A chip testing and sorting device

Abstract

This utility model provides a chip testing and sorting device, including: a worktable, a movable stage slidably mounted on the upper part of the worktable, and a detection frame fixedly mounted in the middle of the worktable. This chip testing and sorting device, through the arrangement of cylinder one, cylinder two, the movable stage, a tray, and the detection frame, etc., uses cylinder one to drive the movable stage to precisely move along the guide rod and slide groove, realizing rapid transfer of chips between the loading / unloading position and the detection position. Cylinder two pushes the tray to slide back and forth within the fixed tray, forming a precision transmission with the guide rail slider pair to ensure chip alignment at the detection position. The electric telescopic rod and movable plate in the detection frame combine to drive the rotating rod to automatically transfer defective product labels. The limiting groove of the tray not only ensures automatic centering and damage prevention during chip loading but also provides reliable positioning for the detection and transfer processes, realizing full automation from chip loading, detection, labeling to sorting.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and more specifically, to a chip testing and sorting device. Background Technology

[0002] After the chips are manufactured, they need to be tested using testing equipment to determine whether they are qualified.

[0003] However, existing chip testing and sorting devices have the following problems when in use:

[0004] Traditional testing processes often rely on manual placement of chips one by one onto a mounting base beneath the equipment. After the testing equipment completes the electrical performance test, operators must monitor the display screen in real time to read the test results, and then manually remove the chips from the mounting base and categorize them into "qualified" or "defective" areas. The frequent repetitive chip handling by workers easily leads to operational errors due to fatigue, such as chips slipping and breaking, or misclassification. Furthermore, purely manual operation is extremely inefficient and far from meeting the testing needs of tens of thousands of chips per day on modern semiconductor production lines. In addition, prolonged repetitive labor increases the risk of occupational injuries for workers, and the high labor costs make it difficult to adapt to the trend of automation and large-scale production in the semiconductor industry.

[0005] This invention can automate the entire process of chip testing and label transfer, improving testing accuracy and efficiency while reducing labor costs and error rates. Summary of the Invention

[0006] The present invention aims to solve the technical problems mentioned in the background art and provide a chip testing and sorting device.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a chip testing and sorting device, comprising: a workbench, a movable stage slidably mounted on the upper end of the workbench, a testing frame fixedly mounted in the middle of the workbench, a tray slidably connected inside the movable stage, a movable plate slidably connected inside the testing frame, a testing head fixedly mounted on the rear side of the top of the testing frame, the testing head being located behind the movable plate, a rotating rod rotatably connected to the bottom of the movable plate, and a transfer label paper attached to the surface of the rotating rod.

[0008] A further preferred embodiment: baffles are fixedly installed on both the front and rear sides of the upper end of the worktable, and a cylinder is fixedly installed on the front side of the baffle, with the output end of the cylinder being fixedly connected to the moving table.

[0009] A further preferred embodiment: guide rods are fixedly installed on both the left and right sides between the baffles, and the guide rods are slidably connected to the moving platform. Sliding grooves are opened on both the left and right sides of the upper end of the worktable, and the sliding grooves are slidably connected to the moving platform.

[0010] A further preferred embodiment: a fixed plate is fixedly installed on the upper end of the moving platform, and sliders are fixedly installed on both the left and right sides of the bottom of the moving platform. Guide holes are opened on both the left and right sides of the front of the moving platform, and the guide holes are slidably connected to the guide rods.

[0011] A further preferred embodiment: a cylinder two is fixedly installed on the left end of the fixed plate, the output end of the cylinder two is fixedly connected to the tray, guide rails are fixedly installed on both the front and rear sides inside the fixed plate, the tray is slidably installed inside the fixed plate, and a slider two is fixedly installed on the bottom of the tray, the slider two is slidably connected to the guide rails.

[0012] A further preferred embodiment: the tray has several limiting grooves inside, and the inside of each limiting groove is chamfered.

[0013] A further preferred embodiment: the detection frame has two sliding grooves at both the left and right ends, and the sliding grooves are slidably connected to the moving plate.

[0014] A further preferred embodiment: an electric telescopic rod is fixedly installed on the upper end of the testing frame, and the output end of the electric telescopic rod is fixedly connected to the upper end of the moving plate.

[0015] A further preferred embodiment: a fixing plate is fixedly installed on both the left and right sides of the bottom of the movable plate, and a rotating rod is rotatably connected between the fixing plates.

[0016] A further preferred embodiment: a motor is fixedly mounted on the outer end face of the fixing plate, and the output end of the motor is fixedly connected to the rotating rod. Beneficial effects

[0017] 1. By setting up a slide groove one, a slider one, a guide hole, a guide rail, and a slider two, slide groove one and slider one provide stable support for the moving stage, reduce lateral offset during movement, and ensure its translational accuracy on the worktable; the sliding pair of the guide hole and the guide rod further constrains the movement trajectory of the moving stage, eliminates pitch and yaw errors, and keeps the chip in a horizontal position during transmission; the guide rail and slider two provide precision guidance for the tray, and the low friction characteristics ensure that the tray moves smoothly within the fixed tray, meeting the high-precision alignment requirements of the chip and the detection head; the multiple guiding structure effectively distributes the load of the moving parts and extends the service life of the equipment.

[0018] 2. By setting a limiting groove, when the chip falls into the groove under the action of gravity, the rounded corner design at the chamfer can disperse the impact force when the chip falls, reduce the risk of chip edge breakage, and protect the chip pads from damage.

[0019] 3. Equipped with an electric telescopic rod and a rotating rod, when the electric telescopic rod extends downwards, the moving plate drives the rotating rod to press the label paper downwards. After the pressing is completed, the rotating rod retracts upwards with the moving plate, and the motor rotates, causing the rotating rod to rotate and turn the label paper on the adjacent side to the bottom, making it convenient for the next label paper to be pressed.

[0020] 4. In summary, this chip testing and sorting device, through the configuration of cylinder one, cylinder two, a moving stage, a tray, and a detection frame, achieves rapid transfer of chips between loading / unloading positions and the detection position by means of cylinder one driving the moving stage to move precisely along the guide rod and slide groove. Cylinder two pushes the tray to slide back and forth within the fixed tray, forming a precision transmission with the guide rail slider pair to ensure chip alignment at the detection position. The electric telescopic rod and moving plate in the detection frame combine to drive the rotating rod to complete the automatic transfer of defective product labels. The limiting groove of the tray not only ensures automatic centering and damage prevention during chip loading, but also provides reliable positioning for the detection and transfer process, realizing full automation of the entire process from chip loading, detection, labeling to sorting. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of this utility model.

[0022] Figure 2 This is a schematic diagram of the workbench structure of this utility model.

[0023] Figure 3 This is a schematic diagram of the mobile platform structure of this utility model.

[0024] Figure 4 This is a schematic diagram of the testing frame structure of this utility model.

[0025] Figure 1-4 Components: 1. Workbench; 101. Baffle; 102. Cylinder 1; 103. Guide rod; 104. Slide 1; 2. Moving table; 201. Fixed plate; 202. Slider 1; 203. Guide hole; 204. Cylinder 2; 205. Guide rail; 206. Tray; 207. Slider 2; 208. Limiting groove; 3. Detection frame; 301. Slide 2; 302. Moving plate; 303. Electric telescopic rod; 304. Detection head; 305. Fixed plate; 306. Rotating rod; 307. Motor. Detailed Implementation

[0026] The following will refer to the appendix in the embodiments of this utility model. Figures 1-4 The technical solutions in the embodiments of this utility model will be clearly and completely described.

[0027] Please see Figure 1-4In this embodiment of the present invention, a chip testing and sorting device includes: a workbench 1, a movable stage 2 slidably mounted on the upper end of the workbench 1, a testing frame 3 fixedly mounted in the middle of the workbench 1, a tray 206 slidably connected inside the movable stage 2, a movable plate 302 slidably connected inside the testing frame 3, a testing head 304 fixedly mounted on the rear side of the top inside the testing frame 3, the testing head 304 being located behind the movable plate 302, a rotating rod 306 rotatably connected to the bottom of the movable plate 302, a transfer label paper being attached to the surface of the rotating rod 306, and baffles 101 fixedly mounted on both the front and rear sides of the upper end of the workbench 1, with the front baffle 101 fixedly mounted on the front side. A cylinder 102 is installed, with its output end fixedly connected to a moving stage 2. Guide rods 103 are fixedly installed on both the left and right sides of the baffle 101, and are slidably connected to the moving stage 2. Slide grooves 104 are provided on both the left and right sides of the upper end of the worktable 1, and are slidably connected to the moving stage 2. A fixed plate 201 is fixedly installed on the upper end of the moving stage 2. Slider 202 is fixedly installed on both the left and right sides of the bottom of the moving stage 2. Guide holes 203 are provided on both the left and right sides of the front of the moving stage 2, and are slidably connected to the guide rods 103. The chip to be tested is placed on the tray 206 inside the moving stage 2. The tray 206 is fixed in the moving stage 2 via a sliding connection. Then, the cylinder 102 on the front baffle 101 is activated, pushing the moving stage 2 to slide backward along the guide rod 103 and the slide groove 104. The slider 202 moves synchronously within the slide groove 104, ensuring that the moving stage is stably positioned below the detection frame 3. The moving stage 2 achieves precise guidance through the cooperation of the guide hole 203 and the guide rod 103. After reaching the detection area, the fixed plate 201 locks the position of the tray 206, ensuring that the chip is aligned with the detection head 304. After alignment, the detection head 304 is activated to detect the chip on the tray 206. The detection head 304 transmits the detection data. The data is transmitted to the control system, which determines the chip category as good or bad based on the results. After the inspection, the moving plate 302 inside the inspection rack 3 slides downward through the internal drive mechanism, causing the rotating rod 306 to approach the chip placement area. The transfer label paper on the surface of the rotating rod 306 contacts the slot where the chip is placed, and the defective mark is printed onto the surface through pressure transfer. Then the moving plate 302 retracts, and the cylinder 102 continues to push the moving stage 2 backward so that the remaining chips can be inspected. Then the rotating rod 306 is rotated to replace the new label paper. The above operation is repeated to achieve batch inspection and sorting of chips.

[0028] In this embodiment of the invention, a cylinder 204 is fixedly installed on the left end of the fixed disk 201. The output end of the cylinder 204 is fixedly connected to the tray 206. Guide rails 205 are fixedly installed on both the front and rear sides inside the fixed disk 201. The tray 206 is slidably installed inside the fixed disk 201. A slider 207 is fixedly installed on the bottom of the tray 206. The slider 207 is slidably connected to the guide rails 205. The cylinder is fixed to the left end of the fixed disk 201 and drives the tray 206 to slide back and forth inside the fixed disk through the extension and retraction of the piston rod, thereby realizing the precise movement of the chip between the detection position and the sorting position. The front and rear guide rails 205 inside the fixed disk 201 and the slider 207 on the bottom of the tray are connected. A linear sliding pair is formed to ensure that the pallet moves without deviation. The chip is manually placed into the carrier slot of the pallet 206. The second cylinder 204 is in the retracted state. The pallet 206 is located at the front loading position of the fixed plate 201. The first cylinder 102 pushes the moving stage 2 to below the inspection frame 3. At this time, the fixed plate 201 is directly below the inspection head 304. The second cylinder 204 extends and pushes the pallet 206 to slide backward along the guide rail 205 through the piston rod. The second slider 207 moves backward synchronously in the guide rail, accurately pushing the chip directly below the inspection head 304. After the inspection is completed, the second cylinder 204 retracts and the pallet 206 returns to the front of the fixed plate 201 along the guide rail 205.

[0029] In this embodiment of the utility model, a plurality of limiting grooves 208 are provided inside the tray 206. The limiting grooves 208 are all chamfered. The chip is transported to the top of the tray 206 and falls into the limiting grooves 208 under the action of gravity. The rounded corner design at the chamfer can disperse the impact force when the chip falls and reduce the risk of chip edge breakage.

[0030] In this embodiment of the utility model, the detection frame 3 has sliding grooves 301 at both its left and right ends, which are slidably connected to the moving plate 302. An electric telescopic rod 303 is fixedly installed on the upper end of the detection frame 3, and its output end is fixedly connected to the upper end of the moving plate 302. Fixed plates 305 are fixedly installed on both the left and right sides of the bottom of the moving plate 302, and a rotating rod 306 is rotatably connected between the fixed plates 305. A motor 307 is fixedly installed on the outer end face of the fixed plate 305, and its output end is fixedly connected to the rotating rod 306. When the detection head 30... After the four pairs of chips are inspected and a defective product is found, the electric telescopic rod 303 is driven downward. The moving plate 302 moves downward along the slide groove 301, and the fixed plate 305 at the bottom of the moving plate 302 descends accordingly, so that the rotating rod 306 falls above the limiting groove 208. Then it is pressed down, so that the transfer label on the rotating rod 306 is affixed to one side of the limiting groove 208. Then the electric telescopic rod 303 is retracted. After resetting, the motor 307 rotates, so that the rotating rod 306 rotates, so that the label paper on the adjacent side is directly below, making it convenient to affix the label paper to one side of the limiting groove 208 next time.

[0031] Working principle: First, chips are manually placed into the limiting groove 208. After the chips are placed, cylinder 102 is activated, pushing the moving stage 2 backward to move it below the detection frame 3, allowing the detection head 304 to detect the chips. After the chips at this location are detected, cylinders 102 and 204 push the tray 206 to change its position below the detection head 304, ensuring that all chips in the tray 206 can be detected. When a defective product is detected, the electric telescopic rod 303 starts to extend, pushing the moving plate 302 downward so that the rotating rod 306 is close to the limiting groove 208. Then, it is pressed down so that the transfer label on the surface of the rotating rod 306 is attached to one side of the limiting groove 208. Then, the electric telescopic rod 303 retracts and resets, and the motor 307 rotates, causing the rotating rod 306 to rotate so that the transfer label on the adjacent side is directly below the rotating rod 306 for easy use next time.

Claims

1. A chip test handler, comprising: A workbench (1) is provided with a movable stage (2) slidably mounted on the upper end of the workbench (1) and a testing frame (3) fixedly mounted in the middle of the workbench (1). The movable stage (2) is slidably connected to a tray (206), the testing frame (3) is slidably connected to a movable plate (302), a testing head (304) is fixedly mounted on the rear side of the top of the testing frame (3), the testing head (304) is located on the rear side of the movable plate (302), a rotating rod (306) is rotatably connected to the bottom of the movable plate (302), and a transfer label is attached to the surface of the rotating rod (306).

2. A chip testing and sorting apparatus according to claim 1, wherein: The workbench (1) is fixedly installed with baffles (101) on both the front and rear sides. A cylinder (102) is fixedly installed on the front side of the baffle (101). The output end of the cylinder (102) is fixedly connected to the moving table (2).

3. A chip testing and sorting apparatus according to claim 2, wherein: Guide rods (103) are fixedly installed on both the left and right sides of the baffle (101). The guide rods (103) are slidably connected to the moving table (2). Slide grooves (104) are opened on both the left and right sides of the upper end of the worktable (1). The slide grooves (104) are slidably connected to the moving table (2).

4. A chip testing and sorting apparatus according to claim 3, wherein: The upper end of the mobile platform (2) is fixedly installed with a fixed plate (201), and the bottom left and right sides of the mobile platform (2) are fixedly installed with sliders (202). The left and right sides of the front of the mobile platform (2) are provided with guide holes (203), and the guide holes (203) are slidably connected to the guide rod (103).

5. A chip testing and sorting apparatus according to claim 4, wherein: A cylinder 2 (204) is fixedly installed on the left end of the fixed plate (201). The output end of the cylinder 2 (204) is fixedly connected to the tray (206). Guide rails (205) are fixedly installed on both the front and rear sides inside the fixed plate (201). The tray (206) is slidably installed inside the fixed plate (201). A slider 2 (207) is fixedly installed at the bottom of the tray (206). The slider 2 (207) is slidably connected to the guide rail (205).

6. A chip testing and sorting apparatus according to claim 5, wherein: The tray (206) has several limiting grooves (208) inside, and the limiting grooves (208) are all chamfered.

7. The chip testing and sorting device according to claim 1, characterized in that: The detection frame (3) has two sliding grooves (301) on both the left and right sides inside, and the sliding grooves (301) are slidably connected to the moving plate (302).

8. A chip testing and sorting apparatus according to claim 7, wherein: An electric telescopic rod (303) is fixedly installed on the upper end of the testing frame (3), and the output end of the electric telescopic rod (303) is fixedly connected to the upper end of the moving plate (302).

9. The chip testing and sorting apparatus according to claim 1, wherein: The movable plate (302) has fixed plates (305) fixedly installed on both the left and right sides of its bottom, and a rotating rod (306) is rotatably connected between the fixed plates (305).

10. The chip testing and sorting apparatus according to claim 9, wherein: A motor (307) is fixedly installed on the outer end face of the fixing plate (305), and the output end of the motor (307) is fixedly connected to the rotating rod (306).

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