Integrated circuit testing machine with convenient and simple operation

Through the innovative structural design of the integrated circuit tester, the problem of inaccurate test results caused by external interference during the testing process has been solved, achieving stable fixation of integrated circuit components and accuracy of test results.

CN224456945UActive Publication Date: 2026-07-03SHENZHEN HUASHI SEMICON EQUIP CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN HUASHI SEMICON EQUIP CO LTD
Filing Date
2025-06-10
Publication Date
2026-07-03

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    Figure CN224456945U_ABST
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Abstract

This utility model discloses a convenient and easy-to-operate integrated circuit testing machine, relating to the field of integrated circuit testing technology. It includes a test chamber and a base. The test chamber has a base at its bottom and a protective cover at its top. Stabilizing components are embedded in the sides of the test chamber, and an integrated circuit test platform is installed inside. This convenient and easy-to-operate integrated circuit testing machine, by installing stabilizing components on all four sides of the test chamber, can structurally limit and fix integrated circuits of different sizes within a certain range, ensuring the stability of the integrated circuits during testing. Simultaneously, the structure of the test chamber and the protective cover can maximize the safety and stability of the tested integrated circuits, while minimizing unnecessary influence and interference from external factors.
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Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing technology, specifically to an integrated circuit testing machine that is convenient and easy to operate. Background Technology

[0002] Integrated circuit testing (IC testing) is an indispensable and crucial step in semiconductor manufacturing. Its core is to evaluate the functionality, performance, and reliability of a chip by comparing its actual output with the expected results.

[0003] An integrated circuit tester is a specialized device used to test integrated circuits. It is primarily used in the fields of information science and systems science, electronics and communication technologies. By simulating various working conditions and environments, it tests the functionality, performance, and reliability of integrated circuits, ensuring that the chips function properly.

[0004] When conventional integrated circuit testing machines perform structural inspections on products, the structure itself lacks sufficient structural protection, making the product susceptible to interference from external factors, which can affect the structure and lead to inaccurate test results. Utility Model Content

[0005] The purpose of this invention is to provide a convenient and easy-to-operate integrated circuit testing machine to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: an integrated circuit testing machine that is convenient and easy to operate, comprising a test box and a base. The bottom of the test box is provided with a base, and the top of the test box is provided with a protective cover. A stabilizing component is embedded in the side of the test box, and the main body of the integrated circuit test bench is installed inside the test box. At the same time, a double-segment damping hinge is connected and installed at the connection between the test box and the protective cover on one side.

[0007] Furthermore, the base has holes at each of the four opposite corners for bolt installation, and the test box is fixedly installed at the top center of the base.

[0008] Furthermore, the stabilizing components are arranged in a circular array with the test box as the center, and there are four groups of them. The stabilizing components are installed inside the side of the test box.

[0009] Furthermore, the stabilizing component includes an electronic control device, an electric telescopic rod, and a limiting plate. The electric telescopic rod is horizontally mounted on the lower end of one side of the electronic control device, and the limiting plate is located at the end of the electric telescopic rod away from the electronic control device.

[0010] Furthermore, the limiting plate is made of anti-static material, and there is a movable connection between the limiting plate and the output end of the electric telescopic rod.

[0011] Furthermore, the protective cover is symmetrically equipped with electric locking posts on the left and right sides of its front facade, and the test box is symmetrically equipped with docking seats on the upper part of its front facade.

[0012] Furthermore, the bottom end of the electric locking post furthest from the protective cover is vertically inserted into the upper interior of the docking seat, and the electric locking post and the docking seat are movably connected.

[0013] Furthermore, the dual-segment damping hinge is symmetrically installed on the side surface of the test box away from the electric locking stake, and the two ends of the dual-segment damping hinge are movably connected to the test box and the protective cover, respectively.

[0014] This utility model provides a convenient and easy-to-operate integrated circuit testing machine, which has the following beneficial effects:

[0015] 1. This utility model involves installing a set of test boxes on each of the four side facades of the test box. Under the control of an electronic control device, the electric telescopic rod can be adjusted horizontally, thereby driving the limiting plate connected to it to move synchronously in the horizontal direction. Using this structure, the integrated circuit component placed on the top surface of the integrated circuit test bench can be structurally limited and fixed in four directions, ensuring good structural stability of the tested integrated circuit component and avoiding unnecessary problems during the testing process. Furthermore, the structural design of the stabilizing component allows for flexible structural adjustments within a certain range according to the specifications of the integrated circuit component being tested, thus ensuring the flexibility of the device's structural use.

[0016] 2. This utility model, by placing the main body of the integrated circuit test bench inside the test chamber and coordinating with the protective cover, ensures sufficient structural protection for the integrated circuit components under test during the testing process, thereby ensuring the safety and stability of the test and minimizing unnecessary structural interference from external factors. Furthermore, by installing electric locking posts and docking seats on the front sides of the test chamber and the protective cover respectively, after the electric locking posts and docking seats are fastened to the top surface of the test chamber using a double-segment damping hinge, the electric locking posts are vertically inserted into the docking seats to achieve structural locking, thus ensuring the structural firmness and stability of the connection between the protective cover and the test chamber. Additionally, the observation window allows testers to easily monitor the testing status inside the test chamber in real time. The base, with its four diagonally spaced holes, allows for the use of bolts to fix the entire device to the mounting surface, maximizing the structural stability of the entire device and ensuring stable operation. Attached Figure Description

[0017] Figure 1This is a side-view structural diagram of the main body of an integrated circuit testing machine that is convenient and easy to operate according to this utility model;

[0018] Figure 2 This is a side-view structural diagram of the main body of an integrated circuit testing machine that is convenient and easy to operate according to this utility model;

[0019] Figure 3 This is a schematic diagram of the internal structure of the integrated circuit testing machine of this utility model, which is convenient and easy to operate.

[0020] Figure 4 This is a schematic diagram of the main body opening structure of an integrated circuit testing machine that is convenient and easy to operate according to this utility model;

[0021] Figure 5 This is a three-dimensional structural diagram of a stable component of an integrated circuit testing machine that is convenient and easy to operate according to this utility model.

[0022] In the diagram: 1. Test box; 2. Base; 3. Protective cover; 4. Stabilizing component; 401. Electrical control device; 402. Electric telescopic rod; 403. Limiting plate; 5. Main body of integrated circuit test bench; 6. Dual-section damping hinge; 7. Observation window; 8. Electric locking post; 9. Docking seat. Detailed Implementation

[0023] The embodiments of this utility model will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and should not be construed as limiting the scope of this utility model.

[0024] like Figures 1 to 5As shown, a convenient and easy-to-operate integrated circuit testing machine includes a test box 1 and a base 2. The base 2 is located at the bottom of the test box 1, and a protective cover 3 is located at the top of the test box 1. A stabilizing component 4 is embedded in the side of the test box 1, and an integrated circuit test bench body 5 is installed inside the test box 1. A double-segment damping hinge 6 is installed at the connection between the test box 1 and the protective cover 3. The stabilizing component 4 includes an electronic control device 401, an electric telescopic rod 402, and a limiting plate 403. The electric telescopic rod 402 is horizontally installed at the lower end of one side of the electronic control device 401, and the end of the electric telescopic rod 402 away from the electronic control device 401 is limited by the limiting plate 403. 03. The limiting plate 403 is made of anti-static material, and the output end of the limiting plate 403 and the electric telescopic rod 402 are movably connected. The stabilizing components 4 are arranged in a circular array with the test box 1 as the center and there are four sets. The stabilizing components 4 are installed inside the side of the test box 1. Under the control of the electronic control device 401, the electric telescopic rod 402 can be adjusted in the horizontal direction, thereby driving the limiting plate 403 connected to it to move synchronously in the horizontal direction. With the above structure, the integrated circuit components placed on the top surface of the integrated circuit test bench body 5 can be structurally limited and fixed in four directions.

[0025] like Figures 1 to 5 As shown, the base 2 has holes for bolt installation at its four opposite corners, and the test box 1 is fixedly installed at the top center of the base 2. Electric locking posts 8 are symmetrically installed on the front side of the protective cover 3, and docking seats 9 are symmetrically installed on the upper part of the front side of the test box 1. The bottom of the electric locking post 8, away from the protective cover 3, is vertically inserted into the upper part of the docking seat 9, and the electric locking post 8 and the docking seat 9 are movably connected. A double-stage damping hinge 6 is symmetrically installed on the side of the test box 1 away from the electric locking post 8, and both ends of the double-stage damping hinge 6 are movably connected to the test box 1 and the protective cover 3, respectively. By placing the integrated circuit test bench body 5 inside the test box 1, and cooperating with the structural design of the protective cover 3, sufficient structural protection can be ensured for the integrated circuit components being tested during the testing process, thereby ensuring the safety and stability of the test and minimizing unnecessary structural interference from external factors.

[0026] In summary, as Figures 1 to 5 As shown, this convenient and easy-to-operate integrated circuit tester, when in use, first utilizes the holes at the four opposite corners of the base 2 set at the bottom of the test box 1, and uses bolts to fix the entire device to the mounting structure surface to ensure the stability of the device.

[0027] Then, the integrated circuit structural component to be tested is placed on the top surface of the integrated circuit test bench body 5 inside the test chamber 1. Then, the stabilizing components 4 set on the four sides are activated. Under the control of the electronic control device 401, the electric telescopic rod 402 connected to it begins to extend and retract in the horizontal direction, and drives the limiting plate 403 connected to it to move synchronously, and pushes the limiting plate 403 to the side of the integrated circuit structural component to be tested, thereby achieving structural fixation and limitation.

[0028] The protective cover 3 is then attached to the top surface of the test chamber 1 using the structure of the double-segment damping hinge 6. Then, the electric locking post 8 is used to insert one end of its bottom into the interior of the docking seat 9, thereby connecting and fixing the test chamber 1 and the protective cover 3. The tester can use the observation window 7 to observe the interior of the test chamber 1 in real time to ensure the stability of the test.

[0029] The embodiments of this utility model are given for illustrative and descriptive purposes only, and are not intended to be exhaustive or to limit the utility model to the forms disclosed. Many modifications and variations will be apparent to those skilled in the art. The embodiments were chosen and described in order to better illustrate the principles and practical applications of this utility model, and to enable those skilled in the art to understand this utility model and design various embodiments with various modifications suitable for a particular purpose.

Claims

1. A convenient and easy-to-operate integrated circuit testing machine, comprising a test box (1) and a base (2), characterized in that: The test box (1) is provided with a base (2) at the bottom and a protective cover (3) at the top. A stabilizing component (4) is embedded in the side of the test box (1). An integrated circuit test bench body (5) is installed inside the test box (1). A double-segment damping hinge (6) is connected to the connection between the test box (1) and the protective cover (3) on one side.

2. The integrated circuit tester of claim 1 wherein, The base (2) has holes at its four opposite corners for bolt installation, and the test box (1) is fixedly installed at the top center of the base (2).

3. The integrated circuit tester of claim 1 wherein, The stabilizing components (4) are arranged in a circular array with the test box (1) as the center and there are four groups of them. The stabilizing components (4) are installed inside the side of the test box (1).

4. The integrated circuit tester of claim 1 wherein, The stabilizing component (4) includes an electronic control device (401), an electric telescopic rod (402), and a limiting plate (403). The electric telescopic rod (402) is horizontally installed on one lower side of the electronic control device (401), and the limiting plate (403) is located at the end of the electric telescopic rod (402) away from the electronic control device (401).

5. The integrated circuit tester of claim 4 wherein, The limiting plate (403) is made of anti-static material, and the limiting plate (403) and the output end of the electric telescopic rod (402) are movably connected.

6. The integrated circuit tester of claim 1 wherein, Electric locking posts (8) are symmetrically installed on the left and right sides of the front facade of the protective cover (3), and docking seats (9) are symmetrically installed on the upper end of the front facade of the test box (1).

7. The integrated circuit tester of claim 6 wherein, The electric locking post (8) is vertically inserted into the upper part of the docking seat (9) at the bottom of the end away from the protective cover (3), and the electric locking post (8) and the docking seat (9) are movably connected.

8. The integrated circuit tester of claim 1 wherein, The dual-segment damping hinge (6) is symmetrically installed on the side surface of the test box (1) away from the electric locking stake (8), and the two ends of the dual-segment damping hinge (6) are movably connected to the test box (1) and the protective cover (3), respectively.