An alternating current circuit breaker overload trip testing system and electronic device

By designing a bypass module combining a multi-level series test architecture and thyristor contactors, efficient, reliable, and adaptable tripping performance testing of multiple circuit breakers was achieved. This solved the shortcomings of the existing system in terms of adaptability and stability, and improved testing efficiency and system reliability.

CN224416995UActive Publication Date: 2026-06-26SHANGHAI KELIANG INFORMATION ENG

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHANGHAI KELIANG INFORMATION ENG
Filing Date
2025-07-08
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

Existing AC circuit breaker overload tripping test systems are inadequate in terms of compatibility, test stability, and automation control, making it difficult to meet the unified testing requirements of single-pole, two-pole, and three-pole circuit breakers. Furthermore, existing switching devices are prone to current surges or high energy consumption during bypass switching, affecting system stability and lifespan.

Method used

A multi-stage series test architecture and a combination of parallel thyristors and contactors are used as bypass modules. The host computer control unit enables synchronous testing of multiple circuit breakers and switches to the bypass module when a circuit breaker trips, ensuring the continuity and stability of the test.

Benefits of technology

It improves testing efficiency and equipment utilization, avoids test interruptions caused by the tripping of a single circuit breaker, enhances the continuity and stability of system operation, and reduces energy consumption and maintenance costs.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the present disclosure relates to the technical field of power equipment testing, and provides an alternating current circuit breaker overload tripping test system and an electronic device, the system comprising a constant current source, a plurality of test architectures and an upper computer control unit, the plurality of test architectures are connected in series to form a multi-stage series loop, and the constant current source is connected between the upper computer control unit and one of the test architectures; the test architecture comprises a test module and a bypass module connected in parallel, the test module is provided with a connecting structure for connecting a measured circuit breaker; the upper computer control unit is connected to the bypass module, the upper computer control unit is used for controlling the constant current source to output a test current, and when detecting that the measured circuit breaker trips, controlling the bypass module connected in parallel with the test module corresponding to the measured circuit breaker to be turned on. The embodiment of the present disclosure is at least advantageous in solving the problems of low efficiency and poor stability of a traditional test system.
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