Fault Detection and Classification Graphical User Interface for Electronic Devices
CN309358559SActive Publication Date: 2025-06-27SEMITRONIX
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Patent Information
- Application Number
- CN202430332344.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-31
- Publication Date
- 2025-06-27
- Estimated Expiration
- 2039-05-31
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Figure 000001_ABST
Abstract
1. Name of the design product: Graphical user interface for fault detection and classification of electronic devices. 2. Use of the design product: An electronic device. 3. Design key points of the design product: The graphical user interface on the screen. 4. Picture or photo that best shows the design key points: The front view of Design 1. 5. Design 1 is designated as the basic design. 6. Use of the graphical user interface: This design product is used to view the specific situation of fault detection and classification. By performing a correlation analysis on wafer yield data or wafer test data and device data, information on the reasonable range of eigenvalues (Features) and eigenvalue distribution information can be obtained. Interface interaction process: Change state diagram of Design 1: Based on the front view of Design 1, select the eigenvalue that you want to view specifically in the scatter plot or eigenvalue chart in the front view of Design 1, and jump to the change state diagram of Design 1; The interaction method and use of Design 2 are similar to those of Design 1. Based on the front view of Design 2, select the eigenvalue that you want to view specifically in the scatter plot or eigenvalue chart in the front view of Design 2, and jump to the change state diagram of Design 2.
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