Electric field measuring device based on polymorphic Rydberg atoms
By using a multi-state Rydberg atom probe combined with an internal plate electrode for electric field measurement, the problem of insufficient resolution and accuracy in high-frequency electric field measurement in existing technologies has been solved, and wide dynamic range and ultra-high resolution electric field measurement have been achieved.
Patent Information
- Application Number
- CN202520860813.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-01
- Publication Date
- 2026-02-27
- Estimated Expiration
- 2035-05-01
AI Technical Summary
Existing electric field measurement devices lack sufficient resolution and accuracy when measuring at high frequencies, making it difficult to meet the requirements for precise measurement under strong electric fields.
An electric field measurement device based on multistate Rydberg atoms is used. By combining high and low principal quantum number atomic probes with internal plate electrodes, electric field measurement is performed using EIT transmission spectroscopy to achieve high resolution and broadband measurement.
It achieves electric field measurement in the range of 1μV/cm to 10 kV/cm, with a weak field resolution of 0.1μV/cm and a strong field resolution of 1V/cm, with an error of <1%, and features a wide dynamic range and ultra-high resolution.
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Figure CN223955696U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical field of electric field measurement, specifically relates to a kind of electric field measurement device based on polymorphic Rydberg atom. BACKGROUND
[0002] The existing device for electric field measurement mainly includes inductive charge type and electro-optical type, the inductive charge type measurement device indirectly measures electric field intensity by the induced charge generated by metal electrode in alternating electric field, which has simple structure and low cost, but the measurement resolution is low, usually more than 10 V / m, and is limited by the bandwidth of induction circuit, only applicable to power frequency and low frequency electric field, and cannot meet the measurement needs of high frequency or ultrahigh frequency electric field such as microwave and terahertz band. The electro-optical type measurement device is based on the Pockels effect of lithium niobate crystal under the action of electric field, and the electric field intensity is inversely calculated by optical signal modulation, which has small volume and non-invasive measurement, i.e. without interference to the measured field. However, due to the limitation of electro-optical modulation technology, the highest measurement frequency is usually not more than 10 GHz, which is difficult to cover higher frequency bands such as millimeter wave and terahertz. At the same time, the measurement accuracy is insufficient, i.e. the error is more than 1%, and the resolution is limited, i.e. the typical value is more than 10 V / m, which cannot meet the accurate measurement needs in strong electric field. SUMMARY
[0003] In order to overcome the shortcomings of the prior art, the utility model provides a kind of electric field measurement method and device based on polymorphic Rydberg atom, to solve the problems of insufficient strong field measurement accuracy and electric field resolution in the prior art, and difficult to further improve the measurement bandwidth.
[0004] The technical scheme provided by the utility model is as follows:
[0005] An electric field measurement device based on polymorphic Rydberg atom, comprising a sensing unit, a measurement unit and an upper computer control unit, the sensing unit comprises at least two sensing light paths with different principal quantum numbers, each sensing light path comprises an atomic probe, a probe light source device connected to the first input end of the atomic probe through an optical fiber, a coupling light source device connected to the second input end of the atomic probe through an optical fiber, and a photodetector connected to the output end of the atomic probe through an optical fiber. The probe light output by the probe light source device and the coupling light output by the coupling light source are incident to the atomic probe in opposite directions. The atoms in the atomic probe are excited from the ground state to the Rydberg state. After the initial EIT transmission peak appears on the transmission spectrum of the probe light, the photodetector converts the spectral signal into an electrical signal and outputs it to the measurement unit.
[0006] The measurement unit is in communication connection with the sensing unit, and is used for outputting control signal to the atomic probe, controlling the electric field generated by the inner flat plate electrode and gradually increasing the electric field strength, and outputting EIT transmission spectrum data under different electric field strengths to the upper computer control unit.
[0007] The host computer control unit is in communication connection with the measurement unit, and is used for identifying the EIT transmission spectrum data and outputting the electric field intensity result.
[0008] Further, the atomic probe includes a high principal quantum number atomic probe and a low principal quantum number atomic probe, and the photodetector includes a first photodetector and a second photodetector.
[0009] The detection light source device includes a detection light source, a half-wave plate I connected with an output end of the detection light source, a dichroic mirror I connected with an output end of the half-wave plate, a polarization beam splitter connected with an output end of the dichroic mirror, a half-wave plate II connected with an output end of the polarization beam splitter, and a dichroic mirror II connected with an output end of the half-wave plate II, wherein an output end of the dichroic mirror II is connected with the low principal quantum number atomic probe or the high principal quantum number atomic probe.
[0010] The coupling light source device includes a coupling light source, a half-wave plate III connected with an output end of the coupling light source, and a dichroic mirror III connected with an output end of the half-wave plate III, wherein an output end of the dichroic mirror III is connected with the low principal quantum number atomic probe or the high principal quantum number atomic probe.
[0011] Further, the detection light source device, the high principal quantum number atomic probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the high principal quantum number atomic probe, and the first photodetector constitute a high principal quantum number sensing optical path.
[0012] The detection light source device, the high principal quantum number atomic probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the high principal quantum number atomic probe, and the first photodetector constitute a high principal quantum number sensing optical path.
[0013] Further, the detection light source device, the low principal quantum number atomic probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the low principal quantum number atomic probe, and the second photodetector constitute a low principal quantum number sensing optical path.
[0014] The detection light source device, the low principal quantum number atomic probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the low principal quantum number atomic probe, and the second photodetector constitute a low principal quantum number sensing optical path.
[0015] Further, the low principal quantum number atomic probe is internally provided with an internal flat electrode, which receives a control signal of the measuring unit, generates an electric field and gradually increases the electric field strength; the high principal quantum number atomic probe is internally provided with an internal flat electrode, which receives a control signal of the measuring unit, generates an electric field and gradually increases the electric field strength.
[0016] The utility model discloses a high, low principal quantum number collocation mode is adopted, and the electric field measurement is carried out based on the riidberg multi-state Stark spectrum, and the maximum measurable field intensity and electric field resolution are kept, and the contradiction of the two in single state is effectively solved.
[0017] The technical effects of the utility model are as follows:
[0018] The contradiction that the maximum field intensity and the measurement resolution / sensitivity cannot be simultaneously solved is solved by simultaneously preparing multiple riidberg state atoms in different principal quantum numbers with large differences between high and low.
[0019] The device dependence is reduced, the maintenance cost is reduced through the quantum state self-calibration characteristics, the long-term stability is improved, and the environmental robustness is enhanced. DRAWINGS
[0020] Figure 1 It is the structure schematic diagram of the electric field measuring device based on the multi-state riidberg atom of the utility model embodiment. DETAILED DESCRIPTION
[0021] In order to make the personnel in the technical field better understand the technical scheme in the present application, the technical scheme in the present application embodiment will be clearly and completely described below in combination with the drawings in the present application embodiment. Obviously, the described embodiments are only part of the embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the protection scope of the present application.
[0022] As shown in the drawings, Figure 1 The utility model embodiment provides an electric field measuring device based on multi-state riidberg atom, and it includes sensing unit, measuring unit and host computer control unit.
[0023] The sensing unit includes two sensing light paths with different principal quantum numbers, each sensing light path includes an atomic probe, a probe light source device connected to the first input end of the atomic probe through an optical fiber, a coupling light source device connected to the second input end of the atomic probe through an optical fiber, and a photodetector connected to the output end of the atomic probe through an optical fiber.
[0024] The atomic probe comprises a high principal quantum number atomic probe and a low principal quantum number atomic probe, and the photodetector comprises a first photodetector 6 and a second photodetector 7; the low principal quantum number atomic probe is internally provided with an internal flat electrode 5-2, which receives a control signal of the measuring unit, generates an electric field and gradually increases the electric field strength; the high principal quantum number atomic probe is internally provided with an internal flat electrode 5-1, which receives a control signal of the measuring unit, generates an electric field and gradually increases the electric field strength.
[0025] The detection light source device comprises a detection light source 1, a half-wave plate I 3-1 connected with an output end of the detection light source, a dichroic mirror I 4-1 connected with an output end of the half-wave plate, a polarization beam splitter 8 connected with an output end of the dichroic mirror I 4-1, a half-wave plate II 3-2 connected with a separate output end of the polarization beam splitter 8, and a dichroic mirror II 4-2 connected with an output end of the half-wave plate II 3-2, wherein an output end of the dichroic mirror II 4-2 is connected with the high principal quantum number atomic probe; meanwhile, the detection light source device further comprises a dichroic mirror IV 4-4 connected with another separate output end of the polarization beam splitter 8, a half-wave plate IV 3-4 connected with an output end of the dichroic mirror IV 4-4, and a dichroic mirror IV 4-4 connected with an output end of the half-wave plate IV 3-4, wherein an output end of the dichroic mirror IV 4-4 is connected with the low principal quantum number atomic probe. In this embodiment, the detection light source 1 is an 852 nm laser.
[0026] The coupling light source device comprises a coupling light source I 2-1, a half-wave plate III 3-3 connected with an output end of the coupling light source I 2-1, and a dichroic mirror III 4-3 connected with an output end of the half-wave plate III 3-3, wherein an output end of the dichroic mirror III 4-3 is connected with the high principal quantum number atomic probe; the coupling light source device further comprises a coupling light source I 2-2, a half-wave plate III 3-5 connected with an output end of the coupling light source I 2-2, and a dichroic mirror III 4-5 connected with an output end of the half-wave plate III 3-5, wherein an output end of the dichroic mirror III 4-5 is connected with the low principal quantum number atomic probe. In this embodiment, the coupling light source 2-1 is a 514 nm laser, and the coupling light source 2-2 is a 509 nm laser, wherein the 514 nm laser corresponds to the high principal quantum number atomic probe, and the 509 nm laser corresponds to the low principal quantum number atomic probe.
[0027] The detection light output by the detection light source device and the coupling light output by the coupling light source are respectively incident to the atomic probe, atoms in the atomic probe are excited from a ground state to a Rydberg state, and after the detection light appears an initial EIT transmission peak on a transmission spectrum, the photodetector respectively converts the spectral signal into an electrical signal and outputs the electrical signal to the measuring unit.
[0028] The detection light source device, the high principal quantum number atom probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the high principal quantum number atom probe, and the first photoelectric detector constitute a high principal quantum number sensing light path; wherein the coupling light source device is a coupling light source I 2-1, a half-wave plate III 3-3, and a dichroic mirror III 4-3; the detection light source outputs first detection light, which is incident to the high principal quantum number atom probe after passing through a half-wave plate I 3-1, a dichroic mirror I 4-1, a polarization beam splitter 8, a half-wave plate II 3-2, and a dichroic mirror II 4-2, and excites atoms in the high principal quantum number atom probe from a ground state to an intermediate state; the coupling light source 2-1 outputs first coupling light, which is incident to the high principal quantum number atom probe together with the first detection light after passing through the half-wave plate III 3-3 and the dichroic mirror III 4-3, and excites atoms in the high principal quantum number atom probe from the intermediate state to a low principal quantum number Rydberg state; the first photoelectric detector 6 converts the first detection light in the high principal quantum number atom probe into an optical-electrical signal and outputs the optical-electrical signal to a measurement unit.
[0029] The detection light source device, the low principal quantum number atom probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the low principal quantum number atom probe, and the second photoelectric detector constitute a low principal quantum number sensing light path; the detection light source 1 outputs second detection light, which is incident to the low principal quantum number atom probe after passing through a half-wave plate I 3-1, a dichroic mirror I 4-1, a polarization beam splitter 8, a dichroic mirror IV 4-4, a half-wave plate IV 3-4, and a dichroic mirror IV 4-4, and excites atoms in the low principal quantum number atom probe from a ground state to an intermediate state; the coupling light source 2-2 outputs second coupling light, which is incident to the low principal quantum number atom probe together with the second detection light after passing through a half-wave plate III 3-5 and a dichroic mirror III 4-5, and excites atoms in the low principal quantum number atom probe from the intermediate state to a high principal quantum number Rydberg state; the second photoelectric detector 7 converts the second detection light in the low principal quantum number atom probe into an optical-electrical signal and outputs the optical-electrical signal to a measurement unit; the first detection light and the second detection light respectively first appear EIT transmission peaks on a transmission spectrum, and the peak values are recorded and output to the measurement unit.
[0030] The measurement unit is in communication connection with the sensing unit, is used for outputting a control signal to the atom probe, controlling an electric field generated by an inner flat electrode of the atom probe and gradually increasing an electric field strength, and outputting EIT transmission spectrum data under different electric field strengths to the upper computer control unit;
[0031] The upper computer control unit is in communication connection with the measurement unit, is used for identifying the EIT transmission spectrum data, and outputting an electric field strength result.
[0032] The utility model discloses a kind of electric field measuring devices based on polytypic Rydberg atom, by sequentially two beams of probe light and two beams of different frequency coupling light are incident to atomic gas chamber, and utilize two inner flat electrodes to generate electric field and gradually increase electric field intensity, output the EIT transmission spectrum data under the electric field intensity of the main quantum number of 30 and the electric field intensity of the main quantum number of 50 to host computer control unit, then the EIT transmission spectrum data is processed by host computer control unit, output spectrum data to be identified to host computer control unit, finally by host computer control unit regression output electric field intensity discriminant result, to realize double Rydberg state collaborative measurement, cover 1 μV / cm~10 kV / cm field intensity range, weak field resolution reaches 0.1 μV / cm, strong field resolution reaches 1V / cm, error <1%, with wide dynamic range and ultra-high resolution, solve the preparation multiple in high low difference larger different main quantum number Rydberg state atom, realize the technical problem that maximum field strength and measurement resolution / sensitivity cannot be simultaneously solved in measurement.
Claims
1. A multi-state Rydberg atom-based electric field measurement device, comprising a sensing unit, a measurement unit and a host computer control unit, characterized in that: the sensing unit comprises at least two different principal quantum number sensing light paths, each sensing light path comprising an atomic probe, a probe light source device connected to the first input end of the atomic probe through an optical fiber, a coupling light source device connected to the second input end of the atomic probe through an optical fiber, and a photodetector connected to the output end of the atomic probe through an optical fiber; the probe light output by the probe light source device and the coupling light output by the coupling light source device are incident on the atomic probe respectively; the atoms in the atomic probe are excited from the ground state to the Rydberg state; after the probe light appears an initial EIT transmission peak on the transmission spectrum, the photodetector converts the optical spectrum signal into an electrical signal and outputs it to the measurement unit; the measurement unit is in communication with the sensing unit and is used to output a control signal to the atomic probe to control the internal flat plate electrode to generate an electric field and gradually increase the electric field strength, and output the EIT transmission spectrum data under different electric field strengths to the host computer control unit; the host computer control unit is in communication with the measurement unit and is used to identify the EIT transmission spectrum data and output the electric field strength result.
2. The multi-state Rydberg atom-based electric field measurement device of claim 1, characterized in that: the atomic probe comprises a high principal quantum number atomic probe and a low principal quantum number atomic probe, and the photodetector comprises a first photodetector and a second photodetector; the probe light source device comprises a probe light source, a half-wave plate I connected to the output end of the probe light source, a dichroic mirror I connected to the output end of the half-wave plate, a polarization beam splitter connected to the output end of the dichroic mirror, a half-wave plate II connected to the output end of the polarization beam splitter, and a dichroic mirror II connected to the output end of the half-wave plate II, the output end of the dichroic mirror II being connected to the low principal quantum number atomic probe or the high principal quantum number atomic probe; the coupling light source device comprises a coupling light source, a half-wave plate III connected to the output end of the coupling light source, and a dichroic mirror III connected to the output end of the half-wave plate III, the output end of the dichroic mirror III being connected to the low principal quantum number atomic probe or the high principal quantum number atomic probe.
3. The multi-state Rydberg atom-based electric field measurement device of claim 2, characterized in that: the probe light source device, the high principal quantum number atomic probe connected to the probe light source device through an optical fiber, the coupling light source device connected to the high principal quantum number atomic probe, and the first photodetector constitute a high principal quantum number sensing light path; the probe light source outputs first probe light which is incident on the high principal quantum number atomic probe to excite the atoms in the high principal quantum number atomic probe from the ground state to an intermediate state; the coupling light source outputs first coupling light which is incident on the high principal quantum number atomic probe together with the first probe light to excite the atoms in the high principal quantum number atomic probe from the intermediate state to a low principal quantum number Rydberg state; and the first photodetector converts the first probe light in the high principal quantum number atomic probe into a photoelectric signal and outputs it to the measurement unit.
4. The multi-state Rydberg atom-based electric field measurement device of claim 3, characterized in that: The detection light source device, the low principal quantum number atom probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the low principal quantum number atom probe, and the second photoelectric detector constitute a low principal quantum number sensing light path; The detection light source device, the low principal quantum number atom probe connected with the detection light source device through an optical fiber, the coupling light source device connected with the low principal quantum number atom probe, and the second photoelectric detector constitute a low principal quantum number sensing light path; 5. The electric field measuring device based on multi-state Rydberg atoms according to claim 4, characterized in that: The low principal quantum number atom probe is provided with an inner flat electrode, which receives a control signal from the measuring unit, generates an electric field, and gradually increases the electric field strength; the high principal quantum number atom probe is provided with an inner flat electrode, which receives a control signal from the measuring unit, generates an electric field, and gradually increases the electric field strength.