Probe analysis system analysis workbench graphical user interface for electronic devices
CN309652655SActive Publication Date: 2025-12-05CHINA SECURITIES DATA CO LTD
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Patent Information
- Application Number
- CN202530028896.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-16
- Publication Date
- 2025-12-05
- Estimated Expiration
- 2040-01-16
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Figure 000001_ABST
Abstract
1. The name of the design product: probe analysis system analysis workbench graphical user interface for electronic equipment. 2. The use of the design product: for an electronic device. 3. The design points of the design product: in the graphical user interface. 4. The picture or photo that best indicates the design points: front view. 5. The electronic equipment is a conventional design, and the rear view, left view, right view, top view, and bottom view are omitted. 6. The use of the graphical user interface: for the analysis workbench of the probe analysis system; by selecting the "tool set" on the right side of the front view interface, the interface change state diagram 1 is displayed, by selecting the "dot" in the interface change state diagram 1, the interface change state diagram 2 is entered, and by selecting "dimensionality increase analysis 2" above the interface change state diagram 2, the interface change state diagram 3 is displayed.
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