Multi-path synchronous measurement device

Abstract

This utility model relates to the technical field of measurement devices, and discloses a multi-path synchronous measurement device, including a vector signal generator and a vector signal analyzer. A signal storage unit is provided between the vector signal generator and the vector signal analyzer. The signal storage unit is used to sequentially receive and store multiple vector frequency signals generated in the vector signal generator, and to sequentially receive and store multiple acquisition frequency signals set in the vector signal analyzer. It also includes a controller and a device under test (DUT). The controller is electrically connected to the signal storage unit, and the DUT is electrically connected to both the signal storage unit and the vector signal analyzer. This utility model aims to increase measurement speed and improve testing efficiency.

Description

Technical Field

[0001] This utility model relates to the technical field of measuring devices, specifically to a multi-path synchronous measuring device. Background Technology

[0002] In high-frequency circuit design, scattering parameters, also known as S-parameters, are used because it is difficult to define absolute open or short circuits in the high-frequency domain, and it is also difficult to measure total voltage and current in the network. Furthermore, some active components, such as transistors and diodes, cannot operate stably in open or short-circuit environments. Therefore, it is necessary to use incident and reflected power, which are easier to measure at high frequencies, to define the circuit parameters, i.e., the S-parameters.

[0003] In the prior art, the measurement process for S-parameter measurement at a single frequency point includes the following steps: a vector signal generator sets a first frequency signal; the vector signal generator is started to generate the first frequency signal; a vector signal analyzer sets a first acquisition frequency; the vector signal analyzer is started to capture the first frequency data in the first frequency signal through the first acquisition frequency and switches the RF switch; and the continuous signal of the first frequency is obtained from the vector signal analyzer and sent back to the background for analysis to obtain the S-parameters of the first frequency.

[0004] To perform S-parameter measurements at multiple frequencies, the above process can be repeated until the S-parameters at all frequencies are measured. However, for each frequency measured, the vector signal generator and vector signal analyzer need to issue an additional instruction to reset the frequency, and then collect the measured values ​​to analyze and obtain the S-parameters. This requires an extra instrument setup time, resulting in longer testing time for multi-point S-parameter measurements and reduced testing efficiency. Utility Model Content

[0005] The present invention aims to provide a multi-path synchronous measurement device to increase measurement speed and improve testing efficiency.

[0006] To achieve the above objectives, the present invention adopts the following technical solution:

[0007] 1) A multi-path synchronous measurement device, comprising a vector signal generator and a vector signal analyzer, wherein a signal storage unit is provided between the vector signal generator and the vector signal analyzer, the signal storage unit being used to sequentially receive and store multiple vector frequency signals generated in the vector signal generator, and to sequentially receive and store multiple acquisition frequency signals set in the vector signal analyzer; further comprising a controller and a device under test, the controller being electrically connected to the signal storage unit, the controller being used to trigger multiple corresponding vector frequency signals and acquisition frequency signals in the signal storage unit to be sequentially transmitted outward, the device under test being electrically connected to the signal storage unit and the vector signal analyzer respectively, the signal storage unit being used to apply multiple vector frequency signals to the device under test, the vector signal analyzer being used to sequentially capture corresponding radio frequency vector values ​​under the corresponding vector frequency signals and acquisition frequency signals of the device under test, the signal storage unit being electrically connected to the vector signal analyzer, the vector signal analyzer being used to correspond multiple radio frequency vector signals one-to-one with multiple vector frequency signals and obtain S-parameter measurement values.

[0008] 2) According to the multi-path synchronous measurement device described in 1), wherein:

[0009] The signal storage unit also includes an electronic integrated card electrically connected to the controller. The electronic integrated card is electrically connected to the vector signal generator and the vector signal analyzer respectively. The electronic integrated card is used to generate multiple trigger signals in sequence and trigger the vector signal generator to generate multiple vector frequency signals in sequence, and to generate multiple trigger signals in sequence and trigger the vector signal analyzer to generate multiple capture frequency signals in sequence.

[0010] 3) According to the multi-path synchronous measurement device described in 2), wherein:

[0011] The signal storage unit further includes several first signal memories and second signal memories. Each first signal memory is used to sequentially receive and store a vector frequency signal generated in the vector signal generator. Each second signal memory is used to sequentially receive and store a capture frequency signal set in the vector signal analyzer. The first signal memories and second signal memories are electrically connected to the controller. The controller is used to control the corresponding first signal memories to send vector frequency signals and the second signal memories to send capture frequency signals to act together on the test object. The vector signal analyzer measures the corresponding radio frequency vector signals captured sequentially under the corresponding vector frequency signal and capture frequency signal of the test object.

[0012] 4) According to the multi-path synchronous measurement device described in 3), wherein:

[0013] All the first signal memories are electrically connected to a vector signal analyzer, which receives the vector frequency signals in the first signal memories and combines them with the captured corresponding radio frequency vector signals to analyze and obtain the S-parameter measurement values.

[0014] Compared with the prior art, this utility model also has the following technical effects:

[0015] This invention utilizes an electronic integrated card to synchronously trigger a vector signal generator and a vector signal analyzer, enabling the vector signal generator to generate multiple vector frequency signals and the vector signal analyzer to generate multiple acquisition frequency signals. The multiple vector frequencies and multiple acquisition frequency signals correspond one-to-one to form a multi-path measurement channel. The controller controls the corresponding first signal memory and second signal memory to send the vector frequency signals and acquisition frequency signals to the vector signal analyzer, so as to simultaneously and quickly obtain the S-parameter measurement values ​​of the corresponding multiple radio frequency vector signals. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of the multi-path synchronous measurement device of this utility model. Detailed Implementation

[0017] The following detailed description illustrates the specific implementation method:

[0018] The reference numerals in the accompanying drawings include: vector signal generator 1, vector signal analyzer 2, signal storage unit 3, first signal memory 31, second signal memory 32, electronic integrated card 4, controller 5, and object under test 6.

[0019] Embodiments of this utility model will be further explained below with reference to the accompanying drawings. Wherever possible, the same reference numerals represent the same or similar components in the drawings and description. In the drawings, shapes and thicknesses may be exaggerated for simplicity and convenience. It is understood that elements not specifically shown in the drawings or described in the description are forms known to those skilled in the art. Those skilled in the art can make various changes and modifications based on the content of this utility model.

[0020] It is understood that the terms “electrical coupling” or “electrical connection” as used herein include any direct and indirect means of electrical connection. For example, if a first device is described as electrically coupled to a second device, it means that the first device can be directly connected to the second device, or indirectly connected to the second device through other devices or means of connection. Furthermore, in descriptions relating to the transmission or provision of electrical signals, those skilled in the art will understand that attenuation or other non-ideal variations may occur during the transmission of electrical signals, but unless otherwise specified, the source and receiver of the transmitted or provided electrical signal should be considered substantially the same signal. For example, if an electrical signal S is transmitted (or provided) from terminal a of an electronic circuit to terminal b of the electronic circuit, a voltage drop may occur across the source of a transistor switch and / or possible stray capacitance. However, unless the purpose of this design is to intentionally use attenuation or other non-ideal variations during transmission (or provision) to achieve certain specific technical effects, the electrical signal S at terminals a and b of the electronic circuit should be considered substantially the same signal.

[0021] See the example. Figure 1 As shown, the multipath synchronous measurement device in this embodiment includes a vector signal generator 1 and a vector signal analyzer 2. A signal storage unit 3 is located between the vector signal generator 1 and the vector signal analyzer 2. The signal storage unit 3 is used to sequentially receive and store multiple vector frequency signals generated in the vector signal generator 1, and to sequentially receive and store multiple acquisition frequency signals set in the vector signal analyzer 2. It also includes a controller 5 and a device under test (DUT) 6. The controller 5 is electrically connected to the signal storage unit 3 and is used to trigger the sequential transmission of multiple corresponding vector frequency signals and acquisition frequency signals from the signal storage unit 3. The DUT 6 is electrically connected to both the signal storage unit 3 and the vector signal analyzer 2. The signal storage unit 3 applies multiple vector frequency signals to the DUT 6. The vector signal analyzer 2 sequentially captures corresponding radio frequency vector values ​​under the corresponding vector frequency signals and acquisition frequency signals of the DUT 6. The signal storage unit 3 is electrically connected to the vector signal analyzer 2, which maps multiple radio frequency vector signals to multiple vector frequency signals and obtains S-parameter measurement values. This is achieved by measuring short circuits, open circuits, loads, and through-circuit parameters. The Open Load and Through (SOLT) standard calibration kit is used to establish S-parameter calibration error values. The actual S-parameter values ​​can be calculated using the S-parameter calibration error values ​​and the measured S-parameter values.

[0022] In this embodiment, the signal storage unit 3 also includes an electronic integrated card 4 electrically connected to the controller 5. The electronic integrated card 4 is electrically connected to the vector signal generator 1 and the vector signal analyzer 2 respectively. The electronic integrated card 4 is used to generate multiple trigger signals in sequence and trigger the vector signal generator 1 to generate multiple vector frequency signals in sequence, and to generate multiple trigger signals in sequence and trigger the vector signal analyzer 2 to generate multiple capture frequency signals in sequence.

[0023] In addition, the signal storage unit 3 in this embodiment also includes several first signal memories 31 and second signal memories 32. In this embodiment, the first signal memories 31 and the second signal memories 32 are both existing memory technologies. Each first signal memory 31 is used to receive and store a vector frequency signal generated in the vector signal generator 1 in sequence. Each second signal memory 32 is used to receive and store a capture frequency signal set in the vector signal analyzer 2 in sequence. The first signal memories 31 and the second signal memories 32 are electrically connected to the controller 5. The controller 5 is used to control the corresponding first signal memory 31 to send vector frequency signals and the second signal memory 32 to send capture frequency signals to act together on the test object 6. The vector signal analyzer 2 measures the corresponding radio frequency vector signals captured in sequence under the corresponding vector frequency signals and capture frequency signals of the test object 6.

[0024] Meanwhile, all the first signal memories 31 are electrically connected to the vector signal analyzer 2. The vector signal analyzer 2 is used to receive the vector frequency signals in the first signal memories 31 and combine them with the captured corresponding radio frequency vector signals to analyze and obtain the S-parameter measurement values.

[0025] The electronic integrated card 4 synchronously triggers the vector signal generator 1 and the vector signal analyzer 2, so that the vector signal generator 1 generates multiple vector frequency signals and the vector signal analyzer 2 generates multiple acquisition frequency signals. The multiple vector frequencies and multiple acquisition frequency signals correspond one-to-one to form a multi-path measurement channel. The controller 5 controls the corresponding first signal memory 31 and second signal memory 32 to send the vector frequency signals and acquisition frequency signals to the vector signal analyzer 2, so as to simultaneously and quickly obtain the S-parameter measurement values ​​of the corresponding multiple radio frequency vector signals.

[0026] See Table 1 for a comparison between the apparatus of this embodiment and the measurement methods in the prior art.

[0027]

[0028]

[0029] Referring to Table 1, the measurement time for one frequency point in the prior art (described in the background art) is 5.8 milliseconds, and the measurement time for 20 frequency points is 116 milliseconds. However, the device of this embodiment measures 20 frequency points faster than the prior art measurement method, with an average measurement time of 4.2 milliseconds per frequency point. Therefore, this embodiment can simultaneously and quickly obtain S-parameter measurement values ​​corresponding to multiple RF vector signals, thereby increasing measurement speed and improving testing efficiency.

[0030] The above are merely embodiments of this utility model. Commonly known technical solutions and / or characteristics are not described in detail here. It should be noted that those skilled in the art can make various modifications and improvements without departing from the technical solution of this utility model. These modifications and improvements should also be considered within the scope of protection of this utility model, and will not affect the effectiveness of the implementation of this utility model or the practicality of the patent. The scope of protection claimed in this application shall be determined by the content of its claims, and the specific embodiments described in the specification can be used to interpret the content of the claims.

Claims

1. A multi-path synchronous measurement device, characterized in that, The system includes a vector signal generator and a vector signal analyzer, with a signal storage unit between them. The signal storage unit sequentially receives and stores multiple vector frequency signals generated by the vector signal generator and multiple acquisition frequency signals set in the vector signal analyzer. It also includes a controller and a device under test (DUT). The controller is electrically connected to the signal storage unit and triggers the sequential transmission of multiple corresponding vector frequency signals and acquisition frequency signals from the signal storage unit. The DUT is electrically connected to both the signal storage unit and the vector signal analyzer. The signal storage unit applies multiple vector frequency signals to the DUT. The vector signal analyzer sequentially captures corresponding radio frequency vector values ​​based on the corresponding vector frequency signals and acquisition frequency signals of the DUT. The signal storage unit is electrically connected to the vector signal analyzer, which maps multiple radio frequency vector signals to multiple vector frequency signals to obtain S-parameter measurement values.

2. The multi-path synchronous measurement device according to claim 1, characterized in that: The signal storage unit also includes an electronic integrated card electrically connected to the controller. The electronic integrated card is electrically connected to the vector signal generator and the vector signal analyzer respectively. The electronic integrated card is used to generate multiple trigger signals in sequence and trigger the vector signal generator to generate multiple vector frequency signals in sequence, and to generate multiple trigger signals in sequence and trigger the vector signal analyzer to generate multiple capture frequency signals in sequence.

3. The multi-path synchronous measurement device according to claim 2, characterized in that: The signal storage unit further includes several first signal memories and second signal memories. Each first signal memory is used to sequentially receive and store a vector frequency signal generated in the vector signal generator. Each second signal memory is used to sequentially receive and store a capture frequency signal set in the vector signal analyzer. The first signal memories and second signal memories are electrically connected to the controller. The controller is used to control the corresponding first signal memories to send vector frequency signals and the second signal memories to send capture frequency signals to act together on the test object. The vector signal analyzer measures the corresponding radio frequency vector signals captured sequentially under the corresponding vector frequency signal and capture frequency signal of the test object.

4. The multi-path synchronous measurement device according to claim 3, characterized in that: All the first signal memories are electrically connected to a vector signal analyzer, which receives the vector frequency signals in the first signal memories and combines them with the captured corresponding radio frequency vector signals to analyze and obtain the S-parameter measurement values.

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