A circuit board probe for improving test precision

Abstract

The utility model discloses a kind of circuit board probes of improving test precision, including probe main body, lower connecting sleeve, connecting piece, upper connecting sleeve and lengthening rod, probe main body is installed in lower connecting sleeve, probe main body one end penetrates lower connecting sleeve, spring is placed in the one end of probe main body in lower connecting sleeve, connecting piece is installed in the one end of spring in lower connecting sleeve, upper connecting sleeve is installed in the one end of connecting piece away from lower connecting sleeve, upper connecting sleeve is adjustably installed with lengthening rod.The utility model, connecting piece is installed in the one end of spring in lower connecting sleeve, the middle part of connecting piece is provided with baffle, the both ends of spring are respectively rested on spring and probe main body, when probe main body still moves downward after contacting circuit board, probe main body can extrude spring, so that spring is compressed, avoid probe main body to circuit board and be extruded excessively, ensure the safety of circuit board.

Description

Technical Field

[0001] This utility model relates to the field of circuit board probe technology, specifically a circuit board probe that improves testing accuracy. Background Technology

[0002] A probe is a tool used for electrical testing of PCB circuit boards. It is used in test fixtures or other test equipment and is usually gold-plated. One end of the probe is in contact with and electrically connected to the test point on the circuit board, such as the copper leakage location, while the other end is electrically connected to the test fixture or test instrument. This allows the test point to be electrically connected to the test fixture or test instrument, thereby enabling electrical testing of the PCB circuit board.

[0003] The existing announcement number CN217060312U discloses a PCB circuit board inspection probe, which includes a needle bar and a needle head fixed on the needle bar. The end of the needle bar extends out of the needle head, and the diameter of the needle head is larger than the diameter of the needle bar, thereby improving the efficiency of PCB hole removal and inspection.

[0004] In existing technologies, the probe length is generally fixed and cannot be adjusted, which limits the probe's application range. Furthermore, since the probe is a rigid structure, excessive pressure on the circuit board can damage it. Therefore, we propose a circuit board probe to improve testing accuracy. Utility Model Content

[0005] The purpose of this invention is to provide a circuit board probe that improves testing accuracy, thereby solving the problems in the prior art.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a circuit board probe for improving testing accuracy, comprising a probe body, a lower connecting sleeve, a connector, an upper connecting sleeve, and an extension rod. The probe body is installed inside the lower connecting sleeve, with one end of the probe body penetrating through the lower connecting sleeve. A spring is placed at one end of the lower connecting sleeve near the probe body, and a connector is installed at one end of the lower connecting sleeve near the spring. The upper connecting sleeve is installed at the end of the connector away from the lower connecting sleeve, and an extension rod is adjustablely installed on the upper connecting sleeve.

[0007] Preferably, the probe body includes a probe head, a probe middle section, and a probe tail section. The probe head and probe tail sections are respectively provided at both ends of the probe middle section. The diameter of the probe tail section is larger than the diameter of the probe middle section. The probe middle section passes through a lower connecting sleeve.

[0008] Preferably, the lower connecting sleeve is provided with a limiting step to limit the probe tail.

[0009] Preferably, the probe head is hemispherical in shape.

[0010] Preferably, a partition is provided in the middle of the connector, and the two ends of the spring abut against the spring and the probe body, respectively.

[0011] Preferably, the lower connecting sleeve and the connecting member are connected by threads, the upper connecting sleeve and the connecting member are connected by threads, and the upper connecting sleeve and the extension rod are connected by threads.

[0012] Compared with the prior art, the beneficial effects of this utility model are:

[0013] 1. A spring is placed at one end of the lower connecting sleeve and a connector is installed at one end of the spring. A partition is set in the middle of the connector. The two ends of the spring abut against the spring and the probe body respectively. When the probe body continues to move downward after contacting the circuit board, the probe body can squeeze the spring, thereby compressing the spring and preventing the probe body from excessively squeezing the circuit board, thus ensuring the safety of the circuit board.

[0014] 2. The upper connecting sleeve is adjustable and equipped with an extension rod. By adjusting the extension rod, the length of the probe can be adjusted, thereby increasing the probe's range of use. Attached Figure Description

[0015] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0016] Figure 1 This is a schematic diagram of the structure of this utility model;

[0017] Figure 2 This is a structural schematic diagram of the present invention from the bottom view;

[0018] Figure 3 This is the front view of this utility model;

[0019] Figure 4 This is a cross-sectional view of the present invention.

[0020] In the figure: 1. Probe body; 2. Lower connecting sleeve; 3. Connector; 4. Upper connecting sleeve; 5. Extension rod; 6. Spring; 11. Probe head; 12. Middle part of probe; 13. Probe tail; 21. Limiting step; 31. Partition. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model. Therefore, the following detailed description of the embodiments of this utility model provided in the accompanying drawings is not intended to limit the scope of the claimed utility model, but merely to represent selected embodiments of this utility model.

[0022] Please see Figure 1-4 In this embodiment of the present invention, a circuit board probe for improving testing accuracy includes a probe body 1, a lower connecting sleeve 2, a connector 3, an upper connecting sleeve 4, and an extension rod 5. The probe body 1 is installed inside the lower connecting sleeve 2, with one end of the probe body 1 penetrating through the lower connecting sleeve 2. A spring 6 is placed at one end of the lower connecting sleeve 2 near the probe body 1, and a connector 3 is installed at one end of the lower connecting sleeve 2 near the spring 6. A partition 31 is provided in the middle of the connector 3. The two ends of the spring 6 abut against the spring 6 and the probe body 1, respectively. When the probe body 1 contacts the circuit board and continues to move downwards, the probe body 1 can move the spring. The spring 6 is compressed by the pressure, which prevents the probe body 1 from excessively compressing the circuit board and ensures the safety of the circuit board. The upper connecting sleeve 4 is installed at the end of the connector 3 away from the lower connecting sleeve 2. The upper connecting sleeve 4 is adjustablely equipped with an extension rod 5. By adjusting the extension rod 5, the length of the probe can be adjusted, thereby increasing the probe's range of use. The lower connecting sleeve 2 and the connector 3 are connected by threads, the upper connecting sleeve 4 and the connector 3 are connected by threads, and the upper connecting sleeve 4 and the extension rod 5 are connected by threads. The threaded connections between the components make disassembly and assembly more convenient, and all components are metal parts.

[0023] The probe body 1 includes a probe head 11, a probe middle section 12, and a probe tail section 13. The probe middle section 12 has a probe head 11 and a probe tail section 13 at its two ends, respectively. The diameter of the probe tail section 13 is larger than the diameter of the probe middle section 12. The diameter of the probe tail section 13 is the same as the inner diameter of the lower connecting sleeve 2. The probe middle section 12 penetrates the lower connecting sleeve 2. The lower connecting sleeve 2 is provided with a limiting step 21 to limit the probe tail section 13. The probe head 11 is hemispherical in shape.

[0024] The working principle of this utility model is as follows: The circuit board probe is installed on the tester, and the tester controls the raising and lowering of the circuit board probe to achieve the test of the circuit board; a spring 6 is placed at one end of the lower connecting sleeve 2 located on the probe body 1, and a connector 3 is installed at one end of the lower connecting sleeve 2 located on the spring 6. A partition 31 is provided in the middle of the connector 3. The two ends of the spring 6 abut against the spring 6 and the probe body 1 respectively. When the probe body 1 contacts the circuit board and continues to move downward, the probe body 1 can squeeze the spring, thereby compressing the spring 6, avoiding excessive compression of the circuit board by the probe body 1, and ensuring the safety of the circuit board.

[0025] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A circuit board probe for improving testing accuracy, characterized in that: The device includes a probe body (1), a lower connecting sleeve (2), a connector (3), an upper connecting sleeve (4), and an extension rod (5). The probe body (1) is installed inside the lower connecting sleeve (2). One end of the probe body (1) passes through the lower connecting sleeve (2). A spring (6) is placed at one end of the lower connecting sleeve (2) located on the probe body (1). A connector (3) is installed at one end of the lower connecting sleeve (2) located on the spring (6). The upper connecting sleeve (4) is installed at the end of the connector (3) away from the lower connecting sleeve (2). The extension rod (5) is adjustablely installed on the upper connecting sleeve (4).

2. The circuit board probe for improving testing accuracy according to claim 1, characterized in that: The probe body (1) includes a probe head (11), a probe middle part (12) and a probe tail part (13). The probe middle part (12) has a probe head (11) and a probe tail part (13) at its two ends respectively. The diameter of the probe tail part (13) is larger than the diameter of the probe middle part (12). The probe middle part (12) passes through the lower connecting sleeve (2).

3. A circuit board probe for improving testing accuracy according to claim 2, characterized in that: The lower connecting sleeve (2) is provided with a limiting step (21) to limit the probe tail (13).

4. A circuit board probe for improving testing accuracy according to claim 2, characterized in that: The probe head (11) is hemispherical in shape.

5. A circuit board probe for improving testing accuracy according to claim 1, characterized in that: A partition plate (31) is provided in the middle of the connector (3), and the two ends of the spring (6) abut against the spring (6) and the probe body (1) respectively.

6. A circuit board probe for improving testing accuracy according to claim 1, characterized in that: The lower connecting sleeve (2) and the connector (3) are connected by threads, the upper connecting sleeve (4) and the connector (3) are connected by threads, and the upper connecting sleeve (4) and the extension rod (5) are connected by threads.

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