Wafer analysis range setting section of graphical user interface for wafer inspection of electronic device

Abstract

1. Name of the designed product: setting wafer analysis range part of graphic user interface for wafer inspection of electronic device 2. Use of the designed product: the product is used in an electronic device. 3. Design points of the designed product: the design points are in the local part of the graphic user interface. 4. Picture or photo best showing the design points: front view. 5. Use of the graphic user interface: the graphic user interface of the designed product is used for human-computer interaction and setting wafer analysis range. 6. Human-computer interaction mode of the graphic user interface: interaction is performed through face recognition, clicking, touching, voice or scene triggering, etc., and the front view is the initial state diagram of the wafer display part of the analysis object with the analysis range display part. Through user operation, it can be switched to "interface change state diagram 1", which can enlarge the analysis range display part and set it to the required size. In addition, through user operation, it can be further switched to "interface change state diagram 2", which can change the analysis range display part along the notch shape formed on the wafer, so as to set an exclusion range in the analysis range. 7. Other circumstances needing to be explained: the parts shown in solid line in the view, the light gray part in the circle in the view, the part shown in red solid line in the reference diagram and the part coated with red color are the appearance designs claimed to be protected, but the color is not claimed to be protected.

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