Low-speed ttl optical module error code testing device

Abstract

The utility model relates to optical module test technical field, concretely for a kind of low-speed TTL optical module error code testing device, including error code testing box, auxiliary detection component and to-be-detected piece;The side box of error code testing box is integrated with multiple groups of detection connecting port, each group of the detection connecting port is adapted to connect detection lead, and the other end of the detection lead is connected with plug-in interface;The auxiliary detection component contains auxiliary plug-in box, by the design of auxiliary detection component, multiple groups of to-be-detected piece are placed in the limiting groove of auxiliary plug-in box in turn, the adjusting plate and guide plate are driven to move using telescopic cylinder, make the plug-in interface on guide plate synchronous with the connecting port of multiple groups of to-be-detected piece butt joint, realize the synchronous detection of multiple groups of low-speed TTL optical module, compared with the error code testing device of traditional only single detection, greatly shorten test time, satisfy the demand of multiple optical modules simultaneous testing in large-scale production, effectively improve production progress.

Description

Technical Field

[0001] This utility model relates to the field of optical module testing technology, specifically a low-speed TTL optical module bit error rate testing device. Background Technology

[0002] With the rapid development of optical communication technology, optical modules are being used more and more widely in fields such as industrial control. Bit error rate testing is a crucial step in the production and quality inspection of optical modules. For low-speed TTL optical modules, the accuracy and efficiency of bit error rate testing directly affect the product's quality and performance.

[0003] Currently, existing bit error rate testing devices on the market have many problems when testing low-speed TTL optical modules. Some devices can only test a single optical module, which cannot meet the needs of testing multiple optical modules simultaneously in large-scale production. This results in low testing efficiency and seriously affects production progress. In addition, when testing multiple optical modules, traditional devices often require manual connection of each optical module to the testing equipment, which is cumbersome and prone to connection errors, thus affecting the accuracy of the test results. Furthermore, problems such as poor contact during the connection process may also lead to fluctuations in test data, which cannot truly reflect the performance of the optical module. Therefore, this utility model proposes a low-speed TTL optical module bit error rate testing device to solve the above problems. Utility Model Content

[0004] The purpose of this invention is to provide a low-speed TTL optical module bit error rate testing device to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a low-speed TTL optical module bit error rate testing device, comprising a bit error rate testing box, auxiliary detection components, and a component to be tested;

[0006] The side box of the bit error test box integrates multiple sets of detection connection ports. Each set of detection connection ports is adapted to connect to a detection wire, and the other end of the detection wire is connected to a plug interface.

[0007] The auxiliary detection component includes an auxiliary plug-in box, on which limit slots are arranged in an array. The part to be tested is placed in these limit slots in sequence. One end of the auxiliary plug-in box is provided with a guide plate, on which multiple sets of plug interfaces are installed. Each set of plug interfaces corresponds to the connection port of the part to be tested.

[0008] The other end of the auxiliary connector box is provided with an adjustment plate. The adjustment plate is connected to the guide plate through a guide post, and the adjustment plate is connected to the output end of the telescopic cylinder built into the auxiliary connector box. When the telescopic cylinder extends or retracts, it can drive the adjustment plate and the guide plate to move back and forth, thereby moving the connector on the guide plate to achieve synchronous detection of multiple sets of test pieces.

[0009] Preferably, the bottom of the auxiliary connector box is provided with a through groove corresponding to the position of each set of limiting grooves. A first screw is installed in the groove, the adjusting end of which extends out of the outer wall of the auxiliary connector box. Furthermore, the first screw is connected to the abutment plate in the limiting groove.

[0010] Preferably, the abutting end faces of the abutting plate are provided with rubber pads by Velcro.

[0011] Preferably, the guide plate has a rectangular groove with a downwardly recessed rectangular cavity. A second screw is provided inside the rectangular cavity, and the second screw is connected to multiple sets of adjusting blocks. The adjusting blocks are rectangular hollow structures.

[0012] Preferably, each set of the connectors is mounted on the corresponding adjusting block via positioning parts at both ends and bolts.

[0013] Preferably, the first screw and the second screw have the same thread clearance. Based on this characteristic, when the two screws are rotated in the same number of turns, the insertion interface and the connection port of the component to be tested can still be accurately matched.

[0014] Compared with the prior art, the beneficial effects of this utility model are:

[0015] (1) By designing the auxiliary testing component, multiple sets of test pieces are placed in the limiting slot of the auxiliary plug box in sequence. The telescopic cylinder drives the adjustment plate and guide plate to move, so that the plug interface on the guide plate is synchronously connected with the connection port of multiple sets of test pieces, realizing the synchronous testing of multiple sets of low-speed TTL optical modules. Compared with the traditional bit error test device that can only test one, the test time is greatly shortened, meeting the needs of simultaneous testing of multiple sets of optical modules in large-scale production, and effectively improving the production progress.

[0016] (2) The first screw at the bottom of the auxiliary plug box is connected to the abutment in the limiting groove. The position of the abutment can be adjusted by rotating the first screw to adapt to different sizes of test pieces. With the rubber pad on the end face of the abutment, the test piece is placed stably to avoid fluctuations in test data due to poor contact. On the other hand, the thread gap of the first screw and the second screw is the same. When rotating with the same number of turns, it can ensure that the plug interface and the connection port of the test piece are accurately aligned. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0018] Figure 2 This is a schematic diagram of the structure of this utility model from another perspective.

[0019] Figure 3 This is a schematic diagram of the auxiliary detection component of this utility model.

[0020] Figure 4 This is a schematic diagram of the connection structure between the telescopic cylinder and the adjusting plate of this utility model.

[0021] Figure 5 This is a schematic diagram of the installation structure of the component to be tested according to this utility model.

[0022] In the diagram: 1. Error test box; 2. Test connection port; 21. Test wire; 22. Plug interface; 3. Auxiliary test components; 31. Auxiliary plug box; 311. Back plate; 312. First screw; 32. Guide plate; 321. Rectangular cavity; 33. Adjusting block; 34. Second screw; 35. Adjusting plate; 36. Guide post; 37. Telescopic cylinder; 4. Component to be tested. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] Please see Figures 1 to 4 This utility model provides a technical solution: a low-speed TTL optical module bit error rate testing device, including a bit error rate testing box 1, an auxiliary detection component 3, and a component to be tested 4. The side box of the bit error rate testing box 1 integrates multiple sets of detection connection ports 2, each set of detection connection ports 2 being adapted to connect a detection wire 21, the other end of which is connected to a connector 22. The auxiliary detection component 3 includes an auxiliary connector box 31, on which limit slots are arranged in an array. The component to be tested 4 is placed sequentially in these limit slots. One end is provided with a guide plate 32, on which multiple sets of plug-in interfaces 22 are installed, each set of plug-in interfaces 22 corresponding to the connection port of the component to be tested 4; the other end of the auxiliary plug-in box 31 is provided with an adjustment plate 35, which is connected to the guide plate 32 through a guide post 36, and the adjustment plate 35 is connected to the output end of the telescopic cylinder 37 built into the auxiliary plug-in box 31. When the telescopic cylinder 37 extends or retracts, it can drive the adjustment plate 35 and the guide plate 32 to move back and forth, thereby moving the plug-in interfaces 22 on the guide plate 32, so as to realize the synchronous detection of multiple sets of components to be tested 4.

[0025] By designing the auxiliary testing component 3, multiple sets of test components 4 are placed sequentially in the limiting slots of the auxiliary connector box 31. The telescopic cylinder 37 drives the adjusting plate 35 and the guide plate 32 to move, so that the connector 22 on the guide plate 32 is simultaneously connected to the connection ports of multiple sets of test components 4, realizing the synchronous testing of multiple sets of low-speed TTL optical modules. Compared with the traditional bit error rate testing device that can only test one, it greatly shortens the testing time, meets the needs of simultaneous testing of multiple sets of optical modules in large-scale production, and effectively improves the production progress.

[0026] Please see Figures 1 to 4 The bottom of the auxiliary plug box 31 is provided with a through groove corresponding to the position of each set of limiting grooves. A first screw 312 is installed in the groove, and its adjustment end extends out of the outer wall of the auxiliary plug box 31. The first screw 312 is connected to the abutment plate 311 in the limiting groove.

[0027] Please see Figures 1 to 4 The abutting end face of the abutting plate 311 is provided with a rubber pad by Velcro. The rubber pad helps to limit the movement and prevents the abutting plate 311 from pinching and damaging the workpiece 4 to be tested.

[0028] Please see Figures 1 to 4 The guide plate 32 has a rectangular groove, and a downwardly recessed rectangular cavity 321 is provided in the rectangular groove. A second screw 34 is provided in the rectangular cavity 321. The second screw 34 is connected to multiple sets of adjusting blocks 33. The adjusting blocks 33 are rectangular hollow structures.

[0029] Please see Figures 1 to 4 Each set of connectors 22 is mounted on the corresponding adjusting block 33 via positioning parts and bolts at both ends.

[0030] Please see Figures 1 to 4 The first screw 312 and the second screw 34 have the same thread clearance. Based on this characteristic, when the two screws are rotated in the same number of turns, the connection port of the insertion interface 22 and the connection port of the component to be tested 4 can still be accurately matched.

[0031] In use, multiple sets of test pieces 4 are placed sequentially in the limiting groove of the auxiliary connector box 31. By rotating the adjusting end of the first screw 312, the abutment plate 311 is driven to move within the limiting groove until the rubber pad tightly abuts the test piece 4, ensuring its fixed position and avoiding rigid contact that could damage the device. According to the specifications of the test piece 4, the first screw 312 and the second screw 34 are rotated synchronously by the same number of turns. Utilizing the same thread clearance characteristics of the two screws, the connector 22 on the guide plate 32 is precisely aligned with the connection port of the test piece 4. The telescopic cylinder 37 built into the auxiliary connector box 31 is activated, and its output end pushes the adjusting plate 35 forward. The adjusting plate 35 drives the guide plate 32 to move forward synchronously through the guide post 36, so that the connector 22 and the connection port of the test piece 4 are automatically aligned. The positioning parts at both ends of the connector 22 and the bolts ensure a stable connection. The rectangular hollow adjusting block 3... 3. It can compensate for minor installation errors. The code generator in the bit error test box 1 generates a test code signal, which is transmitted to the test piece 4 through the detection connection port 2, the detection wire 21 and the plug interface 22. After the test piece 4 processes the signal, it is fed back to the bit error detector in the bit error test box 1 through the original path. The bit error detector compares the received signal with the original signal, calculates the bit error rate and transmits it to the data processing unit. The data processing unit analyzes the bit error rate data, generates a test report, and outputs the test results through the display screen or interface of the bit error test box 1 to complete a batch test. The telescopic cylinder 37 retracts, driving the guide plate 32 to move backward to separate the plug interface 22 from the test piece 4. The first screw 312 is rotated to loosen the stop plate 311 and take out the tested test piece 4. Then the above steps are repeated to test the next batch of test pieces 4. The test piece 4 is specifically a TTL optical module.

[0032] It should be noted that the bit error rate test box 1 in this application is an existing product in this field, and its electrical connections are existing mature technologies, so they will not be described in detail here.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A low-speed TTL optical module bit error rate testing device, comprising a bit error rate testing box (1), an auxiliary detection component (3), and a component to be tested (4), characterized in that: The side box of the bit error test box (1) integrates multiple sets of detection connection ports (2), each set of detection connection ports (2) is adapted to connect detection wires (21), and the other end of the detection wires (21) is connected to the plug interface (22); The auxiliary detection component (3) includes an auxiliary connector box (31). The auxiliary connector box (31) is provided with limit slots arranged in an array. The part to be tested (4) is placed in these limit slots in sequence. One end of the auxiliary connector box (31) is provided with a guide plate (32). The guide plate (32) is equipped with multiple sets of connectors (22). Each set of connectors (22) corresponds to the connection port of the part to be tested (4). The other end of the auxiliary plug-in box (31) is provided with an adjustment plate (35). The adjustment plate (35) is connected to the guide plate (32) through the guide post (36). The adjustment plate (35) is connected to the output end of the telescopic cylinder (37) built into the auxiliary plug-in box (31). When the telescopic cylinder (37) moves forward and backward, it can drive the adjustment plate (35) and the guide plate (32) to move back and forth, thereby moving the plug-in interface (22) on the guide plate (32) to realize the synchronous detection of multiple sets of test pieces (4).

2. The low-speed TTL optical module bit error rate testing device according to claim 1, characterized in that: The bottom of the auxiliary plug box (31) is provided with a through groove corresponding to the position of each set of limiting grooves. A first screw (312) is installed in the groove, and its adjustment end extends out of the outer wall of the auxiliary plug box (31). The first screw (312) is connected to the abutment plate (311) in the limiting groove.

3. The low-speed TTL optical module bit error rate testing device according to claim 2, characterized in that: The abutting end face of the abutting plate (311) is provided with a rubber pad by Velcro.

4. The low-speed TTL optical module bit error rate testing device according to claim 1, characterized in that: The guide plate (32) has a rectangular groove, and a downwardly recessed rectangular cavity (321) is provided in the rectangular groove. A second screw (34) is provided in the rectangular cavity (321). The second screw (34) is connected to multiple sets of adjusting blocks (33). The adjusting blocks (33) are rectangular hollow structures.

5. The low-speed TTL optical module bit error rate testing device according to claim 1, characterized in that: Each set of connectors (22) is mounted on the corresponding adjusting block (33) by positioning parts and bolts at both ends.

6. The low-speed TTL optical module bit error rate testing device according to claim 2, characterized in that: The first screw (312) and the second screw (34) have the same thread clearance. Based on this characteristic, when the two screws are rotated in the same number of turns, the connection port of the insertion interface (22) and the connection port of the test piece (4) can still be accurately matched.

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