preferably, the data storage module is used to store the data measured by the digital multimeter module.

[0038] The above is only the preferred embodiment of the present invention. It should be understood that the present invention is not limited to the form disclosed herein, should not be regarded as an exclusion of other embodiments, but can be used in various other combinations, modifications and environments, and can be within the scope of the concept described herein, through the above teachings or the technology or knowledge in related fields for modification. And the modifications and changes made by those skilled in the art that do not depart from the spirit and scope of the present invention should all be within the protection scope of the appended claims of the present invention.

Claims

1. A 32EANA nuclear test system card testing device, comprising a 32EANA nuclear test system card, characterized in that: It includes a DC adjustable power supply module, a digital multimeter module, a display module, a data processing module and a data storage module; The DC adjustable power supply module is connected to the 32EANA nuclear test system card, and the DC adjustable power supply module, digital multimeter module, display module and data storage module are respectively connected to the data processing module; the digital multimeter module is connected to the 32EANA nuclear test system card; The digital multimeter module is used to perform card impedance detection and card power supply voltage detection on the 32EANA nuclear test system card.

2. A 32EANA nuclear test system card testing device according to claim 1, characterized in that: The digital multimeter module is used to perform impedance detection on the 32EANA nuclear test system card, including: Turn off the DC adjustable power supply module, use the resistance block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC1-C32 port of the 32EANA nuclear test system card, and connect the black probe end of the digital multimeter module to the XC1-C31 port; Use the resistance block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC2-C9 port of the 32EANA nuclear test system card, and connect the black probe end of the digital multimeter module to the XC2-C8 port of the 32EANA nuclear test system card.

3. A 32EANA nuclear test system card testing device according to claim 1, characterized in that: The digital multimeter module is used to detect the power supply voltage of the 32EANA nuclear test system card, including: Turn on the DC adjustable power supply module, connect the XC1-A32 and XC1-C32 ports of the 32EANA nuclear test system card to the power supply DC+5V±0.1V, connect the XC1-A31 and XC1-C31 ports to the power supply ground 0V; connect the XC2-C9 port to the power supply DC+24V±0.1V, and connect the XC2-C8 port to the power supply ground 0V; Use the DC voltage block of the digital multimeter module, connect the red test lead to the XC1 / C32 port, and the black test lead to the XC1 / C31 port to measure the voltage between the XC1 / C32 port and the XC1 / C31 port; Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC2-C9 port, and connect the black probe end of the digital multimeter module to the XC2-C8 port; Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the XC2-C10 port, and connect the black probe end of the digital multimeter module to the XC1-C31 port; Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the U1#1 port, and connect the black probe end of the digital multimeter module to the XC1-C31 port; Use the DC voltage block of the digital multimeter module, connect the red probe end of the digital multimeter module to the U1#27 port, and connect the black probe end of the digital multimeter module to the XC1-C31 port.

4. A 32EANA nuclear test system card testing device according to claim 1, characterized in that: The data storage module is used to store the data measured by the digital multimeter module.