An interface testing device and interface testing system
By designing an interface testing device, automated interface short-circuit testing without manual plugging and unplugging was achieved, solving the problems of high testing costs and equipment damage in existing technologies, thereby improving testing efficiency and reducing costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- WUXI RUIQIN TECH CO LTD
- Filing Date
- 2025-03-27
- Publication Date
- 2026-07-03
AI Technical Summary
In the existing technology, the testing cost for short-circuit protection function of electronic device interfaces is high, and the testing process can easily damage external devices.
Design an interface testing device, including a first interface, a second interface, a multiplexing circuit, a short-circuit analog circuit, and a control circuit. By automatically controlling the power-on and power-off of external devices and short-circuiting the interface under test, short-circuit testing can be achieved without manual plugging and unplugging.
It reduced testing costs, decreased the number of times external equipment failed, improved testing efficiency and speed, and simplified the testing process.
Smart Images
Figure CN224457003U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic device testing technology, and in particular to an interface testing device and interface testing system. Background Technology
[0002] To enable functions such as data transmission, charging management, and peripheral expansion, electronic devices typically have one or more interfaces. Taking 3C products (i.e., computer electronic products, communication electronic products, and consumer electronic products) as an example, they usually have one or more USB (Universal Serial Bus) interfaces to enable functions such as device charging and peripheral expansion.
[0003] During actual use, electronic devices are prone to short circuits at their interfaces due to factors such as water ingress, dust accumulation, loose pins, damaged pins, and improper soldering, leading to current overload. To improve the safety, stability, and lifespan of electronic devices, they typically incorporate short-circuit protection for their interfaces to prevent damage to the interface or other circuits caused by short circuits.
[0004] To ensure that the performance and quality of electronic equipment meet relevant standards and requirements, it is necessary to test the short-circuit protection function of the electronic equipment before it leaves the factory. However, the existing technology involves testers manually shorting each pin of the interface and manually plugging and unplugging external devices. Repeated plugging and unplugging, as well as the large current generated when the interface is short-circuited, can easily damage the external devices, increasing the testing cost. Utility Model Content
[0005] The purpose of this application is to address at least one of the aforementioned technical defects, particularly the technical defect of excessively high testing costs in the prior art.
[0006] In a first aspect, embodiments of this application provide an interface testing apparatus, including:
[0007] The first interface is used to connect external devices;
[0008] The second interface is used to connect to the interface under test of the device under test.
[0009] A multiplexing circuit includes at least one multiplexing unit; the multiplexing unit has a first common terminal, a first control terminal, a first path terminal and a second path terminal, the first common terminal is connected to the first interface, and the first path terminal is used for grounding or floating;
[0010] A short-circuit analog circuit includes at least one short-circuit switch unit; the short-circuit switch unit has a second common terminal, a second control terminal, a third path terminal, a fourth path terminal, and a fifth path terminal, the second common terminal is connected to the second interface, the third path terminal is used for grounding, the fourth path terminal is used for connecting to a power supply, and the fifth path terminal is used for connecting to the second path terminal;
[0011] The control circuit, connected to the first control terminal and the second control terminal respectively, is used to control the first common terminal to connect to the first path terminal and the second common terminal to connect to the third path terminal or the fourth path terminal when in a short-circuit test state; the control circuit is also used to control the first common terminal to connect to the second path terminal and the second common terminal to connect to the fifth path terminal when in an interface test state.
[0012] In some embodiments, the number of multiplexing units is N, and the first common terminal of the N multiplexing units is connected one-to-one with the N pins of the first interface, where N≥2.
[0013] In some embodiments, the number of short-circuit switch units is N, the fifth path terminals of the N short-circuit switch units are connected one-to-one with the second path terminals of the N multiplexing units, and the second common terminal of the N short-circuit switch units is connected one-to-one with the N pins of the second interface.
[0014] In some embodiments, the short-circuit switch unit includes a single-pole triple-throw switch having a second common terminal, a second control terminal, a third path terminal, a fourth path terminal, and a fifth path terminal.
[0015] In some embodiments, the control circuit includes a host computer and a slave computer, the host computer being connected to the slave computer, and the slave computer being connected to the first control terminal and the second control terminal respectively;
[0016] The host computer is used to send a short-circuit test command to the slave computer in response to the first user's operation; the slave computer is used to control the first common terminal to connect to the first channel terminal and control the second common terminal to connect to the third channel terminal or the fourth channel terminal when it receives the short-circuit test command.
[0017] The host computer is also configured to send an interface test command to the slave computer in response to a second user operation; the slave computer is also configured to control the first common terminal to connect to the second channel terminal and control the second common terminal to connect to the fifth channel terminal when it receives the interface test command.
[0018] In some embodiments, the lower-level machine includes an MCU, which is connected to the upper-level machine, the first control terminal, and the second control terminal.
[0019] In some embodiments, the first interface is a USB interface, and the second interface is a USB interface.
[0020] In some embodiments, the first interface is a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface, or a Mini-USB interface;
[0021] The second interface is a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface, or a Mini-USB interface.
[0022] Secondly, embodiments of this application provide an interface testing system, including:
[0023] The interface testing device described in any of the above embodiments;
[0024] An external device is connected to the first interface of the interface testing device.
[0025] In some embodiments, the external device is a storage device, a portable electronic device, an interface-rechargeable device, an input device, or an output device.
[0026] In the interface testing apparatus and system provided in some embodiments of this application, under short-circuit test conditions, the first common terminal of the multiplexing unit is connected to the first path terminal of the multiplexing unit, and the second common terminal of the short-circuit switch unit is connected to the third or fourth path terminal of the short-circuit switch unit. Thus, external devices can be powered down by grounding or leaving the first interface and multiplexing circuit floating. Furthermore, the interface under test can be grounded or connected to a power supply through the second interface and short-circuit simulation circuit to achieve an interface short circuit.
[0027] In interface testing mode, the first common terminal is connected to the second path terminal, and the second common terminal is connected to the fifth path terminal. In this way, external devices can connect to the device under test (DUT) through the first interface, multiplexing circuit, short-circuit simulation circuit, and second interface to power on the device and test whether the DUT interface functions correctly.
[0028] Therefore, this application allows for power control of external devices without repeated plugging and unplugging, and enables short-circuit testing of the interface under test, thereby reducing the frequency of external device failures and lowering testing costs. Simultaneously, it reduces the degree of manual intervention during the testing process, thus improving testing efficiency and speed while ensuring test quality. Attached Figure Description
[0029] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0030] Figure 1 This is one of the structural schematic diagrams of an interface testing device in one embodiment;
[0031] Figure 2 This is a circuit diagram of a multiplexing circuit in one embodiment;
[0032] Figure 3 This is a second schematic diagram of the interface testing device in one embodiment;
[0033] Figure 4 This is a schematic diagram of the structure of a single-pole three-throw switch in one embodiment;
[0034] Figure 5 This is a schematic diagram of the host computer interface in one embodiment;
[0035] Explanation of reference numerals in the attached figures:
[0036] 10—First interface, 20—Second interface, 30—Multiplexing circuit, 310—Multiplexing unit, D—First common terminal, SA—First path terminal, SB—Second path terminal, CTR1—First control terminal, Short-circuit analog circuit—40, Short-circuit switch unit—410, Single-pole three-throw switch—411, Second common terminal—COM, Second control terminal—CTR2, Third path terminal—NO0, Fourth path terminal—NO1, Fifth path terminal—NO2, Control circuit—50. Detailed Implementation
[0037] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0038] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
[0039] In some embodiments, this application provides an interface testing apparatus for performing short-circuit protection function testing on the interface under test of the device under test.
[0040] like Figure 1 As shown, the interface testing device includes a first interface 10, a second interface 20, a multiplexing circuit 30, a shorting analog circuit 40, and a control circuit 50. The first interface 10 is used to connect to an external device, and the second interface 20 is used to connect to the interface under test of the device under test. It should be noted that the external device described in this application can be any device capable of connecting to the device under test through the interface under test, and may be, but is not limited to, storage devices, portable electronic devices, interface-rechargeable devices, input devices, or output devices, etc. This application does not impose specific limitations in this regard.
[0041] It is understood that the interface type of the first interface and the interface type of the second interface can be determined based on the interface type of the interface under test. In some examples, both the first interface 10 and the second interface 20 can be USB interfaces, enabling the interface testing device to test the short-circuit protection function of the USB interface. It is understood that the first interface 10 and the second interface 20 can be any type of USB interface to broaden the application scenarios of the interface testing device. For example, the first interface 10 can be a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface, or a Mini-USB interface, and the second interface 20 can be a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface, or a Mini-USB interface.
[0042] The multiplexing circuit 30 refers to a circuit that has multiple channels and can selectively conduct one of the channels under the control of a control signal. The multiplexing circuit 30 includes at least one multiplexing unit 310, which has a first common terminal D, a first control terminal CTR1, a first path terminal SA, and a second path terminal SB. The first common terminal D is connected to the first interface 10, and the first path terminal SA is used for grounding or floating.
[0043] The short-circuit analog circuit 40 refers to a circuit capable of simulating an interface short circuit, which may include at least one short-circuit switch unit 410. The short-circuit switch unit 410 has multiple channels and can selectively conduct one of the channels under the control of a control signal. Specifically, the short-circuit switch unit 410 has a second common terminal COM, a second control terminal CTR2, a third path terminal NO0, a fourth path terminal NO1, and a fifth path terminal NO2. The second common terminal COM is connected to the second interface 20, the third path terminal NO0 is used for grounding, the fourth path terminal NO1 is used to connect to the power supply VBUS, and the fifth path terminal NO2 is connected to the second path terminal SB of the multiplexing unit 310.
[0044] It should be noted that the number of multiplexing units 310 and the number of short-circuit switch units 410 can be determined according to the actual situation. For example, there can be one or more multiplexing units 310 and one or more short-circuit switch units 410.
[0045] Control circuit 50 refers to the circuit used to control the conduction channels of multiplexing unit 310 and short-circuit switch unit 410. Control circuit 50 can be connected to the first control terminal CTR1 of multiplexing unit 310 and the second control terminal CTR2 of short-circuit switch unit 410, respectively. By outputting a control signal to the first control terminal CTR1, it controls multiplexing unit 310 to conduct one of its channels, and by outputting a control signal to the second control terminal CTR2, it controls short-circuit switch unit 410 to conduct one of its channels.
[0046] Specifically, in the short-circuit test state, the control circuit 50 can short-circuit the interface under test by controlling the conduction channel of the short-circuit switch unit 410. In this case, the control circuit 50 can control the second common terminal COM to connect to the third path terminal NO0 or the fourth path terminal NO1. Further, the control circuit 50 can control the second common terminal COM to connect to the third path terminal NO0 and the fourth path terminal NO1 in sequence.
[0047] When the second common terminal COM is connected to the third path terminal NO0, the interface under test (DUT) can be grounded sequentially through the second interface 20 and the short-circuit analog circuit 40, thus shorting the DUT to ground. When the second common terminal COM is connected to the fourth path terminal NO1, the DUT can be connected to the power supply VBUS sequentially through the second interface 20 and the short-circuit analog circuit 40, thus shorting the DUT to the power supply VBUS. In this way, the DUT can be automatically shorted via the control circuit 50 and the short-circuit analog circuit 40, eliminating the need for repeated manual plugging and unplugging.
[0048] Furthermore, when in the short-circuit test state, the control circuit 50 can also control the first common terminal D to connect to the first path terminal SA, so that the external device is grounded or left floating through the first interface 10 and the multiplexing circuit 30 in sequence, thereby controlling the external device to be powered off and avoiding damage to the external device due to short circuit of the interface under test.
[0049] In interface testing mode, control circuit 50 can connect external devices to the interface under test (DUT) of the device under test (DUT) by controlling the conduction channels of multiplexing unit 310 and short-circuit switch unit 410 to determine whether the DUT is damaged, thereby completing the short-circuit protection function test of the DUT. Specifically, in interface testing mode, control circuit 50 controls the first common terminal D to connect to the second path terminal SB, and controls the second common terminal COM to connect to the fifth path terminal NO2. In this way, external devices can be connected to the DUT sequentially through the first interface 10, multiplexing circuit 30, short-circuit analog circuit 40, and second interface 20, thereby testing whether the DUT is usable after a short circuit.
[0050] For example, taking a power bank as an external device, if in interface testing mode, the interface testing device can connect the power bank to the interface under test (DUT) of the device under test (DUT). If the power bank's charging indicator light illuminates, it indicates that the DUT interface is functioning normally and the DUT's short-circuit protection function is working properly. Conversely, if the power bank's charging indicator light does not illuminate, it indicates that the DUT interface or the DUT is damaged, and the DUT's short-circuit protection function cannot protect the DUT interface or other circuits / devices in the event of a short circuit.
[0051] Therefore, this application allows for power control of external devices without repeated plugging and unplugging, and enables short-circuit testing of the interface under test, thereby reducing the frequency of external device failures and lowering testing costs. Simultaneously, it reduces manual intervention during testing, simplifies the testing process, and thus improves testing efficiency and speed while ensuring test quality.
[0052] In some embodiments, such as Figure 2 As shown, the number of multiplexing units 310 can be N. The first common terminal D of the N multiplexing units 310 is connected one-to-one with the N pins of the first interface 10, where N ≥ 2. That is, each pin of the first interface 10 is connected to one multiplexing unit 310, and each multiplexing unit 310 is connected to one pin of the first interface 10. In this way, the interface testing device can achieve more comprehensive short-circuit testing through N multiplexing units 310.
[0053] In this embodiment, each multiplexing unit 310 has a first common terminal D, a first path terminal SA, and a second path terminal SB. The first path terminal SA of each multiplexing unit 310 is used for grounding or floating. The second path terminal SB of each multiplexing unit 310 is connected to the fifth path terminal NO2 of the short-circuit switch unit 410. The first common terminal D of the N multiplexing units 310 is connected to the N pins of the first interface 10 in a one-to-one correspondence.
[0054] In some examples, each multiplexing unit 310 may have a first control terminal CTR1, and the control circuit 50 may be connected to the first control terminals CTR1 of N multiplexing units 310 respectively to control the conduction channel of each multiplexing unit 310. In other examples, the multiplexing circuit 30 may have a first control terminal CTR1, and the control circuit 50 may control the conduction channels of N multiplexing units 310 together by sending a control signal to the first control terminal CTR1.
[0055] In some embodiments, such as Figure 3 As shown, there are N short-circuit switch units 410. Each short-circuit switch unit 410 has a second control terminal CTR2, a second common terminal COM, a third path terminal NO0, a fourth path terminal NO1, and a fifth path terminal NO2. The fifth path terminal NO2 of the N short-circuit switch units 410 is connected one-to-one with the second path terminal SB of the N multiplexing units 310, and the second common terminal COM of the N short-circuit switch units 410 is connected one-to-one with the N pins of the second interface 20. The third path terminal NO0 of the N short-circuit switch units 410 is used for grounding, and the fourth path terminal NO1 of the N short-circuit switch units 410 is used for connecting to the power supply VBUS.
[0056] In this way, the interface testing device can short-circuit each pin of the interface under test one by one through N short-circuit switch units 410, thereby simulating various short-circuit situations that may be encountered in actual applications, and thus achieving more comprehensive short-circuit testing.
[0057] Please see Figure 3 The first interface 10 may include N pins, namely A1~AN. The second interface 20 may include N pins, namely C1~CN. The multiplexing circuit 30 includes N multiplexing units 310, and the shorting analog circuit 40 includes N shorting switch units 410. The N shorting switch units 410 are connected one-to-one with the N multiplexing units 310, the N shorting switch units 410 are connected one-to-one with C1~CN, and the N multiplexing units 310 are connected one-to-one with A1~AN.
[0058] The first common terminal D of each multiplexing unit 310 is connected to the corresponding pin of the first interface 10. The first path terminal SA of each multiplexing unit 310 is used for grounding or floating. The second path terminal SB of each multiplexing unit 310 is connected to the fifth path terminal NO2 of the corresponding shorting switch unit 410. The third path terminal NO0 of each shorting switch unit 410 is used for grounding. The fourth path terminal NO1 of each shorting switch unit 410 is used to connect to the power supply VBUS. The second common terminal COM of each shorting switch unit 410 is connected to the corresponding pin of the second interface 20.
[0059] It is understood that the short-circuit switch unit 410 can be implemented in any manner. In some embodiments, the short-circuit switch unit 410 can be implemented based on a single-pole three-throw switch 411 to reduce the cost of the interface testing device.
[0060] Specifically, such as Figure 4 As shown, the short-circuit switch unit 410 includes a single-pole three-throw switch 411. The single-pole three-throw switch 411 has a second common terminal COM, a second control terminal CTR2, a third path terminal NO0, a fourth path terminal NO1, and a fifth path terminal NO2. The second control terminal CTR2 is connected to the control circuit 50, the second common terminal COM is connected to the second interface 20, the third path terminal NO0 is used for grounding, the fourth path terminal NO1 is used to connect to the power supply VBUS, and the fifth path terminal NO2 is connected to the second path terminal SB of the multiplexing unit 310.
[0061] In some examples, there can be two second control terminals CTR2, namely second control terminals IN1 and IN2. Control circuit 50 can select different channels by applying different voltage levels to IN1 and IN2. For example, GPIO1 of control circuit 50 can be connected to IN1, GPIO2 can be connected to IN2, and GPIO3 can be connected to CTR1 of multiplexing circuit 30.
[0062] Table 1 shows the control logic table of the single-pole triple-throw switch 411 in some examples. When both IN1 and IN2 are low, the single-pole triple-throw switch 411 does not work; when IN1 is low and IN2 is high, the second common terminal COM is connected to the third path terminal NO0, and the pins of the interface under test can be short-circuited to ground; when IN is high and IN2 is low, the second common terminal COM is connected to the fourth path terminal NO1, and the pins of the interface under test can be short-circuited to the power supply VBUS; when both IN1 and IN2 are high, the second common terminal COM is connected to the fifth path terminal NO2, and the interface under test exits the short-circuit state.
[0063] Table 1
[0064]
[0065] In some embodiments, the control circuit 50 includes a host computer and a slave computer, with the host computer connected to the slave computer, and the slave computer connected to a first control terminal CTR1 and a second control terminal CTR2, respectively. The host computer is used to interact with the tester, and the slave computer is used to control the multiplexing circuit 30 and the short-circuit analog circuit 40. This allows testers to conveniently perform short-circuit tests using the interface testing device, thereby further improving testing efficiency.
[0066] Specifically, the host computer, in response to the first user's operation, sends a short-circuit test command to the slave computer to instruct the interface testing device to enter the short-circuit test state. Upon receiving the short-circuit test command, the slave computer controls the first common terminal D to connect to the first channel terminal SA and controls the second common terminal COM to connect to the third channel terminal NO0 or the fourth channel terminal NO1.
[0067] The host computer is also used to respond to the second user's operation by sending an interface test command to the slave computer, instructing the interface test device to enter the interface test state. The slave computer is also used, upon receiving the interface test command, to control the first common terminal D to connect to the second channel terminal SB and to control the second common terminal COM to connect to the fifth channel terminal NO2.
[0068] In some examples, such as Figure 5 As shown, the host computer can interact with the tester through an interactive interface. For example, when it is necessary to short-circuit pin A1, the tester can first click the external device disconnect button to ground or leave the external device floating through the multiplexing circuit 30, thereby powering down the external device. Then, click the button to short-circuit pin A1 to GND or VBUS to ground pin A1 or supply power VBUS. After short-circuiting, the green light behind the control will light up. After short-circuiting for 5 seconds, the P2P button can be clicked to remove the USB interface from the short-circuit state and restore it to normal. Next, click the external device connect button to connect the external device to the interface under test through the interface testing device and observe whether the external device can work normally or be recognized normally.
[0069] In some embodiments, the lower-level device includes an MCU (Microcontroller Unit), which is connected to the upper-level device, the first control terminal CTR1, and the second control terminal CTR2. For example, the MCU can output high and low levels via GPIO ports to control the conduction channels of the multiplexing unit 310 and the shorting switch unit 410, thereby controlling the power-on / off of external devices and shorting the interface under test.
[0070] Furthermore, in some examples, the MCU may be an STM32 microcontroller.
[0071] In some embodiments, this application also provides an interface testing system, including an external device and the interface testing apparatus described in any of the above embodiments. The external device can be connected to a first interface of the interface testing apparatus.
[0072] It is understood that the external device in this application can be any type of device, and this application does not impose any specific limitations on it. In some examples, the external device can be a storage device, a portable electronic device, a rechargeable interface device, an input device, or an output device. Among them, the storage device can be, but is not limited to, a USB flash drive, a portable hard drive, a memory card, etc.; the portable electronic device can be, but is not limited to, a laptop, a tablet, a smartphone, a wireless headset, etc.; the rechargeable interface device can be, but is not limited to, a power bank, a desktop fan, etc., which can be powered through an interface; the input device can be, but is not limited to, a wired keyboard, a wired mouse, a graphics tablet, etc.; and the output device can be, but is not limited to, a speaker, wired headphones, a monitor, etc.
[0073] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. For example, without departing from the scope of this application, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor. Both the first resistor and the second resistor are resistors, but they are not the same resistor.
[0074] The terms “comprising,” “including,” or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase “comprising one…” does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
[0075] It is understood that the term "connection" in the following embodiments should be understood as "electrical connection," "communication connection," etc., if the connected circuits, modules, units, etc., have electrical signal or data transmission with each other.
[0076] In this text, “a,” “one,” “the,” “the,” and “its” may also include plural forms unless the context clearly indicates otherwise. Multiple refers to at least two, such as 2, 3, 5, or 8, etc. “And / or” includes any and all combinations of the related listed items.
[0077] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The various embodiments can be combined as needed, and the same or similar parts can be referred to each other.
[0078] The above description of the disclosed embodiments enables those skilled in the art to make or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. An interface testing device, characterized in that, include: The first interface is used to connect external devices; The second interface is used to connect to the interface under test of the device under test. A multiplexing circuit includes at least one multiplexing unit; the multiplexing unit has a first common terminal, a first control terminal, a first path terminal and a second path terminal, the first common terminal is connected to the first interface, and the first path terminal is used for grounding or floating; A short-circuit analog circuit includes at least one short-circuit switch unit; the short-circuit switch unit has a second common terminal, a second control terminal, a third path terminal, a fourth path terminal, and a fifth path terminal, the second common terminal is connected to the second interface, the third path terminal is used for grounding, the fourth path terminal is used for connecting to a power supply, and the fifth path terminal is used for connecting to the second path terminal; The control circuit, connected to the first control terminal and the second control terminal respectively, is used to control the first common terminal to connect to the first path terminal and the second common terminal to connect to the third path terminal or the fourth path terminal when in a short-circuit test state; the control circuit is also used to control the first common terminal to connect to the second path terminal and the second common terminal to connect to the fifth path terminal when in an interface test state.
2. The interface testing device of claim 1, wherein, The number of multiplexing units is N, and the first common terminal of the N multiplexing units is connected one-to-one with the N pins of the first interface, where N≥2.
3. The interface testing device of claim 2, wherein, The number of short-circuit switch units is N. The fifth path terminal of each of the N short-circuit switch units is connected to the second path terminal of each of the N multiplexing units in a one-to-one correspondence. The second common terminal of each of the N short-circuit switch units is connected to the N pins of the second interface in a one-to-one correspondence.
4. An interface testing device according to any one of claims 1 to 3, characterised in that, The short-circuit switch unit includes a single-pole three-throw switch, which has a second common terminal, a second control terminal, a third path terminal, a fourth path terminal, and a fifth path terminal.
5. The interface testing device of claim 1, wherein, The control circuit includes a host computer and a slave computer, the host computer is connected to the slave computer, and the slave computer is connected to the first control terminal and the second control terminal respectively; The host computer is used to send a short-circuit test command to the slave computer in response to the first user's operation; the slave computer is used to control the first common terminal to connect to the first channel terminal and control the second common terminal to connect to the third channel terminal or the fourth channel terminal when it receives the short-circuit test command. The host computer is also configured to send an interface test command to the slave computer in response to a second user operation; the slave computer is also configured to control the first common terminal to connect to the second channel terminal and control the second common terminal to connect to the fifth channel terminal when it receives the interface test command.
6. The interface testing device of claim 5, wherein, The lower-level machine includes an MCU, which is connected to the upper-level machine, the first control terminal, and the second control terminal.
7. The interface testing device of any of claims 1 to 3, 5 to 6, wherein, The first interface is a USB interface, and the second interface is a USB interface.
8. The interface testing device of claim 7, wherein, The first interface is a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface, or a Mini-USB interface; The second interface is a USB-A interface, a USB-B interface, a USB-C interface, a Micro-USB interface or a Mini-USB interface.
9. An interface test system, characterized by Comprising: The interface testing device of any one of claims 1 to 8; An external device connected to the first interface of the interface testing device.
10. The interface test system of claim 9, wherein, The external device is a storage device, a mobile electronic device, an interface charging device, an input device or an output device.