Transformer testing device

Abstract

The utility model provides a transformer testing device. The transformer testing device comprises a base, a transformer connecting piece, a plurality of conductive medium grooves, a driving assembly and a plurality of second conductive pieces. The transformer connecting piece comprises a first insulating base, a plurality of first conductive pieces and a wiring piece. The first conductive pieces are arranged on the first insulating base at intervals. Each first conductive piece is provided with a wiring piece. The wiring piece comprises a plurality of wiring parts. The first insulating seat is detachably connected to the base. The conducting medium groove is arranged on the base. The conducting medium groove is used for containing conducting media. The driving assembly is arranged on the base. The second conductive piece is arranged on the driving assembly. The second conductive parts and the first conductive parts are arranged in a one-to-one correspondence mode in the first direction. The driving assembly is used for driving the second conductive part to move close to or away from the first conductive part.

Description

Technical Field

[0001] This application relates to the field of testing, and in particular to a transformer testing device. Background Technology

[0002] A transformer consists of a core and a coil. The coil is wound around the core. The coil includes conductive wires and an outer insulation layer. The outer insulation layer covers the conductive wires. During transformer production, product testing is required. For example, damage testing is needed to detect whether the outer insulation layer of the coil has been damaged. In related technologies, manual inspection is used to inspect transformers, which is inefficient. Utility Model Content

[0003] In view of the above problems, this application provides a transformer testing device, which is beneficial to improving the efficiency of testing work.

[0004] This application provides a transformer testing device, which includes a base, a transformer connector, multiple conductive medium tanks, a drive assembly, and multiple second conductive elements.

[0005] The transformer connector includes a first insulating base, multiple first conductive elements, and wiring components. The first conductive elements are spaced apart on the first insulating base. Each first conductive element is equipped with a wiring component. The wiring component includes multiple wiring portions. The first insulating base is detachably connected to a base. A conductive medium groove is disposed on the base. The conductive medium groove is used to contain conductive medium. A drive assembly is disposed on the base. Second conductive elements are disposed on the drive assembly. Along a first direction, the second conductive elements are arranged in a one-to-one correspondence with the first conductive elements. The drive assembly is used to drive the second conductive elements to move closer to or away from the first conductive elements.

[0006] In the transformer testing device of this application embodiment, multiple first conductive components in the transformer connector are respectively provided with wiring terminals. Each first conductive component can be connected to a transformer to be tested through a wiring terminal. The tail wire of the transformer can be connected and fixed to the wiring terminal. The core of the transformer and part of the coil can be immersed in the conductive medium contained in the conductive medium tank. During testing, multiple second conductive components can be driven by the driving component to clamp the exposed conductive wires on the tail wires with the corresponding first conductive components, so that the corresponding transformers, first conductive components and second conductive components are electrically connected to each other. Then, each transformer can be subjected to an independent withstand voltage test to determine whether the coils of each transformer are damaged. The transformer testing device of this application embodiment can test multiple transformers at one time, and perform independent testing on each transformer at the same time, which is beneficial to improving the efficiency of the testing work. Furthermore, when the transformer to be tested is damaged, the damaged transformer can be easily, accurately and quickly located and identified, which helps to reduce the possibility of missed or false detections.

[0007] In some possible implementations, the first conductive element includes a groove, at least a portion of the wiring element is disposed within the groove, and a drive assembly is used to drive the second conductive element to insert into or retract from the groove.

[0008] By placing the connector in the groove, the first conductive element can protect the connector, reducing the possibility of structural damage caused by scratches or collisions from external structural components.

[0009] In some feasible implementations, the connector is a flexible element.

[0010] Under its own elastic restoring force, the connector can abut against the first conductive component, improving the connection stability between the connector and the first conductive component, reducing the possibility of a loose connection between the connector and the first conductive component, and also reducing the possibility of the connector coming off the first conductive component.

[0011] In some feasible methods, limiting holes are provided on the two side walls of the groove, and the connector includes a limiting connection part located inside the limiting hole.

[0012] The first conductive element can limit the connection of the connector, further reducing the possibility of the connector coming off the first conductive element.

[0013] In some feasible implementations, the connector is a helical spring.

[0014] In the structure of the helical spring, a connection point is formed between two adjacent helical segments. The tail wire of the coil can be snapped between the two helical segments to secure it. The connection between the tail wire and the connector is simple and easy to operate. At the same time, the tail wire is compressed by the two helical segments, which improves the stability and reliability of the connection between the tail wire and the connector, making it less likely for the tail wire to separate from or fall off the helical spring.

[0015] In some feasible embodiments, along the second direction, the groove passes through the first conductive element, the connector is located in the groove, along the first direction, the groove has an opening facing the second conductive element, there is a gap between the connector and the opening, there is a gap between the connector and the bottom wall of the groove, and the first direction is perpendicular to the second direction.

[0016] The way the connector is set entirely within the groove further ensures that the first conductive element provides effective protection for the connector.

[0017] In some feasible embodiments, the base includes a first positioning part, the first insulating seat includes a second positioning part, and the first insulating seat and the base are positioned relative to each other through the first positioning part and the second positioning part.

[0018] When assembling the transformer connector with the base, the transformer connector can be positioned relative to the first positioning part of the base through the second positioning part on the first insulating seat. This facilitates quick and accurate installation of the transformer connector into the predetermined position on the base, improving testing efficiency and the accuracy of the transformer connector installation position. The first insulating seat and the base form a mutual limiting constraint through the first and second positioning parts, reducing the possibility of the first insulating seat shifting relative to the base.

[0019] In some feasible implementations, one of the first positioning part and the second positioning part is a positioning post, and the other is a positioning hole.

[0020] The first and second positioning parts each have relatively simple structures, which helps to reduce the difficulty of processing.

[0021] In some feasible embodiments, the transformer testing apparatus further includes a second insulating base, with a plurality of second conductive elements spaced apart on the second insulating base, which is disposed on the drive assembly.

[0022] The second insulating base can support the second conductive element and provide a mounting foundation for it. Connecting multiple second conductive elements to the drive assembly via the second insulating base helps reduce the difficulty of connecting multiple second conductive elements to the drive assembly.

[0023] In some feasible embodiments, the second conductive element includes a voltage-conducting block and an electrode probe. The electrode probe includes a main body and a connecting part. The main body is connected to a second insulating base, and the connecting part is disposed facing the first conductive element. The voltage-conducting block is electrically connected to the connecting part. A driving assembly is used to drive the second conductive element to move closer to or away from the first conductive element so that the voltage-conducting block and the first conductive element are electrically connected or disconnected.

[0024] The voltage-conducting block has a relatively large area, so after the voltage-conducting block is connected to the first conductive component, the contact area between the voltage-conducting block and the first conductive component is relatively large. This helps to ensure that the second conductive component and the first conductive component accurately clamp all the exposed conductive wires on the tail wire, reducing the possibility that the second conductive component may fail to press down all the exposed conductive wires on the tail wire, resulting in incorrect test results.

[0025] In some feasible embodiments, the adapter and the main body are slidably connected, and the electrode probe also includes an elastomer. The adapter and the main body are respectively connected to the elastomer. When the adapter slides relative to the main body, the elastomer accumulates or releases elastic potential energy. Along the first direction, there is a gap between the conductive block and the second insulating seat.

[0026] When the voltage-conducting block comes into contact with the first conductive component, the voltage-conducting block can push the transition part to move relative to the main body. The transition part causes the elastic body to deform, so that the elastic body accumulates elastic potential energy. Thus, when the voltage-conducting block comes into contact with the first conductive component, the electrode probe can buffer and absorb the impact energy between the voltage-conducting block and the first conductive component, reducing the possibility of structural damage to the electrode probe, voltage-conducting block, or first conductive component due to rigid contact between the voltage-conducting block and the first conductive component.

[0027] In some possible implementations, the drive assembly includes a guide rail, a slide, and a driver, the guide rail extending in a first direction, the slide slidably connected to the guide rail, the driver connected to the guide rail, the slide connected to the driver, and a second conductive element connected to the slide.

[0028] The guide rail can limit and constrain the slide, making the slide's movement direction more accurate and the movement process more stable. This ensures that the second conductive component connected to the slide has a more accurate movement direction and a more stable movement process, which is beneficial to ensure that the second conductive component is accurately connected to the first conductive component.

[0029] In some feasible implementations, a transformer connector is provided on one side of the conductive medium tank.

[0030] All the tail wires in a transformer under test can be connected to a single terminal block on one side in the same direction. By centrally connecting all the tail wires of a transformer to a single terminal block, the number of components used to secure the tail wires can be reduced.

[0031] In some feasible embodiments, the transformer testing apparatus further includes a tester, the first electrode of which is disposed in a conductive medium tank and is used to electrically connect with the conductive medium in the conductive medium tank, and the second electrode of the tester is electrically connected to a second conductive element.

[0032] The tester has multiple first electrodes and multiple second electrodes. The number of first electrodes corresponds one-to-one with the number of conductive medium tanks. Each first electrode can be individually associated with one conductive medium tank. The number of second electrodes corresponds one-to-one with the number of second conductive elements. Each second electrode can be individually associated with one second conductive element. During testing, one first electrode, one conductive medium tank, one first conductive element, one second conductive element, and one second electrode can form a test channel. Therefore, the transformer testing device of this application embodiment can include multiple test channels, thereby achieving the ability to test multiple transformers in a single test. Attached Figure Description

[0033] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this application. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0034] Figure 1 This is a schematic diagram of a transformer.

[0035] Figure 2 This is a schematic diagram of the structure of a transformer testing device provided in one embodiment of this application;

[0036] Figure 3 This is a schematic diagram of the structure of a transformer connector provided in one embodiment of the application;

[0037] Figure 4 This is a schematic diagram of the cooperation state of a transformer connector, a transformer, and a conductive medium tank according to an embodiment of this application;

[0038] Figure 5 This is a schematic diagram of the cooperation state of a transformer connector, a transformer, a second conductive component, and a conductive medium tank provided in an embodiment of this application;

[0039] Figure 6 This is a partial cross-sectional view of the first conductive element and the wiring element provided in an embodiment of this application;

[0040] Figure 7 This is a partial cross-sectional view of the second insulating base and the second conductive element provided in an embodiment of this application;

[0041] Figure 8 This is a schematic diagram of the structure of a transformer testing device provided in one embodiment of this application;

[0042] Figure 9 This is a schematic diagram of the structure of a tester provided in one embodiment of this application.

[0043] Explanation of reference numerals in the attached figures:

[0044] 10. Transformer testing device;

[0045] 20. Base; 21. First positioning part;

[0046] 30. Transformer connectors;

[0047] 31. First insulating base; 311. Second positioning part;

[0048] 32. First conductive element; 321. Groove; 3211. Opening; 322. Limiting hole;

[0049] 33. Wiring component; 33a. Limiting connection part; 331. Wiring part;

[0050] 40. Conductive dielectric tank;

[0051] 50. Drive assembly; 51. Guide rail; 52. Slide; 53. Driver;

[0052] 60. Second conductive element; 61. Voltage conductive block; 62. Electrode probe; 621. Main body; 622. Adapter; 623. Elastomer;

[0053] 70. Second insulating base;

[0054] 80. Testing instrument; 81. First electrode; 82. Second electrode; 83. Display;

[0055] 90. Conductive transfer electrode;

[0056] 100. Transformer;

[0057] 110. Iron core;

[0058] 120. Coil; 1201. Tail wire; 121. Conductive wire; 122. Outer insulation layer;

[0059] X, first direction;

[0060] Y, the second direction. Detailed Implementation

[0061] The embodiments of the technical solution of this application will now be described in detail with reference to the accompanying drawings. These embodiments are only used to more clearly illustrate the technical solution of this application and are therefore merely examples, and should not be used to limit the scope of protection of this application.

[0062] It should be noted that, unless otherwise stated, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by those skilled in the art to which the embodiments of this application pertain.

[0063] In the description of the embodiments of this application, the technical terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0064] Furthermore, technical terms such as "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. In the description of the embodiments of this application, "a plurality of" means two or more, unless otherwise explicitly defined.

[0065] In the description of the embodiments of this application, unless otherwise expressly specified and limited, the technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0066] In the description of the embodiments of this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0067] Figure 1 The structure of transformer 100 is shown schematically. See also Figure 1 As shown, transformer 100 can convert input voltage into the required output voltage to meet the power supply needs of different devices. Transformer 100 includes an iron core 110 and a coil 120. The coil 120 includes conductive wires 121 and an outer insulation layer 122. The outer insulation layer 122 covers the conductive wires 121. The coil 120 is wound around the iron core 110. The portion of the coil 120 not wound around the iron core 110 forms a tail wire 1201. The conductive wires 121 are exposed at the end of the tail wire 1201 and are not covered by the outer insulation layer 122. Transformer 100 can be electrically connected to other components through the exposed conductive wires 121 at the tail wire 1201. For example, transformer 100 can be soldered to a printed circuit board (PCB) through the tail wires 1201. Exemplarily, coil 120 may include four tail wires 1201. Transformer 100 can be a toroidal transformer. For example, transformer 100 can be a circular toroidal transformer. The iron core 110 is a toroidal core.

[0068] In related technologies, transformer withstand voltage testing fixtures are used to perform withstand voltage tests on transformers. During testing, multiple transformers are manually fixed to the testing station sequentially. The transformer withstand voltage testing fixture tests multiple transformers simultaneously. Because the fixture tests multiple transformers simultaneously without distinguishing independent judgment channels, if there are unqualified transformers among the multiple transformers tested in the same round, it is impossible to directly screen out the unqualified transformers, requiring repeated sorting or scrapping of the entire board. If repeated sorting is required, each transformer needs to be retested sequentially, resulting in excessive retesting time and low testing efficiency. If the entire board is scrapped, even qualified transformers are scrapped, increasing costs. In addition, when manually installing multiple transformers, the spacing between each transformer is relatively small, and the process of sequentially installing multiple transformers is time-consuming, resulting in low testing efficiency. The positional errors of manually installed multiple transformers mean that there is a possibility of some transformers being missed in the test.

[0069] To alleviate the problems of low efficiency and missed or false positives in transformer testing, multiple transformers can be subjected to individual withstand voltage tests to determine whether there is damage to the coils of each transformer.

[0070] Based on the above considerations, and to alleviate the problems of low efficiency and missed or false positives in transformer testing, the inventors, after in-depth research, designed a transformer testing device. This device can test multiple transformers simultaneously, allowing for independent testing of each transformer, thus improving testing efficiency. Furthermore, when a transformer under test is damaged, it can easily, accurately, and quickly locate and identify the damaged transformer, reducing the possibility of missed or false positives.

[0071] Figure 2 The structure of the transformer testing device 10 is shown schematically. Figure 3 The structure of the transformer connector 30 is shown schematically. Figure 4 The diagram schematically shows the mating arrangement of the transformer connector 30, the transformer 100, and the conductive medium tank 40. See also... Figure 2 , Figure 3 and Figure 4 As shown, this application provides a transformer testing device 10, which includes a base 20, a transformer connector 30, a plurality of conductive medium tanks 40, a drive assembly 50, and a plurality of second conductive elements 60.

[0072] The transformer connector 30 includes a first insulating base 31, a plurality of first conductive elements 32, and connectors 33. The first conductive elements 32 are spaced apart from the first insulating base 31. Each first conductive element 32 is provided with a connector 33. Each connector 33 includes a plurality of wiring portions 331. The first insulating base 31 is detachably connected to a base 20. A conductive medium groove 40 is disposed on the base 20. The conductive medium groove 40 is used to contain conductive medium. A drive assembly 50 is disposed on the base 20. A second conductive element 60 is disposed on the drive assembly 50. Along a first direction X, the second conductive element 60 is disposed one-to-one with the first conductive element 32. The drive assembly 50 is used to drive the second conductive element 60 to move closer to or away from the first conductive element 32, so that the second conductive element 60 and the first conductive element 32 are electrically connected or disconnected.

[0073] In this embodiment, the first insulating base 31 can insulate and isolate the first conductive element 32 and the base 20. The plurality of first conductive elements 32 are independently disposed and are not electrically connected to each other. The plurality of second conductive elements 60 are independently disposed and are not electrically connected to each other. The plurality of conductive medium grooves 40 are independently disposed and are not electrically connected to each other. In some embodiments, the material of the conductive medium groove 40 is an insulating material. For example, the material of the conductive medium groove 40 can be plastic.

[0074] The transformer testing device 10 of this application embodiment can be used by taking a transformer connector 30 and multiple transformers 100 to be tested, and then connecting the tail wire 1201 of the coil 120 to the wiring portion 331 of the connector 33. Exemplarily, the portion of the tail wire 1201 with the outer insulation layer 122 is connected to the wiring portion 331. The exposed conductive wire 121 at the end of the tail wire 1201 can contact the first conductive element 32. One transformer connector 30 can connect multiple transformers 100 simultaneously. One first conductive element 32 can be connected to one transformer 100. Multiple tail wires 1201 of a transformer 100 can be connected to different wiring portions 331 of a connector 33. The number of wiring portions 331 in a connector 33 can be greater than or equal to the number of tail wires 1201 of a transformer 100.

[0075] After the transformer 100 is connected to the transformer connector 30, the transformer connector 30 is installed and fixed on the base 20. Simultaneously, the iron core 110 and part of the coil 120 of one transformer 100 are immersed in the conductive medium contained in a conductive medium tank 40. A tester is provided, and the first electrode of the tester is electrically connected to the conductive medium in each conductive medium tank 40, and the second electrode of the tester is electrically connected to each second conductive element 60. For example, the first electrode can be a negative electrode, and the second electrode can be a positive electrode.

[0076] Figure 5The diagram schematically shows the engagement of the transformer connector 30, the transformer 100, the second conductive element 60, and the conductive medium tank 40. (See also...) Figure 5 As shown, the driving component 50 drives the second conductive element 60 to move closer to the first conductive element 32. When the second conductive element 60 and the first conductive element 32 together clamp the exposed conductive wire 121 at the end of the tail wire 1201, an electrical connection is established between the first conductive element 32, the conductive wire 121, and the second conductive element 60. At this point, the movement of the second conductive element 60 is stopped. The tester is started, and the tester detects the leakage current value. If the outer insulation layer 122 of the coil 120 is damaged, the first and second electrodes of the tester can conduct, allowing the tester to detect the leakage current. If the outer insulation layer 122 of the coil 120 is not damaged, the first and second electrodes of the tester are open-circuited, preventing the tester from detecting the leakage current. Therefore, based on the leakage current value detected by the tester, it can be determined whether the coil 120 is damaged, thus determining whether the transformer 100 meets the withstand voltage test requirements.

[0077] In some feasible methods, during the testing process, the operator can additionally remove the next transformer connector 30 and perform the transformer 100 wiring operation. After the previous transformer connector 30 has completed testing, the drive assembly 50 drives the second conductive element 60 to move, thereby separating the second conductive element 60 from the first conductive element 32. The previous transformer connector 30 and the tested transformer 100 are removed from the base 20, and then the next transformer connector 30 and the transformer 100 to be tested are placed on the base 20 for corresponding testing. Therefore, the alternating use of two transformer connectors 30 improves testing efficiency.

[0078] A single transformer connector 30 can connect multiple transformers 100 at a time. Multiple transformers 100 are immersed in the conductive medium in different conductive medium tanks 40. Therefore, the transformer testing device 10 can individually test multiple transformers 100 in a single test. This improves the efficiency of transformer testing and allows for individual assessment of each transformer 100 for damage. Furthermore, when any one or more transformers 100 are damaged, the device can easily and quickly locate and identify the damaged transformer without requiring secondary inspections of each transformer 100. This improves testing efficiency and reduces the possibility of missed or incorrect assessments.

[0079] In the transformer testing apparatus 10 of this application embodiment, multiple first conductive elements 32 in the transformer connector 30 are respectively provided with connectors 33. Each first conductive element 32 can be connected to a transformer 100 to be tested through a connector 33. The tail wire 1201 of the transformer 100 can be connected and fixed to the connector 331. The iron core 110 and part of the coil 120 of the transformer 100 can be immersed in the conductive medium contained in the conductive medium tank 40. During testing, multiple second conductive elements 60 can be driven by the drive assembly 50 to clamp the exposed conductive wire 121 on the tail wire 1201 with the corresponding first conductive element 32, so that the corresponding transformer 100, the first conductive element 32 and the second conductive element 60 are electrically connected to each other. Then, each transformer 100 can be subjected to an independent withstand voltage test to determine whether the coil 120 of each transformer 100 is damaged. The transformer testing device 10 of this application embodiment can test multiple transformers 100 at once, and can also perform independent testing on each transformer 100, thereby improving the efficiency of the testing work. Furthermore, when the transformer 100 to be tested is damaged, the damaged transformer 100 can be easily, accurately and quickly located and identified, which helps to reduce the possibility of missed detection or false detection.

[0080] In some feasible ways, Figure 6 A partial cross-sectional view of the first conductive element 32 and the wiring element 33 is schematically shown. See also Figure 3 , Figure 4 and Figure 6 As shown, the first conductive element 32 includes a groove 321. At least a portion of the connector 33 is disposed within the groove 321. The way the connector 33 is disposed within the groove 321 allows the first conductive element 32 to protect the connector 33, reducing the possibility of structural damage to the connector 33 due to scratches or impacts from external structural components. The connector portion 331 of the connector 33 can be located within the groove 321. After the tail wire 1201 of the coil 120 is connected to the connector portion 331 of the connector 33, the first conductive element 32 can protect both the connector portion 331 and the tail wire 1201, which helps reduce the possibility of the connector portion 331 and the tail wire 1201 separating and losing their connection due to scratches.

[0081] The drive assembly 50 is used to drive the second conductive element 60 to insert into or retract from the groove 321. When testing is required, the second conductive element 60 inserts into the groove 321. The second conductive element 60 and the bottom wall of the groove 321 clamp the exposed conductive wire 121 on the tail wire 1201. After the test is completed, the second conductive element 60 retracts from the groove 321 to release the conductive wire 121.

[0082] See in some examples Figure 4 and Figure 6 As shown, along the second direction Y, the groove 321 passes through the first conductive member 32. The connector 33 is located within the groove 321. Along the first direction X, the groove 321 has an opening 3211 facing the second conductive member 60. There is a gap between the connector 33 and the opening 3211. Along the first direction X, the connector 33 does not extend beyond the opening 3211 of the groove 321. There is a gap between the connector 33 and the bottom wall of the groove 321. The connector 33 does not contact the bottom wall of the groove 321. The first direction X is perpendicular to the second direction Y.

[0083] When the connector 33's connector portion 331 is connected to the tail wire 1201 of the coil 120, the tail wire 1201 can be connected to the connector portion 331 along the depth direction of the groove 321. The depth direction of the groove 321 is the same as the first direction X. The way in which the connector 33 is entirely disposed within the groove 321 can further ensure that the first conductive element 32 provides effective protection for the connector 33.

[0084] When the second conductive element 60 is connected to the first conductive element 32, the second conductive element 60 will not come into contact with the connector 33, reducing the possibility that the connector 33 will be deformed due to the pressure of the second conductive element 60 caused by the positional interference between the second conductive element 60 and the connector 33.

[0085] In some examples, the first direction X can be vertical, and the second direction Y can be horizontal.

[0086] In some examples, the connector 33 is an elastic element. The assembly process of the connector 33 and the first conductive element 32 can involve compressing the connector 33 to reduce its size, thus facilitating its insertion into the groove 321 of the first conductive element 32. Under its own elastic restoring force, the connector 33 can abut against the first conductive element 32, improving the connection stability between the connector 33 and the first conductive element 32, reducing the possibility of a loose connection between them, and also reducing the possibility of the connector 33 detaching from the first conductive element 32.

[0087] For example, see Figure 6 As shown, limiting holes 322 are respectively provided on the two side walls of the groove 321. The connector 33 includes a limiting connection part 33a. The limiting connection part 33a is located inside the limiting hole 322. The first conductive member 32 can form a limiting constraint on the connector 33, further reducing the possibility of the connector 33 coming off the first conductive member 32.

[0088] In some examples, the first conductive element 32 includes a mounting hole. The mounting hole communicates with a limiting hole 322. The mounting hole and the limiting hole 322 are coaxially arranged. The connector 33 is inserted into the first conductive element 32 through the mounting hole. After the connector 33 is in place, it is connected to the mounting hole using a fastener. The fastener presses against the connector 33. Exemplarily, the mounting hole can be a threaded hole. The fastener is a screw.

[0089] See in some examples Figure 6 As shown, the connector 33 is a helical spring. A connection portion 331 is formed between two adjacent helical segments in the helical spring's structure. The tail wire 1201 of the coil 120 can be snapped between the two helical segments to secure the tail wire 1201. The connection between the tail wire 1201 and the connector 33 is simple and easy to operate. Simultaneously, the compression of the tail wire 1201 by the two helical segments improves the stability and reliability of the connection between the tail wire 1201 and the connector 33, making it less likely for the tail wire 1201 to separate from or fall off the helical spring.

[0090] For example, the axial direction of the helical spring is perpendicular to the first direction X, and the axial direction of the helical spring is perpendicular to the second direction Y. Limiting connection portions 33a are formed at both ends of the helical spring along its axial direction. Limiting holes 322 are respectively provided on the two side walls of the groove 321 along its axial direction.

[0091] In some examples, the first conductive element 32 may be a one-piece conductive block. The material of the first conductive element 32 may include, but is not limited to, copper or copper alloy. The material of the first insulating base 31 may include, but is not limited to, plastic. Exemplarily, the first conductive element 32 may be bonded to the first insulating base 31 or connected to the first insulating base 31 using fasteners such as screws.

[0092] See in some examples Figure 2 and Figure 3 As shown, the base 20 includes a first positioning part 21. The first insulating seat 31 includes a second positioning part 311. The first insulating seat 31 and the base 20 are positioned relative to each other by the first positioning part 21 and the second positioning part 311. When the transformer connector 30 is assembled with the base 20, the transformer connector 30 can be positioned relative to the first positioning part 21 of the base 20 by the second positioning part 311 on the first insulating seat 31, thereby facilitating the quick and accurate installation of the transformer connector 30 into the predetermined position on the base 20, which is beneficial to improving the efficiency of the testing work and the accuracy of the installation position of the transformer connector 30. The first insulating seat 31 and the base 20 form a mutual limiting constraint through the first positioning part 21 and the second positioning part 311, reducing the possibility of the position of the first insulating seat 31 shifting relative to the base 20.

[0093] For example, one of the first positioning part 21 and the second positioning part 311 is a positioning post, and the other is a positioning hole. The first positioning part 21 and the second positioning part 311 each have relatively simple structures, which helps to reduce the difficulty of processing.

[0094] For example, the first positioning part 21 is a positioning post. The second positioning part 311 is a positioning hole. The base 20 includes two or more first positioning parts 21. The first insulating base 31 includes two or more second positioning parts 311. The first positioning parts 21 and the second positioning parts 311 are arranged in a one-to-one correspondence.

[0095] In some examples, Figure 7 A partial cross-sectional view of the second insulating base 70 and the second conductive element 60 is schematically shown. See also Figure 2 and Figure 7 As shown, the transformer testing device 10 also includes a second insulating base 70. A plurality of second conductive elements 60 are spaced apart on the second insulating base 70. The second insulating base 70 is disposed on the drive assembly 50. The second insulating base 70 can insulate and isolate the second conductive elements 60 from the drive assembly 50. The second insulating base 70 can support the second conductive elements 60 and provide a mounting base for the second conductive elements 60. The method of connecting the plurality of second conductive elements 60 to the drive assembly 50 through the second insulating base 70 helps to reduce the difficulty of connecting the plurality of second conductive elements 60 to the drive assembly 50.

[0096] For example, the material of the second insulating base 70 includes, but is not limited to, plastic.

[0097] See in some examples Figure 2 and Figure 7 As shown, the second conductive element 60 includes a voltage-conducting block 61 and an electrode probe 62. The electrode probe 62 includes a main body 621 and a connecting part 622. The main body 621 is connected to the second insulating base 70. The connecting part 622 is disposed facing the first conductive element 32. The voltage-conducting block 61 is electrically connected to the connecting part 622. The driving assembly 50 is used to drive the second conductive element 60 to move closer to or away from the first conductive element 32, so that the voltage-conducting block 61 and the first conductive element 32 are electrically connected or disconnected.

[0098] The voltage-conducting block 61 has a relatively large area, so after the voltage-conducting block 61 is connected to the first conductive element 32, the contact area between the voltage-conducting block 61 and the first conductive element 32 is relatively large. This helps to ensure that the second conductive element 60 and the first conductive element 32 accurately clamp all the exposed conductive wires 121 on the tail wire 1201, reducing the possibility that the second conductive element 60 may fail to press down all the exposed conductive wires 121 on the tail wire 1201, resulting in incorrect test results.

[0099] The main body 621 of the electrode probe 62 can be used for electrical connection with the second electrode 82 of the tester 80. Exemplarily, a portion of the main body 621 extends through the second insulating base 70 along the first direction X. The portion of the main body 621 extending out of the second insulating base 70 can be used for electrical connection with the second electrode 82 of the tester 80.

[0100] For example, the material of the voltage-conducting block 61 may include, but is not limited to, copper or copper alloy.

[0101] See also some of the possible implementation methods. Figure 7 As shown, the adapter 622 is slidably connected to the main body 621. The electrode probe 62 also includes an elastic body 623. The adapter 622 and the main body 621 are respectively connected to the elastic body 623. When the adapter 622 slides relative to the main body 621, the elastic body 623 accumulates or releases elastic potential energy. Along the first direction X, there is a gap between the voltage-conducting block 61 and the second insulating seat 70.

[0102] When the voltage-conducting block 61 comes into contact with the first conductive element 32, the voltage-conducting block 61 can push the transition part 622 to move relative to the main body part 621. The transition part 622 causes the elastic body 623 to deform, so that the elastic body 623 accumulates elastic potential energy. Thus, when the voltage-conducting block 61 comes into contact with the first conductive element 32, the electrode probe 62 can buffer and absorb the impact energy between the voltage-conducting block 61 and the first conductive element 32, reducing the possibility of structural damage to the electrode probe 62, the voltage-conducting block 61, or the first conductive element 32 due to the rigid connection between the voltage-conducting block 61 and the first conductive element 32.

[0103] For example, when the voltage-conducting block 61 is connected to the first conductive element 32, the transition portion 622 slides relative to the main body portion 621, and the transition portion 622 can compress the elastic body 623 to accumulate elastic potential energy. When the voltage-conducting block 61 is separated from the first conductive element 32, the transition portion 622 can release the elastic potential energy, and the elastic element pushes the transition portion 622 to slide relative to the main body portion 621.

[0104] The distance between the voltage-conducting block 61 and the second insulating seat 70 is greater than the maximum travel of the voltage-conducting block 61. When the voltage-conducting block 61 comes into contact with the first conductive element 32, the voltage-conducting block 61 moves closer to the second insulating seat 70, but the voltage-conducting block 61 does not come into contact with the second insulating seat 70.

[0105] In some examples, the main body 621 includes a cylindrical portion. An elastomer 623 is disposed within the cylindrical portion. A portion of the adapter 622 is located within the cylindrical portion and is slidably connected to the main body 621.

[0106] In some examples, the elastomer 623 can be a spring.

[0107] In some feasible ways, Figure 8 The structure of the transformer testing apparatus 10 is shown schematically. See also... Figure 2 and Figure 8 As shown, the drive assembly 50 includes a guide rail 51, a slide 52, and a driver 53. The guide rail 51 extends along a first direction X. The slide 52 is slidably connected to the guide rail 51. The driver 53 is connected to the guide rail 51. The slide 52 is connected to the driver 53. A second conductive element 60 is connected to the slide 52. The driver 53 drives the slide 52 and the second conductive element 60 to move closer to or away from the first conductive element 32.

[0108] The guide rail 51 can limit and constrain the slide 52, so that the slide 52 moves with high accuracy and the movement process is stable. This ensures that the second conductive component 60 connected to the slide 52 moves with high accuracy and the movement process is stable, which is conducive to ensuring that the second conductive component 60 and the first conductive component 32 are accurately connected.

[0109] In some examples, the transformer testing apparatus 10 also includes a second insulating base 70. A plurality of second conductive elements 60 are spaced apart from each other on the second insulating base 70. The second conductive elements 60 are connected to the slide 52 via the second insulating base 70.

[0110] In some examples, the driver 53 may include a motor and a lead screw. The lead screw is connected to the output shaft of the motor. The slide 52 is threadedly connected to the lead screw.

[0111] In some feasible implementations, a transformer connector 30 is provided on one side of the conductive medium groove 40 along the second direction Y. Along the second direction Y, one conductive medium groove 40 can correspond to one first conductive element 32. Each tail wire 1201 in a transformer 100 to be tested can be connected in the same direction to a connector 33 on one side. By centrally connecting all tail wires 1201 of a transformer 100 to a connector 33, the number of components used to fix the tail wires 1201 can be reduced.

[0112] In some examples, the drive assembly 50 includes a guide rail 51. A conductive dielectric groove 40 is disposed between the transformer connector 30 and the guide rail 51 along the second direction Y.

[0113] See also some of the possible implementation methods. Figure 8 As shown, the transformer testing device 10 also includes a tester 80. The first electrode 81 of the tester 80 is disposed in the conductive medium tank 40, and the first electrode 81 is used for electrical connection with the conductive medium within the conductive medium tank 40. The second electrode 82 of the tester 80 is electrically connected to the second conductive element 60.

[0114] The tester 80 has multiple first electrodes 81 and multiple second electrodes 82. The number of first electrodes 81 corresponds one-to-one with the number of conductive medium tanks 40. Each first electrode 81 can be individually associated with one conductive medium tank 40. The number of second electrodes 82 corresponds one-to-one with the number of second conductive elements 60. Each second electrode 82 can be individually associated with one second conductive element 60. During testing, one first electrode 81, one conductive medium tank 40, one first conductive element 32, one second conductive element 60, and one second electrode 82 can form a test channel. Therefore, the transformer testing device 10 of this embodiment can include multiple test channels, thereby enabling the testing of multiple transformers 100 in a single test.

[0115] See in some examples Figure 5 and Figure 8 As shown, the transformer testing apparatus 10 also includes a conductive transfer electrode 90. The conductive transfer electrode 90 is disposed in the conductive medium tank 40. At least a portion of the conductive transfer electrode 90 is located within the conductive medium tank 40 for electrical connection with the conductive medium. The first electrode 81 can be electrically connected to the conductive transfer electrode 90 via a wire. Exemplarily, the material of the conductive transfer electrode 90 may include, but is not limited to, copper or a copper alloy.

[0116] In some examples, the second conductive element 60 includes an electrode probe 62. The second electrode 82 is electrically connected to the electrode probe 62 via a wire.

[0117] In some examples, Figure 9 The structure of the tester 80 is shown schematically. See also Figure 9 As shown, the tester 80 has a display 83. The display 83 can show the test results of each test channel, making it easy for operators to determine whether each transformer 100 to be tested has passed the test based on the displayed results. If there is a transformer 100 that fails the test, the results displayed on the display 83 can be used to quickly and accurately locate the transformer 100, thereby improving the efficiency of the testing work.

[0118] In some implementations, the base 20 is equipped with corresponding buttons. In some examples, the base 20 may have two start buttons, a pause button, a reset button, and an emergency stop button. The drive assembly 50 can only start working when both start buttons are pressed simultaneously. Pressing the pause button will pause the transformer testing device 10 during testing. Pressing the reset button will reset the entire transformer testing device 10. Pressing the emergency stop button will immediately stop the entire transformer testing device 10 from testing.

[0119] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application, and they should all be covered within the scope of the claims and specification of this application. In particular, as long as there is no structural conflict, the various technical features mentioned in the embodiments can be combined in any way. This application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A transformer testing device, characterized in that, include: Base; A transformer connector includes a first insulating base, a plurality of first conductive elements and a wiring component. The first conductive elements are spaced apart on the first insulating base, and each first conductive element is provided with a wiring component. The wiring component includes a plurality of wiring portions, and the first insulating base is detachably connected to the base. Multiple conductive medium grooves are disposed on the base, and the conductive medium grooves are used to contain conductive medium; The driving component is disposed on the base; A plurality of second conductive elements are disposed on the driving assembly along a first direction, with each second conductive element corresponding to a first conductive element. The driving assembly is used to drive the second conductive elements to move closer to or away from the first conductive elements.

2. The transformer testing device according to claim 1, characterized in that, The first conductive element includes a groove, at least a portion of the connector is disposed within the groove, and the driving assembly is used to drive the second conductive element to insert into or retract from the groove.

3. The transformer testing device according to claim 2, characterized in that, The connector is a flexible component.

4. The transformer testing device according to claim 3, characterized in that, Limiting holes are provided on the two side walls of the groove, and the connector includes a limiting connection part, which is located inside the limiting hole.

5. The transformer testing device according to claim 3, characterized in that, The connector is a helical spring.

6. The transformer testing device according to claim 2, characterized in that, Along the second direction, the groove passes through the first conductive element, the connector is located in the groove, and along the first direction, the groove has an opening facing the second conductive element. There is a gap between the connector and the opening, and a gap between the connector and the bottom wall of the groove. The first direction is perpendicular to the second direction.

7. The transformer testing device according to claim 1, characterized in that, The base includes a first positioning part, and the first insulating seat includes a second positioning part. The first insulating seat and the base are positioned relative to each other through the first positioning part and the second positioning part.

8. The transformer testing apparatus according to claim 7, characterized in that, One of the first positioning part and the second positioning part is a positioning post, and the other is a positioning hole.

9. The transformer testing apparatus according to any one of claims 1 to 8, characterized in that, The transformer testing device further includes a second insulating base, with a plurality of second conductive elements spaced apart on the second insulating base, and the second insulating base is disposed on the drive assembly.

10. The transformer testing device according to claim 9, characterized in that, The second conductive element includes a voltage-conducting block and an electrode probe. The electrode probe includes a main body and a connecting part. The main body is connected to the second insulating base. The connecting part is disposed facing the first conductive element. The voltage-conducting block is electrically connected to the connecting part. The driving assembly is used to drive the second conductive element to move closer to or away from the first conductive element so that the voltage-conducting block and the first conductive element are electrically connected or separated.

11. The transformer testing apparatus according to claim 10, characterized in that, The adapter is slidably connected to the main body. The electrode probe also includes an elastomer. The adapter and the main body are respectively connected to the elastomer. When the adapter slides relative to the main body, the elastomer accumulates or releases elastic potential energy. Along the first direction, there is a gap between the voltage-conducting block and the second insulating seat.

12. The transformer testing apparatus according to any one of claims 1 to 8, characterized in that, The drive assembly includes a guide rail, a slide, and a driver. The guide rail extends along the first direction, the slide is slidably connected to the guide rail, the driver is connected to the guide rail, the slide is connected to the driver, and the second conductive element is connected to the slide.

13. The transformer testing apparatus according to any one of claims 1 to 8, characterized in that, The transformer connector is provided on one side of the conductive medium tank.

14. The transformer testing apparatus according to any one of claims 1 to 8, characterized in that, The transformer testing device further includes a tester, the first electrode of which is disposed in the conductive medium tank and is used to electrically connect with the conductive medium in the conductive medium tank, and the second electrode of which is electrically connected with the second conductive element.

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