Test equipment for vehicle gauge level AI chip

Abstract

The utility model relates to a testing device for a vehicle gauge level AI chip, which belongs to the technical field of integrated circuit chip testing and comprises a rack bottom plate, a detection assembly is arranged at the upper end of the rack bottom plate, and a detection transplanting platform is arranged between the detection assembly and the rack bottom plate. The detection assembly comprises a detection support, a detection camera is arranged on the upper portion of the detection support, a camera lens is arranged at the lower end of the detection camera, and strip-shaped light sources fixedly connected with the detection support are arranged on the two sides of the middle of the detection support. Through driving of the motor, actions such as unstacking, carrying and up-and-down movement are carried out, so that the running speed of equipment is controllable and smoother, chips are effectively prevented from being violently vibrated, the operation stability is improved, and the probability of material damage is reduced. The automatic detection function is achieved, and the materials are prevented from being vibrated out in the transportation process.

Description

TECHNICAL FIELD

[0001] The utility model relates to integrated circuit chip test technical field, concretely relates to a test equipment for car gauge level AI chip. BACKGROUND

[0002] Chip tray, also known as IC tray, is a packaging tray used for chip (IC) packaging and testing in semiconductor packaging enterprises. This tray is mainly used in the production and testing process of electronic products to ensure the safe transportation and protection of chips. Chip trays are usually made of plastic, which can effectively prevent static touch and protect chips from damage, and facilitate automated detection and installation. In addition, the chip tray also has the functions of anti-static and high-temperature resistance, which can maintain stability in high-temperature environment and protect the chip from damage.

[0003] Chinese patent "A conveying device for chip tray detection", application number 2024119863656, discloses a conveying device for chip tray detection, comprising a conveying mechanism and a transfer mechanism; the conveying mechanism comprises a support and a conveying part; the conveying part comprises two synchronous belts; the transfer mechanism comprises a supporting vertical plate, a detection table and a first transfer part; the supporting vertical plate is fixed on one side of the support, and a sliding rail is horizontally arranged on the supporting vertical plate; the detection table is fixed on the support; the first transfer part comprises a first connecting rod, a second connecting rod, a first supporting seat, a first air cylinder, a first vacuum chuck and a first motor; one end of the first connecting rod is rotatably arranged on the side of the supporting vertical plate facing the support; a first long groove is arranged on the first connecting rod along its length direction; the second connecting rod is slidably arranged on the sliding rail, and the upper end of the second connecting rod is slidably arranged in the first long groove; the first air cylinder is arranged on the first supporting seat; a limiting plate is also vertically fixed on the support.

[0004] Chinese patent "Tray feeding and discharging system", application number 2024113800117, discloses a tray feeding and discharging system, comprising a feeding unit and a discharging unit; the feeding unit comprises a first material transfer car module, a first feeding and discharging module, and a first connection module; the first material transfer car module is used to move the material car from the system feeding position to the feeding grabbing position and the transition position in sequence; the first feeding and discharging module is used to grab and transfer the tray stack combination on the material car to the connection position of the first connection module at the feeding grabbing position; the discharging unit comprises a second material transfer car module, a second feeding and discharging module, and a second connection module; the second material transfer car module is used to move the material car from the transition position to the discharging placement position and the system discharging position in sequence; the second feeding and discharging module is used to transfer the tray stack combination on the connection position of the second connection module to the discharging placement position and place the tray stack combination on the material car; the feeding and discharging process is realized by the material car.

[0005] The existing belt feeding structure is not suitable for the detection of the current chip tray group, the linear mode single detection efficiency is slow, and the chip will be moved to cause secondary damage; and the chip is shaken out of the tray, resulting in a decrease in the good product quantity of the chip production. Utility model content

[0006] The utility model mainly solves the shortage in prior art, provides a kind of test equipment for car gauge level AI chip, it is driven by motor, and carries out unstacking, handling, up and down etc. Action, make the equipment running speed controllable more smooth, effectively avoid that chip is subjected to violent vibration, improve the stability of operation, reduce the probability of material damage. Realize automatic detection function, so that material avoids material shakeout in the transportation process.

[0007] The above technical problems of the utility model are mainly solved by the following technical solutions:

[0008] A kind of test equipment for car gauge level AI chip, including rack bottom plate, the rack bottom plate upper end is equipped with detection assembly, detection assembly and rack bottom plate between are equipped with detection transplanting platform. The detection assembly includes detection support, the detection support upper part is equipped with detection camera, the detection camera lower end is equipped with camera lens, the detection support middle part both sides are equipped with the strip light source fixedly connected with detection support.

[0009] As preferred, the detection transplanting platform includes Y-axis linear module, the Y-axis linear module upper end is equipped with gripper platform, the gripper platform front and rear ends are equipped with photoelectric sensor I.

[0010] As preferred, the detection transplanting platform side is equipped with stock bin assembly, the detection assembly front end is equipped with the unstacking assembly of the chip of stock bin assembly unstacking transfer to detection transplanting platform.

[0011] As preferred, the unstacking assembly includes unstacking frame, the unstacking frame upper end is equipped with X-axis linear module, the X-axis linear module side is equipped with Z-axis linear module, the Z-axis linear module lower end is equipped with unstacking gripper.

[0012] As preferred, the Y-axis linear module side, X-axis linear module upper end, Z-axis linear module side are equipped with respectively with the road connection of Y-axis linear module, X-axis linear module, Z-axis linear module Drag Chain.

[0013] As preferred, the bin assembly comprises a bin fixed frame, the bin fixed frame is internally provided with a movable bin in slidingly sleeved connection with the bin fixed frame, the movable bin is internally provided with photoelectric sensors II at upper and lower portions, the bin fixed frame is provided with a cylinder air cylinder extending to the movable bin at a lower end, and the cylinder air cylinder is provided with linear guides fixed with the bin fixed frame and in slidingly inserted connection with the movable bin.

[0014] As preferred, the detection assembly is provided at a rear end with a chip tray, and the chip tray is provided at a lower end with a stacking seat between the chip tray and a rack bottom plate.

[0015] The utility model discloses can reach following effect:

[0016] The utility model provides a kind of test equipment for car gauge level AI chip, compared with prior art, by the drive of motor, carry out unstacking, transport, up and down etc.

[0017] Realize chip packaging automation, ensure that the information of each IC is traceable, guarantee material unique accurate, need to detect each IC before packaging and delivery to carry out information check, detection is one indispensable function, complete and realize the check of chip information. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 It is the structural schematic diagram of the utility model.

[0019] Figure 2 It is the structural schematic diagram of detection transplanting platform in the utility model.

[0020] Figure 3 It is the structural schematic diagram of detection assembly in the utility model.

[0021] Figure 4 It is the structural schematic diagram of bin assembly in the utility model.

[0022] Figure 5 It is the structural schematic diagram of unstacking assembly in the utility model.

[0023] In the diagram: 1. Destacking assembly; 2. Detection assembly; 3. Chip tray; 4. Palletizing base; 5. Frame base plate; 6. Hopper assembly; 7. Detection and transfer platform; 8. Gripper platform; 9. Photoelectric sensor I; 10. Y-axis linear module; 11. Cable chain; 12. Detection bracket; 13. Detection camera; 14. Camera lens; 15. Strip light source; 16. Movable hopper; 17. Photoelectric sensor II; 18. Cylindrical cylinder; 19. Linear guide rail; 20. Hopper fixing frame; 21. Destacking frame; 22. X-axis linear module; 23. Z-axis linear module; 24. Destacking gripper. Detailed Implementation

[0024] The technical solution of this utility model will be further described in detail below through embodiments and in conjunction with the accompanying drawings.

[0025] Example: Figures 1-5 As shown, a testing device for automotive-grade AI chips includes a rack base plate 5. A testing component 2 is mounted on the upper end of the rack base plate 5. The testing component 2 includes a testing bracket 12, a testing camera 13 mounted on the upper part of the testing bracket 12, and a camera lens 14 mounted on the lower end of the testing camera 13. Strip light sources 15, fixedly connected to the testing bracket 12, are located on both sides of the middle of the testing bracket 12. A chip tray 3 is located at the rear end of the testing component 2, and a stacking seat 4 is located between the lower end of the chip tray 3 and the rack base plate 5. A testing transfer platform 7 is located between the testing component 2 and the rack base plate 5. The testing transfer platform 7 includes a Y-axis linear module 10, a gripper platform 8 mounted on the upper end of the Y-axis linear module 10, and photoelectric sensors Ⅰ9 mounted at both the front and rear ends of the gripper platform 8.

[0026] The detection and transplanting platform 7 has a hopper assembly 6 on its side. The hopper assembly 6 includes a hopper fixing frame 20. Inside the hopper fixing frame 20, there is a movable hopper 16 that is slidably connected to the hopper fixing frame 20. The upper and lower parts of the movable hopper 16 are equipped with photoelectric sensors II 17. The lower end of the hopper fixing frame 20 is equipped with a cylindrical cylinder 18 that extends to the movable hopper 16. The side of the cylindrical cylinder 18 is equipped with a linear guide rail 19 that is fixed to the hopper fixing frame 20 and slidably inserted into the movable hopper 16. The front end of the detection assembly 2 is equipped with a destacking assembly 1 that transfers the chips from the hopper assembly 6 to the detection and transplanting platform 7. The destacking assembly 1 includes a destacking frame 21. The upper end of the destacking frame 21 is equipped with an X-axis linear module 22. The side of the X-axis linear module 22 is equipped with a Z-axis linear module 23. The lower end of the Z-axis linear module 23 is equipped with a destacking gripper 24. The Y-axis linear module 10, the upper end of the X-axis linear module 22, and the Z-axis linear module 23 are each provided with a drag chain 11 that is connected to the Y-axis linear module 10, the X-axis linear module 22, and the Z-axis linear module 23 respectively via a road.

[0027] In summary, the test equipment for the vehicle-level AI chip, through the driving of the motor, carries out the unstacking, the carrying, the up and down and other actions, makes the equipment running speed controllable more smooth, effectively avoids that the chip receives the violent vibration, improves the stability of the operation, reduces the probability of the material damage.

[0028] It is obvious for those skilled in the art that the present application is not limited to the details of the above-described exemplary embodiments, but can be implemented in other concrete forms without departing from the basic characteristics of the present application. Therefore, the embodiments should be regarded as exemplary and non-limiting, and the scope of the present application is defined by the appended claims rather than the above description, and all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application. Any reference signs in the claims should not be regarded as limiting the claims involved.

[0029] In summary, the above only describes specific embodiments of the present application, but the structural characteristics of the present application are not limited to this, and any changes or modifications made by those skilled in the art within the scope of the present application are covered by the patent scope of the present application.

Claims

1. A test apparatus for a car-grade AI chip, characterized by: Including rack bottom plate (5), the upper end of rack bottom plate (5) is equipped with detection assembly (2), and the detection assembly (2) is equipped with detection transplanting platform (7) with rack bottom plate (5) between.The detection assembly (2) includes detection support (12), the upper part of detection support (12) is equipped with detection camera (13), the lower end of detection camera (13) is equipped with camera lens (14), and the middle part of detection support (12) is equipped with strip light source (15) fixedly connected with detection support (12) on both sides.

2. The test device for car-grade Al chip according to claim 1, wherein: The detection transplanting platform (7) includes Y-axis linear module (10), and the upper end of Y-axis linear module (10) is equipped with gripper platform (8), and the front and rear ends of gripper platform (8) are equipped with photoelectric sensor I (9).

3. The testing device for car-grade Al chips according to claim 2, wherein: The detection transplanting platform (7) side is equipped with stock bin assembly (6), and the front end of detection assembly (2) is equipped with unstacking assembly (1) for unstacking and transferring the chips of stock bin assembly (6) to detection transplanting platform (7).

4. The testing device for car-grade Al chips according to claim 3, wherein: The unstacking assembly (1) includes unstacking frame (21), and the upper end of unstacking frame (21) is equipped with X-axis linear module (22), and the side of X-axis linear module (22) is equipped with Z-axis linear module (23), and the lower end of Z-axis linear module (23) is equipped with unstacking gripper (24).

5. The testing device for car-grade AI chips of claim 4, wherein: The side of Y-axis linear module (10), the upper end of X-axis linear module (22) and the side of Z-axis linear module (23) are all equipped with drag chain (11) respectively communicated with Y-axis linear module (10), X-axis linear module (22) and Z-axis linear module (23).

6. The testing device for car-grade Al chips of claim 3, wherein: The stock bin assembly (6) includes stock bin fixed frame (20), and the inside of stock bin fixed frame (20) is equipped with movable stock bin (16) slidably connected with stock bin fixed frame (20), the upper and lower parts of movable stock bin (16) are both equipped with photoelectric sensor II (17), the lower end of stock bin fixed frame (20) is equipped with cylinder pneumatic cylinder (18) extending to movable stock bin (16), and the side of cylinder pneumatic cylinder (18) is equipped with linear guide rail (19) fixed with stock bin fixed frame (20) and slidably inserted with movable stock bin (16).

7. The testing device for car-grade AI chips of claim 1, wherein: The rear end of detection assembly (2) is equipped with chip tray (3), and the lower end of chip tray (3) is equipped with stacking seat (4) with rack bottom plate (5) between.

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