Surface contamination measuring instrument

CN309954766SActive Publication Date: 2026-05-01SHANXI ZHONGFU NUCLEAR INSTR CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
SHANXI ZHONGFU NUCLEAR INSTR CO LTD
Filing Date
2025-09-30
Publication Date
2026-05-01

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Abstract

1. Name of the product in this design: Surface Contamination Measuring Instrument. 2. Application of this design: This design is used to measure the dose equivalent rate around γ. By combining with different probes, it can realize the measurement of α, β, and γ radiation in various occasions. It can be applied in places such as environmental protection, medical and health care, mining, metallurgy, and radioactive laboratories where radiation environment and radiation protection testing are required. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key features: the front view.
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