Surface contamination measuring instrument
CN309954766SActive Publication Date: 2026-05-01SHANXI ZHONGFU NUCLEAR INSTR CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHANXI ZHONGFU NUCLEAR INSTR CO LTD
- Filing Date
- 2025-09-30
- Publication Date
- 2026-05-01
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Surface Contamination Measuring Instrument. 2. Application of this design: This design is used to measure the dose equivalent rate around γ. By combining with different probes, it can realize the measurement of α, β, and γ radiation in various occasions. It can be applied in places such as environmental protection, medical and health care, mining, metallurgy, and radioactive laboratories where radiation environment and radiation protection testing are required. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key features: the front view.
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