Chip inductor withstand voltage test fixture

Abstract

The utility model discloses a chip inductor withstand voltage test fixture, which comprises an operating platform, the operating platform is provided with a conduction seat I, a test seat and a conduction seat II, the conduction seat I is fixed on the operating platform, one side of the conduction seat I is provided with a guide post, the guide post is sleeved with the test seat and the conduction seat II, one side of the conduction seat II is provided with a push block, and the push block is connected with the test seat and the conduction seat II. One side of the push block is connected with a linear actuating mechanism, mounting grooves are formed in the conduction seat I and the conduction seat II, a plurality of spring probe groups are fixed in the mounting grooves, the spring probe groups are provided with outgoing lines, the outgoing lines are connected with spring probes in the spring probe groups in series, a plurality of test grooves are formed in the test seat, a plurality of contact pieces are fixed in the test grooves, and the contact pieces are connected with the contact pieces. Each contact piece is communicated with a contact column, the contact columns are embedded in the test seat, one end faces of the contact columns are exposed out of the side face of the test seat, and spring probes of the spring probe set and the contact pieces in the test groove are matched with pins of the chip inductor. Compared with the prior art, the chip inductor voltage withstanding test efficiency can be effectively improved.

Description

Technical Field

[0001] The utility model belongs to inductance testing, and particularly relates to a fixture for testing the withstand voltage of a chip inductor. Background Art

[0002] A chip inductor, also known as a power inductor, a high-current inductor, and a surface-mounted high-power inductor, has characteristics such as miniaturization, high quality, high energy storage, and low resistance, and is widely used in fields such as digital products and network communication. Before leaving the factory, it is necessary to test the withstand voltage of the chip inductor. The commonly used tool for the withstand voltage test is a withstand voltage tester. During the test, it is not easy for the contact head of the withstand voltage tester to connect with the pins of the chip inductor. It is necessary to use a lead wire to introduce the pins and then connect them with the contact head of the withstand voltage tester, which is rather troublesome and the efficiency of the withstand voltage test is slow. Summary of the Utility Model

[0003] The purpose of the utility model is to overcome the problem of slow efficiency in the withstand voltage test of existing chip inductors, and provide a withstand voltage test fixture that can effectively improve the efficiency of the withstand voltage test of chip inductors.

[0004] The technical solution adopted by the utility model to solve its technical problems: A withstand voltage test fixture for a chip inductor, including an operating table, on which a conduction seat I, a test seat, and a conduction seat II are provided. The conduction seat I, the test seat, and the conduction seat II are cuboids. The conduction seat I is fixed on the operating table. On one side of the conduction seat I, several mutually parallel guide columns are vertically fixed. The test seat and the conduction seat II are sleeved on the guide columns in sequence from left to right. On one side of the conduction seat II, a push block is provided. One side of the push block is connected to a linear actuator, and the linear actuator drives the push block to perform a linear reciprocating motion in the horizontal direction. Installation grooves are provided on the conduction seat I and the conduction seat II. Several spring probe groups are fixed in the installation grooves. Each spring probe group is composed of several spring probes. The needle heads of the spring probes are exposed on one side of the conduction seat I and the conduction seat II. The spring probe groups are provided with lead wires, and the lead wires are connected in series with each spring probe in the spring probe group. Several test grooves are provided on the test seat, and several contact pieces are fixed in the test grooves. Each contact piece is connected to a contact post, and the contact post is embedded in the test seat. One end face of the contact post is exposed on the side of the test seat. The spring probes of the spring probe group and the contact pieces in the test grooves are matched with the pins of the chip inductor.

[0005] Optionally, return springs are sleeved on the guide columns between the conduction seat I and the test seat and between the test seat and the conduction seat II.

[0006] Optionally, the operating table is a wire box, and one end of the lead wire passes through the inner cavity of the wire box and out of the wire box.

[0007] Optionally, the linear actuator is a manual push-pull rod.

[0008] Optionally, protection plates are provided on the tops of the conduction seat I and the conduction seat II.

[0009] Usage method and principle of the utility model: Connect the lead-out wires of the conduction seat I and the conduction seat II to a withstand voltage tester. Place a chip inductor in the test slot of the test seat. Move the push block towards the conduction seat I through a linear actuator. During the movement of the push block, it drives the conduction seat II and the test seat towards the conduction seat I. During the movement, the spring probe groups of the conduction seat I and the conduction seat II contact the contact posts of the test seat. At this time, the pins of the chip inductor are connected to the withstand voltage tester, forming a test circuit. The withstand voltage tester performs a withstand voltage test on the chip inductor. After the test is completed, return the conduction seat II and the test seat to their original positions, place another batch of chip inductors, and conduct the next round of withstand voltage test; through the contact and separation of the conduction seat I, the test seat, and the conduction seat II, the on-off of the test circuit of the withstand voltage tester is realized. Placing and removing the chip inductor in the test slot can quickly perform the withstand voltage test and improve the efficiency of the withstand voltage test of the chip inductor.

[0010] Compared with the prior art, the beneficial effect of the utility model: The utility model can effectively improve the efficiency of the withstand voltage test of the chip inductor. Description of the drawings

[0011] Figure 1 It is a front view cross-sectional structure schematic diagram of the utility model;

[0012] Figure 2 It is a top view structure schematic diagram of the utility model;

[0013] The reference numerals in the drawings are as follows: operating table 1, conduction seat I 2, test seat 3, conduction seat II 4, guide post 5, push block 6, linear actuator 7, installation groove 8, spring probe group 9, lead-out wire 10, test slot 11, contact piece 12, contact post 13, return spring 14, protection plate 15. Specific embodiments

[0014] Example 1, hereinafter in conjunction with Figure 1 and Figure 2The present utility model will be further described. A voltage withstand test fixture for a chip inductor includes an operation table 1. On the operation table, there are a conduction seat I 2, a test seat 3, and a conduction seat II 4. The conduction seat I, the test seat, and the conduction seat II are cuboids, and they are parallel to each other with the same length. The conduction seat I is fixed on the operation table by screws. On one side of the conduction seat I, two parallel guide posts 5 are vertically fixed. The guide posts are distributed at the front and back of one side wall of the conduction seat I. The test seat and the conduction seat II are sleeved on the guide posts in sequence from left to right. On one side of the conduction seat II, there is a push block 6. One side of the push block is connected to a linear actuator 7. The linear actuator is a manual push-pull rod, and the linear actuator drives the push block to perform a linear reciprocating motion in the horizontal direction. Installation grooves 8 are provided on the conduction seat I and the conduction seat II. Several spring probe groups 9 are fixed in the installation grooves. The spring probe group is composed of several spring probes. The spring probe is composed of a needle head, a spring, and a needle tube. The needle head of the spring probe is exposed on one side of the conduction seat I and the conduction seat II. The spring probe group is provided with lead wires 10, and the lead wires are connected in series to each spring probe in the spring probe group. Several test grooves 11 are provided on the test seat. The test grooves are arranged at intervals along the long side of the test seat. Several contact pieces 12 are fixed in the test grooves. Each contact piece is connected to a contact post 13. The contact piece and the contact post are made of conductive metal. The contact post is embedded in the test seat, and one end face of the contact post is exposed on the side of the test seat. The spring probes of the spring probe group and the contact pieces in the test grooves are matched with the pins of the chip inductor.

[0015] Optionally, in order to enable the test seat and the conduction seat II to automatically return to their positions, return springs 14 are sleeved on the guide posts between the conduction seat I and the test seat and between the test seat and the conduction seat II.

[0016] Optionally, in order to facilitate the routing of the lead wires, a wire box is used as the operation table, and one end of the lead wire passes through the inner cavity of the wire box and out of the wire box.

[0017] Optionally, in order to protect the spring probes and the lead wires in the installation grooves of the conduction seat I and the conduction seat II, and at the same time, for the safety of the operators, protection plates 15 are provided on the tops of the conduction seat I and the conduction seat II.

[0018] The above is only a preferred specific embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any changes or substitutions that can be easily thought of by those skilled in the art within the technical scope disclosed by the present utility model should be covered within the protection scope of the present utility model.

Claims

1. A chip inductor withstand voltage test fixture, comprising an operating table (1), characterized in that: The operating table is provided with a conducting seat I (2), a test seat (3) and a conducting seat II (4). The conducting seat I, the test seat and the conducting seat II are rectangular parallelepipeds. The conducting seat I is fixed on the operating table. A plurality of mutually parallel guide posts (5) are vertically fixed on one side of the conducting seat I. The test seat and the conducting seat II are sleeved on the guide posts from left to right in sequence. A push block (6) is provided on one side of the conducting seat II. One side of the push block is connected to a linear actuator (7). The linear actuator drives the push block to perform linear reciprocating motion in the horizontal direction. The conducting seat I and the conducting seat II are provided with mounting grooves (8). The mounting grooves are fixed There are several spring probe groups (9), which are composed of several spring probes. The needles of the spring probes are exposed on one side of the conductive seat I and the conductive seat II. The spring probe group is provided with lead wires (10), and the lead wires are connected in series with each spring probe in the spring probe group. The test seat is provided with several test slots (11), and several contact pieces (12) are fixed in the test slots. Each contact piece is connected to a contact column (13), and the contact column is embedded in the test seat. One end face of the contact column is exposed on the side of the test seat. The spring probes of the spring probe group and the contact pieces in the test slots match the pins of the chip inductor.

2. The chip inductor withstand voltage test fixture according to claim 1, characterized in that: A return spring (14) is sleeved on the guide column between the conducting seat I and the test seat and between the test seat and the conducting seat II.

3. The chip inductor withstand voltage test fixture according to claim 1, characterized in that: The operating table is a wire box, and one end of the lead wire passes through the inner cavity of the wire box and out of the wire box.

4. The chip inductor withstand voltage test fixture according to claim 1, characterized in that: Linear actuator manual push-pull rod.

5. The chip inductor withstand voltage test fixture according to claim 1, characterized in that: A protection plate (15) is provided on the top of the conductive seat I and the conductive seat II.

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