Intelligent point inspection instrument multifunctional data acquisition probe

By designing a support component on the probe of the intelligent inspection instrument, the problem of the probe tipping over when the equipment vibrates is solved, achieving more stable data sampling, which is applicable to the field of intelligent inspection instruments.

CN224533961UActive Publication Date: 2026-07-21QILU YUNSHANG DIGITAL TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
QILU YUNSHANG DIGITAL TECH CO LTD
Filing Date
2025-08-01
Publication Date
2026-07-21

AI Technical Summary

Technical Problem

The data acquisition probes of existing intelligent inspection instruments are prone to tipping over when the equipment vibrates, affecting the stability and continuity of data sampling.

Method used

A multifunctional data acquisition probe including a support assembly was designed. The support assembly consists of a rotating disk, an arc-shaped groove, support legs, a connecting rod, and a protrusion. It is fixed to the probe body by a threaded connection. The rotating disk drives the support legs to unfold or retract to stabilize the probe.

Benefits of technology

It improves the stability of the probe under equipment vibration conditions, ensures the continuity and reliability of data sampling, avoids probe tipping, and is suitable for widespread application.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a multifunctional data acquisition probe of intelligent point inspection instrument relates to the field of intelligent point inspection instrument, including point inspection instrument probe body, the point inspection instrument probe body, the upper and lower end outer wall of point inspection instrument probe body all round array has a plurality of guide rod, the top middle part of point inspection instrument probe body is integrative with the stud, the guide rod with between the stud is equipped with the support component for supporting the point inspection instrument probe body place, the support component includes the rotating disc, is equipped with a plurality of circumferential array's arc slot on the rotating disc. The utility model discloses a support component can effectively improve the stability of point inspection instrument probe body sampling placement, avoid the equipment vibration to be bigger and influence the standing of point inspection instrument probe body's placement, through the support component to the point inspection instrument probe body support can avoid the probe toppling over due to improper human operation or equipment vibration, thereby guaranteeing the continuity and reliability of measurement data.
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Description

Technical Field

[0001] This utility model relates to the field of intelligent inspection instruments, specifically a multi-functional data acquisition probe for intelligent inspection instruments. Background Technology

[0002] An intelligent inspection instrument is a smart device that integrates multiple sensors, data acquisition modules, data analysis algorithms, and communication technologies. It is used for equipment or machine inspection and fault diagnosis, featuring real-time monitoring, accurate diagnosis, and efficient management. Through multi-sensor integration and intelligent algorithm analysis, the intelligent inspection instrument can more accurately determine the equipment status, promptly identify potential faults, and prevent equipment failures from escalating.

[0003] Existing intelligent inspection instruments mainly consist of probes, terminals, and signs. Existing data sampling probes are equipped with various sensors and data acquisition modules to achieve data acquisition for different functions. However, when sampling, the data sampling probe is placed independently on the outer surface of the equipment. Due to the small detection end area of ​​the probe, it is not stable when placed on the equipment surface. If the vibration generated by the equipment is large, it is easy for the probe to tip over, which will affect data sampling. Utility Model Content

[0004] The purpose of this utility model is to provide a multi-functional data acquisition probe for an intelligent inspection instrument in order to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a multi-functional data acquisition probe for an intelligent inspection instrument, including an inspection instrument probe body. The upper and lower outer walls of the inspection instrument probe body are each arranged in a circular array with multiple guide rods. A stud is integrally formed at the top center of the inspection instrument probe body. A support component for supporting the placement of the inspection instrument probe body is installed between the guide rods and the stud. The support assembly includes a rotating disk with multiple circularly arranged arc-shaped grooves. The outer side of the inspection probe body is surrounded by multiple support legs. Each support leg has a guide groove that is slidably connected to the guide rod. The upper end of each support leg is connected to a connecting rod. The end of the connecting rod near the rotating disk has a protrusion located within the arc-shaped groove.

[0006] As a further embodiment of this utility model: the stud is connected to the central shaft of the rotating disk by a thread, and the rotating disk is located directly above the probe body of the inspection instrument.

[0007] As a further embodiment of this utility model: the rotating disk is located above the connecting rod, the outer diameter of the protrusion is matched with the width of the arc groove, the protrusion has a cylindrical structure, and the length of the protrusion is greater than the thickness of the rotating disk.

[0008] As a further improvement of this utility model, the number of the arc-shaped groove, support leg, connecting rod and protrusion is the same.

[0009] As a further embodiment of this utility model: one end of the arc-shaped groove is close to the outer edge of the rotating disk, and the other end of the arc-shaped groove is close to the axis of the rotating disk.

[0010] As a further improvement of this utility model, a limit block is provided at the outer end of the guide rod.

[0011] Compared with the prior art, the beneficial effects of this utility model are: This invention, by setting up a support component, can effectively improve the stability of the sampling placement of the inspection instrument probe body, and avoid the impact of large equipment vibrations on the placement and standing of the inspection instrument probe body. By supporting the inspection instrument probe body with the support component, the probe can be prevented from tipping over due to improper human operation or equipment vibration, thereby ensuring the continuity and reliability of measurement data. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the structure of this utility model; Figure 2 This is a schematic diagram of the structure of the probe body of the inspection instrument of this utility model; Figure 3 This is a schematic diagram of the structure of the support component of this utility model.

[0013] In the diagram: 1. Inspection instrument probe body; 11. Guide rod; 12. Limiting block; 13. Stud; 2. Support assembly; 201. Rotating disk; 202. Arc groove; 203. Support leg; 204. Guide groove; 205. Connecting rod; 206. Protrusion. Detailed Implementation

[0014] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0015] Please see Figures 1-3In this embodiment of the utility model, the intelligent inspection instrument multi-functional data acquisition probe includes an inspection instrument probe body 1. The inspection instrument probe body 1 has multiple guide rods 11 arranged in a circular array on the upper and lower outer walls. A stud 12 is integrally formed at the top center of the inspection instrument probe body 1. A support component 2 for supporting the placement of the inspection instrument probe body 1 is installed between the guide rods 11 and the stud 12. The support assembly 2 includes a rotating disk 201, on which multiple arc-shaped grooves 202 in a circular array are formed. Multiple support legs 203 are provided around the outer side of the inspection probe body 1. The support legs 203 are provided with guide grooves 204 that are slidably connected to the guide rod 11. A connecting rod 205 is connected to the upper end of the support leg 203. A protrusion 206 is provided at the end of the connecting rod 205 near the rotating disk 201. The protrusion 206 is located in the arc-shaped groove 202. The stud 12 is connected to the central shaft of the rotating disk 201 by a thread, and the rotating disk 201 is located directly above the probe body 1 of the inspection instrument; The rotating disk 201 is located above the connecting rod 205. The outer diameter of the protrusion 206 matches the width of the arc groove 202. The protrusion 206 has a cylindrical structure and its length is greater than the thickness of the rotating disk 201. The number of arc grooves 202, support legs 203, connecting rods 205 and protrusions 206 are the same.

[0016] One end of the arc-shaped groove 202 is close to the outer edge of the rotating disk 201, and the other end of the arc-shaped groove 202 is close to the axis of the rotating disk 201; a limit block 12 is provided on the outer end of the guide rod 11.

[0017] In this embodiment: Since the existing intelligent inspection instrument mainly consists of a probe, a terminal and a sign, the existing data sampling probe is equipped with a variety of sensors and data acquisition modules to achieve data acquisition for different functions. However, when the data sampling probe is sampling, it is placed independently on the outer surface of the device. Since the detection end area of ​​the probe is small, it is not stable when placed on the surface of the device. If the vibration generated by the device is large, it is easy to cause the probe to tip over, which will affect the data sampling.

[0018] By setting up the support component 2, the stability of the sampling placement of the probe body 1 of the inspection instrument can be effectively improved, and the large vibration of the equipment can be avoided from affecting the placement and standing of the probe body 1 of the inspection instrument. By supporting the probe body 1 of the inspection instrument through the support component 2, the probe can be prevented from tipping over due to improper human operation or equipment vibration, thereby ensuring the continuity and reliability of measurement data.

[0019] Specifically, this solution involves rotating the rotating disk 201, which moves along the length of the stud 12. The rotating disk 201, in turn, causes the arc-shaped groove 202 to move synchronously. This causes the groove to move from the inner end to the outer end relative to the protrusion 206, thereby causing multiple support legs 203 to move synchronously away from the inspection probe body 1. The multiple support legs 203 are located on the outer side of the inspection probe body 1 and provide auxiliary support for the standing of the inspection probe body 1, greatly reducing the probability of the inspection probe body 1 tipping over during the sampling process. Conversely, similarly, after the rotating disk 201 is rotated in the opposite direction, multiple support legs 203 simultaneously move closer to and retract towards the inspection instrument probe body 1, making it easy to store and carry. The structure of this support component 2 can expand the support surface during use, ensuring the stable placement of the inspection instrument probe body 1. When not in use, it can be folded and stored, saving space and making it suitable for widespread promotion.

[0020] It should be noted that the rotating disk 201 moves along the length of the stud 12 during rotation. Therefore, there is a suitable gap between the connecting rod 205 and the rotating disk 201. Similarly, the protrusion 206 is designed to be relatively long to prevent the rotating disk 201 from detaching from the protrusion 206 during the lifting and lowering process.

[0021] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A multi-functional data acquisition probe for an intelligent inspection instrument, comprising an inspection instrument probe body (1), characterized in that, The inspection instrument probe body (1) has multiple guide rods (11) arranged in a circular array on the upper and lower outer walls. A stud (13) is integrally formed at the top center of the inspection instrument probe body (1). A support component (2) for supporting the placement of the inspection instrument probe body (1) is installed between the guide rods (11) and the stud (13). The support assembly (2) includes a rotating disk (201), on which multiple arc-shaped grooves (202) in a circular array are opened. Multiple support legs (203) are arranged around the outer side of the inspection instrument probe body (1). A guide groove (204) is opened on the support leg (203) and slidably connected to the guide rod (11). A connecting rod (205) is connected to the upper end of the support leg (203). A protrusion (206) is provided at the end of the connecting rod (205) near the rotating disk (201). The protrusion (206) is located in the arc-shaped groove (202).

2. The intelligent inspection instrument multi-functional data acquisition probe according to claim 1, characterized in that, The stud (13) is threadedly connected to the central shaft of the rotating disk (201), which is located directly above the probe body (1) of the inspection instrument.

3. The intelligent inspection instrument multi-functional data acquisition probe according to claim 2, characterized in that, The rotating disk (201) is located above the connecting rod (205). The outer diameter of the protrusion (206) is matched with the width of the arc groove (202). The protrusion (206) has a cylindrical structure and the length of the protrusion (206) is greater than the thickness of the rotating disk (201).

4. The intelligent inspection instrument multi-functional data acquisition probe according to claim 3, characterized in that, The number of the arc-shaped groove (202), support leg (203), connecting rod (205) and protrusion (206) is the same.

5. The intelligent inspection instrument multi-functional data acquisition probe according to claim 4, characterized in that, One end of the arc-shaped groove (202) is close to the outer edge of the rotating disk (201), and the other end of the arc-shaped groove (202) is close to the axis of the rotating disk (201).

6. The multi-functional data acquisition probe of the intelligent inspection instrument according to claim 5, characterized in that, A limit block (12) is provided at the outer end of the guide rod (11).