Probe device for low-temperature testboard
Through the cooperation of the telescopic cylinder and the ball positioning rod, the problems of probe alignment and fixation are solved, the precise positioning and stability of the low-temperature test bench are achieved, and the accuracy and safety of the test are improved.
CN223436033UActive Publication Date: 2025-10-14SUZHOU STANDARD ELECTRONIC TECH CO LTD
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Patent Information
- Application Number
- CN202422782567.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-10-14
- Estimated Expiration
- 2034-11-15
AI Technical Summary
Technical Problem
When the probe is far away from the object to be inspected, it is difficult to align it. When the distance is close, the lower end of the probe is easily damaged and it is difficult to fix uneven objects.
Method used
The telescopic cylinder is used to drive the installation block to move, and the ball bearing and positioning rod are used to cooperate to achieve precise positioning of the probe; the objects are fixed by the splint and screw structure to achieve position adjustment.
Benefits of technology
It achieves precise alignment between the probe and the detection point, avoids probe damage, and is convenient for fixing uneven objects, thereby improving the accuracy and reliability of the test.
✦ Generated by Eureka AI based on patent content.
Abstract
The utility model provides a probe device for a low-temperature testboard. The probe device comprises a base; a support is fixedly connected to the upper end of the base, a telescopic air cylinder is arranged at the upper end of the support, a mounting block is fixedly connected to the output end of the telescopic air cylinder, a probe body is arranged at the bottom of the mounting block, and a positioning rod is slidably connected to the bottom of a fixing ring. According to the probe device for the low-temperature testboard provided by the utility model, the positioning rods are kept at the lowest positions through the elastic force of the springs, the mounting block is driven by the telescopic cylinder to move downwards during testing, so that the balls can be in contact with the surface of an object, and a detection point can be adjusted at the middle positions of the multiple groups of positioning rods through comparison of the multiple groups of positioning rods; at the moment, the detection point is aligned with the probe body, the telescopic air cylinder continues to drive the mounting block to move downwards, the positioning rod slides along the fixing ring, when the probe body makes contact with the detection point, the probe body tests the detection point, through the structure, the probe body can be conveniently aligned with the detection point, and the probe body cannot be damaged.
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