Spectrometer (dual wavelength, fully automatic)
CN310060626SActive Publication Date: 2026-06-30JIANGSU SKYRAY INSTR
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- JIANGSU SKYRAY INSTR
- Filing Date
- 2025-10-11
- Publication Date
- 2026-06-30
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Figure 000021_ABST
Abstract
1. Name of the product in this design: Spectrometer (Dual Wavelength, Fully Automatic). 2. Purpose of this design: For the differentiation and quantitative measurement of inorganic and organic materials. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D view of the assembled state.
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