ATE tester data analysis tool graphical user interface for electronic devices

Abstract

1. The name of the design product: ATE tester data analysis tool graphical user interface for electronic equipment. 2. The use of the design product: for electronic equipment. 3. The design points of the design product: the graphical user interface content displayed on the electronic equipment. 4. The picture or photo that best shows the design points: front view. 5. The conventional design, omit the rear view, left view, right view, top view, bottom view. 6. The use of the graphical user interface: for the analysis of ATE tester data. 7. The human-computer interaction mode of the graphical user interface: the front view is the main interface, click the "Select CSV file" button, a "Select CSV file" dialog box pops up, enter state diagram 1; in the "Select CSV file" dialog box of state diagram 1, select a "csv" suffix document, click the "Open (O)" button, the "Select CSV file" dialog box automatically closes, loads the selected file, and a "Load successful" dialog box pops up, enter state diagram 2; in state diagram 2, click the "OK" button of the "Load successful" dialog box to close it, click the drop-down list box behind the "Select testItem:" text in the interface to open the list items of the drop-down list box, enter state diagram 3; select the "Contact" list item of the drop-down list box, click the "Start analysis" button in the interface, and the analysis tool analyzes the Contact (contact test) data. After the analysis is completed, the CDF scatter plot and wafer distribution plot of Contact are generated, and state diagram 4 is entered; move the mouse arrow to the CDF scatter plot area below the "Value vs CDF Output" text, turn the mouse wheel down, and the CDF scatter plot area is displayed in a smaller size, enter state diagram 5; click the drop-down list box behind the "Select testItem:" text in the interface to open the list items of the drop-down list box, enter state diagram 6; select the "Mon_VARY" list item of the drop-down list box, click the "Start analysis" button in the interface, and the analysis tool analyzes the Mon_VARY (bit high voltage test) data. After the analysis is completed, the CDF scatter plot and wafer distribution plot of Mon_VARY data are generated, and state diagram 7 is entered.

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