Optical module adjusting and testing device and system

By setting up multiple connectors and fans in the optical module testing device, and combining them with power management and temperature management modules, the temperature and voltage control of the optical module is realized, solving the problems of high testing cost and difficult temperature control of optical modules, and improving testing efficiency and accuracy.

CN223584185UActive Publication Date: 2025-11-21ACCELINK TECHNOLOGIES CO LTD
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Patent Information

Application Number
CN202520232287.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-02-13
Publication Date
2025-11-21
Estimated Expiration
2035-02-13

AI Technical Summary

Technical Problem

Existing technologies for testing optical modules are costly and difficult to control the temperature of optical modules, making it impossible to meet the testing requirements of optical modules at specific temperatures.

Method used

An optical module testing and adjustment device was designed, comprising a testing module, a power management module, and a temperature management module. By setting multiple connectors and a fan on the testing module, the power management module provides voltage, the temperature management module drives the fan to control the temperature, and the transmission module receives control commands to achieve temperature and voltage control of the optical module.

Benefits of technology

It reduces the testing cost of optical modules, can accurately control the temperature and voltage of optical modules at specific temperatures, improves testing efficiency, supports the testing of QSFP-DD packaged optical modules, and realizes automated penta-angle pull-off testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of communication, in particular to an optical module adjusting and testing device and system. The device comprises a test module, a power management module and a temperature management module. A plurality of connecting seats and a plurality of fans are arranged on the test module; each first output end of the power management module is connected with the power supply end of each connecting seat; the second output end of the power management module is connected with the power supply end of the temperature management module. Each output end of the temperature management module is connected with the control end of each fan; the power supply management module provides working voltage for the optical module and the temperature management module; and the temperature management module provides driving current for the fan so as to control the temperature of the optical module. According to the utility model, the plurality of connecting seats are arranged on the test module, so that the test module can be used for testing a plurality of optical modules, and the temperature management module is used for providing driving current for the fan, so that the temperature control of the optical modules is realized, and the test requirement of the optical modules at a specific temperature is met.
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Description

TECHNICAL FIELD

[0001] The utility model relates to communication technical field especially relates to a kind of optical module testing device and system. BACKGROUND

[0002] Optical module cooperates with switch, router product uses, is applied to city area / region, data center interconnection network scene. Customer side electrical signal received from mainboard is converted into line side optical signal supporting long-distance transmission, and the line side optical signal received is converted into corresponding customer side electrical signal. And optical module needs to pass a large number of factory tests before factory, and test items include module power consumption, TX light precision, TX OSNR, RX limit OSNR, RX sensitivity and other key indicators of test. In prior art, the test of optical module is mainly realized using switch as fixture, but optical module is often mass-produced, and a large number of switches are needed to test a large number of optical modules, thereby generating large test cost, and on the other hand, optical module test also needs to control the temperature of optical module to test the working condition of optical module under specific temperature, and prior art cannot meet this demand. SUMMARY

[0003] The utility model overcomes the prior art when testing optical module and cannot control the temperature of optical module.

[0004] The utility model is realized as follows:

[0005] Firstly, the utility model provides a kind of optical module testing device, including test module, power management module and temperature management module;The test module is provided with multiple connecting seats and multiple fans;

[0006] The first output end of the power management module is connected with the power supply end of each connecting seat;The second output end of the power management module is connected with the power supply end of the temperature management module;The output end of the temperature management module is connected with the control end of each fan;

[0007] The connecting seat is used to install optical module;The power management module is used to provide first working voltage for optical module, and second working voltage for temperature management module;The temperature management module is used to provide driving current for fan to drive fan rotation, realizes temperature control to optical module.

[0008] Preferably, the electrical interface between every two connecting seats is connected with each other to form data pair transmission channel between corresponding two optical modules.

[0009] Preferably, the power management module includes a power supply unit and a voltage conversion unit;

[0010] Each first output terminal of the power supply unit is connected to the input terminal of each voltage conversion unit; the output terminal of each voltage conversion unit is used as the first output terminal of the power management module; the second output terminal of the power supply unit is used as the second output terminal of the power management module.

[0011] The power supply unit is used to generate the original voltage and output the original voltage as the second working voltage; the voltage conversion unit is used to convert the original voltage into the first working voltage.

[0012] Preferably, the power management module further includes multiple voltage and current detection units; each voltage and current detection unit is disposed between the corresponding voltage conversion unit and the connector.

[0013] The voltage and current detection unit is used to detect the magnitude of each first operating voltage and the magnitude of the first operating current, so as to detect the power consumption of the optical module through the magnitude of the first operating voltage and the magnitude of the first operating current; wherein, the first operating current is the current input to the power supply terminal of each connector.

[0014] Preferably, it also includes a transmission module;

[0015] The power supply terminal of the transmission module is connected to the third output terminal of the power module to supply power to the transmission module;

[0016] The first port of the transmission module is connected to the host computer, and each second port of the transmission module is connected to the command communication terminal of each connector.

[0017] The transmission module is used to receive optical module control commands from the host computer and send the optical module control commands to each optical module.

[0018] Preferably, the third port of the transmission module is connected to the command communication terminal of the temperature management module;

[0019] The transmission module is used to receive temperature control commands from the host computer and send the temperature control commands to the temperature management module.

[0020] Preferably, the connector is one or more of QSFP-DD connector, OSFP connector, and CFP connector.

[0021] Preferably, the first operating voltage is 3.2 to 3.4V.

[0022] Secondly, this utility model provides an optical module tuning and testing system, including an index detection device and the optical module tuning and testing device described in the first aspect;

[0023] The optical module debugging device is used for mounting each optical module to be tested;

[0024] The test input end of the index detection device is connected with the optical interface of each optical module to be tested, so as to detect the index of each optical module to be tested.

[0025] In a third aspect, the utility model provides a kind of optical module debugging system, comprising first debugging device, second debugging device, optical transmission system and index detection device;The first debugging device and second debugging device are the optical module debugging device of first aspect;

[0026] The first debugging device is used for mounting first measured optical module and first optical module to be tested;The second debugging device is used for mounting second measured optical module and second optical module to be tested;Wherein, the first measured optical module and first optical module to be tested are mounted on the two connecting seats of the first debugging device in which electrical interface is connected with each other, and the second measured optical module and second optical module to be tested are mounted on the two connecting seats of the second debugging device in which electrical interface is connected with each other;

[0027] The optical interface of the first optical module to be tested is connected with the optical interface of the second optical module to be tested by the optical transmission system;The optical interface of the second measured optical module is self-loop;The test input end of the index detection device is connected with the optical interface of the first measured optical module, to form the communication transmission loop between index detection device, first measured optical module, first optical module to be tested, second optical module to be tested and second measured optical module;

[0028] The index detection device is used for detecting the index of the communication transmission loop, to detect the communication condition between first optical module to be tested and second optical module to be tested.

[0029] Compared with prior art, the utility model has the beneficial effect that: the utility model is in test module on the one hand is provided with multiple connecting seats, so as to be used for the test of multiple optical modules, on the other hand, the embodiment is also provided with fan in test module, and temperature management module is used to provide driving current for fan, so as to realize the temperature control of optical module, to meet the test demand of optical module under specific temperature. BRIEF DESCRIPTION OF DRAWINGS

[0030] In order to more clearly illustrate the technical scheme in the embodiment of the utility model or prior art, the drawings needed to be used in the following embodiment or prior art description will be briefly introduced, and obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can be obtained without creative labor according to these drawings.

[0031] Figure 1The utility model provides a first optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0032] Figure 2 The utility model provides a second optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0033] Figure 3 The utility model provides a third optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0034] Figure 4 The utility model provides a fourth optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0035] Figure 5 The utility model provides a fifth optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0036] Figure 6 The utility model provides a sixth optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0037] Figure 7 The utility model provides a seventh optical module debugging device's framework schematic drawing provided for the embodiment of the utility model,

[0038] Figure 8 The utility model provides a kind of optical module debugging system's framework schematic drawing provided for the embodiment of the utility model,

[0039] Figure 9 The utility model provides another optical module debugging system's framework schematic drawing provided for the embodiment of the utility model,

[0040] Figure 10 The utility model provides still another optical module debugging system's framework schematic drawing provided for the embodiment of the utility model. DETAILED DESCRIPTION

[0041] The terms "first", "second", etc. in the utility model are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first", "second", etc. can be explicitly or implicitly included one or more features. In the description of the present application, unless otherwise specified, the meaning of "a plurality of" is two or more.

[0042] In the present application, unless otherwise specified and limited, the term "connection" should be understood broadly, for example, "connection" can be fixed connection, or detachable connection, or integral; It can be directly connected, or indirectly connected through intermediate medium. In addition, the term "coupling" can be an electrically connected mode for realizing signal transmission.

[0043] With reference to the drawings of the embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative efforts fall within the scope of the present application.

[0044] Embodiment 1:

[0045] The embodiment of the present application provides a kind of optical module measurement device, as shown in Figure 1 It includes test module, power management module and temperature management module;The test module is provided with multiple connecting seats and multiple fans.

[0046] The first output end (i.e. Figure 1 1-1 port and 2-2 port in) of the power management module is connected with the power supply end (i.e. Figure 1 5-1 port and 5-2 port in) of each connecting seat;The second output end (i.e. Figure 1 2 port in) of the power management module is connected with the power supply end (i.e. Figure 1 3 port in) of the temperature management module;The output end (i.e. Figure 1 4-1 port and 4-2 port in) of the temperature management module is connected with the control end of each fan.

[0047] The connecting seat is used to install optical module;The power management module is used to provide first working voltage for optical module, and second working voltage for temperature management module;The temperature management module is used to provide driving current for fan, to drive fan rotation, realize temperature control to optical module. Wherein, the size of the driving current can be obtained by those skilled in the art according to test demand analysis.

[0048] Among them, the connecting seat is one or more of Quad Small Form Factor Pluggable-Double Density (QSFP-DD for short) connecting seat, Octal Small Formfactor Pluggable (OSFP for short) connecting seat and Centum Form-factor Pluggable (CFP) connecting seat.

[0049] It needs to be explained here that, Figure 1is exemplified by setting 2 connection seats (connection seat 1 and connection seat 2) and 2 fans (fan 1 and fan 2) on the test module, in actual use, the number N of connection seats set on one test module is obtained by demand analysis by those skilled in the art, and N fans are correspondingly set, so that each fan controls the temperature of the corresponding connection seat, in actual use, the test module can also be provided with multiple air ducts, each connection seat is arranged in an air duct, and a corresponding fan is arranged at the opening position of the air duct.

[0050] On the one hand, the embodiment can be used for testing of multiple optical modules by setting multiple connection seats on the test module, and on the other hand, the embodiment also sets a fan in the test module, and uses a temperature management module to provide driving current for the fan, so as to realize temperature control of the optical module, thereby meeting the testing requirements of the optical module at a specific temperature.

[0051] It is considered that in actual use, not only the optical module itself needs to be tested, but also the communication between multiple optical modules needs to be tested, in order to meet this requirement, the embodiment also provides a preferred implementation, that is, as shown in Figure 2 , the electrical interfaces (i.e. 6-1 port and 6-2 port in Figure 2 ) between every two connection seats are connected to each other to form a data transmission channel between the corresponding two optical modules.

[0052] Exemplified by taking the connection seat 1 and the connection seat 2 as QSFP-DD connection seats, then one connection seat has 8 electrical interfaces, the 8 electrical interfaces of the connection seat 1 are connected to the 8 electrical interfaces of the connection seat 2 in sequence to form a lane transmission, wherein each pair of connections supports a 56 baud rate.

[0053] In this embodiment, the tested optical module (i.e. the optical module that has been tested and has normal function) can be installed on the connection seat 1 as a communication module, the to-be-tested optical module (i.e. the optical module that needs to be tested) is installed on the connection seat 2, and the optical interface of the to-be-tested optical module is connected to other optical modules through an optical transmission system, so that the indicators of the to-be-tested optical module can be tested through the optical interface of the communication module. Figure 3For example, the measured optical module is installed in the connection seat 1 as a communication module, the optical interface of the communication module is connected to the error code instrument, the optical module to be measured is installed in the connection seat 2, and the optical module to be measured is connected to other optical modules through the optical transmission system. The other optical modules can be optical modules to be measured, so as to test the communication between the two optical modules to be measured, or can be measured optical modules, that is, only one optical module to be measured and the existing optical module are tested. In actual testing, optical communication is carried out between the other optical modules and the optical module to be measured, the communication data is converted into an electrical signal, and then transmitted to the communication module through the data transmission channel, and then transmitted to the error code instrument for testing, so as to obtain the bit error rate in the optical communication process. The communication module can be understood as a module with a reliable bit error rate in a controllable range, so as to not affect the test of the optical communication process.

[0054] In a specific application scenario, as shown in Figure 4 The power management module includes a power supply unit and a voltage conversion unit; each first output end (i.e. 7-1 port and 7-2 port in Figure 4 ) of the power supply unit is connected to the input end of each voltage conversion unit; the output end of each voltage conversion unit is used as the first output end of the power management module; the second output end (i.e. 8 port in Figure 4 ) of the power supply unit is used as the second output end of the power management module; the power supply unit is used to generate an original voltage, and the original voltage is used as a second working voltage; the voltage conversion unit is used to convert the original voltage into the first working voltage. In a specific application scenario, the size of the original voltage can be 12V, and the size of the first working voltage is 3.2-3.4V. In an optional embodiment, the size of the first working voltage is 3.3V.

[0055] In a preferred embodiment, as shown in Figure 5 The power management module further includes a plurality of voltage and current detection units; each voltage and current detection unit is arranged between the corresponding voltage conversion unit and the connection seat; the voltage and current detection unit is used to detect the size of each first working voltage and the size of the first working current, so as to detect the power consumption of the optical module through the size of the first working voltage and the size of the first working current; wherein the first working current is the current input to the power supply end of each connection seat.

[0056] The power consumption of the optical module can be calculated by a person skilled in the art according to the detected size of the first working voltage and the size of the first working current.

[0057] In an optional embodiment, as shown in Figure 6 It further includes a transmission module; the power supply end (i.e. 9 port in Figure 6The 10 port in the power supply module and the third output terminal (i.e., port 10) are connected to the third output terminal of the power supply module. Figure 6 The first port of the transmission module (i.e., port 9) is connected to provide power to the transmission module; Figure 6 The 13th port of the transmission module is connected to the host computer, and each of the second ports of the transmission module (i.e., ...) Figure 6 Ports 11-1 and 11-2 of the optical module are connected to the command communication terminals of each connector (in actual use, these are represented by the I2C pins of each connector). In a specific application scenario, the transmission module also reserves an additional port, which is connected to the low-power pins of each connector, enabling the optical module to be controlled by a hardware DIP switch and also by a host computer through the transmission module. The transmission module is used to receive optical module control commands from the host computer and send the optical module control commands to each optical module.

[0058] In a preferred embodiment, the third port of the transmission module (i.e. Figure 6 The transmission module (port 13) is connected to the command communication terminal of the temperature management module; the transmission module is used to receive temperature control commands from the host computer and send the temperature control commands to the temperature management module. The transmission module also reads the temperature of each optical module (i.e., the case temperature of the optical module) from the command communication terminal and reports the temperature of each optical module to the host computer so that the host computer can send temperature control commands according to the temperature of the optical modules.

[0059] In practical use, such as Figure 7 As shown, each fourth port of the transmission module is also connected to the output terminal of each voltage and current detection unit to receive the magnitude of the first operating voltage and the magnitude of the first operating current detected by the voltage and current detection units, and transmit the magnitude of the first operating voltage and the magnitude of the first operating current to the host computer; each fifth port of the transmission module is also connected to the control terminal of each voltage conversion unit to receive voltage control commands from the host computer, and send the voltage control commands to each voltage conversion unit to control the magnitude of the output first operating voltage. In this preferred embodiment, temperature and voltage control of each optical module can be realized, thereby enabling the optical module to be tested in a stable three-temperature and three-wave environment.

[0060] The transmission module may include a microcontroller and a network connection unit (such as a network management module and a network port connector), thereby enabling data transmission between the microcontroller and the host computer. The network connection unit may be a wired network connection unit or a wireless network connection unit; this embodiment does not impose any limitation on this.

[0061] The following will be based on the above method, combined with specific application scenarios, and by the technical expression in the relevant scene to elaborate the implementation process of the characteristic scene of the utility model. This embodiment is to set two connecting seats on the test module, and the two connecting seats are QSFP-DD connecting seats.

[0062] As shown in Figure 8 and Figure 9 , the optical module debugging device of the embodiment includes a power management module, a test module, a temperature management module, a transmission module (including a central processing unit (CPU) control small system, i.e. a single-chip microcomputer, and a network connection unit), and an external host computer and an optical path test platform (i.e. an index detection device) of the optical module debugging device. Among them, Figure 9 The use of the error code instrument to test the to-be-tested optical module in the optical module debugging device is used as an application scenario, and it should be noted that in actual use, the fan is located close to the connecting seat, i.e. on the test module, Figure 9 The fan in the test module is placed outside the test module only for the clarity of the connection relationship in the drawing, and does not represent the actual position of the fan.

[0063] The power management module is powered by a common 220V power line for a pluggable power module, and the 1200W pluggable power module is connected to the 12V power supply (i.e. the 12V power supply unit in Figure 9 ) can be connected to four test boards in four ways (this function is realized by the power supply unit). The 12V power supply is supplied to the test board to supply power to the temperature management module, and is converted to 3.3V by the DC / DC voltage conversion module to supply power to the single-chip microcomputer and the to-be-tested optical module, wherein two to-be-tested optical modules are provided with current and voltage monitoring chips (i.e. voltage and current detection units) in front of them for module power consumption detection.

[0064] The test module has two QSFP-DD connecting seats for plugging and unplugging QSFP-DD modules and has good heat dissipation, which can solve the heat dissipation of 25W power consumption. The two to-be-tested optical module electrical ports (i.e. electrical interfaces) have 8 pairs of lane pairs on the board, and each pair can support a 56G baud rate.

[0065] The single-chip microcomputer in the transmission module can fetch the temperature of the module every 5 seconds, and adjust the duty cycle of the fan speed control chip according to the set value to achieve the effect of temperature control

[0066] The CPU control small system is a 3.3V powered single-chip microcomputer, and the low-power pins of the to-be-tested optical module are led to the board, one side is controlled by a hardware dial switch, and the other side is controlled by a single-chip microcomputer. In addition, the I2C pin of the to-be-tested optical module is also connected to the single-chip microcomputer for issuing commands to the module

[0067] The network connection unit includes a network port control and a serial port control, and the serial port is often used to obtain the printing information of the optical module. The test board has two network ports for network port cascading. The host computer can simultaneously control multiple optical module test devices.

[0068] The host computer is a computer terminal commonly used by people, and the host computer can simultaneously operate the optical module test devices to test the optical modules.

[0069] The optical path test platform can be switched according to test requirements. For example, when a factory-hung test is performed, two test ports are used, one of which can be connected to a data module on an error code instrument, and the other can be connected to a fiber passing through a DWDM system to form a loop. For example, when the light output parameters of the optical module to be tested are tested, the wavelength meter is connected to test the light output accuracy, and the optical switch is connected to the optical spectrum analyzer to read the TX OSNR.

[0070] In the prior art, there are related patents with publication numbers CN203691398U and CN202798726U. However, the CN203691398U patent mainly uses an external power supply to supply power to the test board, and uses the host computer to debug the CFP2 packaged optical module, and the high-speed signal interface of the module is led out for high-speed electrical signal measurement.

[0071] The difference between the embodiment and the prior art is that the electrical signal of the embodiment is in a transmission state on the test module rather than being led out for measurement, and the test items of the embodiment are biased towards optical testing. Moreover, the embodiment specially supports the testing of QSFP-DD packaged optical modules, and the embodiment supports temperature control of the optical module.

[0072] The difference between the embodiment and the CN202798726U patent is that the embodiment specially supports the testing of QSFP-DD packaged optical modules, and the CN202798726U patent leads out the MDIO interface, the control pin interface, and the test signal interface, which is more biased towards electrical signal testing. The embodiment mainly tests the optical indicators of the module, and controls the working environment (i.e., the temperature) of the optical module.

[0073] The optical module test device described in the embodiment uses a low-cost test board rather than a switch as a fixture, which greatly saves the testing cost of the product. The temperature, voltage, current, and power consumption can be accurately controlled in real time, the temperature and voltage of the module can be controlled, and automatic five-angle polarization testing can be realized. Multiple systems can be simultaneously tested through network port multi-level cascading, which improves the testing efficiency. Two QSFP-DD packaged modules can be wired on the test module to achieve good electrical port transmission, which can serve as a fixture for the module before it is shipped.

[0074] Compared with the prior art, the embodiment can accurately control temperature, voltage, current and power consumption in real time, control temperature and voltage of the module, realize automatic five-angle polarization test, realize simultaneous test of multiple systems through multi-level cascade, improve test efficiency, support test and debugging of QSFP-DD packaged optical modules, and multiple projects share the test platform. The embodiment can also simultaneously realize electrical port and optical port performance test functions. The embodiment also uses an upper computer GUI interface for control, facilitates automatic test, and can cascade test platforms to improve test efficiency.

[0075] Embodiment 2

[0076] Based on the optical module debugging device described in embodiment 1, the embodiment also provides an optical module debugging system, as shown in Figure 7 The optical module debugging device is used to install each optical module to be tested. A test input end of the index detection device is connected with an optical interface of each optical module to be tested to detect indexes of each optical module to be tested. The index detection device can be a bit error rate tester, a wavelength meter or a spectrometer.

[0077] Taking the index detection device as a bit error rate tester as an example, as shown in Figure 8 Two connection seats are arranged on the test module, and the two connection seats are QSFP-DD connection seats. As shown in Figure 9 The power management module, the test module, the temperature management module and the CPU control subsystem are all controlled through I2C communication. The upper computer inputs target temperature, voltage parameters and configuration information instructions. The CPU issues initialization temperature and voltage instructions. The optical module to be tested is started. The module temperature is read back and displayed. The fan speed is increased or decreased. If the temperature is greater than the set value, the speed continues to increase. Otherwise, the speed is decreased. Until the temperature = set value ± 0.5℃. Similarly, the module voltage, current and calculated power consumption are read back and displayed. If the voltage is greater than the set value, the DC / DC output voltage is decreased. If the module voltage is less than the set value, the DC / DC output voltage is increased. Until the voltage = set value ± 0.01V, a stable test environment is achieved to start the test.

[0078] Embodiment 3

[0079] Based on the optical module debugging device described in embodiment 1, the embodiment also provides an optical module debugging system, as shown in Figure 10 The system includes a first debugging device, a second debugging device, an optical transmission system and an index detection device. The first debugging device and the second debugging device are both the optical module debugging device described in embodiment 1. Each two connection seats in the first debugging device are connected with each two connection seats in the second debugging device through the optical transmission system. Figure 10The electrical interfaces between the two connection seats in which the first measured optical modules are located and the two connection seats in which the first to-be-measured optical modules are located are connected to each other. Figure 10 The electrical interfaces between the two connection seats in which the second measured optical modules are located and the two connection seats in which the second to-be-measured optical modules are located are connected to each other.

[0080] The first measuring device is used for mounting the first measured optical modules and the first to-be-measured optical modules; the second measuring device is used for mounting the second measured optical modules and the second to-be-measured optical modules; wherein the first measured optical modules and the first to-be-measured optical modules are mounted on the two connection seats in which the electrical interfaces are connected to each other in the first measuring device, and the second measured optical modules and the second to-be-measured optical modules are mounted on the two connection seats in which the electrical interfaces are connected to each other in the second measuring device.

[0081] The optical interfaces of the first to-be-measured optical modules and the second to-be-measured optical modules are connected through the optical transmission system; the optical interfaces of the second measured optical modules are self-looped; the test input end (Client module) of the index detection device (ONT-804) is connected to the optical interfaces of the first measured optical modules, so as to form a communication transmission loop among the index detection device, the first measured optical modules, the first to-be-measured optical modules, the second to-be-measured optical modules and the second measured optical modules.

[0082] The index detection device is used for detecting the indexes of the communication transmission loop, so as to detect the communication between the first to-be-measured optical modules and the second to-be-measured optical modules.

[0083] Wherein, the ONT is a model of a bit error rate instrument, and each optical module measuring device carries 400G data modules (the first measured optical modules and the second measured optical modules) and to-be-measured optical modules (the first to-be-measured optical modules and the second to-be-measured optical modules) optical port pairs, so as to form an overall transmission path: the data modules and the to-be-measured optical modules are electrically connected on the first measuring device, the first to-be-measured optical modules and the second to-be-measured optical modules are transmitted through the optical path system, and the data module optical ports of the second measuring device are self-looped to form a service loop.

[0084] The above only describes preferred embodiments of the present application, and is not intended to limit the present application, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. An optical module adjustment and testing device, characterized in that, It includes a test module, a power management module, and a temperature management module; the test module is equipped with multiple connectors and multiple fans; Each first output terminal of the power management module is connected to the power supply terminal of each connector; the second output terminal of the power management module is connected to the power supply terminal of the temperature management module; each output terminal of the temperature management module is connected to the control terminal of each fan. The connector is used to install the optical module; the power management module is used to provide a first operating voltage to the optical module and a second operating voltage to the temperature management module; the temperature management module is used to provide drive current to the fan to drive the fan to rotate, thereby controlling the temperature of the optical module.

2. The optical module adjustment and testing device according to claim 1, characterized in that, The electrical interfaces between each pair of connectors are interconnected to form a data transmission channel between the two corresponding optical modules.

3. The optical module adjustment and testing device according to claim 1, characterized in that, The power management module includes a power supply unit and a voltage conversion unit; Each first output terminal of the power supply unit is connected to the input terminal of each voltage conversion unit; the output terminal of each voltage conversion unit is used as the first output terminal of the power management module. The second output terminal of the power supply unit is used as the second output terminal of the power management module; The power supply unit is used to generate the original voltage and output the original voltage as the second working voltage; the voltage conversion unit is used to convert the original voltage into the first working voltage.

4. The optical module adjustment and testing device according to claim 3, characterized in that, The power management module also includes multiple voltage and current detection units; each voltage and current detection unit is disposed between the corresponding voltage conversion unit and the connector. The voltage and current detection unit is used to detect the magnitude of each first operating voltage and the magnitude of the first operating current, so as to detect the power consumption of the optical module through the magnitude of the first operating voltage and the magnitude of the first operating current; wherein, the first operating current is the current input to the power supply terminal of each connector.

5. The optical module adjustment and testing device according to claim 1, characterized in that, It also includes a transmission module; The power supply terminal of the transmission module is connected to the third output terminal of the power module to supply power to the transmission module; The first port of the transmission module is connected to the host computer, and each second port of the transmission module is connected to the command communication terminal of each connector. The transmission module is used to receive optical module control commands from the host computer and send the optical module control commands to each optical module.

6. The optical module adjustment and testing device according to claim 5, characterized in that, The third port of the transmission module is connected to the command communication terminal of the temperature management module; The transmission module is used to receive temperature control commands from the host computer and send the temperature control commands to the temperature management module.

7. The optical module adjustment and testing device according to any one of claims 1-6, characterized in that, The connector is one or more of the following: QSFP-DD connector, OSFP connector, and CFP connector.

8. The optical module adjustment and testing device according to any one of claims 1-6, characterized in that, The first operating voltage is 3.2 to 3.4V.

9. An optical module commissioning system, characterized in that, Includes an index detection device and an optical module adjustment device as described in any one of claims 1-8; The optical module debugging device is used to install each optical module to be tested; The test input terminal of the index detection device is connected to the optical interface of each optical module under test to detect the index of each optical module under test.

10. An optical module adjustment and testing system, characterized in that, It includes a first adjustment and testing device, a second adjustment and testing device, an optical transmission system, and an index detection device; the first adjustment and testing device and the second adjustment and testing device are both optical module adjustment and testing devices as described in any one of claims 1-8; wherein, the electrical interfaces between every two connectors in the first adjustment and testing device are interconnected, and the electrical interfaces between every two connectors in the second adjustment and testing device are interconnected. The first adjustment and testing device is used to install a first measured optical module and a first optical module to be tested; the second adjustment and testing device is used to install a second measured optical module and a second optical module to be tested; wherein, the first measured optical module and the first optical module to be tested are installed on two connectors in the first adjustment and testing device whose electrical interfaces are interconnected, and the second measured optical module and the second optical module to be tested are installed on two connectors in the second adjustment and testing device whose electrical interfaces are interconnected. The optical interface of the first optical module under test and the optical interface of the second optical module under test are connected through the optical transmission system; the optical interface of the second optical module under test is in a loop; the test input terminal of the index detection device is connected to the optical interface of the first optical module under test to form a communication transmission loop between the index detection device, the first optical module under test, the first optical module under test, the second optical module under test, and the second optical module under test. The indicator detection device is used to detect the indicators of the communication transmission loop in order to detect the communication status between the first optical module under test and the second optical module under test.

Citation Information

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