Test fixture of BC solar cell

By designing a test fixture suitable for BC solar cells, the problem of electrical related testing of 0BB grid line BC solar cells is solved, the testing accuracy and reliability of various grid line structures are achieved, and the preparation cost is reduced.

CN223093749UActive Publication Date: 2025-07-11陕西众森电能科技有限公司
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Patent Information

Application Number
CN202422249261.9
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-09-13
Publication Date
2025-07-11
Estimated Expiration
2034-09-13

AI Technical Summary

Technical Problem

The prior art lacks effective testing fixtures to conduct electrical correlation tests on BC solar cells with 0BB type gate lines, especially BC battery electrical correlation tests with MBB type gate lines.

Method used

A test fixture for BC solar cells is designed, including a driving component, a clamping support member and an electrical contact assembly. The clamping of the BC solar cell to be tested is achieved through the displacement of the clamping support member, and the electrical signal acquisition is realized through the electrical contact assembly. A transparent support is provided in the fixture to allow light transmission. The electrical contact layer adopts an FPC flexible printed circuit board to ensure reliable collection and testing accuracy of electrical signals.

Benefits of technology

Electrical correlation tests of 0BB and MBB grid-line BC solar cells are realized, which improves the testing accuracy and reliability, reduces the preparation cost, and is suitable for BC solar cell testing of various grid-line structures.

✦ Generated by Eureka AI based on patent content.

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Abstract

A test fixture for a BC solar cell belongs to the field of solar cell test devices, and is characterized by comprising a driving assembly, a clamping support member and an electric contact assembly, the clamping support piece comprises a transparent support piece and a lower support piece; the transparent supporting piece is arranged right above the lower supporting piece; the electric contact assembly is arranged on the upper surface of the lower supporting piece; the driving assembly is arranged on the back of the transparent supporting piece and / or the lower supporting piece and used for driving the transparent supporting piece and / or the lower supporting piece to move. Through the arrangement of the clamping supporting piece, the clamping supporting piece clamps the solar cell to be tested under the driving action of the driving assembly, and meanwhile, the clamping supporting piece located on the solar cell assembly is arranged to be a transparent supporting piece to achieve projection of light in the test. By arranging the electric contact assembly on the lower supporting piece, electric signals of the solar cell to be tested are collected, the structure is simple and reliable, the size precision is high, contact is good, the manufacturing cost is low, and the device is suitable for application and popularization.
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Description

Technical Field

[0001] The utility model belongs to the field of solar cell testing devices, and particularly relates to a testing fixture for BC solar cells. Background Art

[0002] A solar cell is a semiconductor wafer that can generate electricity through the photovoltaic effect when illuminated, and the generated current is collected and led out through grid lines. During the production and R & D process, it is necessary to conduct electrical-related tests on the performance of solar cells. During the test, electricity needs to be applied to both poles of the solar cell, or relevant tests are conducted by collecting electrical signals at both poles of the solar cell. Testing fixtures are required in electrical-related tests such as IV or EL to form a detachable electrical contact with the solar cell to be tested.

[0003] The sizes of conventional solar cells vary from 156 mm to 230 mm. One side is the positive electrode and the other side is the negative electrode, and the positive and negative electrodes need to be contacted separately; the BC cell is a fully back-contact solar cell, and both the positive and negative electrodes are on one surface, and there is no electrode distribution on the light-receiving surface. In order to implement the Kelvin four-wire system, generally the voltage and current also need to be collected separately. The grid lines on the surface of BC solar cells come in various forms, and the common ones can be mainly divided into MBB-type grid lines and 0BB-type grid lines. The main body of the MBB-type grid lines is a large number of parallel thin grid lines, and then several main grid lines are used to connect the series of thin grid lines to form a cross; the number M of the main grid lines ranges from 2 to 20; the main body of the 0BB-type grid lines is a large number of thin grid lines, but there are no obvious main grid lines.

[0004] In the prior art, for BC cells with MBB-type grid lines, a glass plate plus a probe array is used as a testing fixture for electrical-related tests. The glass plate is on the upper side of the sample to be tested, and the probe array is on the lower side of the glass plate. However, for BC with 0BB-type grid lines, there is currently no effective testing fixture. Summary of the Invention

[0005] The utility model aims to solve the above problems and provides a testing fixture for BC solar cells, which can not only meet BC cells with 0BB-type grid lines but also meet electrical-related tests for MBB-type grid lines.

[0006] The testing fixture for BC solar cells described in the utility model includes a driving component, a clamping and supporting component, and an electrical contact component;

[0007] The clamping and supporting component includes a transparent supporting member and a lower supporting member;

[0008] The transparent supporting member is arranged directly above the lower supporting member;

[0009] The electrical contact component is arranged on the upper surface of the aforementioned lower supporting member and is located between the aforementioned transparent supporting member and the lower supporting member;

[0010] The driving component is arranged on the back of the aforementioned transparent support and / or the lower support, and is used to drive the transparent support and / or the lower support to displace; the driving component can be separately arranged on the back of the transparent support to drive the transparent support to displace towards the lower support, or separately arranged on the back of the lower support to drive the lower support to displace towards the transparent support, or the driving component can be arranged on the backs of both the transparent support and the lower support to drive the transparent support and the lower support to displace towards each other.

[0011] During the test, the BC solar cell to be tested is placed on the electrical contact component, between the transparent support and the lower support. Under the driving action of the driving component, the distance between the transparent support and the lower support is reduced until the BC solar cell to be tested is clamped, and then the test of the BC solar cell to be tested is realized through the electrical contact component.

[0012] Furthermore, for the test fixture of the BC solar cell of the present utility model, a plurality of through holes are provided on the transparent support; by providing the through holes, the BC solar cell to be tested can be quickly separated from the transparent support after the test.

[0013] Furthermore, for the test fixture of the BC solar cell of the present utility model, the electrical contact component includes an electrical contact layer and a flexible buffer layer;

[0014] The flexible buffer layer is arranged on the upper surface of the aforementioned lower support;

[0015] The electrical contact layer is arranged on the flexible buffer layer. During the test, the electrical contact layer realizes the acquisition of the electrical signals of the BC solar cell to be tested; during the clamping process, the flexible buffer layer provides a buffer interval for the BC solar cell to be tested being clamped, so that the BC solar cell to be tested can have better contact with the electrical contact layer, thereby improving the reliability of the electrical signal acquisition and the test accuracy.

[0016] Furthermore, for the test fixture of the BC solar cell of the present utility model, the electrical contact layer is provided with at least two non-conductive conductive layers;

[0017] The conductive layers include a positive conductive layer and a negative conductive layer; during the test, the positive conductive layer of the electrical contact layer is in corresponding electrical contact with the positive electrode of the BC solar cell to be tested, and the negative conductive layer of the electrical contact layer is in corresponding electrical contact with the negative electrode of the BC solar cell to be tested.

[0018] Furthermore, for the test fixture of the BC solar cell of the present utility model, the positive conductive layer is divided into a voltage acquisition area and a current acquisition area that are not electrically connected; the negative conductive layer is divided into a negative voltage acquisition area and a negative current acquisition area that are not electrically connected; when not in contact with the BC solar cell to be tested, the voltage acquisition area and the current acquisition area are not electrically connected, thus forming a positive voltage acquisition area, a positive current acquisition area, a negative voltage acquisition area, and a negative current acquisition area, realizing the Kelvin four-wire system acquisition and ensuring the accuracy of the test during the IV test.

[0019] Furthermore, for the test fixture of the BC solar cell of the present utility model, the electrical contact layer is an FPC flexible printed circuit board; the flexible printed circuit board belongs to a mature industrial product, has the advantages of high dimensional accuracy, good quality and low price, and is conducive to reducing the cost of this test fixture.

[0020] Furthermore, for the test fixture of the BC solar cell of the present utility model, the flexible buffer layer is a silicone pad or a silicone foam pad or a rubber pad.

[0021] Furthermore, for the test fixture of the BC solar cell of the present utility model, part or all of the conductive layer is vertically arranged with respect to the fine grid lines of the BC solar cell to be tested. When vertically arranged, it is close to the solder tape of the solar cell module, making the test result closer to the final actual use conditions.

[0022] Furthermore, for the test fixture of the BC solar cell of the present utility model, part or all of the conductive layer is horizontally arranged with respect to the fine grid lines of the BC solar cell to be tested. When horizontally arranged, the contact strips of the positive conductive layer only contact the positive fine grid lines, and the contact strips of the negative conductive layer only contact the negative fine grid lines, thus avoiding short circuits between the positive and negative poles.

[0023] For the test fixture of the BC solar cell of the present utility model, by setting the clamping and supporting member, the clamping and supporting member clamps the solar cell to be tested under the driving action of the driving component, and at the same time, the clamping and supporting member located on the solar cell module is set as a transparent supporting member to realize the projection of light during the test. By setting the electrical contact component on the lower supporting member, the acquisition of electrical signals of the solar cell to be tested is realized. The structure is simple and reliable, easy to manufacture, has high dimensional accuracy, good contact, and low preparation cost, and is suitable for popularization and application. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 is a schematic structural diagram of the test fixture of the BC solar cell according to the embodiment of the present utility model;

[0025] Figure 2 is a top view of the transparent supporting member according to the embodiment of the present utility model;

[0026] Figure 3 is a top view of the lower supporting member according to the embodiment of the present utility model;

[0027] Figure 4 Schematic diagram of the perpendicular setting structure of the conductive layer and the fine grid lines of the BC solar cell to be measured in the embodiment of the present utility model;

[0028] Figure 5 Schematic diagram of the parallel setting structure of the conductive layer and the fine grid lines of the BC solar cell to be measured in the embodiment of the present utility model;

[0029] Wherein 1 - upper driving component, 2 - transparent support, 3 - BC solar cell to be measured, 4 - electrical contact layer, 5 - flexible buffer layer, 6 - lower driving component, 7 - lower support, 31 - positive fine grid line, 32 - negative fine grid line, 41 - positive conductive layer, 42 - negative conductive layer, 411 - positive voltage acquisition area, 412 - positive current acquisition area, 421 - negative voltage acquisition area, 422 - negative current acquisition area. Specific implementation manner

[0030] The test fixture of the BC solar cell of the present utility model will be described in detail below with reference to the drawings and embodiments.

[0031] This embodiment discloses a test fixture for a BC solar cell, as Figure 1 shown, which includes a driving component, a clamping support, and an electrical contact component; in this public embodiment, the driving component includes an upper driving component 1 and a lower driving component 6 arranged oppositely; the clamping support includes a transparent support 2 and a lower support 7; the transparent support 2 is connected to the front end of the aforementioned upper driving component 1; the lower support 7 is connected to the front end of the aforementioned lower driving component 6; the electrical contact component is arranged on the upper surface of the aforementioned lower support 7. When the upper driving component 1 drives, it drives the transparent support 2 to move towards the lower support 7; when the lower driving component 6 drives, it drives the lower support 7 to move towards the transparent support 2. In this public embodiment, both the upper driving component 1 and the lower driving component 6 include driving cylinders arranged on the left and right sides, respectively located on both sides of the transparent support 2 and the lower support 7, providing a stable and reliable source of displacement force for the transparent support 2 and the lower support 7.

[0032] In practical applications, according to the actual usage situation, only select to set the driving component on the back of the transparent support 2 or the lower support 7 to drive and control the distance between the transparent support 2 and the lower support 7 to achieve clamping of the BC solar cell 3 to be measured.

[0033] In this public embodiment, as Figure 2 shown, 4 through holes are provided on the transparent support 2; as Figure 3As shown, the electrical contact component includes an electrical contact layer 4 and a flexible buffer layer 5; the flexible buffer layer 5 is disposed on the upper surface of the aforementioned lower support member 7; the electrical contact layer 4 is disposed on the flexible buffer layer 5.

[0034] In the embodiment of the present disclosure, the electrical contact layer 4 is an FPC flexible printed circuit board; the flexible buffer layer 5 is a silica gel pad; the lower support member 7 is made of an aluminum plate.

[0035] In the embodiment of the present disclosure, the electrical contact layer 4 is provided with two non-conductive conductive layers; the conductive layers include a positive conductive layer 41 and a negative conductive layer 42; the positive conductive layer 41 is further divided into a non-conductive voltage acquisition area and a current acquisition area; when not in contact with the BC solar cell 3 to be measured, the voltage acquisition area and the current acquisition area are not conductive to each other, thus forming a positive voltage acquisition area 411 and a positive current acquisition area 412, a negative voltage acquisition area 421 and a negative current acquisition area 422, so as to realize the Kelvin four-wire system acquisition and ensure the accuracy of the IV test.

[0036] During the test, the transparent support member 2 and the lower support member 7 are connected to the driving cylinders provided on both sides thereof; under the action of the upper driving assembly 1, the transparent support member 2 reciprocates on the upper side of the BC solar cell 3 to be measured, and under the action of the lower driving assembly 6, the lower support member 7 reciprocates on the lower side of the BC solar cell 3 to be measured; when moving to a position far from the BC solar cell 3 to be measured, another BC solar cell can be replaced; after replacement, the upper and lower driving assemblies 6 move towards each other and approach the BC solar cell 3 to be measured until the electrical contact layer 4 and the transparent support member 2 clamp the BC cell to be measured, realizing detachable electrical contact.

[0037] During the electrical related test, the transparent support member 2 and the electrical contact component clamp the BC solar cell 3 to be measured in the middle. The transparent support member 2 mainly functions to transmit light and support the BC solar cell 3 to be measured. The positive conductive layer 41 of the electrical contact layer 4 is in electrical contact with the positive electrode of the BC solar cell 3 to be measured, and the negative conductive layer 42 of the electrical contact layer 4 is in electrical contact with the negative electrode of the BC solar cell 3 to be measured. The flexible buffer layer 5 deforms itself when being squeezed, so as to ensure good contact between the electrical contact layer 4 and the BC solar cell 3 to be measured.

[0038] During the IV test, the simulated sunlight penetrates the transparent support layer and irradiates the BC solar cell 3 to be measured, causing electrical signals to be generated at its positive and negative electrodes; the electrical signals are collected through the positive and negative conductive layers 42 of the electrical contact layer 4 and connected to the IV processing system; during the EL test, the power supply discharges the BC solar cell 3 to be measured through the positive and negative conductive layers 42 of the electrical contact layer 4, and the BC solar cell 3 to be measured emits a light beam that penetrates the transparent support member 2 and is acquired by the EL camera on the front side, thereby completing the test work of the relevant solar cell.

[0039] In the embodiments of the present disclosure, as Figure 4 shown, the conductive layer is arranged perpendicular to the fine grid lines of the BC solar cell 3 to be tested. The positive conductive layer 41 is provided with 9 contact bars, which are in perpendicular electrical contact with the fine grid lines of the solar cell to be tested; the negative conductive layer 42 is provided with 10 contact bars, which are in perpendicular electrical contact with the fine grid lines of the solar cell to be tested; the positive conductive layer 41 and the negative conductive layer 42 are fabricated on a single FPC flexible printed circuit; the FPC flexible printed circuit board uses a two-layer board, the first layer conducts current and has a wider width, the second layer conducts voltage and has a narrower width, and insulation is provided between the two layers to achieve the Kelvin four-wire system; the FPC flexible printed current board is a mature technical process and will not be elaborated here. The current of the BC solar cell 3 to be tested is first collected by its positive and negative fine grid lines 32, and then transmitted and aggregated to the contact bars of the positive conductive layer 41 and the negative conductive layer 42 for acquisition.

[0040] As Figure 4 shown by the vertical contact method, it is close to the solder strip of the solar cell module, making the test result closer to the final condition. However, since each contact bar will simultaneously pass through the positive fine grid line 31 and the negative fine grid line 32 of the BC solar cell 3 to be tested, the BC solar cell 3 to be tested needs to be specially treated during the test to avoid short-circuit between the positive and negative poles.

[0041] In specific applications, according to the actual application situation, as Figure 5 shown, the conductive layer can be arranged parallel to the fine grid lines of the BC solar cell 3 to be tested. At this time, the contact bars of the positive conductive layer 41 only contact the positive fine grid line 31, and the contact bars of the negative conductive layer 42 only contact the negative fine grid line 32, thereby avoiding short-circuit between the positive and negative poles.

[0042] Since the grid lines of the BC solar cell 3 to be tested are not in one direction but are staggered or perpendicular to each other. Therefore, the test fixture for the BC solar cell described in this embodiment can be applied regardless of how the fine grid lines of the BC solar cell 3 to be tested are arranged.

Claims

1. A test fixture for BC solar cells, characterized in that: It includes a driving component, a clamping support and an electrical contact component; The clamping support includes a transparent support and a lower support; The transparent support is arranged directly above the lower support; The electrical contact component is arranged on the upper surface of the aforementioned lower support, between the aforementioned transparent support and the lower support; The driving component is arranged on the back of the aforementioned transparent support and / or the lower support, and is used to drive the transparent support and / or the lower support to displace.

2. The test fixture for the BC solar cell according to claim 1, wherein: A number of through holes are arranged on the transparent support; 3. The test fixture for the BC solar cell according to claim 1 or 2, characterized in that: The electrical contact component includes an electrical contact layer and a flexible buffer layer; The flexible buffer layer is arranged on the upper surface of the aforementioned lower support; The electrical contact layer is arranged on the flexible buffer layer; 4. The test fixture for the BC solar cell according to claim 3, characterized in that: At least two non-conductive conductive layers are arranged on the electrical contact layer; The conductive layer includes a positive conductive layer and a negative conductive layer; 5. The test fixture for the BC solar cell according to claim 4, characterized in that: The positive conductive layer is divided into a non-conductive positive voltage acquisition area and a positive current acquisition area; the negative conductive layer is divided into a non-conductive negative voltage acquisition area and a negative current acquisition area; 6. The test fixture for the BC solar cell according to claim 5, characterized in that: The electrical contact layer is an FPC flexible printed circuit board; 7. The test fixture for the BC solar cell according to claim 6, characterized in that: The flexible buffer layer is a silica gel pad or a silicone foam pad or a rubber pad; 8. The test fixture for the BC solar cell according to claim 7, characterized in that: Part or all of the conductive layer is arranged perpendicular to the fine grid lines of the BC solar cell to be measured; 9. The test fixture for the BC solar cell according to claim 7, characterized in that: Part or all of the conductive layer is arranged parallel to the fine grid lines of the BC solar cell to be measured.