Reverse bias voltage measuring device for laser receiver
By designing a laser receiver reverse bias voltage measurement device for collaborative testing by multiple people, the problems of high cost and low efficiency in the prior art are solved, and efficient and low-cost laser receiver testing is achieved.
Patent Information
- Application Number
- CN202421461325.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-25
- Publication Date
- 2025-07-04
- Estimated Expiration
- 2034-06-25
AI Technical Summary
The existing laser receiver bias voltage measurement device is expensive and can only be tested one-to-one, which cannot improve the testing efficiency.
A laser receiver reverse bias voltage measurement device including two data acquisition devices, testing devices and data display devices is designed. By setting up an interlocking circuit and multiple probes and positioning slots, the two-way collaborative testing is realized, reducing costs and improving efficiency.
It realizes simultaneous testing of multiple people, reduces costs, improves testing efficiency, simplifies the operation process, and reduces the possibility of manual misoperation.
Smart Images
Figure CN223065388U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of bias voltage testing, and more specifically, to a device for measuring the reverse bias voltage of a laser receiver. Background Art
[0002] With the development and progress of technology, the laser ranging industry has been rapidly developed and popularized. In particular, the pulsed laser ranging technology has become an indispensable part of civil and industrial applications.
[0003] Pulsed laser ranging refers to accurately measuring the distance to a target using a pulsed laser. The specific principle is as follows: when working, a laser beam is emitted towards the target, the laser beam reflected by the target is received by the laser receiver, and the time from the emission to the reception of the laser beam is measured by a timer to calculate the distance from the laser ranging device to the target. In this process, the role of the laser receiver is to convert the optical signal into an electrical signal. Currently, the commonly used laser receiver is an avalanche photodiode (APD), which has relatively high sensitivity and internal gain. Therefore, it can improve the detection sensitivity and signal-to-noise ratio of the laser ranging system.
[0004] However, in the actual operation process, the internal gain and sensitivity of the avalanche photodiode are temperature-sensitive. In other words, its internal gain and sensitivity change drastically with temperature. Therefore, in the actual working process, the entire laser ranging system will fluctuate drastically due to the performance change of the avalanche diode, affecting the measurement accuracy.
[0005] To address the above problems, the existing treatment method compensates for temperature by changing the bias voltage across the avalanche photodiode to ensure the internal gain of the avalanche photodiode. At the same time, the existing bias voltage temperature compensation circuit usually adopts a one-to-one compensation mode, that is, one compensation circuit corresponds to one avalanche photodiode.
[0006] However, the existing devices for measuring the bias voltage of laser receivers are too expensive and can only be tested one by one, unable to improve the test efficiency.
[0007] Therefore, how to provide a device for testing laser receivers simultaneously by multiple people is an urgent problem to be solved by those skilled in the art. Summary of the Utility Model
[0008] In view of this, the utility model provides a device for measuring the reverse bias voltage of a laser receiver, aiming to solve the above technical problems.
[0009] To achieve the above purpose, the utility model adopts the following technical solutions:
[0010] An optical receiver reverse bias voltage measurement device, comprising: a data acquisition device, a test device, and a data display device;
[0011] There are two data acquisition devices, including a first data acquisition device and a second data acquisition device, both of which are provided with drive circuits, and a test circuit is provided in the test device;
[0012] The drive circuits in the first data acquisition device and the second data acquisition device are both electrically connected to the test circuit in the test device, the test circuit in the test device is electrically connected to the data display device, and an interlock circuit is provided in the test device.
[0013] Further, the drive circuit in the second data acquisition device is specifically:
[0014] Pin 1 of the 6P socket P2' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S2, pin 3 is grounded through the resistor R2 and the light-emitting diode LED2, pin 4 is connected to pin 5 through the test contact LD2, pin 4 is connected to pin 5 through the test contact LD4, and pin 6 is grounded.
[0015] Further, the drive circuit in the first data acquisition device is specifically:
[0016] Pin 1 of the 6P socket P1' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S1, pin 3 is grounded through the resistor R1 and the light-emitting diode LED1, pin 4 is connected to pin 5 through the test contact LD1, pin 4 is connected to pin 5 through the test contact LD3, and pin 6 is grounded.
[0017] Further, the test circuit in the test device includes a first test circuit and a second test circuit. The drive circuit in the first data acquisition device is electrically connected to the first test circuit, and the drive circuit in the second data acquisition device is electrically connected to the second test circuit.
[0018] Further, the first test circuit is specifically:
[0019] Pin 1 of the 6P socket P1 is connected to the 24v power supply, pin 2 is connected to pin 3 of the relay SRD2, pin 2 is also connected to pin 1 of the relay SRD1, pin 3 is connected to pin 5 of the relay SRD2, pin 4 is connected to pin 5 of the relay SDR3, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD2 and the relay SRD4 are grounded.
[0020] Further, the second test circuit is specifically:
[0021] Pin 1 of the 6P socket P2 is connected to the 24V power supply, pin 2 is connected to pin 3 of the relay SRD1, pin 2 is also connected to pin 1 of the relay SRD2, pin 3 is connected to pin 5 of the relay SRD1, pin 4 is connected to pin 5 of the relay SDR4, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD1 and the relay SRD3 are grounded.
[0022] Further, pin 1 of the 2P socket J1 is connected to pin 1 of the relay SRD1, the relay SRD2, the relay SRD3 and the relay SRD4.
[0023] Further, a groove is provided on the data acquisition device, the groove is adapted to the size of the laser receiver, test contacts are provided at the bottom of the groove, the number and position of the test contact probes are adapted to the contacts of the laser receiver, and the probes are electrically connected to the drive circuit.
[0024] The above technical solution has at least the following technical effects:
[0025] As can be seen from the above technical solution, compared with the prior art, the present invention discloses a device for measuring the reverse bias voltage of a photoreceiver. Compared with the original one device and one person for testing, the present invention expands one test port, realizing two-person collaborative testing with one device. It reduces costs and improves efficiency. Compared with the traditional method of holding the test pen, it adds 4 probes (two positive and two negative) and a positioning groove. When testing the product, there is no need to observe the polarity direction, which is convenient for testing, improves efficiency, and reduces labor costs. Compared with the signal test switch button on the test instrument, signal switch buttons are respectively installed on the two test boards, which is convenient for control and improves work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained according to the provided drawings without creative efforts.
[0027] Figure 1 It is a schematic structural diagram of a test device of the present invention.
[0028] Figure 2 It is a schematic structural diagram of a test circuit of the present invention.
[0029] Figure 3 It is a schematic structural diagram of the drive circuit in the first data acquisition device of the present invention.
[0030] Figure 4This is a schematic diagram of the drive circuit in the second data acquisition device of the present utility model. Detailed implementation mode
[0031] The technical solutions in the embodiments of the present utility model will be clearly and completely described below. Apparently, the described embodiments are only a part of the embodiments of the present utility model, rather than all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0032] See the appendix Figures 1-4 , the embodiments of the present utility model disclose an optical receiver reverse bias voltage measurement device, including: a data acquisition device, a test device, and a data display device;
[0033] There are two data acquisition devices, including a first data acquisition device and a second data acquisition device, both of which are provided with drive circuits, and a test circuit is provided in the test device;
[0034] The drive circuits in the first data acquisition device and the second data acquisition device are both electrically connected to the test circuit in the test device, the test circuit in the test device is electrically connected to the data display device, and an interlock circuit is provided in the test device.
[0035] To further optimize the above technical solution, the drive circuit in the second data acquisition device is specifically:
[0036] Pin 1 of the 6P socket P2' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S2, pin 3 is grounded through the resistor R2 and the light-emitting diode LED2, pin 4 is connected to pin 5 through the test contact LD2, pin 4 is connected to pin 5 through the test contact LD4, and pin 6 is grounded.
[0037] To further optimize the above technical solution, the drive circuit in the first data acquisition device is specifically:
[0038] Pin 1 of the 6P socket P1' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S1, pin 3 is grounded through the resistor R1 and the light-emitting diode LED1, pin 4 is connected to pin 5 through the test contact LD1, pin 4 is connected to pin 5 through the test contact LD3, and pin 6 is grounded.
[0039] To further optimize the above technical solution, the test circuit in the test device includes a first test circuit and a second test circuit. The drive circuit in the first data acquisition device is electrically connected to the first test circuit, and the drive circuit in the second data acquisition device is electrically connected to the second test circuit.
[0040] To further optimize the above technical solution, the first test circuit is specifically as follows:
[0041] Pin 1 of the 6P socket P1 is connected to the 24V power supply, pin 2 is connected to pin 3 of the relay SRD2, pin 2 is also connected to pin 1 of the relay SRD1, pin 3 is connected to pin 5 of the relay SRD2, pin 4 is connected to pin 5 of the relay SDR3, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD2 and the relay SRD4 are grounded.
[0042] To further optimize the above counting scheme, the second test circuit is specifically as follows:
[0043] Pin 1 of the 6P socket P2 is connected to the 24V power supply, pin 2 is connected to pin 3 of the relay SRD1, pin 2 is also connected to pin 1 of the relay SRD2, pin 3 is connected to pin 5 of the relay SRD1, pin 4 is connected to pin 5 of the relay SDR4, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD1 and the relay SRD3 are grounded.
[0044] To further optimize the above technical solution, pin 1 of the 2P socket J1 is connected to pins 1 of the relay SRD1, the relay SRD2, the relay SRD3, and the relay SRD4.
[0045] To further optimize the above technical solution, a groove is provided on the data acquisition device. The groove is adapted to the size of the laser receiver. A test contact is provided at the bottom of the groove. The number and position of the probes of the test contact are adapted to the contacts of the laser receiver. The probes are electrically connected to the drive circuit.
[0046] The test box is powered by a 24V regulated power supply. The internal circuit has 4 24V relays, two 6p sockets, and one 2p socket. An interlock circuit is built. Four positioning holes are used to fix the box. The 4 24V relays are divided into two groups and are respectively connected to the two 6p sockets. The two 6p sockets are respectively connected to a test board. Based on the interlock circuit, when one test board is working, the other test board cannot work, avoiding test circuit conflicts. Both groups of relays are connected to the 2p socket, and the 2p socket is connected to the measuring instrument. The measuring instrument is used to display the bias voltage of the laser receiver being measured on the current test board.
[0047] The test board uses a switch, a 6-pin socket interface, and two grooves for placing laser receivers. Four probes are arranged in each groove, and these four probes are used to contact the laser receiver to measure values. There is also an LED light on the test board. When the switch is pressed and the current test board starts to work, the LED light lights up to prompt the operator that the current test board is working. There are four positioning holes, and the test board is fixed to the test bench with four suction cups for convenient testing.
[0048] Compared with the prior art:
[0049] 1. Compared with the original situation where one device was tested by one person, one more test port is expanded, enabling two people to cooperate in testing one device, reducing costs and improving efficiency.
[0050] 2. Compared with the traditional hand-held test pen type of testing, 4 more probes (two positive and two negative) and one positioning groove are added. When testing products, there is no need to observe the polarity direction, which makes the testing convenient, improves efficiency, and reduces labor costs.
[0051] 3. Compared with the signal test switch buttons on the test instrument, the two test boards are respectively installed with signal switch buttons, which is convenient to control and improves work efficiency.
[0052] In this specification, the various embodiments are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The same or similar parts among the various embodiments can be referred to each other. The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A device for measuring the reverse bias voltage of a laser receiver, characterized in that, Including: A data acquisition device, a testing device, and a data display device; There are two data acquisition devices, including a first data acquisition device and a second data acquisition device, both of which are provided with drive circuits, and a test circuit is provided in the testing device; The drive circuits in the first data acquisition device and the second data acquisition device are both electrically connected to the test circuit in the testing device, the test circuit in the testing device is electrically connected to the data display device, and an interlock circuit is provided in the testing device.
2. The laser receiver reverse bias voltage measuring device according to claim 1, characterized in that The drive circuit in the second data acquisition device is specifically: Pin 1 of the 6P socket P2' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S2, pin 3 is grounded through the resistor R2 and the light-emitting diode LED2, pin 4 is connected to pin 5 through the test contact LD2, pin 4 is connected to pin 5 through the test contact LD4, and pin 6 is grounded.
3. A reverse bias voltage measuring device for a laser receiver according to claim 1, characterized in that, The drive circuit in the first data acquisition device is specifically: Pin 1 of the 6P socket P1' is connected to the 24v power supply, pin 2 is connected to the 24v power supply through the push-button switch S1, pin 3 is grounded through the resistor R1 and the light-emitting diode LED1, pin 4 is connected to pin 5 through the test contact LD1, pin 4 is connected to pin 5 through the test contact LD3, and pin 6 is grounded.
4. A laser receiver reverse bias voltage measuring device according to claim 1, characterized in that, The test circuit in the testing device includes a first test circuit and a second test circuit. The drive circuit in the first data acquisition device is electrically connected to the first test circuit, and the drive circuit in the second data acquisition device is electrically connected to the second test circuit.
5. A laser receiver reverse bias voltage measuring device according to claim 4, characterized in that, The first test circuit is specifically: Pin 1 of the 6P socket P1 is connected to the 24v power supply, pin 2 is connected to pin 3 of the relay SRD2, pin 2 is also connected to pin 1 of the relay SRD1, pin 3 is connected to pin 5 of the relay SRD2, pin 4 is connected to pin 5 of the relay SDR3, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD2 and the relay SRD4 are grounded.
6. The laser receiver reverse bias voltage measuring device according to claim 4, wherein The second test circuit is specifically: Pin 1 of the 6P socket P2 is connected to the 24v power supply, pin 2 is connected to pin 3 of the relay SRD1, pin 2 is also connected to pin 1 of the relay SRD2, pin 3 is connected to pin 5 of the relay SRD1, pin 4 is connected to pin 5 of the relay SDR4, pin 5 is connected to pin 2 of the 2P socket J1, pin 6 is grounded, and pins 4 of the relay SRD1 and the relay SRD3 are grounded.
7. A laser receiver reverse bias voltage measuring device according to claim 5 or 6, characterized in that, Pin 1 of the 2P socket J1 is connected to pins 1 of the relay SRD1, the relay SRD2, the relay SRD3, and the relay SRD4.
8. A reverse bias voltage measuring device for a laser receiver according to claim 1, characterized in that A groove is provided on the data acquisition device. The groove is adapted to the size of the laser receiver. A test contact is provided at the bottom of the groove. The number and position of the probes of the test contact are adapted to the contacts of the laser receiver. The probes are electrically connected to the drive circuit.