Analog test device for non-contact rail profile detection apparatus

By designing the platform and test rail of the simulation testing device, the problems of space occupation and high cost of non-contact rail profile inspection equipment are solved, realizing efficient and low-cost simulation testing, and improving the accuracy of testing and the versatility of the device.

CN224593950UActive Publication Date: 2026-08-04江苏欣铁机电科技有限公司 +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
江苏欣铁机电科技有限公司
Filing Date
2025-09-02
Publication Date
2026-08-04

AI Technical Summary

Technical Problem

Existing non-contact rail profile inspection equipment has a large space requirement, high cost, and is greatly affected by the outdoor environment.

Method used

A simulation testing device is provided, including a support platform and a test rail. The device under test is driven to move by a traveling component to simulate the testing under real use conditions. The length of the test rail is reduced to control space occupation, and the test accuracy is improved by stabilizing the structure.

Benefits of technology

It enables efficient and low-cost indoor simulation testing, improves testing accuracy and device versatility, and reduces transportation and implementation costs.

✦ Generated by Eureka AI based on patent content.

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Abstract

This application provides a simulation testing device for a non-contact rail profile inspection equipment, including a base, a support platform, and a bracket. The support platform supports an inverted device under test (DUT), with the DUT's detection unit and traveling wheels facing upwards. The bracket houses a test rail and a traveling assembly. The length of the test rail is parallel to the traveling direction of the traveling assembly. The test rail is inverted, with its top surface facing the plane of the support platform. Both the test rail and the traveling assembly are movable. The test rail moves to be within the detection range of the DUT's detection unit, and the traveling assembly moves to contact the DUT's traveling wheels and drive them to move synchronously. This application, through the cooperation of the lower support platform and the upper test rail, provides a stable and reliable testing foundation. The traveling assembly simulates the movement of the DUT, improving the accuracy of the simulation test. Furthermore, it eliminates the need for a long track, effectively controlling the space occupied by the simulation test and reducing its cost.
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Description

Technical Field

[0001] This application relates to the field of railway inspection technology, and in particular to a simulation testing device for non-contact rail profile inspection equipment. Background Technology

[0002] The research and development of non-contact rail cross-section wear and corrugated wear detection equipment (hereinafter referred to as "non-contact rail profile detection equipment" or "test equipment") has become increasingly mature, such as rail profile self-propelled measuring instrument and self-propelled corrugated wear measuring instrument.

[0003] However, there is very little research on simulation testing of non-contact rail profile inspection equipment. In most cases, the test is conducted on outdoor rails, which is easily affected by outdoor weather and the environment of rented test sites, and the transportation and implementation costs are high. As for indoor testing, it is mostly carried out by building a track model indoors and then pushing it on it, which takes up a lot of space and the track model materials are expensive. Utility Model Content

[0004] The purpose of this application is to address the problems of large space occupation and high cost in the simulation testing of non-contact rail profile inspection equipment in the prior art. Therefore, this application provides a simulation testing device for non-contact rail profile inspection equipment. By cooperating with the lower support platform and the upper test rail, a stable and reliable testing foundation is provided. The traveling component enables the simulation of the movement of the equipment under test, which can improve the accuracy of the simulation test. At the same time, it eliminates the need for a long track, effectively controls the space occupied by the simulation test, and reduces the simulation test cost.

[0005] This application provides a simulation testing device for a non-contact rail profile detection equipment, including a base, on which a support platform and a bracket are provided;

[0006] The support platform is used to support the inverted device under test, and to make the detection unit and the running wheels of the device under test face upward;

[0007] The support is equipped with a test rail and a traveling assembly. The length direction of the test rail is parallel to the traveling direction of the traveling assembly. The test rail is inverted, with its top surface facing the plane of the bearing surface of the support platform. Both the test rail and the traveling assembly are movable. The test rail moves to be within the detection range of the detection unit of the device under test, and the traveling assembly moves to contact the traveling wheels of the device under test and drive them to move synchronously.

[0008] By adopting the above technical solution, the inverted device under test (DUT) is supported by a bearing platform, and the inverted test rail is mounted on a bracket. This allows the DUT's testing unit and the test rail to be positioned relative to each other, and both the DUT and the test rail are installed stably, providing a foundation for simulation testing. At the same time, the traveling components drive the DUT's traveling wheels, simulating the DUT's movement and testing under real-world usage conditions, thereby improving the accuracy of the simulation test. Furthermore, the test rail is only for testing steel rails, which effectively controls the length of the test rail, thereby effectively controlling the space occupied and reducing the cost of simulation testing.

[0009] In some embodiments, both the test rail and the traveling assembly are located at one end of the support platform; and the test rail is located above the traveling assembly and is positioned closer to the center of the support platform relative to the traveling assembly via a mounting plate connected to the bottom.

[0010] By adopting the above technical solution, the test rail is positioned closer to the center of the support platform than the traveling components, which improves the compatibility with the layout of the testing unit and traveling wheels of the device under test, thereby improving the stability of the device under test on the support platform and increasing the accuracy of the simulation test. By placing the test rail above the traveling components, the height of the test rail itself can be used to make the top surface of the test rail flush with the traveling surface of the traveling components, thereby simplifying the connection structure of the test rail, traveling components and bracket and controlling costs.

[0011] In some embodiments, the traveling assembly includes a motor and a roller connected to the drive end of the motor. The traveling assembly moves to cause the roller to contact the traveling wheel of the device under test. The motor is used to drive the roller to drive the traveling wheel of the device under test to move.

[0012] In some embodiments, the length of the test rail is 100-150cm, the distance between the test rail and the roller in the walking direction is 1-3cm, and both the test rail and the traveling assembly can be raised and lowered relative to the support platform and slide along the axis of the roller.

[0013] By adopting the above technical solution, through the design of the test rail length and its distance from the roller, and the ability of the test rail and traveling components to move relative to the support platform in two directions, this device can be adapted to most of the devices under test, improving the versatility of the device, and the operation is relatively simple, thus improving the convenience of simulation testing.

[0014] In some embodiments, the support includes two longitudinal beams and two transverse beams, the two longitudinal beams being arranged opposite to each other and fixed to the base;

[0015] The two crossbeams are arranged in parallel, and both ends are slidably connected to the two longitudinal beams respectively;

[0016] The test rail is slidably connected to the higher of the two crossbeams, and the traveling assembly is slidably connected to the lower of the two crossbeams.

[0017] In some embodiments, a reinforcing beam is provided below the longitudinal beam, the longitudinal beam is located in the middle of the reinforcing beam, and the longitudinal beam is mounted on the base via the reinforcing beam.

[0018] By adopting the above technical solution, a T-shaped structure is formed by combining the reinforcing beam and the longitudinal beam, which improves the stability of the support and thus improves the accuracy of the simulation test.

[0019] In some embodiments, both the longitudinal beam and the crossbeam are provided with slide rails, the end of the crossbeam is slidably connected to the slide rail of the longitudinal beam via a first slider, and the test rail and the traveling assembly are respectively slidably connected to the slide rail of the corresponding crossbeam via a second slider.

[0020] In some embodiments, the support platform is provided with a plurality of movable limiting blocks, which are used to move the device under test against its edge after the device is placed in place on the support platform, so as to restrict its horizontal movement.

[0021] In some embodiments, the plurality of limiting blocks are slidably disposed on the bearing surface of the bearing platform and restrict the horizontal movement of the device under test by sliding friction; and at least two of the limiting blocks are disposed at one end near the traveling component and at the opposite end.

[0022] In some embodiments, the support platform is connected to the base via a lifting mechanism. The lifting mechanism includes X-shaped adjustable support frames symmetrically arranged on both sides of the support platform. The two adjustable support frames are connected to a transmission assembly. The transmission assembly is connected to an adjusting handle, and the adjusting handle is rotatable, thereby driving the two adjustable support frames to rise and fall through the transmission assembly.

[0023] Other features and corresponding beneficial effects of this application will be described in the latter part of the specification, and it should be understood that at least some of the beneficial effects will become obvious from the description in this application. Attached Figure Description

[0024] Figure 1 This is a schematic diagram illustrating the usage status of this application;

[0025] Figure 2 This is a schematic diagram of the structure of this application;

[0026] Figure 3 This is a side view of the present application;

[0027] Figure 4 This is a schematic diagram of the structure of the support platform in this application.

[0028] Explanation of reference numerals in the attached figures:

[0029] 1. Device under test; 2. Base;

[0030] 10. Support platform; 11. Support surface; 12. Limiting block; 13. Slide groove; 14. Lifting mechanism; 141. Adjustable support frame; 142. Fixed slide groove; 143. Transmission rod; 144. Lead screw; 145. Fixed block; 146. Moving block; 147. Adjusting handle;

[0031] 20. Support; 21. Longitudinal beam; 22. Crossbeam; 23. Reinforcing beam; 24. Slide rail; 25. First slider; 26. Second slider;

[0032] 30. Test rail; 31. Mounting plate;

[0033] 40. Traveling assembly; 41. Motor; 42. Roller; 43. Mounting bracket. Detailed Implementation

[0034] The following specific embodiments illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. Although the description of this application is presented in conjunction with preferred embodiments, this does not mean that the features of this application are limited to this embodiment. On the contrary, the purpose of describing the application in conjunction with embodiments is to cover other options or modifications that may be derived based on the claims of this application. To provide a thorough understanding of this application, many specific details will be included in the following description. This application may also be implemented without using these details. Furthermore, to avoid confusion or obscuring the focus of this application, some specific details will be omitted in the description. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other.

[0035] It should be noted that in this specification, similar reference numerals and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0036] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used solely for the convenience of describing this application and for simplification, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this application, unless otherwise stated, "a plurality of" means two or more. Unless otherwise explicitly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; a mechanical connection or an electrical connection; a direct connection or an indirect connection through an intermediate medium; or a connection within two elements. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0037] Please see Figures 1-3 , Figure 1 This is a schematic diagram illustrating the usage status of this application; Figure 2 This is a schematic diagram of the structure of this application; Figure 3 This is a side view of the present application.

[0038] This application provides a simulation testing device for a non-contact rail profile detection equipment, including a base 2, on which a support platform 10 and a bracket 20 are provided.

[0039] The support platform 10 is used to support the inverted device under test 1, and to make the detection unit and the running wheels of the device under test 1 face upward.

[0040] The support 20 is equipped with a test rail 30 and a traveling assembly 40. The length direction of the test rail 30 is parallel to the traveling direction of the traveling assembly 40, thus providing a basis for simulating the actual use environment of the device under test 1, i.e., detection and movement along the length direction of the rail. Moreover, this positional relationship is fixed, and there is no need to move the two to make them parallel. This not only simplifies the subsequent movement operation of the test rail 30 and the traveling assembly 40 and improves the convenience of operation, but also improves the accuracy of subsequent simulation tests.

[0041] The test rail 30 is inverted, with its top surface (the end face for the train wheels to travel on under normal conditions) facing the plane of the bearing surface 11 of the support platform 10. This allows it to cooperate with the device under test 1, which is inverted on the bearing surface 11 of the support platform 10. The detection unit of the device under test 1 then performs tests on the test rail 30, and the functionality of the device under test 1 can be determined by analyzing the test data. It should be noted that this simulation testing device provides a data acquisition environment for the simulation testing of the device under test 1. Subsequent data analysis can be performed using existing data analysis software or instruments, and data transmission can be achieved through the communication unit of the device under test 1 itself.

[0042] Furthermore, this method uses the support platform 10 to support the inverted device under test 1 and the bracket 20 to install the inverted test rail 30, so that the detection unit of the device under test 1 and the test rail 30 are both installed stably, providing a stable foundation for simulation testing, thereby improving the accuracy of simulation testing.

[0043] Both the test rail 30 and the traveling assembly 40 are movable. The test rail 30 moves to be within the detection range of the detection unit of the device under test 1, and the traveling assembly 40 moves to contact the traveling wheels of the device under test 1 and drive them to move synchronously. This simulates the simultaneous movement and detection of the device under test 1 under actual use, thereby improving the accuracy of the simulation test. Furthermore, the test rail 30 is only for rail detection and does not need to be used for the movement of the device under test 1, thus effectively controlling the length of the test rail 30 and consequently controlling the space occupied, reducing the cost of the simulation test.

[0044] It should be noted that the test rail 30 is a standard rail with a certain length. Multiple test rails 30 can be set according to different rail standards, and one of them can be selected and assembled according to the simulation test requirements.

[0045] In one embodiment, the test rail 30 and the traveling assembly 40 are both located at one end of the support platform 10, with the test rail 30 located above the traveling assembly 40. The test rail 30 is connected to the bottom by a mounting plate 31, which makes it closer to the center of the support platform 10 relative to the traveling assembly 40. This improves the compatibility with the layout of the testing unit and the traveling wheels of the device under test 1. That is, the testing unit of the device under test 1 is usually the heaviest part of the entire device, and its setting is usually closer to the center of the device under test 1 relative to the traveling wheels.

[0046] By using this configuration of the test rail 30 and the traveling assembly 40, the center of gravity of the device under test 1 can be closer to the center of the platform 10 when it is placed on the platform 10, thereby improving the stability of the device under test 1 on the platform 10 and thus improving the accuracy of the simulation test.

[0047] Furthermore, by setting the test rail 30 above the traveling component 40, the top surface of the test rail 30 can be made flush with the traveling surface of the traveling component 40 by utilizing the height of the test rail 30 itself, thereby simplifying the connection structure between the test rail 30, the traveling component 40 and the bracket 20, and further controlling the cost of simulation testing.

[0048] Meanwhile, the distance between the test rail 30 and the traveling component 40 can be adjusted by adjusting the position of the test rail 30 on the mounting plate 31, especially the distance in the traveling direction. This allows it to be adapted to different distances between the detection units and traveling wheels of different devices under test 1, ensuring that the test rail 30 and the traveling component 40 can simultaneously meet the requirements of testing the device under test 1 and driving synchronous movement.

[0049] In one embodiment, the traveling assembly 40 includes a motor 41 and a roller 42 connected to the drive end of the motor 41. The traveling assembly 40 moves to drive the roller 42 to contact the traveling wheel of the device under test 1. The motor 41 is used to drive the roller 42 to drive the traveling wheel of the device under test 1 to travel.

[0050] In one embodiment, the length of the test rail 30 is 100-150cm, such as 100cm, 115cm, 130cm, 140cm, 150cm, etc., and the distance between the test rail 30 and the roller 42 in the walking direction is 1-3cm, such as 1cm, 1.5cm, 2cm, etc., and both the test rail 30 and the traveling assembly 40 can be raised and lowered relative to the support platform 10 and slide along the axis of the roller 42.

[0051] This method, through the design of the length of the test rail 30 and its distance from the roller 42, and the ability of the test rail 30 and the traveling assembly 40 to move relative to the support platform 10 in two directions, makes the device suitable for most devices under test 1 (i.e., the position and spacing of the detection unit and traveling wheels of the device under test 1), improving the versatility of the device, and making the operation relatively simple and improving the convenience of simulation testing.

[0052] In one embodiment, the bracket 20 includes two longitudinal beams 21 and two transverse beams 22, with the two longitudinal beams 21 arranged opposite to each other and fixed to the base 2.

[0053] The two crossbeams 22 are arranged in parallel, and both ends are slidably connected to the two longitudinal beams 21 respectively.

[0054] The test rail 30 is slidably connected to the higher of the two crossbeams 22, and the traveling assembly 40 is slidably connected to the lower of the two crossbeams 22.

[0055] In this method, the bracket 20 has a simple structure and low construction cost.

[0056] In one embodiment, a reinforcing beam 23 is provided below the longitudinal beam 21, with the longitudinal beam 21 positioned in the middle of the reinforcing beam 23. The longitudinal beam 21 is mounted on the base 2 via the reinforcing beam 23, meaning that the reinforcing beam 23 and the longitudinal beam 21 combine to form a T-shaped structure, thereby improving the stability of the support 20 and thus enhancing the accuracy of the simulation test.

[0057] In one embodiment, both the longitudinal beam 21 and the transverse beam 22 are provided with slide rails 24. The end of the transverse beam 22 is slidably connected to the slide rail 24 of the longitudinal beam 21 via a first slider 25. The test rail 30 and the traveling assembly 40 are respectively slidably connected to the slide rail 24 of the corresponding transverse beam 22 via a second slider 26.

[0058] In one specific embodiment, the mounting plate 31 for mounting the test rail 30 is fixed to the second slider 26 on the slide rail 24 of the upper crossbeam 22, so that the test rail 30 can slide along the upper crossbeam 22.

[0059] In one specific embodiment, the traveling component 40 is mounted on the mounting frame 43. For example, the mounting frame 43 has a clamping part, a roller 42 is rotatably disposed in the clamping part, a frame part is provided on one side of the clamping part, a motor 41 is fixed on the frame part, and the drive shaft of the motor 41 passes through the frame part and is connected to the roller.

[0060] Mounting bracket 43 is fixed to the second slider 26 on the slide rail 24 of the lower crossbeam 22, so that the traveling component 40 can slide along the lower crossbeam 22.

[0061] In one embodiment, the support platform 10 is provided with a plurality of movable limiting blocks 12. The plurality of limiting blocks 12 are used to move against the edge of the device under test 1 after it is placed in place on the support platform 10, so as to restrict its horizontal movement, thereby protecting the device under test 1 and improving the test safety.

[0062] In one embodiment, a plurality of limiting blocks 12 are slidably disposed on the bearing surface 11 of the bearing platform 10, and the horizontal movement of the device under test 1 is restricted by sliding friction.

[0063] Since the device under test 1 usually has long triangular supports at both ends (i.e., in the direction of travel), and auxiliary filter wheels (i.e., ...) are installed on the triangular supports. Figure 1 The device under test 1 has a triangular structure at both ends. When the device under test 1 is placed on the support platform 10, it is relatively more unstable in this direction. Therefore, in one embodiment, the simulation test device is provided with at least two limiting blocks 12 at one end near the traveling component 40 and at the opposite end, thereby strengthening the protection of the device under test 1 in the traveling direction.

[0064] In one embodiment, the simulation test apparatus further includes a power source, such as a battery, to power the traveling assembly 40 and the device under test 1.

[0065] In other alternative implementations, the travel assembly 40 and the device under test 1 are connected to an external power source, such as AC power.

[0066] Please see Figure 4 , Figure 4 This is a schematic diagram of the structure of the support platform 10 in this application.

[0067] In one embodiment, the support platform 10 is connected to the base 2 via the lifting mechanism 14, thereby enabling the lifting and lowering of the device under test 1. That is, for different devices under test 1 with fixed relative positions of the testing unit and the traveling wheels, the device under test 1 can be replaced and different simulation tests can be performed by operating only the support platform 10 and the lifting mechanism 14, without moving the test rail 30 and the traveling component 40, thus improving the ease of operation.

[0068] In one specific embodiment, the lifting mechanism 14 includes X-shaped adjustable support frames 141 symmetrically arranged on both sides of the support platform 10. For example, fixed grooves 142 are provided on the sides of the support platform 10 and the base 2. The ends of the adjustable support frames 141 are slidably disposed within the fixed grooves 142. The lifting and lowering of the support platform 10 can be achieved by adjusting the sliding contraction and expansion of the support frames 141 within the fixed grooves 142. Furthermore, the two X-shaped adjustable support frames 141 can achieve stable support and adjustment for the support platform 10.

[0069] Two adjustable support frames 141 are connected to a transmission assembly, which includes two transmission rods 143. Each transmission rod 143 is connected to a corresponding rod of one of the two X-shaped adjustable support frames 141. Furthermore, each transmission rod 143 is connected to a lead screw 144. One transmission rod 143 is connected to the end of the lead screw 144 via a fixed block 145, and the other transmission rod 143 is connected to the lead screw 144 via a moving block 146. When the lead screw 144 rotates, its end rotates within the fixed block 145. The transmission rod 143 connected to the fixed block 145 remains stationary relative to the lead screw 144 along its length. The moving block 146 drives the transmission rod 143 connected to it to move along the length of the lead screw 144, thereby enabling the two transmission rods 143 to retract or expand the adjustable support frame 141. It should be noted that the transmission assembly is not limited to the above structure; any assembly capable of retracting and expanding the adjustable support frame 141 is acceptable.

[0070] The transmission component is connected to an adjustment handle 147, which can rotate to drive the transmission component and, through the transmission component, drive the two adjustment support frames 141 to rise and fall. The structure is relatively simple, the cost is low, and manual operation is convenient.

[0071] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An analog test device for a non-contact rail profile inspection apparatus, characterized in that, Includes a base, on which a support platform and a bracket are provided; The support platform is used to support the inverted device under test, and to make the detection unit and the running wheels of the device under test face upward; The support is equipped with a test rail and a traveling assembly. The length direction of the test rail is parallel to the traveling direction of the traveling assembly. The test rail is inverted, with its top surface facing the plane of the bearing surface of the support platform. Both the test rail and the traveling assembly are movable. The test rail moves to be within the detection range of the detection unit of the device under test, and the traveling assembly moves to contact the traveling wheels of the device under test and drive them to move synchronously.

2. The simulation testing device for non-contact rail profile inspection equipment according to claim 1, characterized in that, Both the test rail and the traveling assembly are located at one end of the support platform; and the test rail is located above the traveling assembly, and is positioned closer to the center of the support platform relative to the traveling assembly via a mounting plate connected to the bottom.

3. The analog test device for a non-contact rail profile inspection apparatus of claim 1, wherein, The traveling assembly includes a motor and a roller connected to the drive end of the motor. The traveling assembly moves to drive the roller to contact the traveling wheel of the device under test. The motor is used to drive the roller to drive the traveling wheel of the device under test to move.

4. The analog test device for a non-contact rail profile inspection apparatus according to claim 3, characterized in that, The test rail is 100-150cm long, and the distance between the test rail and the roller in the walking direction is 1-3cm. Both the test rail and the traveling assembly can be raised and lowered relative to the support platform and can slide along the axis of the roller.

5. An analogue testing device for a non-contact rail profile inspection apparatus according to claim 4, wherein, The support includes two longitudinal beams and two transverse beams, with the two longitudinal beams arranged opposite to each other and fixed to the base; The two crossbeams are arranged in parallel, and both ends are slidably connected to the two longitudinal beams respectively; The test rail is slidably connected to the higher of the two crossbeams, and the traveling assembly is slidably connected to the lower of the two crossbeams.

6. An analogue testing device for a non-contact rail profile inspection apparatus according to claim 5, characterised in that, A reinforcing beam is provided below the longitudinal beam, the longitudinal beam is located in the middle of the reinforcing beam, and the longitudinal beam is mounted on the base through the reinforcing beam.

7. The analog test device for a non-contact rail profile inspection apparatus of claim 5, wherein, Both the longitudinal beam and the crossbeam are equipped with slide rails. The end of the crossbeam is slidably connected to the slide rail of the longitudinal beam via a first slider. The test rail and the traveling assembly are slidably connected to the slide rail of the corresponding crossbeam via second sliders.

8. The analog test device for a non-contact rail profile inspection apparatus of claim 2, wherein, The support platform is provided with multiple movable limiting blocks. The multiple limiting blocks are used to move the device under test against its edge after the device is placed in place on the support platform, so as to restrict its horizontal movement.

9. An analogue testing device for a non-contact rail profile inspection apparatus according to claim 8, characterised in that, The plurality of limiting blocks are slidably disposed on the bearing surface of the bearing platform and restrict the horizontal movement of the device under test by sliding friction; and at least two of the limiting blocks are disposed at one end near the traveling component and at the opposite end.

10. The analog test device for a non-contact rail profile inspection apparatus of claim 1, wherein, The support platform is connected to the base via a lifting mechanism. The lifting mechanism includes X-shaped adjustable support frames symmetrically arranged on both sides of the support platform. The two adjustable support frames are connected to a transmission component. The transmission component is connected to an adjusting handle, and the adjusting handle is rotatable. The transmission component drives the two adjustable support frames to rise and fall.